WO2016193307A1 - Read-out circuit and method for reading out large-array resistive sensors - Google Patents
Read-out circuit and method for reading out large-array resistive sensors Download PDFInfo
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- WO2016193307A1 WO2016193307A1 PCT/EP2016/062381 EP2016062381W WO2016193307A1 WO 2016193307 A1 WO2016193307 A1 WO 2016193307A1 EP 2016062381 W EP2016062381 W EP 2016062381W WO 2016193307 A1 WO2016193307 A1 WO 2016193307A1
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- connection lines
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/225—Measuring circuits therefor
- G01L1/2262—Measuring circuits therefor involving simple electrical bridges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/2268—Arrangements for correcting or for compensating unwanted effects
Definitions
- the present invention relates to a method of reading out a large array of resistive sensors having m column connection lines and n row connection lines, each of a plurality of resistive sensors being connected between an associated one of the m column connection lines and an associated one of the n row connection lines.
- the present invention relates to a read-out circuit for a large array of resistive sensors having m column connection lines and n row connection lines, each of a plurality of resistive sensors being connected between an associated one of the m column connection lines and an associated one of the n row connection lines.
- the present invention seeks to provide a low complexity solution for a read-out circuit for large-array resistive sensors, having improved performance over prior art circuitry with regard to sensitivity of error sources related to the measurement circuit used (e.g. operational amplifiers).
- a method according to the preamble defined above is provided further comprising, measuring a sensor value of a single one of the plurality of resistive sensors by:
- the present invention relates to a read-out circuit for a large array of resistive sensors as defined in the preamble above, the read-out circuit comprising a measurement circuit (e.g. an operational amplifier based circuit) providing an output signal, m column switches each connected to one of the m column connection lines and to either ground or a supply voltage, and n row switches each connected to one of the n row connection lines and to either ground or the measurement circuit.
- a measurement circuit e.g. an operational amplifier based circuit
- m column switches each connected to one of the m column connection lines and to either ground or a supply voltage
- n row switches each connected to one of the n row connection lines and to either ground or the measurement circuit.
- Fig. 1 shows a circuit diagram of a read-out circuit for an exemplary 4x4 array of resistive sensors, according to an embodiment of the present invention
- Fig. 2 shows a circuit diagram of a read-out circuit according to an embodiment of the present invention for a generic m x n resistive sensor array.
- a high-accuracy yet simple read-out circuit architecture is proposed wherein the problems caused by several main non-ideality sources and errors are overcome. In this way, not only the accuracy of the read-out circuit is increased but also its complexity and therefore cost is reduced.
- Fig. 1 shows a circuit diagram of a read-out circuit for an exemplary 4x4 array of resistive sensors Rmn, according to an embodiment of the present invention.
- the present invention read-out circuit is especially suited for a large array of resistive sensors having m column connection lines and n row connection lines (m and n being positive integers), each of a plurality of resistive sensors Rmn being connected between an associated one of the m column connection lines and an associated one of the n row connection lines.
- the read-out circuit itself comprises a measurement circuit 5 providing an output signal V 0 , m column switches SWcm each connected to one of the m column connection lines and to either ground or a supply voltage V CC , and n row switches SWRD each connected to one of the n row connection lines and to either ground or the measurement circuit.
- the switches SWc m and SWRD are operated for measuring a second sensor value of the single resistive sensor R23 from the plurality of resistive sensors Rmn, i.e. the second column switch SWc2 is connected to a supply voltage Vcc and the third row switch SWR 3 is connected to the measurement circuit 5.
- the ratio of the maximum measurable resistance to the minimum measurable resistance is increased (i.e. the dynamic range), and this is achieved simultaneously with a reduced complexity of the read-out circuit.
- the measurement circuit 5 comprises a simple feedback circuit with an operational amplifier 6 (opamp) and a feedback resistor Rf connected between the opamp output and its positive input.
- the negative input of the opamp 6 is connected to ground, and the positive input to the instantaneous
- the present invention embodiments work as follows: using a double-sampling scheme, the digitized version of the output of the circuit for the case when the input switch (i.e. SWc3 in Fig. 1) is connected to Vcc (second sensor value) is subtracted from that obtained when the input is grounded (first sensor value). The subtraction result is therefore, an error-free value which is much less dependent on the offset voltage and the input current of the opamp 6.
