WO2015014044A1

WO2015014044A1 - Display, test system and test method thereof

Info

Publication number: WO2015014044A1
Application number: PCT/CN2013/087393
Authority: WO
Inventors: 陈敏; 吕本登
Original assignee: 京东方科技集团股份有限公司; 北京京东方显示技术有限公司
Priority date: 2013-07-30
Filing date: 2013-11-19
Publication date: 2015-02-05
Also published as: CN103412420B; CN103412420A

Abstract

A display (20), a test system and a test method thereof are provided. The invention can be used to test the function control panel (202) of the display (20) and the display main panel (201), can save the test time and therefore improves the production efficiency and the device utilization ratio. The test system comprises a test mainframe (10) and the display (20), wherein the display (20) comprises the display main panel (201), the function control panel (202) and a test response component (203). The test mainframe (10) is used to send a test instruction; the display main panel (201) is used to receive the test instruction, convert the test instruction into a control instruction and send the control instruction to the function control panel (202); the function control panel (202) is used to receive the control instruction, and control the test response component (203) to respond.

Description

Display, test system and test method thereof

TECHNICAL FIELD The present invention relates to the field of display technologies, and in particular, to a display, a test system of the display, and a test method thereof. Background technique

With the rapid development of display technology, people are increasingly demanding display screens. Therefore, Philips has developed an Ambiglow technology for the first time, ensuring a stable and clear display, which has resulted in a breakthrough in the display of traditional display devices. The Ambilight technology is to set the LEDs on both sides of the LCD screen.

Emitting Diode, the LED is called the light source. By monitoring the change of the display screen in real time, the LED light source on both sides of the LCD display is driven to display the corresponding color according to the change of the screen content, thereby extending the color of the screen to the outside of the LCD screen, and the brilliance flow breaks through the screen. Limiting, creating a wider range of visual appreciation, can bring the audience an immersive cinema experience; at the same time, the technology can create a soft light environment for the viewer's eyes, reducing the contrast between the display and the surrounding environment. Reduce visual fatigue. In the production process, it is necessary to test the display device with Ambilight function to ensure the quality of the product. In the typical Ambilight function test system in the prior art, the test host is connected to one end of the Ambilight function control board through a serial port adapter board, and the other end of the Ambilight function control board is connected to the LED effect lamp. The specific test process is as follows: The test host issues a control command to the Ambilight control panel, so that the Ambilight control panel controls the LED effect light to emit light according to the control command, thereby completing the test of the Ambilight function. After the test is completed, the Ambilight control panel is assembled into the liquid crystal display. However, during the above test procedure, the Ambilight Control Panel needs to be removed separately for testing. This increases the time required for display testing and assembly and the workload of the tester, which reduces production efficiency and affects the utilization of the equipment. Summary of the invention

Embodiments of the present invention provide a test system and a test method thereof, which can save test Time, which increases productivity and equipment utilization. Embodiments of the present invention adopt the following technical solutions:

In one aspect, a display is provided that includes a display main board, a function control board, and a test response component. The display board receives the test command and converts the test command into a control command and sends the command to the function control board. The function control board receives the control command and controls the test response component to respond. Optionally, the display mainboard includes an instruction conversion module, and the instruction conversion module is configured to convert the test instruction into the control instruction. Optionally, the display comprises a liquid crystal display; and the function control board comprises a Ambilight function control board. Optionally, the test response component comprises a light emitting component, and the light emitting component comprises an LED. In another aspect, a test system is provided that includes the display described above, and a test host. The test host is configured to issue a test command received by the display board. Optionally, in the case that the function control board includes a Ambilight function control board, the test system further includes a serial port adapter board; wherein the test host and the display board pass the serial port adapter board Connected; a light emitting component is disposed at an edge of the display area of the display. Further optionally, the light emitting component is divided into a plurality of test areas, each of which includes a red LED, a green LED, and a blue LED. Further, the test host includes a regional test module and a color separation test module; the regional test module is configured to sequentially issue a regional test command for the multiple test areas; and the color separation test module is used in the In the case where the area test module issues the area test command for one test area, the color separation test command for each color LED of the one test area is sequentially issued. In still another aspect, a test method for the above test system is provided, the test method comprising: testing a host to issue a test command to a display motherboard of the display; The main board receives the test instruction, and converts the test instruction into a control instruction and sends it to the function control board; the function control board receives the control instruction, and controls the test response component to respond. Optionally, the display mainboard converts the test instruction into a control instruction by using an instruction conversion module. Optionally, the test host sends a test command to the display motherboard of the liquid crystal display; the display mainboard receives the test command, and converts the test command into a control command and sends the test command to the Ambilight function control panel; The efficacious function control panel receives the control command and controls illumination of the illuminating component, wherein the illuminating component comprises an LED. Further optionally, the area test module of the test host sequentially issues a regional test command for the plurality of test areas of the light-emitting component, and the color separation test module issues the area test for a test area in the area test module. In the case of an instruction, a color separation test instruction for each color LED of the one test area is sequentially issued, wherein each test area includes a red LED, a green LED, and a blue LED; the display main board receives the area test instruction And the color separation test instruction, and converting the area test instruction and the color separation test instruction into a regional control instruction and a color separation control instruction, and then sent to the Ambilight function control panel; the Ambilight function control panel After receiving the area control command and the color separation control command, the color LEDs in the area are controlled to sequentially emit light for the area of the light-emitting component indicated by the area control command. Embodiments of the present invention provide a display, a test system, and a test method of the test system, the test system including a test host and a display, the display including a display main board, a function control board, and a test response component; wherein, the test The host is configured to issue a test command; the display mainboard receives the test command, and converts the test command into a control command to send to the function control board; the function control board receives the control command, and controls the The test response component responds. According to whether the test response component responds normally, the purpose of testing the corresponding function can be achieved; when the test response component responds normally, it can be concluded that the display motherboard and the function control board are all normal. During this process, since the display main board can convert the test command into a control command, and the function control board controls the test response component to respond by the control command, the disassembly can be performed without disassembly. The test board and the function control board are now tested, thereby saving test time, thereby improving production efficiency and equipment utilization rate.

DRAWINGS

The drawings used in the embodiments or the description of the prior art are described in a single manner. It is obvious that the drawings in the following description are only some embodiments of the present invention, and those of ordinary skill in the art do not pay Other drawings can also be obtained from these drawings on the premise of creative labor.

1 is a schematic structural diagram 1 of a display according to an embodiment of the present invention;

2 is a schematic structural diagram 2 of a display according to an embodiment of the present invention; FIG. 3 is a schematic diagram 1 of a test system according to an embodiment of the present invention; FIG. 4 is a schematic diagram 2 of a test system according to an embodiment of the present invention; 5 is a schematic diagram of a setting position of a light-emitting component according to an embodiment of the present invention; FIG. 6 is a command format of a test command according to an embodiment of the present invention; FIG. 7 is a control command according to an embodiment of the present invention; Instruction format; FIG. 8 is a schematic flowchart diagram of a test method for testing the Ambilight function according to an embodiment of the present invention.

Reference mark:

10-test host; 20-display; 200-liquid crystal display; 201-display main board; 2010- command conversion module; 202-function control board; 203-test response component; 2030-lighting component; 30-serial adapter board. The technical solutions in the embodiments of the present invention are clearly and completely described in the following with reference to the accompanying drawings in the embodiments of the present invention. It is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. example. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments of the present invention without creative efforts are within the scope of the present invention. The embodiment of the present invention provides a display 20, as shown in FIG. 1 and FIG. 2, the display 20 includes a display main board 201, a function control board 202, and a test response component 203.

The display main board 201 is configured to receive a test command, and convert the test command into a control command and send the command to the function control board 202. The function control board 202 is configured to receive the control command and control the The test response component 203 responds. It should be noted that, in the embodiment of the present invention, the display main board 201 and the function control board 202 are disposed inside the display 20, and may be integrated and integrated, or may be independently set to each other. The actual configuration of the display 20 is subject to change and is not limited herein.

Secondly, in the embodiment of the present invention, the test response component 203 is a component corresponding to the control function of the function control board 202; that is, when the function control panel 202 has some control function, A control command issued by the function control board 202 controls the test response component 203 to respond to the function. Here, after the test response component 203 receives the control command sent by the function control board 202, it may respond by an optical signal, an acoustic signal or other identifiable signal; by the response of the device, the Whether the function control board 202 is normal.

