WO2011154405A1 - Système laser accordable - Google Patents

Système laser accordable Download PDF

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Publication number
WO2011154405A1
WO2011154405A1 PCT/EP2011/059395 EP2011059395W WO2011154405A1 WO 2011154405 A1 WO2011154405 A1 WO 2011154405A1 EP 2011059395 W EP2011059395 W EP 2011059395W WO 2011154405 A1 WO2011154405 A1 WO 2011154405A1
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WO
WIPO (PCT)
Prior art keywords
laser diode
accordance
laser system
chamber
tunable laser
Prior art date
Application number
PCT/EP2011/059395
Other languages
English (en)
Inventor
Winfried Karl Hensinger
Ben Jacques-Parr
James Mcloughlin
Original Assignee
The University Of Sussex
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by The University Of Sussex filed Critical The University Of Sussex
Publication of WO2011154405A1 publication Critical patent/WO2011154405A1/fr

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/14—External cavity lasers
    • H01S5/141—External cavity lasers using a wavelength selective device, e.g. a grating or etalon
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/0607—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying physical parameters other than the potential of the electrodes, e.g. by an electric or magnetic field, mechanical deformation, pressure, light, temperature
    • H01S5/0612—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying physical parameters other than the potential of the electrodes, e.g. by an electric or magnetic field, mechanical deformation, pressure, light, temperature controlled by temperature
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068—Stabilisation of laser output parameters
    • H01S5/06804—Stabilisation of laser output parameters by monitoring an external parameter, e.g. temperature
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/022—Mountings; Housings
    • H01S5/02218—Material of the housings; Filling of the housings
    • H01S5/0222—Gas-filled housings
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/024—Arrangements for thermal management
    • H01S5/02407—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling
    • H01S5/02415—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling by using a thermo-electric cooler [TEC], e.g. Peltier element
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/14—External cavity lasers
    • H01S5/141—External cavity lasers using a wavelength selective device, e.g. a grating or etalon
    • H01S5/143—Littman-Metcalf configuration, e.g. laser - grating - mirror

