WO2012028660A1 - Gas distribution device for vacuum processing equipment - Google Patents
Gas distribution device for vacuum processing equipment Download PDFInfo
- Publication number
- WO2012028660A1 WO2012028660A1 PCT/EP2011/065052 EP2011065052W WO2012028660A1 WO 2012028660 A1 WO2012028660 A1 WO 2012028660A1 EP 2011065052 W EP2011065052 W EP 2011065052W WO 2012028660 A1 WO2012028660 A1 WO 2012028660A1
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- WIPO (PCT)
- Prior art keywords
- plate
- gas
- channels
- vacuum chamber
- channel
- Prior art date
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45574—Nozzles for more than one gas
Definitions
- the invention relates to a vacuum chamber for accommodating a substrate to be treated in a vacuum process comprising a gas inlet connected to a gas source for receiving gas and a gas distribution system for dispensing the gas from the gas inlet to a plurality of outlet openings into the vacuum chamber at a plurality of locations towards the substrate.
- the present invention relates to a system for uniformly distributing a precursor gas or gases in a low pressure chemical vapour deposition reactor.
- This gas distribution system can be applied in all chemical vapour deposition reactors to improve the local gas flow uniformity and thus the coating homogeneity.
- the system permits also to transport an e.g. reactive precursor independently without premixing close to the substrate surface to reduce the parasitic deposition on the reactor itself.
- Deposition or coating processes are well-known in the art. Especially for the manufacturing of large area coatings, deposition uniformity is an important criterion.
- layer properties realized on small scale need to be extended to large area substrates of such thin film technologies.
- the tighter the specification for the integration on a small area the better the uniformities need to be on a larger area.
- a typical example is the IC industry, where several thin film layers are adjusted to each other. This adjustment needs to be maintained over the whole substrate area, which requires good uniformity on all involved layers in all their critical properties over the whole wafer.
- a similar example is a thin film solar cell application.
- the cell properties allowing high efficiency need to be applied over the whole integrated module. Areas with properties “out of specification” will deteriorate individual cells, which will exhibit a low efficiency causing a higher resistance in a serial connection. As a consequence, areas of bad cell properties reduce the overall performance of the complete solar module.
- LPCVD low pressure chemical vapour deposition
- the gas plenum may have different designs but is generally composed of a cooling part 1 to reduce parasitic coating on the gas plenum, a gas shower unit 2 and a piping net 3 to distribute the gases, as shown in prior art Fig. 1.
- the pipings 3 usually exhibit bores 4 easily distributed over their length in order to allow dosing of gases and/or precursors.
- the bores 4 may be enclosed in a chamber, separated from the actual processing space in order to allow the inflowing gases to easily distribute even at the location of the bores 4 where local pressure peaks may arise.
- a shower plate or shower head is a perforated plate, i.e. the gas shower unit 2, with the distribution of through holes, the bores 4, allowing the gases to transfer from the dosing chamber to the processing space.
- Such distribution of gases or precursors within the plenum using the piping net 3 is known from prior art but requires a complex maintenance, which includes dismounting all pipes, checking the whole orientation of the pipes during the mounting phase, checking numerous sealings between the frame and the pipes etc.
- the flow uniformity obtained with the piping net 3 is poor and the possibility to improve it without extremely complex design is quite limited.
- the distribution pipes of the piping net 3 are located behind the cooling/shower plate, the gas shower unit 2, in a separate volume as described above.
- the precursors are mixed within this volume and may even partially react.
- Such parasitic deposition can occur within the gas plenum and may reduce some gas distributor functionality as a function of utilization time.
- more than one independent piping line has to be used which increases further the complexity of the whole distribution system and reduces even more the design freedom.
- a vacuum chamber for accommodating a substrate to be treated in a vacuum process
- a gas inlet connected to a gas source for receiving gas and a gas distribution system for dispensing the gas from the gas inlet to a plurality of outlet openings into the vacuum chamber at a plurality of locations towards the substrate
- the gas distribution system comprises a first plate and a second plate, each plate having a flat side, the first plate exhibits a plurality of bores forming the outlet openings, the second plate exhibits a plurality of channels arranged on the flat side, the first plate and the second plate are mounted together with their flat sides directly contacting each other such that each bore of the first plate is arranged where a channel of the second plate ends such that gas is dispensable through the respective channel into the bore, and the individual channels merge into at least one common channel connected to the gas inlet thus forming a branching arrangement.
