WO2011085731A1 - Materials for photoelectrocatalytic hydrogen production - Google Patents
Materials for photoelectrocatalytic hydrogen production Download PDFInfo
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- WO2011085731A1 WO2011085731A1 PCT/DK2011/050008 DK2011050008W WO2011085731A1 WO 2011085731 A1 WO2011085731 A1 WO 2011085731A1 DK 2011050008 W DK2011050008 W DK 2011050008W WO 2011085731 A1 WO2011085731 A1 WO 2011085731A1
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- hydrogen
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- 239000000463 material Substances 0.000 title claims abstract description 105
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 title claims abstract description 49
- 239000001257 hydrogen Substances 0.000 title claims abstract description 47
- 229910052739 hydrogen Inorganic materials 0.000 title claims abstract description 47
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 20
- 239000010949 copper Substances 0.000 claims abstract description 44
- 239000004065 semiconductor Substances 0.000 claims abstract description 18
- 238000006243 chemical reaction Methods 0.000 claims abstract description 17
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims abstract description 15
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 13
- 239000001301 oxygen Substances 0.000 claims abstract description 13
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 13
- 239000011572 manganese Substances 0.000 claims abstract description 12
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 10
- 239000011651 chromium Substances 0.000 claims abstract description 10
- 229910017052 cobalt Inorganic materials 0.000 claims abstract description 10
- 239000010941 cobalt Substances 0.000 claims abstract description 10
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims abstract description 10
- 239000010955 niobium Substances 0.000 claims abstract description 10
- 239000011669 selenium Substances 0.000 claims abstract description 10
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims abstract description 9
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims abstract description 9
- 239000005864 Sulphur Substances 0.000 claims abstract description 9
- 229910052802 copper Inorganic materials 0.000 claims abstract description 9
- 229910052750 molybdenum Inorganic materials 0.000 claims abstract description 9
- 239000011733 molybdenum Substances 0.000 claims abstract description 9
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 8
- 230000002708 enhancing effect Effects 0.000 claims abstract description 7
- 229910052748 manganese Inorganic materials 0.000 claims abstract description 7
- 229910052723 transition metal Inorganic materials 0.000 claims abstract description 7
- 150000003624 transition metals Chemical class 0.000 claims abstract description 7
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims abstract description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims abstract description 5
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 claims abstract description 5
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims abstract description 5
- 229910052804 chromium Inorganic materials 0.000 claims abstract description 5
- 229910052759 nickel Inorganic materials 0.000 claims abstract description 5
- 229910052758 niobium Inorganic materials 0.000 claims abstract description 5
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims abstract description 5
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 5
- 229910052702 rhenium Inorganic materials 0.000 claims abstract description 5
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 claims abstract description 5
- 229910052711 selenium Inorganic materials 0.000 claims abstract description 5
- 229910052715 tantalum Inorganic materials 0.000 claims abstract description 5
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims abstract description 5
- 229910052714 tellurium Inorganic materials 0.000 claims abstract description 5
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 claims abstract description 5
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims abstract description 5
- 229910052721 tungsten Inorganic materials 0.000 claims abstract description 5
- 239000010937 tungsten Substances 0.000 claims abstract description 5
- 229910015463 Mo3S4 Inorganic materials 0.000 claims description 59
- 239000003446 ligand Substances 0.000 claims description 54
- 238000000034 method Methods 0.000 claims description 28
- 230000002209 hydrophobic effect Effects 0.000 claims description 20
- -1 methylcyclopentadienyl Chemical group 0.000 claims description 19
- 238000000151 deposition Methods 0.000 claims description 10
- 229910052710 silicon Inorganic materials 0.000 claims description 9
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 8
- 238000005266 casting Methods 0.000 claims description 8
- 239000010703 silicon Substances 0.000 claims description 8
- 125000000058 cyclopentadienyl group Chemical group C1(=CC=CC1)* 0.000 claims description 7
- ZSWFCLXCOIISFI-UHFFFAOYSA-N endo-cyclopentadiene Natural products C1C=CC=C1 ZSWFCLXCOIISFI-UHFFFAOYSA-N 0.000 claims description 7
- TXWRERCHRDBNLG-UHFFFAOYSA-N cubane Chemical compound C12C3C4C1C1C4C3C12 TXWRERCHRDBNLG-UHFFFAOYSA-N 0.000 claims description 6
- 230000008021 deposition Effects 0.000 claims description 6
- 239000002086 nanomaterial Substances 0.000 claims description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 abstract description 18
- 239000003054 catalyst Substances 0.000 abstract description 11
- 239000000446 fuel Substances 0.000 abstract description 7
- 239000000126 substance Substances 0.000 abstract description 6
- 229910052697 platinum Inorganic materials 0.000 abstract description 4
- 239000006096 absorbing agent Substances 0.000 abstract description 3
- 150000002431 hydrogen Chemical class 0.000 abstract description 3
- 230000000694 effects Effects 0.000 description 12
- 125000004429 atom Chemical group 0.000 description 11
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 11
- 150000001450 anions Chemical class 0.000 description 10
- 230000008569 process Effects 0.000 description 10
- 238000001228 spectrum Methods 0.000 description 9
- 239000011521 glass Substances 0.000 description 7
- 238000005259 measurement Methods 0.000 description 7
- 235000016768 molybdenum Nutrition 0.000 description 7
- 239000002800 charge carrier Substances 0.000 description 6
- 239000003792 electrolyte Substances 0.000 description 6
- 239000002803 fossil fuel Substances 0.000 description 5
- 238000003306 harvesting Methods 0.000 description 5
- 238000002360 preparation method Methods 0.000 description 5
- 230000002441 reversible effect Effects 0.000 description 5
- QAOWNCQODCNURD-UHFFFAOYSA-L Sulfate Chemical compound [O-]S([O-])(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-L 0.000 description 4
- 238000000708 deep reactive-ion etching Methods 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- JOXIMZWYDAKGHI-UHFFFAOYSA-N toluene-4-sulfonic acid Chemical compound CC1=CC=C(S(O)(=O)=O)C=C1 JOXIMZWYDAKGHI-UHFFFAOYSA-N 0.000 description 4
- RZVAJINKPMORJF-UHFFFAOYSA-N Acetaminophen Chemical compound CC(=O)NC1=CC=C(O)C=C1 RZVAJINKPMORJF-UHFFFAOYSA-N 0.000 description 3
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 3
- 239000004593 Epoxy Substances 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 3
- 235000012721 chromium Nutrition 0.000 description 3
- 229940107218 chromium Drugs 0.000 description 3
- 239000003245 coal Substances 0.000 description 3
- 239000010411 electrocatalyst Substances 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 3
- 229910000372 mercury(II) sulfate Inorganic materials 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 239000003921 oil Substances 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- 239000005297 pyrex Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 2
- 239000011358 absorbing material Substances 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 238000006555 catalytic reaction Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000002860 competitive effect Effects 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 229910000040 hydrogen fluoride Inorganic materials 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 2
- 238000005342 ion exchange Methods 0.000 description 2
- 238000011031 large-scale manufacturing process Methods 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 210000004379 membrane Anatomy 0.000 description 2
- 239000011941 photocatalyst Substances 0.000 description 2
- 239000010948 rhodium Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 238000001429 visible spectrum Methods 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 241000252506 Characiformes Species 0.000 description 1
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 1
- YZCKVEUIGOORGS-IGMARMGPSA-N Protium Chemical compound [1H] YZCKVEUIGOORGS-IGMARMGPSA-N 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000005587 bubbling Effects 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 229940000425 combination drug Drugs 0.000 description 1
- 230000002301 combined effect Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- LBJNMUFDOHXDFG-UHFFFAOYSA-N copper;hydrate Chemical compound O.[Cu].[Cu] LBJNMUFDOHXDFG-UHFFFAOYSA-N 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- 238000004070 electrodeposition Methods 0.000 description 1
- 238000005868 electrolysis reaction Methods 0.000 description 1
- 238000001652 electrophoretic deposition Methods 0.000 description 1
- 239000000374 eutectic mixture Substances 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000003863 metallic catalyst Substances 0.000 description 1
- 239000013580 millipore water Substances 0.000 description 1
- 230000003278 mimic effect Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 230000001699 photocatalysis Effects 0.000 description 1
- 239000003495 polar organic solvent Substances 0.000 description 1
- 230000003334 potential effect Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 238000001878 scanning electron micrograph Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000011877 solvent mixture Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 230000007306 turnover Effects 0.000 description 1
- 238000010792 warming Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J27/00—Catalysts comprising the elements or compounds of halogens, sulfur, selenium, tellurium, phosphorus or nitrogen; Catalysts comprising carbon compounds
- B01J27/02—Sulfur, selenium or tellurium; Compounds thereof
- B01J27/04—Sulfides
