WO2015046202A1

WO2015046202A1 - Sliced-sample production device and sliced-sample production method

Info

Publication number: WO2015046202A1
Application number: PCT/JP2014/075190
Authority: WO
Inventors: 弘明飯田; 健吾渡辺; 中川　泰
Original assignee: 倉敷紡績株式会社
Priority date: 2013-09-30
Filing date: 2014-09-24
Publication date: 2015-04-02
Also published as: JP2017009286A

Abstract

Provided are a sliced-sample production device and method capable of reducing sliced-sample thickness variation caused by the temperature of a sample block. A sliced-sample production device (100) for producing sliced samples (16) by using a cutter (31) to slice a sample block (10) in which a sample (11) is embedded in an embedding agent (12), said sliced-sample production device (100) being provided with a conveying unit (20) for conveying the sample block (10), a cutting unit (30) having the cutter (31) provided thereto, a temperature detection unit (24) for detecting the surface temperature of the sample block (10), and a control unit (70) for controlling the operation of at least the conveying unit (20), the cutting unit (30), or both on the basis of the surface temperature of the sample block (10) detected by the temperature detection unit (24).

Description

Thin section sample preparation device and thin section sample preparation method

The present invention relates to a thin-section sample preparation apparatus and a thin-section sample preparation method for preparing a thin-section sample used for physicochemical sample analysis or microscopic observation of biological samples.

Conventionally, a microtome is widely known as an apparatus for producing a thin-section sample used for physicochemical sample analysis or microscopic observation of a biological sample. A microtome is a device that produces a thin slice sample by slicing a sample block (embedded) in an embedding agent such as paraffin into a specimen block (embedded) such as a biological sample of an animal. . For example, Patent Documents 1 to 5 describe thin-section sample preparation apparatuses that perform a series of operations such as slicing a sample block, attaching to a slide glass, stretching, and drying.

JP 2012-229993A JP 2012-229994 A JP 2012-229995 A JP 2012-229996 A JP 2012-229997 A

The thickness of the thin slice sample is required to be very thin (depending on the sample, for example, 3 μm to 10 μm) and uniform. Furthermore, since many biological samples of animals are difficult to collect again, it is necessary to avoid as much as possible the waste of the sample without obtaining a desired thickness. On the other hand, this sample block has a problem that expansion and contraction are likely to occur due to a subtle change in temperature, and unevenness is likely to occur in the thickness of the thin slice during thin slice processing.

Therefore, in order to maintain the environment at a constant temperature (for example, 10 ° C. to 25 ° C.), the thin-section sample preparation device is generally provided with a cooler that cools the inside of the device surrounded by a casing. The temperature is appropriately set according to the sample used as the sample block, the type of embedding agent, and the like. However, when the temperature is adjusted by the cooler, the temperature of the sample block may not reach the predetermined temperature even when the temperature varies within the enclosed apparatus and the temperature inside the apparatus is almost the predetermined temperature. In addition, the temperature of the embedding agent for the sample block may not be sufficiently lowered until the preparation of the thin section.

As a countermeasure against this, the use of a thin-section sample preparation device usually starts a thin-section preparation operation such as a cutting process after about 30 minutes have passed since the cooler is operated. However, the set time of 30 minutes does not take into account the temperature of the sample block, it may be too long and it may simply be a time loss, or it may be too short to reduce the temperature of the sample block, and the sample during the cutting process Thickness unevenness may occur in the thin slice obtained by the temperature change of the block.

In response to the above-described problem, the present invention controls the thin-section manufacturing operation of the apparatus based on the surface temperature of the sample block.

The thin-section sample preparation apparatus of the present invention is a thin-section sample preparation apparatus that prepares a thin-section sample by slicing a sample block in which a sample is embedded in an embedding agent with a cutter, and transports the sample block A conveyance unit; a cutting unit including the cutter; a temperature detection unit that detects a surface temperature of the sample block; and at least the conveyance unit and / or based on the surface temperature of the sample block detected by the temperature detection unit. A control unit for controlling the operation of the cutting unit.

Preferably, when the surface temperature of the sample block is outside the predetermined range, the control unit stops the conveying unit and / or the cutting unit until the surface temperature falls within the predetermined range. Let

Preferably, any of the thin-section sample preparation devices further includes a humidifying unit that humidifies the surface of the sample block, and the humidifying unit humidifies between the cutting unit and the temperature detecting unit. .

