WO2016106890A1 - 一种对显示器的制程进行线上实时控制的方法 - Google Patents

一种对显示器的制程进行线上实时控制的方法 Download PDF

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WO2016106890A1
WO2016106890A1 PCT/CN2015/071137 CN2015071137W WO2016106890A1 WO 2016106890 A1 WO2016106890 A1 WO 2016106890A1 CN 2015071137 W CN2015071137 W CN 2015071137W WO 2016106890 A1 WO2016106890 A1 WO 2016106890A1
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display
line parameters
line
quality
attribute
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陈黎暄
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TCL China Star Optoelectronics Technology Co Ltd
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Shenzhen China Star Optoelectronics Technology Co Ltd
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
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    • G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling

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  • the present invention generally relates to display manufacturing. More specifically, it relates to a method of performing on-line real-time control of a display process.
  • the quality of the display is one of the important factors determining the market share. Since the production process of the display includes several processes, if the process fluctuation of the process is too large, the key attributes of the display will exceed the specifications. Phenomenon means that the quality of the display does not meet the specified quality specifications.
  • Gamma is one of the key attributes affecting the quality of liquid crystal displays. It is derived from the response curve of the display, which characterizes the nonlinear relationship between the display brightness of the display and the input voltage. Among them, the corresponding production line of some processes in the process of liquid crystal display. The parameters are related to the Gamma genus. If the corresponding line parameters of a certain process fluctuate greatly, the Gamma attribute will exceed the specification, that is, the quality of the liquid crystal display does not meet the specified quality specifications.
  • An exemplary embodiment of the present invention is to provide a method for performing on-line real-time control of a process of a display to overcome the problem that the quality of the semi-finished product in the prior art is difficult to remedy.
  • the present invention provides a method for performing on-line real-time control of a display process, comprising: (A) establishing a monitoring equation for estimating a display property based on line parameters corresponding to respective processes in a process of the display, wherein The calculation result of the monitoring equation is used to indicate the quality of the display; (B) each time a process of the display is completed, the calculation result of the monitoring equation is updated according to the value of the line parameter corresponding to the process fed back on the line. (C) when the quality of the display indicated by the calculation result updated in the step (B) does not conform to the specified quality specification, the line parameters corresponding to the process after the one process are adjusted to make the display The quality meets the specified quality specifications.
  • step (A) the monitoring equation is expressed as a linear weighting of the line parameters, and a least squares method is used to determine the weight of each line parameter.
  • monitoring equation is expressed as the following equation:
  • S is a display attribute, X i with the display process in the i-th step corresponding to all of the production line parameters, k i is the weight X i weight, n is the number of display process included in the process.
  • the display is a liquid crystal display or an organic electroluminescent display.
  • the display attribute comprises at least one of the following: a gamma attribute, a contrast attribute, and a penetration attribute.
  • the display is a liquid crystal display
  • the display attribute is a Gamma attribute
  • each process in the process of the display comprises a PI process, an ITO process, a box gap process, an HVA process, and an LC process
  • the corresponding production line parameters of the PI process include thickness and temperature
  • the production line parameters corresponding to the ITO process include cracks and thicknesses
  • the line parameters corresponding to the box gap process include distances
  • the line parameters corresponding to the HVA process include voltage and temperature.
  • time and illumination; line parameters corresponding to the LC process include quantities.
  • step (B) for the production line parameters corresponding to the process after the one process, the calculation results of the monitoring equation are updated by using preset standard values respectively.
  • the line parameters corresponding to the steps after the one step are manually adjusted in accordance with the adjustment range set in advance for each line parameter.
  • the key attributes of the display can be maintained within the qualified specifications by adjusting the production line parameters of the subsequent process, thereby avoiding the quality of the semi-finished product.
  • the problem is difficult to remedy, increasing the output of qualified display products.
  • FIG. 1 illustrates a flow chart of a method of performing on-line real-time control of a process of a display, in accordance with an exemplary embodiment of the present invention.
  • FIG. 1 illustrates a flow chart of a method of performing on-line real-time control of a process of a display, in accordance with an exemplary embodiment of the present invention.
  • the display may be a liquid crystal display (LCD) or an organic electroluminescent display (OLCD). It should be understood that the display is not limited to a liquid crystal display or an organic electroluminescent display, and may be other display devices.
