WO2016101675A1

WO2016101675A1 - Testing device and testing system

Info

Publication number: WO2016101675A1
Application number: PCT/CN2015/091487
Authority: WO
Inventors: 魏伟伟; 郭耀斌; 王晖; 校焕庆; 张晓毅; 韩辉
Original assignee: 中兴通讯股份有限公司
Priority date: 2014-12-24
Filing date: 2015-10-08
Publication date: 2016-06-30
Also published as: CN204374238U

Abstract

A testing device comprises a testing bench (10) for testing a product, a base (20) and a bracket (30) which are connected with the testing bench (10), a switch (40) for controlling the power-on/off of the testing bench (10), and a clamp (50) for clamping the product; the clamp (50) is provided with a clamping block (51) for triggering the switch (40), the switch (40) is mounted on the base (20), and the clamp (50) is movably connected to the bracket (30) and can move relative to the testing bench (10). In the process that the clamp (50) moves toward the testing bench (10), the switch (40) is triggered by the clamping block (51) and the testing bench (10) is powered off. In the case that the clamp (50) is connected to the testing bench (10), the clamping block (51) is detached from the switch (40), and testing bench (10) is powered on to test the product; In the process that the clamp (50) moves to leave the testing bench (10), the switch (40) is triggered by the clamping block (51), the testing bench (10) is powered off, and the clamp (50) is detached from the testing bench (10). A testing system is also disclosed.

Description

Test device and test system

Technical field

The invention relates to the technical field of production testing of communication equipment, in particular to a testing device and a testing system.

Background technique

With the development of communication technology, while the functions of communication devices are becoming increasingly powerful, the size of devices is becoming smaller and smaller. This has led to an increasingly complex circuit of communication devices, and the design of various new devices has become increasingly difficult.

In order to ensure the quality of the products, the products need to be tested strictly before leaving the factory. Due to the special nature of some products, manual manual operation is required for testing. This requires the operator to have a high professional quality and can strictly follow the operation specifications. Otherwise, the operator may directly perform hot plugging and other misoperations, which may cause over-stress. problem. Among them, ESD (Electro-Static discharge) is an electrostatic charge transfer between objects or surfaces of different electrostatic potentials (potential difference), which easily causes device damage during discharge. Electrostatic discharge is a kind of electrical stress in a broad sense. In general, EOS (Electrical Over Stress) refers to the voltage or current that a component is subjected to exceeds its maximum allowable threshold, and the device is permanently damaged. EOS problems can easily lead to device damage, which increases production costs and brings quality hazards.

Summary of the invention

The embodiment of the invention provides a testing device and a testing system, and aims to solve the technical problem of how to avoid EOS damage caused by hot plugging of the power supply when the product is tested.

Embodiments of the present invention provide a testing apparatus including a test stand for testing a product, a base and a bracket connected to the test stand, a switch for controlling the power-off of the test stand, and a product for clamping a clamp; wherein the clamp is provided with a block for actuating the switch, A switch is mounted to the base, the clamp is movably coupled to the bracket, and the clamp is movable relative to the test station.

In an embodiment, a pressing portion for actuating the switch is connected to the base, and the pressing portion is provided with a pushing rod, and the clamping block can push the pushing rod to touch the switch.

In an embodiment, the push rod is provided with a hook that cooperates with the block; when the block presses the hook, the hook drives the push rod to touch the switch The test stand locks the clamp when the card fits the hook.

In an embodiment, the pressing portion further includes an elastic member for resetting the push rod, the elastic member being connected to the base at one end and the push rod at the other end.

In an embodiment, the bracket is provided with a slide rail, and a slide bar that is sleeved on the slide rail, and the slide rod drives the clamp to slide on the slide rail.

In an embodiment, the bracket is provided with a link mechanism for driving the clamp to move relative to the test bench, and the link mechanism includes a first link, a second link, and a third connection that are sequentially connected a rod, wherein the second link is rotatably coupled to the first link and the third link, respectively.

In an embodiment, the bracket is further provided with a guiding hole for limiting the movement track of the link mechanism.

In an embodiment, the bracket is further provided with a handle.

In an implementation manner, the test station is provided with an access port for accessing a product, and the clamp is provided with a contact end corresponding to the access port, and the contact end is provided with a contraction rod.

In addition, embodiments of the present invention also provide a test system including a test device, and a processor coupled to the test device, the test device including a test device, the test device including a test product a test stand, a base and a bracket connected to the test stand, a switch for controlling the on/off of the test stand, and a clamp for holding a product, the clamp being provided with a block for actuating the switch; The switch is mounted to the base, the clamp is movably coupled to the bracket, and the clamp is movable relative to the test stand.

