WO2016192100A1 - 在线测试微结构冲击强度的装置和方法 - Google Patents

在线测试微结构冲击强度的装置和方法 Download PDF

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Publication number
WO2016192100A1
WO2016192100A1 PCT/CN2015/080872 CN2015080872W WO2016192100A1 WO 2016192100 A1 WO2016192100 A1 WO 2016192100A1 CN 2015080872 W CN2015080872 W CN 2015080872W WO 2016192100 A1 WO2016192100 A1 WO 2016192100A1
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microstructure
flexible beam
impact
locking teeth
flexible
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PCT/CN2015/080872
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English (en)
French (fr)
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张立
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北京大学
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Priority to US15/579,397 priority Critical patent/US10337970B2/en
Priority to EP15893756.5A priority patent/EP3306298B1/en
Priority to PCT/CN2015/080872 priority patent/WO2016192100A1/zh
Publication of WO2016192100A1 publication Critical patent/WO2016192100A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/30—Investigating strength properties of solid materials by application of mechanical stress by applying a single impulsive force, e.g. by falling weight
    • G01N3/307—Investigating strength properties of solid materials by application of mechanical stress by applying a single impulsive force, e.g. by falling weight generated by a compressed or tensile-stressed spring; generated by pneumatic or hydraulic means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0001—Type of application of the stress
    • G01N2203/001—Impulsive
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/003—Generation of the force
    • G01N2203/0032—Generation of the force using mechanical means
    • G01N2203/0035—Spring
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/003—Generation of the force
    • G01N2203/0032—Generation of the force using mechanical means
    • G01N2203/0039—Hammer or pendulum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied
    • G01N2203/006—Crack, flaws, fracture or rupture
    • G01N2203/0067—Fracture or rupture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied
    • G01N2203/0076—Hardness, compressibility or resistance to crushing
    • G01N2203/0087—Resistance to crushing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/0202—Control of the test
    • G01N2203/0208—Specific programs of loading, e.g. incremental loading or pre-loading
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/022—Environment of the test
    • G01N2203/0244—Tests performed "in situ" or after "in situ" use
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/022—Environment of the test
    • G01N2203/0248—Tests "on-line" during fabrication
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0286—Miniature specimen; Testing on microregions of a specimen
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/06—Indicating or recording means; Sensing means
    • G01N2203/0605—Mechanical indicating, recording or sensing means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/06—Indicating or recording means; Sensing means
    • G01N2203/067—Parameter measured for estimating the property
    • G01N2203/0682—Spatial dimension, e.g. length, area, angle

Definitions

  • the present invention relates to the field of microelectromechanical systems (MEMS) processing, and more particularly to an apparatus and method for testing the impact strength of microstructures in-line.
  • MEMS microelectromechanical systems
  • Microelectromechanical systems are an important direction in the development and application of microelectronics.
  • sensors for microelectromechanical systems are widely used in all aspects of civilian military applications, such as pressure gauges, accelerometers and gyros, which are indispensable components in consumer electronics and high-end applications.
  • Due to the characteristics of the physical quantity of the test itself the impact load of the sensor is often encountered in the working environment of the sensor. At this time, the impact strength of the sensor structure is very important.
  • the impact strength of traditional micro-electro-mechanical system sensors is measured by drop-weight test. This type of experimental method requires the sensor to be split and packaged after the end of the manufacturing process.
  • the present invention has been made to solve at least one of the above problems and disadvantages existing in the prior art.
  • an apparatus for testing the impact strength of a microstructure in-line comprising: a flexible beam having one end fixed; and an impact mass disposed at the other end of the flexible beam for Applying an impact to the microstructure; and a locking member comprising a beam arm and a plurality of locking teeth, one end of the beam arm being fixed, the plurality of locking teeth being spaced along the beam arm such that The other end of the flexible beam is engaged with one of the plurality of locking teeth when the flexible beam is loaded.
  • a method for in-line testing of microstructure impact strength using the above apparatus comprising the steps of: (a) fixing the microstructure to face the impact mass; (b) loading station a flexible beam, the other end of the flexible beam being engaged with a locking tooth of the other of the plurality of locking teeth closest to the other end of the flexible beam; (c) releasing the other end of the flexible beam to The microstructure is applied to the microstructure by the impact mass disposed on the other end of the flexible beam Applying an impact; (d) repeating steps (b) and (c), causing the other end of the flexible beam to be sequentially released in a near-to-far sequence with each of the plurality of locking teeth, until The microstructure is broken; and (e) the position of the locking tooth corresponding to the destruction of the microstructure is recorded, and the corresponding loading deflection is calculated and the corresponding impact strength is obtained.
