WO2016067357A1

WO2016067357A1 - Measurement method and measurement device

Info

Publication number: WO2016067357A1
Application number: PCT/JP2014/078574
Authority: WO
Inventors: 太田　佳孝
Original assignee: 株式会社ニレコ
Priority date: 2014-10-28
Filing date: 2014-10-28
Publication date: 2016-05-06

Abstract

[Problem] To accurately measure the shapes of two surfaces of an object of measurement and the angle of a corner part forming the boundary of those two surfaces. [Solution] An elongated cast slab 10 having a rectangular cross-sectional shape that has, in order in the circumferential direction, an upper surface 11, right side surface 12, lower surface 13, and left side surface 14 is irradiated with slit light P1 oriented toward the upper surface 11 and right side surface 12 by a light source 21 from a direction orthogonal to a conveyance direction in the longitudinal direction of the cast slab 10 and when a photography device 22 having an optical axis inclined in the conveyance direction or the direction opposite therefrom by a prescribed pinching angle in relation to a plane of the slit light P1 of the light source 21 acquires a photographed image including reflection light of an optical section line for the upper surface 11 and right side surface 12 created through the irradiation of the slit light P1 by the light source 21, the light source 21 is set so that the central optical axis P0 of the slit light P1 is oriented toward the corner part 15 forming the boundary of the upper surface 11 and right side surface 12 of the cast slab 10 and the maximum allowable angle of the tilting of the orientation is 45° ± 25° in relation to an imaginary plane M parallel to the upper surface 11.

Description

Measuring method and measuring device

The present invention provides a measurement method for obtaining a captured image including reflected light of a light cutting line when measuring the shape of a measured object such as a long slab or rolled material having a quadrangular cross section having four surfaces. And a measuring device.

If distortion occurs in the shape of the slab taken out from the blast furnace or the rolled material fed out from the rolling mill, when the slab or rolled material is cooled and solidified, defects such as cracks are generated inside, resulting in quality deterioration. Invite. If the slab is cracked, there is a problem of cracking during rolling. Further, depending on the degree of distortion of the slab, the slab is caught at the entrance of the rolling mill, which causes a problem that the rolling mill cannot pass.

Also, when rolling, the corner of the tip of the rolled material fed out from the rolling mill has an extruded shape as shown in FIG. 20 (the white portion facing downward indicates the tip of the rolled material). Since such a tip portion becomes a defective portion that cannot be used as a product, the defective portion is cut out. At this time, it is important to calculate how much weight the material after the defective part is cut out, but there was no effective method for measuring this during conveyance.

Conventionally, in most cases, the operator has entered and measured the shape distortion of the slab or rolled material by entering the conveyance path of the slab or rolled material, but otherwise, the following method is adopted. It was.

(1) Utilization of contact-type sensor As shown in FIG. 21, a plurality of contact-type sensors 50 are arranged around the conveyance path of the slab 10 conveyed in the Y direction, and the slab 10 passes therethrough. When the slab 10 is in contact with any one or more contact-type sensors 50, the shape distortion of the slab 10 is detected by sequentially detecting each unit transport distance of the slab 10. To do.

(2) Use of non-contact distance meter This is because, as shown in FIG. 22, a plurality of non-contact distance meters 60 are arranged around the conveyance path of the slab 10 conveyed in the Y direction. The shape distortion of the slab 10 is detected by sequentially measuring the distance data between the slab 10 obtained by the measurement at 60 and the non-contact distance meter 60 for each unit transport distance of the slab 10. Is.

(3) Use of line sensor (transmission type)
This is because, as shown in FIG. 23 (a), a long lower light source 71 is arranged in the horizontal direction below the conveyance path of the slab 10 conveyed in the Y direction, and is arranged in the upper part of the slab 10. An image obstructed by the slab 10 is taken by the line sensor camera 72 and the shape of the slab 10 is measured. Reference numeral 73 denotes an attachment column, and 74 denotes an attachment beam. The image 75 obtained by the line sensor camera 72 is an image in which a portion corresponding to the lateral width of the slab 10 (the width in the direction orthogonal to the conveying direction) is a shadow 75a as shown in FIG. The presence or absence of shape distortion of the slab 10 can be determined from the horizontal length A in the figure of the shadow 75a and the data of both end positions A1 and A2.

(4) Use of line sensor (reflection type)
As shown in FIG. 24 (a), the self-light emission generated by the slab 10 conveyed in the Y direction is photographed by a line sensor camera 81 arranged on the upper part of the slab 10, and The shape is measured. Reference numeral 83 denotes an attachment column, and 84 denotes an attachment beam. As shown in FIG. 24B, the image 85 obtained by the line sensor camera 81 is an image in which a portion corresponding to the lateral width of the slab 10 (the width in the direction orthogonal to the conveying direction) is a self-luminous portion 85a. Therefore, the presence or absence of the shape distortion of the slab 10 can be determined from the data of the length B of the portion 85a in the drawing and the data of both end positions B1 and B2. Even if the line sensor camera 81 is integrated with the light source 82 and the reflected light when the light source 82 irradiates the slab 10 is imaged by the line sensor camera 81, the shape distortion of the slab 10 is similarly determined. be able to.

(5) Utilization of scan type distance meter This is because a scan type distance meter 90 is arranged toward the slab 10 around the conveyance path of the slab 10 conveyed in the Y direction as shown in FIG. The slab 10 is scanned from the direction orthogonal to the conveying direction of the slab 10, and distance data of each scan point from the scan type distance meter 90 to each part of the surface of the slab 10 is obtained as a unit of the slab 10. By acquiring sequentially for every conveyance distance, the shape distortion of the said slab 10 is estimated.

(6) Utilization of light cutting method This is because, as shown in FIG. 26, the light source 21 arranged at an angle with respect to the slab 10 vertically above one surface of the slab 10 conveyed in the Y direction. Then, the slit light P <b> 1 is irradiated in the width direction of the slab 10. The slit light P1 can be generated, for example, by passing a point laser beam through a cylindrical lens. At this time, by arranging the surface of the slit light P1 to be inclined with respect to the conveying direction Y of the slab 10, the reflected light of the slit light P1 becomes an image whose position is changed in accordance with the unevenness of the surface of the slab 10. This image is the optical cutting line T0, and the optical cutting line T0 is imaged by the imaging device 22 arranged so that the sandwiching angle η between the surface of the slit light P1 is 25 ° to 160 °. Then, the shape of the slab 10 on the optical cutting line T0 is measured from the positional relationship between the light source 21 and the imaging device 22, the shape of the optical cutting line T0 on the captured image W, and the like. By performing this measurement operation for each unit transport distance of the slab 10 along the transport direction indicated by Y of the slab 10, the three-dimensional shape of the surface of the slab 10 can be measured (Patent Literature). 1).

In addition, although the conveyed slab 10 cut | disconnects for every predetermined weight and is single-piece | united, the said weight was calculated by multiplying theoretical cross-sectional area by length and specific gravity. Then, the calculated value is multiplied by a safety factor to obtain a weight larger than the predetermined weight, and is cut into a long piece to be a single product.

International Publication No. 2014/057580

However, since “(1) Use of contact type sensor” described in FIG. 21 is a contact type, not only distortion of the slab 10 but also warpage of the slab 10 and vibration during conveyance are detected. there is a possibility. Moreover, depending on the form of the shape distortion of the slab 10, the slab 10 may not be in contact with the contact sensor 50, and the shape distortion may not be measured. Furthermore, accurate distortion information such as what shape and how many millimeters the slab 10 is distorted cannot be extracted.