Definitions

  • the invention relates to the production of laser light, particularly the production of laser light at variable and selected wavelengths.
  • wavelengths are available. This leaves many gaps in the electromagnetic spectrum that it is often desirable to fill, particularly for scientific research purposes, but also in medical, dentistry and biological applications.
  • a frequency doubling system is commonly used, whereby a non-linear crystal doubles the frequency (halves the wavelength) of the light emitted by a commercially available laser.
  • these systems are complex and expensive and can be unreliable because of the need for near perfect crystal alignment.
  • the wavelength of a laser diode may be varied ("dragged") by adjusting the temperature of a laser diode, for instance by cooling.
  • the amount by which wavelength can be dragged depends on the temperature range achievable and also the emission wavelength; in general diodes emitting at longer wavelengths can be dragged further than diodes emitting at shorter wavelengths.
  • a laser emitting at 805nm could be dragged by 14nm to 791 nm, while a laser emitting at 398nm could be dragged by 3nm to 395nm by cooling to -38°C. It is therefore desirable to vary the operating temperature of the laser diode by around 60°C.
  • a further known method of tuning the wavelength of a laser diode is an external cavity arrangement whereby a diffraction grating reflects a selected frequency of light back into the diode to stimulate the emission of radiation.
  • the diffraction grating is also used to narrow the line-width of the light.
  • Two external cavity configurations are commonly used; the Littrow and the Littman-Metcalf configurations, shown in Figures 1 a and 1 b respectively.
  • the Littrow configuration uses a collimating lens and a diffraction grating as the end mirror to reflect the first order beam back into the laser diode.
  • the emission wavelength can be tuned by rotating the diffraction grating to change the angle of incidence of the light from the laser diode to the grating.
  • thermoelectric cooler thermoelectric cooler
  • the present invention therefore provides a tunable laser system comprising; a sealed chamber, including an optical window, a laser diode located within the chamber and a diffraction grating located outside the chamber, wherein the laser diode, optical window and diffraction grating are arranged such that light emitted from the laser diode can pass through the optical window to the diffraction grating, and wherein a thermal control means is provided to control the temperature of the laser diode, and wherein an atmosphere control means is provided for controlling the moisture content of the atmosphere within the chamber.
  • the laser diode is therefore maintained in a controlled environment; the laser diode may be cooled in order to drag the output wavelength, while the moisture content of the atmosphere in the surrounding chamber may be reduced in order to prevent condensation forming on the optical elements.
  • the volume of the chamber itself may be minimised thus increasing the efficiency of the thermal control means and the atmosphere control means. Optimising the system in this way allows very low temperatures to be reached with a thermoelectric cooling technique.
  • the thermal control means may be a thermo electric cooler (TEC). Electrical cooling is a stable cooling technique because there are no moving parts, the vibrations from which would cause output beam instability.
  • TEC thermo electric cooler
  • the TEC has a hot side and a cool side.
  • the TEC may be arranged such that the cool side is in thermal contact with the laser diode and the hot side is in thermal contact with a heat sink.
  • the heat sink may be of a high thermal mass in relation to the laser diode and thermally conductive to passively dissipate heat from the hot side of the TEC.
  • the heat sink may be provided with fins to assist heat dissipation.
  • the heat sink may form a stable base upon which the optical elements of the system are mounted, including the diffraction grating.
  • the chamber may be in thermal contact with the heat sink. This allows the chamber to remain at room temperature and therefore prevent condensation from forming on the chamber or optical window.
  • the optical window may be provided with an anti-reflective coating to allow selected wavelengths of light to pass.
  • the window may also be mounted at an angle to the light emitted from the laser diode during use, so that reflected light is reflected away from the laser diode.
  • the atmosphere control means may be a dessicant provided in the chamber, or may be an inlet for purging the chamber with a gas, for example nitrogen, or may be a connection to a vacuum system for removing air from the chamber.
  • the diffraction grating may be movable in the direction of the beam emitted at the laser diode when in use in order to vary the external cavity length. In this way the free spectral range of the beam can be controlled.
  • the diffraction grating may be rotatable relative to the beam emitted at the laser diode when in use, thereby forming a Littrow arrangement to tune the emitted radiation wavelength.
  • a rotatable mirror may be provided in combination with the diffraction grating to form a Littman-Metcalf arrangement to tune the emitted radiation wavelength.
  • the laser diode, optical window and diffraction grating are each arranged to be removable and changeable.
  • a bias-t circuit may be provided to modulate the input to the laser diode in order to produce sidebands in the optical output spectrum of the laser diode.