- Fig. 2 shows a circuit diagram of a read-out circuit according to an embodiment of the present invention for a generic m x n resistive sensor array.
- m column switches SWcm are connected to the respective m column connection lines of the array
- n row switches SWRD are connected the respective n row connection lines of the array.
- connecting the measurement circuit 5 to the row connection line associated with the single one resistive sensor is implemented using a row switch SWRD
- connecting the column connection line associated with the single one resistive sensor to a supply voltage is implemented using a column switch SWcm.
- the row and column switches may be actual hardware switches, controlled switches, semiconductor switches, etc.
- the row and column switches SWRD, SWcm are controlled or actuated using a control unit 7.
- the read-out circuitry comprises a control unit 7 connected to each of the m column switches SWcm and each of the n row switches SWRD.
- the control unit 7 can then be used to provide proper control and timing of all switches, e.g. for determining the actual sensor value of each of the plurality of resistive sensors by subsequently connecting the associated ones of the m column connection lines and n row connection lines.
- the entire array of resistive sensors Rmn can be read out with improvement of sensitivity for the opamp inherent error sources in this array read-out circuit.
- control unit 7 is connected to the measurement circuit 5 for receiving the output signal V 0 thereof, and the control unit 7 is further arranged to execute the method steps of any one of method embodiments as described above.
- the first sensor value and second sensor value are stored and subsequently processed. This can e.g. be achieved by adding processing circuitry (e.g. data processor, memory, input signal digitization, etc.) to the control unit 7.
- the large arrays of resistive sensors as discussed above have a wide range of applications from medical to industrial, and the present invention method embodiments and read-out circuit embodiments may equally be applied in these applications.
- An example is textile sensors which are becoming smarter. In wearing biomedical devices, another booming application field is emerging.
- Other examples include, but are not limited to Barefoot Pressure Analysis; In-Shoe Planar Pressure Analysis; Seating & Positioning Pressure Analysis; Human Joint Analysis; Animal Gait Analysis; Body Pressure Mapping (Seating & Mattress); Occlusal Analysis (Dentistry); Tire Footprint Pressure Measurement; Wiper Force Measurement; Grip Pressure Measurement.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Force Measurement Appropriate To Specific Purposes (AREA)
- Analogue/Digital Conversion (AREA)
Abstract
Read-out circuit and method for reading out a large array of resistive sensors having m column connection lines and n row connection lines. Each of a plurality of resistive sensors (Rmn) is connected between one of the m column connection lines and one of the n row connection lines. Measuring a sensor value of a single one of the resistive sensors (Rmn) is accomplished by connecting the measurement circuit (5) to the row connection line associated with the single one resistive sensor, grounding all column connection lines and measuring a first sensor value, connecting a column connection line associated with the single one resistive sensor to a supply voltage and measuring a second sensor value, and determining the sensor value of the single one resistive sensor by subtracting the first sensor value and second sensor value.
Description
Read-out circuit and method for reading out large-array resistive sensors
Field of the invention
The present invention relates to a method of reading out a large array of resistive sensors having m column connection lines and n row connection lines, each of a plurality of resistive sensors being connected between an associated one of the m column connection lines and an associated one of the n row connection lines. In a further aspect, the present invention relates to a read-out circuit for a large array of resistive sensors having m column connection lines and n row connection lines, each of a plurality of resistive sensors being connected between an associated one of the m column connection lines and an associated one of the n row connection lines.
Prior art
American patent publication US2005/0200732 discloses a read-out circuit for a pixel array employing an offset error compensation by subtracting from a value sensed by a color sensor a dark current offset value.
American patent publication US2013/0088247 discloses offset compensation using a dedicated offset correction circuit in a pressure sensing array.
American patent publication US2005/0207234 discloses an offset error compensation scheme for an array forming a data storage device by subtracting a predetermined offset value from a measured value for each cell in the array. An array of resistive probes P are connected to columns C and rows R connection lines. Each probe P can be connected to a corresponding row R connection line with a subtraction stage in the form of a differential amplifier having one input connected to the corresponding row line R and another connected to the offset signal generator for receiving an offset compensation signal sc(t). The output of each differential amplifier is connected via a low pass filter, having a bypass switch, to a sampler represented by a switch.