- B01J27/047—Sulfides with chromium, molybdenum, tungsten or polonium
- B01J27/049—Sulfides with chromium, molybdenum, tungsten or polonium with iron group metals or platinum group metals
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J27/00—Catalysts comprising the elements or compounds of halogens, sulfur, selenium, tellurium, phosphorus or nitrogen; Catalysts comprising carbon compounds
- B01J27/02—Sulfur, selenium or tellurium; Compounds thereof
- B01J27/04—Sulfides
- B01J27/047—Sulfides with chromium, molybdenum, tungsten or polonium
- B01J27/051—Molybdenum
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J27/00—Catalysts comprising the elements or compounds of halogens, sulfur, selenium, tellurium, phosphorus or nitrogen; Catalysts comprising carbon compounds
- B01J27/02—Sulfur, selenium or tellurium; Compounds thereof
- B01J27/04—Sulfides
- B01J27/047—Sulfides with chromium, molybdenum, tungsten or polonium
- B01J27/051—Molybdenum
- B01J27/0515—Molybdenum with iron group metals or platinum group metals
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J35/00—Catalysts, in general, characterised by their form or physical properties
- B01J35/30—Catalysts, in general, characterised by their form or physical properties characterised by their physical properties
- B01J35/39—Photocatalytic properties
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B3/00—Hydrogen; Gaseous mixtures containing hydrogen; Separation of hydrogen from mixtures containing it; Purification of hydrogen
- C01B3/02—Production of hydrogen or of gaseous mixtures containing a substantial proportion of hydrogen
- C01B3/04—Production of hydrogen or of gaseous mixtures containing a substantial proportion of hydrogen by decomposition of inorganic compounds, e.g. ammonia
- C01B3/042—Decomposition of water
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25B—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES FOR THE PRODUCTION OF COMPOUNDS OR NON-METALS; APPARATUS THEREFOR
- C25B1/00—Electrolytic production of inorganic compounds or non-metals
- C25B1/50—Processes
- C25B1/55—Photoelectrolysis
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25B—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES FOR THE PRODUCTION OF COMPOUNDS OR NON-METALS; APPARATUS THEREFOR
- C25B11/00—Electrodes; Manufacture thereof not otherwise provided for
- C25B11/04—Electrodes; Manufacture thereof not otherwise provided for characterised by the material
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25B—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES FOR THE PRODUCTION OF COMPOUNDS OR NON-METALS; APPARATUS THEREFOR
- C25B11/00—Electrodes; Manufacture thereof not otherwise provided for
- C25B11/04—Electrodes; Manufacture thereof not otherwise provided for characterised by the material
- C25B11/051—Electrodes formed of electrocatalysts on a substrate or carrier
- C25B11/073—Electrodes formed of electrocatalysts on a substrate or carrier characterised by the electrocatalyst material
- C25B11/075—Electrodes formed of electrocatalysts on a substrate or carrier characterised by the electrocatalyst material consisting of a single catalytic element or catalytic compound
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/30—Hydrogen technology
- Y02E60/36—Hydrogen production from non-carbon containing sources, e.g. by water electrolysis
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P20/00—Technologies relating to chemical industry
- Y02P20/10—Process efficiency
- Y02P20/133—Renewable energy sources, e.g. sunlight
Definitions
- the invention relates to the direct conversion of solar energy to chemical fuels, e.g. hydrogen, utilizing a combination of a solar energy absorber with a non-platinum (Pt) hydrogen evolution reaction (HER) catalyst deposited on its surface.
- a solar energy absorber with a non-platinum (Pt) hydrogen evolution reaction (HER) catalyst deposited on its surface.
- HER hydrogen evolution reaction
- the production of hydrogen gas using electrolysis is based on splitting of wa- ter molecules by a two-fold process, where first water is split into oxygen gas (O 2 gas) and protons (H + ) and secondly the protons are reduced to hydrogen gas (H 2 gas) in a hydrogen evolution reaction (HER):
- the hydrogen evolving photocatalyst can absorb visible and/or IR light, thereby utilizing the low energy part of the solar spectrum.
- Oxides have been proposed as light absorbing materials for HER. However, oxides generally have too large band gaps and thus are only able to access the UV portion of the solar spectrum, ultimately limiting their efficiency. Some oxides, such as e.g. copper oxide (Cu 2 O), have shown to be able to work as HER using visible light. However, these oxides are neither active nor stable.
- Si is an interesting candidate as a light absorbing material for HER, as it has a low band gap enabling harvesting of the visible and IR light from the sun. Si is additionally very abundant and thus inexpensive. However, Si alone has a low HER activity, and modification of the material is therefore needed.
- electrocatalysts based on palladium (Pd), ruthenium (Ru), rhodium (Rh), iridium (Ir) or alloys thereof have been suggested.
- Pd palladium
- Ru ruthenium
- Rh rhodium
- Ir iridium
- alloys thereof have been suggested.
- all of these structures are based on rare materials, they too are expensive to produce and the cost of such systems is far too high for large scale production and thus not commercially competitive compared to traditional fuels such as oil and coal.
- a hydrogen evolution reaction (HER) material for photo- electrocatalytic hydrogen production, said HER material comprising a molecular cluster core of the formula L x NyM z , where L is selected from molybde- num (Mo), tungsten (W), tantalum (Ta), rhenium (Re), iron (Fe), nickel (Ni), niobium (Nb), chromium (Cr) and cobalt (Co); N is selected from oxygen (O), nitrogen (N), sulphur (S), selenium (Se) and tellurium (Te) ; M is selected from copper (Cu), cobalt (Co), manganese (Mn), or any other transition metal ; x is an integer selected from 2, 3, 4 and 5; y is an integer selected from 1 , 2, 3, 4 and 5; z is an integer selected from 0, 1 , 2, 3, 4 and 5.
- L is selected from molybde- num (Mo), tungsten (W), tantalum (Ta),
- said HER material is to be positioned on the surface of a photoabsorptive semiconductor having a low band gap, whereby said HER material is enhancing the hydrogen production.
- a low band gap is meant a material with a band gap, which enables harvesting of the visible and I R light from the sun. Normally a band gap of 2.0eV or less is adequate for this.
- the HER material also normally contains hydrophobic ligands, such as e.g. Cp-ligands (cyclopentadienyl ligands or methylcyclopentadienyl ligands). Depending on which ligands are used, the HER process can be enhanced to different degrees.
- the ligands need to be hydrophobic as opposed to hydrophilic.
- Counter anions such as e.g. p- toluenesulfonate, sulfate, or hexafluorophosphate, are also normally present in combination with the HER material. Which of these anions that are present, is a matter of preparation.
- said molecular cluster core of said HER mate- rial is of the formula Mo x S y .
- This is a non-Pt based, i.e. non-precious materials-based system, and is as such inexpensive and viable.
- said molecular cluster core of said HER material is of the formula Mo 3 S 4 .
- said molecular cluster core of said HER material has a cubane cluster core structure, which is advantageous, as the structure is known to be active.
- said molecular cluster core of said HER material is Mo 3 S 4 Cu.
- said HER material further comprises x hydrophobic ligands, where x is said integer selected from 2, 3, 4 and 5. It is thereby obtained that the HER material can be attached to e.g. a Si surface. Using a corresponding cubane cluster with hydrophilic ligands would make this nearly impossible.
- said x hydrophobic ligands are cyclopentadi- enyl ligands or methylcyclopentadienyl ligands. More specifically, in one or more embodiments, said molecular cluster core of said HER material is of the formula Mo 3 S 4 and said hydrophobic ligands are methylcyclopentadienyl ligands. In other embodiments, said molecular cluster core of said HER material is of the formula Mo 3 S 4 Cu and said hydrophobic ligands are methylcy- clopentadienyl ligands.
- a hydrogen evolution reaction (HER) material comprising a molecular cluster core of the formula L x NyM z , where L is selected from molybdenum (Mo), tungsten (W), tantalum (Ta), rhenium (Re), iron (Fe), nickel (Ni), niobium (Nb), chro- mium (Cr) and cobalt (Co); N is selected from oxygen (O), nitrogen (N), sulphur (S), selenium (Se) and tellurium (Te) ; M is selected from copper (Cu), cobalt (Co), manganese (Mn), or any other transition metal ; x is an integer selected from 2, 3, 4 and 5; y is an integer selected from 1 , 2, 3, 4 and 5; z is an integer selected from 0, 1 , 2, 3, 4 and 5; and a photoabsorptive positive type (p-type) semiconductor with a low band gap, where said HER material is positioned
- a low band gap is meant a material with a band gap, which en- ables harvesting of the visible and I R light from the sun. Normally a band gap of 2.0eV or less is adequate for this.
- the HER material also normally contains hydrophobic ligands, such as e.g. Cp-ligands (cyclopentadienyl ligands or methylcyclopentadienyl ligands). Depending on which hydrophobic ligands are used, the HER proc- ess can be enhanced to different degrees.
- the ligands need to be hydrophobic as opposed to hydrophilic.
- Counter anions such as e.g. p-toluenesulfonate, sulfate, or hexafluorophosphate are also normally present in combination with the HER material. Which of these anions that are present, is a matter of preparation.
- a system for hydrogen production with direct utilization of visible solar energy to produce hydrogen through water splitting is based on inexpensive and abundant materials, thereby making it cost-effective and, in combination with an oxygen evolution reaction site, a promising competitor to fossil fuels. Further, the system is typically stable over long time periods during activity measurements, and it does not corrode.
- said HER material is deposited on said surface of said photoabsorptive semiconductor by the method of drop casting, which is a simple, quick and cheap method yielding controllable distribution of the HER material.
- said HER material is deposited on said surface of said photoabsorptive semiconductor by the method of electrophoretic deposition, whereby the concentration and the distribution of the HER material is controllable.
