WO2013189149A1 - 液晶面板的检验方法及设备 - Google Patents

液晶面板的检验方法及设备 Download PDF

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Publication number
WO2013189149A1
WO2013189149A1 PCT/CN2012/084885 CN2012084885W WO2013189149A1 WO 2013189149 A1 WO2013189149 A1 WO 2013189149A1 CN 2012084885 W CN2012084885 W CN 2012084885W WO 2013189149 A1 WO2013189149 A1 WO 2013189149A1
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Prior art keywords
liquid crystal
crystal panel
value
voltage
common electrode
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English (en)
French (fr)
Inventor
张培林
柳在健
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BOE Technology Group Co Ltd
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BOE Technology Group Co Ltd
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Definitions

  • Embodiments of the present invention relate to a method and apparatus for inspecting a liquid crystal panel. Background technique
  • TFT-LCD thin film field effect transistor liquid crystal display
  • the afterimage is a phenomenon in which a liquid crystal panel displays (drives) a specific still image (for example, a high-gradation image) for a long period of time, and then converts it to another image (for example, a low-gradation image).
  • the afterimage is a phenomenon that occurs inside a liquid crystal cell. Since the liquid crystal panel changes to display other images after displaying the still picture for a long time, the liquid crystal molecules cannot be completely deflected in time to adapt to the new picture, thereby affecting the display effect.
  • the afterimage can be divided into two types: area image sticking and line image sticking depending on the form and position.
  • residual image is the effect of residual charge.
  • residual charges include polarized charges generated inside the liquid crystal cell under an applied electric field and different distributions of impurity charges inside the liquid crystal cell. These residual charges affect the orientation of the liquid crystal at the top and bottom of the liquid crystal cell, so that the afterimage occurs in the entire liquid crystal panel region, and the more severe case is distributed at the boundary between the images having significant color differences.
  • the generation of afterimages is also affected by other factors, such as ambient temperature and still picture type, display time, brightness level, and so on.
  • the afterimage evaluation time is long, usually 168 hours, and the afterimage result can be judged only after the evaluation is over. If the voltage setting of the liquid crystal panel is deviated, or the probability of occurrence of afterimage of the liquid crystal panel becomes large due to design and process, etc., the corresponding conclusion can be obtained only after the afterimage evaluation is completed. At present, there is no method and device for judging the probability of occurrence of afterimage by testing the parameters of the liquid crystal panel. Summary of the invention
  • Embodiments of the present invention provide a method and apparatus for inspecting a liquid crystal panel relating to an afterimage of a liquid crystal panel, which can determine the probability of occurrence of afterimages by testing parameters of the liquid crystal panel.
  • One aspect of the present invention provides a liquid crystal panel inspection method comprising: testing a common electrode uniformity of a liquid crystal panel; and determining a probability of occurrence of an afterimage of the liquid crystal panel based on a result of a common electrode uniformity of the liquid crystal panel.
  • the common electrode uniformity of the test liquid crystal panel may include: measuring a value of an optimum common voltage at a plurality of different positions on the liquid crystal panel; determining according to the value of the optimal common voltage The common electrode uniformity of the liquid crystal panel.
  • the measuring the value of the optimal common voltage at a plurality of different positions on the liquid crystal panel may include: dividing the liquid crystal panel into a plurality of regions; and energizing the liquid crystal panel under the blinking screen Inputting a gradually increasing alternating common electrode voltage to the liquid crystal panel, respectively testing the magnitude of the flicker intensity of the center point of the plurality of regions, respectively determining that the flicker intensity at the center point of the plurality of regions is less than one
  • the value of the applied alternating voltage in the case of the threshold value, and the value of the voltage of the plurality of regions is a value of an optimum common voltage at a plurality of different positions on the liquid crystal panel.
  • the measuring the value of the optimal common voltage at a plurality of different positions on the liquid crystal panel may include: dividing the liquid crystal panel into a plurality of regions; and energizing the liquid crystal panel under the blinking screen Inputting a gradually increasing alternating common electrode voltage to the liquid crystal panel, respectively testing the magnitude of the flicker intensity of the center points of the plurality of regions, respectively determining the minimum flicker intensity at the center point of the plurality of regions
  • the value of the voltage of the plurality of regions is a value of an optimum common voltage of a plurality of different positions on the liquid crystal panel.
  • determining the common electrode uniformity of the liquid crystal panel according to the value of the optimal common voltage may include: calculating a standard deviation of the value of the optimal common voltage; The standard deviation determines the common electrode uniformity of the liquid crystal panel.
