WO2014047203A1 - Pulse width controller - Google Patents
Pulse width controller Download PDFInfo
- Publication number
- WO2014047203A1 WO2014047203A1 PCT/US2013/060451 US2013060451W WO2014047203A1 WO 2014047203 A1 WO2014047203 A1 WO 2014047203A1 US 2013060451 W US2013060451 W US 2013060451W WO 2014047203 A1 WO2014047203 A1 WO 2014047203A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- wave plate
- beam splitter
- axis
- polarizing beam
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/352—Working by laser beam, e.g. welding, cutting or boring for surface treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/0604—Shaping the laser beam, e.g. by masks or multi-focusing by a combination of beams
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/062—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
- B23K26/0622—Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam by shaping pulses
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/064—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
- B23K26/0643—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms comprising mirrors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/064—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
- B23K26/0648—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms comprising lenses
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
- G02B27/286—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising for controlling or changing the state of polarisation, e.g. transforming one polarisation state into another
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/005—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping
- H01S5/0057—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping for temporal shaping, e.g. pulse compression, frequency chirping
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
- G02B27/283—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising used for beam splitting or combining
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/005—Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping
- H01S3/0057—Temporal shaping, e.g. pulse compression, frequency chirping
Definitions
- Embodiments described herein relate to apparatus and methods of laser thermal processing. More specifically, apparatus and methods described herein relate to a pulse width controller incorporated in a laser thermal processing apparatus.
- Thermal processing is commonly practiced in the semiconductor industry. Semiconductor substrates are subjected to thermal processing in the context of many transformations, including doping, activation, and annealing of gate source, drain, and channel structures, siliciding, crystallization, oxidation, and the like. Over the years, techniques of thermal processing have progressed from simple furnace baking, to various forms of increasingly rapid thermal processing such as RTP, spike annealing, and laser annealing.
- laser annealing processes use laser emitters that may be semiconductor or solid state lasers with optics that focus, defocus, or variously image the laser light into a desired shape.
- a common approach is to image the laser light into a line or thin rectangle image. The laser light is scanned across a fixed substrate or the substrate is scanned beneath the laser light to process the entire surface of the substrate.
- a optical system for controlling width of an energy pulse, and an apparatus including such an optical system are disclosed.
- the optical system features a rotatable wave plate that outputs oriented radiation to a polarizing beam splitter. Radiation transmitted by the polarizing beam splitter is routed through an optical circuit that has a second rotatable wave plate. Radiation from the second rotatable wave plate is routed back to the polarizing beam splitter along the axis of light originally reflected by the polarizing beam splitter. The first rotatable wave plate is rotated to control the fraction of radiation that enters the optical circuit, and the second rotatable wave plate is rotated to control the fraction of radiation in the optical circuit that exits through the polarizing beam splitter.
- optical circuits may be nested in and/or pendant from a first optical circuit, each with its input and output optical gates.
- Optical delay legs may also be used in some embodiments to add further delay components.
- the optical system described above may be included in a thermal processing apparatus featuring an energy source that produces radiant energy in pulses or continuous wave.
- the energy that has been routed through the pulse width controller is directed to an optical system for adjusting the spatial or temporal profile of the energy, such as a homogenizer, etalon, or fiber bundle.
- the energy may then be directed to an aperture to trim non-uniform edges, and then to a substrate to thermally process the substrate.
- Figure 1 is a schematic diagram of a pulse width controller according to one embodiment.
- Figure 2 is a schematic diagram of a pulse width controller according to another embodiment.
- Figure 3 is a schematic diagram of a pulse width controller according to another embodiment.
- Figure 4 is a plan view of a thermal processing system according to another embodiment.
- Figure 5 is a graph showing pulse intensity as a function of time for an energy pulse processed using apparatus and methods of Figure 1 -4.
- FIG. 1 is a schematic diagram of a pulse width controller 100 according to one embodiment.
- the pulse width controller 100 has a first rotatable wave plate 102, comprising a first wave plate 1 14 and a first actuator 1 16, optically coupled to a polarizing beam splitter 104.
- the polarizing beam splitter 104 has an optically active surface 106 that reflects a portion of incoming electromagnetic radiation along a reflecting axis 126 and transmits a portion of the incoming electromagnetic radiation along a transmitting axis 128.
- the position of the first wave plate 1 14, as rotated by the first actuator 1 16, determines the polarization axis of the radiation incident upon the polarizing beam splitter 104, and the angle of the polarization axis of the incident radiation, compared with the polarizing angle of the optical surface 106, determines the degree of reflection and transmission.
- the transmitted radiation 128 is routed to an optical circuit 136 that delivers a return radiation 134 to the polarizing beam splitter along the reflecting axis 126.
- At least a first reflector 108 and a second reflector 1 10 make up the optical circuit 136.
