WO2015097779A1

WO2015097779A1 - Rack, anomaly detection device for rack, and method for same

Info

Publication number: WO2015097779A1
Application number: PCT/JP2013/084654
Authority: WO
Inventors: 佐藤　克哉
Original assignee: 株式会社日立製作所
Priority date: 2013-12-25
Filing date: 2013-12-25
Publication date: 2015-07-02

Abstract

A rack (1) which mounts an electronic apparatus (9) comprises: one or a plurality of sensors (6) placed on slide rails (2) disposed on left and right sides; and a control unit (28) which, on the basis of detection data by the sensors (6), assesses deformation of the slide rails (2). As a result, if the rack (1) receives significant external force by way of an earthquake, transport, or the like, deformation of the slide rails (2) in which the electronic apparatus (9) is mounted is detected.

Description

Rack, rack abnormality detection device and method thereof

The present invention relates to a rack on which electronic equipment is mounted, a rack abnormality detection device, and a method thereof.

Computers and storage devices are configured with a large number of electronic devices such as blade servers and hard disk devices mounted in a rack. For example, Patent Document 1 discloses an electronic device system in which a large number of electronic devices are mounted on a rack. In particular, this electronic device system is configured to identify the physical position of an abnormal electronic device from among a large number of electrical devices mounted on a rack by changing the display state of the light emitting element of the electronic device that has notified the abnormality. Have.

JP 2009-238066 A

If the rack in which the electronic device is mounted is subjected to a large external force, such as due to an earthquake, transportation, or vibration, the slide rail of the rack may be deformed, causing an abnormality in the mounting state of the electronic device and the electronic device falling from the rack. There is. Therefore, it is desired to detect and notify that an abnormality has occurred in the mounting state of the electronic device.

Incidentally, the electronic device system described in Patent Document 1 is intended to identify an abnormality of the electronic device itself mounted on the rack, and about detecting an abnormality in the mounting state of the electronic device mounted on the rack. Not considered.

An object of the present invention is to detect the state of a rack on which electronic equipment is mounted.

The rack according to the present invention is preferably a rack in which electronic devices are mounted on slide rails provided on the left and right sides, and one or a plurality of first sensors disposed on the slide rails, and the first sensors. And a control unit that determines the deformation of the slide rail based on the detection data obtained by the above.

According to a preferred example, the slide rail is a rail having a predetermined width in the left-right direction,
Arranging the plurality of first sensors in the width direction of the slide rail;
The control unit determines whether the deformation in the width direction of the slide rail is a linear deformation or a local deformation based on detection data of the plurality of first sensors.

Preferably, the slide rail is a rail extending in the depth direction,
Arranging the plurality of first sensors in the depth direction of the slide rail;
The control unit determines deformation of the slide rail in the depth direction based on detection data of the plurality of first sensors.

Preferably, the slide rail is a rail extending in the depth direction,
A second sensor is arranged on the back side of the slide rail,
The control unit determines a mounting state of an electronic device that is inserted while being supported by the slide rail, based on detection data of the second sensor.

More preferably, the control unit predetermines a criterion for deformation of the slide rail based on detection data by the first sensor or the second sensor, and stores the criterion in the storage unit,
The detection data detected by the first sensor or the second sensor is compared with the determination criterion, and control is performed so as to change the display on the display device according to the determination criterion.
The present invention is also grasped as a detection apparatus and a detection method for the state of the rack.

According to the present invention, it is possible to detect the state of the rack, that is, the mounting state of the electronic device, by detecting the state of the slide rail on which the electronic device is mounted with the sensor.

The figure which shows the whole structure of a rack. The perspective view which shows the structure of a slide rail. The figure which shows the mounting structure to the rack of a slide rail. The block diagram which shows the structure of a control unit. The figure which shows the management table classified by sensor output state. The flowchart figure which shows the control action of a control unit. The figure which shows the mode of the L-shaped metal fitting of a normal state in the Y-axis direction. The figure which shows the output graph of the Y-axis sensor of a normal state in a Y-axis direction. The figure which shows the side view of a normal state in a Z-axis direction. The figure which shows the output graph of the Z-axis sensor of a normal state in a Z-axis direction. The figure which shows the state which the L-shaped metal fitting deform | transformed. The figure which shows a sensor output data storage table. The figure which shows the output graph of the Y-axis sensor in an abnormal state in the Y-axis direction. The figure which shows the side view of an abnormal state in a Z-axis direction. The figure which shows the output graph of the Z-axis sensor of an abnormal state in a Z-axis direction.

