WO2013076087A1

WO2013076087A1 - Test system and test method for cable harnesses

Info

Publication number: WO2013076087A1
Application number: PCT/EP2012/073122
Authority: WO
Inventors: Roman KÖNIG; Dietmar SCHEDLER; Hardi Engel; Martin Weber
Original assignee: Digalog Industrie-Mikroelektronik Gmbh
Priority date: 2011-11-25
Filing date: 2012-11-20
Publication date: 2013-05-30
Also published as: DE102011087152B4; DE102011087152A1

Abstract

The invention relates to a test system and a test method for a cable harness, characterized by at least two test nodes (21, 22, 23, 24, 25) for testing at least one connection to a plug (1, 2, 3, 4, 5) in a cable harness (10) to be tested, wherein at least one test node (21, 22, 23, 24, 25) is designed in such a way that its operating energy and/or test signals can be drawn and/or distributed over the cable harness (10) to be tested and can be passed onto other test nodes (21, 22, 23, 24, 25) over the cable harness (10) to be tested.

Description

Test system and test method for wiring harnesses

The invention relates to a test system for harnesses with the features of claim 1 and a test method for harnesses with the features of claim 9.

The supply of systems with current and signals, e.g. in motor vehicles, shipbuilding, household appliances,

Medical technology, aircraft or

Telecommunications systems are often with

Cable harnesses. These bundle individual lines that

Signals (information) and working energy (electricity)

transfer. The cables are in a wiring harness

summarized . In today's passenger vehicles can be installed up to 1000 individual lines with a total length of up to 3 km. Motor vehicles are often equipped with 20 to 80 electronic control units that need to implement their functionality mutual information and data exchange. Also, modern sensors are already integrated into the information network and thus represent their

Actual and reference variables of a large number of

Participants of the network available.

The harnesses are still made manually on special workbenches today. One reason for this is that in many areas of technology, there is a large variety of possibilities, not only the production, but also the testing or testing of the

made harnesses difficult. Since each wire harness must be subjected to intensive testing in practice, in the manufacturing equipment, e.g. in the

Automotive industry, a very large number of test tables required to test the harnesses for proper function. It is therefore an object to provide systems and methods by which the examination of the

Wiring harnesses is made possible in an efficient manner.

The object is achieved by a test system according to claim 1.

At least two test nodes are used for the test

at least one connection to a connector in a harness to be tested, having at least two test nodes for testing at least one connection to a connector in a harness to be tested, wherein at least one

Test node is designed so that its operating power and / or test signals can be obtained and / or distributed over the harness to be tested and over the zu

testing harness are forwarded to other test nodes.

This makes it possible to significantly reduce the wiring of the test device. This not only saves material, but also working time to the

Cabling to perform. Also, repair and service are made easier and faster. The availability of

Test facility is increased. Thus, it is advantageously possible to carry out a test already during assembly of the wiring harness.

In a further advantageous embodiment

at least one test node with a data transmission means for the transmission of a test order of one

Host computer to the individual test nodes and / or for the transmission of the test result to the master computer

coupled.

It is particularly advantageous if, in one embodiment, at least one of the test nodes is equipped with a microcontroller for controlling the test node, in particular for the latter

Energy management, the communication with other test nodes, the communication with the host, the execution of the sent from the host computer test jobs and / or the Logging of the results is coupled. Thus, the data collected at the individual plugs can be compressed, so that the data communication is more efficient. In addition, an embodiment may be advantageous in which at least one test node has a means for wireless data transmission from and to the host computer and / or for communication among test nodes. Furthermore, an advantageous embodiment is provided if the inputs and outputs of at least one test node are designed such that the power supply, the

Forwarding of energy and / or data transmission over any channel of the inputs or outputs can be done.

It is also advantageous if the detection and the

Signaling of contact errors of the wiring harness decentralized and / or centrally done. Thus, e.g. Signaling possible simultaneously on a computer and on a unit to be tested.

When testing the cable harness, it may be advantageous if, in the event of a malfunction of a test node, a signal is output, in particular a visible signal at the test node.

