WO2015041609A1 - Procédé et système de détermination de diagramme d'œil optique d'un faisceau optique modulé de dispositif d'interféromètre - Google Patents

Procédé et système de détermination de diagramme d'œil optique d'un faisceau optique modulé de dispositif d'interféromètre Download PDF

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Publication number
WO2015041609A1
WO2015041609A1 PCT/SG2014/000450 SG2014000450W WO2015041609A1 WO 2015041609 A1 WO2015041609 A1 WO 2015041609A1 SG 2014000450 W SG2014000450 W SG 2014000450W WO 2015041609 A1 WO2015041609 A1 WO 2015041609A1
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WIPO (PCT)
Prior art keywords
optical
parameters
obtaining
modulator structures
eye diagram
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PCT/SG2014/000450
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English (en)
Inventor
Vivek DIXIT
Ching Eng Jason PNG
Soon Thor Lim
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Agency For Science, Technology And Research
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Priority to SG11201601972XA priority Critical patent/SG11201601972XA/en
Publication of WO2015041609A1 publication Critical patent/WO2015041609A1/fr

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/073—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an out-of-service signal
    • H04B10/0731—Testing or characterisation of optical devices, e.g. amplifiers

Definitions

  • the present invention relates broadly to a method and a system for determining an optical eye diagram of a modulated optical beam of an interferometer device, to a method of evaluating system performance of electro-optic devices, and to a data storage medium having stored thereon data code means for instructing a computing device to execute the methods.
  • Electro-optic devices typically work in interferometer configuration to modulate the optical intensity.
  • the qualitative analysis of the modulated signal requires an eye diagram which gives at-glance evaluation of the system performance.
  • researchers and industries use either the measured eye diagram or evaluate the measured eye diagram using system level assumptions.
  • modulators in Mach-Zehnder interferometer (MZI) configuration are mostly measured for their eye diagram.
  • Figure 1 illustrates a typical eye diagram measurement setup 100.
  • Figure 2 illustrates an implementation of a conventional method for determining the optical eye diagram.
  • a random bit sequence generator 200 is applied to the device design 202 to modulate an un-modulated optical beam 204.
  • the modulated signal of the fabricated device for example using the set-up shown in Figure 1 , to measure the optical eye diagram 206.
  • Embodiments of the present invention provide a method and a system for determining an optical eye diagram of a modulated optical beam of an interferometer device, a method of evaluating system performance of electro-optic devices, and a data storage medium having stored thereon data code means for instructing a computing device to execute the methods that seek to address at least one of the above problems.
  • a method of determining an optical eye diagram of a modulated optical beam of an interferometer device comprising obtaining AC parameters for one or more modulator structures of the interferometer device at respective DC bias voltages within a predetermined bias voltage range at an operating frequency of the one or more modulator structures from electrical simulation; obtaining a carrier concentration profile from the electrical simulation; obtaining optical parameters for the one or more modulator structures from optical simulation based on the carrier concentration profile; and determining the optical eye diagram of the modulated optical beam based on the AC parameters and the optical parameters.
  • a method of evaluating system performance of electro-optic devices comprising performing the method of determining an optical eye diagram of a modulated optical beam of an interferometer device as defined in the first aspect.
  • a system for determining an optical eye diagram of a modulated optical beam of an interferometer device comprising means for obtaining AC parameters for one or more modulator structures of the interferometer device at respective DC bias voltages within a predetermined bias voltage range at an operating frequency of the one or more modulator structures from electrical simulation; means for obtaining a carrier concentration profile from the electrical simulation; means for obtaining optical parameters for the one or more modulator structures from optical simulation based on the carrier concentration profile; and means for determining the optical eye diagram of the modulated optical beam based on the AC parameters and the optical parameters.
  • a data storage medium having stored thereon data code means for instructing a computing device to execute the method as defined in the first or second aspects.
  • Figure 1 illustrates a typical eye diagram measurement setup
  • Figure 2 illustrates an implementation of a conventional method for determining the optical eye diagram
  • Figure 3 illustrates an example implementation of a method according to one embodiment
  • Figure 4 shows a flow chart illustrating determining an eye diagram of the modulated optical beam of interferometer devices using electrical and optical simulation results of the individual modulator components, according to an example embodiment
  • Figure 5 shows a representative block diagram of an implementation of a method according to another embodiment
  • Figure 6 shows the schematic SOI modulator structure
  • Figure 7 shows resultant optically modulated beam signal determined by a method according to an example embodiment, plotted as the eye diagram
  • Figure 8 shows the measured eye diagram for an MZI and the biasing conditions used in the method for determining the eye diagram of Figure 7.
  • Figure 9 shows a flow chart illustrating a method of determining an optical eye diagram of a modulated optical beam of an interferometer device, according to an example embodiment.