- the present invention is based on the central idea to provide a so-called binary tree gas distributor plate, i.e. the second plate, having channels to transport, split and/or distribute the gas, for example a “low-reactive” gas or a gas mixture, from the gas inlet to the plurality of outlet openings, resulting in a uniform flow distribution of the gas.
- the uniform gas flow is reached, which results in a uniform coating of the substrate.
- the vacuum chamber comprising the gas distribution system provides for a significant improvement of the substrate coating homogeneity, thus in an improved quality of the so manufactured substrate while decreasing the manufacturing costs as well.
- processing in sense of the current invention comprises any chemical, physical and/or mechanical effect acting on the substrate.
- substrate in sense of the current invention comprise a component, part or workpiece to be treated with the vacuum processing system according to the invention.
- a substrate includes but is not limited to flat-, plate-shaped part having rectangular, square or circular shape.
- the substrate is suitable for manufacturing a thin film solar cell and comprises a float glass, a security glass and/or a quartz glass. More preferably, the substrate is provided as an essentially, most preferably completely flat substrate having a planar surface of a size ⁇ 1 m2, such as a thin glass plate.
- vacuum processing or “vacuum treatment system” in sense of the current invention comprises at least an enclosure for the substrate to be treated under pressure lower than ambient atmospheric pressure.
- CVD chemical vapour deposition
- TCO transparent conductive oxide
- TCO layers are transparent conductive layers, whereby the terms layer, coating, deposit and film are interchangeably used within this invention for a film deposited in vacuum process, be it CVD, LPCVD, plasma enhanced CVD (PECVD) or physical vapour deposition (PVD).
- a film deposited in vacuum process be it CVD, LPCVD, plasma enhanced CVD (PECVD) or physical vapour deposition (PVD).
- solar cell or “photovoltaic cell”, “PV cell”, comprises in sense of the current invention an electrical component, capable of transforming light, essentially sunlight, directly into electrical energy by means of the photovoltaic effect.
- a thin film solar cell usually includes a first or front electrode, one or more semiconductor thin film PIN junctions and a second or back electrode, which are successively stacked on a substrate.
- Each PIN junction or thin film photoelectric conversion unit includes an i-type layer sandwiched between a p-type layer and an n-type layer, whereby “p” stands for positively doped and “n” stands for negatively doped.
- the i-type layer which is a substantially intrinsic semiconductor layer, occupies the most part of the thickness of the thin film PIN junction, whereby the photoelectric conversion primarily occurs in this i-type layer.
- the substrate is preferably a substrate used for manufacturing a thin film photovoltaic cell.
- flat comprises in sense of the current invention a surface that is not rough, i.e. does not have grooves or alike.
- the term “flat” means that the surface roughness grade of the respective surface is ⁇ N9.
- gas in sense of the current invention means any gas suitable for providing a coating in a CVD process, especially for creating a coating required to manufacture a solar cell.
- the first plate is provided as a gas shower plate, which is arranged in the vacuum chamber adjacent to the substrate.
- the second plate is preferably provided as a distributor plate for distributing the gas across the surface of the substrate.
- each channel comprises two ends and is provided in a pipe- or tube-like manner for transporting the gas from the first end to the second end.
- the channel is connected to a bore, it is meant that the gas transported in the channel is preferably completely dispensed into the bore, for flowing onto the substrate.
- the gas distribution system comprises a back plate having a flat side
- the second plate exhibits two opposite flat sides and channels on the two sides
- the back plate and the second plate are mounted together with their flat sides directly contacting each other such that gas is dispensable through the channels on the two sides of the second plate.
- each side of the second plate is designed to transport, split and/or distribute the gas, for example two different gases, independently, which may be mixed in the vacuum chamber for reacting onto the substrate.