- said photoabsorptive semiconductor is silicon (Si), which is an effective absorber of visible and IR-light. In combination with an oxygen evolution reaction side, which utilizes the ultra violet and the high- energy part of the visible light from the sun, the entire solar spectrum is utilized.
- said Si has a nanostructure or microstructure with a non-planar structure. This gives a significant enhancement of the hydrogen evolution efficiency by enhancing the surface area and making the charge carrier collection and transfer more efficient as compared to planar surfaces.
- said non-planar Si structure is Si pillars.
- Disclosed herein is further a method for hydrogen production, wherein said method comprises the step of illuminating a photoelectrocatalytic cell com- prising a system according to the above with sun light.
- visible and/or infra red light from the sun light is used for illuminating said photoelectrocatalytic cell, whereby direct utilization of visible solar energy to produce hydrogen through water splitting is obtained.
- the method is based on inexpensive and abundant materials, thereby making it cost-effective and, in combination with an oxygen evolution reaction site, a promising competitor to the now used fossil fuels.
- Disclosed herein is also the use of a system according to the above for hydrogen production, whereby direct utilization of visible and infra red solar en- ergy to produce hydrogen through water splitting is obtained.
- the system described above is based on inexpensive and abundant materials, the use of it for hydrogen production produces a cost-effective and, in combination with an oxygen evolution reaction site, a promising competitor to fossil fuels.
- Figure 1 illustrates a cell in which the photoelectrochemical measurements are performed.
- Figure 2a illustrates the principle behind an embodiment of the photoelectro- catalytic system according to the invention.
- Figure 2b illustrates the principle behind an embodiment wherein the photo- e!ectrocatalystic system is embedded in a 'chemical solar cell'.
- Figures 3a-c illustrate scanning electron microscope (SEM) images of an embodiment of the Si pillars according to the invention.
- Figure 4 illustrates an embodiment of the molecular cluster core HER material.
- Figure 5 illustrates the concentration dependence of the HER catalyst shown in figure 4 deposited on planar Si.
- Figure 6 illustrates the HER photocurrent for different Si samples with and without the HER catalyst shown in figure 4.
- Figure 7 illustrates the incident photon to current efficiency (IPCE) for different combinations of Si structures with and without the HER catalyst shown in figure 4.
- Figure 8a and b illustrate another embodiment of the molecular cluster core HER material and the cluster core HER material with ligands, respectively.
- Figure 9 illustrates the HER photocurrent for different Si samples with and without the HER catalyst shown in figure 8.
- Figure 10 illustrates the incident photon to current efficiency (IPCE) for different combinations of Si structures with and without the HER catalyst shown in figure 8.
- Figure 1 1 illustrates the dry etch procedure for processing of Si pillars. Description of preferred embodiments
- FIG. 1 illustrates a pyrex glass cell 100 wherein the photoelectrochemical measurements are normally performed.
- the pyrex glass cell 100 comprises two compartments 102, 104; one for the working electrode 106 and one for the counter electrode 108, separated by a glass frit 1 10.
- a flat surface is created in order to let light pass with minimal scattering.
- the working electrode compartment 102 is connected to a third compartment 1 12, which houses the reference electrode 1 14, Hg/HgS0 4 .
- the counter electrode 108 for all experiments is a platinum (Pt) mesh.
- the electrolyte for all experiments is HCI0 .
- the counter electrode compartment 104 is bubbled with hydrogen 1 16, thereby making it a hydrogen electrode.
- the working electrode 106 is made from silicon (Si).
- the Si can have different nano-structural designs, such as e.g. a planar surface, a pillared or pyramidal surface.
- planar single crystal (100) positive type (p-type) Si electrode can be done by a process, wherein each Si sample is cleaned in an ethanol/Millipore water mixture and subsequently sonicated to remove any possible particulate contamination.
- the Si samples can be cleaned in a Piranha solution of concentrated H 2 S0 4 and 30% H 2 0 2 in a 3:1 mixture.
- the blank Si sample is dipped in a 1 % HF solution in order to etch away the native oxide and hydrogen-terminate the surface.
- an ohmic contact to the unpolished backside of the Si wafer is made by using a gallium indium (Ga-ln) eutectic mixture in the liquid form, which is scratched into the backside of the Si.
- the Ga-ln solution is deposited onto the copper wire coil that is used to make connections through a glass tube making a sealed and enclosed system.
- the Cu wire is glued to the Ga-ln mixture on the backside of the Si with silver paint.
- Hysol 1 C epoxy is used to seal the glass tube to the other components and backside of the sample. It is also used to insulate and protect all the contact components from the electrolyte.
- the epoxy is cured at approximately 80°C. It is important not to get the epoxy on the front side of the sample where eventually the HER material will be deposited.
- High surface area silicon samples as shown in figures 3a-c can be prepared by an advanced dry etch process, which is explained in detail in the description of figure 1 1 . As such, there are no metallic catalysts present at the tips of the pillars as in other processing methods such as vapor-liquid-solid processing (VLSP) of pillars.
- VLSP vapor-liquid-solid processing
- Figure 2a illustrates the principle behind one embodiment of the photoelec- trocatalytic system 200 according to the invention, wherein a HER material 202, e.g. with the molecular cluster core Mo 3 S 4 or Mo 3 S 4 Cu, is deposited on the surface of a Si pillar 204.
- Solar energy 206 is exciting the Si pillar 204, whereby an electron is promoted from the valence to the conduction band creating an electron-hole pair.
- the HER material utilizes the electrons to reduce the protons thereby generating hydrogen gas as shown in the figure.
- the HER material 202 also normally contains hydrophobic ligands, such as e.g. Cp-ligands (cyclopenta- dienyl ligands or methylcyclopentadienyl ligands). Depending on which ligands are used, the HER process can be enhanced to different degrees.
- Counter anions such as e.g. p-toluenesulfonate, sulfate, or hexafluorophos- phate are also normally present in combination with the HER material 202. Which of these anions that are present, is a matter of preparation. The anions can very easily be exchanged by an ion-exchange process. However, it is difficult and time-consuming to exchange the ligands at the metals in the cluster core.
- Figure 2b illustrates the principle behind an embodiment wherein the photo- eiectrocataSystic system is embedded in a 'chemical solar cell'.
- the pillared structure ensures an effective harvesting of the photons and an effective photocurrent collection (by virtue of the length available for absorption com- bined with short, radial, minority carrier transport distances) while also exposing a large surface area for the catalytic reactions.
- the blue part 208 of the solar spectrum is absorbed by an 'oxidizing' photoanode 210 - possibly with a oxygen evolution catalyst 212 - where water is oxidized to release oxygen and protons.
- a HER mate- rial 202 - e.g. with the molecular cluster core Mo 3 S 4 or Mo 3 S 4 Cu with hydrophobic ligands, e.g. cyclopentadienyl ligands or methylcyclopentadienyl ligands - is deposited on the surface of a Si pillar 204.
- the two-photon tandem approach allows access to a larger part of the solar spectrum than single-photon water splitting.
- the two photoanodes are separated by a mem- brane 216.
- Si has a band gap of -1 .1 eV
- low energy illumination such as red light or even infrared light from the sun can be used to excite the charge carriers.
- the minority carriers, i.e. the electrons, generated from this excitation process can be transferred to the HER catalyst enhancing, or rather catalyzing, the reduction of protons to hydrogen.
- SEM scanning electron microscope
- the embodiment of the Si pillars 204 shown in the figures has a diameter of 3 ⁇ and a length of 40-50 ⁇ , which creates a much shorter distance between the charge carrier generation site and the surface of the pillars as compared to planar Si. Hence, there is a larger probability for the charge car- riers to reach a HER material deposited onto the surface of the Si pillars as compared to planar Si.
- the Si pillars 204 shown in figures 3a-c are just one possible example of a diameter-length configuration, and multiple other diameter-length configura- tions, which can show to be more effective, can also be utilized.
- a larger amount of HER material 202 can be deposited on the surface if the length of the pillars 204 is increased or if the density of Si pillars 204 is increased, e.g. by using thinner Si pillars 204.
- the HER efficiency will, as a consequence, depend on the length of the pillars 204, the length-diameter ratio of the pillars 204 and the pattern in which they are arranged on a surface.
- the pattern 300 of the Si pillars displayed in figures 3a-c with empty circles 302, 304 placed in between the Si pillars is arbitrarily chosen.
- a surface with- out the empty circles, with fewer or more circles, or with empty spaces in the shape of squares, triangles or any other type of structure could has been used as an alternative.
- Si silicon
- alternative semiconducting materials with a low band gap of 2.0 eV or less can be used.
- germanium germanium
- InP indium phosphide
- InAs indium arsenide
- GaAs gallium arsenide
- Sn semiconducting compounds with tin
- the HER material 202 also normally contains hydrophobic ligands (not shown in this figure), such as e.g. Cp-ligands (cyclopentadienyl ligands or methylcyclopentadienyl ligands). Depending on which ligands are used, the HER process can be enhanced to different degrees.
- Counter anions such as e.g. p-toluenesulfonate, sulfate, or hexafluorophosphate are also normally present in combination with the HER material 202. Which of these anions that are present, is a matter of preparation. The anions can very easily be exchanged by an ion-exchange process. However, it is difficult and time-consuming to exchange the ligands at the metals in the cluster.
