WO2012128120A1

WO2012128120A1 - Test specification generator, test specification generation method, and program

Info

Publication number: WO2012128120A1
Application number: PCT/JP2012/056368
Authority: WO
Inventors: 崇央安藤; 銀惠崔; 秀明西原
Original assignee: 独立行政法人産業技術総合研究所
Priority date: 2011-03-18
Filing date: 2012-03-13
Publication date: 2012-09-27
Also published as: JP5729465B2; JPWO2012128120A1

Abstract

Provided is a test specification generator comprising: a test information storage unit which can store test information that is information used in a test; a specification description information storage unit which can store specification description information that is information related to a target specification described in a specification description language constituting a language for describing the target specification, that is information including at least one variable declaration, and that is information including test source information for generating the test information; a test information acquisition unit that uses the variable declaration and test source information to acquire at least one item of the test information having at least the input value of at least one variable; and a test information accumulation unit for accumulating, in the test information storage unit, at least one item of the test information acquired by the test information acquisition unit. Thus, if information for test design is described at the time of the target design, information related to the appropriate test specification can be automatically generated.

Description

Test specification generation apparatus, test specification generation method, and program

The present invention relates to a test specification generation device for generating a test specification from specification description information described in a specification description language.

Conventionally, there has been a specification description support method for improving the problem of creation efficiency and quality that comes from the characteristics of natural language in specification description using a specification description language including a natural sentence such as UML (for example, see Patent Document 1). In this specification description support method, one of natural sentence templates composed of a changeable part and an unchangeable part is selected, and a term is input to the changeable part of the template. Further, the specification description support method has a dictionary of terms, and prompts registration of terms for unregistered terms.

Japanese Patent Laid-Open No. 2008-15879 (first page, FIG. 1 etc.)

However, in the conventional technology, although the description description can be supported at the design stage, the test process support is insufficient, and a great deal of labor is required for the test design.

The test specification generation device of the first invention includes a test information storage unit that can store test information that is information used in a test, and a target specification described in a specification description language that is a language for describing the target specification. A specification description information storage unit that can store specification description information that is information including one or more variable declarations and includes test source information for generating test information, and variable declaration and Using the test source information, a test information acquisition unit that acquires one or more test information having at least one input value of each of one or more variables, and one or more test information acquired by the test information acquisition unit in the test information storage unit A test specification generation device including a test information storage unit for storing.

With this configuration, if information about specifications is formally described at the time of designing the target, information about appropriate test specifications can be automatically generated.

In the test specification generation device according to the second aspect of the present invention, the variable has a type and the specification description information is associated with one or more variables among the one or more variables. The test source information that is information for specifying the value used in the test among the values that each variable can take, and the test information acquisition unit associates the test source information with the variable from the specification description information. From the test source information acquisition means to be acquired, the variable information acquisition means to acquire variables and variable types that do not have test source information from the specification description information, and the test source information acquired by the test source information acquisition means, each test Test information acquisition means for acquiring one or more input values of variables corresponding to the original information for each variable and acquiring the input value for each variable from the variable acquired by the variable information acquisition means and the variable type. This is a test specification generation device.

With such a configuration, information related to appropriate test specifications can be automatically generated by specifying values to be used in tests in association with variables among the specifications described formally at the time of target design.

Further, in the test specification generation device according to the third aspect of the invention, in contrast to the second aspect of the invention, the test information acquisition unit includes a variable corresponding to each test source information from the test source information acquired by the test source information acquisition unit. The test specification generation device acquires one or more input values and output values for each variable, and acquires the input value and output value for each variable from the variable and variable type acquired by the variable information acquisition unit.

With such a configuration, an appropriate test suite can be automatically generated by specifying a value to be used in a test in association with a variable in a specification described formally at the time of target design.

In addition, the test specification generation device of the fourth aspect of the invention has a specification description information having declarations of one or more variables and one or more pieces of constraint information that is a description about the constraints, as compared with the third aspect of the invention. The information acquisition unit acquires, for each variable, one or more input values and output values of variables corresponding to each test source information from the test source information acquired by the test source information acquisition unit, and the variable information acquisition unit acquires One or more test suites that are a set of one or more input values and one or more output values so that input values and output values are obtained for each variable from the selected variables and variable types, and all constraint information is satisfied. This is a test specification generation device to be acquired.

In addition, the test specification generation device according to the fifth aspect of the present invention is based on the pre-transition state, which is a state having a set of one or more variable values, and the pre-transition state. State transition information having an event that occurs and a post-transition state that is a state to be transitioned to when an event occurs in the pre-transition state, or a first state and a first state having a set of one or more variable values In this case, the test specification generating apparatus is invariant condition information having a second state having a set of values of one or more variables that is always employed in the case of.

Further, in the test specification generation device of the sixth aspect of the invention, in contrast to the fifth aspect of the invention, the test information acquisition means has one or more premise information that is a set of a pre-transition state and an event included in one or more constraint information. Is a test specification generation device that acquires one or more test suites that are a set of one or more input values and one or more output values that satisfy all the constraint information.

This configuration can prevent the generation of test suites that do not satisfy the prerequisites for state transition.

The test specification generation device according to the seventh aspect of the present invention further includes an event constraint information storage unit that can store one or more event constraint information indicating a constraint related to an event. The test information acquisition means includes a test suite that is a set of one or more input values and one or more output values so as to satisfy all the constraint information by using one or more event constraint information as constraint information. It is a test specification generation device that acquires one or more.

This configuration can prevent the generation of test suites that include specified events.

Further, in the test specification generation device of the eighth invention, in contrast to the fifth invention, the test information acquisition unit deletes the information of the pre-transition state from the information corresponding to the already acquired test suite, and To obtain one or more second constraint information that constitutes a logical negation of a part of information other than the pre-transition state, and to satisfy all the constraint information using the one or more second constraint information as constraint information, This is a test specification generation device that acquires one or more test suites that are a set of one or more input values and one or more output values.

Such a configuration can prevent generation of a test suite having a known post-transition state.

Further, in the test specification generation device of the ninth invention, the test information acquisition means, for the fifth invention, deletes post-transition state information from the information corresponding to the test suite already acquired, and To obtain one or more second constraint information that constitutes the logical negation of the part of the information other than the post-transition state, and to satisfy all the constraint information using the one or more second constraint information as the constraint information, This is a test specification generation device that acquires one or more test suites that are a set of one or more input values and one or more output values.

Such a configuration can prevent generation of a test suite having a known pre-transition state.

The test specification generation apparatus according to the present invention can automatically generate information related to appropriate test specifications if information for test design is described in the specifications described formally at the time of target design.

Block diagram of test specification generation apparatus according to Embodiment 1 Flow chart explaining operation of the test specification generation device Flow chart explaining the variable table acquisition process Flow chart for explaining the propositional formula acquisition process Flow chart explaining the test information acquisition process Figure showing the same specification description information Figure showing the variable table Diagram showing an example of a set of propositional formulas The figure which shows the numerical sequence which the same test information acquisition means acquires Diagram showing the test information The figure explaining the concept of operation | movement of the test information acquisition part The figure explaining the flow of processing of the test specification generation device Block diagram of test specification generation apparatus 2 in Embodiment 2 Figure showing the same specification description information Figure showing the variable table Diagram showing an example of a set of propositional formulas The figure which shows the numerical sequence which the same test information acquisition means acquires Diagram explaining the operation to suppress the unnecessary test suite Overview of the computer system in the first embodiment Block diagram of the computer system

Hereinafter, embodiments of the test specification generation device and the like will be described with reference to the drawings. In addition, since the component which attached | subjected the same code | symbol in embodiment performs the same operation | movement, description may be abbreviate | omitted again.

(Embodiment 1)
In the present embodiment, a generation test specification generation apparatus that generates a test specification from specification description information described in a specification description language will be described. The specification description language is usually a formal specification description language, but the format is not limited. The specification description language is usually a language used to describe the specification when designing and constructing software, but may be a hardware description language. Moreover, it is preferable that the specification description information described in the specification description language is automatically converted into a program, but it is not always necessary to be automatically converted into a program.

FIG. 1 is a block diagram of the test specification generation device 1 in the present embodiment. The test specification generation device 1 includes a test information storage unit 11, a specification description information storage unit 12, a reception unit 13, a test information acquisition unit 14, a test information storage unit 15, and a test information output unit 16.

The test information acquisition unit 14 includes a test source information acquisition unit 141, a variable information acquisition unit 142, and a test information acquisition unit 143.

The test information storage unit 11 can store test information. The test information is information used in the target test. The target is a target of specification description, which is usually software, but may be hardware. The test information may be so-called one or more test cases or so-called one or more test suites. The test case is input information (for example, one or more input values) given to the subject during the test. The test suite is a set of input information (for example, one or more input values) given to an object during a test and output information (for example, one or more output values) when the input information is given. The test information may be information that is useful for performing the test. The test information may be information for automatic testing or may be information used for manual testing. The output information is a result of the target operation.

The test information storage unit 11 is preferably a non-volatile recording medium, but can also be realized by a volatile recording medium.

The specification description information storage unit 12 can store specification description information. The specification description information is information related to the target specification described in the specification description language. The specification description information is usually information including declaration of one or more variables. The specification description information is preferably information including test source information for generating test information. The specification description information is a variable used in a test among values that each variable can take in association with one or more variables (m, n> = m) among one or more (n) variables. Test source information, which is information for specifying the value of, may be included. In other words, the test source information may be one or more values used in the test, a range of values used in the test (for example, 1 to 10, etc.), or one or more values not used in the test. , A range of values not used in the test, a condition of values used in the test (for example, an even number, a combination of 3 or less alphabetic characters), and a condition of values not used in the test (for example, It may be a natural number divisible by 3).