- the individual channels of the two sides of the second plate per side merge into at least one common channel such that gas is dispensable to the respective channels of each side of the second plate.
- the gas distribution system comprises two different common channels each provided on one side of the second plate for providing gas to the plurality of channels.
- the first plate, the second plate and/or the back plate are arranged parallel to each other.
- the second plate comprises a plurality of second bores such that gas from two channels of the two sides of the second plate is dispensable into the same bore forming a common outlet opening for the gas.
- two, for example different, gases are mixed, for example for becoming highly reactive, within the second plate and are afterwards and directly injected into the vacuum chamber, i.e. into the reaction chamber.
- gas pre-mixing does not occur in the gas plenum provided within the vacuum chamber, which minimizes the parasitic deposition within the gas plenum.
- the quantity of injected gas that is used for the substrate coating is increased.
- the second plate comprises a plurality of second bores each associated to a bore such that gas from channels of the two sides of the second plate is per side dispensible into a respective bore, each forming a separate outlet opening for the respective gas.
- the end of at least one channel is located adjacent to another channel such that gas dispensed from the one channel into the another channel is equally split between the two ends of the another channel. It is further preferred, that the channels are arranged in a binary tree-manner forming the branching arrangement between the gas inlet and the outlet openings such that gas dispensed into the branching arrangement is equally split across all outlet openings. In another preferred embodiment, the channels are provided such that the gas path length is equal between the gas inlet and each outlet opening.
- At least one channel branches into another channel for creating a more dendritic gas distribution system, such that the influent gas into the common channel is subdivided by the plurality of channel towards the plurality of outlet openings each having the same gas path length and preferably equally distributed along the substrate surface within the vacuum chamber.
- the influent gas into the common channel is subdivided by the plurality of channel towards the plurality of outlet openings each having the same gas path length and preferably equally distributed along the substrate surface within the vacuum chamber.
- the channels are provided in a narrowing manner between the common channel and the end of the respective channel located at the bore, the common channel having a depth of ⁇ 3 mm and a width of ⁇ 16 mm, the end of the channels arranged at the bore having each a depth of ⁇ 1,5 mm and a width of ⁇ 3 mm and the bores having each a diameter of ⁇ 2,2 mm.
- Designing the channel with before-mentioned dimensions allows for a significantly improved coating quality of the substrate, compared to prior art systems, e.g. for a thin film solar cell, especially when providing the channels in a narrowing manner having the same gas path length for all outlet openings to result in a very uniform gas distribution over the complete substrate surface to be treated.
- the thickness of the second plate is ⁇ 15 mm, thus reducing manufacturing costs compared to prior art systems.
- the gas flow within the channels may have any flow rate.
- the channels and the bores are provided such that the gas flow from the gas inlet to the outlet openings is ⁇ 1 slm (standard liter per minute), per side of the second plate. Designing the channels and bores this way further optimize the coating quality due to an increased uniform distribution of the precursors, i.e. the gas. It has been found that a variation of 1% of DEZ flow as gas and 1°C of the substrate temperature induces a variation of about 6 nm and 25 nm of the thickness coating respectively.
- the gas distribution system comprises a means for cooling the second plate, whereby the means preferably comprises water cooling, preferably with13 l water per min at 24°C.
- the cooling means avoids deposition of the surface of the second plate exposed to the hot reactor part of the vacuum chamber but also to reduce the parasitic deposition within the gas distribution system, especially if the gases are pre-mixed according to the before described embodiment.
- the channels can be provided in any way known from prior art for dispensing the gas from the gas inlet to the outlet openings, whereby it is especially preferred that the channels are provided as grooves.
- the bores are preferably provided as holes through the first plate, thus allowing an easy manufacturing.
- Fig. 1 shows a gas distribution system according to prior art
- Fig. 2 shows a top view of a binary tree gas distribution system according to a preferred embodiment of the invention
- Fig. 3 shows a side view of the binary tree gas distribution system according to the preferred embodiment of the invention
- Fig. 4a shows gas mixing in a binary tree gas distribution system according to a further preferred embodiment of the invention
- Fig. 4b shows gas mixing in a binary tree gas distribution system according to a further embodiment of the invention
- Fig. 5a shows a side view of the binary tree gas distribution system according to a further embodiment of the invention.