Preferably, any one of the thin-section sample preparation apparatuses further includes a surface determination unit that determines whether an area of the sample portion on the surface of the sample block is sufficient for thin-section sample preparation. The temperature detection unit performs temperature detection when it is determined that the area of the sample portion on the surface of the sample block is sufficient for thin-section sample preparation.

The thin-section sample preparation method of the present invention is a thin-section sample preparation method for preparing a thin-section sample by slicing a surface layer portion of a sample block in which the sample is embedded in an embedding agent with a cutter. Detecting the surface temperature, determining whether or not the surface temperature is within a predetermined range, and if the surface temperature is within the predetermined range, the cutter and the sample block Performing the slicing operation by relatively moving, and stopping the sample block until the surface temperature falls within the predetermined range when the surface temperature is outside the predetermined range.

Preferably, in the thin-section sample preparation method, the step of determining whether or not the surface temperature is within a predetermined range, and when the surface temperature is within the predetermined range, the cutter and the There is a step of humidifying the surface of the sample block between the step of performing the slicing operation by relatively moving the sample block.

According to the thin-section sample preparation apparatus or method of the present invention, since the thin-section sample preparation operation is controlled based on the surface temperature of the sample block, it is possible to reduce an extra waiting time before the start of thin-section sample preparation, And the nonuniformity of the thickness of the thin slice sample due to the change of the sample block temperature can be suppressed.

It is a block diagram showing a schematic structure of a thin section sample preparation device concerning a 1st embodiment of the present invention. (A) is sectional drawing which looked at the sample block before rough cutting from the front direction, (b) is a plan view of the sample block after rough cutting, and (c) is a view of the sample block after rough cutting from the front direction. It is sectional drawing. It is a process flow figure of the thin section sample preparation method of a 1st embodiment of the present invention. It is a process flow figure of a thin section sample preparation method of a 2nd embodiment of the present invention. It is a process flow figure of a thin section sample preparation method of a 3rd embodiment of the present invention. It is a block diagram which shows schematic structure of the thin slice sample preparation apparatus concerning the 3rd Embodiment of this invention.

First, an outline of the configuration and operation of the thin-section sample preparation apparatus and method according to the first embodiment of the present invention will be described with reference to FIG.

1, a thin-section sample preparation apparatus 100 is an apparatus that prepares a thin-section sample 16 by automatically and continuously slicing the surface layer portion of the sample block 10 with a cutter 31. The thin-section sample preparation device 100 includes a sample block transport unit 20, a sample block storage unit 21, a height detection unit 22, an imaging unit 23, a temperature detection unit 24, a cutting unit 30, a thin section pasting unit 40, an extension unit 50, and a slide. The glass conveyance part 60 and the control part 70 which controls the whole apparatus are comprised.

The sample block 10 is obtained by embedding the sample 11 in an embedding agent 12 such as paraffin. Examples of the sample 11 that is the subject include biological samples such as human and animal tissues. The sample block 10 generally has a surface size of 24 mm × 24 mm, 24 mm × 30 mm, 24 mm × 37 mm. Further, the height of the sample block 10 is generally about 5 mm.

1, a plurality of sample blocks 10 can be stored in the sample block storage unit 21. One sample block 10 selected from the plurality of sample blocks 10 stored in the sample block storage unit 21 is moved to a position A (height detection unit 22), a position B (imaging unit 23), a position by the sample block transport unit 20. It is conveyed to position D (cutting part 30) via C (temperature detection part 24).

The sample block transport unit 20 is configured to be able to reciprocate the sample block 10 between positions A to D after taking out the sample block 10 and transporting it to the position A. Further, the sample block transport unit 20 is configured to be able to adjust the inclination and height position of the sample block 10. After the inclination (inclination) of the sample block 10 with respect to the horizontal plane is first adjusted, the conveyance unit 20 controlled by the control unit 70 adjusts the height of the sample block 10 appropriately according to the cutting amount.

Above the position A, a height detection unit 22 for detecting the tilt and height position of the sample block 10 is arranged. As the height detection part 22, what detects the surface of the sample block 10 with the at least 3 contact-type sensor which is described in patent document 4 and is not on the same straight line can be used, for example. Based on the sensor information, the control unit 70 controls the transport unit 20 to adjust the inclination and height position of the sample block 10.