  • a method of operating a tunable laser system of the type described above comprising the steps of heating or cooling the laser diode, adjusting the angular position of the diffraction grating with respect to the direction of light emitted from the laser diode adjusting the position of the diffraction grating in the direction of the light emitted from the laser diode to vary the free spectral range.
  • the method may further comprise the step of removing moisture from the air around the laser diode, by providing a dessicant, and/or purging the air around the laser diode with a gas, and/or evacuating the air from around the laser diode.
  • the input to the laser diode may be modulated with a high frequency component to produce sidebands.
  • a thermally stabilised laser system comprising; a sealed chamber, including an optical window, and a laser diode located within the chamber, wherein the laser diode and optical window are arranged such that light emitted from the laser diode can pass through the optical window, and wherein a thermal control means is provided to control the temperature of the laser diode, and wherein an atmosphere control means is provided for controlling the moisture content of the atmosphere within the chamber.
  • Bias-t circuitry may also be included in this embodiment.
  • Figure 1 (a) is a schematic diagram of a known Littrow configuration.
  • Figure 1 (b) is a schematic diagram of a known Littman-Metcalf configuration.
  • Figure 2 is a perspective view of a tunable laser system of an embodiment of the invention.
  • Figure 3 is a cross sectional view of the laser diode assembly that is enclosed in a chamber of the tunable laser system shown in Figure 2.
  • Figure 4 is a cross sectional view of the chamber of the tunable laser system of
  • Figure 2 including the laser diode assembly of Figure 3.
  • Figure 5 is a perspective view of the base of the tunable laser system shown in Figure 2.
  • Figure 6 is a plan view of the chamber housing of the tunable laser system shown in Figure 2.
  • Figure 7 is a perspective view of the end optics for the tunable laser system of Figure 2, which is set up in a Littrow configuration.
  • Figure 8 is a perspective view of a dessicant cup for retaining a quantity of dessicant in the chamber of the tunable laser system of Figure 2.
  • Figure 9 is a perspective view of the laser diode housing showing a recess for a temperature probe.
  • a tunable laser diode system which uses a combination of thermal tuning and an external cavity.
  • Thermal tuning is by means of thermoelectric cooler (TEC), specifically a Peltier element in thermal contact with the laser diode.
  • TEC thermoelectric cooler
  • the system is particularly suited to providing access to otherwise hard to reach wavelengths, such as 369nm and 399nm.
  • wavelengths such as 369nm and 399nm.
  • Applications for the system include for research purposes, and for medical, dental and biological areas for example.
  • Figure 2 is a view of the exterior of the system, which includes a chamber 201 , a base 202 and a diffraction grating 203 in a Littrow configuration.
  • the chamber 201 is shown in Figure 4.
  • the chamber 201 encloses a laser diode and TEC assembly 301 , shown in cross- section in Figure 3.
  • the assembly 301 includes a housing 302 which is machined from a high thermal conductivity material such as brass.
  • the housing 302 encloses a laser diode 303.
  • the laser diode 303 is a commercially available Fabry-Perot laser diode supplied by Toptica Photonics, for example.
  • the laser diode 303 is removable so that a variety of laser diodes can be used in the system. In this way a broad range of the wavelengths are available.
  • Contact 308 provides electrical power to the laser diode 303.
  • the housing 302 is in good thermal contact with the cold side 304b of a TEC 304.
  • the TEC 304 is a Peltier element, which can be obtained from Radio Spares. It has a maximum power consumption of 16W, a maximum voltage of 12v and maximum current 2.8A and is able to cool the housing 302 to -40°C and up to 80°C. Power is supplied to the TEC 304 by contact 310.
  • Peltier elements are generally not as efficient as other cooling methods such as closed-loop refrigeration systems or cooling directly with liquid nitrogen. However, the vibrations from the mechanical pumps associated with these cooling methods are unacceptable in this optical application.
  • the efficiency of a Peltier element depends, among other factors, on the hot and cold side heat sink performance. For example, minimising the heating of the cold side 304b of the TEC 304, i.e. the laser diode housing 302, by convection and black body radiation reduces the work that the TEC 304 has to do to cool the components. This can be enhanced by reducing the volume of the cavity between the chamber walls 201 and laser diode assembly 301 . Cooling efficiency can also be enhanced by providing an effective heat sink for the hot side 304a, to remove excess heat.
  • a temperature probe is provided to measure the temperature of the housing 302 and laser diode 303. Electrical connection 309 is provided to the temperature probe.
  • the temperature probe is located in a well 901 in the housing 302, as shown in Figure 9.
  • the housing 302 and TEC 304 are held in place on the base 202 by clamp 306. The clamp ensures a good thermal contact between the cool side of the TEC 304 and the housing 302, and the hot side of the TEC 304 and the base 202.
  • a collimating lens 307 is provided in the housing 302 with screw fittings (not shown) which allows adjustable focus.
  • Figure 4 shows the arrangement of the laser diode assembly 301 in the chamber
  • the clamp 306 secures the laser diode assembly 301 to a podium 401 which is an integral part of the base 202.
