WO2017054846A1 - Sampling device and method for sampling a liquid or viscous material - Google Patents

Sampling device and method for sampling a liquid or viscous material Download PDF

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Publication number
WO2017054846A1
WO2017054846A1 PCT/EP2015/072424 EP2015072424W WO2017054846A1 WO 2017054846 A1 WO2017054846 A1 WO 2017054846A1 EP 2015072424 W EP2015072424 W EP 2015072424W WO 2017054846 A1 WO2017054846 A1 WO 2017054846A1
Authority
WO
WIPO (PCT)
Prior art keywords
liquid
sampling device
receptacle
periphery
measuring
Prior art date
Application number
PCT/EP2015/072424
Other languages
French (fr)
Inventor
Péter SVIDRO
Attila DIOSZEGI
Original Assignee
Tekniska Högskolan I Jönköping Aktiebolag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tekniska Högskolan I Jönköping Aktiebolag filed Critical Tekniska Högskolan I Jönköping Aktiebolag
Priority to EP15770937.9A priority Critical patent/EP3356782A1/en
Priority to PCT/EP2015/072424 priority patent/WO2017054846A1/en
Publication of WO2017054846A1 publication Critical patent/WO2017054846A1/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/10Devices for withdrawing samples in the liquid or fluent state
    • G01N1/12Dippers; Dredgers
    • G01N1/125Dippers; Dredgers adapted for sampling molten metals
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01LCHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L3/00Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
    • B01L3/04Crucibles
    • CCHEMISTRY; METALLURGY
    • C21METALLURGY OF IRON
    • C21CPROCESSING OF PIG-IRON, e.g. REFINING, MANUFACTURE OF WROUGHT-IRON OR STEEL; TREATMENT IN MOLTEN STATE OF FERROUS ALLOYS
    • C21C5/00Manufacture of carbon-steel, e.g. plain mild steel, medium carbon steel or cast steel or stainless steel
    • C21C5/28Manufacture of steel in the converter
    • C21C5/42Constructional features of converters
    • C21C5/46Details or accessories
    • C21C5/4673Measuring and sampling devices
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D21/00Arrangements of monitoring devices; Arrangements of safety devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20Metals
    • G01N33/205Metals in liquid state, e.g. molten metals
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22DCASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
    • B22D27/00Treating the metal in the mould while it is molten or ductile ; Pressure or vacuum casting
    • CCHEMISTRY; METALLURGY
    • C21METALLURGY OF IRON
    • C21CPROCESSING OF PIG-IRON, e.g. REFINING, MANUFACTURE OF WROUGHT-IRON OR STEEL; TREATMENT IN MOLTEN STATE OF FERROUS ALLOYS
    • C21C1/00Refining of pig-iron; Cast iron
    • C21C1/10Making spheroidal graphite cast-iron
    • CCHEMISTRY; METALLURGY
    • C21METALLURGY OF IRON
    • C21CPROCESSING OF PIG-IRON, e.g. REFINING, MANUFACTURE OF WROUGHT-IRON OR STEEL; TREATMENT IN MOLTEN STATE OF FERROUS ALLOYS
    • C21C5/00Manufacture of carbon-steel, e.g. plain mild steel, medium carbon steel or cast steel or stainless steel
    • C21C5/52Manufacture of steel in electric furnaces
    • C21C2005/5288Measuring or sampling devices
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P10/00Technologies related to metal processing
    • Y02P10/20Recycling

Definitions

  • the present disclosure relates to a sampling device for sampling and analyzing a phase transformation of a liquid or viscous material, such as a melt for casting metal.
  • the disclosure also relates to a method of sampling a material and to a device for use in such sampling.
  • the device is particularly suited for analyzing a phase transformation of a metal or metal alloy, and especially the solidification of a metal or metal alloy melt.
  • Some defects are related to the composition of the melt and can, in some cases and within some limits, be compensated for by providing additives to the melt
  • EP1032718B1 discloses a method of producing a compacted graphite iron casting or spheroidal graphite cast iron, wherein a sampling operation is performed for determining an amount of structure-modifying agent that is to be added to the melt in order to obtain the desired type of iron.
  • EP0805964B1 discloses a sample holder that may be used in the method of EP1032718B1 .
  • An object of the present disclosure is to provide an improved method for prediction of phase transformation processes, including solidification processes of a metal melt, and a sampling device which can be used in the method.
  • a specific object is to provide increased reliability in predicting defects.
  • a sampling device for sampling a liquid or viscous material.
  • the sampling device comprises a receptacle, having a wall which is formed of a material having a higher melting point than that of the liquid or viscous material, and a probe channel extending from outside the receptacle and to the receptacle's center of gravity.
  • the receptacle is substantially spherical.
  • substantially is meant that the receptacle is formed as a sphere with a variation of less than 10 %, preferably less than 1 % or less than 0.5 % between a maximum radius and minimum radius. Moreover, it is meant that deviations from the perfect spherical shape are allowed by e.g. joint portions, where the device may be brazed, soldered or welded, and at openings.
  • the wall may be a single wall having a thickness which is less than 5
  • % of an inner radius of the receptacle preferably less than 2.5 % of the radius, preferably less than 1 .5 %.
  • the channel may be formed by a tube, which extends through the wall.
  • the channel may extend outwardly from the wall by a distance that is greater than a radius of the receptacle, preferably at least 200 % of the radius, at least 400 % of the radius or at least 600 % of the radius.
  • the receptacle may present a liquid or viscous material entry opening.
  • the receptacle may present only one opening.
  • the sampling device may comprise a closure part for closing the liquid or viscous material entry opening.
  • the closure part may be arranged freely on the inside of the liquid or viscous material entry opening.
  • the term "arranged freely” means that the closure part is not attached to the receptacle. Hence, there is no hinge or other mechanism providing any guided connection between the receptacle and the closure part.
  • the probe channel may extend through the closure. Hence, the position of the probe channel relative to the receptacle may be used to control an opening position of the closure part.
  • the closure part may be substantially part spherical.
  • the closure part is part spherical with the same radius as the receptacle. Hence, the closure part may provide as little impact as possible on the thermal field of the sample.
  • the part spherical closure part may have a base surface that is greater than the opening.
  • the sampling device may further comprise a splatter protection.
  • the receptacle wall material may comprises at least 50 % of a constituent which also forms at least 50 % of the liquid or viscous material.
  • the receptacle wall material may be selected from a group consisting of: a metallic material or a metal alloy, a polymeric material, a concrete material, and a glass material.