  • FIG. 1 is a schematic view of an apparatus for testing microstructure impact strength in-line, in which a flexible beam is not loaded, in accordance with an embodiment of the present invention
  • FIG. 2 is a schematic view of an apparatus for testing the impact strength of a microstructure in-line according to an embodiment of the present invention, in which a loaded flexible beam is being released, and one end of the flexible beam is engaged with one of a plurality of locking teeth when loaded ;
  • 3(a) is a partial schematic view of an electron micrograph of an apparatus for testing microstructure impact strength in accordance with an exemplary embodiment of the present invention
  • Fig. 3(b) is the impact velocity of the device for in-line test microstructure impact strength according to the example shown in Fig. 3(a) simulated by the finite element analysis software Ansys (ANSYS Corporation, USA) under different loading conditions. Schematic; and
  • Figure 3 (c) is an apparatus for in-line testing of microstructure impact strength according to the example shown in Figure 3 (a) obtained by simulation of finite element analysis software Ansys (ANSYS Corporation, USA) to produce the microstructure under different loading conditions. Schematic diagram of the peak impact stress.
  • a method and apparatus for testing the impact strength of microstructures in-line is designed. Specifically, simultaneously manufacturing a functional device having the microstructure, simultaneously fabricating a functional device on a silicon wafer having functional devices using a standard silicon-on-glass (SOG) bulk silicon process and according to the present invention
  • Device for testing microstructure impact strength in-line ie, adding a detection region of the device having the in-line test microstructure impact strength according to the present invention
  • a test specimen of the microstructure was fabricated for subsequent impact strength testing.
  • an impact is applied to the test sample of the microstructure by the device, thereby performing an impact strength test and acquiring the function online. Process-related mechanical property parameters of the device.
  • an apparatus 100 for testing a microstructure impact strength in accordance with an embodiment of the present invention includes: a flexible beam 1 having one end fixed; and an impact mass 2 disposed at the other end of the flexible beam 1 Applying an impact to the microstructures 6; and a locking member 3 comprising a beam arm 31 and a plurality of locking teeth 32, the beam arms 31 being perpendicular to the flexible beam 1 and being fixed at one end of the beam arms 31, the plurality of locking teeth 32 being along The beam arms 31 are spaced apart such that the other end of the flexible beam 1 engages with one of the plurality of locking teeth 32 when loaded onto the flexible beam 1.
  • the width w and the length 1 of the flexible beam 1 determine the maximum impact energy that the device can generate according to the following formula (1):
  • ⁇ max is the static tensile strength at break of the silicon
  • l is the beam length
  • w is the beam width
  • E is the Young's modulus of the silicon
  • I is the moment of inertia of the beam.
  • the size and shape of the impact mass 1 determines the proportion of impact energy delivered to the microstructure in the device, and the distribution of the locking teeth 32 on the beam arms determines the minimum resolution of the impact strength detection of the entire device.
  • the microstructure 6 to be tested is disposed at one end of the flexible beam 1 having the impact mass 2, as shown in FIG. 1; when the flexible beam 1 is loaded, by pushing the flexible beam 1 and/or the beam arm 31, One end of the flexible beam 1 provided with the impact mass 2 is engaged in one of the plurality of locking teeth 32. Subsequently, as shown in Fig. 2, the free end of the beam arm 31 is continuously pushed until the end of the flexible beam 1 provided with the impact mass 2 is disengaged from the engaged locking teeth, and an instantaneous impact is applied to the microstructure 6.
  • the impact strength of the microstructure can be more conveniently and accurately tested compared with the conventional test method of impacting a functional device such as a sensor, and the test time is significantly shortened, which is more advantageous. Design feedback for functional devices such as sensors. Moreover, since the microstructure can be tested, it is possible to decompose the complex structure into individual microstructures, and test each of the decomposed microstructures one by one, thereby easily finding the weakest region of the complex structure.
  • the apparatus 100 for in-line testing of microstructure impact strength, the microstructures to be tested 6 and functional devices in accordance with the present invention are fabricated using a standard silicon-glass bonded (SOG) bulk silicon process (not shown, such as A sensor, etc., wherein the microstructure to be tested 6 is a microstructured replica of the functional device for impact strength testing.
  • SOG silicon-glass bonded
  • the microstructure 6, the device 100, and the pattern of functional devices are formed in the same lithography process, and the microstructure, the device, and the movable silicon structure of the functional device are released in the same etching process. In this way, it is ensured that the microstructure 6 to be tested has a consistent impact strength with a functional device such as a sensor that actually works, and the interference caused by the process error is eliminated.
