WO2017008112A1 - Positionnement de guide d'ondes - Google Patents

Positionnement de guide d'ondes Download PDF

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Publication number
WO2017008112A1
WO2017008112A1 PCT/AU2016/050608 AU2016050608W WO2017008112A1 WO 2017008112 A1 WO2017008112 A1 WO 2017008112A1 AU 2016050608 W AU2016050608 W AU 2016050608W WO 2017008112 A1 WO2017008112 A1 WO 2017008112A1
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WO
WIPO (PCT)
Prior art keywords
waveguide
shadow
angle
polished end
axis
Prior art date
Application number
PCT/AU2016/050608
Other languages
English (en)
Inventor
Keith Powell
Xiaoke Yi
Original Assignee
The University Of Sydney
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AU2015902764A external-priority patent/AU2015902764A0/en
Application filed by The University Of Sydney filed Critical The University Of Sydney
Publication of WO2017008112A1 publication Critical patent/WO2017008112A1/fr

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/42—Coupling light guides with opto-electronic elements
    • G02B6/4201—Packages, e.g. shape, construction, internal or external details
    • G02B6/4219—Mechanical fixtures for holding or positioning the elements relative to each other in the couplings; Alignment methods for the elements, e.g. measuring or observing methods especially used therefor
    • G02B6/422—Active alignment, i.e. moving the elements in response to the detected degree of coupling or position of the elements
    • G02B6/4221—Active alignment, i.e. moving the elements in response to the detected degree of coupling or position of the elements involving a visual detection of the position of the elements, e.g. by using a microscope or a camera
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/42—Coupling light guides with opto-electronic elements
    • G02B6/4201—Packages, e.g. shape, construction, internal or external details
    • G02B6/4219—Mechanical fixtures for holding or positioning the elements relative to each other in the couplings; Alignment methods for the elements, e.g. measuring or observing methods especially used therefor
    • G02B6/422—Active alignment, i.e. moving the elements in response to the detected degree of coupling or position of the elements
    • G02B6/4227—Active alignment methods, e.g. procedures and algorithms

Definitions

  • the present disclosure relates to determining a position of a waveguide and positioning the waveguide.
  • a system or apparatus often includes a plurality of components that need to be located, positioned and aligned to a specified configuration such that the components are assembled together. This may involve an operator observing, such as by eyesight, the components and moving the components to the specified configuration for assembly.
  • a high-power microscope together with a camera may be used to observe the optical fibre, and an operator may make manual adjustments towards the specified configuration.
  • a camera such as a CCD camera
  • Such systems with high quality lenses may be costly.
  • the combination of the microscope and CCD camera may have a narrow field of view at high magnification levels that may make observation difficult, for example if the optical fibre is initially outside of the field of view.
  • such techniques may involve significant manpower that increases cost and may have low efficiency.
  • a method of determining a position of a waveguide comprises: projecting a beam of light towards the waveguide to cast a shadow such that the shadow is detectable by a planar array of light sensors receiving from the multiple light sensors, a signal indicative of a size and position of the shadow; and determining the position of the waveguide in at least two dimensions based on the signal, wherein one dimension is along a path of the beam.
  • the multiple light sensors may be a planar array of light sensors.
  • the method may allow determination of a position of the waveguide without using high magnification lenses and cameras.
  • the waveguide may be a waveguide for electromagnetic waves.
  • the waveguide is an optical waveguide such as an optical fibre.
  • the waveguide is a ribbon fibre having a plurality of optical fibres.
  • the step of receiving from the multiple light sensors a signal indicative of a size and position of the shadow comprises: detecting, with the multiple light sensors, an intensity of light at a plurality of positions along an observation axis of an observation plane; and determining the size and position of the shadow based on the detected intensity of light at the plurality of positions along the observation axis. In some arrangements, this may allow determination of the size and position of the shadow without a camera.
  • the multiple light sensors detecting the intensity of light may provide an output indicative of one of two binary results, such as whether the respective sensor detects an intensity of light that satisfies a specified threshold (such as above a certain intensity) or does not satisfy the specified threshold (such as below a certain intensity).
  • the step of receiving, from the multiple light sensors, the signal may further comprise: detecting the intensity of light with a linear sensor array associated with the observation axis.
  • detecting the intensity of light with a linear sensor array associated with the observation axis.
  • the step of determining the position of the waveguide in at least two dimensions may comprise: determining, along the observation axis, the positions of two opposite edges of the shadow based on changes in the detected intensity of light;
  • the step of projecting a beam of light towards the waveguide to cast a shadow may further comprise redirecting the beam with one or more reflective surfaces towards the multiple light sensors. This may allow a more compact arrangement for an apparatus performing this method.
  • the step of projecting a beam of light may comprise projecting a diverging beam of light from a light source.
  • the waveguide is positioned relative to a component having a component reflective surface, wherein the step of redirecting the beam with one or more reflective surfaces towards the multiple light sensors comprises redirecting the beam with the component reflective surface.
  • the method of determining a position of a waveguide may further comprise the step of sending the determined position of the waveguide to a controller, wherein the controller includes a processor to provide a control signal to one or more actuators to move at least part of the waveguide.
  • the shadow may be cast from an elongated portion of the waveguide, wherein the elongated portion has an elongated portion axis substantially normal to a plane defined by the two dimensions, and the beam of light includes rays projected towards the waveguide in a direction perpendicular to the elongated portion axis.
  • the elongated portion axis corresponds to a central axis of the waveguide (at that respective elongated portion of the waveguide). This configuration may assist determination, such as mathematical calculation or approximation, of the position of the waveguide.
  • the waveguide may be an optical fibre where the elongated portion of the waveguide has an angle polished end.
  • the method may further comprise: positioning the angle polished end at multiple positions along the elongated portion axis, and determining, for the respective multiple positions, a signal indicative of a size and position of the shadow; and determining an observed gradient of the angle polished end based on the signals corresponding to the respective multiple positions along the elongated portion axis, wherein the observed gradient is indicative of a polish angle of the angle polished end and an angle of rotation of the angle polished end about the elongated portion axis.
  • the angle polished end may have a specified polish angle, wherein the method further comprises determining the angle of rotation of the angle polished end about the elongated portion axis based on the observed gradient and the specified polish angle. The may assist alignment of the angle polished end with a second waveguide and/or coupler.
  • the method of determining a position of a waveguide may further comprise: projecting an additional beam of light towards the waveguide to cast an additional shadow detectable by the multiple light sensors, or additional multiple light sensors; and receiving, from the multiple light sensors, or the additional multiple light sensors, an additional signal indicative of a size and position of the additional shadow, wherein determining the position of the waveguide in at least two dimensions is based on the signal indicative of the size and position of both the shadow and the additional shadow.
