WO2013065713A1 - Copper foil for printing circuit - Google Patents

Copper foil for printing circuit Download PDF

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Publication number
WO2013065713A1
WO2013065713A1 PCT/JP2012/078115 JP2012078115W WO2013065713A1 WO 2013065713 A1 WO2013065713 A1 WO 2013065713A1 JP 2012078115 W JP2012078115 W JP 2012078115W WO 2013065713 A1 WO2013065713 A1 WO 2013065713A1
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WO
WIPO (PCT)
Prior art keywords
copper foil
copper
layer
cobalt
surface area
Prior art date
Application number
PCT/JP2012/078115
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French (fr)
Japanese (ja)
Inventor
新井 英太
敦史 三木
Original Assignee
Jx日鉱日石金属株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jx日鉱日石金属株式会社 filed Critical Jx日鉱日石金属株式会社
Priority to JP2013541804A priority Critical patent/JP5913355B2/en
Priority to CN201280053785.8A priority patent/CN104024488B/en
Priority to KR1020147014501A priority patent/KR101623713B1/en
Publication of WO2013065713A1 publication Critical patent/WO2013065713A1/en

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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/10Electroplating with more than one layer of the same or of different metals
    • C25D5/12Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D1/00Electroforming
    • C25D1/04Wires; Strips; Foils
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D11/00Electrolytic coating by surface reaction, i.e. forming conversion layers
    • C25D11/38Chromatising
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/48After-treatment of electroplated surfaces
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/60Electroplating characterised by the structure or texture of the layers
    • C25D5/605Surface topography of the layers, e.g. rough, dendritic or nodular layers
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/60Electroplating characterised by the structure or texture of the layers
    • C25D5/615Microstructure of the layers, e.g. mixed structure
    • C25D5/617Crystalline layers
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/627Electroplating characterised by the visual appearance of the layers, e.g. colour, brightness or mat appearance
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/06Wires; Strips; Foils
    • C25D7/0614Strips or foils
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/382Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
    • H05K3/384Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by plating
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • C25D3/562Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of iron or nickel or cobalt
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • C25D3/58Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of copper
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0393Flexible materials
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/03Conductive materials
    • H05K2201/0332Structure of the conductor
    • H05K2201/0335Layered conductors or foils
    • H05K2201/0355Metal foils
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/022Processes for manufacturing precursors of printed circuits, i.e. copper-clad substrates

Definitions

  • the present invention relates to a copper foil for printed circuit, and in particular, after forming a primary particle layer of copper on the surface of the copper foil, a secondary particle layer by copper-cobalt-nickel alloy plating is formed thereon.
  • the present invention relates to a copper foil for a printed circuit that can reduce the occurrence of powder falling from the copper foil, increase the peel strength, and improve the heat resistance.
  • the copper foil for printed circuits of the present invention is particularly suitable for fine pattern printed circuits and flexible printed circuit boards, for example.
  • Copper and copper alloy foils have greatly contributed to the development of electrical and electronic industries, and are indispensable particularly as printed circuit materials.
  • Copper foil for printed circuit is generally used to produce a copper-clad laminate by laminating and bonding to a base material such as a synthetic resin board or film through an adhesive or under high temperature and high pressure without using an adhesive.
  • a necessary circuit is printed through a resist coating and exposure process, and then an etching process for removing unnecessary portions is performed. Finally, the required elements are soldered to form various printed circuit boards for the electronic device.
  • the copper foil for printed circuit boards differs in the surface (roughening surface) adhere
  • the requirements for the roughened surface formed on the copper foil are as follows: 1) No oxidation discoloration during storage, 2) High peel strength with substrate, high temperature heating, wet processing, soldering, chemicals It is sufficient even after treatment or the like, and 3) that there is no so-called lamination stain that occurs after lamination with the substrate and etching.
  • the roughening treatment of the copper foil plays a major role as determining the adhesiveness between the copper foil and the base material.
  • a copper roughening treatment in which electrodeposition of copper was initially employed was adopted, but various techniques were proposed thereafter, and copper--for the purpose of improving the heat-resistant peel strength, hydrochloric acid resistance and oxidation resistance.
  • Nickel roughening is established as one typical processing method.
  • the present applicant has proposed a copper-nickel roughening treatment (see Patent Document 1) and has achieved results.
  • the surface of the copper-nickel treatment is black, and particularly in the rolled foil for flexible substrates, this copper-nickel treatment black has been recognized as a symbol as a product.
  • the copper-nickel roughening treatment is excellent in heat-resistant peel strength, oxidation resistance, and hydrochloric acid resistance, it is difficult to etch with an alkaline etchant that has recently become important as a fine pattern treatment, and has a pitch of 150 ⁇ m.
  • an alkaline etchant that has recently become important as a fine pattern treatment, and has a pitch of 150 ⁇ m.
  • the processing layer becomes an etching residue. Therefore, the applicant has previously developed a Cu—Co treatment (see Patent Documents 2 and 3) and a Cu—Co—Ni treatment (see Patent Document 4) as fine pattern treatments.
  • the tendency of the circuit to be easily peeled off by the hydrochloric acid etching solution becomes stronger, and the prevention thereof is necessary.
  • the circuit becomes thinner, the circuit is also easily peeled off due to a high temperature during processing such as soldering, and the prevention thereof is also necessary.
  • As fine patterning progresses it is no longer an essential requirement to be able to etch a printed circuit having a pitch of 150 ⁇ m or less with a CuCl 2 etchant, for example, and alkali etching is becoming a necessary requirement with diversification of resists and the like.
  • the black surface is also important from the viewpoint of copper foil fabrication and chip mounting in terms of increasing alignment accuracy and heat absorption.
  • the present applicant formed a cobalt plating layer or a cobalt-nickel alloy plating layer on the surface of the copper foil and then formed a cobalt plating layer or a cobalt-nickel alloy plating layer.
  • it has many of the above-mentioned general properties, especially the above-mentioned properties comparable to Cu-Ni treatment, and it does not reduce the heat-resistant peel strength when using an acrylic adhesive,
  • rust prevention represented by chromium oxide single coating treatment or mixed coating treatment of chromium oxide and zinc and / or zinc oxide. Processing is performed.
  • the present inventor is concerned with the treatment of a copper foil for printed circuits in which a cobalt-nickel alloy plating layer is formed on the surface of the copper foil after a roughening treatment by copper-cobalt-nickel alloy plating, and further a zinc-nickel alloy plating layer is formed.
  • a cobalt-nickel alloy plating layer is formed on the surface of the copper foil after a roughening treatment by copper-cobalt-nickel alloy plating, and further a zinc-nickel alloy plating layer is formed.
  • Patent Document 6 Patent Document 7 and Patent Document 8 disclose initial techniques of roughening treatment by copper-cobalt-nickel alloy plating.
  • This powder-off phenomenon is a troublesome problem, and the roughened layer of copper-cobalt-nickel alloy plating is characterized by excellent adhesion to the resin layer and excellent heat resistance. Nevertheless, as described above, the particles easily fall off due to an external force, resulting in problems such as peeling due to “rubbing” during processing, contamination of the roll with peeling powder, and etching residue due to peeling powder.
  • JP-A-52-145769 Japanese Patent Publication No.63-2158 Japanese Patent Application No. 1-112227 Japanese Patent Application No. 1-112226 Japanese Patent Publication No. 6-54831 Japanese Patent No. 2849059 Japanese Patent Laid-Open No. 4-96395 JP-A-10-18075
  • the problem of the present invention is that a roughening treatment consisting of copper-cobalt-nickel alloy plating, which is the most basic, causes the dendritic coarsening particles to fall off from the surface of the copper foil and is generally referred to as powdering.
  • the present invention provides a printed circuit copper foil capable of suppressing processing unevenness, increasing peel strength, and improving heat resistance. Along with the development of electronic devices, the miniaturization and high integration of semiconductor devices have further advanced, and the processing performed in the manufacturing process of these printed circuits has become more severe. It is an object of the present invention to provide a technology that meets these requirements.
  • a copper foil for printed circuit in which a primary particle layer of copper is formed on the surface of the copper foil, and then a secondary particle layer of a ternary alloy composed of copper, cobalt and nickel is formed on the primary particle layer.
  • a copper foil for a printed circuit wherein a ratio of a three-dimensional surface area to a two-dimensional surface area by a laser microscope in a certain region of the roughened surface is 2.0 or more and less than 2.2.
  • the average particle diameter of the primary particle layer of copper is 0.25 to 0.45 ⁇ m
  • the average particle diameter of the secondary particle layer made of a ternary alloy made of copper, cobalt and nickel is 0.35 ⁇ m or less.
  • the printed circuit copper foil according to 1) which is characterized in that it is present.
  • a copper foil for a circuit can be provided.
  • the cobalt-nickel alloy plating layer may have a cobalt adhesion amount of 200 to 3000 ⁇ g / dm 2 and a cobalt ratio of 60 to 66 mass%.
  • the zinc-nickel alloy plating layer has a total amount in the range of 150 to 500 ⁇ g / dm 2 , a nickel amount in the range of 50 ⁇ g / dm 2 or more, and a nickel ratio in the range of 0.16 to 0.40.
  • -A nickel alloy plating layer can be formed.
  • a rust prevention treatment layer can be formed on the zinc-nickel alloy plating layer.
  • the independent film processing of chromium oxide or the mixed film processing layer of chromium oxide, zinc, and / or zinc oxide can be formed, for example.
  • a silane coupling layer can be formed on the mixed film treatment layer.
  • the printed circuit copper foil can produce a copper-clad laminate bonded to a resin substrate by thermocompression bonding without using an adhesive.
  • the most basic roughening treatment consisting of copper-cobalt-nickel alloy plating prevents dendritic rough particles from peeling off from the surface of the copper foil and generally preventing the phenomenon of powder falling.
  • the copper foil for printed circuits which can raise peel strength and can improve heat resistance is provided.
  • the number of abnormally grown dendritic and wedge-shaped particles is reduced and the particle diameter is uniform, so that the etching property is good and it is possible to eliminate rough particle residues at the resin substrate interface after copper foil etching. It becomes.
  • the miniaturization and high integration of semiconductor devices have further progressed, and the processing performed in the manufacturing process of these printed circuits has been made more severe. Has a technical effect to answer.
  • FIG. It is the microscope picture of the surface at the time of performing the roughening process which consists of copper-cobalt-nickel alloy plating on the conventional copper foil.
  • a primary particle layer is previously formed on a copper foil, and a secondary particle layer made of copper-cobalt-nickel alloy plating is formed on the primary particle layer. It is a micrograph.
  • the copper foil used in the present invention may be either an electrolytic copper foil or a rolled copper foil.
  • the surface of the copper foil that adheres to the resin base material that is, the roughened surface, has a “fisture” on the surface of the copper foil after degreasing for the purpose of improving the peel strength of the copper foil after lamination.
  • a roughening treatment is performed to perform electrodeposition.
  • the electrolytic copper foil has irregularities at the time of manufacture, the irregularities are further increased by enhancing the convex portions of the electrolytic copper foil by roughening treatment.
  • the content of treatment may be somewhat different between the rolled copper foil and the electrolytic copper foil.
  • a known treatment related to copper foil roughening is included as necessary, and is referred to as “roughening treatment”.
  • This roughening treatment is performed by copper-cobalt-nickel alloy plating (in the following explanation, the roughening treatment of copper-cobalt-nickel alloy plating is performed to clarify the difference from the previous step. Is called a “secondary particle layer”), as described above, simply forming a copper-cobalt-nickel alloy plating layer on a copper foil causes problems such as powder falling as described above. To do.
  • FIG. 3 shows a photomicrograph of the surface of the copper foil in which a copper-cobalt-nickel alloy plating layer is formed on the copper foil.
  • fine particles developed in a dendritic shape can be seen.
  • the fine particles developed in a dendritic shape shown in FIG. 3 are produced at a high current density.
  • particle nucleation during initial electrodeposition is suppressed, and new particle nuclei are formed at the tip of the particle. Will grow. Therefore, to prevent this, when electroplating is performed at a reduced current density, there is no sharp rise, the number of particles increases, and rounded particles grow. Even under such circumstances, powder falling is slightly improved, but sufficient peel strength cannot be obtained, which is not sufficient for achieving the object of the present invention.
  • the state of powder falling when the copper-cobalt-nickel alloy plating layer as shown in FIG. 3 is formed is shown in the conceptual explanatory diagram of FIG.
  • the cause of this powder fall is that fine particles are formed in a dendritic shape on the copper foil as described above.
  • the dendritic particles are easily broken by an external force and fall off from the root.
  • the fine dendritic particles cause peeling due to “rubbing” during the process, contamination of the roll with peeling powder, and etching residue due to peeling powder.
  • FIG. 4 shows a micrograph of the surface on which the primary particles and secondary particles are formed on the copper foil (details will be described later). This eliminates peeling due to "rubbing" during processing, dirt on the roll due to peeling powder, etching residue due to peeling powder, that is, it can suppress the phenomenon called powder falling and processing unevenness, increase peel strength, and The copper foil for printed circuits which can improve heat resistance can be obtained.
  • the average particle diameter of the primary particle layer is 0.25 to 0.45 ⁇ m, and the average particle diameter of the secondary particle layer made of a ternary alloy made of copper, cobalt and nickel is 0.35 or less ⁇ m. As is apparent from the examples shown in (1), this is the optimum condition for preventing powder falling.
  • the lower limit of the average particle diameter of the primary particle layer is preferably 0.27 ⁇ m, more preferably 0.29 ⁇ m, 0.30 ⁇ m, and 0.33 ⁇ m.
  • the upper limit of the average particle diameter of the primary particle layer is preferably 0.44 ⁇ m, more preferably 0.43 ⁇ m, 0.40 ⁇ m, and 0.39 ⁇ m or less.
  • the upper limit of the average particle diameter of the secondary particle layer is preferably 0.34 ⁇ m, more preferably 0.33 ⁇ m, 0.32 ⁇ m, 0.31 ⁇ m, 0.30 ⁇ m, 0.28 ⁇ m, 0.27 ⁇ m or less. preferable.
  • the lower limit of the average particle diameter of the secondary particle layer is not particularly limited. For example, 0.001 ⁇ m or more, or 0.01 ⁇ m or more, or 0.05 ⁇ m or more, or 0.09 ⁇ m or more, or 0.10 ⁇ m or more. Or 0.12 ⁇ m or more, or 0.15 ⁇ m or more.
  • the primary particle layer and the secondary particle layer are formed by an electroplating layer.
  • the secondary particles are characterized by one or more dendritic particles grown on the primary particles. Or normal plating grown on the primary particles. That is, in the present specification, when the term “secondary particle layer” is used, a normal plating layer such as overlay plating is also included. Further, the secondary particle layer may be a layer having one or more layers formed of roughened particles, or may be a layer having one or more normal plating layers, and is normal with a layer formed of roughened particles. A layer having one or more plating layers may be used.
  • the primary particle layer and the secondary particle layer thus formed can achieve an adhesive strength of 0.80 kg / cm or more, and further an adhesive strength of 0.90 kg / cm or more.
  • the ratio of the three-dimensional surface area to the two-dimensional surface area by a laser microscope in a certain region of the roughened surface is 2.0 or more and less than 2.2. It is to do.
  • the roughened surface of the copper foil is formed from a particle layer that is an aggregate of individual roughened particles, and the particle layer is in a macroscopic range than the particle growth control. By controlling with, there is no fluctuation, that is, it has the effect of improving the stable peel strength and preventing the stable powder falling phenomenon. Further, even if the size of each roughened particle is controlled, if fine roughened particles are stacked in the height direction, powder falling occurs. Therefore, it is important to limit and adjust the surface area ratio that provides a three-dimensional roughened particle structure.
  • the peel strength is insufficient.
  • the result of measuring the three-dimensional surface roughness of the standard rolled copper foil in a non-roughened state before the roughening treatment using a laser microscope is 20043 ⁇ m 2 and the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.02. Therefore, it can be said that at least 2.0 or more is desirable for securing the peel strength. Moreover, since it will become easy to generate
  • the upper limit of the surface area ratio (three-dimensional surface area ratio to two-dimensional surface area) is preferably 2.19, more preferably 2.17, and even more preferably 2.15.
  • the lower limit of the surface area ratio (three-dimensional surface area ratio to two-dimensional surface area) is preferably 2.02, more preferably 2.04, 2.05, and 2.06.
  • the measurement method using a laser microscope is to measure a three-dimensional surface area in a range equivalent to 100 ⁇ 100 ⁇ m of the roughened surface using a laser microscope VK8500 manufactured by Keyence Corporation, and in a range of 9944.4 ⁇ m 2 in actual data.
  • ⁇ Set by the method of 2D surface area surface area ratio.
  • a heat-resistant layer can be further formed on the secondary particle layer.
  • the plating conditions are shown below.
  • Liquid composition Nickel 5-20 g / L, Cobalt 1-8 g / L pH: 2-3
  • the present invention can further form the following heat-resistant layer on the secondary particle layer.
  • the plating conditions are shown below.
  • Liquid composition Nickel 2-30 g / L, Zinc 2-30 g / L pH: 3-4
  • the present invention can further form the following antirust layer.
  • the plating conditions are shown below.
  • conditions for the immersion chromate treatment are shown, but electrolytic chromate treatment may be used.
  • Liquid composition potassium dichromate 1-10 g / L, zinc 0-5 g / L pH: 3-4
  • Liquid temperature 50-60C
  • Current density 0-2A / dm 2 (for immersion chromate treatment)
  • Coulomb amount 0 to 2 As / dm 2 (for immersion chromate treatment)
  • Copper as the secondary particles - cobalt - nickel alloy plating, by electrolytic plating, coating weight of 10 ⁇ 30mg / dm 2 of copper -100 ⁇ 3000 ⁇ g / dm 2 of cobalt -50 ⁇ 500 ⁇ g / dm 2 3 ternary alloy of nickel A layer can be formed.