The imaging unit 23 is arranged above the position B. As the imaging unit 23, for example, as described in Patent Document 2, a unit having a light source and a CCD camera can be used. By processing the image data obtained by the imaging unit 23, the control unit 70 determines whether or not the area of the portion of the sample 11 exposed on the surface of the sample block 10 is sufficient for the preparation of the thin slice sample. Hereinafter, exposing the sample 11 to the surface of the sample block 10 by cutting is referred to as “surface exposure”, and determining whether the area of the exposed sample 11 is sufficient for thin-section sample preparation is “surface determination”. That's it. As a reference for the surface determination, for example, when the exposed area of the sample 11 on the cutting surface of the sample block 10 is larger than a preset area ratio, the surface can be determined to be sufficient.

The temperature detection unit 24 is disposed above the position C. The temperature detection unit 24 has a non-contact temperature sensor and measures the surface temperature of the sample block 10. The control unit 70 determines whether or not the measured temperature is within a predetermined range. The reference temperature range can be set in advance according to the type of embedding agent such as paraffin.

The cutting part 30 is arranged above the position D. The cutting unit 30 has a cutter 31 that can slice a surface layer portion of the sample block 10. The cutter 31 is held such that the cutting edge extends in a direction perpendicular to the paper surface in FIG. In this embodiment, the cutter 31 is fixed, and the surface of the sample block 10 is sliced by moving the sample block 10 in the right direction in FIG. The cutter 31 may be configured to be movable in a direction perpendicular to the paper surface. In that case, the surface of the sample block 10 is sliced by moving the sample block 10 in the right direction in FIG. In the cutting unit 30, rough cutting until the sample 11 is sufficiently exposed on the surface of the sample block 10, scraping until the thickness of the thin section is stabilized after the sample 11 is sufficiently exposed, and a book for cutting out the thin section sample 16 Sharpening is performed. In some cases, discarding may be omitted.

Further, above the position D, a carrier tape 33 for holding the thin slice sample 16 obtained by slicing the surface layer portion of the sample block 10 with the cutter 31 is supplied. The carrier tape 33 is fed from the supply reel 32, guided by the

guide rollers

34 and 35, and supplied above the position D. The carrier tape 33 holding the thin slice sample 16 above the position D is guided by the

guide rollers

36 and 37 and is taken up by the take-up reel 38.

The thin slice sample 16 held on the carrier tape 33 is stuck on the slide glass 17 by the thin slice sticking portion 40 disposed between the

guide rollers

36 and 37. The thin-section pasting portion 40 includes a pair of

guide rollers

41 and 41 disposed on the upstream side of the traveling path of the carrier tape 33, and a pair of

guide rollers

42 and 42 disposed on the downstream side of the traveling path of the carrier tape 33. It has. The thin-section pasting portion 40 is bent downward with the carrier tape 33 sandwiched between the pair of

guide rollers

41 and 41 and the pair of

guide rollers

42 and 42, and the thin-section sample 16 held on the carrier tape 33. Is brought into contact with the slide glass 17 supplied with an adhesive liquid 18 such as water. As a result, the thin slice sample 16 is attached to the slide glass 17. Hereinafter, the slide glass on which the thin section sample 16 is attached is referred to as a slide glass with a thin section.

The slide glass 17 with a thin section is conveyed to the extension unit 50 by the slide glass conveyance unit 60. The slide glass transport unit 60 transports the slide glass 17 with a thin section to the extension unit 50, and also takes out the slide glass 17 to which a thin section sample has not been pasted from a slide glass storage unit (not shown). To the bottom. The extension section 50 includes a heating plate (not shown), extends the folds of the thin slice sample 16, and evaporates moisture on the slide glass 17, thereby fixing the thin slice sample 16 to the slide glass 17. .

The operation of each component such as the sample block transport unit 20 is controlled by the control unit 70. The control unit 70 controls the operation of each component based on information input to an input unit (not shown). The input unit is configured to be able to input, for example, the number of manufactured slide glasses with thin sections, the number of thin section samples attached per slide glass, and the like.

