WO2012109094A3 - Magnetic random access memory devices configured for self-referenced read operation - Google Patents
Magnetic random access memory devices configured for self-referenced read operation Download PDFInfo
- Publication number
- WO2012109094A3 WO2012109094A3 PCT/US2012/023682 US2012023682W WO2012109094A3 WO 2012109094 A3 WO2012109094 A3 WO 2012109094A3 US 2012023682 W US2012023682 W US 2012023682W WO 2012109094 A3 WO2012109094 A3 WO 2012109094A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- random access
- access memory
- read operation
- magnetic random
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5607—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using magnetic storage elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1659—Cell access
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1673—Reading or sensing circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1675—Writing or programming circuits or methods
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
Abstract
A magnetic random access memory cell includes a sense layer, a storage layer, and a spacer layer disposed between the sense layer and the storage layer. During a write operation, the storage layer has a magnetization direction that is switchable between m directions to store data corresponding to one of m logic states, with m > 2. During a read operation, the sense layer has a magnetization direction that is varied, relative to the magnetization direction of the storage layer, to determine the data stored by the storage layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP12744425.5A EP2673779B1 (en) | 2011-02-08 | 2012-02-02 | Magnetic random access memory devices configured for self-referenced read operation |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/023,442 US8467234B2 (en) | 2011-02-08 | 2011-02-08 | Magnetic random access memory devices configured for self-referenced read operation |
| US13/023,442 | 2011-02-08 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2012109094A2 WO2012109094A2 (en) | 2012-08-16 |
| WO2012109094A3 true WO2012109094A3 (en) | 2012-10-18 |
Family
ID=46600547
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2012/023682 Ceased WO2012109094A2 (en) | 2011-02-08 | 2012-02-02 | Magnetic random access memory devices configured for self-referenced read operation |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8467234B2 (en) |
| EP (1) | EP2673779B1 (en) |
| TW (1) | TWI525612B (en) |
| WO (1) | WO2012109094A2 (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8576615B2 (en) | 2011-06-10 | 2013-11-05 | Crocus Technology Inc. | Magnetic random access memory devices including multi-bit cells |
| US8488372B2 (en) | 2011-06-10 | 2013-07-16 | Crocus Technology Inc. | Magnetic random access memory devices including multi-bit cells |
| EP2608208B1 (en) * | 2011-12-22 | 2015-02-11 | Crocus Technology S.A. | Self-referenced MRAM cell and method for writing the cell using a spin transfer torque write operation |
| US8917531B2 (en) | 2013-03-14 | 2014-12-23 | International Business Machines Corporation | Cell design for embedded thermally-assisted MRAM |
| US9406870B2 (en) | 2014-04-09 | 2016-08-02 | International Business Machines Corporation | Multibit self-reference thermally assisted MRAM |
| EP2942780B1 (en) | 2014-05-09 | 2019-10-30 | Crocus Technology S.A. | Multi-bit MRAM cell and method for writing and reading to such MRAM cell |
| EP2958108B1 (en) | 2014-06-17 | 2019-08-28 | CROCUS Technology | Self-referenced multibit MRAM cell having a synthetic antiferromagnetic storage layer |
