WO2012130209A2 - Dispositif et procédé pour la détection et l'analyse de rayonnement laser - Google Patents

Dispositif et procédé pour la détection et l'analyse de rayonnement laser Download PDF

Info

Publication number
WO2012130209A2
WO2012130209A2 PCT/DE2012/000283 DE2012000283W WO2012130209A2 WO 2012130209 A2 WO2012130209 A2 WO 2012130209A2 DE 2012000283 W DE2012000283 W DE 2012000283W WO 2012130209 A2 WO2012130209 A2 WO 2012130209A2
Authority
WO
WIPO (PCT)
Prior art keywords
laser radiation
detector
radiation
detector signals
detectors
Prior art date
Application number
PCT/DE2012/000283
Other languages
German (de)
English (en)
Other versions
WO2012130209A3 (fr
Inventor
Wolfgang Rehm
Andreas Prücklmeier
Klaus Schertler
Original Assignee
Eads Deutschland Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eads Deutschland Gmbh filed Critical Eads Deutschland Gmbh
Publication of WO2012130209A2 publication Critical patent/WO2012130209A2/fr
Publication of WO2012130209A3 publication Critical patent/WO2012130209A3/fr

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S3/00Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received
    • G01S3/78Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received using electromagnetic waves other than radio waves
    • G01S3/782Systems for determining direction or deviation from predetermined direction
    • G01S3/783Systems for determining direction or deviation from predetermined direction using amplitude comparison of signals derived from static detectors or detector systems
    • G01S3/784Systems for determining direction or deviation from predetermined direction using amplitude comparison of signals derived from static detectors or detector systems using a mosaic of detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/4804Auxiliary means for detecting or identifying lidar signals or the like, e.g. laser illuminators

