WO2017137972A1 - Dispositif d'imagerie et détection infrarouge sans pièces mobiles - Google Patents

Dispositif d'imagerie et détection infrarouge sans pièces mobiles Download PDF

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Publication number
WO2017137972A1
WO2017137972A1 PCT/IL2016/050173 IL2016050173W WO2017137972A1 WO 2017137972 A1 WO2017137972 A1 WO 2017137972A1 IL 2016050173 W IL2016050173 W IL 2016050173W WO 2017137972 A1 WO2017137972 A1 WO 2017137972A1
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WO
WIPO (PCT)
Prior art keywords
radiation
scene
wavelength band
detector
absorbing molecules
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Application number
PCT/IL2016/050173
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English (en)
Inventor
Dario Cabib
Amir Gil
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Ci Systems (Israel) Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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Priority to PCT/IL2016/050173 priority Critical patent/WO2017137972A1/fr
Publication of WO2017137972A1 publication Critical patent/WO2017137972A1/fr
Priority to IL261129A priority patent/IL261129A/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0224Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using polarising or depolarising elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0227Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using notch filters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2823Imaging spectrometer
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/42Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/457Correlation spectrometry, e.g. of the intensity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G01N2021/3531Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis without instrumental source, i.e. radiometric

Definitions

  • the present invention relates to the detection and imaging of infrared radiation
  • Such types of instrumentation are based in the visible spectral range (400-750 nanometers), and in the various regions of infrared (the Near Infrared (NIR) range of 750-2500 anometers, the Mid Wave Infrared (MWIR) range of 2500-5000 nanometers, and the Long Wave Infrared (LWIR) of 5000-14000), Instrumentation of spectral imaging has been built for nalysis of microscopic samples in hospital environments, as well as of distant cosmic objectshrough large astronomical telescopes. The size of the analyzed region of space and spatialesolution also vary widely, as well as the spectral resolution, depending on the type of detector sed (i.e.
  • spectral imaging technology for safety, security and ndustrial applications, and in particular in the application of hazardous gas cloud detection and maging.
  • Spectral imaging technology as applied to such applications can be used, for example, n automatic detection of leaks in industrial installations without the need for manpower ntensive maintenance investigations, and to identify gases liberated to the air in traffic accidents nvolving trucks during transport.
  • the low price and maintenance-free operation required for this ype of instrumentation is a strong motivation to use low price detectors with no moving parts.
  • the present invention is a reliable and low cost device for detecting, imaging and quantifying an airborne gas in a specific range of concentration and cloud size.
  • the device uses no moving parts and has an optical system based on a bistatic electronically controlled notch bsorber, absorbing in the same wavelength range as the gas to be detected.
  • the device lternately images a field of view through a bistatic absorber in the notch and out-of notch wavelength ranges, respectively.
  • a evice for imaging radiation from a scene the radiation including at least a first and second wavelength band, the second wavelength band included in the first wavelength band
  • the device omprising: (a) a detector of the radiation from the scene sensitive to radiation in the first wavelength band; (b) an image forming optical component for forming an image of the scene on he detector; (c) a filtering arrangement including first and second independently controllable luralities of radiation absorbing molecules in the second wavelength band, the filtering rrangement configured to be electronically switched between: (i) a first state, in which all of the adiation in the first wavelength band is transmitted to the detector, and (it) a second state, in which the radiation in the second wavelength band is at least partially absorbed by each of the first and second pluralities of radiation absorbing molecules, and (d) a control unit electrically oupled to the filtering arrangement and the detector for synchronizing the switching of the ltering arrangement with the image
  • the first plurality of radiation absorbing molecules are arranged in a second orientation substantially perpendicular to a direction of propagation of the radiation from the scene to the detector.
  • the second plurality of radiation absorbing molecules is arranged substantially parallel to the first plurality of radiation absorbing molecules.
  • the second plurality of radiation absorbing molecules is arranged substantially perpendicular to the first plurality of radiation absorbing molecules.