  • determining the common electrode uniformity of the liquid crystal panel according to the standard deviation may include: determining whether a standard deviation of a value of the optimal common voltage is less than 0.03, if the If the standard deviation of the values of the good common voltage is less than 0.03, it is judged that the common electrode of the liquid crystal panel is uniform; if the standard deviation of the value of the optimal common voltage is greater than 0.03, Then, it is determined that the common electrode of the liquid crystal panel is uneven.
  • a liquid crystal panel inspection apparatus includes: a test apparatus for testing uniformity of a common electrode of a liquid crystal panel; determining an afterimage of the liquid crystal panel according to a result of common electrode uniformity of the liquid crystal panel The probability judging device is electrically connected to the test device.
  • the test apparatus may include: a measurement device for measuring a value of an optimum common voltage at a plurality of different positions on the liquid crystal panel; and a calculation device receiving the value of the optimal common voltage And determining the common electrode uniformity of the liquid crystal panel according to the value of the optimal common voltage, and the computing device is electrically connected to the determining device.
  • the measuring device may include: a base for carrying a liquid crystal panel, the base is mounted with a bracket movable above the base; and the liquid crystal is separately measured a tester for flashing intensity at a plurality of different positions on the panel, fixed to the bracket; a DC stabilized power supply for loading the liquid crystal panel; a program controller, and the DC stabilized power supply and the tester Electrically connected, the program controller controls a DC stabilized power supply to input a gradually increasing alternating common electrode voltage to the test liquid crystal panel and controls a switch of the tester; a computer, and the program controller and the test The devices are respectively electrically connected, the computer controls the bracket to move over the area by a program controller, and the computer receives data of flicker intensity of a plurality of different positions on the liquid crystal panel of the tester and respectively determines The value of the applied alternating voltage in the case where the blinking intensity of the plurality of positions is less than a threshold value or a minimum, the plurality of bits The voltage value of the optimum
  • the inspection method and the inspection device for the liquid crystal panel of the embodiment of the present invention can accurately determine the probability and level of occurrence of the residual image of the liquid crystal panel by testing the uniformity of the common electrode inside the liquid crystal panel, thereby quickly determining the liquid crystal panel without performing afterimage evaluation.
  • the residual image saves time and improves work efficiency.
  • 1 is a schematic view showing the connection of the inspection device of the liquid crystal panel of the present invention
  • 2 is a schematic view showing the structure of a base and a bracket in the inspection apparatus of the liquid crystal panel of the present invention.
  • An embodiment of the present invention provides a liquid crystal panel inspection method for testing the uniformity of a common electrode inside a liquid crystal panel by controlling a signal input of a common voltage, for example, by using a program, and accurately determining the occurrence of residual image of the liquid crystal panel by using uniformity data. Probability and level, so that the residual image of the LCD panel can be quickly determined without the afterimage evaluation, saving time and improving work efficiency.
  • a liquid crystal panel inspection method includes the steps of: testing a common electrode uniformity of a liquid crystal panel; and determining a probability of occurrence of an afterimage of the liquid crystal panel based on a result of a common electrode uniformity of the liquid crystal panel.
  • the common electrode of the liquid crystal panel is uniform, it is determined that the residual image occurrence probability of the liquid crystal panel is small; if the common electrode of the liquid crystal panel is not uniform, it is determined that the residual image of the liquid crystal panel has a high probability of occurrence.
  • testing the common electrode uniformity of a liquid crystal panel can be done in a variety of ways.
  • testing the common electrode uniformity of the liquid crystal panel includes: measuring a value of an optimum common voltage at a plurality of different positions on the liquid crystal panel; a value according to the optimum common voltage The common electrode uniformity of the liquid crystal panel is judged.
  • measuring the value of the optimal common voltage at a plurality of different positions on the liquid crystal panel may include the steps of: dividing the liquid crystal panel into a plurality of regions; and energizing the liquid crystal panel Under the blinking screen, the input of the LCD panel is gradually increased.
  • a common electrode voltage respectively testing the magnitude of the flicker intensity of the center point of the plurality of regions, and determining the value of the applied alternating voltage in the case where the flicker intensity at the center point of the plurality of regions is less than a threshold value, respectively
  • the value of the voltage of the plurality of regions is a value of an optimum common voltage of a plurality of different locations on the liquid crystal panel.
  • the gradual increase of the alternating common electrode voltage may be performed in various ways such as increasing at equal intervals, or increasing unequally, or linearly increasing.