Thirdly, in the embodiment of the present invention, the setting position of the test response component 203 is not limited, and may be determined according to the function to be implemented by the test response component 203 after the test is completed.

The embodiment of the present invention provides a display 20, which includes a display main board 201, a function control board 202, and a test response component 203. The display main board 201 is configured to receive the test instruction, and the test is performed. The command conversion is sent to the function control board 202; the function control board 202 is configured to receive the control instruction, and control the test response component 203 to respond; according to whether the test response component 203 is normally responding, For the purpose of testing the corresponding function; when the test response component 203 responds normally, it can be concluded that the display mainboard 201 and the function control board 202 are both normal. In this process, since the display mainboard 201 can convert the test command into a control command, and the function control board 202 controls the test response component 203 to respond by the control command, the display board can be realized without disassembly. 201 and the function control board 202 test, thereby saving test time, thereby improving production efficiency and equipment Rate of utilization.

Optionally, as shown in FIG. 2, the display mainboard 201 includes an instruction conversion module 2010, where the instruction conversion module 2010 is configured to convert the test instruction into the control instruction; for example, the test instruction may be The protocol format is converted to a protocol format required by the control command for controlling the test response component to respond. Optionally, the test response component 203 may be a light emitting component 2030, and the light emitting component 2030 includes an LED light. Optionally, the display 20 may be a liquid crystal display 200, and the function control board 202 may be a Ambilight function control board. The Ambilight function is based on a change in the color of the image displayed by the liquid crystal display 200, and the LED lamp emits light of different colors correspondingly, thereby generating a glare effect. In the embodiment of the present invention, the test command is converted into a control command by the command conversion module 2011 of the display main board 201, and the function control board 202 controls the test response component 203 to respond by the control command, without disassembling. The test of the display main board 201 and the function control board 202 is realized, thereby saving test time, thereby improving production efficiency and equipment utilization rate. The embodiment of the present invention further provides a test system. As shown in FIG. 3, the test system includes a test host 10 and the display 20 described above. The display 20 includes a display main board 201, a function control board 202, and a test response component 203. The test host 10 is configured to send a test command, and the display main board 201 is configured to receive the test command sent by the test host 10, and convert the test command into a control command and send the test command to the function control board. The function control board 202 is configured to receive the control instruction, and control the test response component 203 to respond. It should be noted that the test host 10 may be a computer host or other device with a test function. The embodiment of the present invention provides a test system including a test host 10 and a display 20. The display 20 includes a display main board 201, a function control board 202, and a test response component 203. The test host 10 is used by the test host 10 Issue test instructions; The display main board 201 is configured to receive the test instruction, and convert the test instruction into a control command and send it to the function control board 202; the function control board 202 is configured to receive the control instruction, and control the test The response component 203 responds; according to whether the test response component 203 responds normally, the purpose of testing the corresponding function can be achieved; when the test response component 203 responds normally, it can be concluded that the display mainboard 201 and the function control board 202 are all normal. In this process, since the display main board 201 can convert the test command into a control command, and the function control board 202 controls the test response component 203 to respond by the control command, the display board can be realized without disassembly. 201 and the function control board 202 are tested, thereby saving test time, thereby improving production efficiency and equipment utilization rate. Optionally, for a test system including a Ambilight function display, and the test system is used to test the Ambilight function of the display, as shown in FIG. 4, the display 20 may be a liquid crystal display 200, The test response component 203 may be a light emitting component 2030 disposed at an edge of a display area of the liquid crystal display 200, and the function control panel 202 may be a Ambilight function control panel. At present, the interface of the test host is mainly USB (Universal Serial BUS), and the interface of the liquid crystal display 200 that can cooperate with the light-emitting component 2030 to realize the Ambilight function is mainly a serial port, therefore, for the test host The communication between the display board and the display board 201 of the liquid crystal display 200 is implemented. Referring to FIG. 4, the test host 10 and the display main board 201 of the liquid crystal display 200 are connected through a serial port adapter board 30. 2030 can be a light emitting component that includes an LED light. Further, for the light emitting part 2030, it may be disposed at an edge of a display area of the display. For example, as shown in FIG. 5, it may be disposed on the back surface of the liquid crystal display 200 and adjacent to both side edges of the liquid crystal display 200; and the illuminating function of the light emitting part 2030 and the liquid crystal display 200 The control panels are connected, wherein the Ambilight function control panel can control the light emitting component 2030 to respond by a processor located inside thereof, that is, control the light emitting component 2030 to emit light. Further, the light emitting part 2030 may be divided into a plurality of test areas, each of which includes a red LED light, a green LED light, and a blue LED light. Here, by controlling the red LED lamp, the green LED lamp, and the blue The difference in luminous intensity of the LED lamp allows the light-emitting member 2030 to emit light of various colors, thereby realizing the function of blooming. It should be noted that the number of multiple test areas may be set according to actual conditions, and is not limited herein. Further, the test host 10 may include an area test module and a color separation test module; the area test module is configured to sequentially issue a regional test command for the plurality of test areas; and the color separation test module is used for In the case where the area test module issues the area test command for a test area, a color separation test command for each color LED of the one test area is sequentially issued. Here, for a test area of the light-emitting component 2030, the area test module of the test host 10 issues a zone test command for the test zone, and the color separation test module issues a color separation test command for the test zone, waiting for the test zone After the test is completed, the test in the next test area is performed, and so on. For the color separation test module, the test command may be sequentially issued in the order of sequentially testing the red LED light, the green LED light, and the blue LED light, or may be other sequences, which is not limited herein.