- the first reflector 108 is disposed along the transmitting axis 128 of the polarizing beam splitter 104, faces a first deflection direction 138, and propagates a first deflected radiation along a first deflection axis 130.
- the second reflector 1 10 is positioned to receive radiation originating from the first reflector 108, faces a second deflection direction 140, and propagates a second deflected radiation 132 along the reflecting axis 126 of the polarizing beam splitter 104. This may be done using only two reflectors in some embodiments, while in other embodiments more reflectors may be disposed in the optical circuit.
- a third reflector (not shown) is positioned along the first deflection axis 130 and propagates radiation along a third deflection direction to the second reflector, with the angles of the reflectors suitably adjusted to align the radiation along the reflecting axis 126.
- a second wave plate 1 18 is disposed in the optical circuit 136 at any desired point.
- the second wave plate 1 18 may be disposed along the transmitting axis 128 between the polarizing beam splitter 104 and the first reflector 108, along the first deflection axis 130, along the reflecting axis 126 between the polarizing beam splitter 104 and the second reflector 1 10, or at any position in the optical circuit 136 between the first reflector 108 and the second reflector 1 10.
- the second wave plate 1 18 may be a second rotatable wave plate 1 12, comprising the second wave plate 1 18 and a second actuator 120, if desired.
- the second wave plate 1 18 rotates the polarization axis of the second deflected radiation 132 by 90°, such that the return radiation 134 will pass through the optically active surface 106 of the polarizing beam splitter 104.
- the return radiation 134 thus propagates along the reflecting axis 126 slightly later than the radiation originally reflected along the reflecting axis 126 by the transit time of the optical circuit 136. If the transit time of the optical circuit 136 is less than the time duration of the incident pulse, the radiation reflected along the reflection axis 126 and the return radiation 134 will overlap to form a single extended pulse.
- the extent of the broadening may be controlled by setting the first rotatable wave plate 102.
- the resulting pulse will be broadened only slightly with a decay tail added by the circulated portion of the incident pulse. If the difference is nearly zero, the resulting pulse will be substantially delayed by the circuit transit time and slightly broadened with a rise tail created by the initially reflected radiation. If the difference is substantially far from either extreme (0° or 90°), the resulting pulse will be broadened and will be bimodal, with the intensities of the two peaks determined by the phase difference.
- the second wave plate 1 18 may have a polarization angle that does not align with the polarization angle of the optically active surface 106.
- the return radiation 134 will be partially transmitted and partially reflected at the optically active surface 106, depending on the phase angle difference between the wave plate 1 18 polarization angle and the polarization angle of the optically active surface 106.
- a plurality of pulses will then emerge as the radiation circulates around the optical circuit 136, and the intensity of each pulse will be a function of the angles of the first wave plate 1 14 and the second wave plate 1 18.
- the second wave plate 1 18 may be coupled to a second actuator 120 to form a second rotatable wave plate 1 12, so the angle of the second wave plate 1 18 may be adjusted.
- a pulse of electromagnetic radiation incident on the pulse width controller may be divided into two or more pulses propagating along the reflecting axis 126.
- the pulse width of the incident pulse may be effectively controlled by the pulse width controller 100 if the transit time of the optical circuit 136 is substantially less than the time duration of the incident pulse. For example, for an 8 nsec energy pulse, an optical circuit having a transit time substantially less than 8 nsec, such as a total length less than about 240 cm, for example a total length between about 100 cm and about 200 cm, will afford a single pulse having a tunable pulse width.
- a controller 122 may be coupled to the actuators 1 16 and 120 to control the relative phase angles of the two wave plates 1 14 and 1 18.
- Actuators may be deployed to adjust the length of the optical circuit 136.
- a first actuator 144 is coupled to the first reflector
- each of the first and second actuators 144 and 142 may be a linear and rotational actuator, or one of the first actuator 144 or the second actuator 142 may be a linear and rotational actuator while the other is a rotational actuator only.
- two adjacent reflectors of the optical circuit may be coupled to a support that is moved by a linear actuator to adjust the length of the optical circuit.
- Adjusting the length of the optical circuit may provide fine control over the temporal profile and width of a combined pulse.
- the controller 122 may be programmed to control an energy source to produce pulses 124 having a desired duration and periodicity, to control rotation of the wave plates 102 and 1 12 to control replication and splitting of the pulses, and to control the length of the optical circuit 136 using the actuators 144 and 142 to produce a wide variety of shaped energy pulses.
- the pulse width controller 100 may alter the frequency of pulses in a pulse train, for example by doubling the frequency.
- pulse amplitude is typically lowered by interaction with the pulse width controller 100 if the optical circuit 136 has a transit time less than the periodicity of the pulses.