The object is also achieved by a method having the features of claim 9. First, connections are made between at least two test nodes for testing at least one connection with a plug in a harness to be tested.

In this case, each test node receives its operating energy and / or test signals via the test harness and the

Operating power and / or test signals are routed to other test nodes via the harness being tested.

It is particularly advantageous if the method for testing the harness during manufacture of the harness

Wiring harness is performed. This leads to a considerable time savings. In the figures, embodiments are described, showing a central Prüfansatz for a wiring harness according to the prior art; an embodiment of a test system for a wire harness according to the present invention; a representation of the power supply of an embodiment of the test system for a wiring harness according to the present invention; a representation of the data distribution of an embodiment of the test system for a wire harness according to the present invention; a representation of the data distribution in the system and the test of further connections for a wiring harness according to the present invention; a representation of a variant of

Data distribution to the embodiment of FIG. 5;

a representation of a variant of

Data distribution to the embodiment of FIG. 5;

Fig. 6 shows a representation of an embodiment of a test node. In Fig. 1, a structure for the testing of wire harnesses 10 is shown, which is a central Prüfansatz

represents, as it is known from the prior art.

A central test device 120 for the wiring harness 10 (highlighted in FIG. 1 by thick lines) is provided with an electrical power supply 100 and a

Host computer 110, e.g. a computer and / or a programmable logic controller (PLC) connected.

In the host computer 110 to be tested target state of the wiring harness 10 is deposited with the zu

determining actual state is to be compared.

For this, the central test facility 120 has two

Connections 121, 122.

The wiring harness 10 itself - also referred to as a test object - is connected to the central test device 120 via a harness connection 122. The wiring harness 10 has for this purpose a first connector 1, which is connected directly to the central test device 120. At all other ends of the wiring harness 10 more plugs 2, 3, 4, 5 are arranged. The other plugs 2, 3, 4, 5 can also communicate with each other via lines

be interconnected, as shown in Fig. 1 e.g.

between the fourth plug 4 and the fifth plug 5 is the case. The plugs 1, 2, 3, 4, 5 are in the

Usually not identical, since the use purposes are different in the technical system, not shown here. The plugs 2, 3, 4, 5, which are not at the central

Test device 120 are connected, each with a test plug 12, 13, 14, 15 coupled.

The test plugs 12, 13, 14, 15 are each over

individual lines are connected to a test line 121 at the central test facility 120.

The actual test of the wiring harness is done according to the prior art now by the admission of

Plugs 2, 3, 4, 5 with signals (and energy) via the test plugs 12, 13, 14, 15, which are connected via test leads 130 to the central test device. In addition to the wiring harness 10 thus exists an extensive

Wiring through the test leads 130 extending from the central test device 120 respectively over the

Test plug, 12, 13, 14, 15 to the plugs 2, 3, 4, 5 extends. In case of malfunction of the test plugs 12, 13, 14, 15 complex measures for fault finding must be initiated. In contrast, an embodiment for a test system according to the present invention is shown in Fig. 2, which can be used more efficiently.

The basic structure of the harness 10 to be tested

corresponds to the wiring harness shown in Fig. 1. Also in this structure, there is a power supply 100 and a host computer 110, which is responsible for the actual test. However, the central test device 120 with the test leads 130 connected thereto is not needed.

Rather, each plug 1, 2, 3, 4, 5 with a

Test nodes 21, 22, 23, 24, 25 coupled. Every one of them

Test node 21, 22, 23, 24, 25 is associated with a microcontroller 31, 32, 33, 34, 35. The first connector 1 forms the level 0 with the first test node 21 and the first microcontroller 31. All the other connectors 2, 3, 4, 5 then form together with the associated test nodes 22, 23, 24, 25 and

Microcontrollers 32, 33, 34, 35 the other levels.

In embodiments with very large connectors 2, 3, 4, 5 (high number of pins), it may be advantageous to couple more than one standardized test node 21 with each other. It is not necessary for each

Prüfaufgäbe to develop its own test node 21.