  • Co adhesion amount is less than 100 ⁇ g / dm 2 , the heat resistance is deteriorated and the etching property is also deteriorated.
  • the amount of Co deposition exceeds 3000 ⁇ g / dm 2 , it is not preferable when the influence of magnetism must be taken into consideration, etching spots occur, and deterioration of acid resistance and chemical resistance can be considered.
  • Ni adhesion amount When the Ni adhesion amount is less than 50 ⁇ g / dm 2 , the heat resistance deteriorates. On the other hand, when the Ni adhesion amount exceeds 500 ⁇ g / dm 2 , the etching property is lowered. That is, although it is not at a level where etching remains and etching cannot be performed, it becomes difficult to form a fine pattern.
  • Preferred Co deposition amount is 500 ⁇ 2000 ⁇ g / dm 2, and preferably nickel coating weight is 50 ⁇ 300 ⁇ g / dm 2.
  • copper - cobalt - deposition of nickel alloy plating it may be desirable is 10 ⁇ 30mg / dm 2 of copper -100 ⁇ 3000 ⁇ g / dm 2 of cobalt -50 ⁇ 500 ⁇ g / dm 2 of nickel.
  • Each adhesion amount of the ternary alloy layer is a desirable condition, and a range exceeding this amount is not denied.
  • the etching stain means that Co remains without being dissolved when etched with copper chloride
  • the etching residue means that Ni remains undissolved when alkaline etching is performed with ammonium chloride. It means to end.
  • an alkaline etching solution and a copper chloride based etching solution as described in the following examples are used. Although this etching solution and etching conditions are versatile, it should be understood that they are not limited to these conditions and can be arbitrarily selected.
  • a cobalt-nickel alloy plating layer can be formed on the roughened surface.
  • the cobalt-nickel alloy plating layer preferably has a cobalt adhesion amount of 200 to 3000 ⁇ g / dm 2 and a cobalt ratio of 60 to 66 mass%.
  • This treatment can be regarded as a kind of rust prevention treatment in a broad sense.
  • This cobalt-nickel alloy plating layer needs to be performed to such an extent that the adhesive strength between the copper foil and the substrate is not substantially lowered.
  • the amount of cobalt adhesion is less than 200 ⁇ g / dm 2 , the heat-resistant peel strength decreases, the oxidation resistance and chemical resistance deteriorate, and the treatment surface becomes reddish.
  • the amount of cobalt deposition exceeds 3000 ⁇ g / dm 2 , it is not preferable when the influence of magnetism must be taken into consideration, etching spots occur, and deterioration of acid resistance and chemical resistance is considered.
  • a preferable cobalt adhesion amount is 400 to 2500 ⁇ g / dm 2 .
  • the cobalt ratio is preferably 60 to 66 mass%.
  • the direct major cause of soft etching soaking is a heat-resistant rust-proof layer made of a zinc-nickel alloy plating layer, but cobalt can also cause the soaking of soft etching.
  • the above adjustment is a more desirable condition.
  • the nickel adhesion amount is small, the heat-resistant peel strength is lowered, and the oxidation resistance and chemical resistance are lowered. Further, when the nickel adhesion amount is too large, the alkali etching property is deteriorated, so it is desirable to determine the balance with the cobalt content.
  • a zinc-nickel alloy plating layer can be further formed on the cobalt-nickel alloy plating.
  • the total amount of the zinc-nickel alloy plating layer is 150 to 500 ⁇ g / dm 2 and the nickel ratio is 16 to 40% by mass. This has a role of a heat-resistant rust-proof layer.
  • This condition is also a preferable condition, and other known zinc-nickel alloy plating can be used. It will be understood that this zinc-nickel alloy plating is a preferred additional condition in the present invention.
  • the processing performed in the manufacturing process of the printed circuit becomes much higher, and there is heat generation during use of the device after it has become a product.
  • Nickel has an effect of suppressing penetration of an etching agent (etching aqueous solution of H 2 SO 4 : 10 wt%, H 2 O 2 : 2 wt%) used in soft etching.
  • the total amount of the zinc-nickel alloy plating layer is 150 to 500 ⁇ g / dm 2
  • the lower limit of the nickel ratio in the alloy layer is 16% by mass
  • the upper limit is 40% by mass
  • the nickel The content of 50 ⁇ g / dm 2 or more serves as a heat-resistant and rust-proof layer, suppresses the penetration of the etching agent used during soft etching, and prevents weakening of the joint strength of the circuit due to corrosion It has the effect that it can be done.
  • the heat and rust prevention ability is lowered and it becomes difficult to play a role as a heat and rust prevention layer, and if the total amount exceeds 500 ⁇ g / dm 2 The hydrochloric acid resistance tends to deteriorate.
  • the lower limit of the nickel ratio in the alloy layer is less than 16% by mass, the amount of penetration at the time of soft etching exceeds 9 ⁇ m, which is not preferable.
  • the upper limit value of 40% by mass of the nickel ratio is a technical limit value at which a zinc-nickel alloy plating layer can be formed.
  • a cobalt-nickel alloy plating layer and further a zinc-nickel alloy plating layer may be sequentially formed on the copper-cobalt-nickel alloy plating layer as the secondary particle layer as necessary. it can.
  • the total amount of cobalt and nickel deposited in these layers can also be adjusted. It is desirable that the total deposition amount of cobalt is 300 to 4000 ⁇ g / dm 2 and the total deposition amount of nickel is 150 to 1500 ⁇ g / dm 2 .
  • the total adhesion amount of cobalt is less than 300 ⁇ g / dm 2 , the heat resistance and chemical resistance are lowered, and when the total adhesion amount of cobalt exceeds 4000 ⁇ g / dm 2 , etching spots may occur. Moreover, if the total adhesion amount of nickel is less than 150 microgram / dm ⁇ 2 >, heat resistance and chemical resistance will fall. When the total adhesion amount of nickel exceeds 1500 ⁇ g / dm 2 , an etching residue is generated. Preferably, the total deposit of cobalt is 1500-3500 ⁇ g / dm 2 and the total deposit of nickel is 500-1000 ⁇ g / dm 2 . If the above conditions are satisfied, the conditions described in this paragraph need not be particularly limited.
  • a rust prevention treatment is performed as necessary.
  • a preferable antirust treatment is a coating treatment of chromium oxide alone or a mixture coating treatment of chromium oxide and zinc / zinc oxide.
  • Chromium oxide and zinc / zinc oxide mixture film treatment is a method of forming zinc or zinc oxide comprising zinc oxide and chromium oxide by electroplating using a plating bath containing zinc salt or zinc oxide and chromate. It is the process which coat
  • At least one kind of dichromate such as K 2 Cr 2 O 7 and Na 2 Cr 2 O 7 and CrO 3 and a water-soluble zinc salt such as ZnO 4 and ZnSO 4 ⁇ 7H are used.
  • a mixed aqueous solution of at least one kind such as 2 O and an alkali hydroxide is used.
  • a typical plating bath composition and electrolysis conditions are as follows.
  • the copper foil thus obtained has excellent heat resistance peel strength, oxidation resistance and hydrochloric acid resistance.
  • a printed circuit having a pitch of 150 ⁇ m or less can be etched with a CuCl 2 etching solution, and alkali etching can be performed. In addition, penetration into the circuit edge portion during soft etching can be suppressed.
  • the soft etching solution an aqueous solution of H 2 SO 4 : 10 wt% and H 2 O 2 : 2 wt% can be used. Processing time and temperature can be adjusted arbitrarily.
  • alkaline etching liquids for example, liquids such as NH 4 OH: 6 mol / liter, NH 4 Cl: 5 mol / liter, CuCl 2 : 2 mol / liter (temperature: 50 ° C.) are known.
  • the copper foil obtained in all the above steps has a black to gray color.
  • Black to gray is meaningful in terms of alignment accuracy and high heat absorption rate.
  • printed circuit boards including rigid boards and flexible boards are mounted with components such as ICs, resistors, and capacitors in an automatic process, and chip mounting is performed while reading circuits with sensors.
  • alignment on the copper foil treated surface may be performed through a film such as Kapton.
  • Kapton This also applies to positioning when forming a through hole.
  • the closer the processing surface is to black the better the light absorption and the higher the positioning accuracy.
  • the copper foil and the film are often cured and bonded together while applying heat. At this time, when heating is performed by using long waves such as far infrared rays and infrared rays, the heating efficiency is improved when the color tone of the treated surface is black.
  • silane treatment for applying a silane coupling agent to at least the roughened surface on the rust preventive layer is performed mainly for the purpose of improving the adhesive force between the copper foil and the resin substrate.
  • the silane coupling agent used for the silane treatment include olefin silane, epoxy silane, acrylic silane, amino silane, and mercapto silane, which can be appropriately selected and used.
  • the application method may be any of spraying a silane coupling agent solution by spraying, coating with a coater, dipping, pouring and the like.
  • 60-15654 describes that the adhesion between a copper foil and a resin substrate is improved by subjecting the rough surface of the copper foil to a chromate treatment followed by a silane coupling agent treatment. . Refer to this for details. Thereafter, if necessary, an annealing treatment may be performed for the purpose of improving the ductility of the copper foil.
  • a present Example is an example to the last, and is not restrict
  • 18 ⁇ m of standard rolled copper foil TPC (tough pitch copper standardized in JIS H3100 C1100) was used for the raw foils of the following examples and comparative examples.
  • Example 1 to Example 8 A primary particle layer (Cu) and a secondary particle layer (copper-cobalt-nickel alloy plating) were formed on the rolled copper foil under the conditions shown below.
  • the bath composition and plating conditions used are as follows. [Bath composition and plating conditions]
  • the tertiary of the roughened surface with respect to the two-dimensional surface area by a laser microscope
  • the ratio of the original surface area was 2.0 or more and less than 2.2.
  • the surface area was measured by the measurement method using the laser microscope.
  • the bath composition and plating conditions used are as follows.
  • Table 1 shows the results of measuring the ratio of the three-dimensional surface area to the two-dimensional surface area of the fixed area of the diameter, powder fall, peel strength, heat resistance, and roughened surface by a laser microscope.
  • the average particle diameters of the primary particles and secondary particles of the roughened surface were observed with a magnification of 30000 times using S4700 manufactured by Hitachi High-Technologies Corporation, and the particle diameter was measured.
  • the powder-off characteristics are based on the appearance of the tape discoloring due to the falling roughened particles adhering to the adhesive surface of the tape when a transparent mending tape is applied on the roughened surface of the copper foil. Evaluated. That is, when there was no or slight discoloration of the tape, the powder was OK, and when the tape was gray, the powder was NG.
  • the copper foil roughened surface and the FR4 resin substrate are bonded together by hot pressing to prepare a copper clad laminate, and a 10 mm circuit is prepared using a general copper chloride circuit etchant. The normal peel strength was measured while peeling the foil from the substrate and pulling it in the 90 ° direction. Moreover, the same result is shown in Table 1 as a comparative example.
  • plating was further performed with a current density of forming primary particles of 20 A / dm 2 and a coulomb amount of 30 As / dm 2 . It shows that.
  • Example 1 the current density for forming primary particles is 65 A / dm 2 and 20 A / dm 2 , and the coulomb amounts are 80 As / dm 2 and 30 As / dm 2. This is a case where 28 A / dm 2 is set and the coulomb amount is 20 As / dm 2 .
  • the current density and the amount of Coulomb which form primary particles are two steps, when forming primary particles normally, two steps of electroplating are required. That is, the plating conditions for the first stage core particle formation and the electroplating for the second stage core particle growth.
  • the first plating conditions are electroplating conditions for forming the first stage nucleating particles, and the second plating conditions are electroplating conditions for growing the second stage nucleating particles. The same applies to the following examples and comparative examples, and the description is omitted.
  • the average particle diameter of the primary particles was 0.45 ⁇ m
  • the average particle diameter of the secondary particles was 0.30 ⁇ m
  • the three-dimensional surface area by the laser microscope after the particle formation was 21589 ⁇ m 2 .
  • the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.18, which satisfies the conditions of the present invention.
  • Example 2 the current density for forming the primary particles is 65 A / dm 2 and 2 A / dm 2 , and the coulomb amounts are 80 As / dm 2 and 4 As / dm 2. This is a case where 25 A / dm 2 and the coulomb amount are 15 As / dm 2 .
  • the average particle diameter of primary particles was 0.40 ⁇ m
  • the average particle diameter of secondary particles was 0.15 ⁇ m
  • the surface area after particle formation by a laser microscope was 20978 ⁇ m 2 .
  • the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.11, which satisfies the conditions of the present invention.
  • Example 3 the current density for forming the primary particles is 60 A / dm 2 and 10 A / dm 2 , and the coulomb amounts are 80 As / dm 2 and 20 As / dm 2. This is a case where 25 A / dm 2 and the coulomb amount are 30 As / dm 2 .
  • the average particle diameter of the primary particles was 0.30 ⁇ m
  • the average particle diameter of the secondary particles was 0.25 ⁇ m
  • the three-dimensional surface area after forming the particles by a laser microscope was 21010 ⁇ m 2 .
  • the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.12, which satisfies the conditions of the present invention. There was no powder fall.
  • the normal peel strength is as high as 0.92 kg / cm, and the heat resistance deterioration rate (the peel strength after heating at 180 ° C. for 48 hours after the normal peel measurement is taken as the deterioration rate) is as small as 30% or less. It had the characteristics.
  • Example 4 the current density for forming the primary particles is 55 A / dm 2 and 1 A / dm 2 , and the coulomb amounts are 75 As / dm 2 and 5 As / dm 2. This is a case where 25 A / dm 2 and the coulomb amount are 30 As / dm 2 .
  • the average particle diameter of the primary particles was 0.35 ⁇ m
  • the average particle diameter of the secondary particles was 0.25 ⁇ m
  • the surface area after forming the particles by a laser microscope was 20847 ⁇ m 2 .
  • the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.10, which satisfies the conditions of the present invention. No powder fall off, normal peel strength is as high as 0.94 kg / cm, heat resistance deterioration rate (measured peel strength after heating at 180 ° C for 48 hours after measurement of normal peel, and the difference was taken as the deterioration rate) 30% It had the following small features.
  • Example 5 the current density for forming the primary particles is 50 A / dm 2 and 5 A / dm 2 , and the coulomb amounts are 70 As / dm 2 and 10 As / dm 2. This is a case where 25 A / dm 2 and the coulomb amount are 30 As / dm 2 .
  • the average particle diameter of the primary particles was 0.30 ⁇ m
  • the average particle diameter of the secondary particles was 0.25 ⁇ m
  • the surface area after forming the particles by a laser microscope was 20738 ⁇ m 2 .
  • the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.09, which satisfies the conditions of the present invention.
  • No powder fall off, normal peel strength is as high as 0.91 kg / cm, heat resistance deterioration rate (measured peel strength after heating at 180 ° C for 48 hours after measurement of normal peel and the difference was taken as the deterioration rate) 30% It had the following small features.
  • Example 6 the current density for forming the primary particles is 50 A / dm 2 and 2 A / dm 2 , and the coulomb amounts are 70 As / dm 2 and 3 As / dm 2. This is a case where 15 A / dm 2 and the coulomb amount are 30 As / dm 2 .
  • the average particle diameter of the primary particles is 0.25 ⁇ m, and the secondary particles are almost covered (normal) in a plated state (particle diameter is less than 0.1 ⁇ m), and the surface area after the particle formation by the laser microscope is 20112 ⁇ m 2. It was.
  • the ratio of the three-dimensional surface area to the two-dimensional surface area was 2.03, which satisfied the conditions of the present invention.
  • Example 7 is a case where the current density for forming primary particles is 60 A / dm 2 and 15 A / dm 2 , and the coulomb amounts are 80 As / dm 2 and 20 As / dm 2. Secondary particles (secondary particle layer) and 20A / dm 2 current density for forming a, after the plating covered the coulomb quantity as 60As / dm 2 (normal plating), further a current density was 20A / dm 2, forming a particle as coulombs 20AS / dm 2 This is the case.
  • the primary particle has an average particle size of 0.35 ⁇ m
  • the secondary particles are covered (normal) in a plated state (particle size is less than 0.1 ⁇ m), and the average particle size is 0.15 ⁇ m.
  • the surface area after particle formation was 20975 ⁇ m 2 . Since the two-dimensional surface area of the same region is 9924.4 ⁇ m 2 (which corresponds to an area of 100 ⁇ 100 ⁇ m), the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.11, which satisfies the conditions of the present invention.
  • Example 8 is a case where the current density for forming the primary particles is 40 A / dm 2 and 1 A / dm 2 and the coulomb amounts are 40 As / dm 2 and 2 As / dm 2. This is a case where 20 A / dm 2 is set and the coulomb amount is 20 As / dm 2 .
  • the average particle diameter of the primary particles was 0.15 ⁇ m
  • the average particle diameter of the secondary particles was 0.15 ⁇ m
  • the surface area after formation of the particles was 20345 ⁇ m 2 .
  • the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.05, which satisfies the conditions of the present invention. Powder fall did not occur.
  • the normal peel strength was 0.75 kg / cm, and the heat resistance deterioration rate (the peel strength after heating at 180 ° C. for 48 hours after measurement of the normal peel was measured and the difference was taken as the deterioration rate) was 35%. .
  • the comparative example has the following results.