- the pulse width controller 100 may be tuned to function as a pulse amplifier by delaying pulses such that a first pulse travels through the optical circuit 136 and emerges in co-propagating relation to a second incident pulse partially reflected by the polarizing beam splitter 106.
- FIG. 2 is a schematic diagram of a pulse width controller 200 according to another embodiment.
- the pulse width controller 200 features many of the same components as the pulse width controller 100.
- the pulse width controller 200 has a first optical circuit 202 and a second optical circuit 208 nested within the first optical circuit 202.
- the rotatable wave plate 102 and the polarizing beam splitter 104 control radiation admitted into the first optical circuit 202, as with the pulse width controller 100 of Figure 1 , but a second polarizing beam splitter 206 is positioned between the first reflector 108 and the second reflector 1 10 of the first optical circuit 202.
- the second polarizing beam splitter 206 reflects a portion of incident electromagnetic radiation along a second reflecting axis 216 and transmits the remainder along a second transmitting axis 218, the fraction reflected and transmitted being dependent on the relative polarization angles of the second polarizing beam splitter 206 and a third rotatable wave plate 204 which, in alternate embodiments, may be non-rotatable.
- the transmitted radiation is circulated around the second optical circuit 208 by a third reflector 214 and a fourth reflector 212 and through a fourth wave plate 210, which may be a rotatable wave plate, as described above.
- a fourth wave plate 210 which may be a rotatable wave plate, as described above.
- the second optical circuit 208 further broadens the radiation propagating within the first optical circuit 206 according to similar effects. If the transit time of the second optical circuit 208 is less than the time duration of the energy pulse incident on the second polarizing beam splitter 206, the radiation that propagates along the second reflecting axis 216 will propagate as a broadened pulse, which will further broaden the radiation ultimately propagating along the first reflecting axis.
- the four wave plates 102, 1 12, 204, and 210 may be independently controlled to produce a radiation pulse along the first reflecting axis 126 that has a much broader range of temporal shapes and durations than are available with a single optical circuit.
- Pulse width control circuits may be nested, as the second optical circuit 208 is nested within the first optical circuit 202, to any desired depth. Alternately, or additionally, pulse width control circuits such as the second optical circuit 208 may be proliferated in series around the first optical circuit 202. Any combination of serial and nested pulse width control circuits may be employed to achieve a desired control over pulse width, and all actuated wave plates may be controlled by a controller to provide precise control over the pulse shape and duration.
- the pulse width controller 200 has an actuator 222 coupled to a support
- the actuator 220 for moving portions of the first optical circuit 202 and all of the second optical circuit 208 to control overall transit time of the optical circuit 202. Because the optical circuit 202 is arranged according to a rectilinear configuration, the actuator
- the 222 may adjust the length of the optical circuit 202 by moving coaxial components of the optical circuit 202 in a direction perpendicular to their common optical axis.
- the second optical circuit 208 is coupled to the support 220 to maintain alignment with the actuated components of the first optical circuit 202.
- the first reflector 108, the third reflector 212, the fourth reflector 214, the third wave plate 204, the fourth wave plate 210, and the second polarizing beam splitter 206 are all coupled to the support 220 and the actuator 222 adjusts a distance between the first polarizing beam splitter 104 and the first reflector 108 and a distance between the second polarizing beam splitter 206 and the second reflector 1 10 to adjust length of the optical circuit 202.
- an alternate embodiment may couple the second reflector 1 10 and all components of the second optical circuit 208 to a support to adjust a distance between the third wave plate 204 and the second polarizing beam splitter 206 and a distance between the second reflector 1 10 and the second wave plate 1 12 to adjust length of the optical circuit 202.
- a controller 230 is coupled to the wave plates 102, 1 12, 204, and 210, and to the actuator 222, to control the performance of the pulse width controller 200.
- FIG. 3 is a schematic diagram of a pulse width controller 300 according to another embodiment.
- the pulse width controller 300 of Figure 3 features the same entrance regulating features, the rotatable wave plate 102 and the polarizing beam splitter 104, with a different optical circuit 302.
- the optical circuit 302 features delay legs 304 interposed along the optical circuit 302 to add transit time and subdivisions to the optical circuit 302, if desired.
- Each delay leg 304 features a partial reflector 306 and a full reflector 308, and one delay leg 304 may be optically coupled to another delay leg 304 to increase the pulse-broadening effect of the optical circuit 302.
- the pulse width controller 300 has four delay legs 304A, 304B, 304C, and 304D.
- Radiation incident at partial reflector 306A is partially reflected toward the partial reflector 306D and partially transmitted toward the partial reflector 306B. Radiation incident at partial reflector 306B is partially reflected toward partial reflector 306C and partially transmitted toward two full reflectors 310 and 312 that direct the radiation around to partial reflector 306C. The radiation incident at partial reflector 306C from full reflector 312 is partially reflected toward full reflector 304C and partially transmitted toward the partial reflector 306D. Radiation reflected toward the full reflector 304C is reflected back toward the partial reflector 306C, which subdivides the radiation further.