Definitions

  • the invention relates to a device and a method for detecting and analyzing laser radiation. Such devices and methods are particularly important in optical metrology and analytics with laser in the free jet of importance.
  • Generic devices make it possible, for example, to detect a free-radiating, non-fiber-coupled laser and also to determine the direction of the incident laser beam.
  • the possible uses of such devices are both in civil as well as safety / military field, for example in the field of information transmission or metrology. In the military field, they can also serve to detect and, if necessary, assess threat situations.
  • Laser beam of a continuous wave laser can be determined. The described
  • Device comprises a diffraction grating, which the incident laser beam in a
  • the determined direction of incidence provides information about the location of the laser source.
  • the determined wavelength of the laser light allows a classification of the laser source in the technology used (diode laser, solid-state and fiber lasers, gas lasers, Raman, OPO), as for certain applications
  • the invention has for its object to provide a generic device and a generic method, with the laser radiation both from
  • CW lasers as well as pulse lasers can be detected and analyzed.
  • the object is, according to a first alternative, by a device for detecting and analyzing laser radiation, with at least one diffraction grating, at least one imaging optical system, and at least one detector, which has a multiplicity of
  • detector elements for detecting detector signals, in which the incident laser radiation is converted by the diffraction grating into diffractive radiation, and then directed by the imaging optics to the detector and generates there detector signals, wherein a readout unit is provided for reading out the detector signals of the detector between a low readout frequency in the range of 10 Hz - 100 Hz and a high readout frequency in the range of 500 Hz - 10 7 Hz several times per second, and an evaluation unit is provided, which is designed and set up, based on the detector signals thus read a to determine several or all of the following quantities: direction of incidence of
  • Laser radiation wavelength of laser radiation, frequency bandwidth of
  • Laser radiation pulse repetition rate of the laser radiation, pulse length of the laser radiation.
  • the object is according to a second alternative by a device for detecting and analyzing laser radiation, with at least one diffraction grating, at least one imaging optical system, and two or more detectors, each of a plurality of
  • Diffraction radiation is transmitted, which is then directed by means of the at least one imaging optics on the detectors and generates there detector signals, wherein a readout unit is present, the detector signals at least one of the two or more detectors with a temporally constant low readout frequency in the range of 10 Hz 100 Hz, and the detector signals another one of the two or more Detectors with a temporally constant high readout frequency in the range of 500 Hz - 10 7 Hz reads, and an evaluation unit is provided, which is designed and adapted to determine based on the detector signals thus read one, several or all of the following sizes: direction of incidence of Laser radiation, wavelength of the laser radiation, frequency bandwidth of the laser radiation, pulse repetition rate of the laser radiation, pulse length of the laser radiation.
  • the invention is therefore based on the idea of alternately reading out the detector signals of a detector between a low and a high readout frequency, or continuously reading out a first detector with a temporally constant low readout frequency and a second detector with a constant high readout frequency.
  • a first detector with a temporally constant low readout frequency
  • a second detector with a constant high readout frequency.
  • image data are generated in both specified alternatives which have different exposure times and frame rates, whereby an image is understood to be the entirety of the detector signals read out at a time by the detector or the image data generated therefrom.
  • the image data obtained in this way makes it possible to reliably distinguish whether the incident laser radiation originates from a continuous wave laser or a pulsed laser, the pulse duration predominantly typically in the range of 1 - 200 ns, 1 - 100 ns, 1 - 75 ns, 1 - 25 ns , in particular 5-50 nanoseconds (ns).
  • the inventive device can be realized in a compact design and low weight, so that their use in a ready range of use is possible.
  • an analysis system that is used both in laboratories and mobile outdoor use of civil and security technology.
  • An integration in flying manned and unmanned platforms, as well as space applications on satellites can be realized by the compact design.
  • An advantageous development of the device according to the invention according to the first alternative is characterized in that the read-out unit is designed and set up such that the change between the low read-out frequency f n and the high read-out frequency f h is not in the form of a changeover between the
  • Read-out frequencies ie the sequence: f n , f h , f n , f, fn ⁇ ⁇ takes place, but that
  • interposed predetermined read-only coefficients are inserted, ie according to the sequence: f n , f ,, f 2 ,... f j, f h , f h ... f 2 , f f n , if 2 , where ⁇ h ⁇ ⁇ fi. This allows an even more accurate determination of the pulse repetition rate or the pulse duration when pulsed laser radiation impinges.
  • the readout unit is preferably designed and set up in the device according to the invention according to the first alternative such that the change between the low and the high readout frequency within a second between 2 - 100 times, 2 - 50 times, 2 - 25 times, in particular 10 times ,
  • the device preferably comprises at least one beam splitter in the beam path between incident laser radiation and the detector (s).
  • this beam splitter can be arranged in front of two or more diffraction gratings in the beam path in order to direct or distribute the incident laser radiation onto the diffraction gratings.
  • the beam splitter can be connected directly downstream of a diffraction grating in order to direct or distribute the diffraction radiation produced by the diffraction grating to a plurality of imaging optics connected downstream of the beam splitter.
  • the beam splitter can finally be connected directly downstream of an imaging optical system in order to direct or distribute the diffraction radiation to a plurality of detectors.
  • Devices according to the invention are preferably designed and set up for detecting and analyzing laser radiation in the wavelength range from 780 nm to 1,600 nm, since most of the laser sources known today operate in the wavelength range specified above.
  • This design concerns both the selection of the corresponding diffraction gratings, the imaging optics, the detectors and, if necessary, the / the beam splitter / s, as well as the corresponding adaptation of the evaluation algorithms in the evaluation unit.