  • the current density for forming primary particles is 63 A / dm 2 and 10 A / dm 2
  • the coulomb amounts are 80 As / dm 2 and 30 As / dm 2
  • the secondary particles are not formed. It is.
  • the average particle diameter of primary particles was 0.50 ⁇ m
  • the surface area after the formation of particles by a laser microscope was 20804 ⁇ m 2 .
  • the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.10, which satisfies the conditions of the present invention.
  • the normal peel strength was as high as 0.94 kg / cm, which was an example level.
  • the heat resistance deterioration rate (the peel strength after heating at 180 ° C. for 48 hours after measuring the normal state peel and the difference as the deterioration rate) was 60%, which was extremely bad.
  • the overall evaluation as a printed circuit copper foil was poor.
  • Comparative Example 2 shows a conventional example in which there is no primary particle size and only a secondary particle layer. That is, the current density for forming the secondary particles is 50 A / dm 2 and the coulomb amount is 30 As / dm 2 . As a result, the average particle diameter of the secondary particles was 0.30 ⁇ m, and the three-dimensional surface area after the formation of particles by a laser microscope was 21834 ⁇ m 2 . Since the two-dimensional surface area of the same region is 9924.4 ⁇ m 2 (which corresponds to an area of 100 ⁇ 100 ⁇ m), the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.20, which does not satisfy the conditions of the present invention. A large amount of powdered coarse particles occurred.
  • Normal peel strength is 0.90 kg / cm, which is an example level
  • heat resistance deterioration rate measured peel strength after heating at 180 ° C. for 48 hours after measurement of normal peel, and the difference was taken as the deterioration rate
  • the current density for forming the primary particles is 63 A / dm 2 and 1 A / dm 2
  • the coulomb amounts are 80 As / dm 2 and 2 As / dm 2.
  • 28 A / dm 2 is set and the coulomb amount is 73 As / dm 2
  • the average particle diameter of the primary particles was 0.35 ⁇ m
  • the average particle diameter of the secondary particles was 0.60 ⁇ m
  • the three-dimensional surface area after forming the particles by a laser microscope was 21797 ⁇ m 2 .
  • the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.20, which does not satisfy the conditions of the present invention.
  • the normal peel strength is as high as 0.93 kg / cm and the heat resistance deterioration rate (the peel strength after heating at 180 ° C. for 48 hours after the normal peel measurement is taken as the deterioration rate) is less than 30% Although it was an example level, a large amount of powder falling occurred.
  • the overall evaluation as a printed circuit copper foil was poor.
  • the current density for forming the primary particles is 63 A / dm 2 and 1 A / dm 2
  • the coulomb amounts are 80 As / dm 2 and 2 As / dm 2.
  • 31 A / dm 2 and the coulomb amount is 40 As / dm 2 .
  • the average particle diameter of the primary particles was 0.35 ⁇ m
  • the average particle diameter of the secondary particles was 0.40 ⁇ m
  • the surface area after particle formation was 22448 ⁇ m 2 .
  • the ratio of the three-dimensional surface area to the two-dimensional surface area was 2.26, which did not satisfy the conditions of the present invention.
  • the normal peel strength is as high as 0.91 kg / cm and the heat resistance deterioration rate (the peel strength after heating at 180 ° C. for 48 hours after the normal peel measurement is taken as the deterioration rate) is less than 30% although it was an example level, a large amount of powder falling occurred. The overall evaluation as a printed circuit copper foil was poor.
  • the current density for forming the primary particles is 63 A / dm 2 and 10 A / dm 2
  • the coulomb amounts are 80 As / dm 2 and 30 As / dm 2.
  • 31 A / dm 2 and the coulomb amount is 40 As / dm 2 .
  • the average particle diameter of the primary particles was 0.50 ⁇ m
  • the average particle diameter of the secondary particles was 0.40 ⁇ m
  • the surface area after particle formation was 22086 ⁇ m 2 .
  • the ratio of the three-dimensional surface area to the two-dimensional surface area was 2.23, which did not satisfy the conditions of the present invention.
  • the normal peel strength is 0.91 kg / cm and the heat resistance deterioration rate (the peel strength after heating at 180 ° C. for 48 hours after the normal peel measurement is taken as the difference) is as small as 30% or less. Although it was an example level, powder fall occurred. The overall evaluation as a printed circuit copper foil was poor.
  • the average particle size of the primary particle layer is 0.25 to 0.45 ⁇ m, and the average particle size of the secondary particle layer made of a ternary alloy made of copper, cobalt and nickel is 0.35 ⁇ m or less. It is more effective in achieving the effect.
  • a secondary particle layer composed of copper-cobalt-nickel alloy plating
  • the roughened particles formed in a dendritic shape peel off from the surface of the copper foil
  • the number of abnormally grown particles is reduced, the particle diameter is uniform, and the entire surface is covered, so that the etching property is good and the circuit can be formed with high accuracy, so that the semiconductor device can be downsized and highly integrated. It is useful as a printed circuit material for advanced electronic equipment.

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Abstract

Provided is a copper foil for a printing circuit in which after a first particle layer of copper is formed on the surface of a copper foil, a second particle layer of a ternary alloy comprising copper, cobalt and nickel is formed on top of the first particle layer. The copper foil for a printing circuit is characterized by the ratio of the three-dimensional surface area with respect to the two-dimensional surface area for a given region of a roughened face being at least 2.0 and no more than 2.2 according to laser microscope. The copper foil for a printing circuit as described in claim 1 is characterized by an average particle diameter of 0.25 to 0.45µm for the first particle layer of copper, and an average particle diameter of 0.35µm or less for the second particle layer of a ternary alloy comprising copper, cobalt and nickel.

Description

印刷回路用銅箔Copper foil for printed circuit
本発明は、印刷回路用銅箔に関するものであり、特に銅箔の表面に、銅の一次粒子層を形成した後、その上に銅-コバルト-ニッケル合金めっきによる二次粒子層を形成した、銅箔からの粉落ちの発生を減少させ、ピール強度を高め、かつ耐熱性を向上させることのできる印刷回路用銅箔に関する。
 本発明の印刷回路用銅箔は、例えばファインパターン印刷回路及びフレキシブルプリント配線板( Flexible Printed Circuit )に、特に適する。
The present invention relates to a copper foil for printed circuit, and in particular, after forming a primary particle layer of copper on the surface of the copper foil, a secondary particle layer by copper-cobalt-nickel alloy plating is formed thereon. The present invention relates to a copper foil for a printed circuit that can reduce the occurrence of powder falling from the copper foil, increase the peel strength, and improve the heat resistance.
The copper foil for printed circuits of the present invention is particularly suitable for fine pattern printed circuits and flexible printed circuit boards, for example.
銅及び銅合金箔(以下銅箔と称する)は、電気・電子関連産業の発展に大きく寄与しており、特に印刷回路材として不可欠の存在となっている。印刷回路用銅箔は一般に、合成樹脂ボード、フィルム等の基材に接着剤を介して、又は接着剤を使用せずに高温高圧下で積層接着して銅張積層板を製造し、その後目的とする回路を形成するために、レジスト塗布及び露光工程を経て必要な回路を印刷した後、不要部を除去するエッチング処理が施される。
最終的に、所要の素子が半田付けされて、エレクトロニクスデバイス用の種々の印刷回路板を形成する。印刷回路板用銅箔は、樹脂基材と接着される面(粗化面)と非接着面(光沢面)とで異なるが、それぞれ多くの方法が提唱されている。
Copper and copper alloy foils (hereinafter referred to as copper foils) have greatly contributed to the development of electrical and electronic industries, and are indispensable particularly as printed circuit materials. Copper foil for printed circuit is generally used to produce a copper-clad laminate by laminating and bonding to a base material such as a synthetic resin board or film through an adhesive or under high temperature and high pressure without using an adhesive. In order to form a circuit, a necessary circuit is printed through a resist coating and exposure process, and then an etching process for removing unnecessary portions is performed.
Finally, the required elements are soldered to form various printed circuit boards for the electronic device. Although the copper foil for printed circuit boards differs in the surface (roughening surface) adhere | attached with a resin base material, and a non-adhesion surface (glossy surface), many methods are each proposed.
例えば、銅箔に形成される粗化面に対する要求としては、主として、1)保存時における酸化変色のないこと、2)基材との引き剥し強さが高温加熱、湿式処理、半田付け、薬品処理等の後でも充分なこと、3)基材との積層、エッチング後に生じる、いわゆる積層汚点のないこと等が挙げられる。
銅箔の粗化処理は、銅箔と基材との接着性を決定するものとして、大きな役割を担っている。この粗化処理としては、当初銅を電着する銅粗化処理が採用されていたが、その後、様々な技術が提唱され、耐熱剥離強度、耐塩酸性及び耐酸化性の改善を目的として銅-ニッケル粗化処理が一つの代表的処理方法として定着するようになっている。
本件出願人は、銅-ニッケル粗化処理を提唱し(特許文献1参照)、成果を納めてきた。銅-ニッケル処理表面は黒色を呈し、特にフレキシブル基板用圧延処理箔では、この銅-ニッケル処理の黒色が商品としてのシンボルとして認められるに至っている。
For example, the requirements for the roughened surface formed on the copper foil are as follows: 1) No oxidation discoloration during storage, 2) High peel strength with substrate, high temperature heating, wet processing, soldering, chemicals It is sufficient even after treatment or the like, and 3) that there is no so-called lamination stain that occurs after lamination with the substrate and etching.
The roughening treatment of the copper foil plays a major role as determining the adhesiveness between the copper foil and the base material. As this roughening treatment, a copper roughening treatment in which electrodeposition of copper was initially employed was adopted, but various techniques were proposed thereafter, and copper--for the purpose of improving the heat-resistant peel strength, hydrochloric acid resistance and oxidation resistance. Nickel roughening is established as one typical processing method.
The present applicant has proposed a copper-nickel roughening treatment (see Patent Document 1) and has achieved results. The surface of the copper-nickel treatment is black, and particularly in the rolled foil for flexible substrates, this copper-nickel treatment black has been recognized as a symbol as a product.
しかしながら、銅-ニッケル粗化処理は、耐熱剥離強度及び耐酸化性並びに耐塩酸性に優れる反面で、近時ファインパターン用処理として重要となってきたアルカリエッチング液でのエッチングが困難であり、150μmピッチ回路巾以下のファインパターン形成時に処理層がエッチング残となってしまう。
そこで、ファインパターン用処理として、本件出願人は、先にCu-Co処理(特許文献2及び特許文献3参照)及びCu-Co-Ni処理(特許文献4参照)を開発した。
これら粗化処理は、エッチング性、アルカリエッチング性及び耐塩酸性については、良好であったが、アクリル系接着剤を用いたときの耐熱剥離強度が低下することが改めて判明し、また耐酸化性も所期程充分ではなくそして色調も黒色までには至らず、茶乃至こげ茶色であった。
However, while the copper-nickel roughening treatment is excellent in heat-resistant peel strength, oxidation resistance, and hydrochloric acid resistance, it is difficult to etch with an alkaline etchant that has recently become important as a fine pattern treatment, and has a pitch of 150 μm. When forming a fine pattern having a circuit width or less, the processing layer becomes an etching residue.
Therefore, the applicant has previously developed a Cu—Co treatment (see Patent Documents 2 and 3) and a Cu—Co—Ni treatment (see Patent Document 4) as fine pattern treatments.
These roughening treatments were good in terms of etching property, alkali etching property and hydrochloric acid resistance, but again proved that the heat-resistant peel strength was reduced when an acrylic adhesive was used, and oxidation resistance was also improved. It was not enough as expected and the color did not reach black, and it was brown to dark brown.
最近の印刷回路のファインパターン化及び多様化への趨勢にともない、1)Cu-Ni処理の場合に匹敵する耐熱剥離強度(特にアクリル系接着剤を用いたとき)及び耐塩酸性を有すること、2)アルカリエッチング液で150μmピッチ回路巾以下の印刷回路をエッチングできること、3)Cu-Ni処理の場合と同様に、耐酸化性(180℃×30分のオーブン中での耐酸化性)を向上すること、4)Cu-Ni処理の場合と同様の黒化処理であることが更に要求されるようになった。 With recent trend toward fine patterning and diversification of printed circuits, 1) having heat-resistant peel strength (particularly when using an acrylic adhesive) and hydrochloric acid resistance comparable to those of Cu-Ni treatment. 3) Able to etch a printed circuit with a pitch of 150 μm or less with an alkaline etchant 3) Improve oxidation resistance (oxidation resistance in an oven at 180 ° C. × 30 minutes) as in the case of Cu—Ni treatment 4) Blackening treatment similar to that in the case of Cu—Ni treatment is further required.
即ち、回路が細くなると、塩酸エッチング液により回路が剥離し易くなる傾向が強まり、その防止が必要である。回路が細くなると、半田付け等の処理時の高温により回路がやはり剥離し易くなり、その防止もまた必要である。ファインパターン化が進む現在、例えばCuClエッチング液で150μmピッチ回路巾以下の印刷回路をエッチングできることはもはや必須の要件であり、レジスト等の多様化にともないアルカリエッチングも必要要件となりつつある。黒色表面も、位置合わせ精度及び熱吸収を高めることの点で銅箔の製作及びチップマウントの観点から重要となっている。 That is, as the circuit becomes thinner, the tendency of the circuit to be easily peeled off by the hydrochloric acid etching solution becomes stronger, and the prevention thereof is necessary. When the circuit becomes thinner, the circuit is also easily peeled off due to a high temperature during processing such as soldering, and the prevention thereof is also necessary. As fine patterning progresses, it is no longer an essential requirement to be able to etch a printed circuit having a pitch of 150 μm or less with a CuCl 2 etchant, for example, and alkali etching is becoming a necessary requirement with diversification of resists and the like. The black surface is also important from the viewpoint of copper foil fabrication and chip mounting in terms of increasing alignment accuracy and heat absorption.
こうした要望に答えて、本出願人は、銅箔の表面に銅-コバルト-ニッケル合金めっきによる粗化処理後、コバルトめっき層或いはコバルト-ニッケル合金めっき層を形成することにより、印刷回路銅箔として上述した多くの一般的特性を具備することは勿論のこと、特にCu-Ni処理と匹敵する上述した諸特性を具備し、しかもアクリル系接着剤を用いたときの耐熱剥離強度を低下せず、耐酸化性に優れそして表面色調も黒色である銅箔処理方法を開発することに成功した(特許文献5参照)。
好ましくは、前記コバルトめっき層或いはコバルト-ニッケル合金めっき層を形成した後に、クロム酸化物の単独皮膜処理或いはクロム酸化物と亜鉛及び(又は)亜鉛酸化物との混合皮膜処理を代表とする防錆処理が施される。
In response to these demands, the present applicant formed a cobalt plating layer or a cobalt-nickel alloy plating layer on the surface of the copper foil and then formed a cobalt plating layer or a cobalt-nickel alloy plating layer. Of course, it has many of the above-mentioned general properties, especially the above-mentioned properties comparable to Cu-Ni treatment, and it does not reduce the heat-resistant peel strength when using an acrylic adhesive, We have succeeded in developing a copper foil treatment method that has excellent oxidation resistance and a black surface color (see Patent Document 5).
Preferably, after the cobalt plating layer or the cobalt-nickel alloy plating layer is formed, rust prevention represented by chromium oxide single coating treatment or mixed coating treatment of chromium oxide and zinc and / or zinc oxide. Processing is performed.
その後、電子機器の発展が進む中で、半導体デバイスの小型化、高集積化が更に進み、これらの印刷回路の製造工程で行われる処理が一段と高温となりまた製品となった後の機器使用中の熱発生により、銅箔と樹脂基材との間での接合力の低下があらためて問題となるようになった。
このようなことから、特許文献5において確立された銅箔の表面に銅-コバルト-ニッケル合金めっきによる粗化処理後、コバルトめっき層或いはコバルト-ニッケル合金めっき層を形成する印刷回路用銅箔の処理方法において、耐熱剥離性を改善する発明を行った。
Later, as the development of electronic devices progressed, the miniaturization and high integration of semiconductor devices further progressed, and the processing performed in the manufacturing process of these printed circuits became even higher and the devices were in use after becoming products. Due to heat generation, a decrease in the bonding force between the copper foil and the resin base material has become a problem.
For this reason, a copper foil for a printed circuit in which a cobalt plating layer or a cobalt-nickel alloy plating layer is formed on the surface of the copper foil established in Patent Document 5 after a roughening treatment by copper-cobalt-nickel alloy plating is provided. In the processing method, an invention for improving the heat-resistant peelability was performed.
これは、銅箔の表面に銅-コバルト-ニッケル合金めっきによる粗化処理後、コバルト-ニッケル合金めっき層を形成し、更に亜鉛-ニッケル合金めっき層を形成する印刷回路用銅箔の処理方法である。非常に有効な発明であり、今日の、銅箔回路材料の主要製品の一つとなっている。 This is a method for treating a copper foil for a printed circuit in which a cobalt-nickel alloy plating layer is formed on the surface of the copper foil after a roughening treatment by copper-cobalt-nickel alloy plating, and further a zinc-nickel alloy plating layer is formed. is there. It is a very effective invention and has become one of the main products of copper foil circuit materials today.