- the radiation circulating and counter- circulating within the optical circuit 302 is attenuated into a smeared-out pulse that is subjected to the polarization angle of the wave plate 314, which may be a rotatable wave plate similar to the rotatable wave plate 102, producing the same transmission/recirculation effect at the polarizing beam splitter 104.
- the delay legs 304 introduce transit time and counter-circulation to the optical circuit 302 that is not present in the optical circuits 136, 202, and 208, but at the expense of some energy loss.
- the various reflective and refractive surfaces scatter a small amount of incident radiation, so the combined effect of many delay legs may result in power losses that are more than desired.
- delay legs such as the delay legs 304 may be used in combination with auxiliary optical circuits such as those described above in connection with Figure 2.
- auxiliary optical circuits such as those described above in connection with Figure 2.
- a rotatable wave plate and polarizing beam splitter may be positioned along the optical axis between the full reflector 310 and the full reflector 312 to anchor an optical circuit such as the optical circuit 208, if desired.
- the combination of optical circuits and delay legs may provide expanded options for tailoring of pulse widths and energy profiles.
- FIG. 4 is a plan view of a thermal processing apparatus 400 according to another embodiment.
- a radiant energy source 402 produces a directed radiant energy field that propagates along a first optical axis 414.
- the directed radiant energy field enters a pulse width controller such as the pulse width controller 100, and emerges along a second optical axis 416 having a tailored temporal profile, as described above.
- the pulse width controllers 200 and 300, and other embodiments of pulse width controllers described herein, may also be used.
- the radiant energy emerging from the pulse width controller 100 enters an optical system 404 that further shapes the radiant energy field according to the needs of the application.
- the optical system 404 may feature lenses, filters, prisms, partial and total reflectors, such as mirrors and retroreflectors, etalons, fiber optics, and similar components, to transform the radiant energy field in particular ways.
- the optical system 404 may feature one or more arrays of lenses that overlap portions of the radiant energy field to form a blended, or homogenized, image with reduced spatial variation.
- the optical system 404 may also feature differential delay optics such as fiber bundles and etalons to reduce coherence in the radiant energy field. The differential delay optics may also be effective to reduce variation in the temporal profile of the energy field emerging from the pulse width controller 100.
- the radiant energy emerges from the optical system 404 along a third optical axis 418 to encounter an aperture 406.
- the aperture 406 trims the radiant energy field to a desired shape and removes edge nonuniformities of the radiant energy field.
- the resulting energy emerges along a fourth optical axis 420, and is directed toward a substrate support 410 by any suitable steering optic 408, such as a mirror, or any system of reflective and refractive optics for directing the radiant energy toward the substrate support 410.
- the radiant energy generally approaches the substrate support 410 along a fifth optical axis 422, which may be generally perpendicular to the plane of a substrate support surface 424 of the substrate support 410, or may be inclined at a desired angle.
- the angle of incidence of the fifth optical axis 422 with respect to the substrate support surface 424 is typically between about 85° and about 90°, usually about 90°.
- a substrate positioned on the substrate support 410 is subjected to the radiant energy for thermal or optical processing. If the radiant energy field does not cover the entire substrate, the substrate support 410 may be movable in a plane defined by the substrate support surface 424 of the substrate support 410. A precision x-y stage may be used for such purposes.
- a first treatment zone may be positioned in the path of the fifth optical axis 422, and after processing the substrate may be moved in the plane parallel to the substrate support surface 424 such that a second treatment zone is positioned in the path of the fifth optical axis 422 for processing. This process may be repeated until all desired areas of the substrate are processed.
- Figure 4 depicts a substrate resting on a substrate support and facing upward toward the fifth optical axis 422, the substrate may be oriented vertically, or substantially vertically, and may be positioned above the fifth optical axis 422.
- the substrate support 410 may be oriented at any desired angle.
- the energy source 402 may be a pulsed energy source or a continuous wave energy source.
- the energy source 402 may emit radiant energy having any desired coherence and any desired frequency.
- the pulse width control methods and apparatus described herein are not substantially different for radiation having a broad spectral range, spectral distribution range, and coherency range.
- Continuous wave and pulse lasers may be used, individually or in combination, to produce desired temporal profiles of pulsed energy having any spectral characteristics or combination thereof.
- the apparatus described herein are also embodiments of novel methods.
- the temporal profile of an incident pulse of radiant energy may be effectively controlled by splitting the pulse into a first sub-pulse and a second sub-pulse using differential polarity, routing the second sub-pulse through an optical circuit to delay propagation of the second sub-pulse relative to the first sub-pulse, and releasing the second sub-pulse after a delay to propagate along the same axis as the first sub- pulse. If the delay of the optical circuit is substantially less than a duration of the incident pulse, the two sub-pulses emerge in an overlapping temporal relationship, effectively producing a broadened pulse.