  • Figure 10 shows a schematic drawing illustrating a system for determining an optical eye diagram of a modulated optical beam of an interferometer device, according to an example embodiment.
  • Embodiments of the present invention seek to provide a low cost, fast and accurate way of determining an eye diagram of high speed devices for evaluation of system performance. It has been recognized by the inventors that to understand the suitability for a particular speed, the use of data from electrical simulation, optical simulation and subsequent evaluation of the eye diagram from these electrical and optical simulation parameters is advantageous as it provides an analysis that can preferably be more close to the actual system performance. This becomes particularly crucial when there is significant dependence on the operation speed, where the inventors have recognized that to evaluate the effect of electrical and optical matrices separately is advantageous.
  • a method of determining an optical eye diagram for an interferometer wherein the electrical response of each arm of a modulator to an electrical pulse sequence is calculated separately. The optical response of each arm of the modulator is then calculated separately and the optical response of each arm of the modulator is combined to determine the modulated optical beam.
  • the proposed method advantageously reduces the need for costly equipment needed in existing design iteration, e.g. spectrum analyzer, PRBS generator etc..
  • Figure 3 illustrates an example implementation of a method according to one embodiment.
  • the performance of MZI type devices is evaluated by determining their eye diagram 300 from electrical simulations 302 and optical simulations 304 of component modulators from a component library 306 for their respective device length.
  • Example embodiments directly take into account the characteristics of the modulated optical beam, and provide high accuracy and clear insight into the modulation characteristics of the device. This advantageously enables designers and researchers to perform design iterations with full accuracy assured.
  • developed code is used in generating or determining the eye diagram for MZI comprising two p-i-n modulators.
  • the present invention can be extended to any other type of modulator in different embodiments, such as ring resonators, and detectors with different length and driving in condition.
  • Embodiments of the present invention can also accommodate any DC phase shift included in the MZI configuration.
  • Figure 4 shows a flow chart 400 illustrating determining an eye diagram of the modulated optical beam of interferometer devices using electrical and optical simulation results of the individual modulator components.
  • the method in this embodiment comprises the following steps.
  • Step 402 Obtaining AC parameters, such as AC capacitance and conductance, at every DC bias voltage from electrical simulation;
  • Step 404 Obtaining the carrier (electron and hole) concentration profile from the electrical simulation and converting the electron and hole concentration matrix into a matrix for the complex refractive index (refractive index and absorption coefficient);
  • Step 406 Using optical simulation to obtain optical parameters, namely the effective refractive index and loss, for the modulator structure, based on the device length and wavelength.
  • Step 408 Together with the AC parameters, the optical parameters are used to determine the eye diagram of the modulated optical beam, based on simulated beam amplitude and phase.
  • Figure 5 shows a representative block diagram of an implementation of a method according to another embodiment.
  • step 4) Using time constant ⁇ (obtained from electrical simulations 504) corresponding to the input voltage, calculate the instantaneous voltage across the capacitor, i.e. the transient response of the modulating voltage 506; Repeat step 4) for both/all the arms of the modulator. Add the random noise to the voltage signal as found in the typical devices, as understood in the art;
  • step 4) For the instantaneous voltage obtained in step 4) calculate the amplitude and phase change of the optical beam using the data obtained from optical simulations 510;
  • step 5 for both/all the arms of the modulator
  • optical response of each arm of the modulator can be calculated separately according to the following steps:
  • optical parameters 516 such as effective refractive index and propagation loss, for every DC bias voltage
  • each arm of the modulator is combined to get the modulated optical beam 518 by adding the output beams from two/all arms (addition according to amplitude and phase).
  • the carrier (electron and hole) concentration profile 520 is obtained from the electrical simulation 504 and the electron and hole concentration matrix is converted into a matrix for the complex refractive index (refractive index and absorption coefficient) for use in the optical simulation 510 in the example embodiment.
  • the electrical simulation 504 and the optical simulation 510 are based on data from a component library 522.
  • Embodiments of the present invention have been successfully applied to MZI configuration comprising a silicon-on-insulator (SOI) modulator.
  • Figure 6 shows the schematic SOI modulator structure 600.
  • the electrical simulations have been performed for OV-to-l OV reverse bias voltages.
  • AC capacitance and conductance are used to calculate the step response of each modulator arm.
  • Optical simulations are performed, using the carrier profiles obtained from the electrical simulations for 0V-10V reverse bias, to calculate the effective refractive index and loss for each modulator arm.
  • input to the modulator arm 602 consists of either Vdc ⁇ Vrf/2.
  • the electrical response of the individual arm is simulated using the electrical capacitance/conductance parameters. Using the electrical response of each arm, its effect on the optical beam's magnitude and phase is calculated using the effective refractive index and loss values obtained from the optical simulations at the relevant bias voltage.
