WO2018053726A1 - 单相三线电能表双锰铜采样电路产生脉冲的方法 - Google Patents

单相三线电能表双锰铜采样电路产生脉冲的方法 Download PDF

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Publication number
WO2018053726A1
WO2018053726A1 PCT/CN2016/099617 CN2016099617W WO2018053726A1 WO 2018053726 A1 WO2018053726 A1 WO 2018053726A1 CN 2016099617 W CN2016099617 W CN 2016099617W WO 2018053726 A1 WO2018053726 A1 WO 2018053726A1
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WIPO (PCT)
Prior art keywords
electric energy
energy meter
phase
metering
control unit
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Application number
PCT/CN2016/099617
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English (en)
French (fr)
Inventor
李向锋
张玉清
陈锦辉
Original Assignee
深圳市思达仪表有限公司
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Application filed by 深圳市思达仪表有限公司 filed Critical 深圳市思达仪表有限公司
Priority to PCT/CN2016/099617 priority Critical patent/WO2018053726A1/zh
Publication of WO2018053726A1 publication Critical patent/WO2018053726A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R22/00—Arrangements for measuring time integral of electric power or current, e.g. electricity meters
    • G01R22/06—Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods
    • G01R22/10—Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods using digital techniques

Definitions

  • the present invention relates to an electric energy meter, and more particularly to a method for generating a pulse by a single-phase three-wire electric energy meter double manganese copper sampling circuit.
  • a conventional method for generating a pulse by a main control chip of a single-phase three-wire electric energy meter composed of two sampling circuits generally emits a high-frequency pulse through a metrology chip, and accumulates the high-frequency pulse by a main control chip until the main control chip accumulates The number of high frequency pulses reaches a number that represents one pulse, and the master chip emits a pulse.
  • This method has high requirements on the metering chip, and the metering chip is required to generate high-frequency pulses, and many metering chips have no ability to generate high-frequency pulses, and this method has error jitter.
  • the main technical problem to be solved by the present invention is to provide a method for generating a pulse by a single-phase three-wire electric energy meter double manganese copper sampling circuit.
  • a technical solution adopted by the present invention is: providing a single-phase three-wire electric energy meter double manganese copper sampling circuit to generate a pulse method, comprising a single-phase three-wire electric energy meter, the single-phase three-wire electric energy meter
  • the utility model comprises an MCU control unit, two metering sampling circuits and two manganese copper sampling units, each of the manganese copper sampling units is electrically connected to one of the metering sampling circuits, and two metering sampling circuits are respectively electrically connected to the MCU control unit.
  • the MCU control unit includes a calibrator for detecting the inter-turn intervals T1 and T2 of the pulses generated by the two metering sampling circuits, and for accumulating the inter-turn T3, when T3 ⁇ [(T1 + ⁇ 2) / ⁇ 1 ⁇ 2] ⁇ , the MCU control unit pulses.
  • the range of the interrupted turn T of the fixed device is 150us ⁇ T ⁇ 250us
  • the beneficial effects of the invention are: in the use, the high-frequency pulse output performance of the metering chip is not considered, the dependence on the performance of the metering chip is eliminated, the selection of the metering chip is more flexible, and the cost of the meter is effectively reduced. And this method can output pulses more accurately, avoiding jitter error.
  • FIG. 1 is a schematic diagram of a hardware structure in an embodiment of the present invention. [0012] Main component symbol description:
  • Control unit -10 metering sampling circuit -20; manganese copper sampling unit -30.
  • FIG. 1 is a method for generating a pulse of a single-phase three-wire electric energy meter double manganese copper sampling circuit, including a single-phase three-wire electric energy meter, and a single-phase three-wire electric energy meter including an MCU control unit 10 and two meters.
  • the sampling circuit 20 and two manganese-copper sampling units 30, each of the manganese-copper sampling units 30 are electrically connected to a metering sampling circuit 20, and the two metering sampling circuits 20 are electrically connected to the MCU control unit 10, respectively.
  • the MCU control unit 10 includes a calibrator for detecting the inter-turn intervals T 1 and T2 of the pulses generated by the two metering sampling circuits 20, and for accumulating the inter-turn T3, when T3 ⁇ [(T1+T2) / ⁇ 1 ⁇ 2 ] ⁇ , the MCU control unit 10 emits a pulse.
  • the power of the two-phase three-wire two metering power is assumed to be P1 and P2, the pulse interval is T1 and T2, and the total power of the single-phase three-wire and the total inter-turn interval are assumed to be P and T3.
  • the electric energy can be quantized by the two inter-time intervals T1 and ⁇ 2 of the pulse generated by the two sampling and sampling circuits, and can be equivalently pulsed when T3 ⁇ [(T1+T2) / ⁇ 1 ⁇ 2] ⁇ .
  • the interval of the interrupter Tus of the stator can be set to 1 50us ⁇ T ⁇ 250us. Selecting a fixed or smaller interval of 250us is to obtain a smaller jitter error value. Conversely, if the Tus selection is too small, the MCU control unit interrupts more frequently, and the program execution efficiency becomes more than 150us. Therefore, considering the resources, execution efficiency and measurement accuracy of the MCU control unit, the interrupt interval of the fixed device is 150us ⁇ T ⁇ 250us.
  • the pulse is cumulatively quantized to accumulate the inter-pulse interval of each metering sampling circuit, the control is simpler, the pulse generation is more accurate, and the performance requirements of the chip on the metering circuit are correspondingly reduced.
  • the method of the invention can make the electric energy meter not have to consider the high-frequency pulse output performance of the measuring chip in use, and get rid of the dependence of the electric energy meter on the performance of the measuring chip, so that the selection of the measuring chip is more flexible, and the cost of the electric energy meter is effectively reduced. And adopt this method It can output pulses more accurately and avoid jitter.