  • the value of the optimum common voltage at a plurality of different positions on the liquid crystal panel may also be measured as follows: dividing the liquid crystal panel into a plurality of regions; Powering on, under the blinking screen, inputting a gradually increasing alternating common electrode voltage to the liquid crystal panel, respectively testing the magnitude of the flicker intensity of the center points of the plurality of regions, respectively determining the centers of the plurality of regions
  • the value of the applied alternating voltage in the case where the flashing intensity of the dot is the smallest, and the value of the voltage in the plurality of regions is a numerical value of the optimum common voltage at a plurality of different positions on the liquid crystal panel.
  • the gradual increase of the alternating common electrode voltage may be performed in various ways such as increasing at equal intervals, or increasing unequally, or linearly increasing.
  • the determining the common electrode uniformity of the liquid crystal panel according to the value of the optimal common voltage is: calculating a standard deviation of the value of the optimal common voltage;
  • the standard deviation determines the common electrode uniformity of the liquid crystal panel. For example, it is determined whether or not the common electrode uniformity of the liquid crystal panel is uniform by judging whether or not the standard deviation of the numerical value of the optimum common voltage is smaller than a certain value.
  • the determining the common electrode uniformity of the liquid crystal panel according to the standard deviation may include: determining whether the standard deviation of the value of the optimal common voltage is smaller than 0.03, if the standard deviation of the value of the optimal common voltage is less than 0.03, determining that the common electrode of the liquid crystal panel is uniform; if the standard deviation of the value of the optimal common voltage is greater than 0.03, determining the liquid crystal panel The common electrode is not uniform.
  • an inspection apparatus for a liquid crystal panel includes: a test apparatus for testing uniformity of a common electrode of a liquid crystal panel; and determining a liquid crystal panel according to a result of uniformity of a common electrode of the liquid crystal panel The device 2 for judging the probability of occurrence of afterimages.
  • the breaking device 2 is electrically connected to the above test device.
  • the judging means 2 may be a device having a calculation and judgment capability electrically connected to the above test device, such as a computer, a digital processing device (DSP), etc., and by receiving the result of the test device, determining the probability of occurrence of the afterimage of the liquid crystal panel.
  • DSP digital processing device
  • an example of the above test apparatus may include: a measuring device 11 for measuring a value of an optimum common voltage at a plurality of different positions on the liquid crystal panel; the computing device 12, receiving The value of the optimum common voltage is used to determine the common electrode uniformity of the liquid crystal panel based on the value of the optimum common voltage, and the computing device 12 is electrically connected to the determining device.
  • an example of the measuring device 11 may include: a base 111 for carrying a liquid crystal panel, and the base 111 is mounted with a bracket 112 movable over the base 111;
  • the tester 113 for measuring the flicker intensity of the center point of the area on the liquid crystal panel is fixed on the bracket 112;
  • the DC stabilized power source 116 is used for loading the liquid crystal panel;
  • the program controller 114, and the DC stabilized power source 116 and the tester 113 is electrically connected respectively, and the program controller 114 controls the DC stabilized power supply 116 to input a gradually increasing alternating common electrode voltage to the test liquid crystal panel and controls the switch of the tester 113;
  • the computer 115, and the program controller 114 and the tester 113 Electrically connected, the computer 115 divides the surface of the liquid crystal panel into a plurality of regions, and controls the bracket 112 to move sequentially over the region by the program controller 114.
  • the computer 115 receives the flicker intensity of a plurality of different positions on the liquid crystal panel of the tester 113. Data and separately determine that the flicker intensity at multiple locations is less than a threshold or minimum The value of the alternating voltage is added, and the value of the voltage at the plurality of positions is a value of an optimum common voltage at a plurality of different positions on the liquid crystal panel. Computer 115 is electrically coupled to computing device 12.
  • the first side of the base 111 is provided with a longitudinally extending first guide rail 21, and the movable frame 22 is movably disposed above the base 111 by cooperation with the first guide rail 21.
  • the movable frame 22 is provided with a second guide rail 23 extending in the lateral direction.
  • the bracket 112 is movably disposed above the base 111 by cooperation with the second rail 23. The bracket 112 can be moved to any area above the base 111.
  • the program controller 114 is electrically coupled to the motor of the cradle 112 and the motor of the cradle 22, respectively.
  • the judging device 2 is a computer electrically connected to the computing device 12 of the above-described test device, and by receiving the result of the computing device 12, the probability of occurrence of afterimage of the liquid crystal panel is determined.