  • step S10 a monitoring equation for estimating a display property is established based on line parameters respectively corresponding to respective processes in the process of the display, wherein the calculation result of the monitoring equation is used to indicate the display quality.
  • the line parameters are used to establish a monitoring equation for estimating the properties of the display.
  • the display attributes can include at least one of the following: a Gamma attribute, a contrast attribute, and a penetration rate attribute.
  • the Gamma property can characterize the non-linear relationship between the display brightness of the display and the input voltage
  • the contrast property can characterize the ratio of the brightness of the display
  • the transmittance property can characterize the efficiency with which the display transmits light.
  • the monitoring equation can be expressed as a linear weighting of the line parameters, and the least squares method can be utilized to determine the weight of each line parameter.
  • Equation 1 the monitoring equation can be expressed by Equation 1 below:
  • S is a display attribute
  • X i with the display process in the i-th step corresponding to all of the production line parameters
  • k i is the weight X i weight
  • n is the number of display process included in the process.
  • X-i can be a vector with the display process in the i-th all production line parameters corresponding step consisting
  • K i can by respectively correspond to the processes in the i-th step displays the corresponding A vector consisting of the weights of the various production line parameters.
  • the display is a liquid crystal display
  • the display attribute is a Gamma attribute
  • each process in the process of the display includes a PI process, an ITO process, a box gap process, an HVA process, and an LC process, wherein, the PI process
  • the corresponding production line parameters include thickness and temperature
  • the production line parameters corresponding to the ITO process include cracks and thicknesses
  • the production line parameters corresponding to the box gap process include distances
  • the line parameters corresponding to the HVA process include voltage, temperature, time, and illumination
  • the line parameters corresponding to the LC process include quantities.
  • the weight of each line parameter can be determined using a least squares method based on the above-described line parameters and Gamma standard values monitored online, thereby obtaining a monitoring equation for estimating the Gamma attribute.
  • Equation 2 The monitoring equation for estimating the Gamma property can be expressed by Equation 2 below:
  • the x 1 and x 2 in the process are the thickness line parameters and the temperature line parameters corresponding to the PI process, respectively, and k 1 and k 2 in [k 1 k 2 ] are the weights of the thickness line parameters and the temperature line parameters, respectively.
  • the weight of, The x 3 and x 4 in the process are the crack production line parameters and the thickness production line parameters corresponding to the ITO process, respectively, and k 3 and k 4 in [k 3 k 4 ] are the weights of the crack production line parameters and the thickness production line parameters, respectively.
  • the weight, x 5 is the distance line parameter corresponding to the box gap process, and k 5 is the weight of the distance line parameter.
  • the x 6 , x 7 , x 8 and x 9 are the voltage line parameters, temperature line parameters, time line parameters and illuminance line parameters corresponding to the HVA process, respectively [k 6 k 7 k 8 k 9 k 6 , k 7 , k 8 and k 9 are the weights corresponding to the voltage production line parameters, the temperature production line parameters, the time production line parameters and the illumination production line parameters, and x 10 is the quantity corresponding to the LC process.
  • the line parameter, k 10 is the weight of the quantity line parameter.
  • step S20 each time a process of the display is completed, the calculation result of the monitoring equation is updated according to the value of the line parameter corresponding to the process fed back on the line.
  • the production process of the display may include a plurality of processes, and the process has a predetermined sequence, and each time a process of the display is completed, the value of the line parameter corresponding to the process fed back on the line is performed. Update, at this time, the value of the line parameter corresponding to the process fed back on the line can be substituted into the monitoring equation to obtain an updated calculation result.
  • the preset can be The standard values are substituted into the monitoring equation. That is to say, for the production line parameters corresponding to the processes located after the one process, the preset standard values may be used to update the supervisory The calculation result of the governing equation.
  • step S30 when the quality of the display indicated by the calculation result updated in step S20 does not conform to the specified quality specification, the line parameters corresponding to the process after the one process are adjusted to make the quality of the display Meet the required quality specifications.
  • the process completed when the quality of the display does not conform to the prescribed quality specification can be determined.
  • the production line corresponding to the next process that is, the process after the box gap process
  • the parameters are adjusted to match the quality of the display to the specified quality specifications.
  • the line parameters corresponding to the steps after the one step may be manually adjusted in accordance with the adjustment range set in advance for each line parameter.
  • the key attributes of the display can be kept within the qualified specifications by adjusting the production line parameters of the subsequent processes, thereby avoiding the problem of semi-finished product quality being difficult to remedy.
  • the situation has increased the output of qualified displays.