In addition, it is preferable that the specification description information includes one or more variable declarations and one or more constraint information that is a description related to the constraints. The constraint information is preferably, for example, state transition information or invariant condition information. The state transition information is information related to state transition. It is preferable that the state transition information includes a pre-transition state, an event, a post-transition state, and an action. The state transition information may be information having a pre-transition state, an event, and a post-transition state. The pre-transition state is a state before accepting an event. The pre-transition state is a state having a set of one or more variable values. An event occurs for the pre-transition state. The post-transition state is a state that is shifted when an event occurs in the pre-transition state. The post-transition state is a state having a set of one or more variable values. An action explicitly raises a specific event. The invariant condition information indicates an invariant condition. The invariant condition information has a first state and a second state. The first state has a set of values of one or more variables. The second state has a set of values of one or more variables that are always adopted in the case of the first state. The invariant condition information indicates a condition that is satisfied in both the first state and the second state. Here, the variable usually has a type. A type is also called a data type. Some types have a fixed value or range. The specification description information is preferably a file, but the data structure is not limited.

The specification description information storage unit 12 is preferably a nonvolatile recording medium, but can also be realized by a volatile recording medium.

The process in which the specification description information is stored in the specification description information storage unit 12 does not matter. For example, specification description information may be stored in the specification description information storage unit 12 via a recording medium, and specification description information transmitted via a communication line or the like is stored in the specification description information storage unit 12. Alternatively, specification description information input via an input device may be stored in the specification description information storage unit 12.

The accepting unit 13 accepts instructions and information. The instruction is, for example, a test information generation instruction that is an instruction for generating test information. The instruction is, for example, a test information output instruction that is an instruction to output test information. The input means such as an instruction may be anything such as a keyboard, mouse, or menu screen. The receiving unit 13 can be realized by a device driver for input means such as a keyboard, control software for a menu screen, or the like.

The test information acquisition unit 14 acquires one or more test information having at least an input value of each one or more variables, using the variable declaration and the test source information included in the specification description information. An input value is a value given to an object. The input value may be an initial value of a variable or a set value. Here, acquiring includes generating. Also, the acquisition may be reading from a recording medium.

The test source information acquisition unit 141 constituting the test information acquisition unit 14 acquires the test source information in association with the variable from the specification description information. For example, the test source information acquisition unit 141 performs lexical analysis and syntax analysis on the specification description information, and acquires the test source information in association with variables. In addition, the test source information acquisition unit 141 performs, for example, pattern matching of reserved words (for example, “Var”, “testedwith”, etc.) on the specification description information, and acquires test source information in association with variables. You may do it. That is, the test source information acquisition unit 141 may acquire the test source information in association with the variable from the specification description information using a predetermined character string (for example, a reserved word).

The variable information acquisition unit 142 acquires a variable having no test source information and the type of the variable from the specification description information.

The test information acquisition unit 143 acquires one or more input values of variables corresponding to each test source information from the test source information acquired by the test source information acquisition unit 141 for each variable. The test information acquisition unit 143 acquires an input value for each variable from the variable acquired by the variable information acquisition unit 142 and the variable type.

Further, the test information acquisition unit 143 acquires one or more input values and output values of variables corresponding to each test source information from the test source information acquired by the test source information acquisition unit 141 for each variable. The test information acquisition unit 143 may acquire an input value and an output value for each variable from the variable acquired by the variable information acquisition unit 142 and the variable type.

The test information acquisition unit 143 acquires one or more input values and output values of variables corresponding to each test source information from the test source information acquired by the test source information acquisition unit 141 for each variable, and all One or more test suites satisfying the constraint information are acquired. The test information acquisition unit 143 acquires an input value and an output value for each variable from the variable acquired by the variable information acquisition unit 142 and the type of the variable, and acquires one or more test suites that satisfy all the constraint information. May be.

Note that a test suite is a set of one or more input values and one or more output values. In such a case, the test information acquisition unit 143 acquires, for example, candidate values of input values for each variable from the test source information acquired by the test source information acquisition unit 141 and the variable type. Then, the test information acquisition unit 143 acquires all combinations of input values (values before state transition) and output values (values after state transition) of one or more variables. This combination is a test suite candidate. Then, the test information acquisition unit 143 applies test suite candidates to all constraint information, and extracts test suites that satisfy all constraint information as test suites to be used. Note that when one or more pieces of constraint information exist, a process for determining whether a set of variable values given to the one or more pieces of constraint information satisfies the one or more pieces of constraint information is a known technique. Further, the test information acquisition unit 143 may acquire one or more test suite candidates, apply one or more constraint information to the one or more test suites, and delete a test suite that does not satisfy the constraint information. good. The test information acquisition unit 143 may apply one or more pieces of constraint information when acquiring a test suite.

Moreover, it is preferable that the constraint information is state transition information or invariant condition information. State transition information is a state that transitions when an event occurs in the pre-transition state, the pre-transition state, and the pre-transition state, which are states having a set of one or more variable values. This is information having a post-transition state and an action. The invariant condition information is information having a first state having a set of values of one or more variables and a second state having a set of values of one or more variables that are always employed in the case of the first state. .

The test information storage unit 15 stores one or more pieces of test information acquired by the test information acquisition unit 14 in the test information storage unit 11.

The test information output unit 16 outputs the test information stored in the test information storage unit 11. Here, output means display on a display, projection using a projector, printing on a printer, transmission to an external device, storage on a recording medium, processing result to another processing device or another program, etc. It is a concept that includes delivery. The test information output unit 16 may be considered as including or not including an output device such as a display. The test information output unit 16 can be implemented by output device driver software, or output device driver software and an output device.

The test information acquisition unit 14, the test source information acquisition unit 141, the variable information acquisition unit 142, the test information acquisition unit 143, and the test information storage unit 15 can be usually realized by an MPU, a memory, or the like. The processing procedure of the test information acquisition unit 14 and the like is usually realized by software, and the software is recorded on a recording medium such as a ROM. However, it may be realized by hardware (dedicated circuit).

Next, the operation of the test specification generation device 1 will be described using the flowchart of FIG.

(Step S201) The receiving unit 13 determines whether a test information generation instruction has been received. If a test information generation instruction is accepted, the process proceeds to step S202. If a test information generation instruction is not accepted, the process proceeds to step S207.

(Step S202) The test information acquisition unit 14 reads the specification description information from the specification description information storage unit 12.

(Step S203) The test information acquisition unit 14 interprets the specification description information and acquires a variable table. The interpretation of the specification description information is usually lexical analysis, syntax analysis, etc., and is a well-known technique performed by a program language processing system (for example, a compiler or interpreter). A variable table acquisition process for acquiring a variable table will be described with reference to the flowchart of FIG.

(Step S204) The test information acquisition unit 14 interprets the specification description information and acquires a propositional logical expression. A propositional logical expression acquisition process for acquiring a propositional logical expression will be described with reference to the flowchart of FIG. The interpretation of the specification description information here is usually lexical analysis, syntax analysis, etc., and is a well-known technique performed by a program language processing system (for example, a compiler, interpreter, etc.).

(Step S205) The test information acquisition unit 14 acquires test information using the variable table and the propositional logical expression. Test information acquisition processing for acquiring test information will be described with reference to the flowchart of FIG.

(Step S206) The test information storage unit 15 stores the test information acquired in step S205 in the test information storage unit 11. The process returns to step S201.

(Step S207) The receiving unit 13 determines whether or not a test information output instruction has been received. If a test information output instruction is accepted, the process proceeds to step S208. If a test information output instruction is not accepted, the process returns to step S201.

(Step S208) The test information output unit 16 reads the test information from the test information storage unit 11.

(Step S209) The test information output unit 16 outputs the test information read in step S208. The process returns to step S201.

In the flowchart of FIG. 2, the process is terminated by turning off the power or interrupting the process.

Next, the variable table acquisition process in step S203 will be described with reference to the flowchart of FIG.

(Step S301) The variable information acquisition unit 142 substitutes 1 for the counter i.

(Step S302) The variable information acquisition unit 142 reads the i-th processing unit from the specification description information. One processing unit is, for example, a character string next to a specific reserved word from a character string next to one terminal, one terminator (for example, “;” or a reserved word) to the next terminator. To the next specific reserved word, etc. One processing unit is a character string unit for determining whether a variable is declared or a character string unit for determining whether a variable is a constraint.

(Step S303) The variable information acquisition unit 142 determines whether or not the i-th processing unit has been read in Step S303. If the i-th processing unit can be read, the process proceeds to step S304, and if it cannot be read, the process returns to the upper process.

(Step S304) The variable information acquisition unit 142 determines whether or not the i-th processing unit is a variable declaration. If it is a variable declaration, go to step S305, and if it is not a variable declaration, go to step S310. Whether the processing unit is a variable declaration is, for example, whether the line includes the reserved word “Var”, whether it is a non-reserved word following the reserved word “Var”, or the type of the variable (reserved word ) And the like. Processing for determining whether such a processing unit is a variable declaration is also a known technique.

(Step S305) The variable information acquisition unit 142 acquires the variable type from the i-th processing unit.