  • a method of sampling a liquid or viscous material comprises at least partially submerging a sampling device as claimed in any one of the preceding claims into the liquid or viscous materialfor a time sufficient to fill the sampling device with the liquid or viscous material, withdrawing the thus filled sampling device from the liquid or viscous material and measuring at least one of a temperature in or on the sampling device and/or a deformation of the sampling device.
  • the method may further comprise moving the sampling device to a measuring position.
  • the method may further comprise tilting the sampling device while submerged in the liquid or viscous material.
  • the method may further comprise measuring and recording a respective data series of core temperature, periphery temperature and periphery displacement during a phase transformation of the liquid or viscous material.
  • the liquid or viscous material may be selected from a group consisting of a metallic material or a metal alloy, a polymeric material, a concrete material, and a glass material.
  • a device for use in analyzing a phase transition process of a material comprises a gripping device for holding a spherical sample of the material, a core temperature measuring device for measuring a core temperature of the sample, a periphery temperature measuring device for measuring a
  • a periphery displacement measuring device for measuring a respective displacement in a point on the periphery of the sample
  • a processing device which is connected to the core temperature measuring device, the periphery temperature measuring device and the periphery displacement measuring device so as to receive a respective signal from said devices and to record a respective data series during a measurement period.
  • the material may be a liquid or viscous material
  • the device may further comprise a sampling device having a receptacle for receiving the sample of the liquid or viscous material, and the gripping device may be moveable between a collection position, wherein the sampling device is submerged in the material and a measuring position.
  • the gripping device may comprise a heat insulator, adapted for preventing heat transfer from the sample.
  • the periphery temperature measuring device may be arranged for measuring the periphery temperature in at least two, preferably four, different points on the periphery of the sample.
  • the periphery displacement measuring device may be arranged for measuring the periphery displacement in at least two, preferably four, different points on the periphery of the sample.
  • Fig. 1 is a schematic sectional view of a sample holder.
  • Figs 2a-2d schematically illustrate steps of a sample collection and measurement method.
  • Fig. 3 is a schematic flow chart of a method of analyzing a solidification process.
  • Fig. 4 shows recorded and smoothed cooling curves in the central thermocouple (T c ) and the average outer temperature on the surface of the sample (T w ).
  • Fig. 5 shows calculated volume change based on the measured diameter of the spherical sample.
  • Fig. 6 shows calculated release of latent heat during solidification calculated by the Fourier Thermal Analyze method.
  • Fig. 7 shows calculated change in pressure in the solidification interval represented as a function of temperature.
  • phase transformation process in the form of a solidification process of a liquid metal melt transforming to solid phase.
  • a sample holder 1 comprising a hollow receptacle 10, 1 1 , which presents a substantially spherical shape.
  • the receptacle comprises a receptacle space 10, which is enclosed by a receptacle wall 1 1 .
  • the receptacle may be spherical in that a radius R from a center C of the receptacle is the same for any direction inside the space 10.
  • a radius R from a center C of the receptacle is the same for any direction inside the space 10.
  • the radius may vary less than 10 %, preferably less than 1 % or less than 0.5 % between a maximum radius and a minimum radius.
  • the receptacle wall 1 1 may be formed of a thin plate of a material having a higher melting point than the material that is to be sampled.
  • the wall thickness Tw should be as small as possible. Where the receptacle is formed of a material that has a melting point that is close to that of the melt to be sampled, wall thickness Tw may be adapted to allow for a sufficient exposure time without collapsing.
  • Typical wall thicknesses may be less than 3mm, less than 2 mm, less than 1 .5 mm, less than 1 mm, less than 0.75 mm or less than 0.5 mm.
  • a sample holder for sampling an iron melt may be formed of a steel plate having higher carbon content than the iron melt.
  • the receptacle may be formed by forging plate blanks into respective part-spherically shaped pieces and then assembling the pieces by e.g brazing, welding or soldering to form a hollow body having a sufficiently thin wall.
  • Plate blanks may be forged or pressed into hemispheres or spherical lunes, which may be joined as mentioned above.
  • the receptacle may be formed by casting or molding.
  • the receptacle may be formed by metal spinning using a meltable or incinerable core of e.g. wax, polymer, or even ice, whereby a plate blank is shaped into a one piece spherical hollow body, after which the core is removed.
  • a meltable or incinerable core of e.g. wax, polymer, or even ice
  • An inside and/or outside of the receptacle may be surface treated to enhance or reduce adhesion of the melt that is to be sampled, or in order to protect the sample holder from premature degradation on contact with the melt.
  • surface treatment may be provided in order to protect the receptacle surface from thermal shock, as would be the case with a graphite based surface coating.
  • the receptacle 10 may have a single opening 12 through which the melt to be sampled may be let in and through which air may escape during such process.
  • a cover member such as a lid 13 may be provided to cover the opening, prevent splashing and reduce heat flux at the opening 12, in order to keep the heat flux as even as possible over the receptacle surface.
  • the cover member may be provided as a lid as illustrated in Fig. 1 .
  • Such a lid 13 may be positioned on an inside of the receptacle and be given a shape of a segment of a sphere having a major diameter that is slightly greater than a major diameter of the opening 12. Hence, the size of the lid 13 may prevent it from leaving the receptacle through the opening 12.
  • the lid could be attached to the receptacle by a hinge mechanism.
  • a tube 15 extends to the center C of the receptacle space 10.
  • the tube 15 may have an inner channel 14, which with a sufficient diameter for it to receive a temperature sensor and associated connection, such as wiring, for connecting the sensor to a measuring device.
  • the tube 15 may extend into the space 10 to such an extent that a temperature sensor (not shown), when received in the channel 14, is positioned so as to provide a temperature reading at the center C of the receptacle.
  • the tube 15 may extend to the center C of the receptacle, as illustrated in Fig. 1 .
  • the tube 15 extends through the lid 13 and may be fixedly connected to the lid.
  • the tube 15 may be prevented coming loose from the receptacle.
  • the tube 15 may extend outside of the receptacle such that it can be gripped and used for example for holding the sample holder 1 when collecting the sample and/or when performing measurements on a collected sample.
  • the tube 15 may be provided with a splash protection 16, which may prevent such splashing as may occur when air escapes out of the receptacle through the opening 12 when the sample holder is submerged into a metal melt.
  • the splash protection may be provided in the form of a substantially flat disc.
  • the tube 15 may extend through a wall 1 1 of the receptacle.
  • a through hole through which the tube 15 extends into the space 10 may be spaced from the opening 12.