  • the liquid crystal panel When the liquid crystal panel is detected by the inspection device of the liquid crystal panel of the embodiment of the present invention, the liquid crystal panel is Putting on the base 111, the surface of the liquid crystal panel is divided into a plurality of areas by the computer 115, and the bracket 112 and the moving frame 22 are controlled by the program controller 114 to sequentially move the bracket 112 above the above area by using the computer 115;
  • the program controller 114 controls the DC stabilized power supply 116 to input a gradually increasing alternating common electrode voltage to the test liquid crystal panel and controls the tester 113 to measure the flicker intensity of the center point of the above region on the liquid crystal panel;
  • the computer 115 receives the tester 113
  • the computer 115 supplies the value of the optimum common voltage of the center point of the above region to the computing device 12, and the computing device 12 calculates the standard deviation of the optimum common voltage of the center point; and determines whether the common electrode of the liquid crystal panel is uniform based on the standard deviation.
  • the computing device 12 determines whether three times the standard deviation of the optimal common voltage of the center point is less than 0.09, and if the standard deviation of the optimal common voltage of the center point is less than 0.09, The common electrode of the liquid crystal panel is uniform; if the standard deviation of the optimum common voltage of the center point is three times greater than 0.09, it is determined that the common electrode of the liquid crystal panel is not uniform.
  • the judging device 2 determines the probability of occurrence of the afterimage of the liquid crystal panel according to the data of the computing device 12: if the common electrode of the liquid crystal panel is uniform, it is determined that the residual image occurrence probability of the liquid crystal panel is small; if the common electrode of the liquid crystal panel is not uniform, the liquid crystal panel is judged The probability of occurrence of afterimages is large.