- FIG. 4 An example 400 of a molecular core structure of the HER material Mo 3 S 4 Cu 202 is shown in figure 4, wherein the molybdenum (Mo) atoms are denoted 402, the sulphur (S) atoms 404 and the copper (Cu) atom 406.
- the HER material 202 has a cubane cluster core structure e.g. deposited on the semiconducting material, e.g. the Si pillars.
- the HER material 202 can be electrophoretically deposited onto the pillared Si surface.
- the HER material 202 is electrophoretically deposited onto the pillared Si surface by pressing a silicon electrode against an O-ring sealed opening in an electrochemical cell, where- in 0.25 cm 2 is exposed to the electrolyte.
- a counter electrode is used, wherein the cross section of the counter electrode is parallel to that of the silicon electrode. The distance between the two electrodes is kept at around 4 mm.
- a certain amount, e.g. 0.30 ml, of a HER material solution in a dichloro- methane/methanol solvent mixture, typically a 1 :1 volume mixture, is trans- ferred to the electrochemical cell.
- the silicon electrode and a graphite electrode are connected to the negative and positive terminals of the power supply, respectively, where after a DC of 10 V is applied between the two electrodes for 5 min.
- the HER material 202 can also be deposited onto the Si surface in a number of different ways such as e.g. spin coating, spray coating, drop casting, dip coating, electrochemical deposition, electroless deposition, gas phase deposition, chemical vapour deposition and pulse injection.
- Figure 5 illustrates the concentration dependence of the HER material of figure 4 with the molecular core structure Mo 3 S Cu, which has been electro- phorectically deposited on planar p-type Si 500.
- the concentration of Mo 3 S 4 Cu is 0 ⁇ , 1 ⁇ , 5 ⁇ , 10 ⁇ and 20 ⁇ in the curves 502, 504, 506, 508 and 510, respectively.
- the ligands in this embodiment are methylcy- clopentadienyl.
- FIG. 5 illustrates the optimum concentration of Mo 3 S 4 Cu on planar Si is about 10 ⁇ .
- Figure 6 illustrates the HER photocurrent enhancement 600 of planar Si 602, planar Si with 10 ⁇ of Mo 3 S 4 Cu 604, Si pillars 606 as shown in the SEM images in figures 3a-c and Si pillars with 10 ⁇ of Mo 3 S 4 Cu 608 after illuminating the samples with light having wavelengths above 645 nm obtained from a xenon lamp.
- the ligands in this embodiment are methylcyclopentadi- enyl.
- FIG 6 illustrates the enhancement in activity shown in figure 6 if one configuration where Mo 3 S 4 Cu has been electrophoretically deposited onto the pillared Si surface at a coverage that approximately corresponds to less than one monolayer.
- Other enhancement factors will be observed if different sizes of Si pillars are used, e.g. when changing the diameter and the length of the pillars, or if an entirely different structure forming a non-planar Si surface is used.
- Figure 7 illustrates the incident photon to current efficiency (IPCE) 700 at -0.1 V vs. RHE for planar blank Si (702), planar Si with Mo 3 S 4 Cu (704), blank Si pillars (706), and Si pillars with Mo 3 S 4 Cu (708).
- IPCE incident photon to current efficiency
- the ligands in this embodiment are methylcyclopentadienyl.
- the maximum IPCE obtained is about 4.5 %.
- this can be improved through focused op- timizations of e.g. the deposition procedures of the HER material and the structure of the underlying Si.
- a different example of a molecular core structure of the HER material 800 is the incomplete cubane-like structure Mo 3 S 4 shown in figure 8a and b, wherein the molybdenum (Mo) atoms are denoted 802 and the sulphur (S) atoms 804.
- Mo molybdenum
- S sulphur
- the position of three hydrophobic methylcyclopentadienyl ligands (Cp ligands) 806 attached to the Mo atoms is also shown in figure 8b.
- the HER material 800 is in one embodiment deposited onto the pillared Si surface by drop casting.
- a hydrophobic ligand such as methylcyclopentadienyl as shown in figure 8b
- the HER cubane-like structure be- comes insoluble in water but soluble in polar organic solvents, which is a necessity for obtaining an efficient drop-casting of the material onto the planar Si and the Si pillars.
- Various amounts of Mo 3 S 4 cluster were drop-casted onto the planar Si and the Si pillars and a concentration of 2 nmol was found to be optimal.
- X-ray photoelectron spectroscopy has shown that the Mo 3 S 4 clusters are deposited on the Si surface in a concentration of 2.6 x 1 0 13 Mo 3 S 4 clusters/cm 2 . This implies that most of the deposited clusters are lost into the electrolyte. Since pulling the sample out of the electrolyte in inert gas does not change the activity, 2.6 x 1 0 13 Mo 3 S 4 clusters/cm 2 is also the area density of the Mo 3 S 4 clusters during measurements.
- Figure 9 illustrates the HER photocurrent enhancement 900 of planar Si 902, planar Si with 2 nM of Mo 3 S 4 904, Si pillars 906 and Si pillars with 2 nM of Mo 3 S 4 908 after illuminating the samples with light having wavelengths above 645 nm obtained from a xenon lamp.
- the ligands in this embodiment are me- thylcyclopentadienyl as shown in figure 8b.
- the HER material has been deposited on the Si surfaces by us of the drop casting method.
- this rate of hydrogen evolution at the reversible potential corresponds to a turnover frequency (TOF) of 960 sec "1 for the Mo 3 S 4 modified planar Si surface.
- TOF turnover frequency
- the blank Si pillars 906 are considerably improved relative to planar Si.
- the limiting current density of the pillar electrode 906 is below 16 mA/cm 2 at an over potential larger than -1 V, corresponding to an IPCE of 93%. This is 33% higher than that of the planar Si 902.
- Figure 9 also shows that the Si pillars with Mo 3 S 4 cluster 908 have better activity than the planer Si with Mo 3 S 4 cluster 904, although the gain is modest near the onset potential 912. More importantly, the pillar structure increases the limiting current (and IPCE) significantly. For high-quality single-crystal Si samples at low over potential, not much is gained by using Si pillars as opposed to planar Si surfaces, except for a lower reflectance loss. However, in a cheap gas-phase grown system, where the minority carrier lifetime would be much lower, pillars would be crucial for success.
- FIG. 10 illustrates the incident photon to current efficiency (IPCE) 1000 at 0 V vs. RHE for planar blank Si (1002), planar Si with Mo 3 S 4 (1004), blank Si pillars (1006), and Si pillars with Mo 3 S 4 (1008).
- the ligands in this embodiment are methylcyclopentadienyl as shown in figure 8b.
- the figure highlights the results seen in figure 9, emphasizing the significant increase in IPCE obtainable when depositing the hydrophobic Mo 3 S 4 onto Si surfaces by drop casting.
- the maximum IPCE obtained is 55 % and is observed at 0 V vs. RHE for Si pillars with Mo 3 S 4 .
- Figure 1 1 illustrates the dry etch procedure 1 100 for processing of the Si pillars, shown in detail in figures 3a-c.
- This procedure is step wise, where the first step 1 102 is a 30 sec buffered hydrogen fluoride (BHF) etch followed by, in the second step, 1 104 deposition of 2.2 ⁇ of the photoresist AZ-5214E.
- the Si is exposed to UV-light for 5s through a honeycomb pattern mask.
- the Si is 1 108 firstly baked at 120°C for 120s and secondly flood exposed for 30s.
- the photoresist is developed for 80s in an aqueous solution of the developer AZ 351 .
- working electrode e.g. Si electrode
- HER material e.g. Mo 3 S 4 Cu or Mo 3 S 4
- IPCE incident photon to current efficiency
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Abstract
The invention relates to the direct conversion of solar energy to chemical fuels, e.g. hydrogen, utilizing a combination of a visible and/or infrared light absorber with a non-platinum (Pt) hydrogen evolution reaction (HER) catalyst deposited on its surface. The invention discloses a hydrogen evolution reaction (HER) material comprising a molecular cluster core of the formula LxNyMz, where L is selected from molybdenum (Mo), tungsten (W), tantalum (Ta), rhenium (Re), iron (Fe), nickel (Ni), niobium (Nb), chromium (Cr) and cobalt (Co); N is selected from oxygen (O), nitrogen (N), sulphur (S), selenium (Se) and tellurium (Te); M is selected from copper (Cu), cobalt (Co), manganese (Mn), or any other transition metal; x is an integer selected from 2, 3, 4 and 5; y is an integer selected from 1, 2, 3, 4 and 5; z is an integer selected from 0, 1, 2, 3, 4 and 5. The invention further discloses a system comprising said HER material and a photoabsorptive positive type (p-type) semiconductor with a low band gap, where said HER material is positioned on the surface of said photoabsorptive semiconductor, thereby enhancing the hydrogen production.
Description
Materials for photoelectrocatalytic hydrogen production
The invention relates to the direct conversion of solar energy to chemical fuels, e.g. hydrogen, utilizing a combination of a solar energy absorber with a non-platinum (Pt) hydrogen evolution reaction (HER) catalyst deposited on its surface.