  • the lid may be separate from the tube 15, as mentioned above.
  • the lid may be dispensed with, e.g. provided the additional heat flux can be dealt with or ignored.
  • a skeleton lid is provided, i.e. a lid which connects with the tube and prevents the tube from leaving the receptacle, but which has holes or openings that allow additional heat flux.
  • protection 16 may be made of the same material.
  • a sampling method will now be described, in which a sample holder 1 as described above may be used.
  • sample collection may be performed by hand by simply lowering the sample holder receptacle into the melt until it has filled with molten metal and then withdrawing it and placing it in a measurement fixture.
  • an automated sample collection device may be desirable.
  • a device may comprise a holder gripping device 31 , a tilt joint 32 (which is optional), a holder cradle 33 and a guide rail 34, along which the cradle 33 may travel.
  • the guide rail may be provided 34 with a first actuator (not shown) for causing the cradle 33 to travel along the guide rail 34 in a controlled manner.
  • the cradle 33 and/or the tilt joint 32 may comprise a second actuator (not shown) for causing the gripping device 31 to tilt relative to the cradle 33.
  • a measurement device 4 may be provided.
  • the measurement device may be based on a programmable computer having an interface for connecting to a plurality of measurement probes 41 , 42, 43, 44.
  • the measurement device may also comprise a controller that is arranged to provide signals for controlling the movements of the cradle 33 and/or the tilt joint 32.
  • a sample collecting operation wherein a sample of liquid metal is collected from a vessel 2 may be performed as follows.
  • a sample holder 1 is positioned to be held by the gripping device 31 .
  • the tube 15, e.g. a free end thereof, may be grasped by the gripping device 31 .
  • the gripping device 31 may be heat insulated so as to counteract heat transfer from the holder 1 .
  • the gripping device may be formed of a material having very low heat conductivity, and the part of the gripping device engaging the holder 1 may be made as small as possible.
  • a temperature probe 41 may be inserted into the channel 14 of the tube such that a sensing element is arranged at the center C of the space 10.
  • the cradle 33 is displaced along the guide 34 such that the receptacle is submerged into the melt.
  • the tube 15 and the lid which is attached thereto will shift downwardly relative to the opening 12, such that the liquid metal may flow into the space 10 through the opening 12.
  • the sample holder 1 may be tilted by about 5 ° -30 ° in order to ensure that no air is trapped under the lid and the space 10 is completely filled with liquid metal.
  • the sample holder 1 may be withdrawn and lifted from the liquid metal by the cradle 33 being displaced along the guide rail 34 to a measuring position. Before, during or after the withdrawal of the sample holder, any tilting may be reset such that the tube 15 is centered in the opening 12 and the lid 13 completely covers the opening 12.
  • thermo and radial displacement will be measured and recorded at different spots on the receptacle wall 1 1 during a solidification period. Such measurement may commence immediately on the sample holder reaching the measuring position.
  • four measurement spots may be provided with temperature and radial displacement being measured at each spot.
  • temperature measurement spots and four radial displacement measurement spots are provided, each of which being spaced from a respective temperature measurement spot.
  • Such displacement may be kept to a minimum, such as less than 1 cm, less than 0.5 cm or less than 0.25 cm.
  • the temperatures and displacements may be recorded with a sampling rate of 0.5-20 Hz, preferably 5-10 Hz.
  • the measurement, and thus the recording, may continue until the sample has reached a predetermined degree of solidification. If the
  • predetermined degree of solidification may be where the solidification process has ended. The measurement may continue until a predetermined
  • the time period that is analyzed may constitute a subset of the total measuring time.
  • a first step 100 the sampling device containing melt is introduced into the measuring position and measurements of core temperature, four different surface temperatures and four different radial displacements are provided.
  • each input data point may contain time, core temperature, first surface temperature, second surface temperature, third surface temperature, fourth surface temperature, first radial displacement, second radial displacement, third radial displacement and fourth radial displacement.
  • a noise reduction algorithm may be applied to the measured data.
  • a noise reduction algorithm may comprise a moving average or an interpolation algorithm. For example, for each point an average may be calculated based on the value in the point and in its neighboring points.
  • each noise reduced data point may contain time, noise reduced core temperature, noise reduced first surface temperature, noise reduced second surface temperature, noise reduced third surface temperature, noise reduced fourth surface temperature, noise reduced first radial displacement, noise reduced second radial displacement, noise reduced third radial displacement and noise reduced fourth radial displacement.
  • the surface temperatures T 2 may be averaged.
  • an average may be calculated based on the four temperatures measured at the surface at each point in time.
  • a temperature gradient may be provided based on the four points measured at each point in time, whereupon a difference in temperature between an actual temperature and a predicted temperature at one or more of the points may indicate that the receptacle is not entirely spherical and/or that the sensing element arranged at the center
  • the material was melted in a 50-kg medium frequency induction furnace. The material was superheated to 1460 °C and held for 20 minutes. The material was provided with a strontium based inoculant where the added inoculant was 0.05 % by weight of the total melt. The inoculant was added in the stream while the metal was trapped to a two hand ladle at a temperature of 1440 °C. In a fourth step 130, the radial displacements are averaged.
  • an average radial displacement may be calculated for each point in time.
  • each data point may contain time, core temperature Ti, average peripheral temperature T 2 and average displacement R 2 .
  • volume change of the sampling device is calculated based on the average displacement R 2 .
  • release of latent heat during solidification q s (t) is calculated for a plurality of, or all, points in time.
  • Z f (t) is termed the zero line since it coincides with the cooling curve when the source term is equal to zero, i.e. when the temperature is outside the solidification interval.
  • the latent heat of solidification can be expressed as
  • fM (t)dt (7)
  • equation (4) the volumetric heat capacity is unknown and can for the general case of one solidifying new phase be expressed as a linear combination of the values at the beginning and the end of the solidification interval, i.e.
  • the cooling rate can be determined from the experimental measurement.
  • the Laplace operator can be approximated by a simple finite difference approximation for the 1 -D spherical case as shown in equation (14), involving the two measuring points.
  • 2r fc ⁇ (14) where Ti and T 2 are the measured central and surface temperature.
  • Fig. 6 is a diagram showing the released heat during solidification q s (t) as a function of time.
  • a seventh step 150 the pressure in the inter granular liquid during solidification is calculated.
  • a generally known formula from thermodynamics the Clapeyron equation (15) is used to calculate the pressure as a function of the local temperature, released latent heat and the volume change of the sample within the solidification interval.