  • the person skilled in these relationships are known, so that is omitted at this point to a more detailed explanation.
  • can Device for special tasks also be tuned to a larger, a smaller and / or a corresponding shifted wavelength range. These are well-known measures that require no further explanation here.
  • CMOS or CCD detectors are used for a device according to the invention.
  • the detector elements can be arranged flat or linear, i. For example, as a detector element array or arranged in a row
  • two or more detectors of different types or made of different materials, and therefore different properties such as. Sensitivities, response times, dead times, etc. have. Particularly preferably, at least two of the detectors have different
  • the evaluation unit can be designed and set up in such a way that, in the case of the detector signals read out with the high readout frequency, data is reduced before their analysis.
  • This data reduction can be effected, for example, by summing or averaging the detector signals of a predetermined number of adjacent detector elements or generally calculating them with one another. In this case, a plurality of detector signals are combined to form a signal.
  • all methods of data reduction known to the person skilled in the art are additionally or alternatively applicable depending on the present concrete task.
  • the procedural part of the object is achieved according to a first alternative by a method for detecting and analyzing laser radiation with a device comprising at least one diffraction grating, at least one imaging optics, and at least one detector comprising a plurality of detector elements for detecting
  • Detector signals comprises, wherein the incident laser radiation is converted by the diffraction grating into diffractive radiation, which is then directed by the imaging optics to the detector and generates there detector signals.
  • the method according to the invention comprises the following steps: readout of the detector signals detected by the detector, wherein the readout frequency is repeated several times per second between a low readout frequency in the range of 10 Hz - 100 Hz and a high Readout frequency in the range of 500 Hz - 10 7 Hz changes, and on the basis of the thus read detector signals, determining one, several or all of the following variables: direction of incidence of the laser radiation, wavelength of the laser radiation,
  • Pulse length of the laser radiation Pulse length of the laser radiation.
  • the procedural part of the object is achieved according to a second alternative by a method for detecting and analyzing laser radiation with a device comprising at least one diffraction grating, at least one imaging optics, and two or more detectors each having a plurality of detector elements for detecting
  • Detector signals comprise comprises, wherein the incident laser radiation is converted by the at least one diffraction grating into diffraction radiation, which is then directed by means of the at least one imaging optical system to the detectors and generates there detector signals.
  • the method comprises the following steps: reading the detector signals detected by one of the detectors with a temporally constant low readout frequency in the range of 10 Hz-100 Hz, and the
  • Detector signals of a further one of the two or more detectors with a temporally constant high readout frequency in the range of 500 Hz - 10 7 Hz and based on the thus read detector signals, determining one, several or all of the following variables: direction of incidence of the laser radiation, wavelength of the laser radiation,
  • Pulse length of the laser radiation Pulse length of the laser radiation.
  • Fig. 1 is a schematic representation of a device according to the invention
  • Fig. 2 is a schematic representation for explaining the inventive
  • FIG. 3 is a schematic representation of a device according to the invention
  • Fig. 4 is a schematic representation of a device according to the invention
  • Fig. 5 is a schematic representation of a device according to the invention.
  • Fig. 6 is a schematic diffraction pattern on the detector D.
  • Fig. 7 shows the intensity distribution of the diffraction pattern of Fig. 6 on the
  • Fig. 1 shows a schematic representation of a device according to the invention according to the first embodiment.
  • the device consists of a diffractive grating G, an imaging optic O, a two-dimensional imaging
  • the incident laser radiation 101 (of course, in addition to other background radiation) is transferred to diffraction radiation 102 after passing through the diffraction grating G.
  • the diffraction grating G divides the incident laser radiation 101 into a plurality of orders, wherein the diffraction grating G can be dimensioned one-dimensionally or multi-dimensionally. In the one-dimensional case, the laser radiation 101 in several
  • Diffraction grating G are several grids arranged one behind the other and twisted.
  • a multidimensional Diffraction grating G is a cross lattice in which a grating is arranged rotated by 90 degrees to the second.
  • the optical system O has the task of limiting the diffraction beams (diffraction radiation) 102 to a specific diameter by means of a lens diaphragm and of focusing and / or imaging high-resolution and efficient on the detector D by means of a correspondingly adapted lens system.
  • the read-out unit A is embodied and set up such that for reading the detector signals of the detector D between a low readout frequency in the range of 10 Hz-100 Hz and a high readout frequency in the range of 500 Hz-0 7 Hz several times per second in predetermined or known Way is changed.
  • a low readout frequency in the range of 10 Hz-100 Hz
  • a high readout frequency in the range of 500 Hz-0 7 Hz several times per second in predetermined or known Way is changed.
  • FIGS. 1 and 3-5 the incident laser radiation 101, the diffraction radiation 102 produced by a diffraction grating G, and the radiation 103 focused on a detector D by the imaging optical system O are shown as arrows with solid lines, while the signal or data flow from the detector D to the readout unit A, from there to the evaluation unit B and from there to the
  • Display unit C in is shown as arrows with dashed lines.
  • Pulse lasers used in the military sector are sufficient
  • the read-out frequency of a detector D and thus the image refresh rate must be correspondingly high. This is preferably between 1,000 and more than 10 million images per second.
  • two detectors are operated according to the invention with a very different readout frequency.
  • the read frequency of a detector is changed several times per second between a low and a high read-out frequency.
  • the shorter exposure time at the high readout frequency reduces the brightness of the background image and can even make the image completely dark.
  • the brightness of incident pulsed laser radiation is not reduced, since the pulse duration of the laser radiation is usually much shorter than the exposure time.
  • image data or images with different exposure time and refresh rate are generated.
