WO2011058496A3 - Sensor device with light emitting diode source - Google Patents

Sensor device with light emitting diode source Download PDF

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Publication number
WO2011058496A3
WO2011058496A3 PCT/IB2010/055074 IB2010055074W WO2011058496A3 WO 2011058496 A3 WO2011058496 A3 WO 2011058496A3 IB 2010055074 W IB2010055074 W IB 2010055074W WO 2011058496 A3 WO2011058496 A3 WO 2011058496A3
Authority
WO
WIPO (PCT)
Prior art keywords
sensor device
investigation region
light emitting
emitting diode
spix
Prior art date
Application number
PCT/IB2010/055074
Other languages
French (fr)
Other versions
WO2011058496A2 (en
Inventor
Josephus A. H. M. Kahlman
Original Assignee
Koninklijke Philips Electronics N.V.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics N.V. filed Critical Koninklijke Philips Electronics N.V.
Publication of WO2011058496A2 publication Critical patent/WO2011058496A2/en
Publication of WO2011058496A3 publication Critical patent/WO2011058496A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/027—Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Eye Examination Apparatus (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

The invention relates to a method and a sensor device (100) for executing optical examinations in the investigation region (3) of a carrier (5). The sensor device (100) comprises an LED (22) that is operated with a constant current (Ip) and that emits an input light beam (Ll) towards the investigation region (3). An output light beam (L2) coming from the investigation region (3) is detected with a light detector (30), typically a camera, to provide intensity related raw measurement signals (Spix). The forward voltage (VF) across the LED (22) is sensed and used in a correction unit (50) to generate corrected measurement signals (Spix nrm). Thus the measurements can be made robust with respect to variations of the input light source (22).
PCT/IB2010/055074 2009-11-16 2010-11-09 Sensor device with light emitting diode WO2011058496A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP09176113.0 2009-11-16
EP09176113 2009-11-16

Publications (2)

Publication Number Publication Date
WO2011058496A2 WO2011058496A2 (en) 2011-05-19
WO2011058496A3 true WO2011058496A3 (en) 2011-07-14

Family

ID=43877328

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2010/055074 WO2011058496A2 (en) 2009-11-16 2010-11-09 Sensor device with light emitting diode

Country Status (1)

Country Link
WO (1) WO2011058496A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104792710B (en) * 2015-04-13 2018-08-03 杭州远方光电信息股份有限公司 A kind of object optical characteristic measuring device

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4700064A (en) * 1984-12-04 1987-10-13 Mitsubishi Denki Kabushiki Kaisha Temperature varying optical measurement device
US5442435A (en) * 1994-03-24 1995-08-15 Nartron Corporation Fluid composition sensor using reflected or refracted light monitoring
EP1044858A2 (en) * 1999-04-16 2000-10-18 Hella KG Hueck & Co. Method for getting a correction factor to compensate for the temperature drift in the intensity of the beams of an LED
US20020086432A1 (en) * 2000-12-28 2002-07-04 Tam Lisa A. Portable co-oximeter
GB2412728A (en) * 2004-04-02 2005-10-05 Lee Paul Richman High integrity gas detector
US7365843B2 (en) * 2003-07-23 2008-04-29 X-Rite Europe Ag Spectral photometer and associated measuring head
US20080130695A1 (en) * 2006-12-04 2008-06-05 Finesse Solutions, Llc. System and method for laser temperature compensation
US20080297791A1 (en) * 2007-05-31 2008-12-04 Konica Minolta Sensing, Inc. Reflection characteristic measuring apparatus, and method for calibrating reflection characteristic measuring apparatus

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008155723A1 (en) 2007-06-21 2008-12-24 Koninklijke Philips Electronics N. V. Microelectronic sensor device with light source and light detector

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4700064A (en) * 1984-12-04 1987-10-13 Mitsubishi Denki Kabushiki Kaisha Temperature varying optical measurement device
US5442435A (en) * 1994-03-24 1995-08-15 Nartron Corporation Fluid composition sensor using reflected or refracted light monitoring
EP1044858A2 (en) * 1999-04-16 2000-10-18 Hella KG Hueck & Co. Method for getting a correction factor to compensate for the temperature drift in the intensity of the beams of an LED
US20020086432A1 (en) * 2000-12-28 2002-07-04 Tam Lisa A. Portable co-oximeter
US7365843B2 (en) * 2003-07-23 2008-04-29 X-Rite Europe Ag Spectral photometer and associated measuring head
GB2412728A (en) * 2004-04-02 2005-10-05 Lee Paul Richman High integrity gas detector
US20080130695A1 (en) * 2006-12-04 2008-06-05 Finesse Solutions, Llc. System and method for laser temperature compensation
US20080297791A1 (en) * 2007-05-31 2008-12-04 Konica Minolta Sensing, Inc. Reflection characteristic measuring apparatus, and method for calibrating reflection characteristic measuring apparatus

Also Published As

Publication number Publication date
WO2011058496A2 (en) 2011-05-19

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