“(2) Use of non-contact type sensor” described in FIG. 22 connects the distance information of one point to the slab 10 measured by each non-contact type sensor 60 to connect the shape of the slab 10 to each other. Since it is estimated, a measurement error occurs due to the influence of the curvature of the surface of the slab 10, as shown in FIG. 10a is an angle line of the surface obtained by measurement, and 10b is a correct angle line. Further, as shown in FIG. 27 (b), if the measurement point changes due to vibration during the conveyance of the slab 10, a measurement error also occurs. 10a1 is an uppermost position, 10a2 is an intermediate position, and 10a3 is an angle line obtained by measurement, respectively. Further, 10b1 is a correct angle line at the highest position, 10b2 is an intermediate position, and 10b3 is a lowest position. Further, as shown in FIG. 27 (c), if the measurement timings of the non-contact sensors 60 are not synchronized, the measurement point in the conveyance direction of the slab 10 is displaced, and the measurement error is similarly detected. Will occur. 10c is a measurement point by a non-contact type sensor among a plurality of

non-contact type sensors

60, and 10d is a measurement point by another non-contact type sensor. Furthermore, it is difficult for this technique to adjust the installation position of the non-contact sensor 60 so that the shape of the slab 10 can be measured accurately. Further, when the slab 10 is at a high temperature, air fluctuations occur, so that the distance measurement to the slab 10 may be inaccurate, and similarly a measurement error occurs.

“(3) Use of line sensor (transmission type)” described in (a) of FIG. 23 and “(4) Use of line sensor (reflection type)” described in (a) of FIG. Therefore, the presence / absence of shape distortion can be measured accurately and at high speed. However, since the lateral lengths A and B and the end position widths A1, B2, B1, and B2 are measured, the shape of the distortion can be determined. It cannot be accurately grasped. In addition, in “(3) Use of line sensor (transmission type)”, when scale or dust falls on the lower light source 71, the line sensor camera 72 also picks up the image, so that the slab 10 can be accurately determined. Disappear. In the case of using (4) use of line sensor (reflective type) and using the self-emission of the slab 10, when the temperature of the slab 10 decreases, the self-emission of the slab 10 becomes weaker, and measurement is performed. Increase the error.

In “(5) Use of scanning distance meter” described with reference to FIG. 25, the distance to the surface is measured while scanning the surface of the slab 10 conveyed at a predetermined speed at a constant period. As described above, if the scanning speed is not sufficiently high with respect to the conveyance speed of the slab 10, the scanning trajectory 10e greatly deviates from 90 ° with respect to the conveyance direction of the slab 10, and thus accurate geometric distortion is measured. I can't. Further, when the slab 10 is at a high temperature, air fluctuations occur, so that the distance measurement from the scan type distance meter 90 to the surface of the slab 10 becomes inaccurate, and a measurement error similarly occurs.

In “(6) Use of light cutting method” explained in FIG. 26, when the shape of two adjacent side faces of the slab 10 having a quadrangular section and the angle of the corners forming the boundary between the two faces are measured simultaneously. Although it is necessary to form the light cutting line over the two side surfaces, there is a possibility that an appropriate light cutting line cannot be obtained depending on the angle of the optical axis center of the slit light P1 with respect to the two side surfaces.

An object of the present invention is to provide a measuring method capable of accurately acquiring a light cutting line for obtaining a shape, an angle, etc. of an object to be measured such as a slab or a rolled material in a method using a light cutting method. And providing a measuring device.

In order to achieve the above object, a measurement method according to a first aspect of the present invention is a quadrangular cross-sectional shape having a first surface, a second surface, a third surface, and a fourth surface in the circumferential direction. In addition, for a long object to be measured, slit light is emitted from the first light source toward the first surface and the second surface from the direction perpendicular to the conveying direction in the longitudinal direction of the object to be measured. The first captured image including the reflected light of the first light cutting line on the first surface and the second surface generated by the irradiation of the slit light of the first light source is the first captured image. When acquiring with the first imaging device in which the optical axis is inclined in the transport direction or the opposite direction at a predetermined sandwich angle with respect to the slit light surface of the light source, the first light source is the first light source. The central optical axis of the slit light of the light source is a corner portion that forms the boundary between the first surface and the second surface of the object to be measured. Direction and, and the allowable maximum angle of inclination of the directivity is set so as to be 45 ° ± 25 ° with respect to parallel imaginary plane to said first surface, it is characterized.

The invention according to claim 2 is the measurement method according to claim 1, from the direction orthogonal to the transport direction in the longitudinal direction of the object to be measured, toward the third surface and the fourth surface. A second light source irradiates slit light from the second light source, and includes second light including a reflected light of a second light cutting line on the third surface and the fourth surface generated by irradiation of the slit light of the second light source. When the captured image is acquired by the second imaging device in which the optical axis is inclined in the transport direction or the opposite direction at a predetermined sandwich angle with respect to the slit light surface of the second light source, The center optical axis of the slit light of the second light source is directed to the corner portion forming the boundary between the third surface and the fourth surface of the object to be measured, and the inclination of the direction The maximum allowable angle is set to 45 ° ± 25 ° with respect to a virtual plane parallel to the third surface. The features.

The invention according to claim 3 is the measurement method according to claim 2, from the direction orthogonal to the conveying direction to the longitudinal direction of the object to be measured, toward the second surface and the third surface, The third light source irradiates the slit light, and includes the second surface generated by the slit light irradiation of the third light source and the reflected light of the third light cutting line on the third surface. When the captured image is acquired by the third imaging device in which the optical axis is inclined in the transport direction or the opposite direction at a predetermined sandwich angle with respect to the slit light surface of the third light source, The center light axis of the slit light of the third light source is directed to the corner portion that forms the boundary between the second surface and the third surface of the object to be measured, and the inclination of the direction Is set so that an allowable maximum angle of 45 ° ± 25 ° with respect to a virtual plane parallel to the second surface, A slit light is irradiated by a fourth light source toward the fourth surface and the first surface from a direction perpendicular to the conveyance direction in the longitudinal direction of the measurement object, and the slit light of the fourth light source A fourth captured image including the reflected light of the fourth light cutting line on the fourth surface and the first surface generated by irradiation is sandwiched with a predetermined surface of the slit light surface of the fourth light source. When acquiring with the fourth imaging device in which the optical axis is inclined in the transport direction or the opposite direction at an angle, the fourth light source is connected to the center optical axis of the slit light of the fourth light source. The angle of the object forming the boundary between the fourth surface and the first surface is pointed, and the allowable maximum angle of inclination of the directivity is 45 ° with respect to a virtual surface parallel to the fourth surface. It is set to be ± 25 °.

According to a fourth aspect of the present invention, in the measurement method according to the third aspect, the slit light of each of the first light source and the second light source is on a surface orthogonal to the transport direction of the object to be measured. Each of the slit light beams of the third light source and the fourth light source overlaps a plane orthogonal to the transport direction of the object to be measured, and the first light source and the second light source respectively The plane orthogonal to the conveyance direction of the measurement object of the slit light and the plane orthogonal to the conveyance direction of the measurement object of the slit light of each of the third light source and the fourth light source are shifted. As described above, the first to fourth light sources are arranged.