銅箔の表面に銅-コバルト-ニッケル合金めっきによる粗化処理後、コバルト-ニッケル合金めっき層を形成し、更に亜鉛-ニッケル合金めっき層を形成する印刷回路用銅箔の処理について、本発明者は多くの提案を行い、印刷回路用銅箔の特性に、いくつか大きな進展があった。銅-コバルト-ニッケル合金めっきによる粗化処理の初期の技術は、特許文献6、特許文献7、特許文献8に開示されている。 The present inventor is concerned with the treatment of a copper foil for printed circuits in which a cobalt-nickel alloy plating layer is formed on the surface of the copper foil after a roughening treatment by copper-cobalt-nickel alloy plating, and further a zinc-nickel alloy plating layer is formed. Made many proposals and made some significant progress in the characteristics of copper foil for printed circuits. Patent Document 6, Patent Document 7, and Patent Document 8 disclose initial techniques of roughening treatment by copper-cobalt-nickel alloy plating.
しかし、このような最も基本的な、銅箔の表面に形成された銅-コバルト-ニッケル合金めっきからなる粗化粒子の形状が樹枝状であるために、この樹枝の上部又は根元から剥がれ落ち、一般に粉落ち現象と言われる問題が発生した。 However, since the shape of the roughened particles composed of the copper-cobalt-nickel alloy plating formed on the surface of the copper foil is dendritic, it peels off from the upper part or the root of the dendron, A problem commonly referred to as the powdering phenomenon occurred.
この粉落ち現象は厄介な問題であり、銅-コバルト-ニッケル合金めっきの粗化処理層は、樹脂層との密着性に優れており、耐熱性にも優れているという特徴を有しているにもかかわらず、上記の通り、外力により粒子が脱落し易く、処理中の「こすれ」による剥離、剥離粉によるロールの汚れ、剥離粉によるエッチング残渣が生ずるという問題を生じた。 This powder-off phenomenon is a troublesome problem, and the roughened layer of copper-cobalt-nickel alloy plating is characterized by excellent adhesion to the resin layer and excellent heat resistance. Nevertheless, as described above, the particles easily fall off due to an external force, resulting in problems such as peeling due to “rubbing” during processing, contamination of the roll with peeling powder, and etching residue due to peeling powder.
特開昭52-145769号公報JP-A-52-145769 特公昭63-2158号公報Japanese Patent Publication No.63-2158 特願平1-112227号公報Japanese Patent Application No. 1-112227 特願平1-112226号公報Japanese Patent Application No. 1-112226 特公平6-54831号公報Japanese Patent Publication No. 6-54831 特許第2849059号公報Japanese Patent No. 2849059 特開平4-96395号公報Japanese Patent Laid-Open No. 4-96395 特開平10-18075号公報JP-A-10-18075
本発明の課題は、最も基本的な、銅-コバルト-ニッケル合金めっきからなる粗化処理において、樹枝状に形成される粗化粒子が銅箔の表面から剥がれ落ち、一般に粉落ちと言われる現象、処理ムラを抑制し、ピール強度を高め、かつ耐熱性を向上させることのできる印刷回路用銅箔を提供するものである。電子機器の発展が進む中で、半導体デバイスの小型化、高集積化が更に進み、これらの印刷回路の製造工程で行われる処理が一段と厳しい要求がなされている。本願発明をこれらの要求に応える技術を提供することを課題とする。 The problem of the present invention is that a roughening treatment consisting of copper-cobalt-nickel alloy plating, which is the most basic, causes the dendritic coarsening particles to fall off from the surface of the copper foil and is generally referred to as powdering. The present invention provides a printed circuit copper foil capable of suppressing processing unevenness, increasing peel strength, and improving heat resistance. Along with the development of electronic devices, the miniaturization and high integration of semiconductor devices have further advanced, and the processing performed in the manufacturing process of these printed circuits has become more severe. It is an object of the present invention to provide a technology that meets these requirements.
本願発明は、以下の発明を提供する。
1)銅箔の表面に、銅の一次粒子層を形成した後、該一次粒子層の上に、銅、コバルト及びニッケルからなる3元系合金の二次粒子層を形成した印刷回路用銅箔であって、粗化処理面の一定領域のレーザー顕微鏡による二次元表面積に対する三次元表面積の比が2.0以上2.2未満であることを特徴とする印刷回路用銅箔。
2)前記銅の一次粒子層の平均粒子径が0.25-0.45μmであり、銅、コバルト及びニッケルからなる3元系合金からなる二次粒子層の平均粒子径が0.35μm以下であることを特徴とする上記1)記載の印刷回路用銅箔。
3)前記一次粒子層及び二次粒子層が、電気めっき層であることを特徴とする上記1)又は2)記載の印刷回路用銅箔。
4)二次粒子が、前記一次粒子の上に成長した1又は複数個の樹枝状の粒子または前記一次粒子の上に成長した正常めっき層であることを特徴とする上記1)~3)のいずれか一項に記載の印刷回路用銅箔。
5)一次粒子層及び二次粒子層の接着強度が0.80kg/cm以上であることを特徴とする上記1)~4)のいずれか一項に記載の印刷回路用銅箔。
6)一次粒子層及び二次粒子層の接着強度が0.90kg/cm以上であることを特徴とする上記1)~4)のいずれか一項に記載の印刷回路用銅箔。
The present invention provides the following inventions.
1) A copper foil for printed circuit, in which a primary particle layer of copper is formed on the surface of the copper foil, and then a secondary particle layer of a ternary alloy composed of copper, cobalt and nickel is formed on the primary particle layer. A copper foil for a printed circuit, wherein a ratio of a three-dimensional surface area to a two-dimensional surface area by a laser microscope in a certain region of the roughened surface is 2.0 or more and less than 2.2.
2) The average particle diameter of the primary particle layer of copper is 0.25 to 0.45 μm, and the average particle diameter of the secondary particle layer made of a ternary alloy made of copper, cobalt and nickel is 0.35 μm or less. The printed circuit copper foil according to 1), which is characterized in that it is present.
3) The copper foil for printed circuit as described in 1) or 2) above, wherein the primary particle layer and the secondary particle layer are electroplating layers.
4) The above-mentioned 1) to 3), wherein the secondary particles are one or a plurality of dendritic particles grown on the primary particles or a normal plating layer grown on the primary particles. The copper foil for printed circuits as described in any one of Claims.
5) The copper foil for printed circuit as described in any one of 1) to 4) above, wherein the adhesive strength between the primary particle layer and the secondary particle layer is 0.80 kg / cm or more.
6) The copper foil for printed circuit as described in any one of 1) to 4) above, wherein the adhesive strength between the primary particle layer and the secondary particle layer is 0.90 kg / cm or more.
また、前記銅-コバルト-ニッケル合金めっきによる二次粒子層の上に、コバルト-ニッケル合金めっき層を、また該コバルト-ニッケル合金めっき層の上に、さらに亜鉛-ニッケル合金めっき層を形成した印刷回路用銅箔を提供することができる。
前記コバルト-ニッケル合金めっき層は、コバルトの付着量を200~3000μg/dmとし、かつコバルトの比率が60~66質量%とすることができる。
前記亜鉛-ニッケル合金めっき層においては、その総量を150~500μg/dmの範囲とし、ニッケル量が50μg/dm以上の範囲、かつニッケル比率が0.16~0.40の範囲にある亜鉛-ニッケル合金めっき層を形成することができる。
Further, a printing in which a cobalt-nickel alloy plating layer is formed on the secondary particle layer formed by the copper-cobalt-nickel alloy plating, and a zinc-nickel alloy plating layer is further formed on the cobalt-nickel alloy plating layer. A copper foil for a circuit can be provided.
The cobalt-nickel alloy plating layer may have a cobalt adhesion amount of 200 to 3000 μg / dm 2 and a cobalt ratio of 60 to 66 mass%.
The zinc-nickel alloy plating layer has a total amount in the range of 150 to 500 μg / dm 2 , a nickel amount in the range of 50 μg / dm 2 or more, and a nickel ratio in the range of 0.16 to 0.40. -A nickel alloy plating layer can be formed.
また、前記亜鉛-ニッケル合金めっき層の上に、防錆処理層を形成することができる。
この防錆処理については、例えばクロム酸化物の単独皮膜処理若しくはクロム酸化物と亜鉛及び(又は)亜鉛酸化物との混合皮膜処理層を形成することができる。さらに、前記混合皮膜処理層上には、シランカップリング層を形成することができる。
上記の印刷回路銅箔は、接着剤を介さずに熱圧着により、樹脂基板と接着させた銅張積層板を製造することが可能である。
In addition, a rust prevention treatment layer can be formed on the zinc-nickel alloy plating layer.
About this antirust process, the independent film processing of chromium oxide or the mixed film processing layer of chromium oxide, zinc, and / or zinc oxide can be formed, for example. Furthermore, a silane coupling layer can be formed on the mixed film treatment layer.
The printed circuit copper foil can produce a copper-clad laminate bonded to a resin substrate by thermocompression bonding without using an adhesive.
本発明は、最も基本的な、銅-コバルト-ニッケル合金めっきからなる粗化処理において、樹枝状に形成される粗化粒子が銅箔の表面から剥がれ落ち、一般に粉落ちと言われる現象を抑制し、ピール強度を高め、かつ耐熱性を向上させることのできる印刷回路用銅箔を提供するものである。
また、異常成長した樹枝状やくさび形の粒子が少なくなり、粒子径が揃うことになるので、エッチング性が良好となり、銅箔エッチング後の樹脂基板界面への粗化粒子残渣を無くすことが可能となる。
電子機器の発展が進む中で、半導体デバイスの小型化、高集積化が更に進み、これらの印刷回路の製造工程で行われる処理が一段と厳しい要求がなされているが、本願発明をこれらの要求にこたえる技術的効果を有する。
In the present invention, the most basic roughening treatment consisting of copper-cobalt-nickel alloy plating prevents dendritic rough particles from peeling off from the surface of the copper foil and generally preventing the phenomenon of powder falling. And the copper foil for printed circuits which can raise peel strength and can improve heat resistance is provided.
In addition, the number of abnormally grown dendritic and wedge-shaped particles is reduced and the particle diameter is uniform, so that the etching property is good and it is possible to eliminate rough particle residues at the resin substrate interface after copper foil etching. It becomes.
Along with the development of electronic equipment, the miniaturization and high integration of semiconductor devices have further progressed, and the processing performed in the manufacturing process of these printed circuits has been made more severe. Has a technical effect to answer.
従来の銅箔上に、銅-コバルト-ニッケル合金めっきからなる粗化処理を行った場合の粉落ちの様子を示す概念説明図である。It is a conceptual explanatory view showing a state of powder falling when a roughening treatment comprising copper-cobalt-nickel alloy plating is performed on a conventional copper foil. 本発明の、銅箔上に予め一次粒子層を形成し、この一次粒子層の上に銅-コバルト-ニッケル合金めっきからなる二次粒子層を形成した粉落ちのない銅箔処理層の概念説明図である。Conceptual explanation of a copper foil treatment layer without powder falling, in which a primary particle layer is formed in advance on a copper foil and a secondary particle layer made of copper-cobalt-nickel alloy plating is formed on the primary particle layer of the present invention. FIG. 従来の銅箔上に、銅-コバルト-ニッケル合金めっきからなる粗化処理を行った場合の表面の顕微鏡写真である。It is the microscope picture of the surface at the time of performing the roughening process which consists of copper-cobalt-nickel alloy plating on the conventional copper foil. 本発明の、銅箔上に予め一次粒子層を形成し、この一次粒子層の上に銅-コバルト-ニッケル合金めっきからなる二次粒子層を形成した粉落ちのない銅箔処理面の層の顕微鏡写真である。In the present invention, a primary particle layer is previously formed on a copper foil, and a secondary particle layer made of copper-cobalt-nickel alloy plating is formed on the primary particle layer. It is a micrograph.
本発明において使用する銅箔は、電解銅箔或いは圧延銅箔いずれでも良い。通常、銅箔の、樹脂基材と接着する面即ち粗化面には積層後の銅箔の引き剥し強さを向上させることを目的として、脱脂後の銅箔の表面に、「ふしこぶ」状の電着を行なう粗化処理が施される。電解銅箔は製造時点で凹凸を有しているが、粗化処理により電解銅箔の凸部を増強して凹凸を一層大きくする。
圧延銅箔と電解銅箔とでは処理の内容を幾分異にすることもある。本発明においては、こうした前処理及び仕上げ処理をも含め、銅箔粗化と関連する公知の処理を必要に応じて含め、「粗化処理」と云っている。
The copper foil used in the present invention may be either an electrolytic copper foil or a rolled copper foil. Usually, the surface of the copper foil that adheres to the resin base material, that is, the roughened surface, has a “fisture” on the surface of the copper foil after degreasing for the purpose of improving the peel strength of the copper foil after lamination. A roughening treatment is performed to perform electrodeposition. Although the electrolytic copper foil has irregularities at the time of manufacture, the irregularities are further increased by enhancing the convex portions of the electrolytic copper foil by roughening treatment.
The content of treatment may be somewhat different between the rolled copper foil and the electrolytic copper foil. In the present invention, including such pretreatment and finishing treatment, a known treatment related to copper foil roughening is included as necessary, and is referred to as “roughening treatment”.
この粗化処理を、銅-コバルト-ニッケル合金めっきにより行なおうとするのである(以下の説明においては、銅-コバルト-ニッケル合金めっきの粗化処理を、前工程との差異を明確にするために、「二次粒子層」と呼称する。)が、上記の通り、単純に銅箔の上に銅-コバルト-ニッケル合金めっき層を形成しただけでは、上記の通り粉落ち等の問題が発生する。 This roughening treatment is performed by copper-cobalt-nickel alloy plating (in the following explanation, the roughening treatment of copper-cobalt-nickel alloy plating is performed to clarify the difference from the previous step. Is called a “secondary particle layer”), as described above, simply forming a copper-cobalt-nickel alloy plating layer on a copper foil causes problems such as powder falling as described above. To do.
銅箔の上に銅-コバルト-ニッケル合金めっき層を形成した銅箔の表面の顕微鏡写真を図3に示す。この図3に示すように、樹枝状に発達した微細な粒子を見ることができる。一般に、この図3に示す樹枝状に発達した微細な粒子は高電流密度で作製される。
このような高電流密度で処理された場合には、初期電着における粒子の核生成が抑制されるため、粒子先端に新たな粒子の核が形成されるため、次第に樹枝状に、細く長く粒子が成長することになる。
したがって、これを防止するために、電流密度を下げて電気めっきすると、鋭い立ち上がりがなくなり、粒子が増加し、丸みを帯びた形状の粒子が成長する。このような状況下においても、粉落ちはやや改善されるが、十分なピール強度が得られず、本願発明の目的を達成するためには十分でない。
FIG. 3 shows a photomicrograph of the surface of the copper foil in which a copper-cobalt-nickel alloy plating layer is formed on the copper foil. As shown in FIG. 3, fine particles developed in a dendritic shape can be seen. In general, the fine particles developed in a dendritic shape shown in FIG. 3 are produced at a high current density.
When processed at such a high current density, particle nucleation during initial electrodeposition is suppressed, and new particle nuclei are formed at the tip of the particle. Will grow.
Therefore, to prevent this, when electroplating is performed at a reduced current density, there is no sharp rise, the number of particles increases, and rounded particles grow. Even under such circumstances, powder falling is slightly improved, but sufficient peel strength cannot be obtained, which is not sufficient for achieving the object of the present invention.
図3に示すような銅-コバルト-ニッケル合金めっき層が形成された場合の、粉落ちの様子を、図1の概念説明図に示す。この粉落ちの原因は、上記の通り銅箔上に樹枝状に微細な粒子が生ずるためであるが、この樹枝状の粒子は、外力により樹枝の一部が折れ易く、又根元から脱落する。この微細な樹枝状の粒子は、処理中の「こすれ」による剥離、剥離粉によるロールの汚れ、剥離粉によるエッチング残渣が生ずる原因となる。 The state of powder falling when the copper-cobalt-nickel alloy plating layer as shown in FIG. 3 is formed is shown in the conceptual explanatory diagram of FIG. The cause of this powder fall is that fine particles are formed in a dendritic shape on the copper foil as described above. However, the dendritic particles are easily broken by an external force and fall off from the root. The fine dendritic particles cause peeling due to “rubbing” during the process, contamination of the roll with peeling powder, and etching residue due to peeling powder.
本願発明においては、銅箔の表面に、事前に銅の一次粒子層を形成した後、該一次粒子層の上に、銅、コバルト及びニッケルからなる3元系合金からなる二次粒子層を形成するものである。銅箔上に、この一次粒子及び二次粒子を形成した表面の顕微鏡写真を図4に示す(詳細は後述する)。
これによって、処理中の「こすれ」による剥離、剥離粉によるロールの汚れ、剥離粉によるエッチング残渣が無くなり、すなわち粉落ちと言われる現象と処理ムラを抑制することができ、ピール強度を高め、かつ耐熱性を向上させることのできる印刷回路用銅箔を得ることができる。
In the present invention, after forming a primary particle layer of copper in advance on the surface of the copper foil, a secondary particle layer made of a ternary alloy made of copper, cobalt and nickel is formed on the primary particle layer. To do. FIG. 4 shows a micrograph of the surface on which the primary particles and secondary particles are formed on the copper foil (details will be described later).
This eliminates peeling due to "rubbing" during processing, dirt on the roll due to peeling powder, etching residue due to peeling powder, that is, it can suppress the phenomenon called powder falling and processing unevenness, increase peel strength, and The copper foil for printed circuits which can improve heat resistance can be obtained.
