WO2011076968A3 - Sistema y método de detección y caracterización de nanopartículas - Google Patents

Sistema y método de detección y caracterización de nanopartículas Download PDF

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Publication number
WO2011076968A3
WO2011076968A3 PCT/ES2010/070861 ES2010070861W WO2011076968A3 WO 2011076968 A3 WO2011076968 A3 WO 2011076968A3 ES 2010070861 W ES2010070861 W ES 2010070861W WO 2011076968 A3 WO2011076968 A3 WO 2011076968A3
Authority
WO
WIPO (PCT)
Prior art keywords
nanoparticles
characterisation
detection
light
source
Prior art date
Application number
PCT/ES2010/070861
Other languages
English (en)
French (fr)
Other versions
WO2011076968A2 (es
Inventor
Enric Bertran Serra
Adolf Canillas Biosca
Oriol Arteaga Barriel
Eric Jover Comas
Ferran Barroso Boixader
Original Assignee
Universidad De Barcelona
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universidad De Barcelona filed Critical Universidad De Barcelona
Publication of WO2011076968A2 publication Critical patent/WO2011076968A2/es
Publication of WO2011076968A3 publication Critical patent/WO2011076968A3/es

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02092—Self-mixing interferometers, i.e. feedback of light from object into laser cavity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties

Abstract

Se describen un sistema y un método de detección y caracterización de nanopartículas basado en un micropolarímetro-interferómetro con dos modos de funcionamiento, con uno o dos brazos, para la caracterización y detección tiempo real de nanopartículas. Se utilizan un polarizador (3) encargado de polarizar el haz de luz generado por la fuente de luz (2) y a continuación un modulador fotoelástico (10) adaptado para modular la fase periódica en estado de polarización de la luz generada por la fuente (2). Las nanopartículas circulan secuencialmente hacia una región donde la luz ha sido focalizada por una lente (17) por un portamuestras (11) que se encuentra alineado con el primer brazo (7).
PCT/ES2010/070861 2009-12-23 2010-12-22 Sistema y método de detección y caracterización de nanopartículas WO2011076968A2 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ES201000017A ES2362592B1 (es) 2009-12-23 2009-12-23 Sistema y método de detección y caracterización de nanopart�?culas.
ESP201000017 2009-12-23

Publications (2)

Publication Number Publication Date
WO2011076968A2 WO2011076968A2 (es) 2011-06-30
WO2011076968A3 true WO2011076968A3 (es) 2011-08-18

Family

ID=44185629

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/ES2010/070861 WO2011076968A2 (es) 2009-12-23 2010-12-22 Sistema y método de detección y caracterización de nanopartículas

Country Status (2)

Country Link
ES (1) ES2362592B1 (es)
WO (1) WO2011076968A2 (es)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4886363A (en) * 1988-09-06 1989-12-12 Eastman Kodak Company Quadratic frequency modulated absolute distance measuring interferometry
US5282015A (en) * 1989-06-22 1994-01-25 Quantametrics Inc. Methods and means for full-surface interferometric testing of grazing incidence mirrors
US20070030492A1 (en) * 2005-05-04 2007-02-08 Lukas Novotny Apparatus and method for sizing nanoparticles based on optical forces and interferometric field detection

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4886363A (en) * 1988-09-06 1989-12-12 Eastman Kodak Company Quadratic frequency modulated absolute distance measuring interferometry
US5282015A (en) * 1989-06-22 1994-01-25 Quantametrics Inc. Methods and means for full-surface interferometric testing of grazing incidence mirrors
US20070030492A1 (en) * 2005-05-04 2007-02-08 Lukas Novotny Apparatus and method for sizing nanoparticles based on optical forces and interferometric field detection

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
BARROSO, F. ET AL.: "Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry", THIN SOLID FILMS, vol. 519, no. 9, 5 December 2010 (2010-12-05), pages 2801 - 2805, XP028161990, Retrieved from the Internet <URL:http://www.sciencedirect.com/science/article/pü/50040609010016810><DOI:10.1016/j.tsf.> [retrieved on 20110524], doi:10.1016/j.tsf.2010.12.051 *

Also Published As

Publication number Publication date
ES2362592B1 (es) 2012-05-23
WO2011076968A2 (es) 2011-06-30
ES2362592A1 (es) 2011-07-08

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