Hereinafter, preferred embodiments of the present invention will be described with reference to the drawings.
FIG. 1 shows an overall configuration diagram of a rack. FIG. 2 shows a configuration example of the slide rail, and FIG. 3 shows a mounting structure of the slide rail. FIG. 3B is an enlarged view of a Y portion in FIG.

A plurality of electronic devices 9 such as blade servers can be mounted on the rack 1. In the rack 1, a pair of left and right slide rails 2 are arranged in multiple stages. The front and rear ends of each slide rail 2 are fixed to the column 10 of the rack 1 with screws 39.
The electronic device 9 is mounted on the rack 1 by placing the lower portions on both sides of the electronic device 9 on a pair of left and right slide rails 2 and pushing it backward (in the direction of the arrow in FIG. 3A) from the near side.

The slide rail 2 has a mechanism for detecting an abnormality in the mounting state of the electronic device on the rack, which is characteristic of this embodiment. 2A is a perspective view of the slide rail 2 as viewed from the inside of the rack, and FIG. 2B is a perspective view of the slide rail 2 as viewed from the outside of the rack. The front side of the slide rail 2 corresponds to the front surface of the rack 1.

The slide rail 2 has an outer rail 24 that can be expanded and contracted according to the dimension between the front and rear columns 10 of the rack 1 on which the electronic device 9 is mounted, and an L-shaped bracket 25 that is attached to the outer rail 24 and mounts the electronic device 9. And have. The front and rear portions of the outer rail 24 are fixed to the column 10 of the rack 1 with screws 39.

A sensor mounting plate 23 in which a plurality of Y-axis sensors 6 for detecting displacement in the vertical direction (hereinafter referred to as Y direction) is arranged is fixed to the lower surface of the L-shaped metal fitting 25. The Y-axis sensor 6 is, for example, a pressure sensor, and is arranged in two sets (reference numerals 261 and 262) in the rack width direction (hereinafter referred to as X direction) and four sets in the depth direction (hereinafter referred to as Z direction). Gravity received from the electronic device 9 is detected at the sensor position. Cables 22 for transferring the detection signals of the sensors 26 to the control unit 28 are laid on the back side of the sensor mounting plate 23.

A Z-axis sensor 27, which is a pressure sensor, is attached to the rear of the L-shaped metal fitting 5, and detects the displacement of the electronic device 9 inserted on the slide rail 2 in the Z-axis direction. The Y-axis sensor 26 and the Z-axis sensor 27 are connected to the control unit 28 via the cable 22.

The slide rail 2 shown in FIG. 2 is attached to the left column of the rack 1, but the slide rail 2 attached to the right column of the rack 1 also has a structure or contrast with that of FIG. It is understood that the sensor has an arrangement structure.

FIG. 4 shows the configuration of the control unit 28.
The control unit 28 uses a detection data (sensor output value) of the Y-axis sensor 26 and the Z-axis sensor 27 to determine an abnormality in the mounting state of the electronic device (control table for each sensor output state (see FIG. 5). ) And a sensor output data storage table for storing detection data (see FIG. 12)), a control unit 2802 for determining an abnormal mounting state based on the detection data of each sensor, and a control unit 2802 It has a display unit 29 such as an LED for informing the result of the abnormality determination by. Here, the control unit 2802 is a CPU (processor) on which a program is executed. The abnormal state can be identified by the difference in the color of the display 29. The determination of the abnormal state and the color difference are defined in advance in the control table for each sensor output state.

FIG. 5 shows a configuration example of a control table for each sensor output state (hereinafter simply referred to as a control table). This control table is prepared in the storage unit 2801 in advance. In the present embodiment, the deformation of the L-shaped metal fitting 25 is detected by the plurality of Y-axis sensors 26 arranged on the sensor mounting plate 23, and then, an abnormality in mounting the electronic device 9 is determined. Further, the Z-axis sensor 27 detects an abnormality in the insertion state of the electronic device 9.