According to a fifth aspect of the present invention, in the measurement method according to the third aspect, each slit light of the first light source to the fourth light source is on a surface orthogonal to the transport direction of the object to be measured. The first to fourth light sources are arranged so as to overlap each other.

According to a sixth aspect of the present invention, in the measurement method according to any one of the second to fifth aspects, a cross-sectional area of the object to be measured is obtained based on the first to fourth optical cutting lines, and the cross-sectional area is obtained. Is integrated by a predetermined length in the longitudinal direction of the object to be measured to obtain a volume per predetermined length of the object to be measured, and based on the volume and the specific gravity of the object to be measured, the predetermined of the object to be measured The weight per length is obtained.

The invention according to claim 7 is the measuring method according to any one of claims 1 to 6, wherein the slit light is replaced with scanning light for scanning spot light, and the central optical axis is scanned with the scanning light. The optical axis passing through the center between both ends of the range is replaced.

The invention according to claim 8 is the measuring method according to any one of claims 1 to 7, wherein the object to be measured is a slab or a rolled material.

A measuring device according to a ninth aspect of the present invention is a long object to be measured having a quadrangular cross section having a first surface, a second surface, a third surface, and a fourth surface in this order in the circumferential direction. On the other hand, a first light source that irradiates slit light toward the first surface and the second surface from a direction orthogonal to the conveyance direction in the longitudinal direction of the object to be measured, and the first light source The optical axis is inclined in the transport direction or the opposite direction at a predetermined sandwich angle with respect to the surface of the slit light of the first light source and the second surface generated by the slit light irradiation of the first light source. A first imaging device that acquires a first captured image including reflected light of a first light cutting line on a surface, wherein the first light source is a central optical axis of slit light of the first light source, Directing the corner portion forming the boundary between the first surface and the second surface of the object to be measured, and allowing the inclination of the direction Large angle was set to be 45 ° ± 25 ° with respect to parallel imaginary plane to said first surface, characterized in that.

The invention according to claim 10 is the measuring apparatus according to claim 9, wherein the slit is directed from the direction orthogonal to the conveying direction to the longitudinal direction of the object to be measured toward the third surface and the fourth surface. The optical axis is inclined in the transport direction or the opposite direction at a predetermined sandwich angle with respect to the surface of the second light source for irradiating light and the slit light of the second light source, and the slit light of the second light source The second light source further includes a second imaging device that acquires a second captured image including the reflected light of the second light cutting line on the third surface and the fourth surface generated by irradiation of the second light source. The central optical axis of the slit light of the second light source is directed to the corner portion forming the boundary between the third surface and the fourth surface of the object to be measured, and the inclination of the directivity is allowed. A maximum angle is set to be 45 ° ± 25 ° with respect to a virtual plane parallel to the third surface; And wherein the door.

According to an eleventh aspect of the present invention, there is provided the measuring apparatus according to the tenth aspect, wherein the slit is directed from the direction orthogonal to the longitudinal conveying direction of the object to be measured toward the second surface and the third surface. A third light source for irradiating light and an optical axis inclined in the transport direction or the opposite direction at a predetermined sandwich angle with respect to the surface of the slit light of the third light source, and the slit light of the third light source A third imaging device that obtains a third captured image that includes the reflected light of the third optical cutting line on the second surface and the third surface caused by the irradiation, and the longitudinal direction of the object to be measured A fourth light source that irradiates slit light toward the fourth surface and the first surface from a direction orthogonal to the conveying direction to the first surface, and a predetermined surface with respect to the slit light surface of the fourth light source. An optical axis is inclined in the conveying direction or the opposite direction at a sandwiching angle, and the fourth light source A fourth imaging device that obtains a fourth captured image including reflected light of the fourth optical section line on the fourth surface and the first surface generated by irradiation of slit light; The center light axis of the slit light of the third light source is directed to the corner portion that forms the boundary between the second surface and the third surface of the object to be measured, and the inclination of the direction Is set to be 45 ° ± 25 ° with respect to a virtual plane parallel to the second surface, and the fourth light source has a center optical axis of slit light of the fourth light source, The virtual object is directed to a corner portion that forms a boundary between the fourth surface and the first surface of the object to be measured, and an allowable maximum inclination angle of the directivity is parallel to the fourth surface. It is set to be 45 ° ± 25 °.

According to a twelfth aspect of the present invention, in the measurement apparatus according to the eleventh aspect, the slit light of each of the first light source and the second light source is on a surface orthogonal to the conveyance direction of the measurement object. Each of the slit light beams of the third light source and the fourth light source overlaps a plane orthogonal to the transport direction of the object to be measured, and the first light source and the second light source respectively The plane orthogonal to the conveyance direction of the measurement object of the slit light and the plane orthogonal to the conveyance direction of the measurement object of the slit light of each of the third light source and the fourth light source are shifted. As described above, the first to fourth light sources are arranged.

According to a thirteenth aspect of the present invention, in the measurement apparatus according to the eleventh aspect, each slit light of the first light source to the fourth light source is on a surface orthogonal to the transport direction of the object to be measured. The first to fourth light sources are arranged so as to overlap.

According to a fourteenth aspect of the present invention, in the measurement device according to any one of the ninth to thirteenth aspects, the slit light is replaced with scanning light that scans spot light, and the central optical axis is scanned by the scanning light. The optical axis passing through the center between both ends of the range is replaced.

The invention according to claim 15 is the measuring apparatus according to any one of claims 9 to 14, wherein the object to be measured is a slab or a rolled material.

According to the present invention, the first light source is directed to the corner portion where the center optical axis of the slit light of the first light source forms the boundary between the first surface and the second surface of the object to be measured, and Since the allowable maximum angle of the inclination of the directivity is set to 45 ° ± 25 ° with respect to a virtual surface parallel to the first surface, the first surface and the second surface adjacent to the object to be measured are set. The light cutting line can be obtained accurately. Therefore, it is possible to accurately measure the shape of the first surface and the second surface of the object to be measured and the angle of the corner that forms the boundary between the first surface and the second surface.