The test device of the embodiment of the present invention moves the jig by setting a block on the jig The process interferes with the switch and controls the on/off of the test bench. Therefore, before the product starts testing, the test bench is in a power-off state; when the product is tested, the test bench is powered; after the product is tested, the test bench is powered off. This can effectively avoid EOS damage caused by hot plugging of the product during testing, thereby saving costs.

DRAWINGS

1 is a schematic structural view of an embodiment of a testing device according to the present invention;

2 is a mechanical schematic diagram of an initial state in another embodiment of the testing device of the present invention;

3 is a mechanical schematic diagram of a state in which a card block and a hook are engaged in another embodiment of the testing device of the present invention;

4 is a mechanical schematic diagram of a state in which a push lever is activated in another embodiment of the testing device of the present invention;

5 is a mechanical schematic diagram of a state in which a product and a test stand are connected in another embodiment of the testing device of the present invention;

6 is a mechanical schematic diagram of a test end state in another embodiment of the test apparatus of the present invention;

Figure 7 is a mechanical schematic diagram of an initial state in a further embodiment of the testing device of the present invention;

8 is a mechanical schematic diagram of a state in which a card block and a hook are engaged in a further embodiment of the testing device of the present invention;

9 is a mechanical schematic diagram of a state in which a push rod is activated in a switch device according to still another embodiment of the present invention;

10 is a mechanical schematic diagram of a state in which a product and a test stand are connected in a further embodiment of the testing device of the present invention;

11 is a mechanical schematic diagram of a test end state in still another embodiment of the test apparatus of the present invention;

Figure 12 is a block diagram of an implementation of a test system of the present invention.

The implementation, functional features, and advantages of the present invention will be further described in conjunction with the embodiments.

detailed description

It is understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

It should be noted that in the description of the present invention, the terms "upper", "lower", "left", "right", "vertical", "horizontal", "top", "bottom", etc. indicate the orientation or The positional relationship is based on the orientation or positional relationship shown in the drawings, and is merely for the convenience of the description of the present invention and the simplified description, and does not indicate or imply that the device or component referred to has a specific orientation, and is constructed and operated in a specific orientation. Therefore, it should not be construed as limiting the invention.

1 to FIG. 11, FIG. 1 is a schematic structural view of an embodiment of a testing device according to the present invention; FIGS. 2 to 6 are schematic mechanical views of another embodiment of the testing device of the present invention; and FIGS. 7 to 11 are testing devices of the present invention. A mechanical schematic of still another embodiment.

The present invention provides a test apparatus. Referring to FIG. 1, in one embodiment, the test apparatus includes a test stand 10 for testing a product, a base 20 and a bracket 30 coupled to the test stand 10 for controlling the test stand 10 An on/off switch 40, and a clamp 50 for clamping the product, the clamp 50 is provided with a block 51 for touching the switch 40; wherein the switch 40 is mounted on the base 20, the clamp 50 is movably connected to the bracket 30, and the clamp 50 can be The test block 10 moves relative to the test stand 10; during the movement of the clamp 50 toward the test stand 10, the block 51 touches the switch 40, and the test stand 10 is powered off; in the case where the clamp 50 is connected to the test stand 10, the block 51 is separated from the switch 40. The test stand 10 is energized for product testing; during the movement of the clamp 50 away from the test stand 10, the block 51 touches the switch 40, the test stand 10 is powered off, and the clamp 50 is separated from the test stand 10.

The switch 40 is connected to the test stand 10 through the base 20, and a circuit for testing the product is installed in the test stand 10. The switch 40 is used for controlling the on and off of the circuit, wherein the test stand 10 is off when the switch 40 is in the touch state. Electrical state. The product to be tested is mounted on the jig 50, and the jig 50 is connected to the test stand 10 through the bracket 30, and when the jig 50 drives the product to be connected to the test stand 10, the product can be detected.

In order to prevent the EOS from being damaged due to the hot plugging of the power supply during the test, the test apparatus of the embodiment of the present invention causes the clamp 50 to interfere with the switch 40 during the movement by setting the block 51 on the clamp 50, and the control test is performed. The on/off of the station 10. Therefore, before the product starts testing, the test bench 10 is in a power-off state; when the product is tested, the test bench 10 is in a power-on state; after the product ends the test, the test bench 10 is powered off.

Of course, the switch 40 can also be configured as an infrared sensor switch 40. When the block 51 passes through the area between the switch 40 and the bracket 30, the switch 40 controls the test stand 10 to be powered off. The switch 40 can also be set to be a touch type. Since the inductive switch 40 such as infrared is not stable, it is easily interfered by other factors and cannot be regulated.

