WO2015157363A3 - Method and apparatus for a probe card - Google Patents

Method and apparatus for a probe card Download PDF

Info

Publication number
WO2015157363A3
WO2015157363A3 PCT/US2015/024826 US2015024826W WO2015157363A3 WO 2015157363 A3 WO2015157363 A3 WO 2015157363A3 US 2015024826 W US2015024826 W US 2015024826W WO 2015157363 A3 WO2015157363 A3 WO 2015157363A3
Authority
WO
WIPO (PCT)
Prior art keywords
backplane
probe card
diagnostics
receivers
manual
Prior art date
Application number
PCT/US2015/024826
Other languages
French (fr)
Other versions
WO2015157363A2 (en
Inventor
Walter A. Schindler
Jerry CHOY
Original Assignee
Elma Electronic Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elma Electronic Inc. filed Critical Elma Electronic Inc.
Publication of WO2015157363A2 publication Critical patent/WO2015157363A2/en
Publication of WO2015157363A3 publication Critical patent/WO2015157363A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

An integrated apparatus and method to provide test, diagnostics and characterization access to backplane electrical signals during electronic product development is presented. The apparatus removes need for manual and ad hoc connections made in an engineering laboratory or assembly line which make the process prone to damage of the components, inaccurate measurements and arbitrary fluctuations in function. The method and apparatus is a mechanized way to connect backplane signals to corresponding drivers, receivers and test equipment through probes placed on equidistant electrical traces, reducing inter signal variations.
PCT/US2015/024826 2014-04-08 2015-04-08 Method and apparatus for a probe card WO2015157363A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201461995316P 2014-04-08 2014-04-08
US61/995,316 2014-04-08

Publications (2)

Publication Number Publication Date
WO2015157363A2 WO2015157363A2 (en) 2015-10-15
WO2015157363A3 true WO2015157363A3 (en) 2015-12-03

Family

ID=54288534

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2015/024826 WO2015157363A2 (en) 2014-04-08 2015-04-08 Method and apparatus for a probe card

Country Status (1)

Country Link
WO (1) WO2015157363A2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7126361B1 (en) * 2005-08-03 2006-10-24 Qualitau, Inc. Vertical probe card and air cooled probe head system
US20080211525A1 (en) * 2005-12-22 2008-09-04 Touchdown Technologies, Inc. Probe card assembly and method of forming same
US20100213960A1 (en) * 2007-10-11 2010-08-26 Sammy Mok Probe Card Test Apparatus And Method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7126361B1 (en) * 2005-08-03 2006-10-24 Qualitau, Inc. Vertical probe card and air cooled probe head system
US20080211525A1 (en) * 2005-12-22 2008-09-04 Touchdown Technologies, Inc. Probe card assembly and method of forming same
US20100213960A1 (en) * 2007-10-11 2010-08-26 Sammy Mok Probe Card Test Apparatus And Method

Also Published As

Publication number Publication date
WO2015157363A2 (en) 2015-10-15

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