Thus, the power supply and the

Data connection for the test nodes 22, 23, 24, 25 via the harness 10 itself and not over the separate test leads 130. The usual test device, i. The test table for wiring harnesses is thus superfluous, since the test already on the production facility

can be carried out. Each plug 2, 3, 4, 5 must each only with a test node 22, 23, 24, 25th

be coupled, wherein the test node 22, 23, 24, 25 receives its energy and its test signals on the wiring harness 10 and / or the energy and the test signals are distributed over the wiring harness 10.

In alternative embodiments, the

Signaling of the test nodes 22, 23, 24, 25 or the power supply of the test nodes 22, 23, 24, 25 via separate lines. Experience has shown that in particular the saving of the separate lines 130 for the

Power supply to a reduction of the

Cabling effort. In Fig. 3 is a part of a test system analogous to FIG. 2 is shown in detail, in which case the

Energy supply of a second and third test node 23, 23 takes place via the first test node 21. The

associated microcontroller 31, 32, 33 are not shown here (see Fig. 4). Schematically is here

illustrated that the first test node 21 supplies the second test node 22 via the harness to be tested 10 with electrical energy, here via the switch Sl.

The second test node 22 is connected via the cable harness 10 with the third test node 23, so that this is supplied via the harness 10 with electrical energy. A separate external power supply of the second and third test nodes 22, 23 is not

necessary.

In the embodiment according to FIG. 3, an energy routing in which the first

Test node 21, the second test node 22 is energized. It is shown that the energy can also be forwarded to a third test node 23. The harness 10 (also referred to as Prüflings harness) serves to transfer energy from a power source 100 via the test nodes 21, 22, 23rd

The (logically) lowest test node 21 in the

Tree structure is called Basic Node (Level 0) and is by definition always the foremost one, since it is directly accessible via a CAN and / or the host computer 110. It is directly supplied with voltage (12V / 24V) and fed from the power supply 100.

Downstream test nodes 22, 23 (higher in the logical tree) are called sub-nodes (Level 1 to Level 3). Depending on the connection, a SUB node may be front or following. Overall, in the illustrated embodiment, the tree structure is limited to four levels and the total number of all nodes is limited to 64. Basically, more or fewer levels with more or less nodes can also be used

Use come.

For a power supply between two test nodes 21, 22, 23 there must be at least two direct connections. These are designated "supply" in Fig. 3. The positive voltage is connected via one connection and the GND connection via the other.

The voltage giving test node 21 is referred to herein as the front one (level n in the tree structure), the one connected to it is called the following test node 22 (level n + 1 in the tree structure).

When power is turned on, a simple short circuit test is first made by the front (level n) test node 21. For this purpose, it is first checked whether all

connected lines by their pullups 400 are high.

Subsequently, the GND connection to be tested is switched to GND. Via the pullup 400, an intermediate circuit capacitor, not shown here, of the following test node 22 (level n + 1) is slowly charged.

After a set time, the system shuts off briefly and checks the charge to detect a short circuit more quickly. (And turned back on, if not

Short circuit exists.)

Then the supply current source (level n)

turned on to the capacitor of the following

Test node 22 (level n + 1) to fully charge and thus ensure a regular supply. The current flows through the not shown here

Input diodes of the following test node 22. Test node 23, which are connected downstream in the tree structure (level n + 2, n + 3), are not loaded yet, since they have not been put through a GND potential.

In Fig. 4 is another view of a test system for a wire harness 10 is shown, wherein now the

Signal transmission for testing the second test node 22 is shown. The signal testing is generally carried out as described in connection with FIG

Energy routing.

The first test node 21 has a microcontroller 31, which has a data transmission means 311 for transmitting and receiving test data.

The microcontroller 31 in this case connects the data transmission means 311 for transmitting and receiving test data (e.g., test requests, test results) with the switches Sl, S2, with data on

corresponding means for receiving and transmitting data 321 of the second microcontroller 32 are transmitted. The second microcontroller 32 is connected to the second plug 2, not shown here, of the wiring harness 10 and now checks whether this plug 2 as

desired or not responded. The result is again transmitted via the cable harness 10 back via the first connector 1 to the host computer 110 and there, for example. evaluated and / or logged.