  • the inspection method and the inspection device of the above liquid crystal panel greatly save the time for judging the occurrence of the afterimage of the liquid crystal panel.
  • the results of the conventional method review by the tested liquid crystal panel showed that the accuracy of the inspection method of the embodiment of the present invention was 97% or more.

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
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  • Computer Hardware Design (AREA)
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Abstract

一种液晶面板的检验方法及检验设备。该检验方法包括：测试液晶面板的公共电极均匀性；根据液晶面板的公共电极均匀性结果判定液晶面板的残像发生几率。该检验方法不必进行残像评价就可以快捷地判断液晶面板的残像情况，提高工作效率。

Description

液晶面板的检 3全方法及设备 技术领域
本发明的实施例涉及一种关于液晶面板的检验方法及设备。 背景技术
如今薄膜场效应晶体管液晶显示器（TFT-LCD )产品已经广泛的应用于 人们的生产和生活当中， 例如电视、 显示器、 以及各种便携式的电子显示产 品等。 各大液晶面板厂商都在努力提高产品的性能， 降低能耗， 增大视角， 减小响应时间。 对于显示液晶面板残像的改善尤为重要， 因为残像直接影响 了显示画面的品盾。
残像是指液晶面板长时间显示（驱动）特定静止图像（例如高灰度的图 像)后， 变换为其他图像（例如低灰度的图像）时部分残留之前显示的图像的 现象。 残像是发生在液晶盒（cell )内部的一种现象。 由于液晶面板长时间显 示静止画面后， 再改变为显示其他图像时， 液晶分子不能即时完全的发生偏 转以适应新的画面， 从而影响了显示效果。
残像依据发生的形态和位置不同可以分为面残像 ( area image sticking ) 和线残像 ( line image sticking ) 两种。
人们对残像机理的研究表明， 产生残像的主要原因是残留电荷的影响。 这些残留电荷包括在外加电场作用下在液晶盒内部产生的极化电荷以及在液 晶盒内部杂质电荷的不同分布。 这些残留电荷会影响在液晶盒顶部和底部的 液晶取向， 从而使得残像发生在整个液晶面板区域， 比较严重的情形分布在 具有明显颜色差别的图像之间的交界位置。 残像的产生还受其他因素影响， 比如外界温度以及静止画面类型、 显示时间、 亮度等级等。
现有技术中， 进行残像评价时间较长， 通常为 168小时， 残像结果只有 在评价结束以后才可以判断。 如果液晶面板电压设置出现偏差， 或者由于设 计和工艺等原因使得液晶面板发生残像的几率变大， 也只有在残像评价结束 以后才可得到相应结论。 目前并没有可以通过可测试液晶面板参数来判断残 像发生几率的方法和装置。 发明内容
本发明的实施例提供了一种关于液晶面板的残像的液晶面板的检验方法 及设备， 可以通过测试液晶面板参数来比较快捷的判断残像发生几率。
本发明的一个方面提供了一种液晶面板检验方法， 其包括： 测试液晶面 板的公共电极均匀性； 根据所述液晶面板的公共电极均匀性结果判定所述液 晶面板的残像发生几率。
对于该液晶面板检验方法， 例如， 所述测试液晶面板的公共电极均匀性 可以包括： 测量液晶面板上的多个不同位置的最佳公共电压的数值； 根据所 述最佳公共电压的数值来判断所述液晶面板的公共电极均匀性。
对于该液晶面板检验方法， 例如， 所述测量液晶面板上的多个不同位置 的最佳公共电压的数值可以包括： 将液晶面板划分为多个区域； 对所述液晶 面板通电， 在闪烁画面下， 对所述液晶面板输入逐渐增大的交变的公共电极 电压， 分别测试所述多个区域的中心点的闪烁强度的大小， 分别确定在所述 多个区域的中心点的闪烁强度小于一门限值的情况下的外加交变电压的数 值， 所述多个区域的该电压的数值为所述液晶面板上的多个不同位置的最佳 公共电压的数值。
对于该液晶面板检验方法， 例如， 所述测量液晶面板上的多个不同位置 的最佳公共电压的数值可以包括： 将液晶面板划分为多个区域； 对所述液晶 面板通电， 在闪烁画面下， 对所述液晶面板输入逐渐增大的交变的公共电极 电压， 分别测试所述多个区域的中心点的闪烁强度的大小， 分别确定在所述 多个区域的中心点的闪烁强度最小的情况下的外加交变电压的数值， 所述多 个区域的该电压的数值为所述液晶面板上的多个不同位置的最佳公共电压的 数值。
对于该液晶面板检验方法， 例如， 所述根据所述最佳公共电压的数值来 判断所述液晶面板的公共电极均勾性可以包括： 计算所述最佳公共电压的数 值的标准差； 根据所述标准差判定所述液晶面板的公共电极均匀性。