  • a method of positioning a waveguide comprises: determining the position of the waveguide such as in the methods described above; comparing the determined position of the waveguide to a specified position of the waveguide; and sending a control signal to one or more actuators to move the waveguide based on the result of the comparison.
  • the method of positioning a waveguide may further comprise: determining an angle of rotation of an angle polished end such as in the methods described above; comparing the determined angle of rotation of the angle polished end with a specified angle of rotation; and sending a second control signal to the one or more actuators to rotate the waveguide based on the result of the comparison of the angle of rotation.
  • the method of positioning a waveguide may comprise comparing the observed gradient with an expected gradient and sending a control signal to the one or more actuators to rotate the waveguide based on the result of the comparison of the angle of rotation.
  • the expected gradient corresponds to a correctly aligned waveguide and may be based on a previously observed gradient (of a correctly aligned waveguide) or may be calculated based on mathematical equations, such as those described herein.
  • a method of coupling a waveguide with a second waveguide comprising the steps of: positioning the waveguide such as in the methods described above, wherein the specified position of the waveguide allows the waveguide to be coupled to the second waveguide; and fastening the waveguide relative to the second waveguide.
  • the method may also comprise aligning the waveguide with a grating coupler associated with the second waveguide.
  • software that, when installed on a computer, causes the computer to perform the method described above.
  • an apparatus to determine a position of a waveguide comprising: a light source to project a beam of light towards the waveguide to cast a shadow; multiple light sensors to detect the shadow and send a signal indicative of a size and position of the shadow; a processing device to determine the position of the waveguide in at least two dimensions based on the signal, wherein one dimension is along a path of the beam.
  • the multiple light sensors may comprise a linear sensor array to detect an intensity of light at a plurality of positions along an observation axis on an observation plane, wherein the processor is further arranged to determine the size and position of the shadow based on the detected intensity of light at the plurality of positions along the observation axis.
  • the apparatus may further comprise a mirror to redirect the beam towards the observation plane.
  • the light source may comprise a laser light source.
  • the light source may comprise a single light source or a multiple light source.
  • the waveguide may be an optical fibre having an elongated portion with an elongated portion axis substantially normal to the two dimensions, and the elongated portion having an angle polished end.
  • the apparatus may further comprise: an actuator to position the angle polished end at multiple positions along the elongated portion axis, and wherein the multiple light sensors further sends, for the respective multiple positions, a signal indicative of a size and position of the shadow; and wherein the processor is further arranged to: determine an observed gradient of the angle polished end based on the signals corresponding to the respective multiple positions, wherein the observed gradient is indicative of a polish angle of the angle polished end and an angle of rotation of the angle polished end about the elongated portion axis.
  • the apparatus may further comprise: an additional light source to project an additional beam of light towards the waveguide to cast an additional shadow; additional multiple light sensors, or the multiple light sensors, to detect the additional shadow and send an signal indicative of a size and position of the additional shadow, wherein the processor is further arranged to determine the position of the waveguide in the two dimensions based on the signal and additional signal.
  • an apparatus to position a waveguide comprising: an apparatus to determine a position of the waveguide such as the apparatus described above; and one or more actuators to move the waveguide, wherein the processor is further arranged to compare the determined position of the waveguide to a specified position of the waveguide and to determine a control signal for the one or more actuators to move the waveguide based on the result of the comparison.
  • the apparatus may be arranged to determine an angle of rotation of an angle polished end based on the determined observed gradient and wherein the processor is further arranged to compare the determined angle of rotation of the angle polished end with a specified angle of rotation and to determine a second control signal for the one or more actuators to rotate the waveguide based on the result of the comparison of the angle of rotation.
  • the processor may be arranged to compare the observed gradient with an expected gradient and to determine a second control signal for the one or more actuators to rotate the waveguide based on the result of the comparison of the angle of rotation.
  • an apparatus to couple a waveguide with a second waveguide comprising: an apparatus to position a waveguide such as the apparatus described above, wherein the specified position of the waveguide allows the waveguide to be coupled to the second optical waveguide; and a device to fasten the waveguide relative to the second optical waveguide.
  • Fig. 1 is a perspective view of an apparatus to determine the position of a waveguide
  • Fig. 2a is a schematic side view of an apparatus to determine the position of a waveguide
  • Fig. 2b is a simplified side view of Fig. 2a illustrating a method of determining the position of the waveguide
  • Fig. 2c is another simplified side view of Fig. 2a illustrating an another method of determining the position of the waveguide
  • Fig. 3 is a flow diagram of a method for determining the position of a waveguide
  • Figs. 4a and 4b are side and front view of an angle polished end and a coupler at a first angle of rotation
  • Figs. 5a and 5b are side and front views of the angle polished end and coupler at a second angle of rotation ninety degrees from that shown in Figs. 4a and 4b;
  • Fig. 6 illustrates a sequence with the angle polished end of the waveguide at multiple positions along a z axis and the resultant shadow when the angle polished end is at the first angle of rotation;
  • Fig. 7 illustrates a sequence with the angle polished end of the waveguide at multiple positions along the z axis and the resultant shadow when the angle polished end is at the second angle of rotation;
  • Fig. 8 is a flow diagram of a method for determining the angle of rotation of the waveguide;
  • Fig. 9 is a perspective view of an alternative apparatus to determine the position of a waveguide including a mirror
  • Fig. 10 is a perspective view of another apparatus to determine the position of a waveguide including two mirrors;
  • Fig. 11 is a perspective view of another apparatus to determine the position of a waveguide including two mirrors, two light sources and two light sensors;
  • Figs 12a and 12b are side and front views of an angle polished end and a horizontal angle fibre coupling
  • Fig. 13 illustrates an example of a processing device
  • Fig. 14 illustrates a simulation of the relationship between the performance of the apparatus in a y axis and the distance d;
  • Fig. 15 is a flow diagram of a method of positioning a waveguide and coupling the waveguide to a second waveguide.
  • FIGs. 16a and 16b are side views of another apparatus to determine the position of a waveguide using two shadows, wherein the waveguide is displaced in an x direction;
  • Figs. 17a and 17b are side view of the apparatus in Fig. 16 with the waveguide displaced in a y direction;
  • Figs. 1 and 2 illustrate an apparatus 1 to determine the position of a waveguide 3.
  • the apparatus 1 includes a light source 5 to project a beam of light 7 towards the waveguide 3 to cast a shadow 9.
  • Multiple light sensors 13 are provided to detect the shadow 9 and send a signal indicative of a size and position of the shadow 9.