A power supply test is carried out via the switches S3, S4. The switches S5, S6 are tested in this case. With the present embodiment, thus any channels (ie lines in the harness 10) between the switches Sl to S6 of the test node 1 and the switches Sl to S6 of the test node 2 are linked together.

In Fig. 4 it is shown that there are only two connections between front test node 21 (level n) and the following test node 22 (level n + 1). Now about the

Line on which the power was turned on, the traffic (in Fig. 4 by the symbolic

digital signal indicates) started. If there are more lines, communication can also be via one

separate line (see, e.g., Fig. 5).

To send the power is the front

Test node 21 (level n) in short pulses off and on again and its transmit switch

turned on and off according to the data. The identifier of the front test node 21 (level n) is sent.

This is followed by a fixed time in which the (not shown here) link capacitor as

Energy storage of / the following test nodes 22, 23 is reloaded (level n + x).

After this time, the power is disabled again and the now loaded following test node responds by switching a transmit MOSFET not shown here against GND. The own identifier plus the understood identifier is sent. When the answer is sent, the front test node 21 reboots and loads the connected branch.

The following table shows the sequence of a communication, representing time per 100 milliseconds per state. Transistor Load Send Load Receive Load

Tl ON OFF ON OFF ON

T2 OFF Send, low OFF OFF OFF active

T3 OFF OFF OFF OFF

T4 OFF OFF OFF Send, low OFF active

Tl = current source of the front test node 21

T2 = transmitting MOSFET of the front test node 21

T3 = current source of the following test node 22

T4 = transmit MOSFET of the following test node 22

The break times have to be checked as they are

must be sufficient to provide the internal needs of the cascaded circuits.

There are several connections between the two

Test nodes are now using the above described communication (send ID, return own and

understood ID). After that, the next one will be

the following test nodes are activated.

The order is determined by the higher-level control system 110. This allows bidirectional switching in which each input can be an output and vice versa.

Thus, an examination of connections between

Test node 21, 22 possible by data transmission. This is now done in a next step, which is shown in Fig. 5. Basically, the same structure is shown. But now the first microcontroller 31 ensures that the data connection via the switches S5 and S6 is checked.

The transmitted data contain an identifier of the Transmitter and a number of the transmitting I / O (see eg Fig. 5A). As a result, misconnections or short circuits can be detected, because in this case the transmitted signal is received not only at the expected location but also elsewhere.

Since the power supply and / or the signal line via the wiring harness 10, there are less or no external wiring for the transmission of

Test signals to the wiring harness 10, the reception of the

Signals from the wiring harness 10 and to the

Power supply necessary.

A further advantage results if, irrespective of the assignment in a cable harness 10 for the same types of plug 1, 2, 3, 4, 5 (see FIG. 1), the same test node structure can always be used. This leads to a reduction of the mechanical variants of the

Test nodes. The assignment of the individual I / O points of the plug 1, 2, 3, 4, 5 can be freely selected by the embodiments described here, so that there must be only one test node structure for each physical plug type. This considerably increases the effort involved in the production and maintenance of the test devices

reduced.

FIG. 5A shows an embodiment in which each test node 21, 22 has sixteen switches S1 to S6 at eight inputs and outputs (I / O). The

Flexibility of the present embodiment allows a particularly flexible combination of the switches. Thus, a data transmission between the input and output E / Al of the first test node 21 and the input and output E / A2 of the second test node 22 via the input and output I / O 2 of the first test node 21 is a power supply of the on and output I / O 5 of the second test node 22. The wiring harness 10A in FIG. 5A shows a slightly different structure than the wiring harness 10 in FIG

Although all I / O ports are equal, the same physical setup may still be used in the second test node 22. This brings considerable advantages in terms of availability and reduces the necessary variants.

FIG. 5B shows a variant of the embodiment according to FIG. 5A, so that the corresponding description can be referred to. Here it is shown that it is also possible to test I / O of the same test node 21, 22 via the harness 10B.