  • Chamber walls 402 form a shroud over the podium 401 and are secured to the base 202 by bolts 403 and an O-ring seal 404.
  • the O-ring seal provides an air tight joint between the chamber 201 and base 202.
  • the chamber walls 402 have three openings: for electrical feed through; atmosphere control and light passage.
  • Secured to a first opening is a feed-through plate 405, which includes an electrical feed 406 for supplying power to the laser diode 303 and the TEC 304, and also for receiving signals from the temperature probe (not shown).
  • the electrical feed 406 contains an SMA co-axial feed for supplying power to the laser diode power, and a co-axial cable connects the SMA feed to the laser diode.
  • the atmosphere control plate 407 Secured to a second opening is an atmosphere control plate 407 which includes a window 408.
  • An O-ring seal 601 is provided as shown in Figure 6.
  • the atmosphere control plate 407 can be removed to give access to a dessicant cup 409, shown in isolation in Figure 8.
  • the dessicant cup 409 is filled with a dessicant such as molecular sieve.
  • Molecular sieve is made from synthetically produced zeolite structures and is available from, for example, Baltimore Innovations.
  • the dessicant cup 409 includes slots in its base to allow air in the chamber to permeate through the molecular sieve.
  • Cooling of the housing 302 to low temperatures could cause condensation of water vapour out of the air in the chamber 201 onto cooled surfaces, including the collimation lens 307 and the laser diode light emitting face. This condensation would cause unwanted distortion of the emitted beam.
  • the dessicant removes water vapour from the air and therefore prevents condensation.
  • the volume of the cavity in the chamber is minimised to decrease the work of the dessicant.
  • Secured to a third opening is an optical window plate 410, which includes an optical window 41 1 aligned with the output of the laser diode 303.
  • the three plates are secured to the chamber walls 402 with bolts and O-ring seals.
  • the optical window 41 1 is orientated at an angle to the direction of the beam emitted from the laser diode 303.
  • the wavelength emitted by the diode is selected by reflecting the first order back into the diode. However, if any light of a different wavelength is reflected back into the diode it can reduce the efficiency of the desired feedback and may also damage the diode.
  • the optical window is therefore anti-reflection coated to match the desired wavelength so that the required feedback is not reflected away, while unwanted wavelengths are reflected away by the angled optical window 41 1.
  • the optical window 41 1 is therefore
  • the base 202 includes a block 501 which provides a large thermal and physical mass to stabilise the system.
  • the thermal mass is large relative to the cooled housing 302 to dissipate heat from the hot side of the TEC 304.
  • the heat sink effect and passive cooling of the base 202 is enhanced by fins 502.
  • the base 202 has an upper surface 503 which includes a well 504 for receiving the chamber 201 .
  • the chamber is arranged to form a good thermal contact with the base 202 to ensure that the chamber is maintained at the same temperature as the base, i.e. at ambient temperature. This prevents condensation forming on the optical components in contact with the chamber.
  • the podium 401 is formed in the well 504.
  • the base 202 is rectangular when viewed in plan, with the long dimension of the rectangle defining a beam direction.
  • Slotted flanges 506 are provided at both ends of the base to fix the system to a surface, for example an optical table.
  • the well 504 is located towards an end of the base 202. Extending away from the well 504 in the beam direction are a series of end optic locating holes 412. These are arranged in pairs to receive the Littrow mount 413 shown in Figure 7.
  • the end optic locating holes 412 allow the end optics to be positioned at numerous points along the beam direction.
  • the end optics are maintained in the same reference plane as the laser housing 302 and thus the base 202 acts as an optical table, allowing good laser stability.
  • the series of locating holes 412 allows the cavity length to be varied.
  • Varying the cavity length provides a number of advantages, including the ability to balance sideband enhancement, stabilisation of the cavity and sensitivity of tuning. Another advantage is the option to use different output wavelength diodes; the angle a beam is reflected from the diode depends upon wavelength and groove density of the grating. Shorter wavelengths have smaller reflection angles and lower groove densities also result in smaller reflection angles. Where the reflection angle is small the grating needs to be sufficiently far from the laser diode to ensure the chamber does not obstruct the reflected beam.
  • the input power may be modulated with bias-t circuitry, which is known and widely available.
  • Control electronics for this purpose are located close to the laser diode 303, but outside the chamber 201 .
  • a bias-t circuit combines AC and DC currents, and is used to modulate the current supplied to the laser diode 303. This has the effect of producing extra wavelengths, known as frequency sidebands, from the laser diode, where the wavelength of these sidebands is directly related to the frequency of the applied AC signal.
  • the bias-t circuit can provide any modulating frequency.
  • Free spectral range is a measure of the frequencies that can be supported/ are resonant within a cavity. It is the fundamental resonant harmonic of the cavity. It is inversely related to the length of the cavity, and changing the length of the cavity will allow it to resonate with different frequencies.