For this purpose, the control table includes a determination criterion corresponding to the deformation state of the rail and the insertion state of the electronic device 9 with respect to the detection data by the Y-axis sensor 26 and the Z-axis sensor 27, and the display state of the display unit 29 corresponding to the determination criterion. Is registered in advance. The control unit 2802 controls the display state of the display device 29 with reference to the control table for the detection data of the

sensors

26 and 27. The determination is made based on a comparison result between the detection data of the Y-axis sensor and the Z-axis sensor and a predetermined threshold (α (81) in FIG. 8, β (102) in FIG. 10).

More specifically, the control table includes seven determination reference patterns (in accordance with the states of data detected by the two Y-axis sensors (a (n), b (n)) 26 and the Z-axis sensor 27 ( PTN1 to PTN7) are prepared. The display on the display 29 is switched according to each judgment reference pattern. Note that a (n) indicates the detection data of the sensor on the Y-axis sensor 261 side (that is, the side far from the outer rail 24), and b (n) indicates the sensor on the Y-axis sensor 262 side (that is, the side closer to the outer rail 24). The detection data is shown. The detection data is represented by a voltage value, and is represented by the relationship of the output voltage corresponding to the pressure applied to the Y-axis sensor or the Z-axis sensor, as shown in FIGS.

FIG. 12 shows a sensor output data storage table (hereinafter simply referred to as a storage table). In the illustrated storage table, detection data acquired from the Y-axis sensor 26 and the Z-axis sensor 27 arranged in two rows and four groups (a total of eight) is stored as time T1 to T6 elapses.

Here, Van (Py) represents a sensor output value at the pressure Py in the Y-axis sensor an. (N = 1, 2, 3, 4) (y = y0, y1, y2)
Vbn (Py) represents a sensor output value at the pressure Py in the Y-axis sensor bn. (N = 1, 2, 3, 4) (y = y0, y1, y2)
Vz (Pk) represents a sensor output value at the pressure Pk in the Z-axis sensor z. (k = z0, z1, z2)
The threshold values of each sensor are αa1 to αa4, αb1 to αb4, and αz.
The sensor output value of the Y-axis sensor bn with Van (Py0) <Van (Py1) <αan <Van (Py2), (n = 1,2,3,4) Vbn (Py0) <Vbn (Py1) <αbn <Vbn (Py2), Vz (Pz0) <Vz (Pz1) <αz <Vz (Pz2).

Each Tn (Time 1 to 6) in the illustrated storage table indicates the result of the detection data. T1 is PTN7 (no device installed), T2 is PTN2 (device depth direction abnormality), T3 is PTN1 (no abnormality, device normal installation), T4 is rail twisting in the depth direction, sensor row number 1 is PTN3 (rail local) Sensor row numbers 2 to 4 are PTN1 (no abnormality), T5 is PTN3 (rail local deformation), and T6 is PTN5 (rail deformation).

Next, a control operation by the control unit will be described with reference to FIG.
The control unit 2802 of the control unit 28 stores the output values (detection data) from the Y-axis sensor 26 and the Z-axis sensor 27 in the sensor output data storage table (storage table) in the storage unit 2801 and also outputs the sensor output state. The display is controlled according to which one corresponds to the threshold value determined as a criterion of the separate control table and each output value.

The control unit 2802 stores the obtained output value of each sensor in the storage table and updates the table (S601). The control unit 2802 outputs the output values a (n) and b (n) from the Y-axis sensor 26, the output value z from the Z-axis sensor 27, a predetermined threshold value α (81 in FIG. 8), and β (102 in FIG. 10) is compared (S602) to determine whether or not the output value exceeds the threshold (S603 to S607).

As a result of the comparison determination, if there is no output value exceeding the threshold value, the output value of the Y-axis sensor 26 when the output values a (n) and b (n) from the Y-axis sensor 26 are zero pressure. Is determined to be Vx (83 in FIG. 8), and if YES, the process of PTN7 in which no device is mounted is executed (S606). If NO, the control of PTN1 that is normally mounted is executed (S606).

On the other hand, if the threshold value is exceeded in comparison with the threshold value, the control of S603 to S607 (PTN6, PTN2, PTN4, PTN5, PTN3) is executed.

Next, the output values of the Y-axis sensor 26 and the Z-axis sensor 27 and the deformation of the L-shaped bracket 25 will be described with reference to FIGS.