  • the outcome of the calculation ⁇ is the pressure variation during solidification as a function of temperature and is obtained by inserting the calculated heat release during solidification and the measured volume change.
  • Fig. 7 is a diagram showing the pressure during the solidification as a fuction of temperature
  • the main outcome of the calculation representing the pressure state variation under solidification is shown in Fig. 7.
  • the solidification starts with a slow variation and increase of depression until the minimum pressure is reached at 1 185 ° C where the primary crystal coherency is expected.
  • a release of the depression continue and a positive pressure is accumulated within the temperature interval 1 145 to 1 135 ° C corresponding the interval where the eutectic precipitation is dominated by graphite expansion.
  • the last interval of the solidification develop once again a depression, deeper than during the primary austenite precipitation.
  • the obtained solidification character can be interpreted as an alloy with a late depression which is not known from the literature and the max level of this negative spike can indicate the tendency for shrinkage porosity formation.
  • the disclosure is directed to a phase transformation from liquid to solid phase of a metallic material.
  • the method may be used for analyzing phase
  • transformations from solid to solid in a material sample e.g. a metal or metal alloy, which may transform between different solid phases.
  • the method may also be used to analyze phase transformations from solid to liquid, in which case the sample may need to be provided in a sample holder having sufficiently high melting point and the measurements may need to be provided in a temperature controlled, e.g. heated, environment.
  • the method may be used to analyze multiple phase transitions, such as liquid-solid-solid phase transformations.
  • the method and/or the sampling device may be used to analyze phase transformations in polymeric material, including phase transformations taking place during the "solidification” or “melting” of a thermoplastic material (i.e. a thermoplastic polymer or a thermoplastic elastomer, e.g. around a glass transition temperature or a melting
  • thermosetting polymeric material a thermosetting polymeric material
  • cross-linking of a rubber or rubber-like polymeric material a thermosetting polymeric material
  • the method may be used to analyze a hardening process of a concrete material.
  • the method may be used to analyze the melting and/or solidification process of a glass material.
  • the material of the sampling device will be selected so as to be suitable for the material that is to be sampled.

Abstract

A sampling device for sampling a liquid or viscous comprises a receptacle, having a wall which is formed of a material having a higher melting point than that of the material, and a probe channel extending from outside the receptacle and to the receptacle's center of gravity. The receptacle is substantially spherical.

Description

SAMPLING DEVICE AND METHOD FOR SAMPLING A LIQUID OR
VISCOUS MATERIAL
Technical Field
The present disclosure relates to a sampling device for sampling and analyzing a phase transformation of a liquid or viscous material, such as a melt for casting metal.
The disclosure also relates to a method of sampling a material and to a device for use in such sampling.
The device is particularly suited for analyzing a phase transformation of a metal or metal alloy, and especially the solidification of a metal or metal alloy melt.
Background
In connection with casting of metals, there is a risk of defect formation occurring during the solidification process, i.e. when the liquid metal solidifies. When such defects occur, the entire product may need to be scrapped and typically re-melted. In worst case, the defect is not discovered until later, e.g. when the product fails, whereby product safety is compromised.
Some defects are related to the composition of the melt and can, in some cases and within some limits, be compensated for by providing additives to the melt
Hence, there is a need for predicting the behavior of the melt during the solidification process.
EP1032718B1 discloses a method of producing a compacted graphite iron casting or spheroidal graphite cast iron, wherein a sampling operation is performed for determining an amount of structure-modifying agent that is to be added to the melt in order to obtain the desired type of iron.
EP0805964B1 discloses a sample holder that may be used in the method of EP1032718B1 .
There is still a need for improvements in the prediction of phase transformations, such as solidification processes. Summary
An object of the present disclosure is to provide an improved method for prediction of phase transformation processes, including solidification processes of a metal melt, and a sampling device which can be used in the method. A specific object is to provide increased reliability in predicting defects.
The invention is defined by the appended independent claims with embodiments being set forth in the dependent claims, in the following description and in the drawings.
According to a first aspect, there is provided a sampling device for sampling a liquid or viscous material. The sampling device comprises a receptacle, having a wall which is formed of a material having a higher melting point than that of the liquid or viscous material, and a probe channel extending from outside the receptacle and to the receptacle's center of gravity. The receptacle is substantially spherical.
By "substantially" is meant that the receptacle is formed as a sphere with a variation of less than 10 %, preferably less than 1 % or less than 0.5 % between a maximum radius and minimum radius. Moreover, it is meant that deviations from the perfect spherical shape are allowed by e.g. joint portions, where the device may be brazed, soldered or welded, and at openings.
By using a spherical receptacle, a more stable thermal field is provided, which in turn provides for more accurate temperature measurement during the solidification.
The wall may be a single wall having a thickness which is less than 5
% of an inner radius of the receptacle, preferably less than 2.5 % of the radius, preferably less than 1 .5 %.
Hence, it is possible to measure displacement on the wall surface.
The channel may be formed by a tube, which extends through the wall.
By using a tube, it is possible to reuse the thermocouple, while disposing of the remainder of the sampling device. The channel may extend outwardly from the wall by a distance that is greater than a radius of the receptacle, preferably at least 200 % of the radius, at least 400 % of the radius or at least 600 % of the radius.
The receptacle may present a liquid or viscous material entry opening. Preferably, the receptacle may present only one opening.
The sampling device may comprise a closure part for closing the liquid or viscous material entry opening.
The closure part may be arranged freely on the inside of the liquid or viscous material entry opening.
The term "arranged freely" means that the closure part is not attached to the receptacle. Hence, there is no hinge or other mechanism providing any guided connection between the receptacle and the closure part.
The probe channel may extend through the closure. Hence, the position of the probe channel relative to the receptacle may be used to control an opening position of the closure part.
The closure part may be substantially part spherical. Preferably the closure part is part spherical with the same radius as the receptacle. Hence, the closure part may provide as little impact as possible on the thermal field of the sample.
The part spherical closure part may have a base surface that is greater than the opening.
The sampling device may further comprise a splatter protection.
The receptacle wall material may comprises at least 50 % of a constituent which also forms at least 50 % of the liquid or viscous material.
The receptacle wall material may be selected from a group consisting of: a metallic material or a metal alloy, a polymeric material, a concrete material, and a glass material. According to a second aspect, there is provided a method of sampling a liquid or viscous material. The method comprises at least partially submerging a sampling device as claimed in any one of the preceding claims into the liquid or viscous materialfor a time sufficient to fill the sampling device with the liquid or viscous material, withdrawing the thus filled sampling device from the liquid or viscous material and measuring at least one of a temperature in or on the sampling device and/or a deformation of the sampling device.