对于该液晶面板检验方法， 例如， 所述根据所述标准差判定所述液晶面 板的公共电极均匀性可以包括： 判断所述最佳公共电压的数值的标准差的是 否小于 0.03 , 如果所述最佳公共电压的数值的标准差小于 0.03 , 则判断所述 液晶面板的公共电极均匀；如果所述最佳公共电压的数值的标准差大于 0.03 , 则判断所述液晶面板的公共电极不均匀。
本发明的再一个方面提供了一种液晶面板检验设备， 包括： 用于测试液 晶面板的公共电极均匀性的测试装置； 根据所述液晶面板的公共电极均匀性 结果判定所述液晶面板的残像发生几率的判断装置，与所述测试装置电连接。
对于该液晶面板检验设备， 例如， 所述测试装置可以包括： 用于测量液 晶面板上的多个不同位置的最佳公共电压的数值的测量装置； 计算装置， 接 收所述最佳公共电压的数值并根据所述最佳公共电压的数值来判断所述液晶 面板的公共电极均匀性， 所述计算装置与所述判断装置电连接。
对于该液晶面板检验设备， 例如， 所述测量装置可以包括： 用于承载液 晶面板的基台， 所述基台上安装有可在所述基台上方移动的支架； 用于分别 测量所述液晶面板上多个不同位置的闪烁强度的测试仪，固定于所述支架上； 直流稳压电源， 用于向所述液晶面板加载； 程序控制器， 与所述直流稳压电 源和所述测试仪分别电连接， 所述程序控制器控制直流稳压电源对测试液晶 面板输入逐渐增大的交变的公共电极电压并控制所述测试仪的开关；计算机， 与所述程序控制器和所述测试仪分别电连接， 所述计算机通过程序控制器控 制所述支架在所述区域上方移动， 所述计算机接收所述测试仪的所述液晶面 板上多个不同位置的闪烁强度的数据并分别确定在所述多个位置的闪烁强度 小于一门限值或最小的情况下的外加交变电压的数值， 所述多个位置的该电 压的数值为所述液晶面板上的多个不同位置的最佳公共电压的数值， 所述计 算机与所述计算装置电连接。
本发明的实施例的液晶面板的检验方法及检验设备， 通过测试液晶面板 内部公共电极的均匀性可以准确判断液晶面板残像发生的概率和等级， 从而 不必进行残像评价就可以快捷的判断液晶面板的残像情况， 节省了时间， 提 高了工作效率。 附图说明
为了更清楚地说明本发明实施例的技术方案， 下面将对实施例的附图作 简单地介绍，显而易见地，下面描述中的附图仅仅涉及本发明的一些实施例， 而非对本发明的限制。
图 1为本发明的液晶面板的检^殳备的连接示意图； 图 2为本发明的液晶面板的检^殳备中的基台以及支架的结构示意图。 具体实施方式
为使本发明实施例的目的、 技术方案和优点更加清楚， 下面将结合本发 明实施例的附图，对本发明实施例的技术方案进行清楚、 完整地描述。显然， 所描述的实施例是本发明的一部分实施例， 而不是全部的实施例。 基于所描 述的本发明的实施例， 本领域普通技术人员在无需创造性劳动的前提下所获 得的所有其他实施例， 都属于本发明保护的范围。
本发明的一个实施例提供了一种液晶面板检验方法， 通过例如釆用程序 控制公共电压的信号输入， 测试液晶面板内部公共电极的均匀性， 通过均匀 性的数据可以准确判断液晶面板残像发生的概率和等级， 从而不必进行残像 评价就可以快捷的判断液晶面板的残像情况，节省了时间，提高了工作效率。
通过大量实验可知液晶面板的公共电极均勾性和残像等级之间有密切的 关系； 如果液晶面板公共电极均匀性不好， 则残像也会比较严重。 因此， 可 以通过测试液晶面板内部公共电极的均匀性， 在不进行残像评价的前提下预 先判断残像的情况， 并且可以通过改善液晶面板的公共电极的均勾性来降低 残像的等级。
本发明的一个实施例的液晶面板检验方法， 包括如下步骤： 测试液晶面 板的公共电极均匀性； 根据所述液晶面板的公共电极均匀性结果判定所述液 晶面板的残像发生几率。
例如， 如果所述液晶面板的公共电极均匀， 则判断所述液晶面板的残像 发生几率为小； 如果所述液晶面板的公共电极不均匀， 则判断所述液晶面板 的残像发生几率为大。
测试液晶面板的公共电极均匀性可以釆用很多种方法。 该实施例的液晶 面板的检验方法的一个示例中， 测试液晶面板的公共电极均匀性包括： 测量 液晶面板上的多个不同位置的最佳公共电压的数值； 根据所述最佳公共电压 的数值来判断所述液晶面板的公共电极均匀性。
本实施例的液晶面板检验方法的示例中， 测量液晶面板上的多个不同位 置的最佳公共电压的数值可以包括如下步骤： 将液晶面板划分为多个区域； 对所述液晶面板通电， 在闪烁画面下， 对所述液晶面板输入逐渐增大的交变 的公共电极电压， 分别测试所述多个区域的中心点的闪烁强度的大小， 分别 确定在所述多个区域的中心点的闪烁强度小于一门限值的情况下的外加交变 电压的数值， 所述多个区域的该电压的数值为所述液晶面板上的多个不同位 置的最佳公共电压的数值。
在上述方法中， 例如， 交变的公共电极电压的逐渐增大可以釆用等间隔 地增大， 或者不等间隔地增大， 或者线性增大等多种方式进行。
在本发明的其他实施例的液晶面板检验方法中， 也可以按照如下方法测 量液晶面板上的多个不同位置的最佳公共电压的数值： 将液晶面板划分为多 个区域； 对所述液晶面板通电， 在闪烁画面下， 对所述液晶面板输入逐渐增 大的交变的公共电极电压， 分别测试所述多个区域的中心点的闪烁强度的大 小， 分别确定在所述多个区域的中心点的闪烁强度最小的情况下的外加交变 电压的数值， 所述多个区域的该电压的数值为所述液晶面板上的多个不同位 置的最佳公共电压的数值。