  • a position of the waveguide 3 in at least two dimensions is then determined based on the signal, wherein one dimension is along a path of the beam 7.
  • a processing device 16 may assist in determining the position of the waveguide 3.
  • the shadow 9 is cast at an observation plane 1 1, and the signal is indicative of a size and position of the shadow 9 at the observation plane 1 1.
  • Figs. 1 and 2 the two dimensions are across a two-dimensional plane 15 that extends across the x and y axes, where the x and y axes are perpendicular to each other.
  • the x axis in this example, is along the path of the beam 7.
  • the waveguide 3 may include an optical fibre with an elongated portion 17, where the elongated portion 17 extends along an elongated portion axis 19 that is substantially parallel to a z axis that is, in turn, normal to the two-dimensional plane 15.
  • the beam of light 7 is projected in a direction that is substantially perpendicular to the elongated portion axis 19.
  • the observation plane 1 1 is substantially parallel to the x and y axes.
  • the apparatus 1 may also include a fibre holder 21 to support the waveguide 3.
  • the fibre holder 21 may be associated with a fibre alignment stage 23 that includes associated actuators 25 to move the supported waveguide 3 in one or more of the x, y and z axes.
  • the fibre alignment stage 23 and associated actuators 25 may also rotate the waveguide 3 about one or more of the x, y and z axes. This may allow positioning and alignment of the waveguide 3 which will be discussed in further detail below.
  • the apparatus 1 may also include a second alignment stage 27.
  • the second alignment stage 27 may support a component 29, such as a photonic chip, that is to be positioned and aligned relative to the waveguide 3.
  • the second alignment stage 27 may be fixed.
  • the second alignment stage may have associated actuators 25 to move and/or rotate the component 29.
  • positioning and aligning the waveguide 3 relative to the component 29, may involve moving the waveguide 3 whilst keeping the component 29 stationary, keeping the waveguide 3 stationary whilst moving the component 29, or a combination of moving both the waveguide 3 and component 29.
  • a device 31 may be provided to fasten the waveguide 3 to the component 29.
  • An advantage of the apparatus 1 may include determining the position of the waveguide 3 without using expensive magnification devices and cameras. Another advantage of the apparatus 1 may include automating the determination of the position of the waveguide 3. A further advantage may include automating not only
  • the method 100 includes the step of projecting 110 a beam of light 7 towards the waveguide 3 to cast a shadow 9 such that the shadow 9 is detectable by multiple light sensors 13.
  • the light source 5 projects a beam of light 7 that may include a diverging beam 7 of rays. Some rays 7' are incident on the waveguide 3. Other rays 7" are projected towards and are incident on the observation plane 11 at which the multiple light sensors 13 are located. The result is that a shadow 9 that may be detected on the observation plane 11.
  • the method also includes the step of receiving 120, from the multiple light sensors 13, a signal indicative of a size and position of the shadow 9. In one example, this includes the size and position of the shadow 9 at the observation plane 11.
  • the observation plane 11 may be a surface on which the rays 7" and/or the shadow 9 can be observed.
  • the light sensor 13 may be located at the observation plane 11, whereby the light sensor 13 detects the intensity of light at multiple locations on the observation plane 11.
  • a signal indicative of the size and position of the shadow 9 may be based on the observations of the intensity of light at respective locations on the multiple light sensors 13 at the observation plane 11.
  • light rays 7" are incident at lit locations 33 on the multiple light sensors 13 whereby sensor elements at the lit locations 33 will detect an intensity of light.
  • the shadow 9 is cast on shadow locations 35 on the multiple light sensors 13 where sensor elements at the shadow locations 35 will detect a lower (or no) intensity of light.
  • the size and location of the shadow 9 can be represented in a number of ways. In one example (as illustrated in Fig.
  • the size of the shadow 9 is the shadow width (h s ) 39 that may be defined by the distance between opposite edges 37a, 37b of the shadow 9.
  • the position of the shadow may be represented by the location of one or more of the opposite edges 37a, 37b from a reference.
  • the reference is a central beam axis 41, where the opposite edges 37a and 37b are located at respective distances (hi, h 2 ) 43a, 43b from the central beam axis 41.
  • the average (h av ) 44 of the two distances 43a and 43b may be used as the shadow position on the observation plane 11.
  • the method 100 also includes the step 130 of determining the position of the waveguide 3 in at least two dimensions based on the signal (that is indicative of a size 39 and position of the shadow 9), wherein on dimension is along a path of the beam.
  • one dimension, in the x axis, is along a path of the beam.
  • the other dimension may be on the y axis.
  • the position of the waveguide 3 may be determined with mathematical functions or approximations. Some illustrative examples are provided below.
  • FIG. 2b is a simplified representation of Fig. 2a.
  • the position of the waveguide 3 to be determined is shown as position x f , y f which is relative to an origin 45 at the light source 5. These locations may be approximated by resolving the following equations:
  • x s is the distance from the origin 45 to the observation plane 1 1 which is a known value of the apparatus 1.
  • h f is the approximate height, in the y axis, of the waveguide 3. Since the waveguide 3 is circular and relatively small in height, h f can be approximated to be a known diameter of the waveguide 3.
  • h 1 is the distance from the central beam axis 41 to the lower edge 37a of the shadow 9 which may be determined at step 120.
  • h 2 is the distance from the central beam axis 41 to the upper edge 37b of the shadow 9 which may be determined at step 120.
  • Equations (1) and (2) are derived from trigonometric functions, in particular the tangent of an angle of similar triangles.
  • the triangle formed by points 45, 51 and 53 is similar to the triangle formed by points 45, 55 and 57. Therefore the tangent of the angle of these two triangles is identical to provide equation (1).
  • equation (2) the triangle formed by points 45 59 and 53 is similar to the triangle formed by points 45, 61 and 57 thereby providing equation (2). Since x s , h f h 1 and h 2 are known or determined by the apparatus 1, equations (1) and (2) may be resolved as simultaneous equations to provide the position x f , y f of the waveguide 3.
  • equation (5.1) is accurate even when the waveguide 3 is positioned off the central beam axis 41, by any angle ⁇ which is incurred when the waveguide is moved by some value of y > 0 that represents the most common scenario, since there is only one point at which the waveguide may exist in which [0079]
  • equations (1.2) and (2.2) to relate the additional angle ⁇ to the change in y position of the waveguide 3 to distance from the light source 5 to the waveguide x L f, waveguide diameter D f and imaginary projected image height h 0 if a circular object with diameter equivalent to y were placed directly next to the waveguide with diameter D f such that the total measured shadow width at the image plane becomes h m + h 0 and solving equations (1.2) and (2.2) we get equation (3.2) which expresses the variables independent of a and Aa but without losing the significance of those variables.