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Abstract

一种对显示器的制程进行线上实时控制的方法，包括：基于分别与显示器的制程中的各个工序相应的产线参数来建立用于估计显示器属性的监控方程，其中，监控方程的计算结果用于指示显示器的质量（S10）；每当完成显示器的一个工序时，根据线上反馈的与该工序相应的产线参数的数值来更新监控方程的计算结果（S20）；当在步骤（S20）中更新的计算结果指示的显示器的质量不符合规定的质量规格时，对与位于一个工序后的工序相应的产线参数进行调整以使显示器的质量符合规定的质量规格（S30）。根据该方法，可以通过调整后续工序的产线参数来将显示器的关键属性保持在合格的规格内，从而挽救半成品，提高合格显示器产品的产量。

Description

一种对显示器的制程进行线上实时控制的方法 技术领域
本发明总体来说涉及显示器制造。更具体地讲，涉及一种对显示器的制程进行线上实时控制的方法。
背景技术
在品牌众多的显示器市场，显示器的质量是决定市场占有率的重要因素之一，由于显示器的生产过程包括若干道制程，如果制程的某个工序波动过大，就会出现显示器关键属性超出规格的现象，即意味着显示器的质量不符合规定的质量规格。
例如，Gamma是影响液晶显示器质量的关键属性之一，源于显示器的响应曲线，其表征显示器的显示亮度与输入电压的非线性关系，其中，液晶显示器的制程中的某些工序相应的产线参数与Gamma属相相关，如果某个工序相应的产线参数出现较大的波动，就会使Gamma属性超出规格，即，液晶显示器的质量不符合规定的质量规格。
在现有的显示器制造工艺中，即使及时地发现了由于产线制程波动导致出现了不符合规定的制品，也无法挽回已经生产到一半的半成品。
发明内容
本发明的示例性实施例在于提供一种对显示器的制程进行线上实时控制的方法，以克服现有技术中半成品质量不合格难以补救的问题。
本发明提供一种对显示器的制程进行线上实时控制的方法，包括：(A)基于分别与显示器的制程中的各个工序相应的产线参数来建立用于估计显示器属性的监控方程，其中，所述监控方程的计算结果用于指示显示器的质量；(B)每当完成显示器的一个工序时，根据线上反馈的与该工序相应的产线参数的数值来更新所述监控方程的计算结果；(C)当在步骤(B)中更新的计算结果指示的显示器的质量不符合规定的质量规格时，对与位于所述一个工序后的工序相应的产线参数进行调整以使所述显示器的质量符合规定的质量规格。
可选地，在步骤(A)中，所述监控方程表示为所述产线参数的线性加权，并且，利用最小二乘法来确定各个产线参数的权重。
可选地，所述监控方程表示为下面的等式：
Figure PCTCN2015071137-appb-000001
其中，S为显示器属性，Xi为与显示器的制程中的第i个工序相应的所有产线参数，ki为Xi的权重，n为显示器的制程中所包括的工序的数量。
可选地，所述显示器为液晶显示器或有机电激发光显示器。
可选地，所述显示器属性包括以下项中的至少一项：Gamma属性、对比度属性和穿透率属性。
可选地，所述显示器为液晶显示器，所述显示器属性为Gamma属性，其中，所述显示器的制程中的各个工序包括PI工序、ITO工序、盒间隙工序、HVA工序和LC工序，其中，与PI工序相应的产线参数包括厚度和温度；与ITO工序相应的产线参数包括裂缝和厚度；与盒间隙工序相应的产线参数包括距离；与HVA工序相对应的产线参数包括电压、温度、时间和照明度；与LC工序相应的产线参数包括数量。
可选地，在步骤(B)中，对于与位于所述一个工序后的工序相应的产线参数，采用分别预设的标准数值来更新所述监控方程的计算结果。
可选地，在步骤(C)中，按照针对各个产线参数预先设置的调整范围来手动调整与位于所述一个工序后的工序相应的产线参数。
在根据本发明示例性实施例的对显示器的制程进行线上实时控制的方法中，可以通过调整后续工序的产线参数来将显示器的关键属性保持在合格的规格内，从而避免了半成品质量出现问题难以补救的局面，提高了合格显示器产品的产量。
附图说明
图1示出根据本发明示例性实施例的对显示器的制程进行线上实时控制的方法的流程图。
具体实施方式
现将详细参照本发明的示例性实施例，所述实施例的示例在附图中示出，其中，相同的标号始终指的是相同的部件。以下将通过参照附图来说明所述实施例，以便解释本发明。
图1示出根据本发明示例性实施例的对显示器的制程进行线上实时控制的方法的流程图。这里，作为示例，所述显示器可以为液晶显示器(LCD)或有机电激发光显示器(OLCD)。应理解，所述显示器不限于液晶显示器或有机电激发光显示器，也可以是其他显示设备。
如图1所示，在步骤S10，基于分别与显示器的制程中的各个工序相应的产线参数来建立用于估计显示器属性的监控方程，其中，所述监控方程的计算结果用于指示显示器的质量。