在上述方法中， 例如， 交变的公共电极电压的逐渐增大可以釆用等间隔 地增大， 或者不等间隔地增大， 或者线性增大等多种方式进行。
本发明的实施例的液晶面板检验方法中， 所述根据所述最佳公共电压的 数值来判断所述液晶面板的公共电极均匀性为： 计算所述最佳公共电压的数 值的标准差； 根据所述标准差判定所述液晶面板的公共电极均匀性。 例如， 通过判断所述最佳公共电压的数值的标准差是否小于某一确定的值来判定所 述液晶面板的公共电极均匀性是否为均匀。
例如， 本发明的实施例的液晶面板的检验方法中， 所述根据所述标准差 判定所述液晶面板的公共电极均匀性可以包括： 判断所述最佳公共电压的数 值的标准差的是否小于 0.03 , 如果所述最佳公共电压的数值的标准差小于 0.03 , 则判断所述液晶面板的公共电极均匀； 如果所述最佳公共电压的数值 的标准差大于 0.03 , 则判断所述液晶面板的公共电极不均匀。
如图 1、 图 2所示， 本发明的实施例的液晶面板的检验设备， 包括： 用 于测试液晶面板的公共电极均匀性的测试装置； 和根据液晶面板的公共电极 均匀性结果判定液晶面板的残像发生几率的判断装置 2。
如果液晶面板的公共电极均匀， 则判断液晶面板的残像发生几率为小； 如果液晶面板的公共电极不均匀， 则判断液晶面板的残像发生几率为大。 判 断装置 2与上述测试装置电连接。
判断装置 2可以是与上述测试装置电连接的就有计算、判断能力的装置， 例如计算机、 数字处理设备（DSP )等， 通过接收测试装置的结果， 判断液 晶面板的残像发生几率。
本发明的实施例的液晶面板的检验设备中， 上述测试装置的一个示例可 以包括： 用于测量液晶面板上的多个不同位置的最佳公共电压的数值的测量 装置 11;计算装置 12,接收上述最佳公共电压的数值并根据上述最佳公共电 压的数值来判断液晶面板的公共电极均匀性，计算装置 12与上述判断装置电 连接。
本发明的实施例的液晶面板的检验设备中，测量装置 11的一个示例可以 包括： 用于承载液晶面板的基台 111 , 基台 111上安装有可在基台 111上方 移动的支架 112; 用于测量液晶面板上区域的中心点的闪烁强度的测试仪 113 , 固定于支架 112上； 直流稳压电源 116, 用于向液晶面板加载； 程序控 制器 114, 与直流稳压电源 116和测试仪 113分别电连接， 程序控制器 114 控制直流稳压电源 116对测试液晶面板输入逐渐增大的交变的公共电极电压 并控制测试仪 113的开关； 计算机 115, 与程序控制器 114和测试仪 113分 别电连接， 计算机 115将液晶面板的表面划分为多个区域， 并通过程序控制 器 114控制支架 112在区域上方依次移动， 计算机 115接收测试仪 113的液 晶面板上多个不同位置的闪烁强度的数据并分别确定在多个位置的闪烁强度 小于一门限值或最小的情况下的外加交变电压的数值， 上述多个位置的该电 压的数值为所述液晶面板上的多个不同位置的最佳公共电压的数值。 计算机 115与计算装置 12电连接。
基台 111的两侧设置有纵向延伸的第一导轨 21 , 移动架 22通过与第一 导轨 21配合可移动的设置于基台 111上方。 移动架 22上设置有沿横向延伸 的第二导轨 23。支架 112通过与第二导轨 23的配合可移动的设置于基台 111 上方。 支架 112可以移动至基台 111上方的任何区域。 程序控制器 114与支 架 112的电机和移动架 22的电机分别电连接。
本实施例中，判断装置 2是与上述测试装置中的计算装置 12电连接的计 算机， 通过接收计算装置 12的结果， 判断液晶面板的残像发生几率。
当利用本发明实施例的液晶面板的检验设备检测液晶面板， 将液晶面板 置于基台 111上， 利用计算机 115将液晶面板的表面划分为多个区域， 利用 计算机 115将通过程序控制器 114控制支架 112和移动架 22使支架 112在上 述区域上方依次移动； 同时， 利用程序控制器 114控制直流稳压电源 116对 测试液晶面板输入逐渐增大的交变的公共电极电压并控制测试仪 113测量液 晶面板上上述区域的中心点的闪烁强度； 计算机 115接收测试仪 113的上述 闪烁强度数据， 并判断出闪烁强度小于一门限值（或者最小） 的情况下的外 加交变电压的数值， 该电压的数值就是上述区域的中心点的最佳公共电压的 数值。 计算机 115将上述区域的中心点的最佳公共电压的数值输送给计算装 置 12, 计算装置 12计算上述中心点的最佳公共电压的标准差； 根据上述标 准差判定液晶面板的公共电极是否均匀。 本实施例中， 例如， 计算装置 12 判断上述中心点的最佳公共电压的标准差的三倍是否小于 0.09, 如果上述中 心点的最佳公共电压的标准差的三倍均小于 0.09, 则判断所述液晶面板的公 共电极均匀； 如果上述中心点的最佳公共电压的标准差的三倍大于 0.09, 则 判断所述液晶面板的公共电极不均匀。判断装置 2根据计算装置 12的数据来 判断液晶面板的残像发生几率： 如果液晶面板的公共电极均匀， 则判断液晶 面板的残像发生几率为小； 如果液晶面板的公共电极不均匀， 则判断液晶面 板的残像发生几率为大。