(Step S306) The test source information acquisition unit 141 determines whether or not test source information exists in the i-th processing unit. If the test source information exists, the process goes to step S307, and if the test source information does not exist, the process goes to step S311. Whether or not the test source information exists is determined, for example, by whether or not a reserved word (for example, “testedwith”) that specifies the test source information is included.

(Step S307) The test source information acquisition unit 141 acquires test source information from the i-th processing unit. Note that the test source information acquisition unit 141 acquires, for example, test source information corresponding to a reserved word (for example, “testedwith”) that specifies the test source information.

(Step S308) The variable information acquisition unit 142 uses the test source information and type or the test source information to obtain one or more input values of the variable, or one or more input values of the variable and one or more output values of the variable. get.

(Step S309) The variable information acquisition unit 142 adds a record to the conversion table. A record has one or more input values for a variable, or one or more input values for a variable and one or more output values for a variable.

(Step S310) The variable information acquisition unit 142 increments the counter i by one. The process returns to step S303.

(Step S311) The variable information acquisition unit 142 acquires one or more input values of the variable, or one or more input values of the variable and one or more output values of the variable using the type. Go to step S309. Note that the variable information acquisition unit 142 holds, for example, a correspondence table between types and one or more values. Using the correspondence table, one or more input values from the type, or one or more input values and 1 The above output value is acquired.

In the flowchart of FIG. 3, for example, a record may be configured from default variable information (for example, “null # true” described later), and the record may be written in the variable table. In such a case, the variable information acquisition unit 142 holds default variable information in advance.

Next, the propositional logical expression acquisition process in step S204 will be described using the flowchart of FIG.

(Step S401) The test information acquisition unit 143 substitutes 1 for the counter i.

(Step S402) The test information acquisition unit 143 reads the i-th processing unit from the specification description information.

(Step S403) The test information acquisition unit 143 determines whether or not the i-th processing unit has been read in Step S402. If the i-th processing unit can be read, the process proceeds to step S404, and if it cannot be read, the process returns to the upper process.

(Step S404) The test information acquisition unit 143 determines whether or not the i-th processing unit is a constraint. If it is a constraint, go to step S405, and if not, go to step S406. A constraint is a condition that must be satisfied by a target in a specification description. The test information acquisition unit 143 determines, for example, a line following a reserved word (for example, “Require”) until a reserved word indicating other than the next restriction appears as restriction information. However, the method for determining the constraint information is not limited.

(Step S405) The test information acquisition unit 143 converts the constraint information corresponding to the i-th processing unit into a propositional logical expression. A technique for converting constraint information into a propositional logical expression is a known technique.

(Step S406) The test information acquisition unit 143 increments the counter i by one. The process returns to step S402.

Next, the test information acquisition process of step S205 will be described using the flowchart of FIG.

(Step S501) The test information acquisition unit 143 substitutes 1 for the counter i.

(Step S502) The test information acquisition unit 143 acquires the i-th input value set from the variable table. The test information acquisition unit 143 acquires the value of each variable from the values that one or more of each variable can take as an input value, and acquires one or more pieces of information having a pair of variable name and value. One or more pieces of information having this variable name / value pair is a set of input values.

(Step S503) The test information acquisition unit 143 determines whether or not the i-th input value set has been acquired in step S502. If the i-th set of input values can be acquired, the process proceeds to step S504, and if it cannot be acquired, the process returns to the upper process.

(Step S504) The test information acquisition unit 143 substitutes 1 for the counter j.

(Step S505) The test information acquisition unit 143 acquires the j-th output value set from the variable table. The test information acquisition unit 143 acquires the value of each variable from the values that one or more of each variable can take as an output value, and acquires one or more information having a pair of variable name and value. One or more pieces of information having this variable name / value pair is a set of output values.

(Step S506) The test information acquisition unit 143 determines whether or not the j-th output value set has been acquired in step S505. If the j-th output value set can be acquired, the process goes to step S507, and if not, the process goes to step S516.

(Step S507) The test information acquisition unit 143 substitutes 1 for the counter k.

(Step S508) The test information acquisition unit 143 acquires the kth propositional logical expression. The propositional formula here is the kth propositional formula among the one or more propositional formulas acquired by the propositional formula acquisition process in step S204.

(Step S509) The test information acquisition unit 143 determines whether or not the kth propositional logical expression has been acquired in step S508. If the kth propositional logical expression can be acquired, the process proceeds to step S510. If the kth propositional logical expression cannot be acquired, the process proceeds to step S513.

(Step S510) The test information acquisition unit 143 applies the i-th input value and the j-th output value to the k-th propositional formula.

(Step S511) The test information acquisition unit 143 determines whether or not the i-th input value and the j-th output value satisfy the k-th propositional logical expression. If the kth propositional formula is satisfied, the process goes to step S512, and if not, the process goes to step S515.

(Step S512) The test information acquisition unit 143 increments the counter k by one. The process returns to step S508.

(Step S513) The test information acquisition unit 143 configures test information having an i-th input value and a j-th output value.

(Step S514) The test information acquisition unit 143 adds the test information configured in Step S513 to a buffer (not shown). This buffer is usually a temporary storage medium.

(Step S515) The test information acquisition unit 143 increments the counter j by one. The process returns to step S505.

(Step S516) The test information acquisition unit 143 increments the counter i by one. The process returns to step S502.

Hereinafter, a specific operation of the test specification generation device 1 in the present embodiment will be described.

Now, the specification description information storage unit 12 stores the specification description information shown in FIG. In FIG. 6, (1) and (2) are declarations of variable types. The variable of the data type “onoff_type” in (1) can take the value “ON” or “OFF”. Information that the data type “onoff_type” can take the value “ON” or “OFF” is held by the test specification generation device 1. That is, for example, the test specification generation device 1 holds “onoff_type: on | off”. (2) indicates that the initial value of the data type “m_type” is “m”.

In FIG. 6, (3) is an example of variable declaration. In (3), it can be seen that the test source information {off} exists by the reserved word “testedwith” of the test source information. The test source information {off} indicates that “off” is the only value used when testing the variable “op” of the type “onoff_type”. That is, the description of the test source information can reflect the intention of the creator of the specification description information in the test. Note that “off” in “op: onoff_type {off}” indicates that the initial value of the variable “op” is “off”.

In FIG. 6, (4) is an example of variable declaration, but does not have test source information. The type of the variable “lamp” is “onoff_type”, and the initial value is “off”. In such a case, among the values of the variable “lamp”, the values used in the test are all the values that the variable “lamp” can take (here, “on” and “off”).

Also, (5) in FIG. 6 is a declaration of a variable “ch” of type “m_type”.

Further, (6) and (7) in FIG. 6 are constraint information. The reserved words “Function” and “Require” indicate that the subsequent character string is constraint information. (6) is state transition information. In (6), “op == on && lamp == off” represents a pre-transition state, “ch? M” represents an event, and “lamp == on” represents a post-transition state. In other words, (6) is a constraint that if “op == on && lamp == off” and the event “ch? M” occurs, the state must change to “lamp == on”. Indicates. (7) is invariant condition information. In (7), “op == off-> lamp == off” indicates “lamp == off” if “op == off”. That is, “A-> B” indicates “B if A”.

In this situation, it is assumed that the user has input a test information generation instruction to the test specification generation device 1.

Then, the reception unit 13 receives a test information generation instruction. Then, the test information acquisition unit 14 reads the specification description information in FIG. 6 from the specification description information storage unit 12.

Next, the variable information acquisition unit 142 of the test information acquisition unit 14 interprets the specification description information in FIG. 6 and acquires a variable table. That is, the variable information acquisition unit 142 first acquires default variable information “null # true” and “SubsystemCountUp # true” from a recording medium (not shown) (usually a recording medium held by the variable information acquisition unit 142). . Then, the variable information acquisition unit 142 configures a record by attaching a variable identification code (hereinafter referred to as a variable identifier) to the acquired variable information, and writes the record in an empty variable table. Here, it is assumed that the variable identifier is an integer that is sequentially incremented from “1”. That is, the variable information acquisition unit 142 first writes the records “1 null # true” and “2 SubsystemCountUp # true” to the variable table.

Next, the variable information acquisition unit 142 sequentially reads “Extern”, “Data onoff_type; // from main”, “Class B”, “Data m_type {m};” in FIG. 6, not a variable declaration. Judge that. Note that the processing unit here is, for example, a row.

Next, the variable information acquisition unit 142 reads “Var op: onoff_typeoff {off} testedwith {off};” in FIG. 6. Then, the variable information acquisition unit 142 determines from the reserved word “Var” that this processing unit is a variable declaration. It is assumed that the variable information acquisition unit 142 determines that a variable declaration is made until a reserved word that is not a variable appears in subsequent processing units.

Next, the variable information acquisition unit 142 acquires the variable type “onoff_type” from the processing unit “Varop: onoff_type {off} testedwith {off};”. Next, the test source information acquisition unit 141 acquires test source information “testedwith {off}” from this processing unit.

Next, the variable information acquisition unit 142 uses the test source information “testedwith {off}” to input one or more input values of the variable “op” or one or more input values of the variable and one or more output values of the variable. (The value of the next state) is acquired. That is, the variable information acquisition unit 142 acquires the input value “off” of the variable “op” and the output value “off” of the variable “op”. That is, the test source information “testedwith {off}” indicates that only “off” is used as the test value of the variable “op”, and “on” is not used. Then, the variable information acquisition unit 142 adds the variable identifier to the input value “off” of the variable “op” to configure the record “3 op # off”. If “@” does not exist before “op # off” in “3 op # off”, it indicates that it is an input value. The input value is a value before the state transition. Further, the variable information acquisition unit 142 adds the variable identifier to the output value “off” of the variable “op”, and configures the record “4 @ op # off”. Note that “@” in “4 @ op # off” indicates an output value.