  • Equation (3.2) Rearranging equation (3.2) we can express equation (4.2) in terms of x position x Lf .
  • Equation (5.2) The unknown variable h Q can be solved for by rearranging equation (5.2) which expresses h 0 in terms of optical path length (I) and x position of the waveguide x Lf , to get equation (6.2).
  • Equation (6.2) The value of h Q found in equation (6.2) is then substituted into equation (4.2) and rearranged to get equation (7.2) which is in terms of the x position of the waveguide x Lf .
  • Equations (8.2), (9.2) and (10.2) show the process of simplification, where finally the final expression is obtained in equation (1 1.2) which shows that x Lf is in fact the same regardless of the y offset of the waveguide, and hence the expression shown in equation (5.1) is a complete representation of the waveguide x position based on the measured shadow width, when circular waveguides are used.
  • the above equations may be used to determine an approximation of the position x Lf y of the waveguide 3. It is to be appreciated that other mathematical equations and approximations may be used to determine the position of the waveguide 3 based on the dimensions of the shadow 9 or parameters indicative of the shadow position and shadow size.
  • the position of opposite shadow edges 37a and 37b were used to determine the position of the waveguide 3.
  • the position of the shadow edges 37a and 37b may be considered parameters that are indicative of the shadow width, as the difference in position of the shadow edges 37a and 37b indicate the shadow width.
  • configuration of the apparatus 11 may allow small angle approximations to be used to determine the position x f f of the waveguide 3. For example, it may be assumed that the triangle formed between points 45, 75 and 77 is a triangle approximately similar to the triangle formed by lines 71, 73 and the shadow 9 at the observation plane.
  • waveguide may have an angle polished end that tapers towards a tip.
  • An angle polished end may be desirable in some applications, over a flat polished end, to prevent or reduce light reflecting back into the fibre. To couple the optical fibres with respective connectors, this may require positioning the end of the optical fibre with the respective connector as well as ensuring the angle or rotation of the optical fibre at the angle polished end is at a specified rotation angle.
  • the angled fibre end may also assist in reflecting light to a coupler by internal reflection of light due to a change in refractive index at the angled fibre to air interface.
  • the angle of rotation affects the direction in which light is reflected off the angle polished end 206 and consequently a misaligned angle polished end 206 can adversely affect the performance of the optical fibre 3 and coupling. Therefore, it is important to determine the angle of rotation.
  • Fig. 4 illustrates a waveguide, in the form of an optical fibre 203, having an elongated portion 204 for use in a horizontal angle fibre coupling.
  • the elongated portion 204 has an angle polished end 206.
  • the angle polished end 206 is orientated such that light traveling along elongated portion axis 219 may be reflected off the angle polished end 206 and towards the silicon grating 230 of a coupler 229.
  • the angle polished end 206 is orientated so that a tip 218 of the optical fibre 203 is proximal to the coupler 229.
  • the angle polished end 206 is at an angle of rotation of zero degrees (around the elongated portion axis 219) as shown in Fig. 4b.
  • Fig. 5 illustrates the optical fibre 203 ' having the angle polished end 206' with an angle of rotation of ninety degree from that shown in Fig. 4.
  • the tip 218' has an angle of rotation that is ninety degrees anti-clockwise. Therefore even though the optical fibre 203 ' is approximately in the correct location relative to the coupler 229, the angle polished end 206' is not aligned correctly for coupling.
  • Fig. 6 illustrates a sequence of the method 300 when the angle of rotation is at zero degrees as shown in Figs. 4.
  • Fig. 7 illustrates a sequence of the method 300 when the angle of rotation is at ninety degrees anti-clockwise as shown in Fig. 5.
  • the method includes initially providing the optical fibre 203 ' at the apparatus 1, similar to the method 100 described above, where the elongated portion axis 219 of the optical fibre 203 ' is substantially normal to the two-dimensional plane 15.
  • Fig. 6 show a sequence where the angle polished end 206 is positioned 310 at multiple positions along the elongated portion axis 219.
  • the elongated portion axis 219 in this embodiment, is substantially parallel to the z axis.
  • the movement of the angle polished end 206 may be achieved by movement of the fibre alignment stage 23.
  • the sensor line 250 is representative of the beam of light 7 between the light source 5 and the multiple light sensors 13, which may be in a direction perpendicular to the elongated portion axis 219. Therefore an intersection of the sensor line 250 and the waveguide 203 in Fig.
  • FIG. 6 represents, if any, the portion of the waveguide 203 that would cast a shadow 209b, 209c, 209d, 209e, 209f and 209g.
  • shadow 209 represented in Figs. 6 (and Fig. 7) is not to scale and that the shadow width 39 is not necessarily equivalent to the diameter of the optical fibre 203 or elongated portion 204. Instead, Fig. 6 illustrates the portions of the angle polished end 206 that would cast the resultant shadow 209.
  • the shadow width (h s ) 39 for each of the shadows may be determined.
  • the change in the shadow width between one or more of the shadows divided by the displacement (along the elongated portion axis 219/ z axis) would represent the observed gradient of the angle polished end. This may be represented by the equation below:
  • Shadows 209c, 209d and 209e in Fig. 6 may be appropriate candidate values for determining the change in shadow width.
  • Shadows 209b, 209f and 209g may be less suitable as they represent the minimum and maximum shadow widths and change in displacement along the elongated portion axis / z axis may not provide an accurate observed gradient that is representative of the angle of rotation of the angle polished end 206.
  • the determined 320 observed gradient (m) is indicative of the polish angle and the angle of rotation of the angle polished end 206. Therefore, for a known, or specified, polish angle, the observed gradient (m) may be used to determine 330 the angle of rotation of the angle polished end 206. This may be used to confirm that the angle of rotation is correct, and if otherwise, compare the angle of rotation with the specified angle of rotation. The comparison may then be used to determine the rotation and/or movement required so that the angle polished end is at the specified angle of rotation.
  • one opposite edge 37a of the shadow remains in the same position relative to the central beam axis 41 (shown in Fig. 2), whilst the other opposite edge 37b progressively moves relative to the central beam axis 41.
  • This change in position of the opposite edges 37a, 37b may also be indicative of the angle of rotation.
  • the shadow edge 37a remaining at the same relative position may be indicative of the waveguide 3 and tip 218 orientated at zero degrees as shown in Figs. 4 and 6.
  • Fig. 7 illustrates a sequence where the angle polished end 206' is at ninety degrees, and illustrates a corresponding shadows 209' . It is apparent that the shadows 209c' and 209d' are as different positions and have different sizes compared to that shown in Fig. 6 that had illustrated an angle of rotation of zero degrees. For example, in Fig. 6, the opposite edges 37a and 37b both move away from each other relative to the central beam axis 41.