The embodiment of the present invention provides a test system for the Ambilight function, the test system includes a test host 10, a serial port adapter board 30, and a liquid crystal display 200. The liquid crystal display 200 includes a display motherboard 201 and a glare function. a control board and a light emitting part 2030; wherein, the test host 10 includes a zone test module and a color separation test module, the display main board 201 includes an instruction conversion module, and the light emitting part 2030 is divided into a plurality of test areas, each of which includes a red LED The lamp, the green LED lamp and the blue LED lamp; respectively, the area test module and the color separation test module of the test host 10 respectively issue a regional test command and a color separation test command, and reach the display main board 201 of the liquid crystal display 200 via the serial port adapter plate 30. After that, the command conversion module of the display mainboard 201 converts into a corresponding control command, thereby controlling the light-emitting component 2030 to sequentially test the red LED light, the green LED light, and the blue LED light of each test area, according to the test result. Aiming at the purpose of testing the Ambilight function, when the light-emitting component 2030 is In response, the motherboard 201 can be obtained and the function display panel 202 were normal. In the process, since the display mainboard 201 can convert the test command into a control command, and the Ambilight function control board controls the light-emitting component 2030 to respond by the control command, the The test board 201 and the function control board 202 are tested, thereby saving test time, thereby improving production efficiency and equipment utilization rate. The embodiment of the present invention further provides a test method for the above test system, the test method includes: the test host 10 sends a test command to the display main board 201 of the display 20; the display main board 201 receives the test command, and The test command is converted to a control command and sent to the function control board 202; the function control board 202 receives the control command and controls the test response component 203 to respond. According to whether the test response component 203 responds normally, the purpose of testing the corresponding function can be achieved; when the test response component 203 responds normally, it can be concluded that the display mainboard 201 and the function control board 202 are all normal. In this process, since the display mainboard 201 can convert the test command into a control command, and the function control board 202 controls the test response component 203 to respond by the control command, the display board can be realized without disassembly. 201 and the function control board 202 are tested, thereby saving test time, thereby improving production efficiency and equipment utilization rate. Optionally, the display mainboard 201 can convert the test instruction into a control instruction by using an instruction conversion module. Optionally, referring to FIG. 4, when the test system includes a display function of a Ambilight function, and the test system is used to test the Ambilight function of the display, the test method includes: the test host 10 The display mainboard 201 of the liquid crystal display 200 issues a test command; the display mainboard 201 receives the test command, and converts the test command into a control command and sends it to the Ambilight function control panel; the Ambilight function control panel receives The control command controls the light emitting part 2030 to emit light; the light emitting part 2030 herein may be a light emitting part including a red LED light, a green LED light, and a blue LED light. The test host 10 and the display main board 201 of the liquid crystal display 200 can be connected through a serial port adapter board 30, that is, communication between the two is realized through the serial port adapter board 30. The display main board 201 converts the test instruction into a control instruction by an instruction conversion module. After the Ambilight function control board receives the control command, the control command is parsed and transmitted to the hardware layer to drive the light emitting part 2030 to emit light. The test host 10 issues a test command to the display main board 201 of the liquid crystal display 200. The instruction format is as shown in FIG. 6, and can be transmitted by a two-byte system code, a one-byte protocol data length, and one byte command. Direction, one-byte factory code, one-byte command code, n-byte transfer data, and one-byte check code. The system code is two bytes of fixed data, indicating that the instruction is used for the Ambilight function test; the protocol data length is used to indicate the number of bytes in the instruction except the system code and the check code; Used to indicate whether the instruction writes data to or from the display motherboard 201; the factory code is fixed data to indicate that the instruction is applicable to a particular client; the command code is used to indicate that the instruction needs to be executed Function; data is used to represent the information carried by the instruction; the check code is a value obtained by XORing the byte data other than the check code in the instruction. After the display board 201 of the liquid crystal display device 20 receives the test command, the test command is parsed and converted into a control command for the Ambilight function, and sent to the Ambilight function control panel; For the control instruction, the instruction format is as shown in FIG. 7, and may be composed of one byte system code, one byte command code, and five bytes of data. That is, the n bytes of transmission data in the test command are processed and converted into 5 bytes of data in the control command. Here, after receiving the test command, the display conversion module 2010 generates a control instruction according to the instruction format shown in FIG. 6, the control instruction is corresponding to a system code of a fixed byte and a command code of the test instruction. The command code of the control command having the same function meaning and the transmission data of the test command are composed of the transmission data that needs to be forwarded to the Ambilight function control board. Since the test instruction is sent by an external device, that is, the test host, if the instruction format is too simple, there is a risk of being easily cracked, so the test instruction is complicated; however, the test command is converted into the In the process of controlling the command, the control command is transmitted between the display main board 201 and the Ambilight function control board, that is, transmitted inside the liquid crystal display 20, and there is no external interference, so After the test command is processed and compressed into a single control command, the complexity of the program can be reduced, and the control command can be made more compact. Further, the testing method includes: testing the area of the test host 10 The module sequentially issues an area test command for the plurality of test areas of the light emitting part 2030, and the color separation test module sequentially issues the one for the one area in the case where the area test module issues the area test instruction for one test area a color separation test instruction of each color LED lamp of the test area; the display main board 201 receives the area test instruction and the color separation test instruction, and converts the area test instruction and the color separation test instruction into regional control And the instruction and the color separation control instruction are sent to the Ambilight function control panel; after the Ambilight function control panel receives the area control instruction and the color separation control instruction, the illumination component indicated by the area control instruction In the area of 2030, the LED lights of the respective colors in the area are controlled to sequentially emit light. The LEDs of the respective colors in the area are controlled to sequentially emit light. The LEDs may be sequentially illuminated in the order of controlling the red LEDs, the green LEDs, and the blue LEDs, or may be other sequences, which are not limited herein.