Next, the variable information acquisition unit 142 reads “lamp: onoff_type {off};” in FIG. Then, the variable information acquisition unit 142 determines that this processing unit is a variable declaration.

Next, the variable information acquisition unit 142 acquires the variable type “onoff_type” from the processing unit “lamp: onoff_type_ {off};”. Next, the test source information acquisition unit 141 cannot acquire the test source information from this processing unit.

Next, the variable information acquisition unit 142 uses the type “onoff_type” to obtain one or more input values {on, off} of the variable “lamp” and one or more output values {on, off} of the variable “lamp”. get. Then, the variable information acquisition unit 142 adds the variable identifier to the input value “on” of the variable “lamp”, and configures the record “5 lamp # on”. Further, the variable information acquisition unit 142 adds the variable identifier to the input value “off” of the variable “lamp”, and configures the record “6 lamp # off”. Also, the variable information acquisition unit 142 adds the variable identifier to the output value “on” of the variable “lamp”, and configures the record “7 @ lamp # on”. Furthermore, the variable information acquisition unit 142 adds the variable identifier to the output value “off” of the variable “lamp”, and configures the record “8 @ lamp # off”. And the variable information acquisition means 142 adds these records to a conversion table.

Next, the variable information acquisition unit 142 reads “Channel ch: m_type;” in FIG. Then, the variable information acquisition unit 142 determines from the reserved word “Channel” that this processing unit is a variable declaration.

Next, the variable information acquisition unit 142 acquires the variable type “m_type” from the processing unit “Channel ch: m_type;”. Next, the test source information acquisition unit 141 cannot acquire the test source information from this processing unit.

Next, the variable information acquisition unit 142 acquires the input value {m} of the variable “ch” using the type “m_type”. Then, the variable information acquisition unit 142 adds the variable identifier to the input value “m” of the variable “ch” to configure the record “9 ch? M”. Then, the variable information acquisition unit 142 adds this record to the conversion table. Note that the reserved word “Channel” indicates an event, and the variable information acquisition unit 142 knows in advance that only an input value exists and no output value exists.

The variable table shown in FIG. 7 was obtained by the above processing. In the variable table, “c --- CNFNum to VarAssign table ---”, “c --- end ---”, and “c” at the beginning of the line have no significant meaning here.

Next, the test information acquisition unit 143 interprets the specification description information in FIG. 6 and acquires a propositional logical expression as follows.

That is, the test information acquisition unit 143 reads, for example, the processing unit “Var op: onoff_type {off} testedwith {off};”, and from the processing unit, the propositional logical expression “op # off” before the state transition and the state transition We get the later propositional formula "@ op # off". The test information acquisition means 143 interprets the processing unit “Var op: onoff_type {off} testedwith {off};”, the value of the variable “op” before the state transition is always “off”, and the variable after the state transition The value of “op” is always determined to be “off”. “Op # off” indicates that the value of the variable “op” before the state transition is “off”. “@ Op # off” indicates that the value of the variable “op” after the state transition is “off”.

And here, the test information acquisition means 143 acquires the variable identifier “3” corresponding to “op # off” using the variable table of FIG. 7 for the propositional logical expression “op # off”. Then, replace “op # off” with “30”. Note that “0” in “3 0” indicates the end of the propositional logical expression. In addition, the propositional formula “op # off” is added as a comment. FIG. 8 is an example of a set of propositional logical expressions acquired by the test information acquisition unit 143. In FIG. 8, the propositional formula is commented out (c is added to the beginning of the line) and replaced with a set of variable identifiers having the same meaning. (1) in FIG. 8 corresponds to “op # off”, and (2) corresponds to a set of variable identifiers having the same meaning. Similarly, (3) in FIG. 8 corresponds to “@ op # off”, and (4) corresponds to a set of variable identifiers having the same significance. Note that the test information acquisition unit 143 does not need to add the commented propositional logical expression.

Further, the test information acquisition unit 143 reads, for example, the processing unit “op == on && lamp == off: ch? M: lamp == on;” and outputs the propositional logical expression “op # on∧lamp # off” from the processing unit. ∧ch? M → @ lamp # on ”. That is, the test information acquisition unit 143 sets “op == on” to “op # on”, “lamp == off” to “lamp # off”, “ch? M” to “ch? M”, and “&&& “” Is converted into “∧”, and the state event before transition is connected with “∧”. Then, the post-transition state “lamp == on” is converted to “@ lamp # on” and connected by “→”. Through the above processing, the test information acquisition unit 143 obtains a propositional logical expression from the specification description information.

Next, the test information acquisition unit 143 comments out the processing unit “op == on && lamp == off: ch? M: lamp == on;” and, as described above, the propositional logical expression “op # on∧lamp”. # off∧ch? m → @ lamp # on ”is converted into a set of variable identifiers. Here, since the variable identifier corresponding to “op # on” does not exist in the variable table, the test information acquisition unit 143 changes the propositional logical expression “op # on∧lamp # off∧ch? M → @ lamp # on”. Judge that it cannot be converted into a set of variable identifiers. Therefore, the test information acquisition unit 143 obtains the information (5) in FIG.

Next, the test information acquisition unit 143 reads out the processing unit “op == off-> lamp == off;” and obtains a propositional logical expression “￢op # off∧lamp # off” before the state transition from the processing unit. Then, the propositional logical expression “￢ @ op # off∧ @ lamp # off” after the state transition is obtained. “￢” indicates negative.

Then, the test information acquisition unit 143 comments out the state before the transition of the processing unit “op == off-> lamp == off;”, and obtains (6) in FIG.

Then, the test information acquisition unit 143 performs a process of converting the propositional logical expression “￢op # off∧lamp # off” before the state transition into a set of variable identifiers, and obtains “−3.6.0”. And the test information acquisition means 143 obtains (7) of FIG. Here, “−” of “−3” indicates negation. That is, “−3” that is a value obtained by subtracting “3 (op # off)” of the variable table is obtained from “￢op # off”. In addition, the test information acquisition unit 143 applies “lamp # off” to the variable table to obtain “6”.

Next, the test information acquisition unit 143 comments out the state after the transition of the processing unit “op == off-> lamp == off;” to obtain (8) in FIG. Then, the test information acquisition unit 143 performs a process of converting the propositional logical expression “￢ @ op # off∧ @ lamp # off” after the state transition into a set of variable identifiers, and obtains “−4.80”. And the test information acquisition means 143 obtains (9) of FIG. That is, “−4” which is a value obtained by subtracting “4 (@ op # off)” of the variable table is obtained from “￢ @ op # off”. In addition, the test information acquisition unit 143 applies “@ lamp # off” to the variable table to obtain “8”.

The above processing is performed for all processing units of the specification description information, and the test information acquisition unit 143 obtains a multiplicative standard form (CNF) file of FIG.

Next, the test information acquisition unit 143 takes the values “off” and “on” that can be taken by the variable “op” before the state transition, and the values “off” and “on” that can take the variable “@op” after the state transition. , Possible values “off” and “on” of variable “lamp” before state transition, Possible values “off” and “on” of variable “@lamp” after state transition, Possible values of channel variable ” m ”, possible values of default“ null ”“ true ”and“ false ”, possible values of default counter“ SubsystemCountUp ”“ true ”and“ false ”, and all combinations (set of input value and output value ) Satisfies all the propositional formulas in FIG. 8 (FIG. 8 is a set of variable identifiers that are equivalent to the propositional formulas). Then, the test information acquisition unit 143 acquires a set of input values and output values that satisfy all the propositional logical expressions. This set of input values and output values is test information. However, here, the test information acquisition unit 143 converts the set of input values and output values into a numeric string with reference to the variable table. Here, the numerical sequence acquired by the test information acquisition unit 143 is (1), (2), and (3) in FIG. Note that “−1” in “−1 2 3 4 -5 6 -7 8 -9” in FIG. 9A indicates the negation of “1 null # true” in the variable table. Also, “2” in FIG. 9A indicates “2 SubsystemCountUp # true” in the variable table. Also, “3” in FIG. 9A indicates “3 op # off” in the variable table.

Next, the test information acquisition unit 143 converts the numerical sequence shown in FIGS. 9 (1) to (3) into a set of input values and output values using (FIG. 7), and obtains the test information shown in FIG. . FIG. 10 shows an example of test information, which is a test suite here. In FIG. 10, the action attribute may not exist. An event that is explicitly generated after state transition can be assigned to the attribute of action, but here, all are “null”.

Hereinafter, the concept of the operation of the test information acquisition unit 14 will be further described with reference to FIG. In FIG. 11, the test information acquisition unit 14 performs three processes of T1, T2, and T3.

At T1, specification description information (here, in particular, a SENS description file that is a file described in a specification description language called SENS) is input, and a CNF file is output. Specifically, the constraint information appearing in the SENS description is converted into a multiplicative normal form (CNF) propositional logical expression, and a set of sequences representing the propositional logical expression is output. The processing procedure is as follows. The following processes are all processes performed by the test information acquisition unit 14.