  • the first and second pluralities of radiation absorbing molecules are arranged in series such mat the second plurality of radiation absorbing molecules is interposed between the first plurality of radiation absorbing molecules and the detector.
  • the first plurality of radiation absorbing molecules are positioned within a first cell, and the second plurality of radiation absorbing molecules are positioned within a second cell.
  • the radiation from the scene is unpolarizecL
  • the radiation in the first wavelength band is polarized by the first plurality of radiation absorbing molecules.
  • the first plurality of radiation absorbing molecules is configured to polarize the radiation incident from the scene.
  • the second plurality of radiation absorbing molecules is configured to polarize the radiation incident from the first plurality of radiation absorbing molecules.
  • the image forming optical component has an optical f-number less than approximately 1.5.
  • the filtering arrangement is interposed between the scene and the image forming optical component.
  • the filtering arrangement is interposed between the detector and the image forming optical component.
  • each of the first a cond pluralities of radiation absorbing molecules ncludes liquid crystal molecules.
  • the radiation in the first wavelength band includes radiation in the range of 3.2-3.5 micrometers in wavelength.
  • the first and second signals provide quantitative information about the scene, the quantitative information produced by an analytical technique.
  • the scene is a gas cloud.
  • the gas cloud is a hydrocarbon gas cloud
  • FIG. 1 is a schematic side view illustrating a prior art device for detecting and imaging radiation from a gas cloud
  • FIG. 2 is a schematic side view illustrating a device for detecting and imaging radiation from a scene according to an embodiment of the invention
  • FIG. 3A is plot of the transmjttance of a filter according to an embodiment of the nvention
  • FIG. 3B is a plot of the transmittance of a gas cloud imaged by the device of FIG. 2;
  • FIG. 4 is a plot of detected radiation for different filter transmittance values as a function of gas cloud absorption
  • FIG. 5 is a plot of the absorption characteristics for a group of hydrocarbon gases
  • FIG. 6 is a plot of the transmission characteristics of a liquid crystal
  • FIG. 7A is an illustration of radiation absorbing molecules in a polarizing state
  • FIG. 7B is an illustration of radiation absorbing molecules in an unpolarizing state
  • FIG. 8A is an illustration of two cells of radiation absorbing molecules in a second state n which incident light is at least partially absorbed in the absorption wavelength range of the radiation absorbing molecules;
  • FIG. SB is an illustration of two cells of radiation absorbing molecules in a first state in which incident light is completely transmitted in the detector wavelength range of sensitivity,ncluding the absorption wavelength range of the radiation absorbing molecules.
  • the present disclosure is of a device for detecting and imaging a specific gas in the air in specific range of concentration and cloud size that maybe among the least expensive to build nd most reliable, by avoiding the use of moving parts, and for measuring the path concentration of the gas in each pixel of the image.
  • the gas transmittance tc is in turn dependent on the molecular absorption coefficient f the gas in question multiplied by the d thickness and gas molecular concentration at the ixel in question (referred to as the pa ncentration). Therefore, if the gas in question is nown, the gas path concentration can be estimated.
  • the following will clarify the quantitative method of the present disclosure by showing that to can be measured with the present device, which in turn allows for the gas path concentration to be estimated:
  • equation (1) in the case that B is equal to the radiance difference R is equal to zero, irrespective of the value of to, and in this case no information can be inferred on the quantity
  • equation (1) can be solved for to as follows:
  • Equation (2) All parameters on the right hand side of equation (2) are known: B is known because it is measured in the non-absorbing wavelength w ⁇ >, PI is known because To is measured and w G is known, and R is measured. Therefore, tc is known from equation (2). If the molecular absorption coefficient, Ar» of the specific gas being monitored is known from the literature at w ⁇ , then 1 ⁇ 2 gives a measure of the product of average gas volume concentration in the cloud, multiplied by the thickness of the cloud itself, or the so called concentration times length (or path concentration) value of the cloud. In fact, by the Lambert-Beer law as follows:
  • the estimated average concentration n expressed in equation (5) assumes absorption from single molecules, negligible attenuation effects from scattering, reflections, and multiple absorption in the gas cloud. In general, / is not known and Ac is known, so mis method readily provides nl according to equation (4), once to is measured according to equation (2).
  • the purpose of the present invention is to give a solution to the problem of detecting and imaging the concentration rimes path length distribution of an infrared wavelength absorbing gas cloud (or other similar material with an absorbing wavelength) with the minimum use of moving parts and at the same time retaining the best sensitivity possible.