Abstract

一种单相三线电能表双锰铜采样电路产生脉冲的方法，包括单相三线电能表，单相三线电能表包括MCU控制单元（10）、两个计量采样电路（20）和两个锰铜采样单元（30），每个锰铜采样单元（30）分别和一个计量采样电路（20）电连接，两个计量采样电路（20）分别和MCU控制单元（10）电连接，MCU控制单元（10）中包括定时器，定时器用于检测两个计量采样电路（20）产生脉冲的时间间隔T1和T2，并用于累加时间T3，当T3≥[(T1+T2)/T1×T2]时，MCU控制单元（10）发出脉冲。所述方法在使用中不必考虑计量芯片的高频脉冲输出性能，摆脱了对计量芯片性能的依赖，使计量芯片的选择更加灵活，有效降低电能表的成本，且采用此方法能更加精确地输出脉冲，避免跳动误差。

Description

单相三线电能表双锰铜釆样电路产生脉冲的方法
[0001] 技术领域
[0002] 本发明涉及电能表， 尤其涉及一种单相三线电能表双锰铜采样电路产生脉冲的 方法。
[0003] ¾體
[0004] 传统的由两个采样电路组成的单相三线电能表的主控芯片发出脉冲的方法一般 是通过计量芯片发出高频脉冲， 采用主控芯片累计该高频脉冲， 直到主控芯片 累计的高频脉冲数达到代表一个脉冲的数量吋， 主控芯片发出脉冲。 此种方法 对计量芯片的要求较高， 需要计量芯片能够产生高频脉冲， 而很多计量芯片没 有产生高频脉冲的能力， 并且此方法存在误差跳动。
[0005] 发明肉容
[0006] 本发明主要解决的技术问题是提供一种单相三线电能表双锰铜采样电路产生脉 冲的方法。
[0007] 为解决上述技术问题， 本发明采用的一个技术方案是： 提供一种单相三线电能 表双锰铜采样电路产生脉冲的方法， 包括单相三线电能表， 所述单相三线电能 表包括 MCU控制单元、 两个计量采样电路和两个锰铜采样单元， 每个所述锰铜 采样单元分别和一个所述计量采样电路电连接， 两个计量采样电路分别和所述 MCU控制单元电连接， MCU控制单元中包括定吋器， 所述定吋器用于检测两 个计量采样电路产生脉冲的吋间间隔 T1和 T2, 并用于累加吋间 T3, 当 T3≥[ (T1 +Τ2) / Τ1χΤ2]吋， MCU控制单元发出脉冲。
[0008] 其中， 所述定吋器的中断吋间 T的范围为 150us≤T≤250us
[0009] 本发明的有益效果是： 在使用中不必考虑计量芯片的高频脉冲输出性能， 摆脱 了对计量芯片性能的依赖， 使计量芯片的选择更加灵活， 有效降 ί氐电能表的成 本， 且采用此方法能更加精确地输出脉冲， 避免跳动误差。
[0010] 國綱
[0011] 图 1是本发明的一个实施方式中的硬件结构示意图。 [0012] 主要元件符号说明：
[0013] 控制单元 -10; 计量采样电路 -20; 锰铜采样单元 -30。
[0014] t m^
[0015] 为详细说明本发明的技术内容、 构造特征、 所实现目的及效果， 以下结合实施 方式并配合附图详予说明。
[0016] 请参阅图 1 , 本实施方式为一种单相三线电能表双锰铜采样电路产生脉冲的方 法， 包括单相三线电能表， 单相三线电能表包括 MCU控制单元 10、 两个计量采 样电路 20和两个锰铜采样单元 30, 每个锰铜采样单元 30分别和一个计量采样电 路 20电连接， 两个计量采样电路 20分别和 MCU控制单元 10电连接。 MCU控制单 元 10中包括定吋器， 定吋器用于检测两个计量采样电路 20产生脉冲的吋间间隔 T 1和 T2, 并用于累加吋间 T3, 当 T3≥[ (T1+T2) / Τ1χΤ2]吋， MCU控制单元 10 发出脉冲。