  • an in-line test microjunction in accordance with the present invention is fabricated using a standard silicon-glass bonded (SOG) bulk silicon process
  • the device 100 for constructing impact strength, the microstructure to be tested 6 and functional devices (not shown in the drawings, such as sensors, etc.), such that the device 100, the functional device and the microstructure to be tested 6 according to the present invention are formed in the same microcell, It is convenient to test each functional device separately. With such an arrangement, on the one hand, it is possible to perform an impact strength test for each functional device; on the other hand, since functional devices such as sensors are separated from the test area, the impact strength of the microstructure can be tested online without damaging the actual work.
  • the functional device is superior to all the traditional impact methods that destroy the entire functional device.
  • the apparatus 100 for in-line testing of microstructure impact strength, the microstructures to be tested 6 and functional devices (not shown, such as sensors, etc.) in accordance with the present invention are fabricated using a standard SOG bulk silicon process such that the microstructures 6 is anchored on a silicon wafer (not shown) on which the functional device is located and faces the impact mass 2, and one end of the flexible beam 1 and the beam arm 31 is anchored on the silicon wafer.
  • the plurality of locking teeth 32 are sequentially spaced from the free ends of the beam arms 31 along the beam arms 32 and the tooth length is reduced by an equal amount.
  • the present invention is not limited thereto, and those skilled in the art can set the interval and the tooth length of each of the locking teeth and the number of the locking teeth according to actual test resolution requirements.
  • the individual locking teeth 32 are equally spaced and the lines of the respective tooth tips form a generally circular arc profile, as shown in FIG.
  • the impact mass 2 is sized to generally conform to the dimensions of the microstructure 6.
  • the size and shape of the impact mass 2 may vary with the size and shape of the microstructure 6, so that an impact load of high acceleration and high pulse width is easily obtained.
  • one end of the impact mass 2 is arcuate, as shown in Figures 1 and 2.
  • the present invention is not limited thereto, and those skilled in the art can set the shape and size of the impact mass 2 according to actual needs, and can also achieve the required impact load by simultaneously adjusting the size of the impact mass and the flexible beam.
  • the apparatus 100 for testing the microstructure impact strength according to the present invention further includes a first probe 4 for pushing the free end of the beam arm 31 for loading and/or releasing with a plurality of The free end of one of the engaged flexible beams 1 is locked.
  • the apparatus 100 for testing the microstructure impact strength according to the present invention further includes a second probe 5 for urging the free end of the flexible beam 1 to move with the plurality of locking teeth 32.
  • One of the snaps is not limited thereto, and those skilled in the art can adopt any structure as needed, as long as the flexible beam 1 and the beam arm 32 can be pushed to realize loading and/or unloading of the flexible beam.
  • the present invention provides a method of in-line testing the impact strength of a microstructure using the apparatus 100 as described above, comprising the steps of: (a) fixing the microstructure 6 to face the impact mass 2; (b) loading the flexible beam 1.
  • the other end of the flexible beam 1 ie, the free end
  • the other end of the flexible beam 1 is released to Applying an impact to the microstructure 6 by the impact mass 2 disposed on the other end of the flexible beam 1;
  • the position of the tooth should be locked, the corresponding load deflection is calculated and the corresponding impact strength is obtained.
  • the impact strength of the microstructure can be more conveniently and accurately tested, and the test time is significantly shortened compared to the conventional test method of impacting a functional device such as a sensor. It is more conducive to design feedback of functional devices such as sensors.
  • the microstructure can be tested, it is possible to decompose the complex structure into individual microstructures, and test each of the decomposed microstructures one by one, thereby easily finding the weakest region of the complex structure.
  • step (a) comprises: forming a microstructure 6, a device 100, and a pattern of functional devices such as sensors in the same lithography process using a silicon-glass bonded silicon process, and in the same etch Release the microstructure, the device, and the movable silicon structure of the functional device in a process such that the microstructure is anchored on a silicon wafer on which the functional device is located and faces the impact mass, and One end of the flexible beam and the beam arm is anchored to the silicon wafer.
  • step (c) includes pushing the free end of the beam arm 31 with the first probe 4 to load and/or release the other end of the flexible beam 1.
  • step (b) includes pushing the other end (ie, the free end) of the flexible beam 1 with the second probe 5 to load the other end of the flexible beam 1.
  • step (e) the mechanical model of the device is established by an LS-DYNA simulator in Ansys software (ANSYS, USA), a commercially available large general finite element analysis software, The corresponding loading deflection is input into the mechanical model of the device, and the magnitude of the acceleration generated by the impact moment is obtained by simulation, thereby obtaining the impact strength of the impact mass at the moment of collision with the microstructure.