在实际测试工作中， 利用上述液晶面板的检验方法及检验设备大大节省 了判断液晶面板的残像发生几率的时间。 而通过已检验的液晶面板进行常规 方法的复查的结果表明： 本发明的实施例的检验方法的准确率在 97%以上。
以上所述仅是本发明的示范性实施方式， 而非用于限制本发明的保护范 围， 本发明的保护范围由所附的权利要求确定。

Claims

权利要求书
1. 一种液晶面板的检验方法， 包括：
测试液晶面板的公共电极均匀性；
根据所述液晶面板的公共电极均匀性结果判定所述液晶面板的残像发生 几率。
2. 根据权利要求 1所述的液晶面板的检验方法， 其中， 所述测试液晶面 板的公共电极均匀性包括：
测量液晶面板上的多个不同位置的最佳公共电压的数值；
根据所述最佳公共电压的数值来判断所述液晶面板的公共电极均匀性。
3. 根据权利要求 2所述的液晶面板的检验方法， 其中， 所述测量液晶面 板上的多个不同位置的最佳公共电压的数值包括：
将液晶面板划分为多个区域；
对所述液晶面板通电， 在闪烁画面下， 对所述液晶面板输入逐渐增大的 交变的公共电极电压， 分别测试所述多个区域的中心点的闪烁强度的大小， 分别确定在所述多个区域的中心点的闪烁强度小于一门限值的情况下的外加 交变电压的数值， 所述多个区域的该电压的数值为所述液晶面板上的多个不 同位置的最佳公共电压的数值。
4. 根据权利要求 2所述的液晶面板的检验方法， 其中， 所述测量液晶面 板上的多个不同位置的最佳公共电压的数值包括：
将液晶面板划分为多个区域；
对所述液晶面板通电， 在闪烁画面下， 对所述液晶面板输入逐渐增大的 交变的公共电极电压， 分别测试所述多个区域的中心点的闪烁强度的大小， 分别确定在所述多个区域的中心点的闪烁强度最小的情况下的外加交变电压 的数值， 所述多个区域的该电压的数值为所述液晶面板上的多个不同位置的 最佳公共电压的数值。
5. 根据权利要求 2-4任一所述的液晶面板的检验方法， 其中， 所述根据 所述最佳公共电压的数值来判断所述液晶面板的公共电极均匀性为：
计算所述最佳公共电压的数值的标准差；
根据所述标准差判定所述液晶面板的公共电极均匀性。
6. 根据权利要求 5所述的液晶面板的检验方法， 其中， 所述根据所述标 准差判定所述液晶面板的公共电极均匀性包括：
判断所述最佳公共电压的数值的标准差的是否小于 0.03 , 如果所述最佳 公共电压的数值的标准差小于 0.03 , 则判断所述液晶面板的公共电极均匀； 如果所述最佳公共电压的数值的标准差大于 0.03 , 则判断所述液晶面板的公 共电极不均匀。
7. 一种液晶面板的检验设备， 包括：
用于测试液晶面板的公共电极均匀性的测试装置；
根据所述液晶面板的公共电极均匀性结果判定所述液晶面板的残像发生 几率的判断装置， 与所述测试装置电连接。
8. 根据权利要求 7所述的液晶面板的检验设备， 其中， 所述测试装置包 括：
用于测量液晶面板上的多个不同位置的最佳公共电压的数值的测量装 置；
计算装置， 接收所述最佳公共电压的数值并根据所述最佳公共电压的数 值来判断所述液晶面板的公共电极均勾性， 所述计算装置与所述判断装置电 连接。
9. 根据权利要求 8所述的液晶面板的检验设备， 其中， 所述测量装置包 括：
用于承载液晶面板的基台， 所述基台上安装有可在所述基台上方移动的 支架；
用于分别测量所述液晶面板上多个不同位置的闪烁强度的测试仪， 固定 于所述支架上；
直流稳压电源， 用于向所述液晶面板加载；
程序控制器， 与所述直流稳压电源和所述测试仪分别电连接， 所述程序 控制器控制直流稳压电源对测试液晶面板输入逐渐增大的交变的公共电极电 压并控制所述测试仪的开关；
计算机， 与所述程序控制器和所述测试仪分别电连接， 所述计算机通过 程序控制器控制所述支架在所述区域上方移动， 所述计算机接收所述测试仪 的所述液晶面板上多个不同位置的闪烁强度的数据并分别确定在所述多个位 置的闪烁强度小于一门限值或最小的情况下的外加交变电压的数值， 所述多 个位置的该电压的数值为所述液晶面板上的多个不同位置的最佳公共电压的 数值， 所述计算机与所述计算装置电连接。
PCT/CN2012/084885 2012-06-21 2012-11-20 液晶面板的检验方法及设备 Ceased WO2013189149A1 (zh)

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CN102736282B (zh) * 2012-06-21 2014-12-24 京东方科技集团股份有限公司 液晶面板的检验方法及设备
CN104282251B (zh) 2014-10-28 2017-02-15 合肥鑫晟光电科技有限公司 一种显示装置的残像等级判定方法及检测装置
CN105259689A (zh) * 2015-11-23 2016-01-20 武汉华星光电技术有限公司 液晶显示面板及液晶显示装置
CN107464513B (zh) * 2017-09-18 2023-11-21 惠科股份有限公司 一种显示面板的画面闪烁自动检测系统及检测方法

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