By way of example, in FIG. 6, the assembly of a

Test node 21 shown. A CAN bus can be connected via the plug connections ST1, ST2. The plugs are electrically parallel and have the same assignment. This allows multiple modules with

standardized cables are simply cascaded.

The test node 21 has a Drehkodierschalter Bl, with a unique addressing is possible.

A two-color LED Dl is used to display a

Operating condition.

The test node 21 shown here has 16 freely programmable 24V I / O channels. These are located on a connector ST3. The pins 1 to 16 are assigned to the I / O channels 0 to 15. Reference sign list

1, 2, 3, 4, 5 connectors of the wiring harness

10, 10A, 10B wiring harness

12, 13, 14, 15 Test connector for connector of the wiring harness 21, 22, 23, 24, 25 Test node for connector of the wiring harness

31, 32, 33, 34, 35 microcontroller of the test node

100 energy supply test system

110 master computer

120 Central Test Facility

121 Connection for test leads to test plug

122 Wiring harness 130 test leads

311, 321 Data transmission means for test data

Bl rotary coding switch

Dl LED

ST1, ST2, ST3 plug connections

Claims

claims

A test system for a wiring harness, characterized by at least two test nodes (21, 22, 23, 24, 25) for testing at least one connection to a connector (1, 2, 3, 4, 5) in a harness to be tested (10 ), in which

at least one test node (21, 22, 23, 24, 25) so

is formed that its operating energy and / or

Test signals can be obtained and / or distributed over the harness to be tested (10) and across the test to be tested

Wiring harness (10) to other test nodes (21, 22, 23, 24, 25) are forwarded.

2. Test system according to claim 1, characterized

characterized in that all of the test nodes (21, 22, 23, 24, 25) are configured such that the operating power and / or test signals are obtainable and / or distributable over the harness (10) under test and over the one under test

Wiring harness (10) to other test nodes (21, 22, 23, 24, 25) are forwarded.

3. Test system according to claim 1 or 2, characterized

in that at least one test node (21, 22, 23, 24, 25) is provided with a data transmission means (311, 321) for the transmission of a test job from a

Host computer (110) to the individual test nodes (21, 22, 23, 24, 25) and / or for the transmission of the test result to the host computer (110) is coupled.

4. Test system according to at least one of the preceding

Claims, characterized in that at least one test node (21, 22, 23, 24, 25) with a

Microcontroller (31, 32, 33, 34, 35) for controlling the

Test node (21, 22, 23, 24, 25), in particular for its energy management, the communication with other test nodes (21, 22, 23, 24, 25), the communication with the control computer (110), the execution of the control computer (110)

transmitted test orders and / or the logging of the results.

5. Test system according to at least one of the preceding

Claims, characterized in that at least one test node (21, 22, 23, 24, 25) is a means for

wireless data transmission from and to the host computer and / or communication among test nodes (21, 22, 23, 24, 25).

6. Test system according to at least one of the preceding

Claims, characterized in that the

Inputs and outputs, at least one test node (21, 22, 23, 24, 25) are formed so that the power supply, the transmission of energy and / or the

Data transmission via any channel of the inputs or outputs can be done.

7. Test system according to at least one of the preceding

Claims, characterized in that the

Detection and signaling of contact errors of the wiring harness decentralized and / or centrally done.

8. Test system according to at least one of the preceding

Claims, characterized in that in the case of a malfunction of a test node (21, 22, 23, 24, 25) a signal output, in particular a visible signal, at the test node (21, 22, 23, 24, 25).

9. A method for testing a wiring harness, wherein a) connections between at least two test nodes (21, 22, 23, 24, 25) for testing at least one connection with a plug (1, 2, 3, 4, 5) in one to be tested

Wiring harness (10) are produced, wherein b) each test node (21, 22, 23, 24, 25) its

Operating power and / or test signals on the harness to be tested (10) relates and c) the operating power and / or the test signals via the test harness (10) to other test nodes (21, 22, 23, 24, 25) are forwarded.

10. The method according to claim 9, characterized

characterized in that it is carried out during the manufacture of the wiring harness.