前記一次粒子層の平均粒子径を0.25-0.45μm、銅、コバルト及びニッケルからなる3元系合金からなる二次粒子層の平均粒子径を0.35以下μmとするのが、下記に示す実施例から明らかなように、粉落ちを防止する最適な条件である。
前記一次粒子層の平均粒子径の下限は、好ましくは0.27μm、さらに0.29μm、0.30μm、0.33μmであることが好ましい。
前記一次粒子層の平均粒子径の上限は、好ましくは0.44μm、さらに0.43μm、0.40μm、0.39μm以下であることが好ましい。
また、前記二次粒子層の平均粒子径の上限は、好ましくは0.34μm、さらに0.33μm、0.32μm、0.31μm、0.30μm、0.28μm、0.27μm以下であることが好ましい。
また、二次粒子層の平均粒子径の下限は特に限定する必要はないが、例えば0.001μm以上、あるいは0.01μm以上、あるいは0.05μm以上、あるいは0.09μm以上、あるいは0.10μm以上、あるいは0.12μm以上、あるいは0.15μm以上である。
上記一次粒子層及び二次粒子層は、電気めっき層により形成する。この二次粒子の特徴は、前記一次粒子の上に成長した1又は複数個の樹枝状の粒子である。または前記一次粒子の上に成長した正常めっきである。すなわち、本明細書において用語「二次粒子層」を用いた場合には、被せめっき等の正常めっき層も含まれるものとする。また、二次粒子層は粗化粒子により形成される層を一層以上有する層であってもよく、正常めっき層を一層以上有する層であってもよく、粗化粒子により形成される層と正常めっき層とをそれぞれ一層以上有する層であってもよい。
このようにして形成された一次粒子層及び二次粒子層の接着強度0.80kg/cm以上、さらには接着強度0.90kg/cm以上を達成することができる。
The average particle diameter of the primary particle layer is 0.25 to 0.45 μm, and the average particle diameter of the secondary particle layer made of a ternary alloy made of copper, cobalt and nickel is 0.35 or less μm. As is apparent from the examples shown in (1), this is the optimum condition for preventing powder falling.
The lower limit of the average particle diameter of the primary particle layer is preferably 0.27 μm, more preferably 0.29 μm, 0.30 μm, and 0.33 μm.
The upper limit of the average particle diameter of the primary particle layer is preferably 0.44 μm, more preferably 0.43 μm, 0.40 μm, and 0.39 μm or less.
Further, the upper limit of the average particle diameter of the secondary particle layer is preferably 0.34 μm, more preferably 0.33 μm, 0.32 μm, 0.31 μm, 0.30 μm, 0.28 μm, 0.27 μm or less. preferable.
Further, the lower limit of the average particle diameter of the secondary particle layer is not particularly limited. For example, 0.001 μm or more, or 0.01 μm or more, or 0.05 μm or more, or 0.09 μm or more, or 0.10 μm or more. Or 0.12 μm or more, or 0.15 μm or more.
The primary particle layer and the secondary particle layer are formed by an electroplating layer. The secondary particles are characterized by one or more dendritic particles grown on the primary particles. Or normal plating grown on the primary particles. That is, in the present specification, when the term “secondary particle layer” is used, a normal plating layer such as overlay plating is also included. Further, the secondary particle layer may be a layer having one or more layers formed of roughened particles, or may be a layer having one or more normal plating layers, and is normal with a layer formed of roughened particles. A layer having one or more plating layers may be used.
The primary particle layer and the secondary particle layer thus formed can achieve an adhesive strength of 0.80 kg / cm or more, and further an adhesive strength of 0.90 kg / cm or more.
一次粒子層及び二次粒子層を形成した銅箔において、さらに重要なことは、粗化処理面の一定領域のレーザー顕微鏡による二次元表面積に対する三次元表面積の比を2.0以上2.2未満とすることである。
このような表面積比の制限と調整については、銅箔の粗化処理面が個々の粗化粒子の集合体である粒子層から形成されており、粒子層を粒子の成長制御よりもマクロな範囲で制御することで、ゆらぎの無い、すなわち安定したピール強度の向上と安定した粉落ち現象を防止できる効果を有する。また、個々の粗化粒子サイズを制御しても、微細な粗化粒子が高さ方向に積み重なってしまった場合は粉落ちが発生してしまう。よって三次元的な粗化粒子構成となる表面積比の制限と調整が重要となる。
In the copper foil formed with the primary particle layer and the secondary particle layer, more importantly, the ratio of the three-dimensional surface area to the two-dimensional surface area by a laser microscope in a certain region of the roughened surface is 2.0 or more and less than 2.2. It is to do.
Regarding the limitation and adjustment of such a surface area ratio, the roughened surface of the copper foil is formed from a particle layer that is an aggregate of individual roughened particles, and the particle layer is in a macroscopic range than the particle growth control. By controlling with, there is no fluctuation, that is, it has the effect of improving the stable peel strength and preventing the stable powder falling phenomenon. Further, even if the size of each roughened particle is controlled, if fine roughened particles are stacked in the height direction, powder falling occurs. Therefore, it is important to limit and adjust the surface area ratio that provides a three-dimensional roughened particle structure.
前記表面積比が2.0未満ではピール強度が不十分となる。レーザー顕微鏡を用いて標準圧延銅箔の粗化処理前の無粗化の状態での三次元表面粗さを測定した結果20043μmであり、二次元表面積に対する三次元表面積比が2.02となったため、ピール強度確保のために少なくとも2.0以上が望ましいと言える。また2.20を超えると粉落ち現象が発生し易くなるので、上記の範囲とするのが望ましいと言える。なお、前記表面積比(二次元表面積に対する三次元表面積比)の上限は、好ましくは2.19、より好ましくは2.17、さらに好ましくは2.15である。また、前記表面積比(二次元表面積に対する三次元表面積比)の下限は、好ましくは2.02、さらに2.04、2.05、2.06であることが好ましい。
レーザー顕微鏡による測定法は、株式会社キーエンス製レーザーマイクロスコープVK8500を用いて粗化処理面の100×100μm相当面積、実データでは9924.4μmにおける範囲の三次元表面積を測定して、三次元表面積÷二次元表面積=表面積比とする手法により設定を行う。
When the surface area ratio is less than 2.0, the peel strength is insufficient. The result of measuring the three-dimensional surface roughness of the standard rolled copper foil in a non-roughened state before the roughening treatment using a laser microscope is 20043 μm 2 and the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.02. Therefore, it can be said that at least 2.0 or more is desirable for securing the peel strength. Moreover, since it will become easy to generate | occur | produce a powder fall phenomenon when it exceeds 2.20, it can be said that it is desirable to set it as said range. The upper limit of the surface area ratio (three-dimensional surface area ratio to two-dimensional surface area) is preferably 2.19, more preferably 2.17, and even more preferably 2.15. Moreover, the lower limit of the surface area ratio (three-dimensional surface area ratio to two-dimensional surface area) is preferably 2.02, more preferably 2.04, 2.05, and 2.06.
The measurement method using a laser microscope is to measure a three-dimensional surface area in a range equivalent to 100 × 100 μm of the roughened surface using a laser microscope VK8500 manufactured by Keyence Corporation, and in a range of 9944.4 μm 2 in actual data. ÷ Set by the method of 2D surface area = surface area ratio.
(銅の一次粒子のめっき条件)
銅の一次粒子のめっき条件の一例を挙げると、下記の通りである。
なお、このめっき条件はあくまで好適な例を示すものであり、銅の一次粒子は銅箔上に形成される平均粒子径が粉落ち防止の役割を担うものである。したがって、平均粒子径が本願発明の範囲に入るものであれば、下記に表示する以外のめっき条件であることは何ら妨げるものではない。本願発明はこれらを包含するものである。
液組成  :銅10~20g/L、硫酸50~100g/L
液温   :25~50C
電流密度 :1~58A/dm
クーロン量:4~81As/dm
(Copper primary particle plating conditions)
An example of the plating conditions for the primary particles of copper is as follows.
In addition, this plating condition shows a suitable example to the last, and the average particle diameter formed on copper foil plays the role of powder omission prevention in the primary particle of copper. Therefore, as long as the average particle diameter falls within the scope of the present invention, the plating conditions other than those indicated below are not disturbed. The present invention includes these.
Liquid composition: Copper 10-20 g / L, sulfuric acid 50-100 g / L
Liquid temperature: 25-50C
Current density: 1 to 58 A / dm 2
Coulomb amount: 4 to 81 As / dm 2
(二次粒子のめっき条件)
なお、上記と同様に、このめっき条件はあくまで好適な例を示すものであり、二次粒子は一次粒子の上に形成されるものであり、平均粒子径が粉落ち防止の役割を担うものである。したがって、平均粒子径が本願発明の範囲に入るものであれば、下記に表示する以外のめっき条件であることは何ら妨げるものではない。本願発明はこれらを包含するものである。
液組成 :銅10~20g/L、ニッケル5~15g/L、コバルト5~15g/L
pH  :2~3
液温   :30~50C
電流密度 :24~50A/dm
クーロン量:34~48As/dm
(Plating conditions for secondary particles)
As described above, this plating condition is merely a suitable example, the secondary particles are formed on the primary particles, and the average particle diameter plays a role in preventing powder falling. is there. Therefore, as long as the average particle diameter falls within the scope of the present invention, the plating conditions other than those indicated below are not disturbed. The present invention includes these.
Liquid composition: Copper 10-20 g / L, Nickel 5-15 g / L, Cobalt 5-15 g / L
pH: 2-3
Liquid temperature: 30-50C
Current density: 24 to 50 A / dm 2
Coulomb amount: 34 to 48 As / dm 2
(耐熱層1を形成するめっき条件)
 本願発明は、上記二次粒子層の上に、さらに耐熱層を形成することができる。このめっき条件を下記に示す。
液組成  :ニッケル5~20g/L、コバルト1~8g/L
pH   :2~3
液温   :40~60C
電流密度 :5~20A/dm
クーロン量:10~20As/dm
(Plating conditions for forming the heat-resistant layer 1)
In the present invention, a heat-resistant layer can be further formed on the secondary particle layer. The plating conditions are shown below.
Liquid composition: Nickel 5-20 g / L, Cobalt 1-8 g / L
pH: 2-3
Liquid temperature: 40-60C
Current density: 5 to 20 A / dm 2
Coulomb amount: 10 to 20 As / dm 2
(耐熱層2を形成するめっき条件)
本願発明は、上記二次粒子層の上に、さらに次の耐熱層を形成することができる。このめっき条件を下記に示す。
液組成  :ニッケル2~30g/L、亜鉛2~30g/L
pH   :3~4
液温   :30~50C
電流密度 :1~2A/dm
クーロン量:1~2As/dm
(Plating conditions for forming the heat-resistant layer 2)
The present invention can further form the following heat-resistant layer on the secondary particle layer. The plating conditions are shown below.
Liquid composition: Nickel 2-30 g / L, Zinc 2-30 g / L
pH: 3-4
Liquid temperature: 30-50C
Current density: 1 to 2 A / dm 2
Coulomb amount: 1 to 2 As / dm 2
(防錆層を形成するめっき条件)
  本願発明は、さらに次の防錆層を形成することができる。このめっき条件を下記に示す。下記においては、浸漬クロメート処理の条件を示したが、電解クロメート処理でも良い。
液組成  :重クロム酸カリウム1~10g/L、亜鉛0~5g/L
pH   :3~4
液温   :50~60C
電流密度 :0~2A/dm(浸漬クロメート処理のため)
クーロン量:0~2As/dm(浸漬クロメート処理のため)
(Plating conditions for forming a rust prevention layer)
The present invention can further form the following antirust layer. The plating conditions are shown below. In the following, conditions for the immersion chromate treatment are shown, but electrolytic chromate treatment may be used.
Liquid composition: potassium dichromate 1-10 g / L, zinc 0-5 g / L
pH: 3-4
Liquid temperature: 50-60C
Current density: 0-2A / dm 2 (for immersion chromate treatment)
Coulomb amount: 0 to 2 As / dm 2 (for immersion chromate treatment)
(耐候性層の種類)
 一例として、ジアミノシラン水溶液の塗布を挙げることができる。
(Type of weather-resistant layer)
As an example, application of a diaminosilane aqueous solution can be mentioned.
上記二次粒子としての銅-コバルト-ニッケル合金めっきは、電解めっきにより、付着量が10~30mg/dm銅-100~3000μg/dmコバルト-50~500μg/dmニッケルの3元系合金層を形成することができる。
Co付着量が100μg/dm未満では、耐熱性が悪くなり、またエッチング性も悪くなる。Co付着量が3000μg/dmを超えると、磁性の影響を考慮せねばならない場合には好ましくなく、エッチングシミが生じ、また、耐酸性及び耐薬品性の悪化が考慮され得る。
Copper as the secondary particles - cobalt - nickel alloy plating, by electrolytic plating, coating weight of 10 ~ 30mg / dm 2 of copper -100 ~ 3000μg / dm 2 of cobalt -50 ~ 500μg / dm 2 3 ternary alloy of nickel A layer can be formed.
When the Co adhesion amount is less than 100 μg / dm 2 , the heat resistance is deteriorated and the etching property is also deteriorated. When the amount of Co deposition exceeds 3000 μg / dm 2 , it is not preferable when the influence of magnetism must be taken into consideration, etching spots occur, and deterioration of acid resistance and chemical resistance can be considered.
Ni付着量が50μg/dm未満であると、耐熱性が悪くなる。他方、Ni付着量が500μg/dmを超えると、エッチング性が低下する。すなわち、エッチング残ができ、またエッチングできないというレベルではないが、ファインパターン化が難しくなる。好ましいCo付着量は500~2000μg/dmであり、そして好ましいニッケル付着量は50~300μg/dmである。
以上から、銅-コバルト-ニッケル合金めっきの付着量は、10~30mg/dm銅-100~3000μg/dmコバルト-50~500μg/dmニッケルであることが望ましいと言える。この3元系合金層の各付着量はあくまで、望ましい条件であり、この量を超える範囲を否定するものではない。
When the Ni adhesion amount is less than 50 μg / dm 2 , the heat resistance deteriorates. On the other hand, when the Ni adhesion amount exceeds 500 μg / dm 2 , the etching property is lowered. That is, although it is not at a level where etching remains and etching cannot be performed, it becomes difficult to form a fine pattern. Preferred Co deposition amount is 500 ~ 2000μg / dm 2, and preferably nickel coating weight is 50 ~ 300μg / dm 2.
From the above, copper - cobalt - deposition of nickel alloy plating, it may be desirable is 10 ~ 30mg / dm 2 of copper -100 ~ 3000μg / dm 2 of cobalt -50 ~ 500μg / dm 2 of nickel. Each adhesion amount of the ternary alloy layer is a desirable condition, and a range exceeding this amount is not denied.
ここで、エッチングシミとは、塩化銅でエッチングした場合、Coが溶解せずに残ってしまうことを意味し、そしてエッチング残とは塩化アンモニウムでアルカリエッチングした場合、Niが溶解せずに残ってしまうことを意味するものである。
一般に、回路を形成する場合には、下記の実施例の中で説明するようなアルカリ性エッチング液及び塩化銅系エッチング液を用いて行われる。このエッチング液及びエッチング条件は、汎用性のあるものであるが、この条件に限定されることはなく、任意に選択できることは理解されるべきことである。
Here, the etching stain means that Co remains without being dissolved when etched with copper chloride, and the etching residue means that Ni remains undissolved when alkaline etching is performed with ammonium chloride. It means to end.
In general, when a circuit is formed, an alkaline etching solution and a copper chloride based etching solution as described in the following examples are used. Although this etching solution and etching conditions are versatile, it should be understood that they are not limited to these conditions and can be arbitrarily selected.
本発明は上記の通り、二次粒子を形成した後(粗化処理後)、粗化面上にコバルト-ニッケル合金めっき層を形成することができる。
このコバルト-ニッケル合金めっき層は、コバルトの付着量が200~3000μg/dmであり、かつコバルトの比率が60~66質量%とするのが望ましい。この処理は広い意味で一種の防錆処理とみることができる。
このコバルト-ニッケル合金めっき層は、銅箔と基板の接着強度を実質的に低下させない程度に行なう必要がある。コバルト付着量が200μg/dm未満では、耐熱剥離強度が低下し、耐酸化性及び耐薬品性が悪くなり、また処理表面が赤っぽくなってしまうので好ましくない。
また、コバルト付着量が3000μg/dmを超えると、磁性の影響を考慮せねばならない場合には好ましくなく、エッチングシミが生じ、また、耐酸性及び耐薬品性の悪化が考慮される。好ましいコバルト付着量は400~2500μg/dmである。
In the present invention, as described above, after the secondary particles are formed (after the roughening treatment), a cobalt-nickel alloy plating layer can be formed on the roughened surface.
The cobalt-nickel alloy plating layer preferably has a cobalt adhesion amount of 200 to 3000 μg / dm 2 and a cobalt ratio of 60 to 66 mass%. This treatment can be regarded as a kind of rust prevention treatment in a broad sense.
This cobalt-nickel alloy plating layer needs to be performed to such an extent that the adhesive strength between the copper foil and the substrate is not substantially lowered. If the amount of cobalt adhesion is less than 200 μg / dm 2 , the heat-resistant peel strength decreases, the oxidation resistance and chemical resistance deteriorate, and the treatment surface becomes reddish.
On the other hand, if the amount of cobalt deposition exceeds 3000 μg / dm 2 , it is not preferable when the influence of magnetism must be taken into consideration, etching spots occur, and deterioration of acid resistance and chemical resistance is considered. A preferable cobalt adhesion amount is 400 to 2500 μg / dm 2 .