  • 2 shows a schematic representation for further explanation. Shown are the image times of individual successive images plotted over the time axis t. It can be seen from the representation that the images 1, 2 and 12 were obtained with a lower refresh rate and therefore with a low readout frequency than the images 3 -11.
  • the image duration readable from FIG. 2 is the reciprocal of the image repetition rate and is the sum of the exposure duration and the dead time for reading the image information (for discharging the detector).
  • Image data set at the high readout frequency before their analysis reduced It should be mentioned here that the above-mentioned image data result from the read-out detector signals after corresponding A / D conversion.
  • binning the resolution of the detector D at high readout frequencies / refresh rates is reduced by combining detector signals of horizontally and vertically adjacent detector elements (pixels, pixels) in hardware or software .
  • Typical binning patterns are z. B. 2 x 2 or 4 x 4, but also the combination of whole image lines or image columns to a Pixel is possible.
  • this reduces the amount of image data to be taken into account during the analysis, but on the other hand, of course, this is at the expense of the spatial resolution of the resulting reduced image data. It applies here for the present
  • Pixel brightness of the laser radiation 101 or of the diffraction radiation 103 finally detected by the detector D is retained by binning.
  • the addition of the image brightnesses in digits (0 to 4096 at 12 bits) of individual components from 4 adjacent pixels (pixels 1-4) is as follows:
  • Pixel 1 background brightness: 0, noise: 1, laser radiation: 0
  • Pixel 2 background brightness: 0, noise: 2, laser radiation: 0
  • Pixel 3 Background Brightness: 0, Noise: 2, Laser Radiation: 25
  • Pixel 4 Background Brightness: 0, Noise: 1, Laser Radiation: 0
  • Detector area (image area) are locally concentrated and reduced to this radiation source. This so-called region-of-interest (ROI) function will make this one
  • Refresh rate (high readout frequency) considered.
  • ROI small area
  • Reading frequency are set very high (for example, to 10,000 -10 million Images / s) so that the time characteristics such as pulse duration and pulse repetition rate can be determined.
  • the determination of the direction of incidence of the incident laser radiation 101 is based on the following relationship.
  • the incident laser radiation 101 is through the
  • Diffraction grating G divided into a plurality of partial beams (diffraction radiation 102) whose deflection angle is determined by the lattice constant of the diffraction grating G used and the diffraction order N. Since the position of the center of the resulting diffraction pattern (in the case of monochromatic radiation is a dot pattern) on the detector D is an optical image of the diffraction grating G, the position of the center of the dot pattern on the two-dimensional detector D can be
  • Incidence direction can be determined in two dimensions.
  • Pixels through the diffraction grating behaves to
  • Point distances of the dot pattern arising on the detector D, in addition to the wavelength on the area detector D according to:
  • the dots are 532 pixels apart, and the wavelength A of the incoming laser radiation is 1064 nm, then one pixel of the detector D equals two nanometers, ie, the laser emission bandwidth can be accurate to two nanometers be measured.
  • a diffraction grating G which generates a plurality of diffraction beams and thus several image points on the detector D (eg nine in a 3 ⁇ 3 diffraction grating)
  • the point distances of all pixels can be measured and the result averaged so that the wavelength resolution is still can be many times higher.
  • broadband light sources can be detected and distinguished in particular from narrow-band laser radiation sources.
  • detectors D for detecting weak laser sources is the multitude of incoherent point sources in the open air (such as street lamps, solar and lunar reflections) during the day and at night, which are unaware of a possible threat of laser target acquisition without additional Measures are distinguishable.
  • a laser radiation source has a high temporal coherence in addition to the high spatial coherence, i. a narrow bandwidth. For natural and gas lasers, this bandwidth is usually well below 1 nm, for multimode laser diodes about 3 nm. All natural beam sources are broadband with a bandwidth rarely below 100 nm. Narrow band technical light sources are spectral lamps, high pressure lamps, fluorescent tubes and light emitting diodes with a bandwidth of individual Colors of 20-40 nm. The bandwidth of the laser is thus at least a factor of 10 below the range of all natural and technical sources.
  • interferometers or diffraction gratings come into question here.
  • the use of interferometers for coherence discrimination has the disadvantages of their high sensitivity to vibration and temperature, their low angular acceptance and cumbersome interpretation of interferograms.
  • high-resolution diffraction gratings are very suitable in combination with modern detectors.
  • cross gratings which generate two-dimensional point grating spectra from the light of narrowband point sources instead of the known line spectra, are preferable to the grating gratings.
  • N ⁇ / d sin ⁇ - sin a 0 , where ⁇ denotes the wavelength of the laser radiation, d the lattice constant, a 0 the angle of incidence and ⁇ the diffraction angle.
  • denotes the wavelength of the laser radiation
  • d lattice constant
  • a 0 the angle of incidence
  • the diffraction angle.
  • the position of the Büdic the orders N are thus intersections of two Hyberbelscharen.
  • the 0th order of the diffraction pattern lies on the main beam, so this goes without diffraction through the diffraction grating.
  • the skin ray axis is also the symmetry axis of the diffraction pattern higher
  • the incident direction of the incident laser radiation can, as explained above, be determined unambiguously from the diffraction pattern.
  • the diffraction angle shifts with the wavelength change of ⁇ according to the formula (2): ⁇ aresin (N ⁇ / d), i. the wavelength of the incident radiation can be determined from the angular position of the diffraction maximum.
  • Lattice constant d 10 pm
  • a 2 5.4 °.
  • the wavelength resolution increases.
  • the angular resolution of a pixel is 0.15 °.
  • the spectral resolution of a pixel in the first diffraction order is about 5 nm.
  • the spectral bandwidth of a laser diode is about 3 nm, i. the radiation of the laser diode would be imaged within a pixel.
  • a light emitting diode would extend over a line of 6 pixels and a 100 nm source over 20 pixels.
  • an incoherent light source such as a sun reflex with a bandwidth of 300 nm, after its passage through the diffraction grating G in its intensity by a factor of 1 / 300 are weakened.
  • FIG. 6 shows an example of a diffraction pattern (distribution of radiation intensity) of 0th and 1st order arising on the detector D when radiation passes through a cross diffraction grating G, whose angular separation through the Grid constant is set.