The article by Akavia Kaniel, "Substractor eliminates op-amp offset, common mode errors" in Electronics, vol. 51, no. 8, 1 April 178, pages 135-137, discloses a circuit eliminating an offset voltage of an operational amplifier with switches, two memories, and a subtractor.
Summary of the invention
The present invention seeks to provide a low complexity solution for a read-out circuit for large-array resistive sensors, having improved performance over prior art circuitry with regard to sensitivity of error sources related to the measurement circuit used (e.g. operational amplifiers).
According to the present invention, a method according to the preamble defined above is provided further comprising, measuring a sensor value of a single one of the plurality of resistive sensors by:
connecting a measurement circuit to the row connection line associated with the single one resistive sensor,
grounding all column connection lines and measuring a first sensor value, connecting a column connection line associated with the single one resistive sensor to a supply voltage and measuring a second sensor value, and determining the sensor value of the single one resistive sensor by subtracting the first sensor value and second sensor value.
This will ensure a proper and robust determination of a specific single sensor value without adding complex circuitry (thus with less cost than prior art methods) and with high accuracy.
In a further aspect, the present invention relates to a read-out circuit for a large array of resistive sensors as defined in the preamble above, the read-out circuit comprising a measurement circuit (e.g. an operational amplifier based circuit) providing an output signal, m column switches each connected to one of the m column connection lines and to either ground or a supply voltage, and n row switches each connected to one of the n row connection lines and to either ground or the measurement circuit. By properly actuating the switches (e.g. under control of a control unit), the sensor values of each individual sensor in the array can be determined with high accuracy, yet without necessitating any complex measurement circuitry.
Short description of drawings
The present invention will be discussed in more detail below, using a number of exemplary embodiments, with reference to the attached drawings, in which
Fig. 1 shows a circuit diagram of a read-out circuit for an exemplary 4x4 array of resistive sensors, according to an embodiment of the present invention; and
Fig. 2 shows a circuit diagram of a read-out circuit according to an embodiment of the present invention for a generic m x n resistive sensor array.
Detailed description of exemplary embodiments
Large arrays of resistive sensors have a wide range of applications from industrial systems (e.g. pressure and gas sensors) to biomedical wearable devices (e.g. in the form of textile sensors). Several types of read-out circuits are known in the art and have been presented for such sensors, however, these suffer from drawbacks mainly due to the large number of sensing elements, or when the ratio of the maximum and minimum resistor values is very high. Also, non-idealities of the operational amplifier(s) employed in such circuits provide further disadvantages.
According to the present invention embodiments, a high-accuracy yet simple read-out circuit architecture is proposed wherein the problems caused by several main non-ideality sources and errors are overcome. In this way, not only the accuracy of the read-out circuit is increased but also its complexity and therefore cost is reduced.
This was accomplished after studying the effects of two main non-idealities of an operational amplifier, i.e. the offset voltage and the input current, on the accuracy of the read-out circuit.
In general terms, a double-sampling scheme is proposed to improve the accuracy of the read-out circuit. Both simulation and measurement results have confirmed the effectiveness of the proposed method for large arrays of resistive sensors.
Fig. 1 shows a circuit diagram of a read-out circuit for an exemplary 4x4 array of resistive sensors Rmn, according to an embodiment of the present invention. In generic terms, the present invention read-out circuit is especially suited for a large array of resistive sensors having m column connection lines and n row connection lines (m and n being positive integers), each of a plurality of resistive sensors Rmn being connected between an associated one of the m column connection lines and an associated one of the n row connection lines.
It is noted that in most if not all resistive sensor arrays, the individual sensor terminals are not accessible, but only the column and row terminals.
The read-out circuit itself comprises a measurement circuit 5 providing an output signal V0, m column switches SWcm each connected to one of the m column
connection lines and to either ground or a supply voltage VCC, and n row switches SWRD each connected to one of the n row connection lines and to either ground or the measurement circuit.