Background
The consequences of the ongoing global warming has increased the focus on exploiting alternative energy sources in order to reduce the use of fossil fuels such as oil or coal as the main fuel sources. It is thus desirable to mimic Nature's utilization of the solar energy by directly converting solar energy to chemical fuels such as hydrogen gas (H2 gas).
One of the main requirements when creating artificial systems for hydrogen production is that materials involved are cost-effective materials capable of absorbing sun light, i.e. ultra violet (UV), visible light and near infra red (IR) light efficiently.
The production of hydrogen gas using electrolysis is based on splitting of wa- ter molecules by a two-fold process, where first water is split into oxygen gas (O2 gas) and protons (H+) and secondly the protons are reduced to hydrogen gas (H2 gas) in a hydrogen evolution reaction (HER):
2H 0 solarenergy ? ^ + + ^ solar energy , HER ? 2fJ ^ + ^
The process of splitting water requires photons with a Gibbs free energy of AG = 1 .23eV (1008nm). However, due to various loss mechanisms this value should be closer to about 2eV (620nm) for practical application. Thus, photons from the high energy part of the visible spectrum extending to the ultra violet (UV) part can be used for this reaction, if only one photon is used for each transferred electron. In order to fully take advantage of the entire solar
spectrum, it would be advantageous to split the reaction up and also utilize the low energy part of the visible spectrum and the IR part, thereby making it a two-photon process. Focusing on the HER, the requirements for materials are among other things that they are stable, do not corrode and are cost-effective. It is further advantageous if the hydrogen evolving photocatalyst can absorb visible and/or IR light, thereby utilizing the low energy part of the solar spectrum. Oxides have been proposed as light absorbing materials for HER. However, oxides generally have too large band gaps and thus are only able to access the UV portion of the solar spectrum, ultimately limiting their efficiency. Some oxides, such as e.g. copper oxide (Cu2O), have shown to be able to work as HER using visible light. However, these oxides are neither active nor stable.
Silicon (Si) is an interesting candidate as a light absorbing material for HER, as it has a low band gap enabling harvesting of the visible and IR light from the sun. Si is additionally very abundant and thus inexpensive. However, Si alone has a low HER activity, and modification of the material is therefore needed.
Examples of hydrogen evolving photocatalyst, where platinum-based (Pt- based) structures are employed as electrocatalyst on Si, have been demonstrated. However, Pt is an expensive and rare material and the cost of such systems is far too high for large scale production. Hydrogen gas produced by Pt-based photoelectrocatalytic systems will thus not be a commercially viable and competitive fuel when compared to traditional fuels such as oil and coal.
As alternatives to Pt-based structures employed as electrocatalysts on Si, electrocatalysts based on palladium (Pd), ruthenium (Ru), rhodium (Rh), iridium (Ir) or alloys thereof have been suggested. However, as all of these
structures are based on rare materials, they too are expensive to produce and the cost of such systems is far too high for large scale production and thus not commercially competitive compared to traditional fuels such as oil and coal.
Description of the invention
Disclosed herein is a hydrogen evolution reaction (HER) material for photo- electrocatalytic hydrogen production, said HER material comprising a molecular cluster core of the formula LxNyMz, where L is selected from molybde- num (Mo), tungsten (W), tantalum (Ta), rhenium (Re), iron (Fe), nickel (Ni), niobium (Nb), chromium (Cr) and cobalt (Co); N is selected from oxygen (O), nitrogen (N), sulphur (S), selenium (Se) and tellurium (Te) ; M is selected from copper (Cu), cobalt (Co), manganese (Mn), or any other transition metal ; x is an integer selected from 2, 3, 4 and 5; y is an integer selected from 1 , 2, 3, 4 and 5; z is an integer selected from 0, 1 , 2, 3, 4 and 5. Further, said HER material is to be positioned on the surface of a photoabsorptive semiconductor having a low band gap, whereby said HER material is enhancing the hydrogen production. By the term a low band gap is meant a material with a band gap, which enables harvesting of the visible and I R light from the sun. Normally a band gap of 2.0eV or less is adequate for this. In combination with the molecular cluster core, the HER material also normally contains hydrophobic ligands, such as e.g. Cp-ligands (cyclopentadienyl ligands or methylcyclopentadienyl ligands). Depending on which ligands are used, the HER process can be enhanced to different degrees. In order to be able to attach the HER material to the photoabsorptive positive type (p-type) semiconductor, the ligands need to be hydrophobic as opposed to hydrophilic. Counter anions, such as e.g. p- toluenesulfonate, sulfate, or hexafluorophosphate, are also normally present in combination with the HER material. Which of these anions that are present, is a matter of preparation.
By the above is obtained a photoelectrocatalytic material for hydrogen production with direct utilization of visible/infra red (IR) solar energy to produce hydrogen through water splitting. The material is inexpensive and abundant, thereby making it cost-effective and, in combination with an oxygen evolution reaction site, a promising competitor to fossil fuels. Further, the system is stable over long time periods during activity measurements, and it does not corrode. In one or more embodiments, said molecular cluster core of said HER material has an incomplete cubane cluster core structure, which is advantageous, as the structure is known to be active.
In one or more embodiments, said molecular cluster core of said HER mate- rial is of the formula MoxSy. This is a non-Pt based, i.e. non-precious materials-based system, and is as such inexpensive and viable. In one or more embodiments, said molecular cluster core of said HER material is of the formula Mo3S4. In one or more embodiments, said molecular cluster core of said HER material has a cubane cluster core structure, which is advantageous, as the structure is known to be active.
In one or more embodiments, said molecular cluster core of said HER mate- rial is of the formula MoxSyMz, where M = Cu, Co, Mn, or any other transition metal. This is a non-Pt based, i.e. non-precious materials-based system, and is as such inexpensive and viable. In one or more embodiments, said molecular cluster core of said HER material is Mo3S4Cu. In one or more embodiments, said HER material further comprises x hydrophobic ligands, where x is said integer selected from 2, 3, 4 and 5. It is
thereby obtained that the HER material can be attached to e.g. a Si surface. Using a corresponding cubane cluster with hydrophilic ligands would make this nearly impossible.
In one or more embodiments, said x hydrophobic ligands are cyclopentadi- enyl ligands or methylcyclopentadienyl ligands. More specifically, in one or more embodiments, said molecular cluster core of said HER material is of the formula Mo3S4 and said hydrophobic ligands are methylcyclopentadienyl ligands. In other embodiments, said molecular cluster core of said HER material is of the formula Mo3S4Cu and said hydrophobic ligands are methylcy- clopentadienyl ligands.
Disclosed herein is also a system for hydrogen production comprising a hydrogen evolution reaction (HER) material comprising a molecular cluster core of the formula LxNyMz, where L is selected from molybdenum (Mo), tungsten (W), tantalum (Ta), rhenium (Re), iron (Fe), nickel (Ni), niobium (Nb), chro- mium (Cr) and cobalt (Co); N is selected from oxygen (O), nitrogen (N), sulphur (S), selenium (Se) and tellurium (Te) ; M is selected from copper (Cu), cobalt (Co), manganese (Mn), or any other transition metal ; x is an integer selected from 2, 3, 4 and 5; y is an integer selected from 1 , 2, 3, 4 and 5; z is an integer selected from 0, 1 , 2, 3, 4 and 5; and a photoabsorptive positive type (p-type) semiconductor with a low band gap, where said HER material is positioned on the surface of said photoabsorptive semiconductor, thereby enhancing the hydrogen production.
By the term a low band gap is meant a material with a band gap, which en- ables harvesting of the visible and I R light from the sun. Normally a band gap of 2.0eV or less is adequate for this. In combination with the molecular cluster core, the HER material also normally contains hydrophobic ligands, such as e.g. Cp-ligands (cyclopentadienyl ligands or methylcyclopentadienyl ligands). Depending on which hydrophobic ligands are used, the HER proc-
ess can be enhanced to different degrees. In order to be able to attach the HER material to the photoabsorptive positive type (p-type) semiconductor, the ligands need to be hydrophobic as opposed to hydrophilic. Counter anions such as e.g. p-toluenesulfonate, sulfate, or hexafluorophosphate are also normally present in combination with the HER material. Which of these anions that are present, is a matter of preparation.
By the above is obtained a system for hydrogen production with direct utilization of visible solar energy to produce hydrogen through water splitting. The system is based on inexpensive and abundant materials, thereby making it cost-effective and, in combination with an oxygen evolution reaction site, a promising competitor to fossil fuels. Further, the system is typically stable over long time periods during activity measurements, and it does not corrode. In one or more embodiments said HER material is deposited on said surface of said photoabsorptive semiconductor by the method of drop casting, which is a simple, quick and cheap method yielding controllable distribution of the HER material. In one or more embodiments said HER material is deposited on said surface of said photoabsorptive semiconductor by the method of electrophoretic deposition, whereby the concentration and the distribution of the HER material is controllable. In one or more embodiments, said photoabsorptive semiconductor is silicon (Si), which is an effective absorber of visible and IR-light. In combination with an oxygen evolution reaction side, which utilizes the ultra violet and the high- energy part of the visible light from the sun, the entire solar spectrum is utilized.
In one or more embodiments, said Si has a nanostructure or microstructure with a non-planar structure. This gives a significant enhancement of the hydrogen evolution efficiency by enhancing the surface area and making the charge carrier collection and transfer more efficient as compared to planar surfaces. In one or more embodiments, said non-planar Si structure is Si pillars.