The method may further comprise moving the sampling device to a measuring position.
The method may further comprise tilting the sampling device while submerged in the liquid or viscous material.
The method may further comprise measuring and recording a respective data series of core temperature, periphery temperature and periphery displacement during a phase transformation of the liquid or viscous material.
The liquid or viscous material may be selected from a group consisting of a metallic material or a metal alloy, a polymeric material, a concrete material, and a glass material.
According to a third aspect, there is provided a device for use in analyzing a phase transition process of a material. The device comprises a gripping device for holding a spherical sample of the material, a core temperature measuring device for measuring a core temperature of the sample, a periphery temperature measuring device for measuring a
temperature in a point on a periphery of the sample, a periphery displacement measuring device for measuring a respective displacement in a point on the periphery of the sample, and a processing device, which is connected to the core temperature measuring device, the periphery temperature measuring device and the periphery displacement measuring device so as to receive a respective signal from said devices and to record a respective data series during a measurement period.
The material may be a liquid or viscous material, in which case the device may further comprise a sampling device having a receptacle for receiving the sample of the liquid or viscous material, and the gripping device may be moveable between a collection position, wherein the sampling device is submerged in the material and a measuring position.
The gripping device may comprise a heat insulator, adapted for preventing heat transfer from the sample. The periphery temperature measuring device may be arranged for measuring the periphery temperature in at least two, preferably four, different points on the periphery of the sample.
The periphery displacement measuring device may be arranged for measuring the periphery displacement in at least two, preferably four, different points on the periphery of the sample.
Brief Description of the Drawings
Fig. 1 is a schematic sectional view of a sample holder.
Figs 2a-2d schematically illustrate steps of a sample collection and measurement method.
Fig. 3 is a schematic flow chart of a method of analyzing a solidification process.
Fig. 4 shows recorded and smoothed cooling curves in the central thermocouple (Tc) and the average outer temperature on the surface of the sample (Tw).
Fig. 5 shows calculated volume change based on the measured diameter of the spherical sample.
Fig. 6 shows calculated release of latent heat during solidification calculated by the Fourier Thermal Analyze method.
Fig. 7 shows calculated change in pressure in the solidification interval represented as a function of temperature.
Detailed Description
The description will be directed to a phase transformation process in the form of a solidification process of a liquid metal melt transforming to solid phase.
Referring to Fig. 1 , there is illustrated a sample holder 1 comprising a hollow receptacle 10, 1 1 , which presents a substantially spherical shape. The receptacle comprises a receptacle space 10, which is enclosed by a receptacle wall 1 1 .
The receptacle may be spherical in that a radius R from a center C of the receptacle is the same for any direction inside the space 10. However, such a receptacle may be difficult to produce, and in reality, minor deviations must be accepted. For example, the radius may vary less than 10 %, preferably less than 1 % or less than 0.5 % between a maximum radius and a minimum radius.
The receptacle wall 1 1 may be formed of a thin plate of a material having a higher melting point than the material that is to be sampled.
The wall thickness Tw should be as small as possible. Where the receptacle is formed of a material that has a melting point that is close to that of the melt to be sampled, wall thickness Tw may be adapted to allow for a sufficient exposure time without collapsing.
For example, the concept of additives which modify melting point is well known to the skilled person.
Typical wall thicknesses may be less than 3mm, less than 2 mm, less than 1 .5 mm, less than 1 mm, less than 0.75 mm or less than 0.5 mm.
For example, a sample holder for sampling an iron melt may be formed of a steel plate having higher carbon content than the iron melt.
The receptacle may be formed by forging plate blanks into respective part-spherically shaped pieces and then assembling the pieces by e.g brazing, welding or soldering to form a hollow body having a sufficiently thin wall.
Plate blanks may be forged or pressed into hemispheres or spherical lunes, which may be joined as mentioned above.
At joints thus formed, additional tolerance for variation in the radius R may need to be tolerated.
As further options, the receptacle may be formed by casting or molding.
As yet another option, the receptacle may be formed by metal spinning using a meltable or incinerable core of e.g. wax, polymer, or even ice, whereby a plate blank is shaped into a one piece spherical hollow body, after which the core is removed.
An inside and/or outside of the receptacle may be surface treated to enhance or reduce adhesion of the melt that is to be sampled, or in order to protect the sample holder from premature degradation on contact with the melt. For example, such surface treatment may be provided in order to protect the receptacle surface from thermal shock, as would be the case with a graphite based surface coating.
The receptacle 10 may have a single opening 12 through which the melt to be sampled may be let in and through which air may escape during such process.
A cover member, such as a lid 13 may be provided to cover the opening, prevent splashing and reduce heat flux at the opening 12, in order to keep the heat flux as even as possible over the receptacle surface.
The cover member may be provided as a lid as illustrated in Fig. 1 .
Such a lid 13 may be positioned on an inside of the receptacle and be given a shape of a segment of a sphere having a major diameter that is slightly greater than a major diameter of the opening 12. Hence, the size of the lid 13 may prevent it from leaving the receptacle through the opening 12.
In alternative embodiments, the lid could be attached to the receptacle by a hinge mechanism.
In the illustrated embodiment, a tube 15 extends to the center C of the receptacle space 10.
The tube 15 may have an inner channel 14, which with a sufficient diameter for it to receive a temperature sensor and associated connection, such as wiring, for connecting the sensor to a measuring device.
The tube 15 may extend into the space 10 to such an extent that a temperature sensor (not shown), when received in the channel 14, is positioned so as to provide a temperature reading at the center C of the receptacle.
For example, the tube 15 may extend to the center C of the receptacle, as illustrated in Fig. 1 .
In the example illustrated in Fig. 1 , the tube 15 extends through the lid 13 and may be fixedly connected to the lid.
Hence, in an embodiment where the lid 13 is prevented from leaving the space 10, also the tube 15 may be prevented coming loose from the receptacle. Moreover, the tube 15 may extend outside of the receptacle such that it can be gripped and used for example for holding the sample holder 1 when collecting the sample and/or when performing measurements on a collected sample.
The tube 15 may be provided with a splash protection 16, which may prevent such splashing as may occur when air escapes out of the receptacle through the opening 12 when the sample holder is submerged into a metal melt. The splash protection may be provided in the form of a substantially flat disc.