In the specific embodiment shown in Fig. 1, the switches SWcm and SWRD are operated for measuring a second sensor value of the single resistive sensor R23 from the plurality of resistive sensors Rmn, i.e. the second column switch SWc2 is connected to a supply voltage Vcc and the third row switch SWR3 is connected to the measurement circuit 5.
This is actually one of the steps of the method embodiments of the present invention, which in general can be described as measuring a sensor value of a single one of the plurality of resistive sensors Rmn by:
connecting a measurement circuit 5 to the row connection line associated with the single one resistive sensor,
grounding all column connection lines and measuring a first sensor value, - connecting a column connection line associated with the single one resistive sensor to a supply voltage and measuring a second sensor value, and determining the sensor value of the single one resistive sensor by subtracting the first sensor value and second sensor value (e.g. in the digital domain).
As a result, the ratio of the maximum measurable resistance to the minimum measurable resistance is increased (i.e. the dynamic range), and this is achieved simultaneously with a reduced complexity of the read-out circuit.
In the embodiment shown in Fig. 1, the measurement circuit 5 comprises a simple feedback circuit with an operational amplifier 6 (opamp) and a feedback resistor Rf connected between the opamp output and its positive input. The negative input of the opamp 6 is connected to ground, and the positive input to the instantaneous
measurement value (as determined by the positions of row switches SWW).
One of the error sources in measurement circuits is the opamp offset, the effect of which can be described for the read-out circuit of Fig. 1 as follows:
It can be shown that the output voltage Vo of the read-out circuit (i.e. output of measurement circuit 5 is affected b the o am offset voltage Voffset using:
\ffset
The present invention embodiments work as follows: using a double-sampling scheme, the digitized version of the output of the circuit for the case when the input switch (i.e. SWc3 in Fig. 1) is connected to Vcc (second sensor value) is subtracted from that obtained when the input is grounded (first sensor value). The subtraction result is therefore, an error-free value which is much less dependent on the offset voltage and the input current of the opamp 6. There are several problems that the present invention embodiments described herein have offered solutions for:
1. Cross-talk between different sensors in an array arrangement: in the present invention embodiments, the effect of cross-talk is reduced.
2. Limited value for the Rmax/Rmin ratio (i.e. the dynamic range): this parameter is considerably increased in the present invention embodiments.
Fig. 2 shows a circuit diagram of a read-out circuit according to an embodiment of the present invention for a generic m x n resistive sensor array. In this case, m column switches SWcm are connected to the respective m column connection lines of the array, and n row switches SWRD are connected the respective n row connection lines of the array. In further method embodiments, connecting the measurement circuit 5 to the row connection line associated with the single one resistive sensor is implemented using a row switch SWRD, and connecting the column connection line associated with the single one resistive sensor to a supply voltage is implemented using a column switch SWcm. The row and column switches may be actual hardware switches, controlled switches, semiconductor switches, etc.
As shown in the Fig. 2 embodiment, the row and column switches SWRD, SWcm, are controlled or actuated using a control unit 7. Or in other words, the read-out circuitry comprises a control unit 7 connected to each of the m column switches SWcm and each of the n row switches SWRD. The control unit 7 can then be used to provide proper control and timing of all switches, e.g. for determining the actual sensor value of each of the plurality of resistive sensors by subsequently connecting the associated ones of the m column connection lines and n row connection lines. Thus, the entire array of
resistive sensors Rmn can be read out with improvement of sensitivity for the opamp inherent error sources in this array read-out circuit.
In an even further embodiment, the control unit 7 is connected to the measurement circuit 5 for receiving the output signal V0 thereof, and the control unit 7 is further arranged to execute the method steps of any one of method embodiments as described above. For example, the first sensor value and second sensor value are stored and subsequently processed. This can e.g. be achieved by adding processing circuitry (e.g. data processor, memory, input signal digitization, etc.) to the control unit 7.