In one or all embodiments of the present invention, the base 20 is connected with a pressing portion 60 for the touch switch 40, and the pressing portion 60 is provided with a push rod 61, and the block 51 can push the push rod 61 to activate the switch 40.

Referring to FIGS. 2 to 6, the push lever 61 is in a natural state with a gap between the switch 40 and the test stand 10 is in an energized state. When the clamp 50 slides downward, the block 51 pushes the push rod 61 to move toward the switch 40, at which time the switch 40 is activated and the test stand 10 is in a power-off state.

The push rod 61 is connected to the base 20 in various manners, for example, the push rod 61 and the base 20 are movably connected by a movable pin, or the push rod 61 is connected to the base 20 through a spring, and the push rod is not limited herein. The specific connection between the 61 and the base 20 can be set according to the strength.

In an embodiment, the push rod 61 is provided with a hook 62 that cooperates with the block 51; when the block 51 presses the hook 62, the hook 62 drives the push rod 61 to touch the switch 40; When the hook 62 is engaged, the test stand 10 locks the clamp 50.

The push rod 61 is provided with a hook 62 that cooperates with the block 51. The hook 62 and the block 51 may be disposed in a form in which the jaws are coupled to each other, or may be disposed in a form of engagement. Since the test bench 10 tests the product, the product and the test bench 10 are always in communication, and the test 1 It takes a long time to lock the jig 50 to the test stand 10 at this time. The clamp 50 drives the block 51 to slide downward. When sliding to the position where the hook 62 is located, the block 51 presses the hook 62, and the hook 62 drives the push rod 61 to touch the switch 40, so that the product is connected to the test bench 10. The front is in a power off state. When the block 51 passes the position where the hook 62 is placed, it will engage with the hook 62, at which time the clamp 50 can be locked with respect to the test stand 10.

In an embodiment, the pressing portion 60 further includes an elastic member 63 for resetting the push rod 61, and one end of the elastic member 63 is connected to the base 20 and the other end is connected to the push rod 61.

Continuing to refer to FIGS. 2-6, after the push rod 61 is pressed by the block 51 to move toward the switch 40, the switch 40 is activated to cause the test stand 10 to be in a power-off state, but the push rod 61 is required after the product is inserted into the test stand 10. The rebound causes the hook 62 to be engaged with the block 51 on the one hand, and the test stand 10 needs to be energized on the other hand, so that the elastic member 63 is added.

In order to secure the stability of the push rod 61, the elastic members 63 may be provided in plurality, such as two. If the push rod 61 is rotatably coupled to the base 20, the provision of the two elastic members 63 in parallel ensures the directionality of the push rod 61 after rebound. The elastic member 63 may be an elastic member such as a spring, a torsion spring, a spring, or the like, or may be a combination of an elastic article and other articles.

In one or all embodiments of the present invention, the bracket 30 is provided with a slide rail (not shown), and a slide bar (not labeled) that is sleeved on the slide rail, and the slide rod drives the clamp 50 to slide on the slide rail.

The slider is sleeved on the rail so that the slider can move back and forth in the direction of the rail so that the clamp 50 can be moved closer to or away from the test bench 10. At the same time, the product mounted on the jig 50 can be slidably connected to the test stand 10 by slidingly connecting the slide rail to the slide rail, and the block 51 can touch the switch 40 when passing the switch 40. The clamp 50 can be moved as needed by providing a sliding connection of the slide rail to the slide rail.

In order to facilitate the operation of the worker, the handle 30 can also be provided with a handle 36. The handle 36 can be used as a hand-held portion for the worker to hold and apply force, wherein the handle 36 can be disposed on the slide bar or the clamp 50. The specific structure of the handle 36 can be set according to the actual needs of the test device, and is not limited herein.

In one or all embodiments of the present invention, the bracket 30 is provided with a link mechanism 31 for driving the clamp 50 relative to the test table 10, and the link mechanism 31 includes a first link 32, a second link 33, and The third link 34 and the second link 33 are rotatably coupled to the first link 32 and the third link 34, respectively. The bracket 30 is also provided with a guide hole 35 for restricting the movement trajectory of the link mechanism 31.