In alternative embodiments, the tube 15 may extend through a wall 1 1 of the receptacle. Thus in such embodiments, a through hole through which the tube 15 extends into the space 10 may be spaced from the opening 12.
Also, in such an embodiment the lid may be separate from the tube 15, as mentioned above.
In further alternatives, the lid may be dispensed with, e.g. provided the additional heat flux can be dealt with or ignored.
An embodiment would also be conceivable where a skeleton lid is provided, i.e. a lid which connects with the tube and prevents the tube from leaving the receptacle, but which has holes or openings that allow additional heat flux.
The receptacle wall 1 1 , the lid 13, the tube 15 and the splash
protection 16 may be made of the same material.
Referring to Figs 2a-2d, a sampling method will now be described, in which a sample holder 1 as described above may be used.
It is recognized that the sample collection may be performed by hand by simply lowering the sample holder receptacle into the melt until it has filled with molten metal and then withdrawing it and placing it in a measurement fixture.
In the following, it is envisaged that an automated sample collection device may be desirable. Such a device may comprise a holder gripping device 31 , a tilt joint 32 (which is optional), a holder cradle 33 and a guide rail 34, along which the cradle 33 may travel. The guide rail may be provided 34 with a first actuator (not shown) for causing the cradle 33 to travel along the guide rail 34 in a controlled manner. Moreover, the cradle 33 and/or the tilt joint 32 may comprise a second actuator (not shown) for causing the gripping device 31 to tilt relative to the cradle 33.
Referring to Fig. 2d, a measurement device 4 may be provided. The measurement device may be based on a programmable computer having an interface for connecting to a plurality of measurement probes 41 , 42, 43, 44.
The measurement device may also comprise a controller that is arranged to provide signals for controlling the movements of the cradle 33 and/or the tilt joint 32.
A sample collecting operation, wherein a sample of liquid metal is collected from a vessel 2 may be performed as follows.
Referring to Fig. 2a, a sample holder 1 is positioned to be held by the gripping device 31 . In the illustrated example, the tube 15, e.g. a free end thereof, may be grasped by the gripping device 31 .
The gripping device 31 may be heat insulated so as to counteract heat transfer from the holder 1 . For example, the gripping device may be formed of a material having very low heat conductivity, and the part of the gripping device engaging the holder 1 may be made as small as possible.
At this stage, a temperature probe 41 may be inserted into the channel 14 of the tube such that a sensing element is arranged at the center C of the space 10.
The cradle 33 is displaced along the guide 34 such that the receptacle is submerged into the melt. Through the buoyancy of the initially air-filled receptacle, the tube 15 and the lid which is attached thereto will shift downwardly relative to the opening 12, such that the liquid metal may flow into the space 10 through the opening 12.
Referring to Fig. 2b, the sample holder 1 may be tilted by about 5°-30° in order to ensure that no air is trapped under the lid and the space 10 is completely filled with liquid metal.
Referring to Fig. 2c, the sample holder 1 may be withdrawn and lifted from the liquid metal by the cradle 33 being displaced along the guide rail 34 to a measuring position. Before, during or after the withdrawal of the sample holder, any tilting may be reset such that the tube 15 is centered in the opening 12 and the lid 13 completely covers the opening 12.
Referring to Fig. 2d, at the measuring position, temperature and radial displacement will be measured and recorded at different spots on the receptacle wall 1 1 during a solidification period. Such measurement may commence immediately on the sample holder reaching the measuring position.
In one embodiment, four measurement spots may be provided with temperature and radial displacement being measured at each spot.
In an alternative embodiment, four temperature measurement spots and four radial displacement measurement spots are provided, each of which being spaced from a respective temperature measurement spot. Such displacement may be kept to a minimum, such as less than 1 cm, less than 0.5 cm or less than 0.25 cm.
Also during the solidification period, temperature is measured and recorded at the center C of the space 10.
The temperatures and displacements may be recorded with a sampling rate of 0.5-20 Hz, preferably 5-10 Hz.
The measurement, and thus the recording, may continue until the sample has reached a predetermined degree of solidification. If the
measurement starts with a sample having only liquid phase, this
predetermined degree of solidification may be where the solidification process has ended. The measurement may continue until a predetermined
temperature is reached, or through a predetermined time period after such temperature has been reached. The time period that is analyzed may constitute a subset of the total measuring time.
It is possible to protect the measurement position from e.g. draft, by introducing surrounding walls, which may be thermally insulated, but this is not necessary.The description will now focus on the method of analyzing a sample taken using the sampling device. An overview of the nomenclature used in the equations is provided at the end of the present description.
In a first step 100, the sampling device containing melt is introduced into the measuring position and measurements of core temperature, four different surface temperatures and four different radial displacements are provided.
Hence, each input data point may contain time, core temperature, first surface temperature, second surface temperature, third surface temperature, fourth surface temperature, first radial displacement, second radial displacement, third radial displacement and fourth radial displacement.
In a second step 1 10, a noise reduction algorithm may be applied to the measured data. Such a noise reduction algorithm may comprise a moving average or an interpolation algorithm. For example, for each point an average may be calculated based on the value in the point and in its neighboring points.
Hence, each noise reduced data point may contain time, noise reduced core temperature, noise reduced first surface temperature, noise reduced second surface temperature, noise reduced third surface temperature, noise reduced fourth surface temperature, noise reduced first radial displacement, noise reduced second radial displacement, noise reduced third radial displacement and noise reduced fourth radial displacement.
In a third step 120, the surface temperatures T2 may be averaged.
In a basic embodiment, an average may be calculated based on the four temperatures measured at the surface at each point in time.
In a another embodiment, a temperature gradient may be provided based on the four points measured at each point in time, whereupon a difference in temperature between an actual temperature and a predicted temperature at one or more of the points may indicate that the receptacle is not entirely spherical and/or that the sensing element arranged at the center
C of the receptacle is in fact not exactly centered. Based on this
measurement, it is possible to determine and compensate for the
displacement of the wall from the theoretical centre point.
Based on an experimental measurement, an example of average core temperature T1 and average (according to the basic embodiment) peripheral temperature T2 is plotted in Fig. 4.
In the experiment, a ferrous material having the following composition
(with the remainder being Fe) was used: Element C Si Mn P S Cr Mo Cu
% by 3.5 1 .8 0.6 0.05 0.1 0.15 0.25 0.88 weight
The material was melted in a 50-kg medium frequency induction furnace. The material was superheated to 1460 °C and held for 20 minutes. The material was provided with a strontium based inoculant where the added inoculant was 0.05 % by weight of the total melt. The inoculant was added in the stream while the metal was trapped to a two hand ladle at a temperature of 1440 °C. In a fourth step 130, the radial displacements are averaged.