Both simulation results of a 40*50 array and also the measurement results confirm the effectiveness of the read-circuit of the present invention embodiments in improving the accuracy of the read-out mechanism without introducing additional complexity. The present invention embodiments will lead to more accurate yet less complex read-out circuits for large arrays of read-out (resistive) sensors. One of the examples is a platform measuring the pressure profile under the feet with more than 2000 resistive sensors. With this invention, the accuracy of the measurement system will be increased without additional circuit complexity overhead.
The large arrays of resistive sensors as discussed above have a wide range of applications from medical to industrial, and the present invention method embodiments and read-out circuit embodiments may equally be applied in these applications. An example is textile sensors which are becoming smarter. In wearing biomedical devices, another booming application field is emerging. Other examples include, but are not limited to Barefoot Pressure Analysis; In-Shoe Planar Pressure Analysis; Seating & Positioning Pressure Analysis; Human Joint Analysis; Animal Gait Analysis; Body Pressure Mapping (Seating & Mattress); Occlusal Analysis (Dentistry); Tire Footprint Pressure Measurement; Wiper Force Measurement; Grip Pressure Measurement.
It is noted that the array indications (column, row) in the exemplary
embodiments described above can be interchanged of course, without departing from the scope of protection as defined in the appended claims.
The present invention embodiments have been described above with reference to a number of exemplary embodiments as shown in the drawings. Modifications and alternative implementations of some parts or elements are possible, and are included in the scope of protection as defined in the appended claims.
Claims
1. Method of reading out a large array of resistive sensors having m column connection lines and n row connection lines, each of a plurality of resistive sensors (Rmn) being connected between an associated one of the m column connection lines and an associated one of the n row connection lines,
comprising
measuring a sensor value of a single one of the plurality of resistive sensors (Rmn) by:
connecting a measurement circuit (5) to the row connection line associated with the single one resistive sensor,
grounding all column connection lines and measuring a first sensor value, connecting a column connection line associated with the single one resistive sensor to a supply voltage and measuring a second sensor value, and determining the sensor value of the single one resistive sensor by subtracting the first sensor value and second sensor value.
2. Method according to claim 1, further comprising
determining the actual sensor value of each of the plurality of resistive sensors by subsequently connecting the associated ones of the m column connection lines and n row connection lines.
3. Method according to claim 1 or 2, wherein the measurement circuit (5) comprises an operational amplifier (6).
4. Method according to any one of claims 1-3, wherein connecting the
measurement circuit (5) to the row connection line associated with the single one resistive sensor is implemented using a row switch (SW ) (thus n row switches being present).
5. Method according to any one of claims 1-4, wherein connecting the column connection line associated with the single one resistive sensor to a supply voltage is implemented using a column switch (SWcm) (thus m column switches being present).
6. Method according to any one of claims 1-5, wherein the first sensor value and second sensor value are stored and subsequently processed.
7. Read-out circuit for a large array of resistive sensors having m column connection lines and n row connection lines, each of a plurality of resistive sensors
(Rmn) being connected between an associated one of the m column connection lines and an associated one of the n row connection lines,
the read-out circuit comprising
a measurement circuit (5) providing an output signal (V0),
- m column switches (SWcm) each connected to one of the m column
connection lines and to either ground or a supply voltage (Vcc), and n row switches (SWW) each connected to one of the n row connection lines and to either ground or the measurement circuit (5).
8. Read-out circuit according to claim 7, further comprising a control unit (7) connected to each of the m column switches (SWcm) and each of the n row switches (SWR„).
9. Read-out circuit according to claim 7 or 8, wherein the measurement circuit (5) comprises an operational amplifier (6).