1. The test information acquisition unit 14 expresses, with respect to variables appearing in the SENS description, what value the variable takes at the current time by an atomic proposition, and assigns a unique integer value to the atomic proposition. The integer value is a serial number of the atomic proposition, and the truth value of the atomic proposition is expressed as a positive value of the integer value, and the false value is expressed as a negative value. Similarly, the value that the variable takes at the next time is expressed by an atomic proposition, and a unique integer value is assigned to the atomic proposition.

For example, for a SENS variable “lamp” having values of “on” and “off”, the test information acquisition unit 14 sets a proposition that indicates that the lamp is on at the current time as lamp # on and off. And assign

integer values

5 and 6, respectively. Similarly, at the next time, a proposition indicating that the lamp is on is @ lamp # on, and a proposition indicating that the lamp is off is @ lamp # off, and

integer values

7 and 8 are assigned, respectively (see FIG. 8).

2. The test information acquisition unit 14 converts the constraint information appearing in the SENS description into a propositional logical expression. The constraint information expressed in the form of “precondition: event: postcondition, action” is converted into a propositional formula of the form “precondition 事前 event → postcondition∧action”. At this time, the variable appearing in the postcondition is treated as an expression of the next time. For example, the description `` op == on && lamp == off: ch? M: lamp == on; '' that appears in the SENS description is the propositional formula `` op # on∧lamp # off∧ch? M → @ lamp # is converted to "on".

3. The test information acquisition unit 14 converts the propositional logical expression expressing the constraint information into a multiplicative standard form. For example, if the propositional formula `` op # on∧lamp # off∧ch? M → @ lamp # on '' is converted to the multiplicative standard form, `` ￢op # on∨￢lamp # off∨￢ch? M∨ @ lamp # on "

4. The clause of the multiplicative standard form is 1. It is expressed as a sequence using the integer value assigned to the atomic proposition. At this time, a negative literal is represented by a negative number. The test information acquisition unit 14 outputs the numerical sequence for one clause as a line to a file. For example, the section “￢op # on∨￢lamp # off∨￢ch? M∨ @ lamp # on” is usually converted to a number sequence, but here “op” is only “off” according to the test source information. However, since it is only the target of the test information, it cannot be converted into a number sequence, and the number sequence is not output.

5. The test information acquisition unit 14 writes a correspondence table of atomic propositions and integer values as a comment at the end of the file.

Next, at T2, the test information acquisition unit 14 receives the CNF file and outputs the DNF file. That is, all the Boolean value assignments that satisfy the propositional formula expressed by the CNF file are searched using SAT-solver (software by a known technique). The flow of processing is as shown in FIG.

SAT-solver outputs value assignments in additive standard form (DNF). The value assignment is written (a) to a file in the form of a numerical sequence. (B) At the same time, the logical negation is fed back to the SAT-solver to obtain the next value assignment. This is repeated until no value assignment is output. Each numerical sequence appearing in the output file of T2 represents one of value assignments that satisfy the logical expression expressed by the CNF file.

Next, process T3 is performed. At T3, the CNF file and DNF file created from the SENS description are input, and the CSV file is output.

∙ Each number sequence in the DNF file is interpreted as a logical expression based on the correspondence table at the end of the CNF file, and converted into a CSV format that represents the SENS variable and its value assignment table. One line of CSV represents the input during test execution and the corresponding expected output. That is, one line of CSV represents a set of test suites. For example, the line “-1 -2 3 4 -5 6 -7 8 9” in the DNF file is changed to the propositional formula “op # off∧lamp # off∧ch? M∧ @ op # off∧ @ lamp # off”. Interpretation and conversion into CSV format “off, off, ch? M, off, off, null” (see the second record in FIG. 10).

As described above, according to the present embodiment, if information for test design is described at the time of design of an object, information regarding an appropriate test specification can be automatically generated.

Further, according to the present embodiment, the test source information can be described in the specification description information, so that the test information reflecting the designer's intention can be generated.

Note that the processing in the present embodiment may be realized by software. Then, this software may be distributed by software download or the like. Further, this software may be recorded on a recording medium such as a CD-ROM and distributed. This also applies to other embodiments in this specification. The software that implements the test specification generation apparatus according to the present embodiment is the following program. In other words, this program is information related to the target specification described in the specification description language, which is the test information that is information used in the test, and the language that describes the target specification, in the storage medium. The specification description information, which is information including test source information for generating test information, is stored, and the computer uses one or more of the declaration of the variable and the test source information. A test information acquisition unit that acquires one or more test information having at least an input value of each variable, and a test information storage unit that stores the one or more test information acquired by the test information acquisition unit in the test information storage unit It is a program for functioning.

Further, in the above program, the variable has a type, and the specification description information is associated with one or more variables among the one or more variables, and among the values that each variable can take. Test source information that is information for specifying a value to be used in the test information acquisition unit, the test information acquisition unit acquires the test source information in association with the variable from the specification description information, From the specification description information, a variable that does not have test source information, a variable information acquisition unit that acquires the type of the variable, and a variable corresponding to each test source information from the test source information acquired by the test source information acquisition unit And a test information acquisition unit for acquiring each input value from the variable acquired by the variable information acquisition unit and the type of the variable. It is preferable that a program for causing a data.

In the above program, the test information acquisition unit acquires, for each variable, one or more input values and output values of variables corresponding to each test source information from the test source information acquired by the test source information acquisition unit. And it is suitable that it is a program for making a computer function as what acquires an input value and an output value for every variable from the variable which the said variable information acquisition means acquired, and the type of the said variable.

In the above program, the specification description information includes one or more variable declarations and one or more constraint information that is a description related to the constraints, and the test information acquisition unit is acquired by the test source information acquisition unit. One or more input values and output values of variables corresponding to each test source information are acquired from the test source information for each variable, and the input values and outputs are obtained from the variables acquired by the variable information acquisition means and the types of the variables. To make a computer function as one that acquires one or more test suites that are a set of one or more input values and one or more output values so as to acquire a value for each variable and satisfy all the constraint information It is preferable that the program is.

In the above program, the constraint information includes a pre-transition state that is a state having a set of one or more variable values, an event that occurs for the pre-transition state, and the event that occurs in the state. State transition information having a post-transition state that is a state to be transferred to, or a first state having a set of one or more variable values and a set of one or more variable values that are always employed in the case of the first state It is preferable that the program is a program for causing a computer to function as the invariant condition information having the second state.

(Embodiment 2)
In the present embodiment, a test specification generation apparatus 2 that can prevent generation of an inappropriate test suite will be described. In the present embodiment, first, the test specification generation device 2 that prevents the generation of a test suite that does not satisfy the premise of the state transition will be described using the premise part of the state transition information as a constraint. Secondly, the test specification generation device 2 that provides restrictions on events and prevents the generation of a test suite including a specified event will be described. Third, the test specification generation device 2 that deletes the pre-transition state information and uses the logical negation of the remaining part as constraint information will be described. Fourthly, a description will be given of the test specification generation device 2 in which the post-transition state information is deleted and the logical negation of the remaining part is used as constraint information.

FIG. 13 is a block diagram of the test specification generation apparatus 2 in the present embodiment. The test specification generation apparatus 2 includes a test information storage unit 11, a specification description information storage unit 12, a reception unit 13, a test information acquisition unit 24, a test information storage unit 15, and a test information output unit 16.

The test information acquisition unit 24 includes an event constraint information storage unit 240, a test source information acquisition unit 141, a variable information acquisition unit 142, and a test information acquisition unit 243.

Here, the specification description information stored in the specification description information storage unit 12 includes one or more variable declarations and one or more constraint information. Further, the constraint information here is, for example, state transition information having a state before transition, an event, and a state after transition in the case of the state. The state transition information may have an action. The constraint information is, for example, invariant condition information.

The test information acquisition unit 24 acquires one or more pieces of test information having at least an input value of each of one or more variables using the variable declaration. In addition, it is preferable that the test information acquisition unit 24 acquires one or more pieces of test information having at least an input value of each of one or more variables using the variable declaration and the test source information. The test information here is usually a test suite.

The event constraint information storage unit 240 can store one or more event constraint information. The event constraint information is information indicating constraints related to events. The event constraint information is, for example, “￢null”, “￢t? Clear”, and the like. “￢null” indicates that the event is not null. “￢t? Clear” indicates that the event is not “t? Clear”.

The test information acquisition unit 24 can usually be realized by an MPU, a memory, or the like. The processing procedure of the test information acquisition unit 24 is usually realized by software, and the software is recorded in a recording medium such as a ROM. However, it may be realized by hardware (dedicated circuit).

The test information acquisition unit 243 acquires the input value and the output value for each variable from the specification description information, the variable acquired by the variable information acquisition unit 142 and the type of the variable, and satisfies all the constraint information. One or more test suites that are a set of one or more input values and one or more output values are acquired. Further, the test information acquisition unit 243 acquires one or more input values and output values of the variables corresponding to each test source information from the specification description information for each variable, and satisfies 1 One or more test suites that are a set of the above input value and one or more output values may be acquired.

The test information acquisition means 243 acquires one or more test suites that are a set of one or more input values and one or more output values so as to satisfy all the constraint information by using one or more premise information as constraint information. It is preferable to do. Here, the premise information is a set of a pre-transition state and an event included in one or more pieces of constraint information. The precondition information may be only the pre-transition state. Also, the logical sum of one or more pieces of premise information is usually constraint information. The original constraint information contained in the specification description information is `` (op == on∧null)-> t! Start; (op == on∧t? Ring)-> arg1.ch! M∧arg2.ch! M; '' If it is, the test information acquisition unit 243 acquires the prerequisite information “(op == on∨null) ∨ (op == on∧t? Ring)” of the constraint information and adds it to the constraint information. Here, “(op == on∧null)-> t! Start” means that if the variable “op” is “on” and “null”, the message “start” is sent to the channel “t”. Show. Also, if ((op == on∧t? Ring)-> arg1.ch! M∧arg2.ch! M;) is received, the variable “op” is “on” and the channel “t” is “ring” Indicates that the message “m” is transmitted to the channel “arg1.ch” and the message “m” is transmitted to the channel “arg2.ch”.