In the basic embodiment, an average radial displacement may be calculated for each point in time.
Hence, in the basic embodiment, each data point may contain time, core temperature Ti, average peripheral temperature T2 and average displacement R2.
In a fifth step 140, volume change of the sampling device is calculated based on the average displacement R2.
Based on the experimental measurement, average volume change at each point in time is plotted in Fig. 5.
In a sixth step 150, release of latent heat during solidification qs(t) is calculated for a plurality of, or all, points in time.
Thermal analysis of solidification processes is known from e.g.
Dioszegi, A. & Svensson, I.: On the problems of thermal analysis of solidification, Materials Science and Engineering A (Impact Factor: 2.41 ).
12/2005; 413:474-479. The used method also named Fourier Thermal
Analyze method is based on the numerical solution of the heat conduction equation.
In the general case of temperature dependent properties, this equation reads
V(kVT) + qsol
~dt where qsol is the volumetric heat source term. If k is assumed constant, equation (1) can be expressed as = aV2T + ^L a =— pC =Cv (2) dt Cv pCp dT
Rearranging equation (2) and substituting qsol by 5and— by T , the dt
released heat rate in the solidification interval can be calculated as function of time t qs =CvT-CvaV2T (3) or qs(t) = Cv(t)(†(t)-Zf(t)) (4) where
ZP(t) = a(t)V2T(t) (5)
It should be noted that Zf(t) is termed the zero line since it coincides with the cooling curve when the source term is equal to zero, i.e. when the temperature is outside the solidification interval.
Integrating the released heat over the time interval of solidification, the latent heat of solidification can be expressed as
Figure imgf000015_0001
Considering the solidification interval, the released heat can then be used to express the evolution of fraction solid as a function of time, by a cumulative function, i.e. fM = (t)dt (7)
Figure imgf000015_0002
Considering equation (4), the volumetric heat capacity is unknown and can for the general case of one solidifying new phase be expressed as a linear combination of the values at the beginning and the end of the solidification interval, i.e.
Figure imgf000016_0001
Alloys used in industrial practice precipitate several phases during solidification. An example is the hypoeutectic cast iron where the solid phase at the beginning is primary austenite followed by the eutectic mixture of secondary austenite and graphite. For this particular case, the volumetric heat capacity is given by cr (t) =c"«f'!q (t) + c usfaus (t) + fgr (t) (9) * (,) + «"» (,) + (,) = ! (1 0) fliq (t) = l - fs (t) (1 1 ) Volumetric heat capacity values for cr>b , CK e , C"q , C m and Cf have to be calculated according to equation (2). Appropriate data can be calculated using models proposed in the litterature to calculate heat capacity, Cp , and density of metals.
Considering equation (5), the thermal diffusivity a is unknown and can be expressed for the solidification interval by a similar linear combination as given for Cv , i.e.
Figure imgf000016_0002
where the thermal diffusivity at the start and end of solidification, ab and ae , can be found from equation (2) by considering the heat source qsol = 0 , Equations (4) and (5) include the cooling rate T and the Laplace operator V2 T. The cooling rate can be determined from the experimental measurement. The Laplace operator can be approximated by a simple finite difference approximation for the 1 -D spherical case as shown in equation (14), involving the two measuring points. 2r = fc^ (14) where Ti and T2 are the measured central and surface temperature. Ri and F¾ are the polar radial coordinates of the central and surface position where the temperature are registered. For the present case Ri=0 if the thermal field is concentric around around the central thermocouple.
An iteration procedure for obtaining qs(t) (released heat during solidification) can now be established by considering equations (4), (5), (6), (7), (8) and (12) for the general case of one solidifying phase or considering the same equations but substituting equation (8) by a subroutine containing equations (9), (10) and (1 1 ) for the particular case of hypoeutectic cast iron.
Such an iteration procedure is solved by a robust numerical algorithm.
A mathematical validation of the algorithm exists where the analyzed solidification data (cooling curves) were produced by a forward numerical solidification. The used heat release in the numerical simulation was recovered accurately by the iteration procedure.
Fig. 6 is a diagram showing the released heat during solidification qs(t) as a function of time.
In a seventh step 150, the pressure in the inter granular liquid during solidification is calculated. A generally known formula from thermodynamics the Clapeyron equation (15) is used to calculate the pressure as a function of the local temperature, released latent heat and the volume change of the sample within the solidification interval.
dP _ AH
dT ~ T * AV (15) If the pressure and the temperature vary along the phase transition line integration of equation (15) yield
and ob
Figure imgf000018_0001
The outcome of the calculation Δρ is the pressure variation during solidification as a function of temperature and is obtained by inserting the calculated heat release during solidification and the measured volume change.
Fig. 7 is a diagram showing the pressure during the solidification as a fuction of temperature
The main outcome of the calculation representing the pressure state variation under solidification is shown in Fig. 7. The solidification starts with a slow variation and increase of depression until the minimum pressure is reached at 1 185 °C where the primary crystal coherency is expected. A release of the depression continue and a positive pressure is accumulated within the temperature interval 1 145 to 1 135 °C corresponding the interval where the eutectic precipitation is dominated by graphite expansion. The last interval of the solidification develop once again a depression, deeper than during the primary austenite precipitation. The obtained solidification character can be interpreted as an alloy with a late depression which is not known from the literature and the max level of this negative spike can indicate the tendency for shrinkage porosity formation.
In order to be able to interpret the resulting pressure graphs, it will be necessary to perform tests, whereby samples are analyzed to provide pressure graphs according to the method disclosed above, and evaluated for defects, whereby defects are correlated to pressure graphs or parts of pressure graphs.
As mentioned by way of introduction, the disclosure is directed to a phase transformation from liquid to solid phase of a metallic material. However, the method may be used for analyzing phase
transformations from solid to solid in a material sample, e.g. a metal or metal alloy, which may transform between different solid phases.
The method may also be used to analyze phase transformations from solid to liquid, in which case the sample may need to be provided in a sample holder having sufficiently high melting point and the measurements may need to be provided in a temperature controlled, e.g. heated, environment.
In addition, the method may be used to analyze multiple phase transitions, such as liquid-solid-solid phase transformations.