  • the illustrated diffraction pattern arises in the present case by incident incoherent and coherent radiation of different
  • Radiation sources each incident with the same direction of incidence.
  • Laser radiation also incident respectively background radiation impinges and passes into the device and is imaged on the / the detectors.
  • Reference numeral 606 denotes the imaging area of the imaging optical system O on the detector surface.
  • the intersection of the centers 602 and 603 of the imaging optical system O indicates the intersection of the main beam axis with the detector surface.
  • the main beam axis is defined by the 0 th order diffraction beam for a radiation incident perpendicular to the diffraction grating, which would be imaged here on the intersection of the center axes 602 and 603, since the main beam does not undergo deflection by the diffraction grating. If the incident radiation does not strike the diffraction grating G perpendicularly, the center of the diffraction pattern is displaced.
  • the 0th order of the incident coherent radiation is mapped onto the point 601, and the 0th order of the incident incoherent radiation is imaged onto the circular area 607.
  • the 1 st order of the incident coherent radiation is mapped to the four points 604.
  • the 1 st order of the incident incoherent radiation is mapped to the gray shaded areas 605.
  • FIG. 6 shows a section line S-S 'through the detector.
  • FIG. 7 shows the intensity distribution of the diffraction pattern of FIG. 6 on the detector D along the section line S-S '.
  • the x-axis 701 corresponds to the
  • Diffraction radiation of coherent radiation which is represented in the form of intensity peaks 704, 705a and 705b, of the incoherent radiation, which one over the
  • Section line SS 'blurred intensity curve 703 represents.
  • the points 601 and 604 on the section axis correspond to the intensity peaks 704 and 705a or 705b in FIG. 7.
  • a threshold value 706 By specifying a corresponding threshold value 706, the influence of the incoherent radiation during the evaluation can be suppressed. Assuming that the incident laser radiation, which is the present
  • the pulse duration and pulse rate are determined as follows. If the pulse duration of the laser radiation is longer than the exposure time for a single image, the PuEsdauer can be roughly determined by counting the number of exposed images multiplied by the image duration, the accuracy of the measurement is equal to the image duration.
  • a pixel for example 601 or 604 is considered, at which the laser has illuminated, and then it is measured in which time frame the pixel appears again in a subsequent image. This regular lighting reveals the for each pulse laser
  • the length of the illumination indicates the laser's pulse duration, if it is not shorter than the image acquisition time. Therefore, must to
  • Determining the pulse duration only the number of successive images are determined in which the pixel of the laser radiation is present. This number must then be multiplied by the constant exposure time for these images.
  • two or more detectors can also be used
  • Image information is lost when a weak short laser radiation pulse strikes a detector with a long exposure time and therefore would become vanishingly small due to the long integration time. Since lasers with the emission of several pulse trains are usually used in practice, a device with only one detector (image sensor) and switchable readout frequency is preferably sufficient for the measurement. As a result, the manufacturing, operating and maintenance costs are significantly reduced.
  • FIG. 3 shows a schematic representation of a device according to the invention in accordance with a second embodiment.
  • the incident laser radiation 101 is fed by means of a beam splitter S two diffraction gratings G1 and G2.
  • the diffraction gratings G1 and G2 transfer the laser radiation 101 respectively into diffraction radiation 102, which is imaged by means of the imaging optics 01 and 02 as focused diffraction radiation 103 onto the detectors D1 and D2.
  • the diffraction gratings G1 and G2 can be designed differently, so that the diffraction radiation 102 produced by the diffraction gratings G1 and G2 is different.
  • the flat detectors D1 and D2 are designed such that they have a different
  • the detectors D1 and D2 transmit the read by a readout unit A detector signals to the readout unit A.
  • one of the detectors D1, D2, preferably the one with the lower detector element density read continuously with a high read-out frequency in the range of 500 Hz - 10 7 Hz.
  • the other one of the detectors is continuously read out with a low readout frequency in the range of 10 Hz - 100 Hz.
  • the analog detector signals are also digitized in the readout unit by means of one or more A / D converters and thus converted into digital image data.
  • the image data are transmitted to the evaluation unit B, which is designed and set up to determine one, several or all of the following variables on the basis of the image data obtained as described above: direction of incidence of
  • Laser radiation wavelength of laser radiation, frequency bandwidth of
  • the device can be connected in series in this way
  • Diffraction grating G, optics O and detectors D include. This is through the
  • FIG. 4 shows a schematic representation of a device according to the invention according to a third embodiment.
  • the third embodiment differs from the embodiment shown in Fig. 3 by the use of only one diffraction grating G and the arrangement of the beam splitter S in the radiation path.
  • Laser radiation 101 is first directed in this embodiment to the diffraction grating G and converted by this into diffraction radiation 102.
  • the diffraction radiation 102 is then distributed by means of a beam splitter S to the imaging optics Ol and 02. All other elements are identical to FIG. 3, to the description of which referenced wi d.
  • Fig. 5 shows a schematic representation of a device according to the invention according to a fourth embodiment.
  • the incident laser radiation 101 is converted by a diffraction grating G into diffraction radiation 102, and by means of an imaging optical system O into focused diffraction radiation 103.
  • the focused diffraction radiation 103 is now divided by means of a beam splitter S in the present case to three or more (indicated by the vertical baring) detectors D1, D2, D3.
  • the detectors D2 and D3 in the present case correspond to those of FIG. 3.
  • the detector D1 is read out by the readout unit A with alternating between a low and a high readout frequency. It thus corresponds to the detector from FIG. 1. Reference is made to the respective points of description.
  • the device thus enables the time-parallel detection, differentiation and analysis of pulsed and continuous wave laser radiation, even multiple laser sources.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Optics & Photonics (AREA)
  • Remote Sensing (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Electromagnetism (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