また、コバルト付着量が多いと、ソフトエッチングの染み込み発生の原因となる場合がある。このことからコバルトの比率が60~66質量%とするのが望ましいと言える。
後述するように、ソフトエッチングの染み込み発生の直接の大きな原因は、亜鉛-ニッケル合金めっき層からなる耐熱防錆層であるが、コバルトもソフトエッチングの際の染み発生の原因になることもあるので、上記に調整することが、より望ましいとする条件である。
一方、ニッケル付着量が少ない場合には、耐熱剥離強度が低下し、耐酸化性及び耐薬品性が低下する。また、ニッケル付着量が多すぎる場合には、アルカリエッチング性が悪くなるので、上記コバルト含有量とのバランスで決めることが望ましい。
Moreover, when there is much cobalt adhesion amount, it may become a cause of generation | occurrence | production of a soft etching penetration. From this, it can be said that the cobalt ratio is preferably 60 to 66 mass%.
As will be described later, the direct major cause of soft etching soaking is a heat-resistant rust-proof layer made of a zinc-nickel alloy plating layer, but cobalt can also cause the soaking of soft etching. The above adjustment is a more desirable condition.
On the other hand, when the nickel adhesion amount is small, the heat-resistant peel strength is lowered, and the oxidation resistance and chemical resistance are lowered. Further, when the nickel adhesion amount is too large, the alkali etching property is deteriorated, so it is desirable to determine the balance with the cobalt content.
本発明は、コバルト-ニッケル合金めっき上に更に、亜鉛-ニッケル合金めっき層を形成することができる。亜鉛-ニッケル合金めっき層の総量を150~500μg/dmとし、かつニッケルの比率を16~40質量%とする。これは、耐熱防錆層という役割を有するものである。この条件も、あくまで好ましい条件であって、他の公知の亜鉛-ニッケル合金めっきを使用することができる。この亜鉛-ニッケル合金めっきは、本願発明においては、好ましい付加的条件であることが理解されるであろう。
印刷回路の製造工程で行われる処理が一段と高温となり、また製品となった後の機器使用中の熱発生がある。例えば、樹脂に銅箔を熱圧着で接合する、いわゆる二層材では、接合の際に300°C以上の熱を受ける。このような状況の中でも、銅箔と樹脂基材との間での接合力の低下を防止することが必要であり、この亜鉛-ニッケル合金めっきは有効である。
In the present invention, a zinc-nickel alloy plating layer can be further formed on the cobalt-nickel alloy plating. The total amount of the zinc-nickel alloy plating layer is 150 to 500 μg / dm 2 and the nickel ratio is 16 to 40% by mass. This has a role of a heat-resistant rust-proof layer. This condition is also a preferable condition, and other known zinc-nickel alloy plating can be used. It will be understood that this zinc-nickel alloy plating is a preferred additional condition in the present invention.
The processing performed in the manufacturing process of the printed circuit becomes much higher, and there is heat generation during use of the device after it has become a product. For example, in a so-called two-layer material in which a copper foil is bonded to a resin by thermocompression bonding, a heat of 300 ° C. or more is received during the bonding. Even in such a situation, it is necessary to prevent a decrease in bonding force between the copper foil and the resin base material, and this zinc-nickel alloy plating is effective.
また、従来の技術では、樹脂に銅箔を熱圧着で接合した二層材における亜鉛-ニッケル合金めっき層を備えた微小な回路では、ソフトエッチングの際に、回路のエッジ部に染み込みによる変色が発生する。ニッケルは、ソフトエッチングの際に使用するエッチング剤(HSO:10wt%、H:2wt%のエッチング水溶液)の染み込みを抑制する効果がある。
上記の通り、前記亜鉛-ニッケル合金めっき層の総量を150~500μg/dmとすると共に、当該合金層中のニッケル比率の下限値を16質量%に、上限値を40質量%とし、かつニッケルの含有量を50μg/dm以上とすることが、耐熱防錆層という役割を備えると共に、ソフトエッチングの際に使用するエッチング剤の染み込みを抑制し、腐食に回路の接合強度の弱体化を防止することができるという効果を有する。
In addition, in the conventional technology, in a minute circuit provided with a zinc-nickel alloy plating layer in a two-layer material in which a copper foil is bonded to a resin by thermocompression bonding, discoloration due to penetration into the edge portion of the circuit is caused during soft etching. appear. Nickel has an effect of suppressing penetration of an etching agent (etching aqueous solution of H 2 SO 4 : 10 wt%, H 2 O 2 : 2 wt%) used in soft etching.
As described above, the total amount of the zinc-nickel alloy plating layer is 150 to 500 μg / dm 2 , the lower limit of the nickel ratio in the alloy layer is 16% by mass, the upper limit is 40% by mass, and the nickel The content of 50 μg / dm 2 or more serves as a heat-resistant and rust-proof layer, suppresses the penetration of the etching agent used during soft etching, and prevents weakening of the joint strength of the circuit due to corrosion It has the effect that it can be done.
なお、亜鉛-ニッケル合金めっき層の総量が150μg/dm未満では、耐熱防錆力が低下して耐熱防錆層としての役割を担うことが難しくなり、同総量が500μg/dmを超えると、耐塩酸性が悪くなる傾向がある。
また、合金層中のニッケル比率の下限値が16質量%未満では、ソフトエッチングの際の染み込み量が9μmを超えるので、好ましくない。ニッケル比率の上限値40質量%については、亜鉛-ニッケル合金めっき層を形成できる技術上の限界値である。
In addition, if the total amount of the zinc-nickel alloy plating layer is less than 150 μg / dm 2 , the heat and rust prevention ability is lowered and it becomes difficult to play a role as a heat and rust prevention layer, and if the total amount exceeds 500 μg / dm 2 The hydrochloric acid resistance tends to deteriorate.
Moreover, if the lower limit of the nickel ratio in the alloy layer is less than 16% by mass, the amount of penetration at the time of soft etching exceeds 9 μm, which is not preferable. The upper limit value of 40% by mass of the nickel ratio is a technical limit value at which a zinc-nickel alloy plating layer can be formed.
上記の通り、本発明は、二次粒子層としての銅-コバルト-ニッケル合金めっき層上に、必要に応じてコバルト-ニッケル合金めっき層、さらには亜鉛-ニッケル合金めっき層を順次形成することができる。これら層における合計量のコバルト付着量及びニッケル付着量を調節することもできる。コバルトの合計付着量が300~4000μg/dm、ニッケルの合計付着量が150~1500μg/dmとすることが望ましい。
コバルトの合計付着量が300μg/dm未満では、耐熱性及び耐薬品性が低下し、コバルトの合計付着量が4000μg/dm2 を超えると、エッチングシミが生じることがある。また、ニッケルの合計付着量が150μg/dm未満では、耐熱性及び耐薬品性が低下する。ニッケルの合計付着量が1500μg/dmを超えると、エッチング残が生じる。
好ましくは、コバルトの合計付着量は1500~3500μg/dmであり、そしてニッケルの合計付着量は500~1000μg/dmである。上記の条件を満たせば、特にこの段落に記載する条件に制限される必要はない。
As described above, according to the present invention, a cobalt-nickel alloy plating layer and further a zinc-nickel alloy plating layer may be sequentially formed on the copper-cobalt-nickel alloy plating layer as the secondary particle layer as necessary. it can. The total amount of cobalt and nickel deposited in these layers can also be adjusted. It is desirable that the total deposition amount of cobalt is 300 to 4000 μg / dm 2 and the total deposition amount of nickel is 150 to 1500 μg / dm 2 .
When the total adhesion amount of cobalt is less than 300 μg / dm 2 , the heat resistance and chemical resistance are lowered, and when the total adhesion amount of cobalt exceeds 4000 μg / dm 2 , etching spots may occur. Moreover, if the total adhesion amount of nickel is less than 150 microgram / dm < 2 >, heat resistance and chemical resistance will fall. When the total adhesion amount of nickel exceeds 1500 μg / dm 2 , an etching residue is generated.
Preferably, the total deposit of cobalt is 1500-3500 μg / dm 2 and the total deposit of nickel is 500-1000 μg / dm 2 . If the above conditions are satisfied, the conditions described in this paragraph need not be particularly limited.
この後、必要に応じ、防錆処理が実施される。本発明において好ましい防錆処理は、クロム酸化物単独の皮膜処理或いはクロム酸化物と亜鉛/亜鉛酸化物との混合物皮膜処理である。クロム酸化物と亜鉛/亜鉛酸化物との混合物皮膜処理とは、亜鉛塩または酸化亜鉛とクロム酸塩とを含むめっき浴を用いて電気めっきにより亜鉛または酸化亜鉛とクロム酸化物とより成る亜鉛-クロム基混合物の防錆層を被覆する処理である。
めっき浴としては、代表的には、KCr、NaCr等の重クロム酸塩やCrO等の少なくとも一種と、水溶性亜鉛塩、例えばZnO 、ZnSO・7HOなど少なくとも一種と、水酸化アルカリとの混合水溶液が用いられる。代表的なめっき浴組成と電解条件例は次の通りである。
Thereafter, a rust prevention treatment is performed as necessary. In the present invention, a preferable antirust treatment is a coating treatment of chromium oxide alone or a mixture coating treatment of chromium oxide and zinc / zinc oxide. Chromium oxide and zinc / zinc oxide mixture film treatment is a method of forming zinc or zinc oxide comprising zinc oxide and chromium oxide by electroplating using a plating bath containing zinc salt or zinc oxide and chromate. It is the process which coat | covers the antirust layer of a chromium group mixture.
As the plating bath, typically, at least one kind of dichromate such as K 2 Cr 2 O 7 and Na 2 Cr 2 O 7 and CrO 3 and a water-soluble zinc salt such as ZnO 4 and ZnSO 4 · 7H are used. A mixed aqueous solution of at least one kind such as 2 O and an alkali hydroxide is used. A typical plating bath composition and electrolysis conditions are as follows.
こうして得られた銅箔は、優れた耐熱性剥離強度、耐酸化性及び耐塩酸性を有する。また、CuClエッチング液で150μmピッチ回路巾以下の印刷回路をエッチングでき、しかもアルカリエッチングも可能とする。また、ソフトエッチングの際の、回路エッジ部への染み込みを抑制できる。
ソフトエッチング液には、HSO:10wt%、H:2wt%の水溶液が使用できる。処理時間と温度は任意に調節できる。
アルカリエッチング液としては、例えば、NHOH:6モル/リットル、NHCl:5モル/リットル、CuCl:2モル/リットル(温度50°C)等の液が知られている。
The copper foil thus obtained has excellent heat resistance peel strength, oxidation resistance and hydrochloric acid resistance. In addition, a printed circuit having a pitch of 150 μm or less can be etched with a CuCl 2 etching solution, and alkali etching can be performed. In addition, penetration into the circuit edge portion during soft etching can be suppressed.
As the soft etching solution, an aqueous solution of H 2 SO 4 : 10 wt% and H 2 O 2 : 2 wt% can be used. Processing time and temperature can be adjusted arbitrarily.
As alkaline etching liquids, for example, liquids such as NH 4 OH: 6 mol / liter, NH 4 Cl: 5 mol / liter, CuCl 2 : 2 mol / liter (temperature: 50 ° C.) are known.
上記の全工程で得られた銅箔は、黒色~灰色を有している。黒色~灰色は、位置合わせ精度及び熱吸収率の高いことの点から、意味がある。例えば、リジッド基板及びフレキシブル基板を含め印刷回路基板は、ICや抵抗、コンデンサ等の部品を自動工程で搭載していくが、その際センサーにより回路を読み取りながらチップマウントを行なっている。このとき、カプトンなどのフィルムを通して銅箔処理面での位置合わせを行なうことがある。また、スルーホール形成時の位置決めも同様である。
処理面が黒に近い程、光の吸収が良いため、位置決めの精度が高くなる。更には、基板を作製する際、銅箔とフィルムとを熱を加えながらキュワリングして接着させることが多い。このとき、遠赤外線、赤外線等の長波を用いることにより加熱する場合、処理面の色調が黒い方が、加熱効率が良くなる。
The copper foil obtained in all the above steps has a black to gray color. Black to gray is meaningful in terms of alignment accuracy and high heat absorption rate. For example, printed circuit boards including rigid boards and flexible boards are mounted with components such as ICs, resistors, and capacitors in an automatic process, and chip mounting is performed while reading circuits with sensors. At this time, alignment on the copper foil treated surface may be performed through a film such as Kapton. This also applies to positioning when forming a through hole.
The closer the processing surface is to black, the better the light absorption and the higher the positioning accuracy. Furthermore, when producing a substrate, the copper foil and the film are often cured and bonded together while applying heat. At this time, when heating is performed by using long waves such as far infrared rays and infrared rays, the heating efficiency is improved when the color tone of the treated surface is black.
最後に、必要に応じ、銅箔と樹脂基板との接着力の改善を主目的として、防錆層上の少なくとも粗化面にシランカップリング剤を塗布するシラン処理が施される。
このシラン処理に使用するシランカップリング剤としては、オレフィン系シラン、エポキシ系シラン、アクリル系シラン、アミノ系シラン、メルカプト系シランを挙げることができるが、これらを適宜選択して使用することができる。
塗布方法は、シランカップリング剤溶液のスプレーによる吹付け、コーターでの塗布、浸漬、流しかけ等いずれでもよい。例えば、特公昭60-15654号は、銅箔の粗面側にクロメート処理を施した後シランカップリング剤処理を行なうことによって銅箔と樹脂基板との接着力を改善することを記載している。詳細はこれを参照されたい。この後、必要なら、銅箔の延性を改善する目的で焼鈍処理を施すこともある。
Finally, if necessary, silane treatment for applying a silane coupling agent to at least the roughened surface on the rust preventive layer is performed mainly for the purpose of improving the adhesive force between the copper foil and the resin substrate.
Examples of the silane coupling agent used for the silane treatment include olefin silane, epoxy silane, acrylic silane, amino silane, and mercapto silane, which can be appropriately selected and used. .
The application method may be any of spraying a silane coupling agent solution by spraying, coating with a coater, dipping, pouring and the like. For example, Japanese Patent Publication No. 60-15654 describes that the adhesion between a copper foil and a resin substrate is improved by subjecting the rough surface of the copper foil to a chromate treatment followed by a silane coupling agent treatment. . Refer to this for details. Thereafter, if necessary, an annealing treatment may be performed for the purpose of improving the ductility of the copper foil.
以下、実施例及び比較例に基づいて説明する。なお、本実施例はあくまで一例であり、この例のみに制限されるものではない。すなわち、本発明に含まれる他の態様または変形を包含するものである。なお、以下の実施例及び比較例の原箔には、標準圧延銅箔TPC(JIS H3100 C1100に規格されているタフピッチ銅)18μmを使用した。 Hereinafter, description will be made based on Examples and Comparative Examples. In addition, a present Example is an example to the last, and is not restrict | limited only to this example. That is, it includes other aspects or modifications included in the present invention. In addition, 18 μm of standard rolled copper foil TPC (tough pitch copper standardized in JIS H3100 C1100) was used for the raw foils of the following examples and comparative examples.
(実施例1-実施例8)
圧延銅箔に、下記に示す条件範囲で、一次粒子層(Cu)、二次粒子層(銅-コバルト-ニッケル合金めっき)形成した。
使用した浴組成及びめっき条件は、次の通りである。
[浴組成及びめっき条件]
Example 1 to Example 8
A primary particle layer (Cu) and a secondary particle layer (copper-cobalt-nickel alloy plating) were formed on the rolled copper foil under the conditions shown below.
The bath composition and plating conditions used are as follows.
[Bath composition and plating conditions]
(A)一次粒子層の形成(Cuめっき)
  液組成  :銅15g/L、硫酸75g/L
  液温   :25~30°C
  電流密度 :1~70A/dm
  クーロン量:2~90As/dm
(B)二次粒子層の形成(Cu-Co-Ni合金めっき)
  液組成  :銅15g/L、ニッケル8g/L、コバルト8g/L
  pH   :2
  液温   :40°C
  電流密度 :10~50A/dm
  クーロン量:10~80As/dm
(A) Formation of primary particle layer (Cu plating)
Liquid composition: Copper 15g / L, sulfuric acid 75g / L
Liquid temperature: 25-30 ° C
Current density: 1 to 70 A / dm 2
Coulomb amount: 2 to 90 As / dm 2
(B) Formation of secondary particle layer (Cu—Co—Ni alloy plating)
Liquid composition: Copper 15g / L, nickel 8g / L, cobalt 8g / L
pH: 2
Liquid temperature: 40 ° C
Current density: 10 to 50 A / dm 2
Coulomb amount: 10 to 80 As / dm 2
上記の一次粒子層の形成(Cuめっき)及び二次粒子層の形成(Cu-Co-Ni合金めっき)の条件を調整して、粗化処理面の一定領域のレーザー顕微鏡による二次元表面積に対する三次元表面積の比が2.0以上2.2未満であるとなるようにした。表面積の測定は、上記レーザー顕微鏡による測定法を用いた。 Adjusting the conditions for the formation of the primary particle layer (Cu plating) and the formation of the secondary particle layer (Cu-Co-Ni alloy plating) above, the tertiary of the roughened surface with respect to the two-dimensional surface area by a laser microscope The ratio of the original surface area was 2.0 or more and less than 2.2. The surface area was measured by the measurement method using the laser microscope.
(比較例1-比較例5)
比較例において、使用した浴組成及びめっき条件は、次の通りである。
[浴組成及びめっき条件]
(A)一次粒子層の形成(銅めっき)
  液組成  :銅15g/L、硫酸75g/L
  液温   :25~35°C
  電流密度 :1~70A/dm
  クーロン量:2~90As/dm
(B)二次粒子層の形成(Cu-Co-Ni合金めっき条件)
  液組成  :銅15g/L、ニッケル8g/L、コバルト8g/L
  pH   :2
  液温   :40°C
  電流密度 :20~50A/dm
  クーロン量:30~80As/dm
(Comparative Example 1-Comparative Example 5)
In the comparative example, the bath composition and plating conditions used are as follows.