The test process for the Ambilight function is described below by taking a test system for the Ambilight function as an example, wherein the test system includes a test host 10, a liquid crystal display 200, and a serial port adapter plate 30; The display main board 201, the Ambilight function control board and the light emitting part 2030; wherein, the test host 10 includes a zone test module and a color separation test module, the display main board 201 includes an instruction conversion module, and the light emitting part 2030 includes a plurality of test areas, each The test areas include red, green and blue LEDs. As shown in FIG. 8, the testing method includes the following steps: S101: The test host 10 issues an instruction to turn on the Ambilight test mode, and reaches the display mainboard 201 via the serial port adapter board 30.

S102. The display mainboard 201 receives the instruction to open the Ambilight test mode, and after parsing and converting, sends the instruction to the Ambilight function control panel, and the Ambilight function control panel turns on the Ambilight test mode. . S103. The test host 10 sends a regional test command and a color separation test command through the area test module and the color separation test module, and reaches the display main board 201 via the serial port adapter board 30. The area test module sequentially issues a region test command for the plurality of test areas of the light-emitting component 2030; and the color separation test module sequentially issues the region test command for the test region when the region test module issues the test command For the one test The color separation test command for the red, green, and blue LEDs in the test area.

5104. After receiving the area test command and the color separation test command issued by the test host 10 and parsing, the display main board 201 converts the area test command and the color separation test command into an instruction conversion module by the display main board 201. The area control command and the color separation control command are sent to the Ambilight function control board.