The apparatus 100 includes a casing and a cooler (not shown), and the inside of the apparatus surrounded by the casing is cooled by the cooler and air-conditioned so as to have a constant temperature. This temperature setting is appropriately set according to the type of the sample 11 and the embedding agent 12 used as the sample block 10. The set temperature is typically in the range of 10 ° C to 25 ° C. If the temperature of the sample block 10 is too high, there arises a problem that the quality of the thin slice sample is deteriorated due to the soft embedding agent. In addition, if the temperature difference between the temperature inside the apparatus and the sample block 10 is large, the sample block 10 contracts and expands due to a temperature change, which causes a problem that the variation in thickness between thin slices produced continuously increases. Furthermore, if the temperature of the sample block 10 is too low, a problem such as breaking of a thin section occurs.

Next, the manufacturing operation of the thin slice sample 16 will be described with reference to FIGS. FIG. 2 shows the structure of the sample block. FIG. 3 shows a flow chart of thin section sample preparation in the present embodiment. The thin-section sample 16 is manufactured under the control of the control unit 70.

In FIG. 2, a sample block 10 is obtained by embedding a sample (subject) 11 in an embedding agent 12 such as paraffin. FIG. 2A is a cross-sectional view of the sample block before rough cutting as viewed from the front, and the sample 11 is embedded in the embedding agent 12 so as not to be exposed to the outside (or slightly exposed). The sample block 10 stored in the storage unit 21 is normally in this state. The surface of the sample block 10 is roughened until the exposed area on the surface of the sample 11 is equal to or larger than a preset area (dotted line 14 in FIG. 2A). If the exposed area of the sample 11 exceeds a preset area by rough cutting (FIG. 2 (b)), a scraping or a main cutting for producing a thin slice sample 16 having a thickness of about 3 to 10 μm is performed. (Dotted line 15 in FIG. 2C). Note that the sample block 10 is transported on a sample block table 13 not shown in FIG. It should also be noted that the scale of FIG. 2 is not accurate and is stretched in the height direction for ease of explanation.

1 and 3, first, the sample block transport unit 20 takes out the sample block 10 to be sliced next from the sample block storage unit 21 and transports it to the position A. At the position A, the inclination and height position of the sample block 10 are adjusted.

Next, the sample block transport unit 20 transports the sample block 10 to the position B. At the position B, the imaging unit 23 images the sample block 10, and a surface determination is performed as to whether or not the area of the portion of the sample 11 exposed on the surface of the sample block 10 is sufficient for the preparation of the thin slice sample. The method for determining the surface of Patent Document 1 detects the maximum projection area of the sample in the sample block, identifies the sample portion on the surface of the sample block and the portion of the embedding agent, and samples the sample on the surface of the sample block. It is determined whether or not the ratio of the area is sufficient with respect to whether or not the ratio of the area of the sample block to the area of the maximum projected region of the sample is greater than or equal to a predetermined ratio. In the first imaging, only the maximum projection area of the sample in the sample block is detected, and the surface determination can be omitted.

Next, the sample block transport unit 20 transports the sample block 10 to the position D. At the position D, the surface layer portion of the sample block 10 is roughly cut by the cutting unit 30. Note that, also in the first rough cutting, it may be transferred to the position C, and surface temperature detection / temperature determination may be performed.

Next, the sample block transport unit 20 transports the sample block 10 to the position B again. At the position B, the imaging unit 23 captures an image of the cut surface of the sample block 10 exposed by roughing, and the first surface determination is performed again or again. In addition, since it is not necessary to detect the maximum projection area for the second and subsequent imaging, the irradiation method, the detection method, and the like can be changed from the first imaging.

In the surface determination, if the surface is not sufficient, the sample block transport unit 20 transports the sample block 10 to the position D again, and the surface layer portion of the sample block 10 is roughly cut by the cutting unit 30 at the position D. In this case, it is not necessary to perform surface temperature detection and temperature determination, and rough cutting is performed more efficiently. However, even in rough cutting, the material may be transported to position C and surface temperature detection / temperature determination may be performed.

In the surface determination, if the surface is determined to be sufficient, that is, if the roughing operation is completed, the sample block transport unit 20 transports the sample block 10 to the position C. At the position C, the temperature The detection unit 24 measures the surface temperature of the sample block 10 and determines whether or not the measured temperature is within a predetermined range. When the sample block surface temperature is within the predetermined range, the sample block is transported to the position D and proceeds to the next scraping or main cutting step. When the sample block surface temperature is outside the predetermined range, the control unit 70 stops the sample block transport unit 20 and causes the sample block 10 to wait on the spot until the surface temperature falls within the predetermined range. When cutting a sample block, the humidity of the sample block is also important, and humidification is often performed before cutting. The humidification is preferably performed at a timing at which the temperature measured by the surface temperature detection / temperature determination is within a predetermined range and transported to the position D for scraping or main cutting. That is, it is preferable that the humidification part 39 exists between the position C and the position D. This is because if the humidification is performed before the surface temperature is detected, an appropriate temperature measurement cannot be performed immediately after the humidification, resulting in a time loss.