- the optical circuit is constructed using reflectors that route the second sub-pulse around a polygonal path so that the second sub-pulse returns to the location at which it was divided from the first sub- pulse.
- the differential polarity may be provided using a wave plate that is rotated to control the polarization angle of the incident pulse.
- the incident pulse is directed to a polarizing beam splitter that reflects a portion of the incident pulse, depending on the difference in polarity alignment of the incident pulse and the polarizing beam splitter, to form the first sub-pulse.
- the unreflected portion is transmitted into the optical circuit as the second sub-pulse.
- the second sub-pulse may be further subdivided to broaden the resulting recombined pulse further.
- differential polarity may again be employed to split the second sub-pulse into further sub-pulses, one of which transits the optical circuit again.
- an energy pulse with a long decay may be formed as a series of time overlapping, decaying amplitude, sub- pulses.
- the temporal shape of the resulting pulse may be adjusted by adjusting the relative phases of the differential polarity applicators with respect to the polraity of the polarizing beam splitter.
- the length of the optical circuit may also be adjusted along with the polarizers to afford further control over the shape of the resulting pulse.
- a train of regular energy pulses with simple periodicity may be transformed in complex ways by changing periodicity and amplitude of the resulting pulses by routing the pulses through a differential polarity delay circuit as described herein.
- the fractions reflected and transmitted at each beam splitter, and the length of the delay circuit may be controlled relative to duration and periodicity of the incident pulse train to produce a wide variety of complex patterns of periodicity, amplitude, and temporal profile.
- a train of energy pulses having complex periodicity and amplitude patterns may be folded into a pulse train having a wide variety of characteristics from very regular to extremely irregular depending on architecture and tuning of the optical circuity used to subdivide and recombine the pulses.
- a very irregular train of pulses may be effectively regulated by tuning the optical circuit to produce sub-pulses that substantially overlap in a regular manner.
- Figure 5 is a graph showing pulse intensity as a function of time for an energy pulse processed using apparatus and methods of Figures 1 -4.
- the temporal profile of the incident energy pulse is shown at 502, and the temporal profile of the resultant energy pulse is shown at 504 after passing through a pulse width controller according to an embodiment described herein.
- the amplitudes of the two profiles are not represented on the same scale, so that the general shape of each profile is distinguishable from the other.
- the time evolution of each profile is plotted on the same scale, however, to demonstrate that the incident pulse has been made longer in time by passing through a pulse width controller according to an embodiment described herein.
- FIG. 6 is a a schematic diagram of a pulse width controller 600 according to another embodiment.
- the pulse width controller 600 is similar in many respects to the pulse width controller 100 of Figure 1 , as demonstrated by repetition of reference numerals in Figure 6.
- the pulses 124 encounter a selective reflector 606 on a transmissive surface 608 thereof.
- the pulses 124 pass through the selective reflector 606 and enter the optical circuit 136.
- the second deflected radiation 132 after passing through the second rotatable wave plate 1 12 encounters the optically active surface 106 that reflects an exit pulse 602 and transmits a circulation pulse 604 that is recycled around the optical circuit 136.
- the alternative entry configuration of the pulse width controller 600 may likewise be used in the pulse width controllers 200 and 300, as well.