  • the rate of change in the shadow width relative to the change in displacement in the z axis is much greater.
  • the resultant shadow 209e' has a shadow width 39 that would be the same as the shadow width of the full diameter of the waveguide 203 (see shadows 209e', 209f , 209g' in Fig. 7).
  • the resultant shadow 206d has a shadow width 39 that is only half of that of the shadow 39 that would be cast from the full diameter of the waveguide 203 (see shadows 209f and 209g).
  • the observed gradient and/or position of the shadow edges 37a, 37b may be indicative of the angle of rotation. It is to be appreciated that the observed gradient may be used to determine the corresponding angle of rotation by trigonometric or other mathematical formulas. Alternatively, a lookup table may be used to determine the angle of rotation.
  • the above examples are illustrative methods of determining the observed gradient and subsequently determining an angle of rotation.
  • the determination was, in turn, used to determine if the angle polished end is at the correct angle.
  • other method of calculation, estimation, or approximation may be used to determine if the angle of rotation is that of the specified angle of rotation.
  • the comparison may include comparing the observed gradient with an expected gradient that would correspond to a correctly aligned waveguide 3.
  • the expected gradient may be based on one or more previously observed gradients and respective known angle of rotation. This may be included in a lookup table.
  • the expected gradient may be calculated from mathematical equations such as those described herein.
  • the above methods 100, 300 describe determining the position and angle of rotation of a waveguide 3.
  • the method may further include positioning of the waveguide 3 as illustrated in the method 800 illustrated in Fig. 15.
  • the method 800 includes the step 810 of comparing the determined position of the waveguide 3 to a specified position of the waveguide 3.
  • the specified position may include a position that aligns the waveguide 3 with the component 29, grating 230, coupler 229 etc.
  • the method 800 further includes the step 820 of sending a control signal to one or more actuators 25 to move the waveguide 3 based on the result of the comparison. This may include moving the waveguide 3 such that the waveguide 3 is moved towards the specified position so that the waveguide 3 may be coupled with another component.
  • a further step 830 includes fastening the waveguide 3 with another component.
  • the other component includes a second waveguide, grating 230, coupler 229, component 29. Different methods of fastening the waveguide 3 with another component are discussed in further detail below.
  • Fig. 1 illustrated the apparatus 1 in one embodiment where the light source 5 projects a beam 7 that is substantially perpendicular to the elongated portion axis 19 as well as the observation plane 11.
  • the apparatus 1 may simplify determination of the position of the waveguide 3.
  • the beam 7 may not necessarily be perpendicular to the elongate portion axis 19 and/or the observation plane 11.
  • Fig. 9 illustrates another apparatus 401 to determine the position of a waveguide 3.
  • the apparatus 401 includes a mirror 450, having a reflective surface, to redirect the beam of light 407 from the light source 5 to observation plane 11.
  • the beam of light 407 includes a first section 407a from the light source 5 to the mirror 450 and a second section 407b from the mirror 450 to the observation plane 411.
  • the waveguide 3 is positioned in the path of the first section 407a such that a shadow would be carried over and cast by the second section 407b onto the observation plane 11.
  • the mirror 450 may assist in facilitating a more desirable configuration of the apparatus 1. For example, redirecting the beam 407 with a mirror 450 may allow the apparatus to have a more compact configuration than the configuration shown in Fig. 1.
  • the mirror 450 may also allow a longer beam path which, in some embodiments, may assist in increasing the resolution to facilitate determination of the position of the waveguide 3 with greater accuracy.
  • the mirror 450 may allow the observation plane 11 and/or the multiple light sensors 13 to be located in a more convenient location such that it does not interfere with other components of the apparatus 401 (or vice versa), such as the alignment stages 23, 27, actuators 25, and/or device 31 to fasten the waveguide.
  • the mirror 450 is orientated such that the central beam axis 41 of the first section 407a and second section 407b are perpendicular to each other. This may facilitate ease of determining the position of the waveguide 3. However, in other embodiments, the mirror 450 may be orientated such that the central beam axis 41 of the first and second sections 407a, 407b are non-perpendicular. In one example, the respective beam axes may form an obtuse angle. An obtuse angle may result in greater divergence of second section 407b that in turn results in a corresponding larger shadow width at the observation plane 11. This may increase accuracy of determining the position of the waveguide 3.
  • Fig. 10 illustrates yet another apparatus 501 to determine the position of the waveguide 3.
  • the apparatus 501 includes two mirrors 450a, 450b to redirect the beam in multiple directions.
  • the beam includes a first section 507a, a second section 507b and a third section 507c. This may further increase the advantages of the mirror 450 as described above.
  • the light source 5 projects the first section 407a, 507a of the beam towards the waveguide 3.
  • the beam may first be directed towards a mirror, and the resultant redirected beam is then, in turn, directed towards the waveguide 3.
  • Fig. 11 illustrates yet another apparatus 601 for determining the position of the waveguide 3.
  • the apparatus includes some similarities to the apparatus 401 shown in Fig. 9.
  • the apparatus 601 includes reflective surfaces 650a, 650b that are partially reflective mirrors that allow some light to be transmitted through the reflective surface.
  • the apparatus 601 also includes two light sources 605a, 605b and
  • Each of the light sensors 613a, 613b is associated with a respective observation plane 611a, 61 lb and observation axis 12a, 12b.
  • the provision of two lights sources and respective multiple light sensors 613a, 613b may assist determination of the position of the waveguide 3 by increasing the signal to noise ratio. This may also improve resolution and accuracy of the apparatus 1 by taking a differential measurement. Furthermore, the data obtained from multiple light sensors 613a may be compared with data obtained from multiple light sensors 613b to reduce or eliminate common mode noise that may result from external lighting from a light source or sources that are not the intentional projection source.
  • the light sources 605a, 605b provide different wavelengths to reduce interference of the beams 607, 608 with one another.
  • the reflective surfaces may be formed of a transparent substrate, such as glass, coated with a thin layer of reflective material, such as aluminium, gold or conductive material with a plasma frequency less than that of the wavelength of light being reflected.
  • a transparent substrate such as glass
  • a thin layer of reflective material such as aluminium, gold or conductive material with a plasma frequency less than that of the wavelength of light being reflected.
  • Normally transparent materials may also be used, such that the desired angle of reflection is within the critical angle of refraction, and that the index of refraction of the material is lower than the surrounding medium (e.g. air).