| US9524765B2 (en) | 2014-08-15 | 2016-12-20 | Qualcomm Incorporated | Differential magnetic tunnel junction pair including a sense layer with a high coercivity portion |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080247072A1 (en) * | 2007-03-29 | 2008-10-09 | Commissariat A L'energie Atomique | Magnetic tunnel junction magnetic memory |
| US20090073755A1 (en) * | 2006-03-15 | 2009-03-19 | Honeywell International Inc. | MRAM read bit with askew fixed layer |
| KR20090112037A (en) * | 2008-04-23 | 2009-10-28 | 주식회사 하이닉스반도체 | Multi-bit recording method using magnetoresistive element and MRAM using the same |
| WO2010064476A1 (en) * | 2008-12-02 | 2010-06-10 | 富士電機ホールディングス株式会社 | Magnetic memory element and nonvolatile storage device |
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| US5917749A (en) * | 1997-05-23 | 1999-06-29 | Motorola, Inc. | MRAM cell requiring low switching field |
| US5959880A (en) * | 1997-12-18 | 1999-09-28 | Motorola, Inc. | Low aspect ratio magnetoresistive tunneling junction |
| US5982660A (en) * | 1998-08-27 | 1999-11-09 | Hewlett-Packard Company | Magnetic memory cell with off-axis reference layer orientation for improved response |
| US6545906B1 (en) | 2001-10-16 | 2003-04-08 | Motorola, Inc. | Method of writing to scalable magnetoresistance random access memory element |
| SG115462A1 (en) | 2002-03-12 | 2005-10-28 | Inst Data Storage | Multi-stage per cell magnetoresistive random access memory |
| US6657889B1 (en) * | 2002-06-28 | 2003-12-02 | Motorola, Inc. | Memory having write current ramp rate control |
| US6577529B1 (en) * | 2002-09-03 | 2003-06-10 | Hewlett-Packard Development Company, L.P. | Multi-bit magnetic memory device |
| US7190611B2 (en) * | 2003-01-07 | 2007-03-13 | Grandis, Inc. | Spin-transfer multilayer stack containing magnetic layers with resettable magnetization |
| US6714442B1 (en) | 2003-01-17 | 2004-03-30 | Motorola, Inc. | MRAM architecture with a grounded write bit line and electrically isolated read bit line |
| JP4234684B2 (en) | 2003-05-02 | 2009-03-04 | 富士通株式会社 | Magnetic recording medium, magnetic storage device, and method of manufacturing magnetic recording medium |
| US6794697B1 (en) * | 2003-10-01 | 2004-09-21 | Hewlett-Packard Development Company, L.P. | Asymmetric patterned magnetic memory |
| US7053430B2 (en) | 2003-11-12 | 2006-05-30 | Honeywell International Inc. | Antiferromagnetic stabilized storage layers in GMRAM storage devices |
| US7023724B2 (en) | 2004-01-10 | 2006-04-04 | Honeywell International Inc. | Pseudo tunnel junction |
| US7502248B2 (en) * | 2004-05-21 | 2009-03-10 | Samsung Electronics Co., Ltd. | Multi-bit magnetic random access memory device |
| CN1997515B (en) * | 2004-07-13 | 2013-02-20 | 加利福尼亚大学董事会 | Swapping bias based multi-state magnetic memory and logic devices and magnetically stable magnetic memory |
| KR100590563B1 (en) * | 2004-10-27 | 2006-06-19 | 삼성전자주식회사 | Multi-bit magnetic memory device, its operation and manufacturing method |
| US6937497B1 (en) * | 2004-11-18 | 2005-08-30 | Maglabs, Inc. | Magnetic random access memory with stacked toggle memory cells |
| US7133309B2 (en) | 2005-01-10 | 2006-11-07 | International Business Machines Corporation | Method and structure for generating offset fields for use in MRAM devices |
| US7443639B2 (en) | 2005-04-04 | 2008-10-28 | International Business Machines Corporation | Magnetic tunnel junctions including crystalline and amorphous tunnel barrier materials |
| KR100657956B1 (en) | 2005-04-06 | 2006-12-14 | 삼성전자주식회사 | Multi-value resistor memory device and its manufacture and operation method |
| US8058696B2 (en) | 2006-02-25 | 2011-11-15 | Avalanche Technology, Inc. | High capacity low cost multi-state magnetic memory |