At position D, the thin section 16 is cut out from the surface of the sample block 10 by the main cutting. At this time, the main cutting is usually performed after performing a plurality of times of discarding with the same thickness and conditions as the main cutting. This is because the thickness of the thin section 16 is stabilized by performing the discarding. In particular, when using different cutters 31 or different positions of the cutting edges of the cutter 31 for rough cutting and main cutting, or when the thickness of rough cutting differs from the thickness of main cutting, the thickness accuracy of the thin slice to be produced is improved. In order to do this, it is preferable to perform several times of scraping with the thickness of the main cutting at the positions of the cutter 31 and the blade edge used for the main cutting.

In the main cutting operation, the height position of the sample block 10 is adjusted by the sample block transport unit 20 so that the surface layer portion of the sample block 10 is sliced by the cutter 31 (about 3 μm to 10 μm). Thereafter, the surface layer portion of the sample block 10 is sliced by the cutter 31 to produce a thin slice sample 16. Thereafter, the sample block transport unit 20 temporarily retracts the sample block 10 from the position D to the position C, and adjusts the height position of the sample block 10 so that the surface layer portion of the sample block 10 is sliced by the cutter 31. The next main cutting is performed. The operations of adjusting the height position of the sample block 20, slicing, and retracting are automatically and continuously repeated an arbitrary number of times based on information input to the input unit (not shown), and an arbitrary number of sheets The thin slice sample 16 is prepared.

The thin slice sample 16 produced by the main cutting operation is attached to the carrier tape 33. At this time, it is preferable that the surface of the carrier tape 33 is subjected to treatments such as humidification, cooling, and charging so that the thin-section sample 16 adheres to the carrier tape 33 more reliably. The thin slice sample 16 affixed to the carrier tape 33 is conveyed to the thin slice affixing unit 40 and affixed to the slide glass 17 by the thin slice affixing unit 40. Thereafter, the slide glass with a thin section is conveyed to the extension unit 50 by the slide glass conveyance unit 60. Thereafter, the extending section 50 extends the wrinkles of the thin slice sample 16 and tightly fixes the thin slice sample 16 to the slide glass 17.

In this embodiment, since the sample block 10 reciprocates between positions B to D, the transport unit 20 needs to be configured so that the sample block 10 can reciprocate between positions B to D. Further, since the position adjustment for increasing the height position of the sample block 10 by the cutting amount is performed at each cutting, it is not necessary to return the sample block to the position A normally. However, in preparation for when the inclination of the sample block 10 needs to be readjusted for some reason, the transport unit 20 is preferably configured so that the sample block 10 can reciprocate between positions A to D.

In the present embodiment, the position C of the temperature detection unit 24 is between the positions B and D, but is not limited to this. For example, the temperature detection unit 24 may be in the same place as the imaging unit 22 (position B), or may be in the same place as the cutting unit 30 (position D). Furthermore, the physical position of the temperature detection unit 24 is not particularly limited as long as the transport unit 20 is within a range in which the sample block 10 can be reciprocated. In addition, when the temperature detection part 24 and the cutting part 30 exist in the same position, it is preferable to provide the humidification part 39 in the same position.

In the present embodiment, when the surface temperature of the sample block 10 is outside the predetermined range at the position C, the transport unit 20 stops on the spot. However, the operation when the surface temperature is outside the predetermined range is not limited to this, and the transport unit 20 transports the sample block 10 to a place other than the position C and returns to the position C after a while. Thus, the temperature determination may be performed.

Further, in the present embodiment, when the surface temperature of the sample block 10 is outside the predetermined range, in the present embodiment, the conveyance unit 20 is stopped and the temperature detection position or the separate position until the temperature of the sample block 10 is lowered by the air conditioning in the apparatus 100. Wait at the position. Such a method of waiting the sample block is a preferable method because the temperature change in the sample block 10 is reduced. This is particularly preferable when the number of continuous slices is large. However, this does not prevent forced cooling in order to speed up the cooling of the sample block 10. For example, the surface may be cooled by bringing a Peltier element into contact with the surface of the sample block 10.