L'invention concerne un dispositif et un procédé pour la détection et l'analyse de rayonnement laser. Conformément à un premier mode de réalisation, le dispositif selon l'invention comprend une grille de diffraction, au moins une optique d'imagerie et au moins un détecteur qui comporte une multitude d'éléments détecteurs pour la détection de signaux du détecteur, le rayonnement laser incident étant transformé à travers le réseau de diffraction en un rayonnement diffracté qui est ensuite renvoyé à l'aide de l'optique d'imagerie sur le détecteur et y produit les signaux du détecteur. En outre, le dispositif se distingue par la présence d'une unité de lecture qui, pour la lecture des signaux du détecteur, se permute plusieurs fois par seconde entre une basse fréquence de lecture dans la plage allant de 10 à 100 Hz et une haute fréquence de lecture dans la plage allant de 500 Hz à 107 Hz, et par la présence d'une unité d'évaluation qui est configurée et réglée pour déterminer, sur la base des signaux de détecteur ainsi lus, une, plusieurs ou toutes les grandeurs suivantes : direction d'incidence du rayonnement laser, longueur d'onde du rayonnement laser, largeur de la bande de fréquence du rayonnement laser, taux de répétition des impulsions du rayonnement laser, longueur des impulsions du rayonnement laser. Le dispositif permet par conséquent la détection en parallèle dans le temps, la distinction et l'analyse de rayonnements laser pulsés et continus provenant de plusieurs sources laser.
PCT/DE2012/000283 2011-03-29 2012-03-19 Dispositif et procédé pour la détection et l'analyse de rayonnement laser WO2012130209A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE201110015478 DE102011015478B4 (de) 2011-03-29 2011-03-29 Vorrichtung und Verfahren zur Erfassung und Analyse von Laserstrahlung
DE102011015478.7 2011-03-29