  • additional light sources and sensors may be used. This may include providing light sensors in additional axes to determine, from one or more shadows, the position of the waveguide in three dimensions. This may also include determining the orientation of the waveguide 3 in three perpendicular axes (e.g. in the x, y, z axes).
  • Additional light sources and sensors may also provide redundancy for the apparatus. This may improve reliability of the apparatus and improve error detection.
  • the data from multiple light sources and sensors may be averaged to reduce errors. Error detection may include comparing redundant information and determining an error based on the comparison. For example, if the comparison indicates a variance greater than a specified threshold.
  • FIGs. 16 and 17 illustrate yet another variation of the apparatus 701 that uses two shadows to determine the position of the waveguide 3 from a component 29.
  • the apparatus 701 includes a light source 705 that projects two beam portions of light 707a, 707b towards the waveguide 3.
  • the first beam portion of light 707a is projected directly from the light source 705, whilst the second beam portion of light 707b is projected towards a reflective surface 28 of a component 29, whereby the second beam portion of light 707b is then reflected towards the waveguide 3. That is, the reflective surface 28 of the component 29 acts as a mirror.
  • the two beam portions 707a, 707b may be part of a wider diverging beam of light from the light source 705, such as beam portions between the top 708a and the bottom 708b of the wider diverging beam.
  • the two beam portions 707a, 707b cast respective shadows.
  • a first shadow 709a direct shadow
  • second shadow 709b reflection shadow
  • multiple light sensors such as multiple light sensor 13 at an observation plane 11 described above
  • the size and position of the respective shadows 709a, 709b may then be used to determine the position of the waveguide 3 as discussed below.
  • Fig. 16a shows the waveguide 3 in a first position above the component 29.
  • Fig. 16b shows the waveguide 3 displaced along the x axis (in particular the negative x axis direction) towards the light source 705, with the displacement in the other axes y and z equal. This displacement in the x axis causes a corresponding shift in position of the shadows 709a and 709b at the observation plane 11.
  • both the shadows 709a and 709b will move in unison on the observation plane 11.
  • the heights 746, 748 of the shadows 709a and 709b may vary slightly (depending on the amount on movement along the x axis (but for relatively small movements may be substantially unchanged).
  • the relative distance 744 between the shadows 709a and 709b may also be substantially unchanged.
  • the vertical position of the shadow displaced along the observation plane 11 is changed as shown be the changes in height (in particular the increase in height from 743a to 743a').
  • the change in displacement in the x axis is proportional to the change in the height 743a of the shadow 709a (and/or proportional to the change in height of shadow 709b).
  • the above mentioned apparatus and methods allow determination of a change in position in the x axis and it is to be appreciated that this can also allow determination of the specific position on the x axis, for example by using calibration data to determine the corresponding position on the x axis that cast a shadow 709a and/or 709b on the observation plane.
  • Fig. 17a shows the waveguide 3 at a first position above the component 29.
  • Fig. 17b shows the waveguide displaced along the y axis (in particular the negative y direction) towards, and in contact with, the surface 28 of the component 29.
  • the displacement in the y axis is proportional to the relative distance 744 between the shadows 709a and 709b. Accordingly, the position in the y axis may also be determined in a similar manner as described above. [0125] The preceding paragraphs illustrate how to determine the position in the x and y axis and it is to be appreciated that these can be used in combination to
  • the shadows 709a and 709b from an angle polished end may be used to determine the position of the waveguide in the z axis. For example, assuming the waveguide is in a fixed position in the x and y axis, then the shadows 709a and 709b (or an average/median location of the shadows 709a, 709b) will not have a relative distance 744 that will vary nor a height 743a that will vary.
  • the changes in the shadows 709a and 709b may be attributable to changes in the angle of rotation and/or change in displacement in the z axis. Since only one shadow 709a or 709b is required to determine an angle of rotation, comparing changes between the two shadows may, in some circumstances be used to determine a change in displacement in the z axis (as the angle polished end of the waveguide 3 starts to cast a shadow as shown in Figs. 6 and 7 above).
  • Fig. 18 shows yet another embodiment of the apparatus 1801 with two light sources 1805a, 1805b to cast three shadows of the waveguide 3, including a first shadow 1809a (direct shadow), a second shadow 1809b (reflection shadow) and a third shadow 1809c (projected shadow).
  • a first light source 1805a projects a diverging beam between a top 1808a and bottom 1808b to cast the first shadow 1809a and second shadow 1809b in a similar manner as discussed above with reference to Figs. 16 and 17.
  • the shadows 1809a, 1809b detected at the observation plane 11 may then be used to determine the position of the waveguide 3.
  • a second light source 1805b projects a diverging beam, between a top 1808c and bottom 1808d, directly at the waveguide 3 to cast the third shadow 1809c.
  • the third shadow 1809c is projected at the observation plane in a similar manner as discussed above with reference to Figs. 2a to 2c such that the third shadow 1809c can also be detected and used to determine the position of the waveguide 3.
  • the two methods of determining the position may then be combined to allow an increase in resolution, accuracy and/or error detection.
  • the combined position may be an average or a weighted average of the determined positions.
  • a mean variance between determined positions is determined and if the mean variance is above an acceptable threshold, an alert or error message is generated.
  • the first light source 1805a and the second light source 1805b may project light having a respective first wavelength ⁇ 1 and a second wavelength ⁇ 2 .
  • Each of the wavelengths ⁇ 1; ⁇ 2 are selected to be sufficiently spaced within the spectrum such that they do not interfere with each other at the light sensors detecting the shadows 1809a, 1809b, 1809c at the observation plane 11. This will limit the free spectral range (FSR) between the peak wavelengths in the respective light sources 1805a, 1805b (which may be in the form of laser light sources).
  • FSR free spectral range
  • the spacing between the wavelengths ⁇ 1; ⁇ 2 will also depend on the full width at half maximum (FWHM) of the light output of each light source 1805a, 1805b and the extinction ratio between detected wavelengths at the image sensor. In some examples, the light sensors will detect each wavelength separately, and therefore have an infinite extinction ratio.
  • FWHM full width at half maximum
  • Fig. 19 shows yet another embodiment with two light sources 1905a, 1905b to cast four shadows 1909a, 1909b, 1909c, 1909d shadows.
  • Each of the light sources 1905a, 1905b are configured to project light at the component surface 29 at an angle to provide a pair of shadows at the observation plane 11 as described above with reference to Figs. 16 to 17.
  • a first light source 1905a is configured at a first angle ⁇ to a perpendicular beam axis 1041 (that is perpendicular to the observation plane 11) to project a diverging beam, between a top 1908a and a bottom 1908b, towards the component 29.