  • the external cavity length can therefore be adjusted to have a FSR that is common to both the diode laser frequency and the sideband frequency.
  • Free Spectral Range c/(2L) where c is the speed of light and L is the distance between the diode and the grating.
  • the diffraction grating 203 is fixed to the Littrow mount 413, as shown in Figure 7.
  • the Littrow mount 413 includes slots 701 for receiving bolts to secure the mount to the base 202; the slots 701 allow the mount 413 to be positioned continuously along the length of the slots for a given pair of locating holes 412. Therefore the position of the diffraction grating 203 is continuously variable along the top surface of the base in the beam direction.
  • a vertical cantilever 702 is provided with an adjusting screw 703 to adjust the vertical orientation of the beam.
  • a grating mount 704 is secured to the Littrow mount 413.
  • the grating mount 704 is rotatable about axle 708.
  • the grating mount 704 is provided with a horizontal-angle adjustment cantilever slot 705 operated by screw 706 to adjust the orientation of the reflected beam in the horizontal plane, and thereby to adjust the angle of incidence of the beam with respect to the diffraction grating. Fine control of this angle is by piezo adjustment (not shown) to give fine control over the output wavelength.
  • the diffraction grating 203 is fixed to the face of the grating mount 704 with the grooves running vertically.
  • the diffraction grating 203 used in the present embodiment is 15mmx15mm, with 3600 grooves per mm, and is obtainable from NewportTM. It can be seen that the diffraction grating may be removed and replaced, rotated and adjusted easily without interfering with the chamber 201 .
  • the optical components are aligned so that light emitted from the laser diode 303 can pass through the optical window 41 1 to the diffraction grating 203.
  • the stability of the laser diode output can be increased by decreasing the cavity length. This is because any vibration of the end optics will cause deflection of the reflected beam; over a short cavity length this deflection will have less of an effect than it would over a greater cavity length. Conversely, the sensitivity of the wavelength tuning increases with cavity length. This is because the tuning is dependent on the angle of the diffraction grating and therefore the longer the cavity length, the greater will be the displacement of the beam reflected back into the laser diode.
  • a laser diode is selected In dependence on the output wavelength of light required.
  • the laser diode 303 is installed in the housing 302 and the housing and TEC 304 clamped to the podium 401 with clamp 308.
  • the collimation lens 307 is then adjusted to achieve the required focal
  • the chamber 201 is then lowered over the laser diode assembly 301 and bolted to base 202.
  • the electrical feed is then connected and the electrical feed plate 405 bolted on.
  • the dessicant cup 409 is lowered into position in the chamber 201 and the atmosphere control window plate 407 bolted on.
  • a suitable optical window 41 1 is selected and installed in the optical window plate 410, which is then bolted to the chamber 201 .
  • the sealed chamber is then left for a period of time for the dessicant to remove the moisture from the air in the chamber. This can be rapid, and dessication is usually complete by the time the TEC 304 has cooled the laser diode assembly to operating temperature. This set-up may be undertaken by a user or by a service engineer.
  • the sealed dry chamber need not be opened again until the laser diode is changed. All other tuning of the system is undertaken outside the chamber.
  • a suitable diffraction grating 203 is chosen and installed on the Littrow mount 413.
  • the output wavelength is selected by (as well as adjusting the current and the temperature of the diode) adjusting the angular position of the grating 203 relative to the incident beam using screw 706. This can drag the wavelength of the output light by an amount depending on the wavelength of the light; for longer wavelengths this can be by a few nm, for shorter wavelengths in the blue/UV region, around 0.5nm.
  • the diffraction grating is accessible and its angular and lateral position with respect to the beam direction may be adjusted without interfering with the laser diode assembly.
  • the diffraction grating 203 may be changed without having to bring the laser diode up to room temperature or introducing moisture laden ambient air into the chamber.
  • the cavity length may be adjusted without interfering with the chamber assembly.
  • the housing 302 In order to drag the output wavelength further, power is supplied to the TEC 304, so that the housing 302 is cooled. Alternatively the housing 302 may be heated by the TEC. The temperature probe (not shown) feeds back the temperature to a control system. The temperature of the housing 302 may therefore be accurately controlled, and therefore the output wavelength accurately controlled.
  • atmosphere control plate 407 can be removed and a vacuum system attached to the chamber 201 to evacuate the chamber 201 .
  • a nitrogen feed may be attached to the chamber to purge the chamber of air.
  • the end optics may include a rotatable mirror to form a Littman-Metcalf configuration.
  • no end optics are installed.
  • the system can provide temperature stabilised laser diode operation; by monitoring the temperature of the housing 302 with the temperature probe and detecting when the temperature deviates from a predetermined value, the power to the TEC can be adjusted accordingly to maintain a stable laser diode operating temperature.