  • the resultant optically modulated beam signal is plotted as the eye diagram 700 in Figure 7.
  • Figure 8 shows the measured eye diagram 800 for MZI and the biasing conditions described above, illustrating close agreement.
  • Figure 9 shows a flow chart 900 illustrating a method of determining an optical eye diagram of a modulated optical beam of an interferometer device, according to one embodiment.
  • AC parameters for one or more modulator structures of the interferometer device are obtained at respective DC bias voltages within a predetermined bias voltage range at an operating frequency of the one or more modulator structures from electrical simulation.
  • a carrier concentration profile is obtained from the electrical simulation.
  • optical parameters for the one or more modulator structures are obtained from optical simulation based on the carrier concentration profile.
  • the optical eye diagram of the modulated optical beam is determined based on the AC parameters and the optical parameters.
  • the AC parameters may comprise the AC conductance and the AC capacitance.
  • the optical parameters may comprise the effective refractive index and loss.
  • the obtaining of the optical parameters may comprise obtaining a matrix for the complex refractive index for the one or more modulator structures from the carrier concentration profile, converting the matrix for the complex refractive index into a matrix for the complex refractive index for the one or more modulator structures, and obtaining the optical parameters for the one or more modulator structures from the optical simulation.
  • the obtaining the optical parameters may be based on a device length of the respective modulator structures and a relevant wavelength.
  • Determining the optical eye diagram of the modulated optical beam may be further based on simulated beam amplitude and phase in the one or more arms of the interferometer associated with the one or more modulator structures respectively.
  • the method may comprise obtaining a time constant r from the AC parameters corresponding to a modulating voltage signal for the one or more modulator structures, and calculating a transient response of the modulating voltage signal for the one or more modulator structures based on a time step chosen according to an operation speed of the one or more modulators.
  • the method may comprise adding random noise to the modulating voltage signal.
  • the modulating voltage signal is converted from a random bit sequence generated using a random bit generator.
  • the method may comprise obtaining an electrical eye diagram based on the transient response of the modulating voltage signal for the one or more modulator structures.
  • the method may comprise calculating amplitude and phase change of the modulated optical beam for the one or more modulator structures using data obtained from the optical simulations.
  • the method may comprise combining the optical beams in the interferometer device using their respective amplitude and phase values, and displaying an output beam intensity by overlapping the optical beams after every period.
  • a method of evaluating system performance of electro-optic devices comprising performing the method of determining an optical eye diagram of a modulated optical beam of an interferometer device as described in the above embodiment with reference to Figure 9.
  • Figure 10 shows a schematic drawing illustrating a system 1000 for determining an optical eye diagram of a modulated optical beam of an interferometer device, according to one embodiment.
  • the system comprises means for obtaining AC parameters for one or more modulator structures of the interferometer device at respective DC bias voltages within a predetermined bias voltage range at an operating frequency of the one or more modulator structures from electrical simulation, 1002, means for obtaining a carrier concentration profile from the electrical simulation, 1004, means for obtaining optical parameters for the one or more modulator structures from optical simulation based on the carrier concentration profile, 1006, and means for determining the optical eye diagram of the modulated optical beam based on the AC parameters and the optical parameters, 1008.
  • the AC parameters may comprise the AC conductance and the AC capacitance.
  • the optical parameters may comprise the effective refractive index and loss.
  • the means for obtaining of the optical parameters, 1006, may be configured to obtain a matrix for the complex refractive index for the one or more modulator structures from the carrier concentration profile, convert the matrix for the complex refractive index into a matrix for the complex refractive index for the one or more modulator structures, and obtain the optical parameters for the one or more modulator structures from the optical simulation.
  • the obtaining the optical parameters may be based on a device length of the respective modulator structures and a relevant wavelength.
  • the means for determining the optical eye diagram of the modulated optical beam, 1008, may be configured to determine the optical eye diagram further based on simulated beam amplitude and phase in the one or more arms of the interferometer associated with the one or more modulator structures respectively.
  • the system may comprise means for obtaining a time constant r from the AC parameters corresponding to a modulating voltage signal for the one or more modulator structures, and means for calculating a transient response of the modulating voltage signal for the one or more modulator structures based on a time step chosen according to an operation speed of the one or more modulators.
  • the means for obtaining the time constant is configured for adding random noise to the modulating voltage signal.
  • the system may comprise means for converting the modulating voltage signal from a random bit sequence generated using a random bit generator.