  • ANSYS Ansys software
  • the size of the device for in-line test microstructure impact strength according to the present invention is determined according to the microstructure to be tested.
  • the microstructure to be tested is a single-tooth structure having a width of 20 microns and a length of 40 microns.
  • the impact mass 2 adopts a size similar to that of the microstructure to be tested, that is, a single-sided arc-shaped square body having a length of 40 ⁇ m and a width of 30 ⁇ m, as shown in the partial view of the electron micrograph in Fig. 3(a).
  • the size of the flexible beam 1 should be designed such that it is necessary to ensure that the impact mass reaches a speed level of 10 m/s immediately before impacting the microstructure to be tested under extreme deflection, thereby, according to the energy storage formula, angular velocity and line of the flexible beam
  • the speed relationship and the principle of conservation of energy in the case of the present example, the dimensions of the flexible beam are: 700 microns long and 10 microns wide. Under this design, the impact mass can reach 20m/s at a moment before the impact.
  • the design of the locking teeth is determined according to the impact velocity resolution requirements. The higher the resolution requirement, the denser the locking teeth are arranged, that is, the larger the number. In this example, the spacing of the locking teeth is 10 microns.
  • the position of the locking tooth varies according to the flexible beam.
  • the locking position of the flexible beam is loaded on a 1/4 fan-shaped contour formed by the flexible beam as a radius and the root thereof as a center. Thereby ensuring that the flexible beam is not blocked during loading.
  • a functional device such as a sensor, a device for inspecting the impact strength of the microstructure in accordance with the present invention, and a microstructure to be tested according to the present invention are fabricated by the SOG standard bulk silicon process, and the three are defined by the same lithography in the same microcell. The pattern releases the movable structure by the same etching.