FIG. 7 shows a state where the L-shaped metal fitting 5 is not deformed and the electronic device 9 is normally mounted in the Y direction. FIG. 8 shows the relationship between the pressure applied to the L-shaped bracket 25 and the output values an and bn of the Y-

axis sensors

261 and 262.
As described above, when the pressure to each

sensor

261, 262 is 0, that is, when the electronic device 9 is not mounted on the rack 1, the output value of each pressure sensor is Vx (88). When the electronic device is mounted on the rack, the output value Ix (82) is deformed in the Y direction within the normal range due to its own weight.

9 shows a state in which the electronic device 9 is normally mounted in the Z direction, and FIG. 10 shows a relationship between the pressure value and the output value of the Z-axis sensor 27. In the Z direction, when the electronic device 9 is mounted at a predetermined position in the Z direction, a constant pressure value (Z-1) is generated, and the output value at that time is Iz (101 ) The state of the output value Vz when the pressure value in the Z direction is 0 indicates that the electronic device is not yet mounted or the electronic device is not normally mounted. The state is determined together with the output value of the Y-axis sensor 26.

FIG. 11A shows a state in which the L-shaped metal fitting 25 on which the electronic device 9 is mounted is linearly deformed with the L-shaped bent portion P as a refraction point. The portion of the slide rail corresponding to the sensor 261 is lower than the refraction point P by h.
In this case, as shown in FIG. 13, a load is applied to both the Y-axis sensors a (n) 261 and b (n) 262, the pressure value increases, and the sensor output values both exceed the threshold value α (81). It becomes. This is PTN5 or PTN6 according to the abnormality determination criteria shown in the sensor output state management table (FIG. 5). The determination of PTN5 or PTN6 is performed together with the determination in the Z direction.

Here, with reference to FIG. 14 and FIG. 15, a state where the electronic device 9 is not normally mounted in the Z direction will be described. In the example of FIG. 14, the insertion state of the electronic device 9 inserted on the slide rail 2 is insufficient, and a gap is generated by the interval g. In this case, as shown in FIG. 15, since the pressure in the Z direction decreases, the output voltage detected by the Z-axis sensor 27 also decreases, and the output value falls below the threshold value β (102). At this time, together with the state in which the L-shaped metal fitting 25 is linearly deformed, the determination result is PTN6. In this case, the four sets of Y-axis sensors arranged in the Z direction are the same regardless of the arrangement position in the Z direction (a (1) = a (2) =... A (n) = b ( The same applies to n).

FIG. 11 (B) shows a state in which the L-shaped metal fitting 25 is locally deformed at the refraction point P. FIG. In this case, the detected value of the Y-axis sensor b (n) 262 located inside the L-shaped bent portion Q from the refraction point P does not exceed the threshold value α (81) because the displacement is small. However, the detected value of the outer Y-axis sensor a (n) 261 increases greatly, and the output value exceeds the threshold value α (81). In this case, the determination criterion of the control table (FIG. 5) is PTN3 or PTN4. This determination is performed together with the determination in the Z direction as in the case of linear deformation (FIGS. 11A and 13). When the electronic device 9 is normally mounted with respect to the Z direction, it becomes PTN3, and when it is not normally mounted, it becomes PTN4. Moreover, PTN7 in a state where no electronic device is mounted becomes Time1 of the storage table (FIG. 12).

As described above, according to this embodiment, when an electronic device mounted on a rack is deformed by an external force such as an earthquake, transportation or vibration, the slide rail (L-shaped bracket) on which the electronic device is mounted is deformed. By detecting the deformation state of the rail, and thus the mounting state of the electronic device, it can be displayed in a different color depending on the abnormal state to notify the administrator or the like.

The present invention is not limited to the above-described embodiments, and various modifications and substitutions can be made. For example, the arrangement location and the number of Y-axis sensors and Z-axis sensors are not limited to the above embodiment. In the example shown in FIG. 2, the Y-axis sensors are arranged on the mounting plate 23 of the L-shaped bracket 25 in two rows in the X direction and four places in the Z direction, but the arrangement is not limited thereto. For example, when it is desired to mainly detect deformation in the width direction of the slide rail, it can be realized by arranging a plurality of sensors in the width direction. For example, when it is desired to mainly detect deformation in the depth direction of the slide rail, it can be realized by arranging a plurality of sensors in the depth direction.
In the example shown in FIG. 2, the Z-axis sensor is disposed on the rear side of the rack, but is not limited to this.