  • a first shadow 1909a (direct shadow) and a second shadow 1909b (reflection shadow) of the waveguide 3 is cast at the observation plane 11. These shadows 1909a, 1909b may be used to determine the position of the waveguide 3.
  • a second light source 1905b is configured at a second angle ⁇ 2 to the perpendicular beam axis 1041 to project a diverging beam, between a top 1908c and a bottom 1908d, towards the component 29.
  • a third shadow 1909c (direct shadow) and a fourth shadow 1909d (reflection shadow) of the waveguide 3 is cast at the observation plane 11. These shadows 1909a, 1909b may also be used to determine the position of the waveguide 3.
  • the first and second angles ⁇ , ⁇ 2 are selected so that for an expected (or common) range of positions of the waveguide 3, the resultant shadows 1909a, 1909b, 1909c, 1909d are separately spaced over the measurement range of the multiple light sensors at the observation plane 11. That is, the shadows do not overlap and interfere (or are less likely to interfere). This may allow better accuracy of the determined position.
  • the first wavelength ⁇ 1 of the first light source 1905a may be different to the second wavelength ⁇ 2 of the second light source 1905b, so long as the FSR between the wavelengths ⁇ , ⁇ 2 , are large enough to allow isolated detection between shadows of different wavelengths with light sensors at the observation plane 11.
  • the multiple light sources include a beam splitter to create multiple light sources from a single light source.
  • the two beams may be provided alternatively from respective sources, whereby the timing of the two beams may be used to differentiate between the shadows cast by the different respective light sources.
  • the resolution, and hence accuracy, of the apparatus 1 is dependent on, inter alia i the distance d between the light source 5 and the observation plane 1 1, the distance d 0 between the light source and the waveguide 3 and the diameter of the waveguide (approximated as y 0 ) and the pixel pitch of the sensor elements in the multiple light sensors 13.
  • Equation (13) can be rearranged in terms of the waveguide distance do from the light source 5 to provide:
  • the highest possible resolution in the y axis may then be calculated using equation (15) to which provides 127.2 nm.
  • magnification factor it may be possible to increase a magnification factor to achieve greater accuracy by providing the waveguide 3 at a relative distance closer to the light source 5 which, ceteris paribus, would result in a larger shadow width.
  • the relationship of the magnification factor and distance may be illustrated in Fig. 14 that shows the simulated performance results in terms of y axis sensitivity. From these diagrams 901, 903, 905, the resolution may increase infinitely if the waveguide 3 approaches a zero distance from the light source 5. However, it is to be appreciated that infinite resolution may not be achievable in practice.
  • the resolution in the x axis may be limited by the pixel pitch and the maximum resolution defined in the y axis described above.
  • the highest resolution in the x axis may be determined by:
  • the performance of the apparatus 1 depends on the pixel pitch of the multiple light sensors 13.
  • Low cost and commercially available CCD chips may provide acceptable range for alignment than may be within 10 ⁇ m of the coupling area. This may be sufficient to couple light into optical waveguides of a component 29 to a standard optical fibre 3 via a grating coupler.
  • the multiple light sensors 13 may include a linear sensor array to detect an intensity of light.
  • the linear sensor array may include sensor elements positioned along a linear axis.
  • the sensor elements may include a plurality of charge-coupled device (CCD) sensor elements.
  • CCD charge-coupled device
  • An example is a CCD linear image sensor such as a UPD3799 MOS Integrated Circuit offered by NEC.
  • the multiple light sensors 13 may include a plurality of photodiodes in an array, a light dependent resistor (LDR) array, a CMOS
  • the multiple light sensors 13 may also include a lepton sensor array if the wavelength is in the infra-red region only.
  • the axis of the linear sensor array may be parallel or coaxial with an observation axis 12 of the observation plane, where the observation axis is also substantially perpendicular to the z axis and elongated portion axis 19. This may assist and simplify determination of the size and position of the shadow 9 and the position and angle of rotation of the waveguide 3.
  • the neither multiple light sensor 13, nor the light source 5 do not include lenses (or high precision lenses). This may reduce the complexity and sensitivity to manufacturing tolerances in lenses that may introduce an additional source of error.
  • the apparatus 1 above has been described with multiple light sensors 13 in the form of a linear sensor array. However, it is to be appreciated that other light sensors 13 may be used to determine parameters indicative of the shadow 9.
  • a two-dimensional sensor array may be used, which may determine parameters indicative of the shadow 9 in an additional axis.
  • a two-dimensional light sensor may be orientated to determine characteristics of the shadow across the observation plane 11 (in both the observation axis 12 and the z axis). This may facilitate determination of the position of the waveguide 3 and the angle of rotation of an angle polished end 206 without necessarily requiring positioning the angle polished end at multiple positions along the elongated portion axis 19.
  • the light sensor 13 may be co-located or located proximal to the observation plane 11 as illustrated in Fig.1. However in some alternatives the light sensor 13 may be located distal to the observation plane 11.
  • the observation plane 11 may include an opaque surface (such as a screen) onto which the light beam 7 may cast a shadow 9.
  • the light sensor 13 may be in the form of a camera (such as a CCD camera or CMOS camera) located away from but directed towards the observation plane 11. Thus camera may observe the position and size of the shadow at the observation plane 11.
  • the light source 5 The light source 5
  • the light source 5 may include a number of light sources that can generate light that may be detected by the multiple light sensors 13.
  • the light source may include a laser light source, such as a solid state laser diode.
  • the light source 5 may also be in the form of light emitting diodes (LED), super luminescent light emitting diodes (SLED) incandescent bulbs, multi-mode lasers.
  • the laser light source is a DFB (distributed feedback) laser widely used in optical communications. This provides light with various wavelengths covering S, C and L band. In some examples, suitable wavelengths may be in the range of 700 nm to 390 nm (visible spectrum). Wavelengths as long as one tenth of the waveguide diameter may be the absolute minimum frequency that can be used without violating the ray optics approximation.
  • DFB distributed feedback
  • the light source 5 may produce a diverging beam 7 from a point source (or near point source) as illustrated in Figs. 1 and 2. It is to be appreciated that the waveguide 3 casts a shadow 9 when the waveguide 3 is in the path of the beam 7. Therefore a wide beam 7 may advantageously increase the range of positions of the waveguide 3 that can be determined.
  • the light source 5 may not be a perfect point source.
  • the light source 5 may include an incandescent bulb with the emitted light passing through an aperture of a blind.
  • the resultant edges 37a, 37b of the shadow 9 on the observation plane 11 may not be clearly defined, and instead include a gradual transition between a higher intensity to a lower intensity of light. It is to be appreciated that the edges 37a, 37b and/or size of the shadow 9 may be approximated. For example, by determining the average position in the transition region, or based on results of historical or benchmark values.