Disclosed herein is further a method for hydrogen production, wherein said method comprises the step of illuminating a photoelectrocatalytic cell com- prising a system according to the above with sun light. In one embodiment, visible and/or infra red light from the sun light is used for illuminating said photoelectrocatalytic cell, whereby direct utilization of visible solar energy to produce hydrogen through water splitting is obtained. The method is based on inexpensive and abundant materials, thereby making it cost-effective and, in combination with an oxygen evolution reaction site, a promising competitor to the now used fossil fuels.
Disclosed herein is also the use of a system according to the above for hydrogen production, whereby direct utilization of visible and infra red solar en- ergy to produce hydrogen through water splitting is obtained. As the system described above is based on inexpensive and abundant materials, the use of it for hydrogen production produces a cost-effective and, in combination with an oxygen evolution reaction site, a promising competitor to fossil fuels. Brief description of the drawings
Figure 1 illustrates a cell in which the photoelectrochemical measurements are performed.
Figure 2a illustrates the principle behind an embodiment of the photoelectro- catalytic system according to the invention.
Figure 2b illustrates the principle behind an embodiment wherein the photo- e!ectrocatalystic system is embedded in a 'chemical solar cell'.
Figures 3a-c illustrate scanning electron microscope (SEM) images of an embodiment of the Si pillars according to the invention.
Figure 4 illustrates an embodiment of the molecular cluster core HER material. Figure 5 illustrates the concentration dependence of the HER catalyst shown in figure 4 deposited on planar Si.
Figure 6 illustrates the HER photocurrent for different Si samples with and without the HER catalyst shown in figure 4.
Figure 7 illustrates the incident photon to current efficiency (IPCE) for different combinations of Si structures with and without the HER catalyst shown in figure 4. Figure 8a and b illustrate another embodiment of the molecular cluster core HER material and the cluster core HER material with ligands, respectively.
Figure 9 illustrates the HER photocurrent for different Si samples with and without the HER catalyst shown in figure 8.
Figure 10 illustrates the incident photon to current efficiency (IPCE) for different combinations of Si structures with and without the HER catalyst shown in figure 8. Figure 1 1 illustrates the dry etch procedure for processing of Si pillars.
Description of preferred embodiments
Figure 1 illustrates a pyrex glass cell 100 wherein the photoelectrochemical measurements are normally performed. The pyrex glass cell 100 comprises two compartments 102, 104; one for the working electrode 106 and one for the counter electrode 108, separated by a glass frit 1 10. In the working electrode compartment 102, a flat surface is created in order to let light pass with minimal scattering. The working electrode compartment 102 is connected to a third compartment 1 12, which houses the reference electrode 1 14, Hg/HgS04. The counter electrode 108 for all experiments is a platinum (Pt) mesh. The electrolyte for all experiments is HCI0 . The counter electrode compartment 104 is bubbled with hydrogen 1 16, thereby making it a hydrogen electrode. This additionally creates a lower overall cell potential, since the Pt counter electrode 108 only needs to oxidize hydrogen, not water. The working electrode compartment 102 is bubbled with Argon. For all experi- ments the Hg/HgS04 potential is calibrated against a RHE (reversible hydrogen electrode). Alternatively, the measurements can be done in other electrolytes, e.g. H2S04, with other reference electrodes and another cell configuration. In a preferred embodiment of the invention, the working electrode 106 is made from silicon (Si). The Si can have different nano-structural designs, such as e.g. a planar surface, a pillared or pyramidal surface. The preparation of a planar single crystal (100) positive type (p-type) Si electrode can be done by a process, wherein each Si sample is cleaned in an ethanol/Millipore water mixture and subsequently sonicated to remove any possible particulate contamination. Alternatively, the Si samples can be cleaned in a Piranha solution of concentrated H2S04 and 30% H202 in a 3:1 mixture.
Following a water rinse, the blank Si sample is dipped in a 1 % HF solution in order to etch away the native oxide and hydrogen-terminate the surface. After this step, an ohmic contact to the unpolished backside of the Si wafer is
made by using a gallium indium (Ga-ln) eutectic mixture in the liquid form, which is scratched into the backside of the Si. The Ga-ln solution is deposited onto the copper wire coil that is used to make connections through a glass tube making a sealed and enclosed system. The Cu wire is glued to the Ga-ln mixture on the backside of the Si with silver paint. After these components have dried, Hysol 1 C epoxy is used to seal the glass tube to the other components and backside of the sample. It is also used to insulate and protect all the contact components from the electrolyte. The epoxy is cured at approximately 80°C. It is important not to get the epoxy on the front side of the sample where eventually the HER material will be deposited.
High surface area silicon samples as shown in figures 3a-c can be prepared by an advanced dry etch process, which is explained in detail in the description of figure 1 1 . As such, there are no metallic catalysts present at the tips of the pillars as in other processing methods such as vapor-liquid-solid processing (VLSP) of pillars.
Figure 2a illustrates the principle behind one embodiment of the photoelec- trocatalytic system 200 according to the invention, wherein a HER material 202, e.g. with the molecular cluster core Mo3S4 or Mo3S4Cu, is deposited on the surface of a Si pillar 204. Solar energy 206 is exciting the Si pillar 204, whereby an electron is promoted from the valence to the conduction band creating an electron-hole pair. The HER material utilizes the electrons to reduce the protons thereby generating hydrogen gas as shown in the figure.
In combination with the molecular cluster core, the HER material 202 also normally contains hydrophobic ligands, such as e.g. Cp-ligands (cyclopenta- dienyl ligands or methylcyclopentadienyl ligands). Depending on which ligands are used, the HER process can be enhanced to different degrees. Counter anions such as e.g. p-toluenesulfonate, sulfate, or hexafluorophos- phate are also normally present in combination with the HER material 202.
Which of these anions that are present, is a matter of preparation. The anions can very easily be exchanged by an ion-exchange process. However, it is difficult and time-consuming to exchange the ligands at the metals in the cluster core.
Figure 2b illustrates the principle behind an embodiment wherein the photo- eiectrocataSystic system is embedded in a 'chemical solar cell'. The pillared structure ensures an effective harvesting of the photons and an effective photocurrent collection (by virtue of the length available for absorption com- bined with short, radial, minority carrier transport distances) while also exposing a large surface area for the catalytic reactions. In the 'chemical solar cell' the blue part 208 of the solar spectrum is absorbed by an 'oxidizing' photoanode 210 - possibly with a oxygen evolution catalyst 212 - where water is oxidized to release oxygen and protons.
The red part of the solar spectrum 214, unabsorbed by the large band-gap photoanode 210, passes through to be absorbed by the 'reducing' photo- cathode 204 where protons are reduced to evolve hydrogen. In this embodiment of the 'reducing' photocathode according to this invention, a HER mate- rial 202 - e.g. with the molecular cluster core Mo3S4 or Mo3S4Cu with hydrophobic ligands, e.g. cyclopentadienyl ligands or methylcyclopentadienyl ligands - is deposited on the surface of a Si pillar 204. The two-photon tandem approach allows access to a larger part of the solar spectrum than single-photon water splitting. The two photoanodes are separated by a mem- brane 216.
Since Si has a band gap of -1 .1 eV, low energy illumination such as red light or even infrared light from the sun can be used to excite the charge carriers. Subsequently, the minority carriers, i.e. the electrons, generated from this excitation process can be transferred to the HER catalyst enhancing, or rather catalyzing, the reduction of protons to hydrogen.
An example of the blank Si pillars 204 is shown in scanning electron microscope (SEM) images in figures 3a-c. The pillars are normally of the p-type. Figure 3c is a zoom of figure 3b, which again is a zoom of figure 3a showing the Si pillars 204 and the geometrical structure in which they are arranged. The embodiment of the Si pillars 204 shown in the figures has a diameter of 3 μιτι and a length of 40-50 μιτι, which creates a much shorter distance between the charge carrier generation site and the surface of the pillars as compared to planar Si. Hence, there is a larger probability for the charge car- riers to reach a HER material deposited onto the surface of the Si pillars as compared to planar Si.
The Si pillars 204 shown in figures 3a-c are just one possible example of a diameter-length configuration, and multiple other diameter-length configura- tions, which can show to be more effective, can also be utilized. Generally, a larger amount of HER material 202 can be deposited on the surface if the length of the pillars 204 is increased or if the density of Si pillars 204 is increased, e.g. by using thinner Si pillars 204. The HER efficiency will, as a consequence, depend on the length of the pillars 204, the length-diameter ratio of the pillars 204 and the pattern in which they are arranged on a surface.
The pattern 300 of the Si pillars displayed in figures 3a-c with empty circles 302, 304 placed in between the Si pillars is arbitrarily chosen. A surface with- out the empty circles, with fewer or more circles, or with empty spaces in the shape of squares, triangles or any other type of structure could has been used as an alternative.
Besides round Si pillars as shown in figures 3a-c, different geometrical struc- tures of the Si can be used. These include flat surfaces, hollow tubes, circular dots, oval tubes, triangular shaped tubes, and the like.