  • the device for in-line testing of the microstructure impact strength is loaded and tested, for example, using a probe.
  • a probe eg, a second probe
  • the flexible beam is sequentially loaded from near to far to the position of the corresponding locking tooth, and then another probe is utilized (eg, the first probe) Needle) to perform the locking operation.
  • the flexible beam is released by another probe, and the impact result is recorded.
  • the test is repeated until the microstructure under test is damaged by the impact load, and the loading distance of the flexible beam at this time is recorded, that is, the position of the locking tooth at this time.
  • the breaking position is the twentieth locking tooth, that is, the loading deflection is 200 microns.

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Abstract

一种在线测试微结构冲击强度的装置，包括：柔性梁（1），柔性梁（1）的一端固定；设置在柔性梁（1）的另一端处的冲击质量块（2），用于向微结构施加冲击；和锁定件（3），锁定件（3）包括梁臂（31）和多个锁定齿（32），梁臂（31）垂直于柔性梁（1）且梁臂（31）的一端固定，多个锁定齿（32）沿着梁臂（31）间隔排布，使得向柔性梁（1）加载时柔性梁（1）的另一端与多个锁定齿（32）中的一个卡合。还公开了一种在线测试微结构冲击强度的方法。

Description

在线测试微结构冲击强度的装置和方法 技术领域
本发明涉及微电子机械系统(MEMS)加工领域，尤其涉及一种在线测试微结构冲击强度的装置和方法。
背景技术
微电子机械系统(MEMS)是微电子技术发展和应用的一个重要方向。如今，微电子机械系统的各类传感器已经广泛应用在民用军用的方方面面，诸如压力计、加速度计和陀螺等使用这些传感器的装置都在消费电子和高精端应用中成为了不可缺少的部件。由于自身测试物理量的特点，这类传感器的工作环境中往往会碰到冲击性载荷，此时传感器结构的冲击强度就显得十分重要。传统的微电子机械系统传感器的冲击强度检测为落锤实验，这类实验方法需要传感器在制作工艺流程结束后进行裂片和封装，难以实现即时对器件进行强度检测，从而极大地增加了整个设计流程和周期。同时，该类传统的冲击检测方法具有较大的破坏性，传感器芯片在经历过此类传统方法检测后将出现大面积的结构破坏，无法找出结构中承受冲击能力最为薄弱的地方。不仅如此，受限于加载产生的原理，传统的冲击检测方法很难获得高冲击峰值(大于100000g)和大冲击脉宽(s量级)的加载。然而，在实际军事应用环境中，此类严峻的冲击环境十分常见。由此可见，传统的冲击检测方法和装置具有明显的局限性。
发明内容
鉴于此，提出了本发明，旨在解决现有技术中存在的上述问题和缺陷中的至少一个方面。
根据本发明的一方面，提出了一种在线测试微结构冲击强度的装置，包括：柔性梁，所述柔性梁的一端固定；设置在所述柔性梁的另一端处的冲击质量块，用于向微结构施加冲击；和锁定件，所述锁定件包括梁臂和多个锁定齿，所述梁臂的一端固定，所述多个锁定齿沿着所述梁臂间隔排布，使得向所述柔性梁加载时所述柔性梁的另一端与所述多个锁定齿中的一个卡合。
根据本发明的另一方面，提出了一种使用上述装置在线测试微结构冲击强度的方法，包括步骤：(a)将所述微结构固定为面对所述冲击质量块；(b)加载所述柔性梁，使所述柔性梁的另一端与所述多个锁定齿中的最靠近所述柔性梁的另一端的一个锁定齿卡合；(c)释放所述柔性梁的另一端，以通过设置在所述柔性梁的另一端上的所述冲击质量块向所述微结构 施加冲击；(d)重复步骤(b)和(c)，使所述柔性梁的另一端以由近及远的顺序依次与所述多个锁定齿中的各个锁定齿卡合并释放，直到所述微结构被破坏；和(e)记录所述微结构被破坏时所对应的锁定齿的位置，计算相应的加载挠度并获得对应的冲击强度。
附图说明
图1是根据本发明实施例的在线测试微结构冲击强度的装置的示意性视图，其中柔性梁未被加载；