  • Figure 1 depicts an example of a prior art solution.
  • an objective lens 2 is positioned in front of a detector array 1 and a two-position filter holder or wheel 3 containing two filters (4a,4b), either in front of die objective lens 2 or between the objective lens 2 and the detector array 1.
  • FOV field of view
  • the filter holder 3 slides in front of the objective lens 2 in a linear motion.
  • Other configurations using rotating wheels, grating, etc. to filter the different wavelengths can be used, but they all use moving parts.
  • the filters are before the objective lens. Only the principal rays of the central, top and bottom pixels of the FOV are shown.
  • the filters can be alternately placed between the lens and the detector or between lenses in a multiple lens system design.
  • Figure 1 can be preferably designed with a large numerical aperture of the objective lens 2 to exploit the best possible detector sensitivity (or low f-number, which is in general kept as close to 1 as possible, especially when using uncooled infrared detector arrays).
  • a different configuration using a dichroic beamsplitter to split the incoming beam into two beams to be filtered separately in the two wavelengths and two separate detectors can be used, but would be more expensive because of the additional detector cost.
  • a further similar configuration using, besides the dichroic filter, an additional beam combiner and chopper may be used to limit the design to the single array detector, but in this case the chopper, needed to switch between the two wavelengths in synchronization with the detector frame capture rate, is a low reliability moving part.
  • the device 10 enables imaging the same region of space or field of view (FOV) alternately through wo electronically controlled filtering states, using a single detector array camera 12 and optical system without mechanical movement of any optical component (the shutter is still needed to carry out Nott Uniformity Corrections, including environmental drifts, fixed pattern and readout noise), while preserving the high optical throughput of the conventional configurations previously described in the Section 1.
  • FOV field of view
  • an imaging optics 14 (referred to interchangeably as focusing optics, image forming optics, and objective ens) with f-number close to 1 (high numerical aperture) and a bistatic liquid crystal (LC) based notch filter 16 (referred to interchangeably as LC filter, LC notch, LC notch filter, bistatic LC ilter, bistatic LC notch filter) having a spectral behavior optimized to the gas absorption pectrum in question.
  • the LC filter configurations pair are, as explained in the example below, i) high filter transmittance spectral region, and ii) a notch filter absorbing in a region around a wavelength absorbed by the gas, this wavelength being within the high transmittance wavelength egion.
  • the controller 18 can be implemented as any number of computer processors including, ut not limited to, a microprocessor, an ASIC, a DSP, a state machine, and a microcontroller. Such processors include, or may be in communication with computer readable media, which tores program code or instruction sets mat, when executed by the processor, cause the processor o perform actions. Types of computer readable media include, but are not limited to, electronic, ptical, magnetic, or other storage or transmission devices capable of providing a processor with omputer readable instructions.
  • equation (4) yields the mformation of concentration mes path length of the gas cloud at every point in the image. From this information one can uild the image in false color or in different intensity levels of the color, according to the nl alue of the gas being monitored at every pixel. Capturing alternating information in these two onfigurations on the same detector 12 according to the present invention also allows the monitoring of faster phenomena than in a conventional configuration, because the electronic witching between the "off* (high transmittance) and "on" (notch transmittance) configurations f the filter can be done at high frequencies of several kHz. This is due to the fast LC molecules esponse to the suitably applied high ency alternating voltage. With the proper digital nalysis, the final gas cloud image can be shown superimposed on a conventional visible image of the same field of view, obtained by a usual visible CCD camera. This helps the operator locate the cloud with respect to other objects in the field.
  • FIG. 2 is a cross section from the side of the device 10.
  • the moving filter holder or wheel 3 of Figure 1 is replaced by the electronically controlled bistatic
  • IX! fitter system (the bistatic LC filter 16 and the controller 18), including a high transmittance configuration in a wavelength range, alternating with a notch absorbing fitter configuration in a sub-range corresponding to the gas absorption wavelength.
  • the transmittance is a notch centered at ⁇ « and width w.
  • the transmittance in the notch region is z.
  • the absorption wavelength range is centered in the same wavelength ⁇ as the LC notch and has the same width w.
  • the transmittance in the absorption range is x and 100% otherwise.