It is explanatory drawing of the measuring method of the 1st Example of this invention. It is a functional block diagram of the structure of the measuring device for enforcing the measuring method of a 1st Example. It is a flowchart for enforcing the measuring method of the 1st example. It is explanatory drawing of a part of optical section line obtained with the measuring method of the 1st example. It is explanatory drawing which shows the image of the optical cutting line obtained with the measuring method of the 1st Example. It is explanatory drawing which obtains length and an angle from the optical cutting line obtained with the measuring method of the 1st example. It is a characteristic view of the measurement angle of the corner | angular part 15 when angle (theta) of the center optical axis of the slit light in the measurement method of a 1st Example is set to 45 degrees. It is explanatory drawing which shows the picked-up image and light quantity distribution of the optical cutting line when angle (theta) of the center optical axis of the slit light in the measuring method of a 1st Example is set to 45 degrees. It is a characteristic view of the measurement angle of the corner | angular part 15 when the angle (theta) of the center optical axis of the slit light in the measurement method of a 1st Example is set to 45 degrees +25 degrees. It is explanatory drawing which shows the picked-up image and light quantity distribution of the optical cutting line when angle (theta) of the center optical axis of the slit light in the measuring method of a 1st Example is set to 45 degrees +25 degrees. It is a characteristic view of the measurement angle of the corner | angular part 15 when the angle (theta) of the center optical axis of the slit light in the measurement method of a 1st Example is set to 45 degrees +30 degrees. It is explanatory drawing which shows the picked-up image and light quantity distribution of the optical cutting line when angle (theta) of the center optical axis of the slit light in the measuring method of a 1st Example is set to 45 degrees +25 degrees. It is a characteristic view of the measurement angle of the corner | angular part 15 when the angle (theta) of the center optical axis of the slit light in the measurement method of a 1st Example is set to 45 degrees +35 degrees. It is explanatory drawing which shows the picked-up image and light quantity distribution of a light cutting line when angle (theta) of the center optical axis of the slit light in the measuring method of a 1st Example is set to 45 degrees +35 degrees. It is explanatory drawing of the measuring method of a 2nd Example. It is a functional block diagram of the structure of the measuring device for enforcing the measuring method of a 2nd Example. It is a flowchart for enforcing the measuring method of the 2nd example. It is explanatory drawing of the measuring method of a 3rd Example. It is a functional block diagram of a structure of the measuring device for enforcing the measuring method of a 3rd Example. It is explanatory drawing which shows the image of the front-end | tip part of the material drawn | fed out from a rolling mill. It is explanatory drawing of the shape measurement of the slab using a contact-type sensor. It is explanatory drawing of the shape measurement of the slab using a non-contact distance meter. It is explanatory drawing of the shape measurement of the slab using a line sensor (transmission type). It is explanatory drawing of the shape measurement of the slab using a line sensor (reflection type). It is explanatory drawing of the shape measurement of the slab using a scanning distance meter. It is explanatory drawing of the shape measurement of the slab using an optical cutting line. It is explanatory drawing of the subject in the case of measuring the shape of a slab using a non-contact distance meter. It is explanatory drawing of the subject in the case of measuring the shape of a slab using a scanning distance meter.

<First embodiment>
FIG. 1 shows the configuration of the measurement method of the first embodiment. In this embodiment, the object to be measured is a slab 10. As shown in FIG. 1, the slab 10 has a quadrangular cross-sectional shape and is conveyed in a direction perpendicular to the paper surface. When the slab 10 has a normal shape (square or rectangular), the upper surface 11 and the lower surface 13 are flat and parallel to each other, and the right side surface 12 and the left side surface 14 are also parallel to each other. Furthermore, the angle of the corner 15 that forms the boundary between the upper surface 11 and the right side 12 of the slab 10, the angle of the corner 16 that forms the boundary between the right side 12 and the lower surface 13, and the lower surface 13 and the left side 14 The angle of the corner 17 that forms the boundary and the angle of the corner 18 that forms the boundary between the left side surface 14 and the upper surface 11 are each 90 °.

The measuring device for measuring the shape includes an optical sensor 20 and a measurement control device 30 as shown in FIG. The optical sensor 20 includes a light source 21, an imaging device 22, and a filter 23.

The light source 21 includes a laser light source and a cylindrical lens for converting a point laser beam having a wavelength λ generated by the laser light source into slit light P1. This wavelength λ is a wavelength that can be distinguished from the self-emission and ambient light of the slab 10. Then, as shown in FIG. 1, the light source 21 has a central optical axis P0 of the slit light P1 directed to the corner 15 forming the boundary between the upper surface 11 and the right side surface 12 of the slab 10 and The inclination angle θ of the inclination is set to be 45 ° with respect to the virtual surface M parallel to the upper surface 11.

In addition, the surface of the slit light P1 of the light source 21 is installed so as to be in a direction (horizontal direction on the paper surface in FIG. 1) orthogonal to the conveyance direction of the slab 10 (a direction perpendicular to the paper surface in FIG. 1). . Thereby, the slit light P1 projected on the upper surface 11 of the slab 10 faces the direction orthogonal to the conveyance direction of the slab 10, and the slit light P1 projected on the right side 12 is also orthogonal to the conveyance direction of the slab 10. It will turn in the direction.

The imaging device 22 is composed of, for example, a two-dimensional CCD camera, and its optical axis overlaps the optical axis center P0 of the light source 21 in the direction along the conveying direction of the cast piece 10. Further, the optical axis of the slab 10 is such that the sandwiching angle η between the upper surface 11 and the right side surface 12 of the slab 10 is 8 ° to 20 ° with respect to the surface of the slit light P1 of the light source 21. Or, it is installed inclining in the opposite direction (see FIG. 26 for the meaning of the sandwiching angle η).

The imaging range of the imaging device 22 is set so that the range including the total reflected light of the slit light P1 can be imaged. The passing wavelength of the filter 23 is set to λ so that only the reflected light of the slit light P1 having the wavelength λ out of the total light incident from the slab 100 is sent to the imaging device 22.

The measurement control device 30 includes an imaging control unit 31 that controls operations of the light source 21 and the imaging device 22, a memory 32 that stores an image captured by the imaging device 31, and an image stored in the memory 32 to analyze the slab 10. The image recognition unit 33 for creating the shape profile of the upper surface 11 and the right side surface 12 of the image display unit 33 and the display 34 for displaying the image stored in the memory 32 and the shape profile created by the image recognition unit 31 are provided.

The memory 32 is composed of, for example, a frame memory, and stores an image that has been transmitted from the imaging device 22 but is composed of, for example, 1280 × 1024 pixels.

The image recognition unit 33 extracts a light cutting line from the reflected light in the image stored in the memory 32, and calculates data of the coordinates (X coordinate and Y coordinate) of the light cutting line. The X coordinate is a coordinate in the width direction of the slab 10 (the direction from the corner 18 to the corner 15 and the direction from the corner 15 to the corner 16), and the Y coordinate is a coordinate in the conveying direction of the slab 10.

After calculating the optical cutting line coordinate data, the image recognition unit 33 calculates the shape profiles of the upper surface 11 and the right side surface 12 of the slab 10 based on the image coordinate data. The calculated image profile is normalized and stored in the memory 32 as two-dimensional (X coordinate and Z coordinate) normalized coordinate data or displayed on the display 34. The Z coordinate is a coordinate in the thickness direction of the slab 10 from the upper surface 11 of the slab 10 and in the thickness direction of the slab 10 from the right side surface 12.

FIG. 3 is a flowchart showing the operation of the measuring apparatus. Hereinafter, the operation of the measuring apparatus will be described with reference to FIG.

First, imaging processing (step S11) is performed. Specifically, the light source 21 irradiates the slit light P1 on the upper surface 11 and the right side surface 12 of the slab 10, and the imaging device 22 images reflected light having a wavelength λ in the region where the slit light P1 is irradiated, and images the image. The obtained image is transmitted to the measurement control device 30. The image transmitted to the measurement control device 30 is stored in the memory 32.

Next, the image recognition unit 33 performs an operation of removing disturbance factor noise from the image showing the light cutting line (step S12). As shown in FIG. 4, when the fluctuation portion TA or the chipped portion TB is generated in the pattern TX showing the light cutting line due to the heat generation of the slab 10, water vapor, smoke or the like, it can be taken out by one imaging. Based on a plurality of coordinate data, an operation such as approximate complement is performed on the fluctuation portion TA or the missing portion TB, thereby performing image correction that makes the pattern X segment a continuous line segment.

Also, since noise based on water droplets and steam is often distributed in the form of dots or lumps, the noise component is removed by smoothing the image data. As the smoothing process, a moving average filter, a Gaussian filter, a median filter, or the like can be used. After the smoothing process, small pattern noise is removed by binarizing the processed image as necessary and then performing a contraction / expansion process.