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Laser Beam Processing (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Lasers (AREA)
- Mechanical Light Control Or Optical Switches (AREA)
- Recrystallisation Techniques (AREA)
Description
Claims
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SG11201501569TA SG11201501569TA (en) | 2012-09-20 | 2013-09-18 | Pulse width controller |
| KR1020157010130A KR102201000B1 (en) | 2012-09-20 | 2013-09-18 | Pulse width controller |
| US14/429,597 US10376991B2 (en) | 2012-09-20 | 2013-09-18 | Pulse width controller |
| CN201380048129.3A CN104641458B (en) | 2012-09-20 | 2013-09-18 | Pulse width controller |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261703487P | 2012-09-20 | 2012-09-20 | |
| US61/703,487 | 2012-09-20 | ||
| US13/796,249 | 2013-03-12 | ||
| US13/796,249 US10114157B2 (en) | 2012-09-20 | 2013-03-12 | Pulse width controller |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2014047203A1 true WO2014047203A1 (en) | 2014-03-27 |
Family
ID=50273398
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2013/060451 Ceased WO2014047203A1 (en) | 2012-09-20 | 2013-09-18 | Pulse width controller |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US10114157B2 (en) |
| KR (1) | KR102201000B1 (en) |
| CN (3) | CN105710530B (en) |
| SG (2) | SG11201501569TA (en) |
| TW (3) | TWI638253B (en) |
| WO (1) | WO2014047203A1 (en) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9785050B2 (en) * | 2015-06-26 | 2017-10-10 | Cymer, Llc | Pulsed light beam spectral feature control |
| US9971159B2 (en) * | 2016-10-19 | 2018-05-15 | Coherent, Inc. | Reflective laser line-beam generator |
| CN106773026A (en) * | 2016-11-29 | 2017-05-31 | 北京长城牡丹模具制造有限公司 | A kind of series connection for producing optical delay line swings plane-parallel mirror structure |
| CN110692283B (en) * | 2017-05-30 | 2023-09-19 | Asml荷兰有限公司 | radiation source |
| CN107390355B (en) * | 2017-08-04 | 2019-08-20 | 武汉华星光电技术有限公司 | Change the device of optical pulse waveform |
| KR102584252B1 (en) | 2019-06-10 | 2023-10-05 | 삼성디스플레이 주식회사 | Laser annealing apparatus |
| US11557692B2 (en) | 2019-06-11 | 2023-01-17 | Meta Platforms Technologies, Llc | Selectively bonding light-emitting devices via a pulsed laser |
| CN111025665B (en) * | 2019-12-29 | 2020-11-03 | 中国科学院西安光学精密机械研究所 | a time shaper |
| JP7583571B2 (en) | 2020-10-15 | 2024-11-14 | Jswアクティナシステム株式会社 | Laser irradiation device, laser irradiation method, and semiconductor device manufacturing method |
| CN117678127A (en) * | 2021-06-01 | 2024-03-08 | 西默有限公司 | System for active control of cavity length of optical components |
| TWI832186B (en) * | 2022-03-28 | 2024-02-11 | 國立清華大學 | Laser processing method and laser processing system |
| FR3145450B1 (en) * | 2023-01-27 | 2025-08-15 | Bloom Lasers | Device for generating stretched laser pulses with modulated profile |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003287706A (en) * | 2002-03-28 | 2003-10-10 | Mitsubishi Electric Corp | Laser beam uniform irradiation optical system |
| JP2004055626A (en) * | 2002-07-16 | 2004-02-19 | Nippon Telegr & Teleph Corp <Ntt> | Pulse width control device, THz electromagnetic wave generation device and generation method using the same |
| US20040240492A1 (en) * | 2003-05-26 | 2004-12-02 | Mitsubishi Denki Kabushiki Kaisha | Wavelength conversion method, wavelength conversion laser, and laser beam machining apparatus |
| KR100767622B1 (en) * | 2007-05-10 | 2007-10-17 | 주식회사 루트로닉 | Multi wavelength and multi pulse width oscillating laser system |
| US20090257464A1 (en) * | 2001-01-30 | 2009-10-15 | Board Of Trustees Of Michigan State University | Control system and apparatus for use with ultra-fast laser |
Family Cites Families (43)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| PL68411A6 (en) * | 1969-05-26 | 1973-02-28 | ||
| GB1537925A (en) * | 1976-03-04 | 1979-01-10 | Rca Corp | Interferometer to measure small displacements |
| DE3013498A1 (en) * | 1979-04-09 | 1980-10-30 | Crosfield Business Mach | OPTICAL MODULATOR AND LASER ENGRAVING DEVICE WITH SUCH A MODULATOR |
| US4346991A (en) * | 1979-10-31 | 1982-08-31 | National Research Development Corporation | Method and apparatus for measuring retinal blood flow |
| US4433915A (en) * | 1981-10-15 | 1984-02-28 | Honeywell Inc. | Dual-polarization interferometer with a single-mode waveguide |
| US4707135A (en) * | 1986-01-10 | 1987-11-17 | Rockwell International Corporation | Apparatus and method for the recording and readout of multiple exposure holograms |
| US5028136A (en) * | 1987-01-23 | 1991-07-02 | Iit Research Institute | Rugate optical filter systems |