10. Read-out circuit according to claim 7, 8 or 9, wherein the control unit (7) is connected to the measurement circuit (5) for receiving the output signal (V0) thereof, and wherein the control unit (7) is further arranged to execute the method steps of any one of the embodiments 1-6.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL2014896A NL2014896B1 (en) | 2015-06-01 | 2015-06-01 | Read-out circuit and method for reading out large-array resistive sensors. |
| NL2014896 | 2015-06-01 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2016193307A1 true WO2016193307A1 (en) | 2016-12-08 |
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ID=53783849
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP2016/062381 Ceased WO2016193307A1 (en) | 2015-06-01 | 2016-06-01 | Read-out circuit and method for reading out large-array resistive sensors |
Country Status (2)
| Country | Link |
|---|---|
| NL (1) | NL2014896B1 (en) |
| WO (1) | WO2016193307A1 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109059969A (en) * | 2018-08-13 | 2018-12-21 | 中国科学院电子学研究所 | A kind of resistive sensor array reading circuit and measurement method |
| WO2019170483A1 (en) * | 2018-03-05 | 2019-09-12 | Kuka Deutschland Gmbh | Measuring mechanical changes |
| CN112903151A (en) * | 2021-01-25 | 2021-06-04 | 华东师范大学 | Decoupling method suitable for thin film pressure sensor array and application thereof |
| CN115562066A (en) * | 2022-09-21 | 2023-01-03 | 上海机电工程研究所 | Image simulation method and system for injecting measured image data into resistance array |
| DE102024102067A1 (en) | 2024-01-24 | 2025-07-24 | Brose Antriebstechnik GmbH & Co. Kommanditgesellschaft, Berlin | Measuring device and measuring method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050200732A1 (en) | 2004-03-15 | 2005-09-15 | Boon Keat Tan | System and method for canceling dark photocurrent in a color sensor circuit |
| US20050207234A1 (en) | 2004-03-22 | 2005-09-22 | International Business Machines Corporation | Offset compensation in local-probe data storage devices |
| US20130088247A1 (en) | 2011-10-05 | 2013-04-11 | Industrial Technology Research Institute | Readout apparatus and readout method for sensor array |
-
2015
- 2015-06-01 NL NL2014896A patent/NL2014896B1/en not_active IP Right Cessation
-
2016
- 2016-06-01 WO PCT/EP2016/062381 patent/WO2016193307A1/en not_active Ceased
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050200732A1 (en) | 2004-03-15 | 2005-09-15 | Boon Keat Tan | System and method for canceling dark photocurrent in a color sensor circuit |
| US20050207234A1 (en) | 2004-03-22 | 2005-09-22 | International Business Machines Corporation | Offset compensation in local-probe data storage devices |
| US20130088247A1 (en) | 2011-10-05 | 2013-04-11 | Industrial Technology Research Institute | Readout apparatus and readout method for sensor array |
Non-Patent Citations (2)
| Title |
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| AKAVIA KANIEL: "Substractor eliminates op-amp offset, common mode errors", ELECTRONICS, vol. 51, no. 8, 1 April 1978 (1978-04-01), pages 135 - 137, XP001625250 |
| AKAVIA KANIEL: "Subtractor eliminates op-amp offset, common-mode errors", ELECTRONICS,, vol. 51, no. 8, 1 April 1978 (1978-04-01), pages 135 - 137, XP001625250 * |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019170483A1 (en) * | 2018-03-05 | 2019-09-12 | Kuka Deutschland Gmbh | Measuring mechanical changes |
| CN111819416A (en) * | 2018-03-05 | 2020-10-23 | 库卡德国有限公司 | Measurement of mechanical changes |
| US11549855B2 (en) | 2018-03-05 | 2023-01-10 | Kuka Deutschland Gmbh | Measuring mechanical changes |
| CN109059969A (en) * | 2018-08-13 | 2018-12-21 | 中国科学院电子学研究所 | A kind of resistive sensor array reading circuit and measurement method |
| CN112903151A (en) * | 2021-01-25 | 2021-06-04 | 华东师范大学 | Decoupling method suitable for thin film pressure sensor array and application thereof |
| CN115562066A (en) * | 2022-09-21 | 2023-01-03 | 上海机电工程研究所 | Image simulation method and system for injecting measured image data into resistance array |
| DE102024102067A1 (en) | 2024-01-24 | 2025-07-24 | Brose Antriebstechnik GmbH & Co. Kommanditgesellschaft, Berlin | Measuring device and measuring method |
| WO2025157842A1 (en) * | 2024-01-24 | 2025-07-31 | Brose Antriebstechnik GmbH & Co. Kommanditgesellschaft, Berlin | Measuring device and measuring method |
Also Published As
| Publication number | Publication date |
|---|---|
| NL2014896B1 (en) | 2017-01-31 |
| NL2014896A (en) | 2016-12-12 |
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