这里，在实际生产中，显示器属性的漂移会严重影响显示器的质量，而显示器的制程中的各个工序相应的产线参数会影响显示器属性，因此，可基于分别与显示器的制程中的各个工序相应的产线参数来建立用于估计显示器属性的监控方程。作为示例，所述显示器属性可包括以下项中的至少一项：Gamma属性、对比度属性和穿透率属性。这里，Gamma属性可表征显示器的显示亮度与输入电压的非线性关系；对比度属性可表征显示器亮度的比值；穿透率属性可表征显示器透过光的效率。作为示例，所述监控方程可表示为所述产线参数的线性加权，并且，可利用最小二乘法来确定各个产线参数的权重。
具体说来，可用下面的等式1来表示所述监控方程：
Figure PCTCN2015071137-appb-000002
       等式1
其中，S为显示器属性，Xi为与显示器的制程中的第i个工序相应的所有产线参数，ki为Xi的权重，n为显示器的制程中所包括的工序的数量。这里，作为示例，Xi可以为与显示器的制程中的第i个工序相应的所有产线参数所组成的向量，ki可以为由分别对应于与显示器的制程中的第i个工序相应的各个产线参数的权重所组成的向量。
例如，所述显示器为液晶显示器，所述显示器属性为Gamma属性，其中，所述显示器的制程中的各个工序包括PI工序、ITO工序、盒间隙工序、HVA工序和LC工序，其中，与PI工序相应的产线参数包括厚度和温度；与ITO工序相应的产线参数包括裂缝和厚度；与盒间隙工序相应的产线参数包括距离；与 HVA工序相对应的产线参数包括电压、温度、时间和照明度；与LC工序相应的产线参数包括数量。
相应地，可基于线上监控的上述产线参数和Gamma标准值，利用最小二乘法来确定各个产线参数的权重，从而获得用于估计Gamma属性的监控方程。
可用下面的等式2来表示所述用于估计Gamma属性的监控方程：
Figure PCTCN2015071137-appb-000003
  等式2
其中，S为液晶显示器Gamma属性，
Figure PCTCN2015071137-appb-000004
中的x1和x2分别为与PI工序相应的厚度产线参数和温度产线参数，[k1 k2]中的k1和k2分别为厚度产线参数的权重和温度产线参数的权重，
Figure PCTCN2015071137-appb-000005
中的x3和x4分别为与ITO工序相应的裂缝产线参数和厚度产线参数，[k3 k4]中的k3和k4分别为裂缝产线参数的权重和厚度产线参数的权重，x5为与盒间隙工序相应的距离产线参数，k5为距离产线参数的权重，
Figure PCTCN2015071137-appb-000006
中的x6、x7、x8和x9分别为与HVA工序相应的电压产线参数、温度产线参数、时间产线参数和照明度产线参数，[k6 k7 k8 k9]中的k6、k7、k8和k9分别为电压产线参数、温度产线参数、时间产线参数和照明度产线参数相应的权重，x10为与LC工序相应的数量产线参数，k10为与数量产线参数的权重。
在步骤S20，每当完成显示器的一个工序时，根据线上反馈的与该工序相应的产线参数的数值来更新所述监控方程的计算结果。
具体说来，显示器的生产过程可包括若干个工序，并且，所述工序存在预定的顺序，每当完成显示器的一个工序时，线上反馈的与该工序相应的产线参数的数值就会进行更新，这时，可将线上反馈的与该工序相应的产线参数的数值代入所述监控方程，以得到更新的计算结果，这里，应注意，对于尚未经过的工序，可将预设的标准数值代入所述监控方程。也就是说，对于与位于所述一个工序后的工序相应的产线参数，可采用分别预设的标准数值来更新所述监 控方程的计算结果。
在步骤S30，当在步骤S20中更新的计算结果指示的显示器的质量不符合规定的质量规格时，对与位于所述一个工序后的工序相应的产线参数进行调整以使所述显示器的质量符合规定的质量规格。
具体说来，当在步骤S20更新的计算结果指示的显示器的质量不符合规定的质量规格时，可确定在显示器的质量不符合规定的质量规格时所完成的工序。例如，当在盒间隙工序完成时更新的显示器属性Gamma的计算结果超出规格(例如，Gamma＝2.3)时，可对与接下来的工序(即，位于盒间隙工序后的工序)相应的产线参数进行调整以使显示器的质量符合规定的质量规格。这里，作为示例，可按照针对各个产线参数预先设置的调整范围来手动调整与位于所述一个工序后的工序相应的产线参数。通过上述处理方式，可以通过调整后续工序的产线参数来将显示器的关键属性保持在合格的规格内，从而挽救半成品。
由此可见，在对显示器的制程进行线上实时控制的方法中，可以通过调整后续工序的产线参数来将显示器的关键属性保持在合格的规格内，从而避免了半成品质量出现问题难以补救的局面，提高了合格显示器的产量。
虽然已表示和描述了本发明的一些示例性实施例，但本领域技术人员应该理解，在不脱离由权利要求及其等同物限定其范围的本发明的原理和精神的情况下，可以对这些实施例进行修改。