| US5028864A (en) * | 1990-09-14 | 1991-07-02 | The United States Of America As Represented By The Secretary Of The Navy | Optically stable, large time bandwidth acousto-optic heterodyne spectrum analyzer with fixed non-zero heterodyne output |
| US5459591A (en) * | 1994-03-09 | 1995-10-17 | Faris; Sadeg M. | Electromagnetic energy beam steering devices |
| US5894531A (en) * | 1997-03-11 | 1999-04-13 | Karta Technology, Inc. | Method and apparatus for detection of ultrasound using a fiber-optic interferometer |
| US6257514B1 (en) | 1999-06-25 | 2001-07-10 | Benchmark Tape Systems Corporation | Guiding assembly for protecting a magnetic tape head |
| US6404710B1 (en) * | 1999-07-09 | 2002-06-11 | Sony Corporation | Position controller and position control method of optical system and recording/reproducing apparatus and driving method thereof |
| JP3288671B2 (en) * | 2000-02-17 | 2002-06-04 | 科学技術振興事業団 | Equipment for measuring physical properties of samples |
| JP2002096187A (en) * | 2000-09-18 | 2002-04-02 | Sumitomo Heavy Ind Ltd | Laser beam machine and machining method |
| US6928093B2 (en) | 2002-05-07 | 2005-08-09 | Cymer, Inc. | Long delay and high TIS pulse stretcher |
| US6567217B1 (en) * | 2001-11-06 | 2003-05-20 | Eastman Kodak Company | Image-forming system with enhanced gray levels |
| TWI292245B (en) * | 2002-03-28 | 2008-01-01 | Mitsubishi Electric Corp | An optical system for uniformly irradiating a laser bear |
| US7627251B2 (en) * | 2002-10-29 | 2009-12-01 | Massachusetts Institute Of Technology | Wavelength division and polarization division multiple access free space optical terminal using a single aperture |
| US7012739B2 (en) * | 2003-04-10 | 2006-03-14 | Agilent Technologies, Inc. | Double-pass polarization-independent signal processor and on-axis processing method |
| DE102004029980A1 (en) * | 2003-06-23 | 2005-01-13 | ORC Manufacturing Co., Ltd., Chofu | laser |
| US7184204B2 (en) | 2003-07-01 | 2007-02-27 | Lambda Physik Ag | Master-oscillator power-amplifier (MOPA) excimer or molecular fluorine laser system with long optics lifetime |
| US7035012B2 (en) | 2004-03-01 | 2006-04-25 | Coherent, Inc. | Optical pulse duration extender |
| CN1943083A (en) | 2004-03-02 | 2007-04-04 | 密歇根州州立大学托管委员会 | Laser system using ultra-short laser pulses |
| US7103077B2 (en) * | 2004-04-29 | 2006-09-05 | 20/10 Perfect Vision Optische Geraete Gmbh | System and method for measuring and controlling an energy of an ultra-short pulse of a laser beam |
| US7084959B2 (en) | 2004-05-27 | 2006-08-01 | Asml Holding N.V. | Compact pulse stretcher |
| US7357513B2 (en) * | 2004-07-30 | 2008-04-15 | Novalux, Inc. | System and method for driving semiconductor laser sources for displays |
| JP2006071855A (en) * | 2004-09-01 | 2006-03-16 | Sumitomo Heavy Ind Ltd | Optical device |
| US7851725B2 (en) * | 2004-11-17 | 2010-12-14 | Metal Improvement Company Llc | Active beam delivery system with image relay |
| US7718921B2 (en) * | 2004-11-17 | 2010-05-18 | Metal Improvement Company Llc | Active beam delivery system with variable optical path segment through air |
| JP2006156782A (en) * | 2004-11-30 | 2006-06-15 | National Institute Of Information & Communication Technology | Laser oscillator |
| KR101001621B1 (en) * | 2004-12-02 | 2010-12-17 | 삼성전자주식회사 | Polarization Converter and Method |
| US7480085B2 (en) * | 2005-05-26 | 2009-01-20 | Inphase Technologies, Inc. | Operational mode performance of a holographic memory system |
| US9138913B2 (en) * | 2005-09-08 | 2015-09-22 | Imra America, Inc. | Transparent material processing with an ultrashort pulse laser |
| US7400658B1 (en) | 2007-03-08 | 2008-07-15 | Coherent, Inc. | Quasi-CW UV laser with low peak pulse-power |
| JP2008281672A (en) | 2007-05-09 | 2008-11-20 | Sony Corp | Optical device, illumination device, and image output device |
| US8148663B2 (en) | 2007-07-31 | 2012-04-03 | Applied Materials, Inc. | Apparatus and method of improving beam shaping and beam homogenization |
| US7653097B2 (en) * | 2007-12-31 | 2010-01-26 | Corning Incorporated | Systems and methods for polarization modulation of an optical signal |
| EP2257854B1 (en) * | 2008-02-26 | 2018-10-31 | 3M Innovative Properties Company | Multi-photon exposure system |
| US8271424B2 (en) * | 2008-05-15 | 2012-09-18 | International Business Machines Corporation | Privacy and confidentiality preserving reporting of URLs |
| JP5473414B2 (en) * | 2009-06-10 | 2014-04-16 | 株式会社ディスコ | Laser processing equipment |
| KR101770836B1 (en) * | 2009-08-11 | 2017-08-23 | 하마마츠 포토닉스 가부시키가이샤 | Laser machining device and laser machining method |