  • the detector array 12 is assumed to be sensitive only in the wavelength region between ⁇ and ⁇ 2 .
  • the spectral radiance of the cloud background is B and is a constant function of wavelength.
  • the average radiance reaching the detector array 12 in the wavelength range between X t and ⁇ 2 can be expressed for four cases.
  • Equations (8) and (9) are special cases of equations (6) and (7) respectively for x- l .
  • x-l implies that the gas cloud is absent
  • equation (8) the right hand side of equation (6) is the same as in equation (8) and the right hand side of equation (7) becomes equation (9).
  • equations (6) and (7) give the same result. This is because the total signal is B multiplied by the product of the two transmittanee functions in Figures 3A and 3B. If the gas cloud absorbs all radiation within the notch range the signal is independent on whether the LC notch is in the on or off configuration.
  • a ratio, F, of the difference between "on” and “off and the "off signal (or normalized signal contrast) can be calculated from equations (6) and (7).
  • the ratio F can be expressed as follows:
  • Equation (10) is the basic relation between the pixels' signals in the LC on and off positions and the quantity x, which is equal to to of equation (3) above, in turn the parameter related to the path concentration of the gas cloud in question according to equation (4).
  • the ratio F of equation (10) can be plotted as function of the total gas cloud absorption of equation (4)) for different values of y and z. Example plots are shown in Figure 4.
  • bistatic notch LC filter 16 in order to provide the ype of signals as described above without moving parts, is discussed.
  • This section also addresses the integration of the bistatic notch LC filter 16 in the device 10, in order to detect and mage a gas cloud.
  • the implementation and integration discussion is applied, as a non-limiting example, to a group of hydrocarbons that all have an absorption around the same wavelength range, between 3.2 and 3.5 microns, and to a particular detector type that is sensitive in that range.
  • many other combinations of materials to be detected, LC filters materials, and different detectors may be used according to he teachings of the present embodiments described herein.
  • the absorption characteristics for the non-limiting example group of hydrocarbons are shown in Figure 5.
  • liquid crystals such as, for example, E-7 and BDH-E7.
  • Such iquid crystals present absorption in this wavelength range.
  • the transmission characteristics of such example liquid crystals are shown in Figure 6 which is an excerpt from the Handbook of Optics, McGraw-Hill Inc., Sponsored by the Optical Society of America, Volume II, page 14.6, 995.
  • the transmitted light at wavelengths within the gas and LC absorption wavelength region is polarized perpendicularly to he long axis of the molecule. Light outside this band is not absorbed and is unpolarized.
  • molecules oriented perpendicularly to the light propagation direction have the following effect: they absorb the portion of light around the 3.5 microns range which is polarized parallel to their long molecular axis, while transmitting the same wavelength range polarized in a direction perpendicular to their long molecular axis (depicted as a ransmitted polarized light beam 74 around the gas absorption wavelength); in addition, light outside the 3.5 micron wavelength range is completely transmitted.
  • theunpolarized light 70 is incident on an LC long molecule 76 whose long axis is oriented in the direction of the light propagation direction. As a result, all light is ransmitted and is unpolarized (depicted as a transmitted unpolarized light beam 78).
  • the configuration depicted in Figure 7B is the "off' filter configuration of the LC filter 16.
  • FIG. 8A and 8B a system composed of two equal LC cells in eries (a first LC cell 80 and a second LC cell 82), where the molecules 81 in the first LC cell 80 nd the molecules 83 in the second LC cell 82 are oriented with their long axis in two perpendicular directions with respect to each other and to the light propagation direction.
  • An unpolarized light beam 84 incident from the left is completely (or partially) absorbed in the bsorption wavelength range of the molecule and gas by the pair of cells (this is the "on" filter tate of the LC filter 16 described in Section 3 above).
  • the second LC ell 82 absorbs the residual polarized light 85 transmitted by the first LC cell 80 (functioning as ross polarizers with respect to this radiation). All light outside that range is transmitted.
  • the unpolarized ght heam 84 is transmitted unpolarized (and shown as 85) after passing through the first LC cell 0, and likewise by LC cell 82.
  • all light incident on the first LC cell 80 passeshrough the second LC cell 82 within the whole wide band region between ⁇ and ⁇ 2 of Figure A.
  • the device 10 (as shown in Figure 2) in which the filtering element 16 is a bistat er as described above in Section 4, provides images f the scene in which each pixel's radiation is known according to the four equations (6), (7), (8), nd (9). Accordingly, a procedure as described in Section 3 can be followed to detect a gas cloudaving the above described absorption properties, if present in the air, and map the pathoncentration of the gas cloud pixel by pixel.