After receiving and parsing the area control instruction and the color separation control instruction, the Ambilight function control board 202 sequentially controls the red LED of the current test area in the current test area of the light-emitting part 2030 indicated by the area control instruction. Green LED lights and blue LED lights illuminate. S106. After testing the red LED light, the green LED light, and the blue LED light in the current test area, determine whether the current test area is the last test area. If not, go to S103 to test the next test area. If yes, go to S107.

5107. The test host 10 issues an instruction to turn off the Ambilight test mode.

5108. The display mainboard 201 is sent to the Ambilight function control panel 202 after the instruction to receive the off Ambilight test mode is parsed and converted, and the Ambilight function is turned off by the Ambilight function control panel 202. mode. According to the above process, the purpose of testing the Ambilight function can be achieved. When the red LED light, the green LED light, and the blue LED light of each test area of the light emitting part 2030 are normally responded according to the command, it can be obtained. Both the display main board 201 and the function control board 202 are normal. In this process, since the display main board 201 and the function control board 202 are both disposed inside the display 20, testing of the display main board 201 and the function control board 202 can be realized without disassembly, thereby saving test time and thereby improving Production efficiency and equipment utilization rate. The above is only the specific embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily think of changes or substitutions within the technical scope of the present invention. It should be covered by the scope of the present invention. Therefore, the scope of the invention should be determined by the scope of the appended claims.

Claims

claims

1. A display, including a display mainboard, a function control board and a test response component; wherein, the display mainboard receives test instructions and converts the test instructions into control instructions and sends them to the function control board;

The function control board receives the control instruction and controls the test response component to respond.

2. The display according to claim 1, wherein the display mainboard includes an instruction conversion module, and the instruction conversion module is used to convert the test instructions into the control instructions.

3. The display according to any one of claims 1-2, wherein the display includes a liquid crystal display; and the function control panel includes an Ambilight function control panel.

4. The display according to any one of claims 1 to 3, wherein the test response component includes a light-emitting component, and the light-emitting component includes a light-emitting diode (LED).

5. A test system, including the display according to any one of claims 1 to 4, and a test host;

Wherein, the test host is used to issue test instructions received by the display mainboard.

6. The test system according to claim 5, wherein, when the function control board includes an Ambilight function control board, the test system further includes a serial port adapter board; wherein, the test host and the The display mainboard is connected through the serial port adapter board; the light-emitting component is arranged at the edge of the display area of the display.

7. The test system according to claim 6, wherein the light-emitting component is divided into multiple test areas, and each test area includes a red LED, a green LED, and a blue LED.

8. The test system according to claim 7, wherein the test host includes a regional test module and a color separation test module;

The area test module is used to issue area test instructions in sequence for the multiple test areas;

The color separation test module is configured to sequentially issue color separation test instructions for each color LED of the one test area when the area test module issues a regional test instruction for a test area.

9. A testing method for the testing system according to any one of claims 5 to 8, include:

The test host sends test instructions to the display motherboard of the monitor;

The display mainboard receives the test command, converts the test command into a control command and sends it to the function control board;

10. The testing method according to claim 9, wherein the display mainboard converts the test instructions into control instructions through an instruction conversion module.

11. The test method according to claim 9, wherein, when the function control board includes an Ambilight function control board, the test host issues a test instruction to the display mainboard of the liquid crystal display;

The display mainboard receives the test command, converts the test command into a control command and sends it to the Ambilight function control board;

The Ambilight function control board receives the control instruction and controls the light-emitting component to emit light, where the light-emitting component includes a light-emitting diode (LED).

12. The test method according to claim 11, wherein the area test module of the test host sequentially issues area test instructions for multiple test areas of the light-emitting component, and the color separation test module issues the area test instructions when the area test module In the case of a regional test instruction for a test area, color separation test instructions for each color LED of the test area are issued in sequence, where each test area includes a red LED, a green LED, and a blue LED;

The display mainboard receives the area test instruction and the color separation test instruction, converts the area test instruction and the color separation test instruction into an area control instruction and a color separation control instruction, and then sends them to the Ambilight function control plate;

After receiving the area control instruction and the color separation control instruction, the Ambilight function control panel controls the area of the light-emitting component indicated by the area control instruction to control the LEDs of each color in the area to emit light in sequence.