图2是根据本发明实施例的在线测试微结构冲击强度的装置的示意性视图，其中正在释放被加载的柔性梁，被加载时柔性梁的一端与多个锁定齿中的一个锁定齿卡合；
图3(a)是根据本发明实施例的一示例性实例的在线测试微结构冲击强度的装置的电镜照片局部示意图；
图3(b)是通过有限元分析软件Ansys(ANSYS公司，美国)仿真获得的根据图3(a)所示实例的在线测试微结构冲击强度的装置在不同加载条件下的冲击瞬间的冲击速度示意图；和
图3(c)是通过有限元分析软件Ansys(ANSYS公司，美国)仿真获得的根据图3(a)所示实例的在线测试微结构冲击强度的装置在不同加载条件下使所述微结构产生的冲击应力峰值示意图。
具体实施方式
以下将参考附图，根据具体实施方式来说明本发明，熟悉本领域的技术人员可由以下实施例中所揭示的内容轻易地了解本发明的构造、优点与功效。
本发明亦可藉由其它不同的具体实例加以施行或应用，本说明书中的各项细节亦可基于不同观点与应用，在不背离本发明的构思和范围的情况下可以对各细节进行各种修改与变更。
根据本发明的一般性的发明构思，设计了一种在线测试微结构冲击强度的方法和装置。具体地，在制造具有所述微结构的功能器件的同时，利用标准的硅-玻璃键合(silicon on glass，SOG)体硅工艺在具有功能器件的硅片上同时制造功能器件和根据本发明的在线测试微结构冲击强度的装置(即，所述硅片上添加具有根据本发明的在线测试微结构冲击强度的装置的检测区域)，而且同时在相同的制造工艺条件下在所述装置处制造所述微结构的测试样品，用于之后的冲击强度测试。在制造完成所述功能器件、所述装置和所述微结构的测试样品之后，通过所述装置向所述微结构的测试样品施加冲击，从而进行冲击强度测试，在线地获取功能 器件的工艺相关力学特性参数。
参考图1和2，根据本发明实施例的在线测试微结构冲击强度的装置100包括：柔性梁1，柔性梁1的一端固定；设置在柔性梁1的另一端处的冲击质量块2，用于向微结构6施加冲击；和锁定件3，锁定件3包括梁臂31和多个锁定齿32，梁臂31垂直于柔性梁1并且梁臂31的一端固定，多个锁定齿32沿着梁臂31间隔排布，使得向柔性梁1加载时柔性梁1的另一端与多个锁定齿32中的一个卡合。
在根据本发明实施例的在线测试微结构冲击强度的装置中，柔性梁1的宽度w和长度1按照以下公式(1)决定该装置所能够产生的最大冲击能量：
Figure PCTCN2015080872-appb-000001
其中，δmax是硅的静态拉伸断裂强度，l为梁长，w为梁宽度，E为硅的杨氏模量，I为梁的惯性矩。冲击质量块1的大小和形状决定所述装置中冲击能量传递给微结构的比例，而锁定齿32在梁臂上的分布情况决定整个装置的冲击强度检测最小分辨率。
在测试时，待测的微结构6设置在柔性梁1的具有冲击质量块2的一端，如图1所示；在加载柔性梁1时，通过推动柔性梁1和/或梁臂31，而将柔性梁1的设置有冲击质量块2的一端卡合在多个锁定齿32中的一个锁定齿中。随后，如图2所示，持续推动梁臂31的自由端，直到柔性梁1的设置有冲击质量块2的一端脱离所卡合的锁定齿，将瞬间冲击施加在微结构6上。
通过本发明的在线测试微结构冲击强度的装置，相比于传统的冲击整个诸如传感器等功能器件的测试方法，能够更加方便和准确地测试微结构的冲击强度，测试时间明显缩短，更加有利于诸如传感器等功能器件的设计反馈。而且，由于能够对微结构进行测试，因此能够将复杂的结构分解成各个微结构，逐一测试被分解出来的各个微结构，从而容易找到复杂结构的最为薄弱区域。
在一实施例中，采用标准硅-玻璃键合(SOG)体硅工艺制造根据本发明的在线测试微结构冲击强度的装置100、待测微结构6和功能器件(图中未示出，诸如传感器等)，其中待测微结构6是功能器件中的一微结构的复制样品，用于进行冲击强度测试。在制造过程中，在同一光刻工艺中形成微结构6、所述装置100和功能器件的图案，并且在同一刻蚀工艺中释放微结构、所述装置和功能器件的可动硅结构。这样，能够保证待测微结构6和实际工作的诸如传感器等功能器件具有一致的冲击强度，排除了工艺误差带来的干扰。
在一实施例中，采用标准硅-玻璃键合(SOG)体硅工艺制造根据本发明的在线测试微结 构冲击强度的装置100、待测微结构6和功能器件(图中未示出，诸如传感器等)，使得根据本发明的装置100、功能器件和待测微结构6形成在同一微单元内，便于对每个功能器件单独进行测试。通过这样的设置，一方面能够对每个功能器件进行冲击强度测试；另一方面，由于诸如传感器等功能器件与测试区域分开，因此能够在线测试微结构的冲击强度，同时又不会损坏实际工作的功能器件，优于全部破坏整个功能器件的传统冲击方式。
在一实施例中，采用标准SOG体硅工艺制造根据本发明的在线测试微结构冲击强度的装置100、待测微结构6和功能器件(图中未示出，诸如传感器等)，使得微结构6被锚定在功能器件所在的硅片(未示出)上并且面对冲击质量块2，并且使得柔性梁1和梁臂31的一端锚定在所述硅片上。