Publications (2)

Publication Number Publication Date
WO2012130209A2 true WO2012130209A2 (fr) 2012-10-04
WO2012130209A3 WO2012130209A3 (fr) 2012-11-22

Family

ID=46061962

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2012/000283 WO2012130209A2 (fr) 2011-03-29 2012-03-19 Dispositif et procédé pour la détection et l'analyse de rayonnement laser

Country Status (2)

Country Link
DE (1) DE102011015478B4 (fr)
WO (1) WO2012130209A2 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112611455A (zh) * 2020-12-07 2021-04-06 上海交通大学 一种多角度、多光谱频率编码成像技术及其装置
US11609338B2 (en) * 2019-02-27 2023-03-21 Jena-Optronik Gmbh Method and device for detecting incident laser radiation on a spacecraft

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012022258B4 (de) * 2012-11-14 2017-03-16 Airbus Ds Electronics And Border Security Gmbh Sensor zur Erkennung und Lokalisierung von Laserstrahlungsquellen
CN105297789B (zh) * 2015-10-21 2017-02-22 华北水利水电大学 可实时量测挡土墙平动时有限填土压力及位移变化的装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6118119A (en) 1995-12-27 2000-09-12 Ruschin; Shlomo Spectral analyzer with wavelength and direction indicator

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19851010B4 (de) * 1998-11-05 2010-10-07 Eads Deutschland Gmbh Einrichtung zur Erkennung und Lokalisierung von Laserstrahlungsquellen
US7456940B2 (en) * 2006-06-21 2008-11-25 Sensing Strategies, Inc. Methods and apparatus for locating and classifying optical radiation
DE102007024051B4 (de) * 2007-05-22 2018-02-01 Airbus Defence and Space GmbH Vorrichtung und Verfahren zur Erkennung und Lokalisierung von Laserstrahlungsquellen

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6118119A (en) 1995-12-27 2000-09-12 Ruschin; Shlomo Spectral analyzer with wavelength and direction indicator