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)

Abstract

La présente invention a trait à la production de lumière laser, en particulier à la production de lumière laser à des longueurs d'onde variables et sélectionnées. Le système laser accordable comprend une chambre hermétique (201), incluant une fenêtre optique, une diode laser située à l'intérieur de la chambre et un réseau de diffraction situé à l'extérieur de la chambre (203); la diode laser, la fenêtre optique et le réseau de diffraction (203) sont agencés de manière à ce que la lumière émise à partir de la diode laser puisse passer par la fenêtre optique vers le réseau de diffraction (203), un moyen de commande thermique étant prévu de manière à contrôler la température de la diode laser, et un moyen de commande de l'atmosphère étant prévu de manière à contrôler le degré d'humidité de l'atmosphère à l'intérieur de la chambre (201).
PCT/EP2011/059395 2010-06-07 2011-06-07 Système laser accordable WO2011154405A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB1009428.2 2010-06-07
GBGB1009428.2A GB201009428D0 (en) 2010-06-07 2010-06-07 Tunable laser system

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WO2011154405A1 true WO2011154405A1 (fr) 2011-12-15

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US20190393673A1 (en) * 2018-06-21 2019-12-26 Becton, Dickinson And Company Laser assembly
US10844228B2 (en) 2018-03-30 2020-11-24 Becton, Dickinson And Company Water-soluble polymeric dyes having pendant chromophores
US11099066B2 (en) 2018-06-28 2021-08-24 Becton, Dickinson And Company Light detection systems having input and output modulators, and methods of use thereof
WO2022132837A1 (fr) * 2020-12-14 2022-06-23 Cutera, Inc. Systèmes laser dermatologiques et procédés de traitement de tissu avec une faible sélectivité chromophore
CN116077704A (zh) * 2022-10-31 2023-05-09 广东国志激光技术有限公司 一种激光空气消杀腔室及激光空气消杀装置

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