在一实施例中，多个锁定齿32从梁臂31的自由端沿着梁臂32依次间隔排布且齿长等量减小。然而，本发明不限于此，本领域技术人员可以根据实际的测试分辨率需求设置各个锁定齿的间隔和齿长以及锁定齿的个数。例如，在一优选实施例中，各个锁定齿32等间距排布并且各个齿尖的连线构成大体的圆弧轮廓，如图1所示。
在一实施例中，冲击质量块2的尺寸设置为与微结构6的尺寸大体一致。冲击质量块2的大小和形状可以随着微结构6的大小和形状的变化而变化，从而容易获得高加速度、高脉宽的冲击载荷。例如，在一优选实施例中，冲击质量块2的一端呈圆弧状，如图1和2所示。然而，本发明不限于此，本领域技术人员可以根据实际的需求设置冲击质量块2的形状和大小，也可以通过同时调整冲击质量块和柔性梁的尺寸来实现所需的冲击载荷。
在一实施例中，根据本发明的在线测试微结构冲击强度的装置100还包括第一探针4，第一探针4用于推动梁臂31的自由端，以加载和/释放与多个锁定齿32中的一个卡合的柔性梁1的自由端。在一实施例中，根据本发明的在线测试微结构冲击强度的装置100还包括第二探针5，第二探针5用于推动柔性梁1的自由端移动，以与多个锁定齿32中的一个卡合。应该指出的是，本发明不限于此，本领域技术人员能够根据需要采用任意结构，只要能够推动柔性梁1和梁臂32，实现柔性梁的加载和/或卸载。
此外，本发明还提供了一种使用如上所述的装置100在线测试微结构冲击强度的方法，包括步骤：(a)将微结构6固定为面对冲击质量块2；(b)加载柔性梁1，使柔性梁1的另一端(即，自由端)与多个锁定齿32中的最靠近柔性梁1的另一端的一个锁定齿卡合；(c)释放柔性梁1的另一端，以通过设置在柔性梁1的另一端上的冲击质量块2向微结构6施加冲击；(d)重复步骤(b)和(c)，使柔性梁1的另一端以由近及远的顺序依次与多个锁定齿32中的各个锁定齿卡合并释放，直到微结构6被破坏；和(e)记录微结构6被破坏时所对 应的锁定齿的位置，计算相应的加载挠度并获得对应的冲击强度。
如上所述的，通过根据本发明的在线测试微结构的方法，相比于传统的冲击整个诸如传感器等功能器件的测试方法，能够更加方便和准确地测试微结构的冲击强度，测试时间明显缩短，更加有利于诸如传感器等功能器件的设计反馈。而且，由于能够对微结构进行测试，因此能够将复杂的结构分解成各个微结构，逐一测试被分解出来的各个微结构，从而容易找到复杂结构的最为薄弱区域。
在一实施例中，步骤(a)包括：采用硅-玻璃键合体硅工艺，在同一光刻工艺中形成微结构6、所述装置100和诸如传感器等功能器件的图案，并且在同一刻蚀工艺中释放所述微结构、所述装置和所述功能器件的可动硅结构，使得所述微结构被锚定在所述功能器件所在的硅片上并且面对所述冲击质量块，并且使得所述柔性梁和所述梁臂的一端锚定在所述硅片上。
在一实施例中，步骤(c)包括使用第一探针4推动梁臂31的自由端，以加载和/释放柔性梁1的另一端。在还一实施例中，步骤(b)包括使用第二探针5推动柔性梁1的另一端(即，自由端)，以加载柔性梁1的另一端。
在一实施例中，在步骤(e)中，通过商业上可获得的大型通用有限元分析软件--Ansys软件(ANSYS公司，美国)中的LS-DYNA模拟器建立所述装置的力学模型，将相应的加载挠度输入所述装置的力学模型中，并且通过仿真得到冲击瞬间产生的加速度大小，从而获得所述冲击质量块与所述微结构碰撞瞬间的冲击强度大小。
下面将参考附图3(a)-3(c)详细描述根据本发明的在线测试微结构冲击强度的装置和方法的具体实例。
首先，根据待测试的微结构确定根据本发明的在线测试微结构冲击强度的装置的尺寸，在本实例中，待测试的微结构是宽度为20微米、长度为40微米的单齿结构。冲击质量块2采用与待测试的微结构相似的尺寸，即长为40微米、宽为30微米的单侧圆弧状方体，如图3(a)中的电镜照片局部示意图。柔性梁1的尺寸应该设计为：必须保证在极限挠度情况下使得冲击质量块在撞击待测试微结构前一瞬间达到10m/s的速度水平，由此，根据柔性梁能量储存公式、角速度以及线速度关系和能量守恒原理，在本实例的情况下柔性梁的尺寸为：长700微米，宽10微米。在该设计下，冲击质量块在撞击前一瞬间速度可到达20m/s。锁定齿的设计根据冲击速度分辨率需求确定，分辨率需求越高，锁定齿的排布越密集，即数量越多。在本实例中，锁定齿的间隔为10微米。同时，锁定齿的位置依据柔性梁而变化，在本实例中，柔性梁被加载的锁定位置在以柔性梁为半径、其根部为圆心所形成的1/4扇形轮廓上， 从而保证柔性梁加载过程中不被阻挡。
在实例中，通过SOG标准体硅工艺制作诸如传感器等功能器件、根据本发明的在线测试微结构冲击强度的装置和待测试的微结构，三者在同一微单元内，通过同一光刻定义结构图形，通过同一次刻蚀释放可动结构。
制造工艺结束后，例如利用探针对根据本实例的在线测试微结构冲击强度的装置进行加载和测试。在本实例中，采用一探针(例如，第二探针)直接驱动，将柔性梁由近及远依次加载到相应的锁定齿的位置处，然后利用另一探针(例如，第一探针)进行锁定操作。待整个系统稳定之后，利用另一探针释放柔性梁，记录冲击结果，反复测试直到被测试的微结构被冲击加载破坏，记录此时柔性梁的加载距离，即此时锁定齿的位置。本实例中破坏位置为第二十个锁定齿，即加载挠度为200微米。