[0017] 在本实施方式中， 单相三线两个计量电量的功率假设为 P1和 P2, 脉冲间隔吋 间为 T1和 T2, 单相三线总的功率和总吋间间隔假设为 P和 T3, 则功率可以表示 ¾P=P1+P2, 脉冲间隔吋间 T = 3600000/ (Ρχ脉冲常数） ， 单位为秒。 贝 ljP=Pl+ P2可以表示为 1/T3=1/T1+1/T2; 即当 1/Τ3≥1/Τ1+1/Τ2吋 MCU控制单元发出脉冲
。 由上述原理可知， 电能大小可采用两个计量采样电路产生脉冲的吋间间隔 T1 、 Τ2以及累加吋间 Τ3来量化， 可等效为当 T3≥[ (T1+T2) /Τ1χΤ2]吋发出脉冲。
[0018] 进一步地， 在一个优选的实施方式中， 定吋器的中断吋间 Tus的区间可设置为 1 50us≤T≤250us。 选择小于等于 250us的定吋吋间是为了得到更小跳动的误差值， 反之， 如果 Tus选择太小的话， MCU控制单元的中断更加频繁， 程序执行效率 变 ί氐， 因此需大于 150us。 故从 MCU控制单元的资源及执行效率及计量准确方 面综合考虑， 定吋器的中断吋间区间为 150us≤T≤250us。
[0019] 由于把脉冲累加量化为累加各个计量采样电路的脉冲吋间间隔， 从而使控制更 加简单， 脉冲的产生更加精准， 并且由于对计量采样电路上的芯片的性能要求 也相应降 ί氐， 能够显著降 ί氐电能表的成本。 采用本发明的方法可使得电能表在 使用中不必考虑计量芯片的高频脉冲输出性能， 摆脱了电能表对计量芯片性能 的依赖， 使计量芯片的选择更加灵活， 有效降 ί氐电能表的成本， 且采用此方法 能更加精确地输出脉冲， 避免跳动误差。
以上所述仅为本发明的实施例， 并非因此限制本发明的专利范围， 凡是利用本 发明说明书及附图内容所作的等效结构或等效流程变换， 或直接或间接运用在 其他相关的技术领域， 均同理包括在本发明的专利保护范围内。
技术问题
问题的解决方案
发明的有益效果

Claims

权利要求书
[权利要求 1] 一种单相三线电能表双锰铜采样电路产生脉冲的方法， 包括单相三线 电能表， 所述单相三线电能表包括 MCU控制单元、 两个计量采样电 路和两个锰铜采样单元， 每个所述锰铜采样单元分别和一个所述计量 采样电路电连接， 两个计量采样电路分别和所述 MCU控制单元电连 接， 其特征在于， MCU控制单元中包括定吋器， 所述定吋器用于检 测两个计量采样电路产生脉冲的吋间间隔 T1和 T2， 并用于累加吋间 Τ 3， 当 T3≥[ (T1+T2) / Τ1χΤ2]日寸， MCU控制单元发出脉冲。
[权利要求 2] 根据权利要求 1所述的单相三线电能表双锰铜采样电路产生脉冲的方 法， 其特征在于： 所述定吋器的中断吋间 Tus的范围为 150uS≤T≤250u
PCT/CN2016/099617 2016-09-21 2016-09-21 单相三线电能表双锰铜采样电路产生脉冲的方法 WO2018053726A1 (zh)

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