In addition, the test information acquisition unit 243 uses one or more event constraint information as constraint information, and a test suite that is a set of one or more input values and one or more output values so as to satisfy all the constraint information. It is preferable to acquire one or more. Here, the event constraint information is event constraint information stored in the event constraint information storage unit 240.

In addition, the test information acquisition unit 243 acquires one or more second constraint information from the constraint information corresponding to the test suite (which may be referred to as a solution) that has already been acquired, and obtains the one or more second constraint information. Is also used as constraint information, and it is preferable to acquire one or more test suites that are a set of one or more input values and one or more output values so as to satisfy all the constraint information. Here, the second constraint information is information configured by deleting the pre-transition state information included in the already acquired test suite information and logically negating the remaining part. Further, the second constraint information may be information configured by deleting the pre-transition state and the event included in the constraint information and taking the logical negation of the remaining portion (post-transition state). For example, when the solution “op # off, null # true, @ op # off” is obtained, the test information acquisition unit 243 determines that the second constraint information “is not @ op # off” (￢ “@ op # off” ) Is added as constraint information. Note that deleting the pre-transition state is equivalent to acquiring a part other than the pre-transition state from the constraint information.

Further, the second constraint information is information that is deleted from the post-transition state information included in the constraint information and is included in the constraint information, and is configured by logical negation of a portion other than the post-transition state. Also good. The second constraint information is information that the constraint information deletes the action and post-transition state, and the constraint information has, and is configured by logical negation of a portion other than the deleted portion (pre-transition state) Information may be used. For example, when the solution “op # off, null # true, @ op # off” is obtained, the test information acquisition unit 243 determines that the second constraint information “an event that is not op # off is not null” (￢ (op # off || null # true)) is added as constraint information. Note that deleting the post-transition state is equivalent to acquiring a part other than the post-transition state from the constraint information.

The test information acquisition unit 243 can be usually realized by an MPU, a memory, or the like. The processing procedure of the test information acquisition unit 243 is usually realized by software, and the software is recorded on a recording medium such as a ROM. However, it may be realized by hardware (dedicated circuit).

Next, a specific operation of the test specification generation device 2 in the present embodiment will be described. Hereinafter, four specific examples will be described.

(Specific example 1)
Specific example 1 is a case where one or more pieces of premise information are also used as constraint information to suppress unnecessary test suites.

Now, the specification description information storage unit 12 stores the specification description information shown in FIG. The specification description information in FIG. 14 does not have “testedwith {off}” in (3) as compared with the specification description information in FIG. In FIG. 14, as in FIG. 6, the constraint information is (6) and (7).

Then, the reception unit 13 receives a test information generation instruction. Then, the test information acquisition unit 14 reads the specification description information in FIG. 14 from the specification description information storage unit 12.

Next, the variable information acquisition unit 142 of the test information acquisition unit 14 interprets the specification description information in FIG. 14 and acquires a variable table. That is, the variable information acquisition unit 142 first acquires default variable information “null # true” and “SubsystemCountUp # true” from a recording medium (not shown). Then, the variable information acquisition unit 142 configures a record by attaching a variable identifier to the acquired information of each variable, and writes the record in an empty variable table.

Next, the variable information acquisition unit 142 sequentially reads “Extern”, “Data onoff_type; // from main”, “Class B”, and “Data m_type {m};” in FIG. Judge that.

Next, the variable information acquisition unit 142 reads “Var op: onoff_type {off};” in FIG. Then, the variable information acquisition unit 142 determines from the reserved word “Var” that this processing unit is a variable declaration. It is assumed that the variable information acquisition unit 142 determines that a variable declaration is made until a reserved word that is not a variable appears in subsequent processing units.

Next, the variable information acquisition unit 142 acquires the variable type “onoff_type” from the processing unit “Varop: onoff_type” {off}; ”. Next, the test source information acquisition unit 141 cannot acquire the test source information from this processing unit.

Next, the variable information acquisition unit 142 acquires the input values “on” and “off” of the variable “op” and the output values “on” and “off” of the variable “op” from the variable type “onoff_type”. To do. Then, the variable information acquisition unit 142 adds the variable identifier to the input value “on” of the variable “op” to configure the record “3 op # on. The variable information acquisition unit 142 also sets the variable“ op ”. A variable identifier is added to the input value “off” of the record, and the record “4 op # off” is formed.The variable information acquisition unit 142 adds a variable identifier to the output value “on” of the variable “op”. Record “5 @ op # on”, and variable information acquisition means 142 attaches a variable identifier to the output value “off” of variable “op” and records “6 @ op # off”. Constitute.

Next, the variable information acquisition unit 142 uses the type “onoff_type” to obtain one or more input values {on, off} of the variable “lamp” and one or more output values {on, off} of the variable “lamp”. get. Then, the variable information acquisition unit 142 adds the variable identifier to the input value “on” of the variable “lamp”, and configures the record “7 lamp # on”. Further, the variable information acquisition unit 142 adds the variable identifier to the input value “off” of the variable “lamp”, and configures the record “8 lamp # off”. Further, the variable information acquisition unit 142 adds the variable identifier to the output value “on” of the variable “lamp”, and configures the record “9 @ lamp # on”. Furthermore, the variable information acquisition unit 142 adds the variable identifier to the output value “off” of the variable “lamp”, and configures the record “10 @ lamp # off”. And the variable information acquisition means 142 adds these records to a conversion table.

Next, the variable information acquisition unit 142 acquires the input value {m} of the variable “ch” using the type “m_type”. Then, the variable information acquisition unit 142 adds the variable identifier to the input value “m” of the variable “ch” to configure the record “11 ch? M”. Then, the variable information acquisition unit 142 adds this record to the conversion table. Note that the reserved word “Channel” indicates an event, and the variable information acquisition unit 142 knows in advance that only an input value exists and no output value exists.

The variable table shown in FIG. 15 was obtained by the above processing.

Next, the test information acquisition unit 243 interprets the specification description information in FIG. 14 and acquires a propositional logical expression as follows.

In other words, the test information acquisition unit 243 reads, for example, the processing unit “Var op: offonoff_typeoff {off};”, and sets the propositional logical expression “op # on || op # off” regarding the variable before the state transition from the processing unit. “Not (op # on) || not (op # off)” and the propositional formula “@ op # on || @ op # off” and “not (@ op # on) || not (@ op # off) ".

Then, the test information acquisition unit 243 obtains a variable identifier set “34.0” for the propositional logical expression “op # on || op # off”, for example, using the variable table of FIG. “0” indicates the end of the propositional logical expression. Further, the test information acquisition unit 243 uses the variable table of FIG. 15, for example, for the propositional logical expression “not (op # on) || not (op # off)”, a set of variable identifiers “−3 -4 0 ". “-” Indicates “No”. That is, “not (op # on)” becomes the variable identifier “−3”. Further, the test information acquisition unit 243 obtains a set of variable identifiers “56.0” for the propositional formula “@ op # on || @ op # of” using the variable table of FIG. Further, the test information acquisition unit 243 uses the variable table of FIG. 15 to set the variable identifier set “−5” for the propositional logical expression “not (@ op # on) || not (@ op # off)”. Get -6 0 ". Further, the test information acquisition unit 243 adds the above propositional logical expression as a comment (c is added to the beginning of the line). Then, the test information acquisition unit 243 obtains (1), (2), (3), and (4) in FIG.

The test information acquisition unit 243 reads, for example, the processing unit “op == on && lamp == off: ch? M: lamp == on;” and outputs the propositional logical expression “op # on∧lamp # off” from the processing unit. ∧ch? M → @ lamp # on ”. That is, the test information acquisition unit 143 sets “op == on” to “op # on”, “lamp == off” to “lamp # off”, “ch? M” to “ch? M”, and “&&& “” Is converted into “∧”, and the state event before transition is connected with “∧”. Then, the post-transition state “lamp == on” is converted to “@ lamp # on” and connected by “→”. Through the above processing, the test information acquisition unit 243 obtains a propositional logical expression from the specification description information.

Next, the test information acquisition unit 243 obtains the propositional logical expression “op # on∧lamp # off∧ch? M → @ lamp # on” as an equivalent logical expression “￢op # on ∨ ￢lamp # off ∨”. It is transformed into “￢ch? M ∨ @ lamp # on” and is converted into a set of variable identifiers using the variable table of FIG. Then, the test information acquisition unit 243 obtains “9-11-11-3-8”. Therefore, the test information acquisition unit 243 obtains information (5) in FIG.

The test information acquisition unit 243 performs the above processing for all processing units, and obtains a set of propositional logical expressions shown in FIG. That is, if the specification description information of FIG. 14 is given to the processing system T1 described in the first embodiment, a set of propositional logical expressions of FIG. 16 is obtained. Note that the set of propositional formulas in FIG. 16 is an input to the SAT-solver.