| DE102009047098A1 (en) | 2009-11-25 | 2011-05-26 | Carl Zeiss Smt Gmbh | Optical arrangement for homogenizing a laser pulse |
| US8724108B2 (en) * | 2011-01-19 | 2014-05-13 | Harbin Institute Of Technology | Photoelectric autocollimation method and apparatus based on beam drift compensation |
-
2013
- 2013-03-12 US US13/796,249 patent/US10114157B2/en not_active Expired - Fee Related
- 2013-09-03 TW TW102131736A patent/TWI638253B/en not_active IP Right Cessation
- 2013-09-18 CN CN201610053367.9A patent/CN105710530B/en not_active Expired - Fee Related
- 2013-09-18 WO PCT/US2013/060451 patent/WO2014047203A1/en not_active Ceased
- 2013-09-18 US US14/429,597 patent/US10376991B2/en not_active Expired - Fee Related
- 2013-09-18 SG SG11201501569TA patent/SG11201501569TA/en unknown
- 2013-09-18 CN CN201710618710.4A patent/CN107450189A/en active Pending
- 2013-09-18 KR KR1020157010130A patent/KR102201000B1/en active Active
- 2013-09-18 CN CN201380048129.3A patent/CN104641458B/en active Active
- 2013-09-18 SG SG10201702244XA patent/SG10201702244XA/en unknown
- 2013-09-23 TW TW102134141A patent/TWI616261B/en not_active IP Right Cessation
- 2013-09-23 TW TW107101767A patent/TW201827148A/en unknown
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090257464A1 (en) * | 2001-01-30 | 2009-10-15 | Board Of Trustees Of Michigan State University | Control system and apparatus for use with ultra-fast laser |
| JP2003287706A (en) * | 2002-03-28 | 2003-10-10 | Mitsubishi Electric Corp | Laser beam uniform irradiation optical system |
| JP2004055626A (en) * | 2002-07-16 | 2004-02-19 | Nippon Telegr & Teleph Corp <Ntt> | Pulse width control device, THz electromagnetic wave generation device and generation method using the same |
| US20040240492A1 (en) * | 2003-05-26 | 2004-12-02 | Mitsubishi Denki Kabushiki Kaisha | Wavelength conversion method, wavelength conversion laser, and laser beam machining apparatus |
| KR100767622B1 (en) * | 2007-05-10 | 2007-10-17 | 주식회사 루트로닉 | Multi wavelength and multi pulse width oscillating laser system |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201438839A (en) | 2014-10-16 |
| CN105710530A (en) | 2016-06-29 |
| TWI616261B (en) | 2018-03-01 |
| TW201415185A (en) | 2014-04-16 |
| CN107450189A (en) | 2017-12-08 |
| KR20150058445A (en) | 2015-05-28 |
| CN105710530B (en) | 2018-07-27 |
| KR102201000B1 (en) | 2021-01-11 |
| US10376991B2 (en) | 2019-08-13 |
| SG11201501569TA (en) | 2015-04-29 |
| CN104641458B (en) | 2019-02-12 |
| US20140076863A1 (en) | 2014-03-20 |
| TWI638253B (en) | 2018-10-11 |
| CN104641458A (en) | 2015-05-20 |
| US10114157B2 (en) | 2018-10-30 |
| TW201827148A (en) | 2018-08-01 |
| US20150231735A1 (en) | 2015-08-20 |
| SG10201702244XA (en) | 2017-05-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10376991B2 (en) | Pulse width controller | |
| US9233435B2 (en) | Apparatus and method for the interference patterning of planar samples | |
| EP2724364B1 (en) | Novel thermal processing apparatus | |
| TWI600085B (en) | Laser annealing device and laser annealing method | |
| US9904069B2 (en) | Apparatus and method for speckle reduction in laser processing equipment | |
| KR20190017000A (en) | Improved thermal processing with line beams | |
| US9953851B2 (en) | Process sheet resistance uniformity improvement using multiple melt laser exposures | |
| KR20160127462A (en) | Laser apparatus and method of manufacturing the same | |
| KR20110132249A (en) | Polarization Azimuth Adjustment Device and Laser Processing Device | |
| TWI647046B (en) | Laser shield component, laser process device, and laser illuminating method | |
| CN111133639B (en) | Fiber laser device and method for processing workpiece | |
| JP2020530196A5 (en) | ||
| KR20140048188A (en) | Pulse circulator | |
| US9146337B2 (en) | Apparatus for speckle reduction, pulse stretching, and beam homogenization | |
| TWI764627B (en) | System for adjusting laser pulse width and laser pulse energy | |
| TWM615111U (en) | Laser pulse width/height modulation system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 13838512 Country of ref document: EP Kind code of ref document: A1 |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 14429597 Country of ref document: US |
|
| NENP | Non-entry into the national phase |
Ref country code: DE |
|
| ENP | Entry into the national phase |
Ref document number: 20157010130 Country of ref document: KR Kind code of ref document: A |
|
| 122 | Ep: pct application non-entry in european phase |
Ref document number: 13838512 Country of ref document: EP Kind code of ref document: A1 |