  • the apparatus 1 may have particular application with positioning optical wave guides (such as optical fibre) and other devices onto silicon on insulator (SOI) devices at the sub-micrometre level in PIC. Due to the size of these devices, the apparatus 1 may provide a means to construct PIC accurately, and in a time and cost efficient manner.
  • optical wave guides such as optical fibre
  • SOI silicon on insulator
  • Examples include optical fibres such as a cylindrical dielectric waveguide type.
  • such optical fibres include an outer cladding and an inner core, where the outer cladding enables total internal reflection of the light within the core due to the change in refractive index, which acts as a waveguide.
  • the inner core may have an elongated portion 204 that include an angle polished end 206.
  • the diameter of the inner core may be in the range of 8 ⁇ to 15.2 ⁇ . Thus these relatively small dimensions require high precision for connection with the component 29 (or other intermediate components).
  • the waveguide may include a plurality of optical fibres bundled with each other.
  • the waveguide 3 is a ribbon fibre having multiple optical fibres that are typically parallel with each other.
  • a grating coupler 229, 230 is provided where the optical fibre 3 is positioned so that it is substantially horizontally parallel with the silicon grating 230. This is known as a horizontal angle fibre coupling. It is to be appreciated that the optical fibre 3 may be aligned with other types of components and coupling devices.
  • Fig. 12 illustrates horizontal angle fibre coupling, an alternative coupling 1229 than includes a waveguide 1230.
  • the elongated portion 1204 and angle polished end 1206 (of the waveguide 1203) must be aligned relative to the waveguide 1230 to allow transmission of light between the components.
  • the apparatus and method disclosed herein may also be adapted to align the waveguide 1203 (which may be an optical fibre) to the waveguide 1230 of the direct coupling 1229.
  • the actuators 25 may be required to move the waveguide 3 (or stages 23, 27 and components 29) at the micrometre or even nanometre level. Accordingly high accuracy may be required.
  • a type of actuator that may be suitable is piezoelectric actuators (which may include piezoelectric motors).
  • An example of a piezoelectric actuator includes an 8322 F actuator offered by Newport Optics.
  • the waveguide 3 may be fastened relative to the component 29 (which may have a second waveguide 230, 1230).
  • a device 31 may apply glue to the waveguide 3 and component 29.
  • fastening the waveguide 3 relative to the component 29 may be achieved by directly fastening the components together or indirectly via one or more intermediate components.
  • Fig. 13 illustrates an example of a processing device 16.
  • the processing device 1501 may be used to control components of the apparatus 1 and to determine the position of the waveguide 3.
  • the processing device 16 includes a processor 1510, a memory 1520 and an interface device 1540 that communicate with each other via a bus 1530.
  • the memory 1520 stores instructions and data for implementing the method 100, 300 described above, and the processor 1510 performs the instructions from the memory 1520 to implement the method 100, 300.
  • the interface device 1540 facilitates communication with other components that may include the light source 5, multiple light sensors 13 and actuators 25.
  • the interface device 1540 may facilitate communications with other processing devices or network elements in a communications network (not shown). It is to be appreciated that functions performed by the processing device 1501 may be distributed between multiple network elements.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L'invention concerne un procédé (100) de détermination d'une position d'un guide d'ondes (3), le procédé comprenant les étapes consistant : à projeter (110) un faisceau (7) de lumière vers le guide d'ondes (3) pour projeter une ombre (9) de telle sorte que l'ombre (9) est détectable par de multiples capteurs de lumière (13) ; à recevoir (120), en provenance des multiples capteurs de lumière (13), un signal indiquant une taille et une position de l'ombre (9) ; et à déterminer (130) la position du guide d'ondes (3) dans au moins deux dimensions sur la base du signal, une dimension étant le long d'un trajet du faisceau (7).
PCT/AU2016/050608 2015-07-13 2016-07-13 Positionnement de guide d'ondes WO2017008112A1 (fr)

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AU2015902764A AU2015902764A0 (en) 2015-07-13 Waveguide positioning
AU2015902764 2015-07-13

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CN113253405A (zh) * 2021-07-15 2021-08-13 武汉英飞光创科技有限公司 一种光模块光接收次模块awg耦合高度控制装置及方法
CN114137673A (zh) * 2021-12-16 2022-03-04 长飞光纤光缆股份有限公司 一种光器件的耦合装置及方法

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US4425042A (en) * 1981-07-08 1984-01-10 Corning Glass Works Positioning measuring apparatus and method
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US5904413A (en) * 1996-06-12 1999-05-18 Siemens Aktiengesellschaft Method and apparatus for recognizing a skew angle of at least one optical fiber
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WO2009115311A1 (fr) * 2008-03-19 2009-09-24 Thomas Kollewe Procédé et dispositif de détermination de la position et de l'orientation d'un échantillon
US20140240719A1 (en) * 2011-10-20 2014-08-28 Isiqiri Interface Technologies Gmbh Real-time measurement of relative position data and/or of geometrical dimensions of a moving body using optical measuring means

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US4425042A (en) * 1981-07-08 1984-01-10 Corning Glass Works Positioning measuring apparatus and method
US5011259A (en) * 1989-06-02 1991-04-30 Siemens Aktiengesellschaft Method for aligning two waveguide fiber ends and an apparatus for performing the method
US5904413A (en) * 1996-06-12 1999-05-18 Siemens Aktiengesellschaft Method and apparatus for recognizing a skew angle of at least one optical fiber
US6046798A (en) * 1997-08-27 2000-04-04 Siemens Aktiengesellschaft Method and apparatus for acquiring information about at least one optical fiber end
WO2009115311A1 (fr) * 2008-03-19 2009-09-24 Thomas Kollewe Procédé et dispositif de détermination de la position et de l'orientation d'un échantillon
US20140240719A1 (en) * 2011-10-20 2014-08-28 Isiqiri Interface Technologies Gmbh Real-time measurement of relative position data and/or of geometrical dimensions of a moving body using optical measuring means

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CN113253405A (zh) * 2021-07-15 2021-08-13 武汉英飞光创科技有限公司 一种光模块光接收次模块awg耦合高度控制装置及方法
CN113253405B (zh) * 2021-07-15 2021-10-08 武汉英飞光创科技有限公司 一种光模块光接收次模块awg耦合高度控制装置及方法
CN114137673A (zh) * 2021-12-16 2022-03-04 长飞光纤光缆股份有限公司 一种光器件的耦合装置及方法
CN114137673B (zh) * 2021-12-16 2023-02-07 长飞光纤光缆股份有限公司 一种光器件的耦合装置及方法

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