Shrinkage processing is processing that replaces all surrounding pixels with black if there is even one pixel around the pixel of interest, and expansion processing is whitening if there is even one pixel around the pixel of interest and white pixels. It is a process to replace with. As a result, the pattern TX can be further clarified.

Also, thinning processing is performed as necessary. This thinning process is a process for ensuring the continuity of the pattern TX. By this thinning process, only one pixel of the pattern TX that constitutes the light cutting line is left, and the other pixels are deleted. Is extracted.

Next, the image recognition unit 33 extracts a light cutting line (step S13). When the pattern TX indicating the light cutting line as shown in FIG. 5 is obtained, the image recognition unit 33 extracts the light cutting line from the coordinate data of each position of the continuous line pattern TX.

Next, the image recognition unit 33 calculates the shapes and the like of the upper surface 11 and the right side surface 12 of the cast slab 10 as the object from the extracted shape of the optical cutting line (step S14). In this calculation, as shown in FIG. 6, the lengths L1 and L2 of straight lines connecting the vertex coordinates Q1 and the end point coordinates Q2 and Q3 in the coordinate data of the light cutting lines T1 and T2 extracted from the pattern TX are obtained.

L1 and L2 are an inclination angle θ of the slit light P1 of the light source 21 with respect to the virtual surface M of the central optical axis P0, a sandwich angle η between the central optical axis P0 and the optical axis of the imaging device 22, and a slab from the imaging device 22 20 from the distance to the corner 15. L <b> 1 indicates the width value of the upper surface 11 of the slab 10, and L <b> 2 indicates the width value of the right side surface 12 of the slab 10.

Further, an inclined line R1 approximating the optical cutting line T1 passing through the coordinates Q1 and Q2 by a linear expression is obtained, and an inclined line R2 approximating the optical cutting line T2 passing through the coordinates Q1 and Q3 by a linear expression is obtained. The sandwiching angle φ between the two lines R1, R2 is obtained. This angle φ is the angle of the corner 15 that forms the boundary between the upper surface 11 and the right side surface 12 of the slab 10. Furthermore, the diagonal length between the corner | angular part 16 and the corner | angular part 18 of the slab 10 is calculated | required by calculating | requiring the linear length L3 which connects the coordinate Q1 and Q3.

The above lengths L1, L2, L3 and angle φ are compared with a preset reference value of the slab 10. By performing these processes for each unit transport distance when the slab 10 is transported in the Y direction, the shape distortion of the upper surface 11 and the right side surface 12 of the slab 10 can be obtained.

In the present embodiment, the optical sensor 20 has an inclination angle θ of the central optical axis P0 of the slit light P1 with respect to a virtual plane M parallel to the upper surface 11 of the slab 10, as shown in FIG. It set so that it might become (degree), and the shape of the width direction of the upper surface 11 and the right side surface 12 of the slab 10 was acquired. FIG. 7 shows a characteristic diagram showing the calculation results for the angle φ of the corner 15 of the slab 10 obtained in this way.

Here, since the slab 10 is intended for the corner 15 having an angle φ of 90 °, the slab 10 is transported only for a time of 750 msec in the characteristic diagram shown in FIG. 7 (unit transport distance). The average value of the angles φ obtained every 10 mm) is 89.99 °. That is, the maximum error of the angle φ is 0.1 ° or less. The laser beam constituting the slit light P1 varies in luminance due to spec noise. As can be seen from the characteristic diagram of FIG. 7, when the inclination angle θ of the sensor 20 is 45 °, The measurement error of the angle φ is extremely small.

FIG. 8 is a captured image obtained at that time (left and right and up and down are reversed from those in FIG. 6). According to this, the light cutting lines T1 and T2 are clearly imaged, and the vertex coordinate Q1 of the light quantity distribution PQ has the highest value. It can also be seen that the total light quantity of the light cutting lines T1 and T2 exceeds the measurement limit light quantity PL (when it is below this measurement limit light quantity PL, it is greatly affected by noise and difficult to discriminate). Further, the images of the end point coordinates Q2 and Q3 of the light cutting lines T1 and T2 can be stably captured. The end point position PE of the end point Q3 is also clear.

In FIG. 9, the optical sensor 20 is set so that the inclination angle θ of the central optical axis P0 of the slit light P1 is 45 ° + 25 ° with respect to a virtual surface M parallel to the upper surface 11 of the slab 10. FIG. 6 is a characteristic diagram showing the calculation result of the angle φ of the corner 15 detected at that time. Also here, the average value of the angle φ obtained by conveying the slab 10 for a time of 750 msec every 10 msec (unit conveyance distance 10 mm) is 90.05 °, and the maximum error of the angle φ is 0.1 °. It is as follows.

FIG. 10 is a captured image obtained at that time. According to this, although the light cutting line T2 of the right side surface 12 of the slab 10 is thin, the light quantity distribution of the vertex coordinate Q1 is clear. It can also be seen that the total light quantity in the light quantity distribution PQ of the light cutting lines T1, T2 exceeds the measurement limit light quantity PL. Further, the images of the end point coordinates Q2 and Q3 of the light cutting lines T1 and T2 can be stably captured. The end point position PE of the end point Q3 is also clear.

In FIG. 11, the optical sensor 20 is set so that the inclination angle θ of the central optical axis P0 of the slit light P1 is 45 ° + 30 ° with respect to a virtual surface M parallel to the upper surface 11 of the slab 10. FIG. 6 is a characteristic diagram showing the calculation result of the angle φ of the corner 15 detected at that time. Here, the slab 10 is intended for the corner 15 having an angle of 90 °, but the slab 10 is transported for a time of 750 msec and the average angle φ obtained every 10 msec (unit transport distance 10 mm) is obtained. The value is 90.00 °, and the maximum error of the angle φ is about 0.5 °.

FIG. 12 is a captured image obtained at that time. Here, the reflected light of the upper surface 11 of the slab 10 is obtained sufficiently clearly and the light cutting line T1 is clear, but the reflected light of the right side surface 12 is barely imaged, and the coordinates Q1 and Q3 The light cutting line T2 between them is considerably thin. As described with reference to FIG. 6, since the angle φ of the corner 15 is obtained by the approximate lines R1 and R2 connecting the coordinates Q1 and Q2 and the coordinates Q1 and Q3, measurement is possible, but the slab 10 is conveyed. When the approximate line R2 cannot be obtained correctly with respect to the light cutting line T2 due to fluctuations in the amount of reflected light that occurs in the middle, an error of approximately 0.5 ° has occurred.

In FIG. 13, the optical sensor 20 is set so that the inclination angle θ of the central optical axis P0 of the slit light P1 is 45 ° + 35 ° with respect to a virtual surface M parallel to the upper surface 11 of the slab 10. FIG. 6 is a characteristic diagram showing the calculation result of the angle φ of the corner 15 detected at that time. Here, the slab 10 is intended for the corner 15 having an angle of 90 °, but the slab 10 is transported for a time of 750 msec and the angle obtained as a result obtained every 10 msec (unit transport distance 10 mm). The average value of φ is 90.36 °, and the maximum error of the angle φ is about 0.5 °.