Next, the test information acquisition unit 243 uses a test suite that is a set of one or more input values and one or more output values so as to satisfy all the constraint information by using one or more premise information as constraint information. Get one or more. That is, the test information acquisition unit 243 performs the premise information “op == on && lamp ==” of the constraint “op == on && lamp == off: ch? M: lamp == on;” in the specification description information in FIG. "off && ch? m" is added as constraint information of the specification description information. Further, the test information acquisition unit 243 corresponds to the variable 3 corresponding to “op == on”, the variable 8 corresponding to “lamp == off”, and “ch? M” with reference to the variable table of FIG. The variable 11 to be picked up is extracted, and three lines (6) are added to FIG.
Further, when there are two or more constraints related to state transition, a constraint that satisfies any of the premise information is added. For example, if “op == on && lamp == off: ch? M: lamp == on;” and “op == on && lamp == on: null: true;” exist as constraints, test information acquisition means 243 is based on the premise information “op == on && lamp == off && ch? M” and “op == on && lamp == on && null” and the constraint “(op == on && lamp == off && ch ? m) || (op == on && lamp == on && null) ”. Then, the test information acquisition unit 243 converts the constraint into a logical expression “(op == on || op == on) && (op == on || lamp == on) && (op = = on || null) && (lamp == off || op == on) && (lamp == off || lamp == on) && (lamp == off || null) && (ch? m || op == on) && (ch? m || lamp == on) && (ch? m || null) "and referring to the variable table of FIG. 15, the following nine lines of information are obtained. Then, the test information acquisition unit 243 adds nine lines to the CNF file.
3 3 0
3 7 0
3 1 0
8 3 0
8 7 0
8 1 0
11 3 0
11 7 0
11 1 0

Here, when the test information acquisition unit 243 does not perform the processing using the one or more pieces of premise information as the constraint information, for example, “op 集合 == off 式, lamp == off, ch? m, @ op == on, @lamp == on ”. In the definition of the truth value of the logical expression, this test suite has a constraint “op == on && lamp == off: ch? M: lamp == on;” described in the specification description information of FIG. Although “op == off-> lamp == off” is satisfied, the pre-transition condition “op == on && lamp == off” included in the premise information appearing in the constraint is not satisfied. Therefore, the test information acquisition unit 243 applies (6) of FIG. 16 and does not solve the above test suite.

As described above, the test information acquisition unit 243 extracts the description (premise information) corresponding to the precondition and the event occurrence from the specification description information, converts it into the input form of the SAT-solver, and adds a constraint. Run it.

(Specific example 2)
Specific example 2 is a case where event constraint information is also used as constraint information to suppress unnecessary test suites.

Now, the specification description information storage unit 12 stores the specification description information shown in FIG. Further, it is assumed that the event constraint information storage unit 240 stores “￢null”. Here, “￢null” indicates that “the event is not“ null ””. In other words, depending on the test execution plan, it may be desired to focus only on the test suite that accompanies the event occurrence. At this time, generating a test suite without an event is redundant. Therefore, by storing “￢null” in the event constraint information storage unit 240, generation of useless test suites is suppressed.

The test information acquisition unit 243 reads “￢null” from the event constraint information storage unit 240. Then, the test information acquisition unit 243 adds “￢null” as a constraint. That is, the test information acquisition unit 243 refers to the variable table of FIG. 15, picks up the variable “1” corresponding to “null # true”, adds the sign of “−” representing negative, Add one line (7) at the end.

When the test information acquisition unit 243 does not perform processing using “￢null” as the constraint information, for example, “op == off, lamp == off, ch? M” from the set of propositional logical expressions in FIG. , @ Op == on, @lamp == on ”. In the definition of the truth value of the logical expression, this test suite has a constraint “op == on && lamp == off: ch? M: lamp == on;” described in the specification description information of FIG. “Op == off-> lamp == off” is satisfied, but the condition “￢ (null # true)” appearing in the constraint is not satisfied. Therefore, the test information acquisition unit 243 applies (7) of FIG. 16 and does not solve the above test suite.

As described above, the test information acquisition unit 243 searches for a test suite that satisfies the specification of FIG. 14 and satisfies “the event is not“ null ””.

Also, the search for test suites with specific event occurrences can be suppressed by the same process for other than null. For example, when suppressing the output of the test suite that accompanies the timer count-up, the test information acquisition means 243 picks up the variable “2” corresponding to “SubsystemCountUp” and adds the constraint information “−2 0”. do it. In this case, it is assumed that the event constraint information “￢SubsystemCountUp” is stored in the event constraint information storage unit 240.

(Specific example 3)
Specific Example 3 is a case where unnecessary test suites are suppressed by deleting the pre-transition state information. The operation of specific example 3 is shown in FIG.

When a set of propositional formulas excluding (6) and (7) from the set of propositional formulas (CNF file) in FIG. 16 is processed at T2 described in the first embodiment, a DNF file is output. That is, the test information acquisition means in the prior art acquires the value assignment as shown in FIG. 17 from the set of propositional logical expressions obtained by removing (6) and (7) from the set of propositional logical expressions in FIG. Note that the test information acquisition means in the prior art does not have a test suite generation prevention function of the test specification generation apparatus 2 in the present embodiment.

The solution (a) “-1 の一 -2 図 3１７-4「 5 -6 -7 8 9 -10 11 ”in the first line of FIG. 17 is obtained by referring to the variable table of FIG. 15 as“ ￢null # true ∧￢S ubsys temCountUp. #true ∧ op # on ∧ ￢op # off ∧ @ op # on ∧ ￢ @ op # off ∧ ￢lamp # on ∧ lamp # off ∧ @ lamp # on ∧ ￢ @ lamp # off ∧ ch? m ". That is, “-1, 行 -2, 3, -4, -7, 8, 11” in the solution on the first line in FIG. And ch? M). Further, “5, -6, 9, -10” is information on the post-transition state (@ op == on and @ lamp == on).

Further, the test information acquisition means 243 obtains the logical negation “null # true ∨S ubsys temCountUp # true ∨ ￢op # on ∨ op # off ∨ ￢ @ op # on ∨ @ op # off ∨ lamp # on ∨ ￢lamp # Get the sequence `` 1 2 -3 4 -5 6 7 -8 -9 10 -11 0 '' that encodes `` off ∨ ￢ @ lamp # on ∨ @ lamp # off ∨ ￢ch? m '' and put it in SAT-solver As a result, the second solution (b) is calculated. Here, the test information acquisition unit 243 does not negate the first solution obtained at the time of feedback, but after the transition state “5, -6, 9, -10” (@ op == on and @ lamp = Get the negation of = on). That is, the test information acquisition unit 243 deletes the pre-transition state and event information included in the information corresponding to the test suite, and is information included in the constraint information, and is configured by logical negation of a portion other than the deleted information. Get information. Specifically, the test information acquisition unit 243 acquires the constraint information “(@ op == on and @ lamp == on) that is not”. That is, the test information acquisition unit 243 acquires a test suite whose posterior state is a solution different from (a). In FIG. 17B, the portion corresponding to the posterior state is “5 -6 9 -10”, which is the same as (a), and the constraint information “(@ op == on and @ lamp == on)” Does not meet. Therefore, the test information acquisition unit 243 does not finally output the test suite corresponding to (b) of FIG.

On the other hand, in FIG. 17 (c), the portion corresponding to the posterior state is “5 -6 -9 10”, which satisfies the constraint information “(@ op == on and @ lamp == on)”. Therefore, the test information acquisition unit 243 finally outputs a test suite corresponding to (c) of FIG. As described above, the test information acquisition unit 243 can obtain an exhaustive list of test suites in which the posterior state does not overlap as a result.

(Specific example 4)
Specific example 4 is a case where unnecessary test suites are suppressed by deleting the posterior state information.

Similarly to the specific example 3, when the set of propositional logical expressions (CNF file) in FIG. 16 is processed at T2 described in the first embodiment, value assignment as shown in FIG. 17 is obtained.

In addition, the solution (a) “-1 行 -2 3 -4 5 -6 -7 8 9 -10 11” in the first line of FIG. 17 is obtained by referring to the variable table of FIG. 15 as “￢null # true ∧￢S. ubsys temCountUp # true ∧ op # on ∧ ￢op # off ∧ @ op # on ∧ ￢ @ op # off ∧ ￢lamp # on ∧ lamp # off ∧ @ lamp # on ∧ ￢ @ lamp # off ∧ ch? m '' Become. In other words, “-1, -2, 3, -4, -7, 8, 11” is the prior state information and the information of the occurrence event (op == on and lamp == off and ch? M).

Then, the test information acquisition unit 243 acquires the prior state information and the logical negation of the occurrence event “(op == on and lamp == off and ch? M) denial”. Then, the test information acquisition unit 243 acquires a test suite that satisfies all of the original constraints and satisfies “(op == on and lamp == off and ch? M)”. That is, assuming that (b) in FIG. 17 satisfies “what is not (op == on and lamp == off and ch? M)”, the test information acquisition unit 243 employs (b) in FIG. 17 as a test suite. To do. As a result, the test information acquisition unit 243 obtains an exhaustive list of test suites that do not overlap in the prior state as a result.

As described above, according to the present embodiment, generation of an inappropriate test suite can be prevented.

Furthermore, the software that implements the test specification generation device according to the present embodiment is the following program. In other words, this program is information related to the target specification described in the specification description language, which is the test information that is information used in the test, and the language that describes the target specification, in the storage medium. Test information acquisition unit that stores specification description information, which is information including the declaration of, and uses the declaration of the variable to acquire one or more test information having at least an input value of each of the one or more variables And a program for causing the test information storage unit to function as a test information storage unit that stores one or more pieces of test information acquired in the test information storage unit.