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11609338B2 (en) * 2019-02-27 2023-03-21 Jena-Optronik Gmbh Method and device for detecting incident laser radiation on a spacecraft
US11650322B2 (en) * 2019-02-27 2023-05-16 Jena-Optronik Gmbh Method and device for detecting incident laser radiation on a spacecraft
CN112611455A (zh) * 2020-12-07 2021-04-06 上海交通大学 一种多角度、多光谱频率编码成像技术及其装置
CN112611455B (zh) * 2020-12-07 2022-01-21 上海交通大学 一种多角度、多光谱频率编码成像方法及其装置

Also Published As

Publication number Publication date
DE102011015478A1 (de) 2012-10-04
DE102011015478B4 (de) 2012-10-25
WO2012130209A3 (fr) 2012-11-22

Similar Documents

Publication Publication Date Title
EP2350618B1 (fr) Dispositif notamment microscope pour l'examen d'échantillons
DE4434168B4 (de) Vorrichtung und Verfahren zur Messung und Auswertung von spektralen Strahlungen und insbesondere zur Messung und Auswertung von Farbeigenschaften
EP3891465B1 (fr) Dispositif de mesure optique
DE102006007172B4 (de) Verfahren und Anordnung zur schnellen, ortsaufgelösten, flächigen, spektroskopischen Analyse, bzw. zum Spectral Imaging oder zur 3D-Erfassung mittels Spektroskopie
DE69631714T2 (de) Vorrichtung zur optischen Untersuchung eines Fluids, insbesondere zur hämatologischen Analyse
DE60124647T2 (de) Vorrichtung und Verfahren zur Abstandsmessung
EP2384424B1 (fr) Ensemble spectromètre échelle à prédispersion interne
DE2935716A1 (de) Verfahren und vorrichtung zum messen der dicke eines films durch ausnutzung von infrarot-interferenzerscheinungen
DE102018114860A1 (de) Vorrichtung und Verfahren zur optischen Vermessung eines Messobjekts
DE2260090B2 (de) Photoelektrische Einrichtung zur Bestimmung der Rauhigkeit bzw. Glätte diffusstreuender Oberflächen
EP1754032A1 (fr) Spectrometre-echelle a mise en valeur amelioree du detecteur par l'utilisation de deux ensembles spectrometres
EP2479586B1 (fr) Procédé destiné à l'évaluation d'un degré d'impureté d'un disque frontal d'un dispositif de saisie optique et dispositif de saisie optique
DE102008012635A1 (de) Verfahren und Anordnung zur zeitaufgelösten Spektroskopie
DE69927367T2 (de) Optoelektronische Formerfassung durch chromatische Kodierung mit Beleuchtungsebenen
DE102011015478B4 (de) Vorrichtung und Verfahren zur Erfassung und Analyse von Laserstrahlung
DE10155002A1 (de) Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe
EP1507137B1 (fr) Procédé et dispositif pour l'inspection dépendante de la polarisation et pour l'inspection par résolution spatiale d'une surface ou d'une couche
DE60036467T2 (de) Verfahren und vorrichtung zur dopplergeschwindigkeitsmessung
DE10118463A1 (de) Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe
DE19820053A1 (de) Wellenlängenagiler Empfänger mit der Fähigkeit zu Rauschneutralisation und Winkelortung
EP2033447B1 (fr) Procede de compression sans perte pour interferogrammes
DE102005024271B4 (de) Gitterspektrometersystem und Verfahren zur Messwerterfassung
DE10155142C2 (de) Dunkelfeld-Abbildungsvorrichtung zur ortsaufgelösten Dunkelfeldabbildung einer flächigen Probe
EP1629254A1 (fr) Dispositif et procede pour reconnaitre des couches qui sont appliquees a la surface de pieces, et determination de leurs proprietes
EP3814731B1 (fr) Système optique permettant l'éclairage et l'analyse hyperspectrale d'un objet

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 12720399

Country of ref document: EP

Kind code of ref document: A2

122 Ep: pct application non-entry in european phase

Ref document number: 12720399

Country of ref document: EP

Kind code of ref document: A2