- Fig. 5b shows a top view of the binary tree gas distribution system according to a further embodiment of the invention.
- the current invention composes a new design without using a piping distribution net 3 as shown in prior art Fig. 1.
- the gas distribution is controlled using a so-called binary tree gas distributor plate, i.e. with a second plate 5 as shown in Fig. 2 in a top view.
- the second plate 5 has grooved channels 6a, 6b on both sides, as can be seen in Fig. 3. Each side is designed to transport, split and distribute one “low-reactive” gas A, B or gas mixture from one gas inlet 7 to all outlet openings 8.
- the groove size of the channels 6a, 6b has been selected such that a smooth pressure change within the binary-tree gas distribution system 9 is obtained from the gas inlet 7, e.g. a separate gas inlet 7 for a different gas on each side of the second plate 5, to the 1024 outlet openings 8.
- the second plate 5 having 15mm can be used as gas distributor plate.
- the groove depth are between 3 mm at the entrance close to the gas inlet 7 and 1,5mm where the channels 6a, 6b ends at the outlet openings 8.
- the width of the channel 6a, 6b is reduced from 16mm down to 3mm, resulting in an outlet opening 8 diameter of 2,2mm.
- the gas A, B flows used with such configuration of the second plate 5 are about 1 slm per distributor side, i.e. per side of the second plate 5.
- At least one channel 6a, 6b is located adjacent to another channel 6a, 6b such that gas A, B dispensed from the one channel 6a, 6b into the another channel 6a, 6b is equally split between the two ends of the another channel 6a, 6b.
- the gas distribution system 9 forms a binary tree branching arrangement between the gas inlet 7 and all outlet openings 8.
- Fig. 4a and Fig. 4b For mixing two different gases A, B, two different configurations are possible, as shown in Fig. 4a and Fig. 4b.
- the gases A, B are mixed within a first plate 10 in the outlet opening 8, which is provided as a bore 4, and thereafter injected into a reaction chamber 11 of the vacuum chamber.
- no gas A, B pre-mixing occurs in the gas line or in a gas plenum, e.g. in the reaction chamber 11, which minimizes the parasitic deposition within the plenum.
- the real quantity of injected gas A, B, that is used for the substrate coating, the gas utilization ratio, is thus increased.
- the gas shower plate i.e. the first plate 10, is water cooled by a cooling means 12.
- the first plate 10 and a second plate 5 are mounted together with their flat sides directly contacting each other such that each bore, the outlet opening 8, of the first plate 10 is arranged where a channel 6a, 6b of the second plate 5 ends such that the gas A, B is dispensible through the respective channel 6a, 6b into the outlet opening 8.
- the gas path length between the gas inlet 7 and each outlet opening 8 is the same for all different gas routes within the second plate 5, thus resulting in a uniform gas A, B flow distribution.
- the uniform coating of the substrate can be obtained, when having a uniform substrate temperature as well.
- a variation of 1% of DEZ, dietyhlzinc, flow and 1°C of the substrate temperature may induce a variation of about 6 nm and 25 nm of the thickness coating respectively.
- the configuration shown in Fig. 4a and 4b further exhibit a separation plate 13 provided between the first plate 10 and the second plate 5 as well as a back plate 14 such that the channels 6a, 6b on both sides of the second plate 5 are provided between the second plate 5 and the back plate 14 respectively between the second plate 5 and the separation plate 13.
- the second plate 5 comprises a plurality of second bores 15 such that gas A, B from two channels 6a, 6b of the two sides of the second plate 5 is dispensable into the same bore 4, Fig. 4a, respectively that gas A, B is per side dispensable into a respective bore 4, Fig. 4b.