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  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
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Abstract

La présente invention concerne un dispositif d'imagerie du rayonnement provenant d'une scène. Un détecteur est sensible au rayonnement dans une première bande de longueurs d'onde. Une lentille forme une image de la scène sur le détecteur. Un agencement de filtrage comprend deux ensembles de molécules d'absorption de rayonnement. Une unité de commande commute l'agencement de filtrage entre deux états : dans le premier état, tout le rayonnement dans la première bande de longueurs d'onde est transmis au détecteur et, dans le second état, le rayonnement dans une seconde bande de longueurs d'onde comprise dans la première bande de longueurs d'onde est absorbé par les molécules d'absorption de rayonnement. L'unité de commande synchronise la commutation de l'agencement de filtrage avec le détecteur. Chaque pixel de l'image formée sur le détecteur comprend deux signaux. Le premier signal comprend des informations de rayonnement de scène dans la première bande de longueurs d'onde. Le second signal exclut les informations de rayonnement de scène absorbées par l'agencement de filtrage dans la seconde bande de longueurs d'onde.
PCT/IL2016/050173 2016-02-14 2016-02-14 Dispositif d'imagerie et détection infrarouge sans pièces mobiles WO2017137972A1 (fr)

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PCT/IL2016/050173 WO2017137972A1 (fr) 2016-02-14 2016-02-14 Dispositif d'imagerie et détection infrarouge sans pièces mobiles
IL261129A IL261129A (en) 2016-02-14 2018-08-13 Infrared detection and imaging device with no moving parts

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Application Number Priority Date Filing Date Title
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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3711181A (en) * 1971-03-05 1973-01-16 Xerox Corp Optical notch filter
US3942871A (en) * 1974-04-29 1976-03-09 Xerox Corporation Liquid crystalline optical filter
US4099854A (en) * 1976-10-12 1978-07-11 The Unites States Of America As Represented By The Secretary Of The Navy Optical notch filter utilizing electric dipole resonance absorption
US20070070260A1 (en) * 2005-09-27 2007-03-29 Xinghua Wang Liquid crystal filter with tunable rejection band
US20070241280A1 (en) * 2006-04-17 2007-10-18 Nihon Kohden Corproation Apparatus for measuring concentration of gas
US20100315567A1 (en) * 2009-06-15 2010-12-16 Bing Wen Liquid crystal based broadband filter for fast polarization imaging

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3711181A (en) * 1971-03-05 1973-01-16 Xerox Corp Optical notch filter
US3942871A (en) * 1974-04-29 1976-03-09 Xerox Corporation Liquid crystalline optical filter
US4099854A (en) * 1976-10-12 1978-07-11 The Unites States Of America As Represented By The Secretary Of The Navy Optical notch filter utilizing electric dipole resonance absorption
US20070070260A1 (en) * 2005-09-27 2007-03-29 Xinghua Wang Liquid crystal filter with tunable rejection band
US20070241280A1 (en) * 2006-04-17 2007-10-18 Nihon Kohden Corproation Apparatus for measuring concentration of gas
US20100315567A1 (en) * 2009-06-15 2010-12-16 Bing Wen Liquid crystal based broadband filter for fast polarization imaging

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