Referring to FIGS. 7 to 11, the up and down sliding of the jig 50 is realized by the link mechanism 31 in the present embodiment, wherein the link mechanism 31 includes a first link 32, a second link 33, and a third link 34. Of course, the moving method of the jig 50 is not in the vertical direction, but may be inclined, but in order to save space and facilitate compact arrangement of the components in the test apparatus, it is preferable that the sliding direction of the jig 50 is a vertical direction. For guiding purposes, a guide hole 35 is provided on the bracket 30, and the guide hole 35 can restrict the movement trajectory of the third link 34. The link mechanism 31 and the guide hole 35 may be formed in the form of a crank slider to drive the clamp 50 to move. Among them, the guiding hole 35 and the link mechanism 31 have stable mechanical properties and high reliability, and the structure is simple and convenient for production and assembly.

In one or all embodiments of the present invention, the test station 10 is provided with an access port (not shown) for accessing the product, and the clamp 50 is provided with a contact end corresponding to the access port (not shown), and the contact end is provided. Shrink rod (not shown).

The access port is in contact with the contact end to connect the product to the test bench 10, so that the test bench 10 can test the performance parameters of the product. By setting the contact end and the inlet port, the conductive terminal or other conductive structure can be protected from being exposed, and the test result can be prevented from being affected by other factors such as abrasion or dust. At the same time, the safety of the operator can also be guaranteed.

Since it takes time to slide the jig 50 up and down, there may be a time difference between the time when the push lever 61 touches the switch 40 and the time when the product communicates with the test stand 10, which will affect the effect of the test device to reduce EOS damage. In order to prevent the occurrence of the above situation, in this embodiment, the connection is The contact end is provided with a contraction rod, and the product and the test bench 10 are always connected by the contraction function of the contraction rod before the clamp 50 is moved upward until the switch 40 is touched and powered off.

Of course, in other embodiments, the retracting rod may not be provided. The worker holds the handle 36 in one hand while the other hand pushes the pushing rod 61, and then pushes the handle 36 upward after the pushing rod 61 touches the switch 40. .

Referring to Figure 12, Figure 12 is a block diagram of an embodiment of a test system of the present invention.

The embodiment of the present invention further provides a test system including a test device 1 and a processor 2 connected to the test device, the processor 2 for processing the test result of the test device 1, wherein the number of the test device Can be one or more. The test device may include all the technical solutions in the foregoing embodiments, and the detailed structure may refer to the foregoing embodiments, and details are not described herein again.

The above are only the preferred embodiments of the present invention, and are not intended to limit the scope of the invention, and the equivalent structure or equivalent process transformations made by the description of the present invention and the drawings are directly or indirectly applied to other related technical fields. The same is included in the scope of patent protection of the present invention.

Industrial applicability

The testing device of the embodiment of the present invention controls the opening and closing of the test bench by providing a block on the jig so that the jig interferes with the switch during the moving process. Therefore, before the product starts testing, the test bench is in a power-off state; when the product is tested, the test bench is powered; after the product is tested, the test bench is powered off. This can effectively avoid EOS damage caused by hot plugging of the product during testing, thereby saving costs.

Claims

A test apparatus includes a test stand for testing a product, the test apparatus further including a base and a bracket connected to the test stand, a switch for controlling the power on and off of the test stand, and a clamp a clamp of the product; wherein the clamp is provided with a block for actuating the switch, the switch is mounted to the base, the clamp is movably coupled to the bracket, and the clamp is movable relative to the test stand .
The testing device according to claim 1, wherein a pressing portion for actuating the switch is connected to the base, the pressing portion is provided with a pushing rod, and the clamping block can push the pushing rod to touch the switch.
The testing device according to claim 2, wherein said push rod is provided with a hook that cooperates with said block; said hook moves said push rod when said block presses said hook Touching the switch; the test stand locks the clamp when the card fits the hook.
The testing device according to claim 2 or 3, wherein the pressing portion further comprises an elastic member for resetting the push rod, the elastic member being connected to the base at one end and the push rod at the other end connection.
The test apparatus according to claim 1, wherein said bracket is provided with a slide rail, and a slide bar that is sleeved to said slide rail, said slide lever that drives said clamp to slide on said slide rail.
The test apparatus according to claim 1, wherein said bracket is provided with a link mechanism for driving said jig to move relative to said test stand, said link mechanism comprising a first link and a second link sequentially connected a rod and a third link, wherein the second link is rotatably coupled to the first link and the third link, respectively.
The test apparatus according to claim 6, wherein said bracket is further provided with a guide hole for restricting an activity track of said link mechanism.
The testing device according to claim 5 or 6, wherein the bracket is further provided with a handle.
The testing device of claim 1 wherein said test station is provided for access An access port of the product, the clamp is provided with a contact end corresponding to the inlet, and the contact end is provided with a shrink rod.
A test system comprising a test device and a processor coupled to the test device, the test device being the test device of any one of claims 1 to 9.