Further, in this embodiment, after performing the surface determination and the temperature determination, a plurality of times of scraping and a plurality of times of main cutting are continuously performed. However, the temperature of the sample block surface may be confirmed during the continuous cutting operation. In addition, since the thickness cut by the discard cutting and the main cutting is extremely thin, there is usually no problem even if the temperature of the sample block surface is not confirmed during the continuous cutting operation.

Also, the temperature range that serves as a reference for temperature determination may be set differently before rough cutting and before scraping or main cutting.

Next, a second embodiment of the present invention will be described based on FIG. 1 and FIG.

In this embodiment, the same apparatus as that in the first embodiment is used (FIG. 1). FIG. 4 shows a flow chart of thin section sample preparation in this embodiment. The thin-section sample 16 is manufactured under the control of the control unit 70. The present embodiment is different from the first embodiment in that surface determination is performed after the surface temperature of the sample block 10 is determined.

Referring to FIGS. 1 and 4, the sample block 10 is adjusted in inclination and height position at position A, and surface temperature detection and temperature determination are performed at position C. If the surface temperature is outside the predetermined range, the sample block 10 stands by on the spot, and if it is within the predetermined range, moves to the position B to perform imaging and surface determination. If the surface of the sample block 10 is insufficient, it moves to the position D and rough cutting is performed by the cutting unit 30, and then returns to the position C again to determine the temperature. As described above, the surface temperature detection / temperature determination, imaging / surface determination, and roughing operations are repeated until the sample block 10 is sufficiently surface-exposed. When it is determined that the chamfering is sufficient at the position B, the sample block 10 moves to the position D and is discarded by the cutting unit 30 and the main cutting is performed. Since individual operations of the respective units such as the imaging unit 23, the temperature detection unit 24, and the cutting unit 30 are the same as those in the first embodiment, detailed description thereof is omitted.

Also in the present embodiment, various changes in the structure and operation steps of the apparatus are possible as in the first embodiment. For example, the physical position of the temperature detection unit 24, the standby position of the sample block 10 when the surface temperature is outside a predetermined range, the presence or absence of forced cooling, and the confirmation of the sample block surface temperature during the continuous cutting operation The same changes as in the first embodiment are possible.

In this embodiment, it is necessary to pay attention to the influence of water spray for humidification. In the thin-section sample preparation device 100, water may be sprayed for humidifying the surface of the sample block 10 with some operations. Normally, humidification is performed to optimize the humidity of the sample surface at the time of cutting. Separately, in the imaging unit 23, in order to increase the contrast between the sample 11 and the embedding agent 12, water is sprayed to form a sample block. May humidify the surface. At this time, it is difficult to make an accurate determination even if the temperature is detected in a state where mist is floating above the sample block 10 or in a state where water droplets sprayed on the surface of the sample block remain. Similarly, in order to avoid the influence of the water spray on the image, the image pickup unit 23 performs the image pickup after a while after spraying the water. Therefore, even if the surface temperature is detected immediately after the surface determination, the temperature determination is not affected by water spray. However, in this embodiment, since the temperature detection operation is performed after the cutting operation, it is preferable that a certain period of time is taken between the cutting and the temperature detection until the influence of the spray is eliminated.

A third embodiment of the present invention will be described with reference to FIGS.

The thin-section sample preparation apparatus of this embodiment is different from that of the first and second embodiments in that it does not have an imaging unit (23 in FIG. 1), as shown in FIG. Other configurations are the same as those in the first and second embodiments. FIG. 5 shows a flowchart of thin section sample preparation in the present embodiment. The thin-section sample 16 is manufactured under the control of the control unit 70.

Referring to FIGS. 6 and 5, the sample block 10 is adjusted in inclination and height position at position A, moved to position D, and rough cutting is performed in the cutting unit 30. In this embodiment, since there is no image pickup unit that performs surface determination, rough cutting of a predetermined thickness, or repeated roughing until the surface is sufficiently performed while visually confirming by an operator. become. After the surface is sufficiently formed, the surface temperature detection and temperature determination of the sample block 10 are performed at the position C. If the surface temperature is outside the predetermined range, the sample block 10 stands by on the spot, and if it is within the predetermined range, the sample block 10 moves to the position D and is discarded by the cutting unit 30 to perform the main cutting. In addition, it may convey to the position C once or several times before rough cutting, and may perform surface temperature detection and temperature determination. Since the individual operations of each part of the apparatus such as the temperature detection unit 24 and the cutting unit 30 are the same as those in the first embodiment, detailed description thereof will be omitted.