[Bath composition and plating conditions]
(A) Formation of primary particle layer (copper plating)
Liquid composition: Copper 15g / L, sulfuric acid 75g / L
Liquid temperature: 25-35 ° C
Current density: 1 to 70 A / dm 2
Coulomb amount: 2 to 90 As / dm 2
(B) Formation of secondary particle layer (Cu—Co—Ni alloy plating conditions)
Liquid composition: Copper 15g / L, nickel 8g / L, cobalt 8g / L
pH: 2
Liquid temperature: 40 ° C
Current density: 20 to 50 A / dm 2
Coulomb amount: 30-80 As / dm 2
 上記実施例により形成した銅箔上の一次粒子層(Cuめっき)及び二次粒子層(Cu-Co-Ni合金めっき)を形成した場合の、一次粒子の平均粒径、二次粒子の平均粒径、粉落ち、ピール強度、耐熱性、粗化処理面の一定領域のレーザー顕微鏡による二次元表面積に対する三次元表面積の比を測定した結果を表1に示す。粗化処理面の一次粒子および二次粒子の平均粒径は、株式会社日立ハイテクノロジーズ製S4700を用いて、30000倍の倍率で粒子観察を行い、粒子径を測定した。粉落ち特性は銅箔の粗化処理面上に透明なメンディングテープを貼り付け、このテープを剥がした際にテープ粘着面に付着する脱落粗化粒子により、テープが変色する様子から粉落ち特性を評価した。すなわちテープの変色が無い、または僅かな場合は粉落ちOKとして、テープが灰色に変色する場合は粉落ちNGとした。常態ピール強度は銅箔粗化処理面とFR4樹脂基板を熱プレスにて張り合わせて銅張積層板を作製し、一般的な塩化銅回路エッチング液を使用して10mm回路を作製し、10mm回路銅箔を基板から剥いて、90°方向に引っ張りながら常態ピール強度を測定した。
また、比較例として、同様の結果を表1に示す。
なお、表1の一次粒子電流条件欄に電流条件、クーロン量が2つ記載されている例は、左に記載されている条件でめっきを行った後に、右に記載されている条件で更にめっきを行ったことを意味する。例えば、実施例1の一次粒子電流条件欄には「(65A/dm、80As/dm)+(20A/dm、30As/dm)」と記載されているが、これは一次粒子を形成する電流密度を65A/dm、クーロン量を80As/dmでめっきを行った後に、更に一次粒子を形成する電流密度を20A/dm、クーロン量を30As/dmとしてめっきを行ったことを示す。
Average particle size of primary particles, average particle size of secondary particles when primary particle layer (Cu plating) and secondary particle layer (Cu-Co-Ni alloy plating) on copper foil formed in the above example are formed Table 1 shows the results of measuring the ratio of the three-dimensional surface area to the two-dimensional surface area of the fixed area of the diameter, powder fall, peel strength, heat resistance, and roughened surface by a laser microscope. The average particle diameters of the primary particles and secondary particles of the roughened surface were observed with a magnification of 30000 times using S4700 manufactured by Hitachi High-Technologies Corporation, and the particle diameter was measured. The powder-off characteristics are based on the appearance of the tape discoloring due to the falling roughened particles adhering to the adhesive surface of the tape when a transparent mending tape is applied on the roughened surface of the copper foil. Evaluated. That is, when there was no or slight discoloration of the tape, the powder was OK, and when the tape was gray, the powder was NG. For normal peel strength, the copper foil roughened surface and the FR4 resin substrate are bonded together by hot pressing to prepare a copper clad laminate, and a 10 mm circuit is prepared using a general copper chloride circuit etchant. The normal peel strength was measured while peeling the foil from the substrate and pulling it in the 90 ° direction.
Moreover, the same result is shown in Table 1 as a comparative example.
In addition, in the example in which the current condition and two coulomb amounts are described in the primary particle current condition column in Table 1, after performing plating under the conditions described on the left, further plating is performed under the conditions described on the right. Means that For example, in the primary particle current condition column of Example 1, “(65 A / dm 2 , 80 As / dm 2 ) + (20 A / dm 2 , 30 As / dm 2 )” is described. After plating with a current density of 65 A / dm 2 and a coulomb amount of 80 As / dm 2 , plating was further performed with a current density of forming primary particles of 20 A / dm 2 and a coulomb amount of 30 As / dm 2 . It shows that.
Figure JPOXMLDOC01-appb-T000001
Figure JPOXMLDOC01-appb-T000001
表1から明らかなように、本願発明の実施例の結果は、次の通りである。
実施例1は、一次粒子を形成する電流密度を65A/dmと20A/dmとし、クーロン量を80As/dmと30As/dmとした場合で、二次粒子を形成する電流密度を28A/dmとし、クーロン量を20As/dmとした場合である。
なお、一次粒子を形成する電流密度とクーロン量が2段階になっているが、通常一次粒子を形成する場合には、2段階の電気めっきが必要となる。すなわち、第1段階の核粒子形成のめっき条件と第2段階の核粒子の成長の電気めっきである。
最初のめっき条件は、第1段階の核形成粒子形成のための電気めっき条件であり、次のめっき条件は、第2段階の核粒子の成長のための電気めっき条件である。以下の実施例及び比較例についても同様なので、説明は省略する。
As is apparent from Table 1, the results of the examples of the present invention are as follows.
In Example 1, the current density for forming primary particles is 65 A / dm 2 and 20 A / dm 2 , and the coulomb amounts are 80 As / dm 2 and 30 As / dm 2. This is a case where 28 A / dm 2 is set and the coulomb amount is 20 As / dm 2 .
In addition, although the current density and the amount of Coulomb which form primary particles are two steps, when forming primary particles normally, two steps of electroplating are required. That is, the plating conditions for the first stage core particle formation and the electroplating for the second stage core particle growth.
The first plating conditions are electroplating conditions for forming the first stage nucleating particles, and the second plating conditions are electroplating conditions for growing the second stage nucleating particles. The same applies to the following examples and comparative examples, and the description is omitted.
この結果、一次粒子の平均粒子径が0.45μmで、二次粒子の平均粒子径が0.30μmであり、粒子形成後のレーザー顕微鏡による三次元表面積は21589μmとなった。一方、同じ領域の二次元表面積は9924.4μmである(これは100×100μm面積相当)ので、二次元表面積に対する三次元表面積の比は2.18となり、本願発明の条件を満たしていた。
この結果、粉落ちが少なく、常態ピール強度が0.95kg/cmと高く、耐熱性劣化率(常態ピール測定後に180°C48時間加熱後のピール強度を測定してその差を劣化率とした)が30%以下と小さいという特徴を備えていた。
As a result, the average particle diameter of the primary particles was 0.45 μm, the average particle diameter of the secondary particles was 0.30 μm, and the three-dimensional surface area by the laser microscope after the particle formation was 21589 μm 2 . On the other hand, since the two-dimensional surface area of the same region is 9924.4 μm 2 (which corresponds to an area of 100 × 100 μm), the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.18, which satisfies the conditions of the present invention.
As a result, there was little powder falling and the normal peel strength was as high as 0.95 kg / cm, and the heat resistance deterioration rate (the peel strength after heating at 180 ° C. for 48 hours after the normal peel measurement was measured and the difference was taken as the deterioration rate) Was less than 30%.
実施例2は、一次粒子を形成する電流密度を65A/dmと2A/dmとし、クーロン量を80As/dmと4As/dmとした場合で、二次粒子を形成する電流密度を25A/dmとし、クーロン量を15As/dmとした場合である。
この結果、一次粒子の平均粒子径が0.40μmで、二次粒子の平均粒子径が0.15μmであり、レーザー顕微鏡による粒子形成後の表面積は20978μmとなった。一方、同じ領域の二次元表面積は9924.4μmである(これは100×100μm面積相当)ので、二次元表面積に対する三次元表面積の比は2.11となり、本願発明の条件を満たしていた。
この結果、粉落ちがなく、常態ピール強度が0.89kg/cmと高く、耐熱性劣化率(常態ピール測定後に180°C48時間加熱後のピール強度を測定してその差を劣化率とした)が30%以下と小さいという特徴を備えていた。
In Example 2, the current density for forming the primary particles is 65 A / dm 2 and 2 A / dm 2 , and the coulomb amounts are 80 As / dm 2 and 4 As / dm 2. This is a case where 25 A / dm 2 and the coulomb amount are 15 As / dm 2 .
As a result, the average particle diameter of primary particles was 0.40 μm, the average particle diameter of secondary particles was 0.15 μm, and the surface area after particle formation by a laser microscope was 20978 μm 2 . On the other hand, since the two-dimensional surface area of the same region is 9924.4 μm 2 (which corresponds to an area of 100 × 100 μm), the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.11, which satisfies the conditions of the present invention.
As a result, there was no powder fall and the normal peel strength was as high as 0.89 kg / cm, and the heat resistance deterioration rate (after measuring the normal peel, the peel strength after heating at 180 ° C. for 48 hours was measured and the difference was taken as the deterioration rate) Was less than 30%.
実施例3は、一次粒子を形成する電流密度を60A/dmと10A/dmとし、クーロン量を80As/dmと20As/dmとした場合で、二次粒子を形成する電流密度を25A/dmとし、クーロン量を30As/dmとした場合である。
この結果、一次粒子の平均粒子径が0.30μmで、二次粒子の平均粒子径が0.25μmであり、レーザー顕微鏡による粒子形成後の三次元表面積は21010μmとなった。一方、同じ領域の二次元表面積は9924.4μmである(これは100×100μm面積相当)ので、二次元表面積に対する三次元表面積の比は2.12となり、本願発明の条件を満たしていた。
粉落ちは無かった。常態ピール強度が0.92kg/cmと高く、また、耐熱性劣化率(常態ピール測定後に180°C48時間加熱後のピール強度を測定してその差を劣化率とした)が30%以下と小さいという特徴を備えていた。
In Example 3, the current density for forming the primary particles is 60 A / dm 2 and 10 A / dm 2 , and the coulomb amounts are 80 As / dm 2 and 20 As / dm 2. This is a case where 25 A / dm 2 and the coulomb amount are 30 As / dm 2 .
As a result, the average particle diameter of the primary particles was 0.30 μm, the average particle diameter of the secondary particles was 0.25 μm, and the three-dimensional surface area after forming the particles by a laser microscope was 21010 μm 2 . On the other hand, since the two-dimensional surface area of the same region is 9924.4 μm 2 (which corresponds to an area of 100 × 100 μm), the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.12, which satisfies the conditions of the present invention.
There was no powder fall. The normal peel strength is as high as 0.92 kg / cm, and the heat resistance deterioration rate (the peel strength after heating at 180 ° C. for 48 hours after the normal peel measurement is taken as the deterioration rate) is as small as 30% or less. It had the characteristics.
実施例4は、一次粒子を形成する電流密度を55A/dmと1A/dmとし、クーロン量を75As/dmと5As/dmとした場合で、二次粒子を形成する電流密度を25A/dmとし、クーロン量を30As/dmとした場合である。
この結果、一次粒子の平均粒子径が0.35μmで、二次粒子の平均粒子径が0.25μmであり、レーザー顕微鏡による粒子形成後の表面積は20847μmとなった。同じ領域の二次元表面積は9924.4μmである(これは100×100μm面積相当)ので、二次元表面積に対する三次元表面積の比は2.10となり、本願発明の条件を満たしていた。
粉落ちがなく、常態ピール強度が0.94kg/cmと高く、耐熱性劣化率(常態ピール測定後に180°C48時間加熱後のピール強度を測定してその差を劣化率とした)が30%以下と小さいという特徴を備えていた。
In Example 4, the current density for forming the primary particles is 55 A / dm 2 and 1 A / dm 2 , and the coulomb amounts are 75 As / dm 2 and 5 As / dm 2. This is a case where 25 A / dm 2 and the coulomb amount are 30 As / dm 2 .
As a result, the average particle diameter of the primary particles was 0.35 μm, the average particle diameter of the secondary particles was 0.25 μm, and the surface area after forming the particles by a laser microscope was 20847 μm 2 . Since the two-dimensional surface area of the same region is 9924.4 μm 2 (which corresponds to an area of 100 × 100 μm), the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.10, which satisfies the conditions of the present invention.
No powder fall off, normal peel strength is as high as 0.94 kg / cm, heat resistance deterioration rate (measured peel strength after heating at 180 ° C for 48 hours after measurement of normal peel, and the difference was taken as the deterioration rate) 30% It had the following small features.
実施例5は、一次粒子を形成する電流密度を50A/dmと5A/dmとし、クーロン量を70As/dmと10As/dmとした場合で、二次粒子を形成する電流密度を25A/dmとし、クーロン量を30As/dmとした場合である。
この結果、一次粒子の平均粒子径が0.30μmで、二次粒子の平均粒子径が0.25μmであり、レーザー顕微鏡による粒子形成後の表面積は20738μmとなった。同じ領域の二次元表面積は9924.4μmである(これは100×100μm面積相当)ので、二次元表面積に対する三次元表面積の比は2.09となり、本願発明の条件を満たしていた。
粉落ちがなく、常態ピール強度が0.91kg/cmと高く、耐熱性劣化率(常態ピール測定後に180°C48時間加熱後のピール強度を測定してその差を劣化率とした)が30%以下と小さいという特徴を備えていた。
In Example 5, the current density for forming the primary particles is 50 A / dm 2 and 5 A / dm 2 , and the coulomb amounts are 70 As / dm 2 and 10 As / dm 2. This is a case where 25 A / dm 2 and the coulomb amount are 30 As / dm 2 .
As a result, the average particle diameter of the primary particles was 0.30 μm, the average particle diameter of the secondary particles was 0.25 μm, and the surface area after forming the particles by a laser microscope was 20738 μm 2 . Since the two-dimensional surface area of the same region is 9924.4 μm 2 (which corresponds to an area of 100 × 100 μm), the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.09, which satisfies the conditions of the present invention.
No powder fall off, normal peel strength is as high as 0.91 kg / cm, heat resistance deterioration rate (measured peel strength after heating at 180 ° C for 48 hours after measurement of normal peel and the difference was taken as the deterioration rate) 30% It had the following small features.
実施例6は、一次粒子を形成する電流密度を50A/dmと2A/dmとし、クーロン量を70As/dmと3As/dmとした場合で、二次粒子を形成する電流密度を15A/dmとし、クーロン量を30As/dmとした場合である。
この結果、一次粒子の平均粒子径が0.25μmで、二次粒子はほとんど被せ(正常)めっき状態(粒径は0.1μm未満)となり、レーザー顕微鏡による粒子形成後の表面積は20112μmとなった。同じ領域の二次元表面積は9924.4μmである(これは100×100μm面積相当)ので、二次元表面積に対する三次元表面積の比は2.03となり、本願発明の条件を満たしていた。
粉落ちがなく、常態ピール強度が0.90kg/cmと高く、耐熱性劣化率(常態ピール測定後に180°C48時間加熱後のピール強度を測定してその差を劣化率とした)が30%以下と小さいという特徴を備えていた。
In Example 6, the current density for forming the primary particles is 50 A / dm 2 and 2 A / dm 2 , and the coulomb amounts are 70 As / dm 2 and 3 As / dm 2. This is a case where 15 A / dm 2 and the coulomb amount are 30 As / dm 2 .
As a result, the average particle diameter of the primary particles is 0.25 μm, and the secondary particles are almost covered (normal) in a plated state (particle diameter is less than 0.1 μm), and the surface area after the particle formation by the laser microscope is 20112 μm 2. It was. Since the two-dimensional surface area of the same region was 9924.4 μm 2 (which corresponds to an area of 100 × 100 μm), the ratio of the three-dimensional surface area to the two-dimensional surface area was 2.03, which satisfied the conditions of the present invention.
No powder fall off, normal peel strength is as high as 0.90 kg / cm, heat resistance deterioration rate (measured peel strength after heating at 180 ° C for 48 hours after measurement of normal peel and the difference was taken as the deterioration rate) 30% It had the following small features.
実施例7は、一次粒子を形成する電流密度を60A/dmと15A/dmとし、クーロン量を80As/dmと20As/dmとした場合で、二次粒子(二次粒子層)を形成する電流密度を20A/dmとし、クーロン量を60As/dmとして被せめっき(正常めっき)をした後に、さらに電流密度を20A/dmとし、クーロン量20As/dmとして粒子を形成した場合である。
この結果、一次粒子の平均粒子径が0.35μmで、二次粒子は被せ(正常)めっき状態(粒径は0.1μm未満)および平均粒子径0.15μmの2段階構成となり、レーザー顕微鏡による粒子形成後の表面積は20975μmとなった。同じ領域の二次元表面積は9924.4μmである(これは100×100μm面積相当)ので、二次元表面積に対する三次元表面積の比は2.11となり、本願発明の条件を満たしていた。
粉落ちがなく、常態ピール強度が0.90kg/cmと高く、耐熱性劣化率(常態ピール測定後に180°C48時間加熱後のピール強度を測定してその差を劣化率とした)が30%以下と小さいという特徴を備えていた。
Example 7 is a case where the current density for forming primary particles is 60 A / dm 2 and 15 A / dm 2 , and the coulomb amounts are 80 As / dm 2 and 20 As / dm 2. Secondary particles (secondary particle layer) and 20A / dm 2 current density for forming a, after the plating covered the coulomb quantity as 60As / dm 2 (normal plating), further a current density was 20A / dm 2, forming a particle as coulombs 20AS / dm 2 This is the case.