FIG. 14 is a captured image obtained at that time. Here, the reflected light on the upper surface 11 of the slab 10 is sufficiently clearly obtained and the light cutting line T1 is clear, but the amount of reflected light on the right side surface 12 is less than the measurement limit PL and is very small. Therefore, it is difficult to measure the light amount distribution in that portion. As described with reference to FIG. 6, since the angle φ of the corner portion 15 is obtained by the approximate lines R1 and R2 connecting the coordinates Q1 and Q2 and the coordinates Q1 and Q3, the approximate line R2 is not stable and is large at a plurality of points in time. An error has occurred.

As described above, the optical sensor 20 has an inclination angle θ of 45 °, 45 ° + 25 ° with respect to a virtual plane M in which the inclination angle θ of the central optical axis P0 of the slit light P1 is parallel to the upper surface 11 of the slab 10. , 45 ° + 30 ° and 45 ° + 35 °. On the other hand, when the inclination angle θ is set to 45 ° -25 °, 45 ° -30 °, 45 ° -35 °, the amount of reflected light on the upper surface 11 decreases as the inclination angle θ decreases. Sufficient and similar tendency can be obtained.

From the above experiment, the optical sensor 20 is arranged so that the center optical axis P0 of the slit light P1 is at the corner 15 of the slab 10 and the allowable maximum value of the inclination angle θ with respect to the virtual plane M is 45 ° ± 25 °. It was found that the optical cutting lines T1 and T2 on the upper surface 11 and the right side surface 12 of the slab 10 can be obtained in a clear state. As described above, the present invention has been made to investigate that the allowable maximum value of the inclination angle θ is 45 ° ± 25 °. In this way, the width in the direction perpendicular to the conveying direction of the upper surface 11 and the right side surface 12 of the slab 10, that is, the lengths L1 and L2, the angle φ of the corner 15 and the diagonal length L3 are accurately measured. When the slab 10 is transported, the measurement is performed sequentially for each unit transport distance, so that when the top surface 11 and the right side surface 12 of the slab 10 have a shape distortion, the shape distortion is reduced. It can be seen that accurate measurement is possible.

<Second embodiment>
FIG. 15 shows the configuration of the measurement method of the second embodiment. In this embodiment, two

optical sensors

20A and 20B are used. The optical sensor 20A is arranged so that the inclination angle of the central optical axis P0 of the slit light P1 with respect to the virtual plane M1 parallel to the upper surface 11 of the slab 10 is θ1. The optical sensor 20B is arranged so that the inclination angle of the central optical axis P0 of the slit light P1 with respect to the virtual surface M2 parallel to the lower surface 13 is θ2. At this time, the inclination angles θ1 and θ2 are set such that the maximum allowable value is 45 ° ± 25 °. These

optical sensors

20A and 20B are arranged so that each slit light of a built-in light source overlaps a surface orthogonal to the conveying direction of the slab 10, and at the same measurement timing, the upper surface 11 and the right side of the slab 10 Irradiation and imaging of the slit light P <b> 1 are performed on the same line orthogonal to the conveying direction of the surface 12, the lower surface 13, and the left side surface 14.

By arranging the

optical sensors

20A and 20B in this way, the optical sensor 20A can acquire the optical cutting lines of the upper surface 11 and the right side surface 12 of the slab 10, and the optical sensor 20B can acquire the lower surface 13 and the left side surface 14 of the slab 10. Since the optical cutting line can be obtained, the optical cutting line over the entire circumference of the slab 10 can be obtained at one measurement timing.

FIG. 16 is a diagram showing the control of two

optical sensors

20A and 20B having the same configuration and the configuration of a measurement control device 30A for processing image data obtained there. The optical sensor 20A includes a light source 21A, an imaging device 22A, and a filter 23A, and the optical sensor 20B includes a light source 21B, an imaging device 22B, and a filter 23B.

The measurement control device 30A is obtained with the

light sources

21A and 21B of the

optical sensors

20A and 20B, the imaging unit 31A that controls the

imaging devices

22A and 22B, and the memory 32A that stores image data captured by the

imaging devices

22A and 22B. An image recognition unit 33A that performs the processing shown in FIG. 17 based on the image data, and a display 34A that displays the obtained image data and processing results are provided. The imaging unit 31A, the memory 32A, the image recognition unit 33A, and the display 34A are substantially the same as the imaging unit 310, the memory 320, the image recognition unit 330, and the display 340 described in FIG.

FIG. 17 is a flowchart showing the operation of the measurement method of the second embodiment. In this flowchart, steps S21 to S23 are the same as steps S11 to S13 in the flowchart described with reference to FIG. 3 except that the processes are individually performed based on the image data obtained by the individual

optical sensors

20A and 20B.

In the present embodiment, it is possible to obtain optical cutting lines in the width direction (direction perpendicular to the conveying direction) of the upper surface 11, the right side surface 12, the lower surface 13, and the left side surface 14 of the slab 10. In the shape calculation process of step S24 in the flowchart of FIG. 17, the shape and length in the width direction of the upper surface 11, the right side surface 12, the lower surface 13, and the left side surface 14 of the slab 10 by using those optical cutting lines, The angles φ1 and φ2 of the

corner portions

15 and 17 are calculated. Since the diagonal length between the

corners

15 and 17 can be doubled, one or the average value can be used.

Note that the angle φ3 of the corner 16 and the angle φ4 of the corner 18 cannot be directly obtained, but the added value of the measured angle φ1 of the corner 15 and the angle φ2 of the corner 17 is subtracted from 360 °. Thus, it can be obtained by halving.

Therefore, from the above, the cross-sectional shape and cross-sectional area of the slab 10 can be obtained.

In step S25, the number of pulses generated at each measurement timing of the slab 10 being conveyed (every 1 msec in the above example) is counted, and the number of pulses is multiplied by the unit conveyance distance per pulse. Then, it is confirmed that the slab 10 is conveyed by a predetermined length.

In step S26, the volume of the slab 10 is calculated by integrating the cross-sectional area by the predetermined length of the slab 100 obtained in step S25. For example, the unit volume is obtained by assuming that the cross-sectional areas are the same for the unit transport distance described above, and the unit volume obtained at each measurement timing is added for the number of pulses corresponding to the predetermined length. A long volume can be calculated. And the weight of the slab 10 for predetermined length is computable by multiplying the specific gravity of the slab 10 by the obtained volume.

As described above, according to the present embodiment, the length in the width direction of each surface 11 to 14 of the slab 10 immediately after casting, the diagonal length, the angles φ1 to φ4 of the corners 15 to 18, the degree of shape distortion, and the like. The length and weight of the slab 10 can be obtained as well as being able to be continuously measured along the transport direction of the slab 10 for each unit transport distance, and the cutting position when the slab 10 is made into a single product Can also be set.

<Third embodiment>
FIG. 18 shows the measuring method of the third embodiment. In this embodiment, four photosensors 20A to 20D are used. The

optical sensors

20A and 20B are the same as the arrangement in the second embodiment described with reference to FIG. The optical sensor 20C is arranged such that the angle of the central optical axis P0 of the slit light P1 with respect to the virtual surface M3 parallel to the right side surface 12 is θ3. The optical sensor 20D is arranged so that the angle of the central optical axis P0 of the slit light P1 with respect to the virtual surface M4 parallel to the left side surface 14 is θ4.

At this time, the inclination angles θ3 and θ4 are set such that the maximum allowable value is 45 ° ± 25 °. The

optical sensors

20C and 20D are configured so that the slit light P1 overlaps the surface orthogonal to the conveying direction of the slab 10 and does not overlap the surface of the slit light P1 by the

optical sensors

20A and 20B. The slab 10 is shifted in the transport direction of the slab 10 by two or three times the unit transport distance.