之后，将测试获取的冲击破坏挠度代入通过ANSYS公司(美国)的Ansys软件所建立的力学模型中，在Ansys软件的LS-DYNA模块中进行冲击过程的仿真模拟，获取挠度为200微米情况下冲击质量块和被测试微结构撞击瞬间的冲击加速度，即为该测试微结构的冲击载荷极限强度值，如图3(b)和(c)示出本实例在不同加载条件下的冲击瞬间的冲击速度示意图和使所述微结构产生的冲击应力峰值示意图。在本实例中，被测试的微结构的冲击强度值为1.25Gpa。
上述本发明的实施例仅例示性的说明了本发明的原理及其功效，而非用于限制本发明，熟知本领域的技术人员应明白，在不偏离本发明的精神和范围的情况下，对本发明所作的任何改变和改进都在本发明的范围内。本发明的权利保护范围，应如本申请的申请专利范围所界定的为准。

Claims (12)

  1. 一种在线测试微结构冲击强度的装置，包括：
    柔性梁，所述柔性梁的一端固定；
    设置在所述柔性梁的另一端处的冲击质量块，用于向微结构施加冲击；和
    锁定件，所述锁定件包括梁臂和多个锁定齿，所述梁臂垂直于所述柔性梁且所述梁臂的一端固定，所述多个锁定齿沿着所述梁臂间隔排布，使得向所述柔性梁加载时所述柔性梁的另一端与所述多个锁定齿中的一个卡合。
  2. 根据权利要求1所述的装置，其中，采用硅-玻璃键合体硅工艺，在同一光刻工艺中形成所述微结构、所述装置和功能器件的图案，其中所述功能器件包含有与微结构相同的结构，并且在同一刻蚀工艺中释放所述微结构、所述装置和所述功能器件的可动硅结构，使得所述微结构被锚定在所述功能器件所在的硅片上并且面对所述冲击质量块，并且使得所述柔性梁和所述梁臂的一端锚定在所述硅片上。
  3. 根据权利要求1或2所述的装置，其中，所述多个锁定齿从所述梁臂的另一端沿着所述梁臂依次间隔排布且齿长等量减小。
  4. 根据权利要求1-3中任一项所述的装置，还包括：
    第一探针，所述第一探针用于推动所述梁臂的另一端，以加载或释放与所述多个锁定齿中的一个卡合的所述柔性梁的另一端。
  5. 根据权利要求4所述的装置，还包括：
    第二探针，所述第二探针用于推动所述柔性梁的另一端移动，以与所述多个锁定齿中的一个卡合。
  6. 根据权利要求1-3中任一项所述的装置，其中，所述冲击质量块的尺寸设置为与所述微结构的尺寸大体一致。
  7. 根据权利要求6所述的装置，其中，所述冲击质量块的一端呈圆弧状。
  8. 一种使用如权利要求1所述的装置在线测试微结构冲击强度的方法，包括步骤：
    (a)将所述微结构固定为面对所述冲击质量块；
    (b)加载所述柔性梁，使所述柔性梁的另一端与所述多个锁定齿中的最靠近所述柔性梁的另一端的一个锁定齿卡合；
    (c)释放所述柔性梁的另一端，以通过设置在所述柔性梁的另一端上的所述冲击质量块向所述微结构施加冲击；
    (d)重复步骤(b)和(c)，使所述柔性梁的另一端以由近及远的顺序依次与所述多个锁定齿中的各个锁定齿卡合并释放，直到所述微结构被破坏；和
    (e)记录所述微结构被破坏时所对应的锁定齿的位置，计算相应的加载挠度并获得对应的冲击强度。
  9. 根据权利要求8所述的方法，其中所述步骤(a)包括：采用硅-玻璃键合体硅工艺，在同一光刻工艺中形成所述微结构、所述装置和包括有所述微结构的功能器件的图案，其中所述功能器件包含有与微结构相同的结构，并且在同一刻蚀工艺中释放所述微结构、所述装置和所述功能器件的可动硅结构，使得所述微结构被锚定在所述功能器件所在的硅片上并且面对所述冲击质量块，并且使得所述柔性梁和所述梁臂的一端锚定在所述硅片上。
  10. 根据权利要求8或9所述的方法，其中，所述步骤(c)包括：使用第一探针推动所述梁臂的另一端，以加载或释放所述柔性梁的另一端。
  11. 根据权利要求10所述的方法，其中，所述步骤(b)包括：使用第二探针推动所述柔性梁的另一端，以加载所述柔性梁的另一端。
  12. 根据权利要求8或9所述的方法，其中所述步骤(e)包括：
    将所述相应的加载挠度输入所述装置的力学模型中，获得所述冲击质量块与所述微结构碰撞瞬间的冲击加速度。
PCT/CN2015/080872 2015-06-05 2015-06-05 在线测试微结构冲击强度的装置和方法 WO2016192100A1 (zh)

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CN1936535A (zh) * 2005-12-07 2007-03-28 上海浩顺科技有限公司 一维冲击强度测试装置
JP5621478B2 (ja) * 2010-09-29 2014-11-12 Ｊｆｅスチール株式会社 高靱性かつ高変形性高強度鋼管用鋼板およびその製造方法
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