As a result, the primary particle has an average particle size of 0.35 μm, the secondary particles are covered (normal) in a plated state (particle size is less than 0.1 μm), and the average particle size is 0.15 μm. The surface area after particle formation was 20975 μm 2 . Since the two-dimensional surface area of the same region is 9924.4 μm 2 (which corresponds to an area of 100 × 100 μm), the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.11, which satisfies the conditions of the present invention.
No powder fall off, normal peel strength is as high as 0.90 kg / cm, heat resistance deterioration rate (measured peel strength after heating at 180 ° C for 48 hours after measurement of normal peel and the difference was taken as the deterioration rate) 30% It had the following small features.
実施例8は、一次粒子を形成する電流密度を40A/dmと1A/dmとし、クーロン量を40As/dmと2As/dmとした場合で、二次粒子を形成する電流密度を20A/dmとし、クーロン量を20As/dmとした場合である。
この結果、一次粒子の平均粒子径が0.15μmで、二次粒子の平均粒子径が0.15μmであり、粒子形成後の表面積20345μmとなった。同じ領域の二次元表面積は9924.4μmである(これは100×100μm面積相当)ので、二次元表面積に対する三次元表面積の比は2.05となり、本願発明の条件を満たしていた。
粉落ちは発生しなかった。また、常態ピール強度は0.75kg/cmであり、耐熱性劣化率(常態ピール測定後に180°C48時間加熱後のピール強度を測定してその差を劣化率とした)は35%であった。
Example 8 is a case where the current density for forming the primary particles is 40 A / dm 2 and 1 A / dm 2 and the coulomb amounts are 40 As / dm 2 and 2 As / dm 2. This is a case where 20 A / dm 2 is set and the coulomb amount is 20 As / dm 2 .
As a result, the average particle diameter of the primary particles was 0.15 μm, the average particle diameter of the secondary particles was 0.15 μm, and the surface area after formation of the particles was 20345 μm 2 . Since the two-dimensional surface area of the same region is 9924.4 μm 2 (which corresponds to an area of 100 × 100 μm), the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.05, which satisfies the conditions of the present invention.
Powder fall did not occur. The normal peel strength was 0.75 kg / cm, and the heat resistance deterioration rate (the peel strength after heating at 180 ° C. for 48 hours after measurement of the normal peel was measured and the difference was taken as the deterioration rate) was 35%. .
これに対して、比較例は、次の結果となった。
比較例1は、一次粒子を形成する電流密度を63A/dmと10A/dmとし、クーロン量を80As/dmと30As/dmとした場合で、二次粒子は形成しなかった場合である。この結果、一次粒子の平均粒子径が0.50μmとなり、レーザー顕微鏡による粒子形成後の表面積は20804μmとなった。同じ領域の二次元表面積は9924.4μmである(これは100×100μm面積相当)ので、二次元表面積に対する三次元表面積の比は2.10となり、本願発明の条件を満たしていた。
粉落ちはなく常態ピール強度が0.94kg/cmと高く実施例レベルであった。しかし耐熱性劣化率(常態ピール測定後に180°C48時間加熱後のピール強度を測定し手その差を劣化率とした)が60%と著しく悪かった。全体的な印刷回路用銅箔としての評価は、不良であった。
On the other hand, the comparative example has the following results.
In Comparative Example 1, the current density for forming primary particles is 63 A / dm 2 and 10 A / dm 2 , and the coulomb amounts are 80 As / dm 2 and 30 As / dm 2, and the secondary particles are not formed. It is. As a result, the average particle diameter of primary particles was 0.50 μm, and the surface area after the formation of particles by a laser microscope was 20804 μm 2 . Since the two-dimensional surface area of the same region is 9924.4 μm 2 (which corresponds to an area of 100 × 100 μm), the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.10, which satisfies the conditions of the present invention.
There was no powder falling off, and the normal peel strength was as high as 0.94 kg / cm, which was an example level. However, the heat resistance deterioration rate (the peel strength after heating at 180 ° C. for 48 hours after measuring the normal state peel and the difference as the deterioration rate) was 60%, which was extremely bad. The overall evaluation as a printed circuit copper foil was poor.
比較例2は、一次粒子径が存在せず、二次粒子層のみの従来例を示すものである。すなわち、二次粒子を形成する電流密度を50A/dmとし、クーロン量を30As/dmとした場合である。
この結果、二次粒子の平均粒子径が0.30μmとなり、レーザー顕微鏡による粒子形成後の三次元表面積は21834μmとなった。同じ領域の二次元表面積は9924.4μmである(これは100×100μm面積相当)ので、二次元表面積に対する三次元表面積の比は2.20となり、本発明の条件を満たしていなかった。
粗化粒子の粉落ちが多量に発生した。常態ピール強度が0.90kg/cmと実施例レベルであり、耐熱性劣化率(常態ピール測定後に180°C48時間加熱後のピール強度を測定してその差を劣化率とした)が30%以下と小さいと実施例レベルであった。上記の通り、粉落ちが多量に発生するという問題があるため、全体的な印刷回路用銅箔としての総合評価は、不良であった。
Comparative Example 2 shows a conventional example in which there is no primary particle size and only a secondary particle layer. That is, the current density for forming the secondary particles is 50 A / dm 2 and the coulomb amount is 30 As / dm 2 .
As a result, the average particle diameter of the secondary particles was 0.30 μm, and the three-dimensional surface area after the formation of particles by a laser microscope was 21834 μm 2 . Since the two-dimensional surface area of the same region is 9924.4 μm 2 (which corresponds to an area of 100 × 100 μm), the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.20, which does not satisfy the conditions of the present invention.
A large amount of powdered coarse particles occurred. Normal peel strength is 0.90 kg / cm, which is an example level, and heat resistance deterioration rate (measured peel strength after heating at 180 ° C. for 48 hours after measurement of normal peel, and the difference was taken as the deterioration rate) is 30% or less It was an example level when it was small. As described above, since there is a problem that a large amount of powder falling occurs, the overall evaluation as an overall copper foil for printed circuits was poor.
比較例3は、一次粒子を形成する電流密度を63A/dmと1A/dmとし、クーロン量を80As/dmと2As/dmとした場合で、二次粒子を形成する電流密度を28A/dmとし、クーロン量を73As/dmとした場合である。
この結果、一次粒子の平均粒子径が0.35μmで、二次粒子の平均粒子径が0.60μmであり、レーザー顕微鏡による粒子形成後の三次元表面積は21797μmとなった。同じ領域の二次元表面積は9924.4μmである(これは100×100μm面積相当)ので、二次元表面積に対する三次元表面積の比は2.20となり、本発明の条件を満たしていなかった。粉落ちが多量に発生した。常態ピール強度が0.93kg/cmと高く、耐熱性劣化率(常態ピール測定後に180°C48時間加熱後のピール強度を測定してその差を劣化率とした)が30%以下と小さいと実施例レベルであったが、粉落ちが多量に発生した。全体的な印刷回路用銅箔としての評価は、不良であった。
In Comparative Example 3, the current density for forming the primary particles is 63 A / dm 2 and 1 A / dm 2 , and the coulomb amounts are 80 As / dm 2 and 2 As / dm 2. This is a case where 28 A / dm 2 is set and the coulomb amount is 73 As / dm 2 .
As a result, the average particle diameter of the primary particles was 0.35 μm, the average particle diameter of the secondary particles was 0.60 μm, and the three-dimensional surface area after forming the particles by a laser microscope was 21797 μm 2 . Since the two-dimensional surface area of the same region is 9924.4 μm 2 (which corresponds to an area of 100 × 100 μm), the ratio of the three-dimensional surface area to the two-dimensional surface area is 2.20, which does not satisfy the conditions of the present invention. A large amount of powder fall occurred. When the normal peel strength is as high as 0.93 kg / cm and the heat resistance deterioration rate (the peel strength after heating at 180 ° C. for 48 hours after the normal peel measurement is taken as the deterioration rate) is less than 30% Although it was an example level, a large amount of powder falling occurred. The overall evaluation as a printed circuit copper foil was poor.
比較例4は、一次粒子を形成する電流密度を63A/dmと1A/dmとし、クーロン量を80As/dmと2As/dmとした場合で、二次粒子を形成する電流密度を31A/dmとし、クーロン量を40As/dmとした場合である。
この結果、一次粒子の平均粒子径が0.35μmで、二次粒子の平均粒子径が0.40μmであり、粒子形成後の表面積22448μmとなった。同じ領域の二次元表面積は9924.4μmである(これは100×100μm面積相当)ので、二次元表面積に対する三次元表面積の比は2.26となり、本発明の条件を満たしていなかった。
常態ピール強度が0.91kg/cmと高く、耐熱性劣化率(常態ピール測定後に180°C48時間加熱後のピール強度を測定してその差を劣化率とした)が30%以下と小さいと実施例レベルであったが、粉落ちが多量に発生した。全体的な印刷回路用銅箔としての評価は、不良であった。
In Comparative Example 4, the current density for forming the primary particles is 63 A / dm 2 and 1 A / dm 2 , and the coulomb amounts are 80 As / dm 2 and 2 As / dm 2. This is a case where 31 A / dm 2 and the coulomb amount is 40 As / dm 2 .
As a result, the average particle diameter of the primary particles was 0.35 μm, the average particle diameter of the secondary particles was 0.40 μm, and the surface area after particle formation was 22448 μm 2 . Since the two-dimensional surface area of the same region was 9924.4 μm 2 (which corresponds to an area of 100 × 100 μm), the ratio of the three-dimensional surface area to the two-dimensional surface area was 2.26, which did not satisfy the conditions of the present invention.
When the normal peel strength is as high as 0.91 kg / cm and the heat resistance deterioration rate (the peel strength after heating at 180 ° C. for 48 hours after the normal peel measurement is taken as the deterioration rate) is less than 30% Although it was an example level, a large amount of powder falling occurred. The overall evaluation as a printed circuit copper foil was poor.
比較例5は、一次粒子を形成する電流密度を63A/dmと10A/dmとし、クーロン量を80As/dmと30As/dmとした場合で、二次粒子を形成する電流密度を31A/dmとし、クーロン量を40As/dmとした場合である。この結果、一次粒子の平均粒子径が0.50μmで、二次粒子の平均粒子径が0.40μmであり、粒子形成後の表面積22086μmとなった。同じ領域の二次元表面積は9924.4μmである(これは100×100μm面積相当)ので、二次元表面積に対する三次元表面積の比は2.23となり、本発明の条件を満たしていなかった。
常態ピール強度が0.91kg/cmであり、耐熱性劣化率(常態ピール測定後に180°C48時間加熱後のピール強度を測定してその差を劣化率とした)が30%以下と小さいと実施例レベルであったが、粉落ちが発生した。全体的な印刷回路用銅箔としての評価は、不良であった。
In Comparative Example 5, the current density for forming the primary particles is 63 A / dm 2 and 10 A / dm 2 , and the coulomb amounts are 80 As / dm 2 and 30 As / dm 2. This is a case where 31 A / dm 2 and the coulomb amount is 40 As / dm 2 . As a result, the average particle diameter of the primary particles was 0.50 μm, the average particle diameter of the secondary particles was 0.40 μm, and the surface area after particle formation was 22086 μm 2 . Since the two-dimensional surface area of the same region was 9924.4 μm 2 (which corresponds to an area of 100 × 100 μm), the ratio of the three-dimensional surface area to the two-dimensional surface area was 2.23, which did not satisfy the conditions of the present invention.
When the normal peel strength is 0.91 kg / cm and the heat resistance deterioration rate (the peel strength after heating at 180 ° C. for 48 hours after the normal peel measurement is taken as the difference) is as small as 30% or less. Although it was an example level, powder fall occurred. The overall evaluation as a printed circuit copper foil was poor.
上記実施例及び比較例の対比から明らかなように、銅箔(原箔)の表面に、銅の一次粒子層を形成した後、該一次粒子層の上に、銅、コバルト及びニッケルからなる3元系合金からなる二次粒子層を形成した場合において、粗化処理面の一定領域のレーザー顕微鏡による二次元表面積に対する三次元表面積の比が2.0以上2.2未満であるとすることにより、粉落ちと言われる現象及び処理ムラを、安定して抑制することができるという優れた効果を有し、さらにピール強度を高め、かつ耐熱性を向上させることができる。
また、一次粒子層の平均粒径を0.25-0.45μm、銅、コバルト及びニッケルからなる3元系合金からなる二次粒子層の平均粒子径を0.35μm以下とするのが、上記の効果を達成する上で、さらに有効である。
As is clear from the comparison of the above Examples and Comparative Examples, after forming a primary particle layer of copper on the surface of the copper foil (raw foil), 3 consisting of copper, cobalt and nickel is formed on the primary particle layer. When a secondary particle layer made of a ternary alloy is formed, the ratio of the three-dimensional surface area to the two-dimensional surface area by a laser microscope of a certain region of the roughened surface is 2.0 or more and less than 2.2 In addition, it has an excellent effect of being able to stably suppress the phenomenon called powder fall and processing unevenness, and can further increase the peel strength and improve the heat resistance.
The average particle size of the primary particle layer is 0.25 to 0.45 μm, and the average particle size of the secondary particle layer made of a ternary alloy made of copper, cobalt and nickel is 0.35 μm or less. It is more effective in achieving the effect.
上記の通り、銅-コバルト-ニッケル合金めっきからなる二次粒子層(粗化処理)を形成する際に、樹枝状に形成される粗化粒子が銅箔の表面から剥がれ落ち、一般に粉落ちと言われる現象及び処理ムラを抑制することができるという優れた効果を有し、さらにピール強度を高め、かつ耐熱性を向上させることのできる印刷回路用銅箔を提供するものである。また、異常成長した粒子が少なくなり、粒子径が揃い、かつ全面を覆うことになるので、エッチング性が良好となり、精度の良い回路形成が可能となるので半導体デバイスの小型化、高集積化が進む電子機器用印刷回路材料として有用である。 As described above, when forming a secondary particle layer (roughening treatment) composed of copper-cobalt-nickel alloy plating, the roughened particles formed in a dendritic shape peel off from the surface of the copper foil, It is an object of the present invention to provide a copper foil for a printed circuit which has an excellent effect of suppressing the phenomenon and processing unevenness, which can further enhance the peel strength and improve the heat resistance. In addition, the number of abnormally grown particles is reduced, the particle diameter is uniform, and the entire surface is covered, so that the etching property is good and the circuit can be formed with high accuracy, so that the semiconductor device can be downsized and highly integrated. It is useful as a printed circuit material for advanced electronic equipment.

Claims (6)

  1. 銅箔の表面に、銅の一次粒子層を形成した後、該一次粒子層の上に、銅、コバルト及びニッケルからなる3元系合金の二次粒子層を形成した印刷回路用銅箔であって、粗化処理面の一定領域のレーザー顕微鏡による二次元表面積に対する三次元表面積の比が2.0以上2.2未満であることを特徴とする印刷回路用銅箔。 A copper foil for printed circuit, in which a primary particle layer of copper is formed on the surface of the copper foil, and then a secondary particle layer of a ternary alloy composed of copper, cobalt and nickel is formed on the primary particle layer. A copper foil for a printed circuit, wherein a ratio of a three-dimensional surface area to a two-dimensional surface area measured by a laser microscope in a certain region of the roughened surface is 2.0 or more and less than 2.2.
  2. 前記銅の一次粒子層の平均粒子径が0.25-0.45μmであり、銅、コバルト及びニッケルからなる3元系合金からなる二次粒子層の平均粒子径が0.35μm以下であることを特徴とする請求項1記載の印刷回路用銅箔。 The copper primary particle layer has an average particle size of 0.25 to 0.45 μm, and the secondary particle layer made of a ternary alloy composed of copper, cobalt and nickel has an average particle size of 0.35 μm or less. The copper foil for printed circuits according to claim 1.
  3.  前記一次粒子層及び二次粒子層が、電気めっき層であることを特徴とする請求項1又は2記載の印刷回路用銅箔。 The printed circuit copper foil according to claim 1 or 2, wherein the primary particle layer and the secondary particle layer are electroplating layers.
  4. 二次粒子が、前記一次粒子の上に成長した1又は複数個の樹枝状の粒子または前記一次粒子の上に成長した正常めっき層であることを特徴とする請求項1~3のいずれか一項に記載の印刷回路用銅箔。 The secondary particle is one or a plurality of dendritic particles grown on the primary particle or a normal plating layer grown on the primary particle. The copper foil for printed circuits as described in a term.
  5. 一次粒子層及び二次粒子層の接着強度が0.80kg/cm以上であることを特徴とする請求項1~4のいずれか一項に記載の印刷回路用銅箔。 The printed circuit copper foil according to any one of claims 1 to 4, wherein the adhesive strength between the primary particle layer and the secondary particle layer is 0.80 kg / cm or more.
  6. 一次粒子層及び二次粒子層の接着強度が0.90kg/cm以上であることを特徴とする請求項1~4のいずれか一項に記載の印刷回路用銅箔。 The printed circuit copper foil according to any one of claims 1 to 4, wherein the adhesive strength between the primary particle layer and the secondary particle layer is 0.90 kg / cm or more.
PCT/JP2012/078115 2011-11-02 2012-10-31 Copper foil for printing circuit WO2013065713A1 (en)

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JP6867102B2 (en) * 2014-10-22 2021-04-28 Jx金属株式会社 Manufacturing method of copper heat dissipation material, copper foil with carrier, connector, terminal, laminate, shield material, printed wiring board, metal processing member, electronic device, and printed wiring board
CN115226288A (en) 2021-04-21 2022-10-21 Lg伊诺特有限公司 Circuit board, image sensor module, lens driving device, and camera module

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