By arranging the optical sensors 20A to 20D in this way, the optical sensor 20A can acquire the optical cutting lines of the upper surface 11 and the right side surface 12 of the slab 10, and the lower surface 13 and the left side surface 14 of the slab 10 by the optical sensor 20B. Can be obtained, the optical sensor 20C can obtain the optical cutting lines on the right side surface 12 and the lower surface 13 of the slab 10, and the optical sensor 20D can obtain the optical cutting lines on the left side surface 14 and the upper surface 11 of the slab 10. it can.

FIG. 16 is a diagram showing the control of four photosensors 20A to 20D having the same configuration and the configuration of a measurement control device 30B that processes image data captured there. The optical sensor 20C includes a light source 21C, an imaging device 22C, and a filter 23C, and the optical sensor 20D includes a light source 21D, an imaging device 22D, and a filter 23D.

The measurement control device 30B is obtained with the light sources 21A to 21D of the optical sensors 20A to 20D, the imaging unit 31B that controls the imaging devices 22A to 22D, and the memory 32B that stores the image data captured by the imaging devices 22A to 22D. An image recognition unit 33B that performs processing based on image data and a display 34B that displays the obtained image data and processing results are provided. These imaging unit 31B, memory 32B, image recognition unit 33B, and display 34B are substantially the same as the imaging unit 310, memory 320, image recognition unit 330, and display 340 described in FIG.

The image recognition unit 33B performs the following processing. In the case where the slit light P1 of the

optical sensors

20C and 20D is deviated by, for example, a unit transport distance in the transport direction of the slab 10 with respect to the slit light P1 of the

optical sensors

20A and 20B, the slab 10 by the

optical sensors

20C and 20D. Irradiation and imaging, and irradiation and imaging of the slab 10 by the

optical sensors

20C and 20D are alternately performed for each unit conveyance distance, and the optical cutting line over the entire circumference of each surface 11 to 14 of the slab 10 is unit-conveyed. It acquires for every distance and calculates | requires the cross-sectional shape and cross-sectional area of the slab 10.

As described above, when the slit light P1 of the

optical sensors

20C and 20D is deviated from the slit light P1 of the

optical sensors

20A and 20B, for example, by a unit transport distance in the transport direction of the slab 10, the optical sensor Irradiation and imaging of the slab 10 with 20C and 20D and irradiation and imaging of the slab 10 with the

optical sensors

20C and 20D can be performed simultaneously for each unit transport distance. In this case, since the optical cutting lines per unit conveyance distance over the entire circumference of each surface 11 to 14 of the slab 10 can be obtained in duplicate, the amount of imaged light when the slab 10 is conveyed is averaged. It is possible to reduce the influence of fluctuations and increase the accuracy of the obtained light section line.

<Other examples>
In the second embodiment, the

optical sensors

20A and 20B are configured such that the slit light P1 of the

light sources

21A and 21B overlaps the same surface orthogonal to the conveyance direction of the slab 10, but It may be arranged so as not to overlap each other by being shifted from each other by 2 or 3 times the unit transport distance in the transport direction.

In this case, the optical cutting line obtained from the image captured by the imaging device 22A of the optical sensor 20A and the optical cutting line obtained from the image captured by the imaging device 22A of the optical sensor 20A are obtained at different measurement timings. Both optical cutting lines obtained at the same measurement timing are used.

Further, in the third embodiment, the optical sensors 20A to 20D can be arranged so that the respective slit lights P1 from the optical sensors 20A to 20D overlap with a surface orthogonal to the conveying direction of the cast piece 20. .

In this case, the slit light of one of the two adjacent optical sensors is irradiated with the slit light of the other optical sensor, and the imaging device of one of the optical sensors is the other. Since a reflected image of the slit light of the optical sensor is also taken, a measurement error occurs.

Therefore, in order to prevent this, the wavelengths of the

light sources

21C and 21D and the

filters

23C and 23D of the

optical sensors

20C and 20D may be different from the wavelengths of the

light sources

21A and 21B and the

filters

23A and 23B of the

optical sensors

20A and 20B. .

Further, although the slit light is used as the light source of the

optical sensors

20, 20A, 20B, the scanning light obtained by scanning the spot light can be used instead of the slit light. In this case, the optical axes passing through the centers of both ends of the scanning light are directed to the corners forming the boundary between the two surfaces of the object to be measured, and the allowable maximum inclination angle of the directivity is within the two surfaces. What is necessary is just to set so that it may become 45 degrees +/- 25 degrees with respect to the virtual surface parallel to one surface.

In the above description, the slab 10 has been described as an object to be measured. However, the same measurement and processing can be performed on a rolled material fed from a rolling mill and other conveyed items.

10: slab, 11: upper surface, 12: right side surface, 13: lower surface, 14: left side surface, 15-18: corner 20, 20, 20A-20D: optical sensor, 21, 21A-21D: light source, 22, 22A- 22D: imaging device, 23, 23A to 23D: filter 30, 30A, 30B: measurement control device, 31, 31A, 31B: imaging unit, 32, 32A, 32B: memory, 33, 33A, 33B: image recognition unit, 34 34A, 34B: Display 50: Contact type sensor 60: Non-contact distance meter 71: Lower light source, 72: Line sensor camera, 73: Mounting post, 74: Mounting beam 81: Light source, 82: Camera, 83: Mounting post, 84: Mounting beam 90: Scan type distance meter Q1: Vertex coordinates, Q2, Q3: End point coordinates P0: Center optical axis, P1: Slit light PQ: Light quantity distribution, PL: Measurement limit light , PE: end point position T1, T2: light cutting line R1, R2: line approximated to the light cutting line T1, T2 by a linear expression L1: length of the light cutting line T1, L2: length of the light cutting line T2, L3: Diagonal length θ, θ1 to θ4: Angle of the optical sensor directed to the corner of the slab φ, φ1 to φ4: Angle of the corner of the slab η: Cast of the slit light of the optical sensor and the optical axis of the imaging device Clip angle on one side