  • the system may comprise means for obtaining an electrical eye diagram based on the transient response of the modulating voltage signal for the one or more modulator structures.
  • the system may comprise means for calculating amplitude and phase change of the modulated optical beam for the one or more modulator structures using data obtained from the optical simulations.
  • the system may comprise means for combining the optical beams in the interferometer device using their respective amplitude and phase values, and displaying an output beam intensity by overlapping the optical beams after every period.
  • a data storage medium having stored thereon data code means for instructing a computing device to execute the method as described in the above embodiments.
  • the proposed implementations of the methods are able to calculate very accurately the high-speed optical eye diagram performance based on the actual device dimension and dopant topology - an effect which the existing measurement and estimation cannot provide.
  • Embodiments of the present invention permit accurate analysis of the modulated optical signal using MZI type configuration of modulators, giving an unprecedented ability to determine the eye diagram from electrical and optical simulation characteristics of individual modulator components.
  • the methodology in the example embodiments includes obtaining the AC capacitance and conductance from electrical simulations and the effective complex refractive index from optical simulations, which are used to model the phase change and loss induced by each modulator along with the time response determined by the electrical AC parameters.
  • Embodiments of the present invention are suitable for interferometer optical device level analysis as well as system level analysis using characteristics of individual components.
  • Eye diagram determination will be helpful in determining the operation speed of modulators (such as MZI, ring resonators etc) and detectors, DC bias voltages and AC voltage swing.
  • modulators such as MZI, ring resonators etc
  • detectors DC bias voltages and AC voltage swing.
  • the method of example embodiments is very fast and economical for its ability to determine the eye diagram of the modulated beam, compared to the traditional method of measuring the eye diagram from a fabricated device.
  • the code for one example embodiment can handle the different length of modulator arms, different bias voltages and existence of DC phase shifter, if necessary.
  • the code can be adopted in different embodiments for different types of modulator devices (such as electro-refractive, electro-absorptive and electro-optic) and optical systems.
  • the method of example embodiments can be applied to any arbitrary number of modulator arms, lengths and additional DC phase shifters.
  • the method of example embodiments can be applied to MZI configuration of p-i-n modulators to determine the eye diagram of a modulated optical beam. It can determine the eye diagram of modulated the optical beam for any type of modulator(s)/detectors, their length, number of modulating arms, single-ended or double-ended operation for any speed.
  • the method of example embodiments performs substantially better than the traditional way of measuring the eye diagram or approximating the system level simulation of eye diagram without obtaining actual parameters, including actual device dimensions and dopant topology, from simulations of individual components.
  • the method of example embodiments can determine the eye diagram of electro-optic modulator, which in turn translates to cost saving for PRBS generator and high speed oscilloscope by at least $200k for 10 Gbps, which will increase exponentially with higher bit rate.
  • the present specification also discloses an apparatus for performing the operations of the methods.
  • Such apparatus may be specially constructed for the required purposes, or may comprise a general purpose computer or other device selectively activated or reconfigured by a computer program stored in the computer.
  • the algorithms and displays presented herein are not inherently related to any particular computer or other apparatus.
  • Various general purpose machines may be used with programs in accordance with the teachings herein.
  • the construction of a more specialized apparatus to perform the required method steps may be appropriate.
  • the present specification also implicitly discloses a computer program, in that it would be apparent to the person skilled in the art that the individual steps of the method described herein may be put into effect by computer code.
  • the computer program is not intended to be limited to any particular programming language and implementation thereof.
  • the computer program is not intended to be limited to any particular control flow. There are many other variants of the computer program, which can use different control flows without departing from the spirit or scope of the invention. Furthermore, one or more of the steps of the computer program may be performed in parallel rather than sequentially.
  • Such a computer program may be stored on any computer readable medium.
  • the computer readable medium may include storage devices such as magnetic or optical disks, memory chips, or other storage devices suitable for interfacing with a computing device. The computer program when loaded and executed on the computing device effectively results in an apparatus that implements the steps of the preferred method.
  • the invention may also be implemented as hardware modules. More particular, in the hardware sense, a module is a functional hardware unit designed for use with other components or modules. For example, a module may be implemented using discrete electronic components, or it can form a portion of an entire electronic circuit such as an Application Specific Integrated Circuit (ASIC). Numerous other possibilities exist. Those skilled in the art will appreciate that the system can also be implemented as a combination of hardware and software modules.
  • ASIC Application Specific Integrated Circuit