Also, instead of Si, alternative semiconducting materials with a low band gap of 2.0 eV or less can be used. Some examples of such materials are germanium (Ge), indium phosphide (InP), indium arsenide (InAs), gallium arsenide (GaAs) and semiconducting compounds with tin (Sn), which are all known to be able to harvest the visible and the I R light from sun.
The HER material 202 can in general be described as material with a molecular cluster core with a structure of the type LxNyMz, where L = molybde- num (Mo), tungsten (W), tantalum (Ta), rhenium (Re), iron (Fe), nickel (Ni), niobium (Nb), chromium (Cr) and cobalt (Co); N = oxygen (O), nitrogen (N), sulphur (S), selenium (Se) and tellurium (Te) ; M = copper (Cu), cobalt (Co), manganese (Mn), or any other transition metal ; and x is an integer between 2-5, y is integers between 0-5, and z is an integer between 0-5. In combina- tion with the molecular cluster core, the HER material 202 also normally contains hydrophobic ligands (not shown in this figure), such as e.g. Cp-ligands (cyclopentadienyl ligands or methylcyclopentadienyl ligands). Depending on which ligands are used, the HER process can be enhanced to different degrees. Counter anions such as e.g. p-toluenesulfonate, sulfate, or hexafluorophosphate are also normally present in combination with the HER material 202. Which of these anions that are present, is a matter of preparation. The anions can very easily be exchanged by an ion-exchange process. However, it is difficult and time-consuming to exchange the ligands at the metals in the cluster.
An example 400 of a molecular core structure of the HER material Mo3S4Cu 202 is shown in figure 4, wherein the molybdenum (Mo) atoms are denoted 402, the sulphur (S) atoms 404 and the copper (Cu) atom 406. Normally, the HER material 202 has a cubane cluster core structure e.g. deposited on the semiconducting material, e.g. the Si pillars.
The HER material 202 can be electrophoretically deposited onto the pillared Si surface. In one embodiment of the invention, the HER material 202 is electrophoretically deposited onto the pillared Si surface by pressing a silicon electrode against an O-ring sealed opening in an electrochemical cell, where- in 0.25 cm2 is exposed to the electrolyte. A counter electrode is used, wherein the cross section of the counter electrode is parallel to that of the silicon electrode. The distance between the two electrodes is kept at around 4 mm. A certain amount, e.g. 0.30 ml, of a HER material solution in a dichloro- methane/methanol solvent mixture, typically a 1 :1 volume mixture, is trans- ferred to the electrochemical cell. The silicon electrode and a graphite electrode are connected to the negative and positive terminals of the power supply, respectively, where after a DC of 10 V is applied between the two electrodes for 5 min. The HER material 202 can also be deposited onto the Si surface in a number of different ways such as e.g. spin coating, spray coating, drop casting, dip coating, electrochemical deposition, electroless deposition, gas phase deposition, chemical vapour deposition and pulse injection. Figure 5 illustrates the concentration dependence of the HER material of figure 4 with the molecular core structure Mo3S Cu, which has been electro- phorectically deposited on planar p-type Si 500. The concentration of Mo3S4Cu is 0 μΜ, 1 μΜ, 5 μΜ, 10 μΜ and 20 μΜ in the curves 502, 504, 506, 508 and 510, respectively. The ligands in this embodiment are methylcy- clopentadienyl.
As can be seen from figure 5, the optimum concentration of Mo3S4Cu on planar Si is about 10 μΜ. Figure 6 illustrates the HER photocurrent enhancement 600 of planar Si 602, planar Si with 10 μΜ of Mo3S4Cu 604, Si pillars 606 as shown in the SEM
images in figures 3a-c and Si pillars with 10 μΜ of Mo3S4Cu 608 after illuminating the samples with light having wavelengths above 645 nm obtained from a xenon lamp. The ligands in this embodiment are methylcyclopentadi- enyl.
By using the type of blank Si pillars 204 shown in figures 3a-c, a surface area enhancement of a factor of 6 is observed compared to blank planar Si, where the comparison is made between the curves 606 and 602. However, the photocatalytic HER activity is enhanced by a factor of 50 when changing from blank planar Si 602 to blank Si pillars 606.
Depositing 10 μΜ of the HER material with the molecular core structure Mo3S4Cu onto the Si pillars further increases the efficiency by a factor of 4 compared to the activity of the blank Si pillars, where the comparison is made between the curves 608 and 606. Hence, in total there is an activity enhancement of 200 when using Si pillars with Mo3S Cu compared to the efficiency of the planar Si surface, where the comparison is made between the curves 608 and 602. All the enhancement factors are for a photon to electron efficiency at 0.1 V bias. However, even at zero V. i.e., no applied over poten- tial, it can bee seen from figure 6 that there is a significant current per area of about 1 .5mA/cm2.
The significant enhancement in activity observed upon comparing planar blank Si 602 to Si pillars with Mo3S4Cu deposited on 608 does not seem to be solely due to an enhancement in the surface area of Si, since this only corresponds to a factor of 15. In other words, the surface area enhancement factor of 15 cannot alone explain the activity being increased by a factor of 200. One explanation is that there is an enhanced charge carrier capture, i.e. a lower recombination loss and a lower reflection loss. In other words, the
charge carriers in the planar Si compared to the Si pillars must travel too far before they can reach the surface and be transferred to a HER catalyst. During that distance they can be scattered or recombined. Thus, factors such as charge transfer and transport are significantly affected by the change in Si geometry.
Note that the enhancement in activity shown in figure 6 is for one configuration where Mo3S4Cu has been electrophoretically deposited onto the pillared Si surface at a coverage that approximately corresponds to less than one monolayer. Other enhancement factors will be observed if different sizes of Si pillars are used, e.g. when changing the diameter and the length of the pillars, or if an entirely different structure forming a non-planar Si surface is used. Figure 7 illustrates the incident photon to current efficiency (IPCE) 700 at -0.1 V vs. RHE for planar blank Si (702), planar Si with Mo3S4Cu (704), blank Si pillars (706), and Si pillars with Mo3S4Cu (708). The ligands in this embodiment are methylcyclopentadienyl. At -0.1 V vs. RHE, the maximum IPCE obtained is about 4.5 %. However, this can be improved through focused op- timizations of e.g. the deposition procedures of the HER material and the structure of the underlying Si.
A different example of a molecular core structure of the HER material 800 is the incomplete cubane-like structure Mo3S4 shown in figure 8a and b, wherein the molybdenum (Mo) atoms are denoted 802 and the sulphur (S) atoms 804. The position of three hydrophobic methylcyclopentadienyl ligands (Cp ligands) 806 attached to the Mo atoms is also shown in figure 8b.
The HER material 800 is in one embodiment deposited onto the pillared Si surface by drop casting. By choosing a hydrophobic ligand such as methylcyclopentadienyl as shown in figure 8b, the HER cubane-like structure be-
comes insoluble in water but soluble in polar organic solvents, which is a necessity for obtaining an efficient drop-casting of the material onto the planar Si and the Si pillars. Various amounts of Mo3S4 cluster were drop-casted onto the planar Si and the Si pillars and a concentration of 2 nmol was found to be optimal. X-ray photoelectron spectroscopy (XPS) has shown that the Mo3S4 clusters are deposited on the Si surface in a concentration of 2.6 x 1 013 Mo3S4 clusters/cm2. This implies that most of the deposited clusters are lost into the electrolyte. Since pulling the sample out of the electrolyte in inert gas does not change the activity, 2.6 x 1 013 Mo3S4 clusters/cm2 is also the area density of the Mo3S4 clusters during measurements.
Figure 9 illustrates the HER photocurrent enhancement 900 of planar Si 902, planar Si with 2 nM of Mo3S4 904, Si pillars 906 and Si pillars with 2 nM of Mo3S4 908 after illuminating the samples with light having wavelengths above 645 nm obtained from a xenon lamp. The ligands in this embodiment are me- thylcyclopentadienyl as shown in figure 8b. The HER material has been deposited on the Si surfaces by us of the drop casting method.
In the dark all electrodes 902, 904, 906, 908 show negligible current. Under illumination, the blank planar Si 902 has an onset 91 0 of photocurrent at URHE = -0.4 V. However, upon depositing the Mo3S4 clusters onto the Si planar surface, a significant enhancement in the photoactivity is observed, where the onset 91 2 is now shifted to URHE = +0.1 5 V due to improved catalysis. This results in a hydrogen evolution current density of 8 mA/cm2 at the reversible potential, U RHE = 0 V marked with the dotted line 91 4. This corresponds to an IPCE of 47%. Considering that only 2.6 x 1 013 Mo3S4 clusters/cm2 is present during operation, this rate of hydrogen evolution at the reversible potential corresponds to a turnover frequency (TOF) of 960 sec"1 for the Mo3S4 modified planar Si surface.
The blank Si pillars 906 are considerably improved relative to planar Si. The limiting current density of the pillar electrode 906 is below 16 mA/cm2 at an over potential larger than -1 V, corresponding to an IPCE of 93%. This is 33% higher than that of the planar Si 902. Depositing 2 nmol Mo3S4 cluster onto the Si pillar (908) displayed a hydrogen evolution current density of 9.4 mA/cm2 at the reversible potential, URHE = 0 V, corresponding to an IPCE of 55%. Bubbles dislodging from the photocathode could clearly be observed under these conditions.