Claims

In the longitudinal direction of the object to be measured with respect to a long object to be measured having a quadrangular cross section having a first surface, a second surface, a third surface, and a fourth surface in order in the circumferential direction. The slit light is emitted from the first light source toward the first surface and the second surface from the direction orthogonal to the transport direction of the first light source, and the first light source is generated by the slit light irradiation of the first light source. The first picked-up image including the reflected light of the first light cutting line on the first surface and the second surface is moved in the transport direction or at a predetermined sandwich angle with respect to the slit light surface of the first light source. When acquiring with the first imaging device in which the optical axis is inclined in the opposite direction,
The central light axis of the slit light of the first light source is directed to the corner that forms the boundary between the first surface and the second surface of the object to be measured, and the first light source Setting the maximum allowable angle of directivity inclination to be 45 ° ± 25 ° with respect to a virtual plane parallel to the first surface;
A measuring method characterized by this.
The measurement method according to claim 1,
A slit light is emitted from a second light source toward the third surface and the fourth surface from a direction orthogonal to the transport direction in the longitudinal direction of the object to be measured, and the slit of the second light source A second captured image including reflected light of the second light cutting line on the third surface and the fourth surface generated by light irradiation is predetermined with respect to the surface of the slit light of the second light source. When acquiring with the second imaging device in which the optical axis is inclined in the transport direction or the opposite direction at the sandwich angle of
The center light axis of the slit light of the second light source is directed to the corner that forms the boundary between the third surface and the fourth surface of the object to be measured, and the second light source Setting the maximum allowable angle of directivity inclination to be 45 ° ± 25 ° with respect to a virtual plane parallel to the third surface;
A measuring method characterized by this.
The measurement method according to claim 2,
A slit light is emitted from a third light source toward the second surface and the third surface from a direction orthogonal to the transport direction in the longitudinal direction of the object to be measured, and the slit of the third light source A third captured image including reflected light of the third light cutting line on the second surface and the third surface generated by light irradiation is predetermined with respect to the slit light surface of the third light source. When acquiring with the third imaging device in which the optical axis is inclined in the transport direction or the opposite direction at the sandwich angle of
The center light axis of the slit light of the third light source is directed to the corner that forms the boundary between the second surface and the third surface of the device under test, and the third light source Set the maximum allowable angle of directivity inclination to be 45 ° ± 25 ° with respect to a virtual plane parallel to the second surface,
The slit light of the fourth light source is irradiated with slit light from a fourth light source toward the fourth surface and the first surface from a direction orthogonal to the transport direction in the longitudinal direction of the object to be measured. A fourth captured image including reflected light of the fourth light cutting line on the fourth surface and the first surface generated by light irradiation is predetermined with respect to the surface of the slit light of the fourth light source. When acquiring with the fourth imaging device in which the optical axis is inclined in the transport direction or the opposite direction at the sandwich angle of
The center light axis of the slit light of the fourth light source is directed to the corner that forms the boundary between the fourth surface and the first surface of the device under test, and the fourth light source Setting the maximum allowable angle of directivity inclination to be 45 ° ± 25 ° with respect to a virtual plane parallel to the fourth surface;
A measuring method characterized by this.
The measurement method according to claim 3,
The slit light of each of the first light source and the second light source overlaps a plane orthogonal to the conveyance direction of the object to be measured,
The slit light of each of the third light source and the fourth light source overlaps a plane orthogonal to the conveyance direction of the object to be measured,
The surface perpendicular to the transport direction of the object to be measured of the slit light of each of the first light source and the second light source, and the subject of the slit light of each of the third light source and the fourth light source. So that the surface perpendicular to the conveyance direction of the measurement object is shifted,
A measurement method comprising arranging the first to fourth light sources.
The measurement method according to claim 3,
The first to fourth light sources are arranged so that the respective slit lights of the first to fourth light sources overlap with a plane orthogonal to the conveyance direction of the object to be measured. Measurement method.
In the measuring method as described in any one of Claim 2 thru | or 5,
A cross-sectional area of the object to be measured is obtained based on the first to fourth light cutting lines, and the cross-sectional area is integrated by a predetermined length in the longitudinal direction of the object to be measured to obtain a value per predetermined length of the object to be measured. A measuring method characterized in that a volume is obtained, and a weight per predetermined length of the object to be measured is obtained based on the volume and a specific gravity of the object to be measured.
In the measuring method according to any one of claims 1 to 6,
A measuring method, wherein the slit light is replaced with scanning light that scans spot light, and the central optical axis is replaced with an optical axis that passes through the center between both ends of the scanning range of the scanning light.
In the measuring method according to any one of claims 1 to 7,
The measurement object is a slab or a rolled material.
In the longitudinal direction of the object to be measured with respect to a long object to be measured having a quadrangular cross section having a first surface, a second surface, a third surface, and a fourth surface in order in the circumferential direction. A first light source that irradiates slit light toward the first surface and the second surface from a direction orthogonal to the transport direction of
The first surface generated by the irradiation of the slit light of the first light source with the optical axis inclined in the transport direction or the opposite direction at a predetermined sandwich angle with respect to the surface of the slit light of the first light source. And a first imaging device that acquires a first captured image that includes the reflected light of the first light cutting line on the second surface,
The central light axis of the slit light of the first light source is directed to the corner that forms the boundary between the first surface and the second surface of the object to be measured, and the first light source The allowable maximum angle of directivity inclination was set to be 45 ° ± 25 ° with respect to a virtual surface parallel to the first surface,
A measuring device characterized by that.
In the measuring device according to claim 9,
A second light source for irradiating slit light toward the third surface and the fourth surface from a direction orthogonal to the conveying direction in the longitudinal direction of the object to be measured;
The third surface generated by the irradiation of the slit light of the second light source with the optical axis inclined in the transport direction or the opposite direction at a predetermined sandwich angle with respect to the surface of the slit light of the second light source. And a second imaging device that acquires a second captured image including the reflected light of the second light cutting line on the fourth surface,
The center light axis of the slit light of the second light source is directed to the corner that forms the boundary between the third surface and the fourth surface of the object to be measured, and the second light source Setting the maximum allowable angle of directivity inclination to be 45 ° ± 25 ° with respect to a virtual plane parallel to the third surface;
A measuring device characterized by that.
The measuring device according to claim 10,
A third light source that irradiates slit light toward the second surface and the third surface from a direction orthogonal to the transport direction in the longitudinal direction of the object to be measured;
The second surface generated by irradiation of the slit light of the third light source with the optical axis inclined in the transport direction or the opposite direction at a predetermined sandwich angle with respect to the surface of the slit light of the third light source. And a third imaging device for acquiring a third captured image including the reflected light of the third light cutting line on the third surface;
A fourth light source that irradiates slit light toward the fourth surface and the first surface from a direction orthogonal to the transport direction in the longitudinal direction of the object to be measured;
The fourth surface generated by the irradiation of the slit light of the fourth light source with the optical axis inclined in the transport direction or the opposite direction at a predetermined sandwich angle with respect to the surface of the slit light of the fourth light source. And a fourth imaging device that acquires a fourth captured image including the reflected light of the fourth light cutting line on the first surface,
The center light axis of the slit light of the third light source is directed to the corner that forms the boundary between the second surface and the third surface of the device under test, and the third light source Set the maximum allowable angle of directivity inclination to be 45 ° ± 25 ° with respect to a virtual plane parallel to the second surface,
The center light axis of the slit light of the fourth light source is directed to the corner that forms the boundary between the fourth surface and the first surface of the device under test, and the fourth light source The maximum allowable angle of directivity inclination was set to be 45 ° ± 25 ° with respect to a virtual plane parallel to the fourth surface,
A measuring device characterized by that.
The measuring device according to claim 11,
The slit light of each of the first light source and the second light source overlaps a plane orthogonal to the conveyance direction of the object to be measured,
The slit light of each of the third light source and the fourth light source overlaps a plane orthogonal to the conveyance direction of the object to be measured,
The surface perpendicular to the transport direction of the object to be measured of the slit light of each of the first light source and the second light source, and the subject of the slit light of each of the third light source and the fourth light source. So that the surface perpendicular to the conveyance direction of the measurement object is shifted,
A measuring apparatus comprising the first to fourth light sources.
The measuring device according to claim 11,
The first to fourth light sources are arranged so that the respective slit lights of the first light source to the fourth light source overlap with a plane orthogonal to the conveyance direction of the object to be measured. A measuring device.
In the measuring device according to any one of claims 9 to 13,
2. A measuring apparatus according to claim 1, wherein said slit light is replaced with scanning light for scanning spot light, and said central optical axis is replaced with an optical axis passing through a center between both ends of a scanning range of said scanning light.
In the measuring device according to any one of claims 9 to 14,
The measuring device is a slab or a rolled material.