Also in the present embodiment, as in the first and second embodiments, various changes in the device structure and operation steps are possible. For example, the physical position of the temperature detection unit 24, the standby position of the sample block 10 when the surface temperature is outside a predetermined range, the presence or absence of forced cooling, and the confirmation of the sample block surface temperature during the continuous cutting operation The same changes as in the first or second embodiment can be made.

The present invention is not limited to the above-described embodiment, and various modifications can be made within the scope of the technical idea. For example, in order to measure the temperature in the device housing, a thermometer is arranged separately from the temperature detection unit 24, the thermometer and the control unit are linked, and the housing itself is not within a set temperature range, It is also possible to prevent the entire device from starting. In addition, as a method of placing the thin slice sample on the upper surface of the slide glass, the method by sticking using an adhesive liquid such as water is most preferable, but as another example, the thin slice sample floated on the liquid in the liquid tank. The section sample may be scooped up with a slide glass. Further, the thin slice sample may be transferred from the carrier tape onto the slide glass by the surface tension of the transfer liquid.

In the thin-section sample preparation apparatus and method of the present invention, the surface temperature of the sample block is detected, and after confirming that the surface temperature is within a predetermined temperature range, the thin-section sample is prepared. This makes it possible to suppress uneven thickness of the thin slice sample due to the sample block temperature being too high, and is useful as a thin slice sample preparation device and method used for physicochemical sample analysis and microscopic observation of biological samples. It is.

10 Sample block 11 Sample (subject)
12 Embedding agent 13 Sample block base 14 Rough cutting height 15 Discarded or main cutting height 16 Thin section sample 17 Slide glass 18 Adhesive liquid 20 Sample block transport unit 21 Sample block storage unit 22 Height detection unit 23 Imaging unit 24 Temperature Detection unit 30 Cutting unit 31 Cutter 32 Supply reel 33 Carrier tape 34 to 37, 41, 42 Guide roller 38 Take-up reel 39 Humidifying unit 40 Thin section pasting unit 50 Extending unit 60 Slide glass transport unit 70 Control unit 100 Thin section sample preparation apparatus

Claims

A thin-section sample preparation device for preparing a thin-section sample by slicing a sample block in which a sample is embedded in an embedding agent with a cutter,
A transport unit for transporting the sample block;
A cutting section comprising the cutter;
A temperature detector for detecting the surface temperature of the sample block;
Based on the surface temperature of the sample block detected by the temperature detector, at least a controller that controls the operation of the transport unit and / or the cutting unit;
A thin-section sample preparation apparatus comprising:
When the surface temperature of the sample block is outside the predetermined range, the control unit stops the transport unit and / or the cutting unit until the surface temperature falls within the predetermined range.
The thin-section sample preparation apparatus according to claim 1.
Further comprising a humidifying part for humidifying the sample block surface;
The humidification unit performs humidification between the cutting unit and the temperature detection unit.
The thin-section sample preparation apparatus according to claim 1 or 2.
A surface determination unit that determines whether the area of the sample portion on the surface of the sample block is sufficient for thin-section sample preparation;
The temperature detection unit performs temperature detection when it is determined that the area of the sample portion on the surface of the sample block is sufficient for thin-section sample preparation,
The thin-section sample preparation device according to any one of claims 1 to 3.
A thin-section sample preparation method for preparing a thin-section sample by slicing a surface layer portion of a sample block in which a sample is embedded in an embedding agent with a cutter,
Detecting the surface temperature of the sample block;
Determining whether the surface temperature is within a predetermined range;
When the surface temperature is within the predetermined range, the slicing operation is performed by relatively moving the cutter and the sample block, and when the surface temperature is outside the predetermined range, Stopping the sample block until the surface temperature is within the predetermined range;
A method for preparing a sliced piece sample.
Determining whether the surface temperature is within a predetermined range;
A step of humidifying the surface of the sample block between the step of performing the slicing operation by relatively moving the cutter and the sample block when the surface temperature is within the predetermined range; ,
Thin section sample preparation method.