WO2011058502A3 - Gas sensing device having a photonic structure operating by means of bloch surface waves and corresponding manufacturing process - Google Patents

Gas sensing device having a photonic structure operating by means of bloch surface waves and corresponding manufacturing process Download PDF

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Publication number
WO2011058502A3
WO2011058502A3 PCT/IB2010/055089 IB2010055089W WO2011058502A3 WO 2011058502 A3 WO2011058502 A3 WO 2011058502A3 IB 2010055089 W IB2010055089 W IB 2010055089W WO 2011058502 A3 WO2011058502 A3 WO 2011058502A3
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WO
WIPO (PCT)
Prior art keywords
surface waves
sensing device
manufacturing process
bloch surface
photonic structure
Prior art date
Application number
PCT/IB2010/055089
Other languages
French (fr)
Other versions
WO2011058502A2 (en
Inventor
Francesco Geobaldo
Emiliano Descrovi
Fabrizio Giorgis
Francesco Michelotti
Original Assignee
Politecnico Di Torino
Universita' Degli Studi Di Roma "La Sapienza"
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Politecnico Di Torino, Universita' Degli Studi Di Roma "La Sapienza" filed Critical Politecnico Di Torino
Publication of WO2011058502A2 publication Critical patent/WO2011058502A2/en
Publication of WO2011058502A3 publication Critical patent/WO2011058502A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N2021/0346—Capillary cells; Microcells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/05—Flow-through cuvettes

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

A gas-sensing device having a photonic structure, which comprises a multilayer structure (39) made of porous material comprising a periodic multilayer (22; 32) configured for generating Bloch surface waves, and means (23; 33) for directing a light beam (25; 36) incident upon said device (30) towards said multilayer structure (22; 32) in attenuated-total-reflection (ATR) conditions in order to generate said Bloch surface waves, said periodic multilayer (22; 32) comprising a first sensitive face (32e) that is free so as to be exposed to the gas, and a second face (32f) opposite to said first sensitive face (32e). According to the invention, said second face (32f) of said periodic multilayer (32) is set facing said means (33) for directing the incident light beam (36) in ATR conditions, and said multilayer structure (32) made of porous material is fixed to said means (33) for directing the incident light beam (36) in ATR conditions via a bonding layer (34) and a transparent substrate layer (31).
PCT/IB2010/055089 2009-11-11 2010-11-09 Gas sensing device having a photonic structure operating by means of bloch surface waves and corresponding manufacturing process WO2011058502A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ITTO2009A000866A IT1396777B1 (en) 2009-11-11 2009-11-11 DEVICE FOR GAS SENSOR WITH PHOTONIC STRUCTURE OPERATING BY BLOCH SURFACE WAVES AND ITS MANUFACTURING PROCEDURE
ITTO2009A000866 2009-11-11

Publications (2)

Publication Number Publication Date
WO2011058502A2 WO2011058502A2 (en) 2011-05-19
WO2011058502A3 true WO2011058502A3 (en) 2012-01-26

Family

ID=42260690

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2010/055089 WO2011058502A2 (en) 2009-11-11 2010-11-09 Gas sensing device having a photonic structure operating by means of bloch surface waves and corresponding manufacturing process

Country Status (2)

Country Link
IT (1) IT1396777B1 (en)
WO (1) WO2011058502A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105628651A (en) * 2016-03-18 2016-06-01 复旦大学 Trace liquid or gas refractive index measuring device based on surface wave evanescent field
US10768112B2 (en) 2016-07-12 2020-09-08 National Institute Of Advanced Industrial Science And Technology Optical detection device and optical detection method
CN116698777B (en) * 2023-05-22 2024-01-30 武汉量子技术研究院 Guided wave-exciton coupling dispersion characterization method based on nonlinear Fourier spectrum

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1617203A1 (en) * 2003-04-23 2006-01-18 Japan Science and Technology Agency Differential surface plasmon resonance measuring device and its measuring method
US20070047088A1 (en) * 2005-08-30 2007-03-01 Robertson William M Optical sensor based on surface electromagnetic wave resonance in photonic band gap materials and method for using same

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090010589A1 (en) 2005-08-30 2009-01-08 Robertson William M Optical sensor based on surface electromagnetic wave resonance in photonic band gap materials

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1617203A1 (en) * 2003-04-23 2006-01-18 Japan Science and Technology Agency Differential surface plasmon resonance measuring device and its measuring method
US20070047088A1 (en) * 2005-08-30 2007-03-01 Robertson William M Optical sensor based on surface electromagnetic wave resonance in photonic band gap materials and method for using same

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
DESCROVI E; SFEZ T; DOMINICI L; NAKAGAWA W; MICHELOTTI F; GIORGIS F; HERZIG H -P: "Near-field imaging of Bloch surface waves on silicon nitride one-dimensional photonic crystals", OPTICS EXPRESS, vol. 16, no. 8, 14 April 2008 (2008-04-14), pages 5453 - 5464, XP002590508, DOI: 10.1364/OE.16.005453 *
DESCROVI EMILIANO ET AL: "Coupling of surface waves in highly defined one-dimensional porous silicon photonic crystals for gas sensing applications", APPLIED PHYSICS LETTERS, AIP, AMERICAN INSTITUTE OF PHYSICS, MELVILLE, NY, US LNKD- DOI:10.1063/1.2824387, vol. 91, no. 24, 13 December 2007 (2007-12-13), pages 241109 - 241109, XP012104746, ISSN: 0003-6951 *

Also Published As

Publication number Publication date
WO2011058502A2 (en) 2011-05-19
ITTO20090866A1 (en) 2011-05-12
IT1396777B1 (en) 2012-12-14

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