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)

Abstract

La présente invention concerne un procédé et un système de détermination de diagramme d'œil optique d'un faisceau optique modulé de dispositif d'interféromètre, un procédé d'évaluation de l'efficacité de système de dispositifs électro-optiques, et un support de stockage de données ayant stocké sur celui-ci un moyen de code de données destiné à instruire un dispositif informatique pour exécuter les procédés. Le procédé de détermination de diagramme d'œil optique d'un faisceau optique modulé de dispositif d'interféromètre consiste à obtenir des paramètres de courant alternatif (CA) pour une ou plusieurs structures de modulateur du dispositif d'interféromètre à des tensions de polarisation de courant continu (CC) respectives dans une plage de tension de polarisation prédéterminée à une fréquence de fonctionnement de la ou des structures de modulateur par une simulation électrique ; à obtenir un profil de concentration de porteuse par la simulation électrique ; à obtenir des paramètres optiques pour la ou les structures de modulateur par une simulation optique sur la base du profil de concentration de porteuse ; à déterminer le diagramme d'œil optique du faisceau optique modulé sur la base des paramètres CA et des paramètres optiques.
PCT/SG2014/000450 2013-09-19 2014-09-19 Procédé et système de détermination de diagramme d'œil optique d'un faisceau optique modulé de dispositif d'interféromètre WO2015041609A1 (fr)

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SG11201601972XA SG11201601972XA (en) 2013-09-19 2014-09-19 Method and system for determining an optical eye diagram of a modulated optical beam of an interferometer device

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SG201307103-0 2013-09-19

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Cited By (1)

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Publication number Priority date Publication date Assignee Title
CN104821478A (zh) * 2015-05-31 2015-08-05 厦门大学 一种可集成的光模块发送光眼图的自动调试电路

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WO2009134506A2 (fr) * 2008-02-07 2009-11-05 University Of Washington Modulateur tout optique au silicium amélioré
US20100150575A1 (en) * 2008-12-16 2010-06-17 Electronics And Telecommunications Research Institute Method and Optical Transmitter for Optimizing DC Bias Voltage Input to Optical Modulator with Duo-Binary Modulation

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009134506A2 (fr) * 2008-02-07 2009-11-05 University Of Washington Modulateur tout optique au silicium amélioré
US20100150575A1 (en) * 2008-12-16 2010-06-17 Electronics And Telecommunications Research Institute Method and Optical Transmitter for Optimizing DC Bias Voltage Input to Optical Modulator with Duo-Binary Modulation

Non-Patent Citations (1)

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Title
PNG, C.E. ET AL.: "Accurate high-speed eye diagram simulation of silicon-based modulators", PROC. SPIE 8629, SILICON PHOTONICS VIII, vol. 86290S, 14 March 2013 (2013-03-14), pages 86290S - 1 - 86290S-5 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104821478A (zh) * 2015-05-31 2015-08-05 厦门大学 一种可集成的光模块发送光眼图的自动调试电路

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