Comparison of the blank Si surfaces 902, 906 and the Si surfaces with Mo3S4 cluster 904, 908 shows that the limiting current under large cathodic potential suffers slightly when Mo3S4 clusters are present. The reason for the decrease in limiting current could be hydrogen bubbles adhering to the surface causing the loss of effective surface area. The cluster-modified surface is more hydrophobic than the untreated surface making bubbles adhere much better.
Figure 9 also shows that the Si pillars with Mo3S4 cluster 908 have better activity than the planer Si with Mo3S4 cluster 904, although the gain is modest near the onset potential 912. More importantly, the pillar structure increases the limiting current (and IPCE) significantly. For high-quality single-crystal Si samples at low over potential, not much is gained by using Si pillars as opposed to planar Si surfaces, except for a lower reflectance loss. However, in a cheap gas-phase grown system, where the minority carrier lifetime would be much lower, pillars would be crucial for success. In effect, the Si pillars constitute a "model system" for vapour-liquid-solid grown Si pillars, and they demonstrate that solar driven hydrogen evolution can indeed be achieved with such configurations without using any Pt-group metals. Figure 10 illustrates the incident photon to current efficiency (IPCE) 1000 at 0 V vs. RHE for planar blank Si (1002), planar Si with Mo3S4 (1004), blank Si
pillars (1006), and Si pillars with Mo3S4 (1008). The ligands in this embodiment are methylcyclopentadienyl as shown in figure 8b. The figure highlights the results seen in figure 9, emphasizing the significant increase in IPCE obtainable when depositing the hydrophobic Mo3S4 onto Si surfaces by drop casting. The maximum IPCE obtained is 55 % and is observed at 0 V vs. RHE for Si pillars with Mo3S4.
Figure 1 1 illustrates the dry etch procedure 1 100 for processing of the Si pillars, shown in detail in figures 3a-c. This procedure is step wise, where the first step 1 102 is a 30 sec buffered hydrogen fluoride (BHF) etch followed by, in the second step, 1 104 deposition of 2.2μΜ of the photoresist AZ-5214E. In the subsequent step 1 106, the Si is exposed to UV-light for 5s through a honeycomb pattern mask. In the next step, the Si is 1 108 firstly baked at 120°C for 120s and secondly flood exposed for 30s. In the subsequent step 1 1 10, the photoresist is developed for 80s in an aqueous solution of the developer AZ 351 . This is followed by 1 1 12, firstly another BHF etch and secondly a deep reactive-ion etching (DRIE) for 9-27min. In the final step 1 1 14, there is a resist strip in the plasma asher, thereby creating the Si pillars 1 1 16.
References
100 pyrex glass cell 100 for photoelectrochemical measurements
102 working electrode compartment
104 counter electrode compartment
106 working electrode (e.g. Si electrode)
108 counter electrode (Pt mesh)
1 10 glass frit
1 12 reference electrode compartment
1 14 reference electrode (Hg/HgS04)
1 16 hydrogen bubbling
200 photoelectrocatalytic system
202 HER material, e.g. Mo3S4Cu or Mo3S4
204 Si pillar
206 solar energy
208 blue part of the solar spectrum
210 photoanode
212 oxygen evolution catalyst on the photoanode 210
214 red part of the solar spectrum
216 membrane
300 pattern of the Si pillared surface
302 small empty circle without Si pillars
304 large empty circle without Si pillars
400 molecular core structure of the HER material Mo3S4Cu
402 molybdenum (Mo) atom
404 sulphur (S) atom
406 copper (Cu) atom
500 Mo3S4Cu electrophorectically deposited on planar p-type Si
502 planar Si
504 planar Si with 1 μΜ of Mo3S4Cu
506 planar Si with 5 μΜ of Mo3S4Cu
508 planar Si with 10 μΜ of Mo3S4Cu
510 planar Si with 20 μΜ of Mo3S4Cu
600 HER photocurrent enhancement
602 HER photocurrent of planar Si
604 HER photocurrent of planar Si with 10 μιη of Mo3S4Cu 606 HER photocurrent of Si pillars
608 HER photocurrent of Si pillars with 10 μιτι of Mo3S4Cu
700 incident photon to current efficiency (IPCE) at -0.1 V vs. RHE
702 IPCE for planar blank Si
704 IPCE for planar Si with Mo3S4Cu
706 IPCE for blank pillared Si
708 IPCE for pillared Si with Mo3S4Cu
800 molecular core structure of the HER material Mo3S4
802 molybdenum (Mo) atom
804 sulphur (S) atom
806 methylcyclopentadienyl ligand
900 HER photocurrent enhancement by drop-casting method 902 HER photocurrent of planar Si
904 HER photocurrent of planar Si with Mo3S4
906 HER photocurrent of Si pillars
908 HER photocurrent of Si pillars with Mo3S4
910 onset of the photocurrent for sample 902
912 onset of the photocurrent for samples 904 and 908
914 reversible potential
1000 incident photon to current efficiency (IPCE) at 0 V vs. RHE
1002 IPCE for planar blank Si
1004 I PCE for planar Si with Mo3S4
1006 IPCE for blank pillared Si
1008 I PCE for pillared Si with Mo3S4
1 100 dry etch procedure for processing of the Si pillars
1 102 an initial etch for 30 sec in buffered hydrogen fluoride (BHF)
1 104 deposition of 2.2μΜ of the photoresist AZ-5214E
1 106 exposed to UV-light for 5s through a so called "Honeycomb dummy 1 " mask
1 108 baking at 120 °C for 120s and flood exposed for 30s
1 1 10 developing for 80s in an aqueous solution of the developer AZ 351 1 1 12 a second BHF etch and deep reactive-ion etching (DRIE) for 9- 27min.
1 1 14 a resist strip in the plasma asher
1 1 16 Si pillars
Claims
1 . A hydrogen evolution reaction (HER) material for photoelectrocatalytic hydrogen production, said HER material comprising a molecular cluster core of the formula LxNyMz, where:
- L is selected from molybdenum (Mo), tungsten (W), tantalum
(Ta), rhenium (Re), iron (Fe), nickel (Ni), niobium (Nb), chromium (Cr) and cobalt (Co);
- N is selected from oxygen (O), nitrogen (N), sulphur (S), selenium (Se) and tellurium (Te);
- M is selected from copper (Cu), cobalt (Co), manganese (Mn), or any other transition metal;
- x is an integer selected from 2, 3, 4 and 5;
- y is an integer selected from 1 , 2, 3, 4 and 5;
- z is an integer selected from 0, 1 , 2, 3, 4 and 5;
where said HER material is to be positioned on the surface of a photoab- sorptive semiconductor having a low band gap, whereby said HER material is enhancing the hydrogen production.
2. A HER material according to claim 1 , wherein said molecular cluster core of said HER material has an incomplete cubane cluster core structure.
3. A HER material according to claim 2, wherein said molecular cluster core of said HER material is of the formula MoxSy.
4. A HER material according to claim 3, wherein said molecular cluster core of said HER material is of the formula Mo3S4.
5. A HER material according to claim 1 , wherein said molecular cluster core of said HER material has a cubane cluster core structure.
6. A HER material according to claim 1 or 5, wherein said molecular cluster core of said HER material is of the formula MoxSyMz, where M = Cu, Co, Mn, or any other transition metal.
7. A HER material according to claim 6, wherein said molecular cluster core of said HER material is Mo3S4Cu.
8. A HER material according to any of the claims 1 -7, wherein said HER material further comprises x hydrophobic ligands, where x is said integer selected from 2, 3, 4 and 5.
9. A HER material according to claim 8, wherein said x hydrophobic ligands are cyclopentadienyl ligands or methylcyclopentadienyl ligands.
1 0. A HER material according to claim 9, wherein said molecular cluster core of said HER material is of the formula Mo3S4 and said hydrophobic ligands are methylcyclopentadienyl ligands.
1 1 . A HER material according to claim 9, wherein said molecular cluster core of said HER material is of the formula Mo3S4Cu and said hydrophobic ligands are methylcyclopentadienyl ligands.
1 2. A system for hydrogen production comprising :
• a hydrogen evolution reaction (HER) material according to any of the claims 1 -1 1 ;
· a photoabsorptive positive type (p-type) semiconductor with a low band gap, where said HER material is positioned on the surface of said photoabsorptive semiconductor, thereby enhancing the hydrogen production.
13. A system according to claim 12, wherein said HER material is deposited on said surface of said photoabsorptive semiconductor by the method of drop casting.
14. A system according to claim 12, wherein said HER material is deposited on said surface of said photoabsorptive semiconductor by the method of electrophorectic deposition.
15. A system according to any of the claims 12-14, wherein said photoabsorptive semiconductor is silicon (Si).
16. A system according to claim 15, wherein said Si has a nanostructure or microstructure with a non-planar structure.
17. A system according to claim 16, wherein said non-planar Si structure is Si pillars.
18. A method for hydrogen production, wherein said method comprises the step of illuminating a photoelectrocatalytic cell comprising a system ac- cording to any of the claims 12-17 with sun light.
19. A method according to claim 18, wherein visible and/or infra red light from the sun light is used for illuminating said photoelectrocatalytic cell.
20. Use of a system according to any of the claims 12-17 for hydrogen production.
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