Moreover, the method and/or the sampling device may be used to analyze phase transformations in polymeric material, including phase transformations taking place during the "solidification" or "melting" of a thermoplastic material (i.e. a thermoplastic polymer or a thermoplastic elastomer, e.g. around a glass transition temperature or a melting
temperature), during the hardening of a thermosetting polymeric material, or during the cross-linking of a rubber or rubber-like polymeric material.
Moreover, the method may be used to analyze a hardening process of a concrete material.
Moreover, the method may be used to analyze the melting and/or solidification process of a glass material.
The material of the sampling device will be selected so as to be suitable for the material that is to be sampled.
Capital letters
Cp Heat capacity, Jkg"1K"1
L Heat capacity of the liquid phase, Jkg"1K"1
Heat capacity of the austenite, Jkg"1K"1
gr Heat capacity of the graphite, Jkg"1K"1
Volumetric heat capacity, Jm"3K"1
c Volumetric heat capacity at the start of solidification, Jm"3K'
CV,e Volumetric heat capacity at the end of solidification, Jm"3K" liq Volumetric heat capacity of the liquid phase, Jm"3K"1 aus Volumetric heat capacity of the austenite, Jm"3K"1 r< gr Volumetric heat capacity of the graphite, Jm"3K"1
L, ΔΗ Latent heat of solidification, J kg"1
Ri , R2 Space position, m
† Cooling rate, °Cs"1
T Temperature, °C
Ti Temperature in central point, °C
T2 Temperature in lateral point, °C
T|iq Liquidus temperature, °C
Ttr Temperature at primary to eutectic transition, °C
Tsol Solidus temperature, °C
ZF Fourier zero line , °Cs"1
Small letters
fs Fraction solidified metal
q Fraction liquid
†aus
Fraction austenite
Fraction graphite
f tr Fraction solidified at primary to eutectic transition
> fstr sim Fraction solidified at primary to eutectic transition, input for simulation f rinv Fraction solidified at primary to eutectic transition, calculated by the inverse method
k, kj Thermal conductivity, Wm"1K"1
qsol , qs Released heat during solidification used in heat conduction equation, Wm"3
tb Start time of solidification, s
te End time of solidification, s
Greek letters
a Thermal diffusivity, m2s"1
ab Thermal diffusivity at the start of solidification, m2s"1
ae Thermal diffusivity at the end of solidification, m2s"1
V2T Laplace operator
p Density, kgm"3
p'iq Density of liquid, kgm"3
paus Density of austenite, kgm"3 pgr Density of graphite, kgm"3

Claims

1 . A sampling device for sampling a liquid or viscous material comprising:
a receptacle, having a wall which is formed of a material having a higher melting point than that of the liquid or viscous material, and
a probe channel extending from outside the receptacle and to the receptacle's center of gravity,
characterized in that
the receptacle is substantially spherical.
2. The sampling device as claimed in claim 1 , wherein the wall is a single wall having a thickness which is less than 5 % of an inner radius (R) of the receptacle, preferably less than 2.5 % of the radius or less than 1 .5 %.
3. The sampling device as claimed in claim 1 or 2, wherein the channel is formed by a tube, which extends through the wall.
4. The sampling device as claimed in any one of the preceding claims, wherein the channel extends outwardly from the wall by a distance that is greater than a radius of the receptacle, preferably at least 200 % of the radius, at least 400 % of the radius or at least 600 % of the radius.
5. The sampling device as claimed in any one of the preceding claims, wherein the receptacle presents a liquid or viscous material entry opening.
6. The sampling device as claimed in claim 5, wherein the sampling device comprises a closure part for closing the liquid or viscous material entry opening.
7. The sampling device as claimed in claim 7, wherein the closure part is arranged freely on the inside of the liquid or viscous material entry opening.
8. The sampling device as claimed in claim 6 or 7, wherein the probe channel extends through the closure.
9. The sampling device as claimed in any one of claims 6-8, wherein the closure part is substantially part spherical.
10. The sampling device as claimed in any one of the preceding claims, further comprising a splatter protection.
1 1 . The sampling device as claimed in any one of the preceding claims, wherein at the receptacle wall material comprises at least 50 % of a constituent which forms at least 50 % of the liquid or viscous material.
12. The sampling device as claimed in any one of the preceding claims, wherein the receptacle wall material is selected from a group consisting of:
a metallic material or a metal alloy,
a polymeric material,
a concrete material, and
a glass material.
13. A method of sampling a liquid or viscous material, comprising: at least partially submerging a sampling device as claimed in any one of the preceding claims into the liquid or viscous material for a time sufficient to fill the sampling device with the liquid or viscous material,
withdrawing the thus filled sampling device from the liquid or viscous material, and measuring at least one of a temperature in or on the sampling device and/or a deformation of the sampling device.
14. The method as claimed in claim 13, further comprising:
moving the sampling device from a filling position to a measuring position.
15. The method as claimed in claim 14, further comprising tilting the sampling device while submerged in the liquid or viscous material.
16. The method as claimed in claim 14 or 15, further comprising measuring and recording a respective data series of core temperature, periphery temperature and periphery displacement during a phase
transformation of the liquid or viscous material.
17. The method as claimed in any one of claims 13-16, wherein the liquid or viscous material is selected from a group consisting of
a metallic material or a metal alloy,
a polymeric material,
a concrete material, and
a glass material.
18. A device for use in analyzing a phase transition process of a material, comprising:
a gripping device for holding a spherical sample of the material, a core temperature measuring device for measuring a core
temperature of the sample,
a periphery temperature measuring device for measuring a
temperature in a point on a periphery of the sample,
a periphery displacement measuring device for measuring a respective displacement in a point on the periphery of the sample, and a processing device, which is connected to the core temperature measuring device, the periphery temperature measuring device and the periphery displacement measuring device so as to receive a respective signal from said devices and to record a respective data series during a
measurement period.
19. The device as claimed in claim 18, wherein the material is a liquid or viscous material, the device further comprises a sampling device having a receptacle for receiving the sample of the liquid or viscous material, and the gripping device is moveable between a collection position, wherein the sampling device is submerged in the material and a measuring position.
20. The device as claimed in claim 18 or 19, wherein the gripping device comprises a heat insulator, adapted for preventing heat transfer from the sample.
21 . The device as claimed in any one of claims 18-20, wherein the periphery temperature measuring device is arranged for measuring the periphery temperature in at least two, preferably four, different points on the periphery of the sample.
22. The device as claimed in any one of claims 18-21 , wherein the periphery displacement measuring device is arranged for measuring the periphery displacement in at least two, preferably four, different points on the periphery of the sample.
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