In the above embodiment, the control table shown in FIG. 5 sets seven different determination criteria according to the detection results of the Y-axis sensor and the Z-axis sensor, but the alternative example is not limited to this. For example, depending on the allowable range of abnormality, the determination criterion may be relaxed to be less than seven determination criteria.

1: rack 10: support 9: electronic device 2: slide rail 24: outer rail 25: L-shaped bracket 26: Y-axis sensor 27: Z-axis sensor 28: control unit 2801: storage unit 2802: control unit 29: display

Claims

A rack for mounting electronic devices on slide rails provided on the left and right,
One or more first sensors disposed on the slide rail;
A control unit for determining deformation of the slide rail based on the detection data by the first sensor;
Rack with.
The slide rail is a rail having a predetermined width in the left-right direction,
Arranging the plurality of first sensors in the width direction of the slide rail;
The rack according to claim 1, wherein the control unit determines whether the deformation in the width direction of the slide rail is a linear deformation or a local deformation based on detection data of the plurality of first sensors.
The slide rail is a rail extending in the depth direction,
Arranging the plurality of first sensors in the depth direction of the slide rail;
The rack according to claim 1 or 2, wherein the control unit determines deformation of the slide rail in a depth direction based on detection data of the plurality of first sensors.
The slide rail is a rail extending in the depth direction,
A second sensor is arranged on the back side of the slide rail,
The rack according to any one of claims 1 to 3, wherein the control unit determines a mounting state of an electronic device that is inserted by being supported by the slide rail, based on detection data of the second sensor.
The control unit predetermines a determination criterion for deformation of the slide rail based on detection data by the first sensor or the second sensor, and stores the determination criterion in a storage unit,
The detection data detected by the first sensor or the second sensor is controlled based on the determination criterion, and the display of the display is changed according to the determination criterion. Rack as described in.
A detection device that detects a state of a rack in which electronic devices are mounted on slide rails provided on the left and right,
One or more first sensors disposed on the slide rail;
A control unit for determining deformation of the slide rail based on the detection data by the first sensor;
An apparatus for detecting an abnormality of a rack.
The slide rail is a rail having a predetermined width in the left-right direction,
Arranging the plurality of first sensors in the width direction of the slide rail;
The rack abnormality detection according to claim 6, wherein the control unit determines whether the deformation in the width direction of the slide rail is linear deformation or local deformation based on detection data of the plurality of first sensors. apparatus.
The slide rail is a rail extending in the depth direction,
Arranging the plurality of first sensors in the depth direction of the slide rail;
The rack abnormality detection device according to claim 6 or 7, wherein the control unit determines deformation of the slide rail in the depth direction based on detection data of the plurality of first sensors.
The slide rail is a rail extending in the depth direction,
A second sensor is arranged on the back side of the slide rail,
The rack according to any one of claims 6 to 8, wherein the control unit determines a mounting state of an electronic device to be inserted while being supported by the slide rail based on detection data of the second sensor. Anomaly detection device.
The control unit predetermines a determination criterion for deformation of the slide rail based on detection data by the first sensor or the second sensor, and stores the determination criterion in a storage unit,
The detection data detected by the first sensor or the second sensor is lit against the determination criterion, and control is performed so as to change the display of the display according to the determination criterion. The rack abnormality detection device according to claim 1.
A detection method for detecting a state of a rack in which electronic devices are mounted on slide rails provided on the left and right,
Obtaining detection data from one or more first sensors disposed on the slide rail;
Determining the deformation of the slide rail based on the detection data by the first sensor;
A method for detecting an abnormality in a rack.
The slide rail is a rail having a predetermined width in the left-right direction,
The plurality of first sensors are arranged in the width direction of the slide rail,
The rack abnormality detection method according to claim 11, wherein the deformation in the width direction of the slide rail is determined as linear deformation or local deformation based on detection data of the plurality of first sensors.
The slide rail is a rail extending in the depth direction,
The plurality of first sensors are arranged in the depth direction of the slide rail,
The rack abnormality detection method according to claim 11 or 12, wherein the control unit determines deformation of the slide rail in the depth direction based on detection data of the plurality of first sensors.