- Cooling unit 2 Gas shower unit 3 Piping net 4 Bore 5 Second plate 6a, 6b Channel 7 Gas inlet 8 Outlet opening 9 Gas distribution system 10 First plate 11 Reaction chamber 12 Means for cooling 13 Separation plate 14 Back plate 15 Second bores 16 Reference sign 17 Additional groove
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- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
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- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
2 Gas shower unit
3 Piping net
4 Bore
5 Second plate
6a, 6b Channel
7 Gas inlet
8 Outlet opening
9 Gas distribution system
10 First plate
11 Reaction chamber
12 Means for cooling
13 Separation plate
14 Back plate
15 Second bores
16 Reference sign
17 Additional groove
Claims (14)
- A vacuum chamber for accommodating a substrate to be treated in a vacuum process comprising a gas inlet (7) connected to a gas source for receiving gas (A, B) and a gas distribution system (9) for dispensing the gas (A, B) from the gas inlet (7) to a plurality of outlet openings (8) into the vacuum chamber at a plurality of locations towards the substrate, wherebythe gas distribution system (9) comprises a first plate (10) and a second plate (5), each plate having a flat side,the first plate (10) exhibits a plurality of bores (4) forming the outlet openings (8),the second plate (5) exhibits a plurality of channels (6a, 6b) arranged on the flat side,the first plate (10) and the second plate (5) are mounted together with their flat sides directly contacting each other such that each bore (4) of the first plate (10) is arranged where a channel (6a, 6b) of the second plate (5) ends such that gas (A, B) is dispensable through the respective channel (6a, 6b) into the bore (4), andthe individual channels (6a, 6b) merge into at least one common channel (6a, 6b) connected to the gas inlet (7) thus forming a branching arrangement.
- Vacuum chamber according to the preceding claim, whereby the gas distribution system (9) comprises a back plate (14) having a flat side, the second plate (5) exhibits two opposite flat sides and channels (6a, 6b) on the two sides, and the back plate (14) and the second plate (5) are mounted together with their flat sides directly contacting each other such that gas (A, B) is dispensable through the channels (6a, 6b) on the two sides of the second plate (5).
- Vacuum chamber according to the preceding claim, whereby the individual channels (6a, 6b) of the two sides of the second plate (5) per side merge into at least one common channel (6a, 6b) such that gas (A, B) is dispensable to the respective channels (6a, 6b) of each side of the second plate (5).
- Vacuum chamber according to any of the preceding claims 2 or 3, whereby the second plate (5) comprises a plurality of second bores (15) such that gas (A, B) from two channels (6a, 6b) of the two sides of the second plate (5) is dispensable into the same bore (4) forming a common outlet opening (8) for the gas (A, B).
- Vacuum chamber according to any of the preceding claims 2 or 3, whereby the second plate (5) comprises a plurality of second bores (15) each associated to a bore (4) such that gas (A, B) from channels (6a, 6b) of the two sides of the second plate (5) is per side dispensable into a respective bore (4), each forming a separate outlet opening (8) for the respective gas (A, B).
- Vacuum chamber according to any of the preceding claims, whereby the end of at least one channel (6a, 6b) is located adjacent to another channel (6a, 6b) such that gas (A. B) dispensed from the one channel (6a, 6b) into the another channel (6a, 6b) is equally split between the two ends of the another channel (6a, 6b).
- Vacuum chamber according to any of the preceding claims, whereby the channels (6a, 6b) are arranged in a binary tree-manner forming the branching arrangement between the gas inlet (7) and the outlet openings (8) such that gas (A, B) dispensed into the branching arrangement is equally split across all outlet openings (8).
- Vacuum chamber according to any of the preceding claims, whereby the channels (6a, 6b) are provided such that the gas path length is equal between the gas inlet (7) and each outlet opening (8).
- Vacuum chamber according to any of the preceding claims, whereby the channels (6a, 6b) are provided in a narrowing manner between the common channel (6a, 6b) and the end of the respective channel (6a, 6b) located at the bore (4), the common channel (6a, 6b) having a depth of ≤ 3 mm and a width of ≤ 16 mm, the end of the channels (6a, 6b) located at the bore (4) having each a depth of ≤ 1,5 mm and a width of ≤ 3 mm and the bores (4) having each a diameter of ≤ 2,2 mm.
- Vacuum chamber according to any of the preceding claims, whereby the thickness of the second plate (5) is ≤ 15 mm.