In the above program, the specification description information includes declaration of one or more variables and one or more constraint information that is a description related to the constraint, and the test information acquisition unit includes the variable acquired by the variable information acquisition unit. And one or more test suites that are a set of one or more input values and one or more output values so that the input value and the output value are obtained for each variable from the variable type, and all the constraint information is satisfied. It is a program to acquire.

In the above program, the constraint information includes a pre-transition state that is a state having a set of one or more variable values, an event that occurs for the pre-transition state, and the event that occurs in the state. It is preferable that the information is constraint information for a state transition having a post-transition state that is a state to be transferred to.

Further, in the above program, the test information acquisition unit satisfies all constraint information by using, as constraint information, one or more premise information that is a set of a pre-transition state and an event included in the one or more constraint information. As described above, it is preferable to obtain one or more test suites that are a set of one or more input values and one or more output values.

In the above program, the test information acquisition unit further includes an event constraint information storage unit capable of storing one or more event constraint information indicating a constraint regarding the event, and the test information acquisition unit includes the one or more event constraint information. It is preferable to acquire at least one test suite that is a set of one or more input values and one or more output values so that all the constraint information is satisfied using the constraint information as the constraint information.

In the above program, the test information acquisition unit deletes the information about the pre-transition state and the event included in the constraint information from the constraint information corresponding to the test suite that has already been acquired, and the other than the pre-transition state. One or more second constraint information that constitutes a logical negation of the part of the constraint information is acquired, and the one or more second constraint information is also used as the constraint information to satisfy all the constraint information. It is preferable to acquire at least one test suite that is a set of input values and one or more output values.

Further, in the above program, the test information acquisition unit is a part that the post-transition state included in each constraint information is deleted from each of the one or more pieces of constraint information, and the post-transition state. One or more input values so as to obtain one or more second constraint information that constitutes a logical negation of a part other than, and to satisfy all the constraint information using the one or more second constraint information as constraint information It is preferable to acquire one or more test suites that are a set of one or more output values.

FIG. 19 shows the external appearance of a computer that executes the program described in this specification and realizes the test specification generation apparatus and the like of the above-described embodiment. The above-described embodiments can be realized by computer hardware and a computer program executed thereon. FIG. 19 is an overview diagram of the computer system 340, and FIG. 20 is a diagram showing an internal configuration of the computer system 340. As shown in FIG.

19, the computer system 340 includes a computer 341 including an FD drive 3411 and a CD-ROM drive 3412, a keyboard 342, a mouse 343, and a monitor 344.

In FIG. 20, in addition to the FD drive 3411 and the CD-ROM drive 3412, the computer 341 stores an MPU 3413, a bus 3414 connected to the CD-ROM drive 3412 and the FD drive 3411, and a program such as a bootup program. A RAM 3416 for temporarily storing application program instructions and providing a temporary storage space; and a hard disk 3417 for storing application programs, system programs, and data. Although not shown here, the computer 341 may further include a network card that provides connection to the LAN.

A program that causes the computer system 340 to execute the functions of the test specification generation device or the like of the above-described embodiment is stored in the CD-ROM 3501 or FD 3502, inserted into the CD-ROM drive 3412 or FD drive 3411, and further a hard disk 3417 may be transferred. Alternatively, the program may be transmitted to the computer 341 via a network (not shown) and stored in the hard disk 3417. The program is loaded into the RAM 3416 at the time of execution. The program may be loaded directly from the CD-ROM 3501, the FD 3502, or the network.

The program does not necessarily include an operating system (OS) or a third-party program that causes the computer 341 to execute the functions of the test specification generation device according to the above-described embodiment. The program only needs to include an instruction portion that calls an appropriate function (module) in a controlled manner and obtains a desired result. How the computer system 340 operates is well known and will not be described in detail.

Further, the computer that executes the program may be singular or plural. That is, centralized processing may be performed, or distributed processing may be performed.

In each of the above embodiments, each process (each function) may be realized by centralized processing by a single device (system), or by distributed processing by a plurality of devices. May be.

The present invention is not limited to the above-described embodiment, and various modifications are possible, and it goes without saying that these are also included in the scope of the present invention.

As described above, the test specification generation device according to the present invention has an effect that information related to an appropriate test specification can be automatically generated if information for test design is described at the time of target design, such as a test support device. Useful as.

DESCRIPTION OF

SYMBOLS

1, 2 Test specification production | generation apparatus 11 Test information storage part 12 Specification description information storage part 13

Reception part

14, 24 Test information acquisition part 15 Test information storage part 16 Test information output part 141 Test source information acquisition means 141 Test information source acquisition means 142 Variable information acquisition means 143, 243 Test information acquisition means

Claims

A test information storage unit that can store test information that is information used in the test;
Information related to the target specification described in a specification description language, which is a language describing the target specification, information including declaration of one or more variables, and information including test source information for generating test information A specification description information storage unit capable of storing specification description information,
A test information acquisition unit that acquires at least one test information having at least an input value of each of one or more variables using the declaration of the variable and the test source information;
A test specification generation apparatus comprising: a test information storage unit that stores one or more pieces of test information acquired by the test information acquisition unit in the test information storage unit.
The variable has a type;
The specification description information is
Among the one or more variables, there is test source information that is information for specifying a value used in a test among values that can be taken by each variable in association with one or more variables.
The test information acquisition unit
Test source information acquisition means for acquiring the test source information in association with the variable from the specification description information;
From the specification description information, variable information acquisition means for acquiring a variable having no test source information and the type of the variable;
One or more input values of variables corresponding to each test source information are acquired for each variable from the test source information acquired by the test information acquisition unit, and the variable acquired by the variable information acquisition unit and the type of the variable The test specification generation apparatus according to claim 1, further comprising test information acquisition means for acquiring an input value for each variable.
The test information acquisition means includes
From the test source information acquired by the test source information acquisition means, one or more input values and output values of variables corresponding to each test source information are acquired for each variable, and the variable acquired by the variable information acquisition means The test specification generation apparatus according to claim 2, wherein an input value and an output value are obtained for each variable from the variable type.
The specification description information is
Has one or more variable declarations and one or more constraint information that is a description of the constraint,
The test information acquisition means includes
From the test source information acquired by the test source information acquisition means, one or more input values and output values of variables corresponding to each test source information are acquired for each variable, and the variable acquired by the variable information acquisition means Acquire input values and output values for each variable from the variable type, and acquire one or more test suites that are a set of one or more input values and one or more output values so as to satisfy all the constraint information. The test specification generation device according to claim 3.
The constraint information is a state that has a set of one or more variable values, a state before transition, an event that occurs for the state before transition, and a state that transitions when the event occurs in the state. State transition information having a post-transition state and an action that explicitly generates an event, or a first state having a set of values of one or more variables and one or more variables that are always employed in the case of the first state The test specification generation device according to claim 4, which is invariant condition information having a second state having a set of values.
The test information acquisition means includes
One or more input values and one or more outputs so as to satisfy all the constraint information by using one or more premise information that is a set of a pre-transition state and an event included in the one or more constraint information as constraint information. The test specification generation apparatus according to claim 5, wherein one or more test suites that are a set of values are acquired.
The test information acquisition unit
Further comprising event constraint information storage means capable of storing one or more event constraint information indicating constraints on the event;
The test information acquisition means includes
6. The test suite, which is a set of one or more input values and one or more output values, is acquired so as to satisfy all the constraint information by using the one or more event constraint information as constraint information. Test specification generator.
The test information acquisition means includes
One or more configured to delete the pre-transition state and event information included in the constraint information from the constraint information corresponding to the test suite that has already been acquired, and to constitute a logical negation of the portion of the constraint information other than the pre-transition state Test that is a set of one or more input values and one or more output values so as to satisfy all the constraint information using the one or more second constraint information as constraint information. The test specification generation apparatus according to claim 5, wherein one or more suites are acquired.
The test information acquisition means includes
The post-transition state possessed by each constraint information is deleted from each of the one or more constraint information, and the part of the constraint information includes one or more firsts that constitute a logical negation of a portion other than the post-transition state. A test suite that is a set of one or more input values and one or more output values is acquired so as to satisfy all the constraint information by using the one or more second constraint information as the constraint information. The test specification generation device according to claim 5, wherein one or more are acquired.
In the storage medium,
Test information that is used for testing,
Information related to the target specification described in a specification description language, which is a language describing the target specification, information including declaration of one or more variables, and information including test source information for generating test information The specification description information is stored.
A test specification generation method that can be realized by a test information acquisition unit and a test information storage unit,
A test information acquisition step in which the test information acquisition unit acquires one or more test information having at least an input value of each of one or more variables using the declaration of the variable and the test source information;
A test specification generation method, comprising: a test information accumulation step in which the test information accumulation unit accumulates one or more pieces of test information acquired in the test information acquisition step in the test information storage unit.
In the storage medium,
Test information that is used for testing,
Information related to the target specification described in a specification description language, which is a language describing the target specification, information including declaration of one or more variables, and information including test source information for generating test information The specification description information is stored.
Computer
A test information acquisition unit that acquires at least one test information having at least an input value of each of one or more variables using the declaration of the variable and the test source information;
A program for functioning as a test information storage unit that stores one or more pieces of test information acquired by the test information acquisition unit in the test information storage unit.