| US8018011B2 (en) | 2007-02-12 | 2011-09-13 | Avalanche Technology, Inc. | Low cost multi-state magnetic memory |
| US7903452B2 (en) * | 2006-06-23 | 2011-03-08 | Qimonda Ag | Magnetoresistive memory cell |
| KR100885184B1 (en) | 2007-01-30 | 2009-02-23 | 삼성전자주식회사 | Memory device having resistance characteristics that can be controlled independently by electric and magnetic fields, and method of operation thereof |
| KR100862183B1 (en) * | 2007-06-29 | 2008-10-09 | 고려대학교 산학협력단 | Magnetic memory device using domain structure and multi-state of ferromagnetic material |
| US20090027948A1 (en) * | 2007-07-24 | 2009-01-29 | Manfred Ruehrig | Integrated Circuits, Method of Programming a Cell, Thermal Select Magnetoresistive Element, Memory Module |
| KR101311577B1 (en) | 2007-07-25 | 2013-09-26 | 삼성전자주식회사 | Method for visible communication in a visible light cimmunication |
| KR101425958B1 (en) | 2007-09-06 | 2014-08-04 | 삼성전자주식회사 | Memory system for storing multi-bit data and its reading method |
| US7706176B2 (en) * | 2008-01-07 | 2010-04-27 | Qimonda Ag | Integrated circuit, cell arrangement, method for manufacturing an integrated circuit and for reading a memory cell status, memory module |
| KR20090096294A (en) | 2008-03-07 | 2009-09-10 | 삼성전자주식회사 | Multi-level nonvolatile memory device using variable resistive element |
| US7746687B2 (en) | 2008-09-30 | 2010-06-29 | Seagate Technology, Llc | Thermally assisted multi-bit MRAM |
| EP2270812B1 (en) | 2009-07-02 | 2017-01-18 | CROCUS Technology | Ultimate magnetic random access memory-based ternay CAM |
| EP2276034B1 (en) * | 2009-07-13 | 2016-04-27 | Crocus Technology S.A. | Self-referenced magnetic random access memory cell |
| US8331141B2 (en) * | 2009-08-05 | 2012-12-11 | Alexander Mikhailovich Shukh | Multibit cell of magnetic random access memory with perpendicular magnetization |
| US8279662B2 (en) * | 2010-11-11 | 2012-10-02 | Seagate Technology Llc | Multi-bit magnetic memory with independently programmable free layer domains |
| US8625336B2 (en) * | 2011-02-08 | 2014-01-07 | Crocus Technology Inc. | Memory devices with series-interconnected magnetic random access memory cells |
| US8488372B2 (en) | 2011-06-10 | 2013-07-16 | Crocus Technology Inc. | Magnetic random access memory devices including multi-bit cells |
| US8576615B2 (en) | 2011-06-10 | 2013-11-05 | Crocus Technology Inc. | Magnetic random access memory devices including multi-bit cells |
-
2011
- 2011-02-08 US US13/023,442 patent/US8467234B2/en active Active
-
2012
- 2012-02-02 EP EP12744425.5A patent/EP2673779B1/en active Active
- 2012-02-02 WO PCT/US2012/023682 patent/WO2012109094A2/en not_active Ceased
- 2012-02-08 TW TW101104073A patent/TWI525612B/en not_active IP Right Cessation
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090073755A1 (en) * | 2006-03-15 | 2009-03-19 | Honeywell International Inc. | MRAM read bit with askew fixed layer |
| US20080247072A1 (en) * | 2007-03-29 | 2008-10-09 | Commissariat A L'energie Atomique | Magnetic tunnel junction magnetic memory |
| KR20090112037A (en) * | 2008-04-23 | 2009-10-28 | 주식회사 하이닉스반도체 | Multi-bit recording method using magnetoresistive element and MRAM using the same |
| WO2010064476A1 (en) * | 2008-12-02 | 2010-06-10 | 富士電機ホールディングス株式会社 | Magnetic memory element and nonvolatile storage device |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2012109094A2 (en) | 2012-08-16 |
| TW201237864A (en) | 2012-09-16 |
| EP2673779A4 (en) | 2018-01-03 |
| EP2673779B1 (en) | 2019-08-28 |
| EP2673779A2 (en) | 2013-12-18 |
| TWI525612B (en) | 2016-03-11 |
| US8467234B2 (en) | 2013-06-18 |
| US20120201074A1 (en) | 2012-08-09 |
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