Claims (8)

  1. 一种对显示器的制程进行线上实时控制的方法，包括：
    (A)基于分别与显示器的制程中的各个工序相应的产线参数来建立用于估计显示器属性的监控方程，其中，所述监控方程的计算结果用于指示显示器的质量；
    (B)每当完成显示器的一个工序时，根据线上反馈的与该工序相应的产线参数的数值来更新所述监控方程的计算结果；
    (C)当在步骤(B)中更新的计算结果指示的显示器的质量不符合规定的质量规格时，对与位于所述一个工序后的工序相应的产线参数进行调整以使所述显示器的质量符合规定的质量规格。
  2. 如权利要求1所述的方法，其中，在步骤(A)中，所述监控方程表示为所述产线参数的线性加权，并且，利用最小二乘法来确定各个产线参数的权重。
  3. 如权利要求2所述的方法，其中，所述监控方程表示为下面的等式：
    Figure PCTCN2015071137-appb-100001
    其中，S为显示器属性，Xi为与显示器的制程中的第i个工序相应的所有产线参数，ki为Xi的权重，n为显示器的制程中所包括的工序的数量。
  4. 如权利要求1所述的方法，其中，所述显示器为液晶显示器或有机电激发光显示器。
  5. 如权利要求4所述的方法，其中，所述显示器属性包括以下项中的至少一项：Gamma属性、对比度属性和穿透率属性。
  6. 如权利要求1所述的方法，其中，所述显示器为液晶显示器，所述显示器属性为Gamma属性，
    其中，所述显示器的制程中的各个工序包括PI工序、ITO工序、盒间隙工序、HVA工序和LC工序，其中，与PI工序相应的产线参数包括厚度和温度；与ITO工序相应的产线参数包括裂缝和厚度；与盒间隙工序相应的产线参数包 括距离；与HVA工序相对应的产线参数包括电压、温度、时间和照明度；与LC工序相应的产线参数包括数量。
  7. 如权利要求2所述的方法，其中，在步骤(B)中，对于与位于所述一个工序后的工序相应的产线参数，采用分别预设的标准数值来更新所述监控方程的计算结果。
  8. 如权利要求1所述的方法，其中，在步骤(C)中，按照针对各个产线参数预先设置的调整范围来手动调整与位于所述一个工序后的工序相应的产线参数。
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