- Vacuum chamber according to any of the preceding claims, whereby the channels (6a, 6b) and the bores (4) are provided such that the gas flow from the gas inlet to (7) the outlet openings (8) is ≤ 1 slm per side of the second plate (5).
- Vacuum chamber according to any of the preceding claims, whereby the gas distribution system (9) comprises a means for cooling (12) the second plate (5).
- Vacuum chamber according to any of the preceding claims, whereby the channels (6a, 6b) are provided as grooves.
- Vacuum chamber according to any of the preceding claims, whereby the bores (4) are provided as holes through the first plate (10).
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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KR1020137008449A KR20130103737A (en) | 2010-09-03 | 2011-08-31 | Gas distribution device for vacuum processing equipment |
JP2013526462A JP2013541641A (en) | 2010-09-03 | 2011-08-31 | Gas supply equipment for vacuum process equipment |
CN2011800426193A CN103097575A (en) | 2010-09-03 | 2011-08-31 | Gas distribution device for vacuum processing equipment |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US37988610P | 2010-09-03 | 2010-09-03 | |
US61/379,886 | 2010-09-03 |
Publications (1)
Publication Number | Publication Date |
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WO2012028660A1 true WO2012028660A1 (en) | 2012-03-08 |
Family
ID=44651706
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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PCT/EP2011/065052 WO2012028660A1 (en) | 2010-09-03 | 2011-08-31 | Gas distribution device for vacuum processing equipment |
Country Status (4)
Country | Link |
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JP (1) | JP2013541641A (en) |
KR (1) | KR20130103737A (en) |
CN (1) | CN103097575A (en) |
WO (1) | WO2012028660A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2021078442A1 (en) | 2019-10-24 | 2021-04-29 | Evatec Ag | Vacuum process treatment chamber and method of treating a substrate by means of a vacuum treatment process |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN109960186B (en) * | 2017-12-25 | 2022-01-07 | 紫石能源有限公司 | Control flow processing method and device, electronic equipment and storage medium |
US10829852B2 (en) * | 2018-08-16 | 2020-11-10 | Asm Ip Holding B.V. | Gas distribution device for a wafer processing apparatus |
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DE10045958A1 (en) * | 2000-09-16 | 2002-04-04 | Muegge Electronic Gmbh | Unit introducing gas into and from plasma processing chamber has lines of identical flow resistance connecting between gas connection and chamber |
US20080216747A1 (en) * | 2007-03-05 | 2008-09-11 | Applied Materials, Inc. | Coating Installation And Gas Piping |
EP2067877A1 (en) * | 2007-11-23 | 2009-06-10 | Applied Materials, Inc. | Coating device and method of producing an electrode assembly |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
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US5589002A (en) * | 1994-03-24 | 1996-12-31 | Applied Materials, Inc. | Gas distribution plate for semiconductor wafer processing apparatus with means for inhibiting arcing |
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2011
- 2011-08-31 WO PCT/EP2011/065052 patent/WO2012028660A1/en active Application Filing
- 2011-08-31 KR KR1020137008449A patent/KR20130103737A/en not_active Application Discontinuation
- 2011-08-31 CN CN2011800426193A patent/CN103097575A/en active Pending
- 2011-08-31 JP JP2013526462A patent/JP2013541641A/en not_active Withdrawn
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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DE10045958A1 (en) * | 2000-09-16 | 2002-04-04 | Muegge Electronic Gmbh | Unit introducing gas into and from plasma processing chamber has lines of identical flow resistance connecting between gas connection and chamber |
US20080216747A1 (en) * | 2007-03-05 | 2008-09-11 | Applied Materials, Inc. | Coating Installation And Gas Piping |
EP2067877A1 (en) * | 2007-11-23 | 2009-06-10 | Applied Materials, Inc. | Coating device and method of producing an electrode assembly |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2021078442A1 (en) | 2019-10-24 | 2021-04-29 | Evatec Ag | Vacuum process treatment chamber and method of treating a substrate by means of a vacuum treatment process |
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JP2013541641A (en) | 2013-11-14 |
KR20130103737A (en) | 2013-09-24 |
CN103097575A (en) | 2013-05-08 |
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