WO2011038003A1 - Impedance sensing systems and methods for use in measuring constituents in solid and fluid objects - Google Patents

Impedance sensing systems and methods for use in measuring constituents in solid and fluid objects Download PDF

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Publication number
WO2011038003A1
WO2011038003A1 PCT/US2010/049824 US2010049824W WO2011038003A1 WO 2011038003 A1 WO2011038003 A1 WO 2011038003A1 US 2010049824 W US2010049824 W US 2010049824W WO 2011038003 A1 WO2011038003 A1 WO 2011038003A1
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WO
WIPO (PCT)
Prior art keywords
sensor
impedance
coil
sensing
under test
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Application number
PCT/US2010/049824
Other languages
French (fr)
Inventor
Boris Kesil
Yury Nikolenko
Original Assignee
Adem
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Adem filed Critical Adem
Priority to RU2012116010A priority Critical patent/RU2629901C2/en
Priority to KR1020127010197A priority patent/KR101526039B1/en
Priority to JP2012530993A priority patent/JP5666597B2/en
Priority to CA2775144A priority patent/CA2775144C/en
Priority to CN201080047815.5A priority patent/CN102575998B/en
Priority to EP10776852.5A priority patent/EP2480878B1/en
Priority to AU2010298385A priority patent/AU2010298385B2/en
Priority to NZ598827A priority patent/NZ598827A/en
Publication of WO2011038003A1 publication Critical patent/WO2011038003A1/en
Priority to IL218707A priority patent/IL218707A/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/023—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance where the material is placed in the field of a coil
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance

Definitions

  • This invention relates to a new extremely sensitive kind of electrical sensors that makes possible measurement of physical characteristics, detection and quantification of constituencies of solids, bulk materials and fluids. More particularly, the new sensor technology allows for new realtime non-contact methods for measurement, detection and quantification of components in said materials regardless of its conductivity, transparency and reflectivity under most environmental condition to apply Impedance Resonance Spectroscopy.
  • An electrical resonance sensor that can be used in array of similar by design sensors, where each sensor comprises two coils, one of which is excitation coil and the other is sensing coil and in electromagnetic coupling with object under test works at predetermined resonant frequency that was chosen for providing strong correlation of sensor indication with a parameter of interest in radiofrequency range (RF); and the method of using said sensors to measure the physical characteristics and/or composition of the subject under test without contact in real-time.
  • RF radiofrequency range
  • the invention provides a resonance type impedance sensor which is a multicoil open-core or air-core inductor, the sensor comprising at least two coils, one coil being an excitation coil connectable to at least one alternating current source with frequency sweep, another coil being a sensing coil connectable to at least one data processing system, wherein upon electrical connection to said current source, the excitation coil propagates an energy to the sensing coil, which generates a probing electromagnetic field and wherein L C R parameters of the sensing coil are capable of providing resonance conditions for measuring of object under test impedance at predetermined frequency.
  • a resonance type impedance sensor which is a multicoil open-core or air-core inductor, the sensor comprising at least two coils, one coil being an excitation coil connectable to at least one alternating current source with frequency sweep, another coil being a sensing coil connectable to at least one data processing system, wherein upon electrical connection to said current source, the excitation coil propagates an energy to the sensing coil, which generates a probing electromagnetic field and
  • the invention provides an impedance sensing system for non-contact and non-invasive measuring and analyzing of targeted chemical and physical properties of gaseous, fluid and solid objects comprising: (A) at least one resonance type impedance sensor described above; (B) at least one alternating current source with frequency sweep electrically connected to said at least one excitation coil; (C) said at least one data processing system in communication with said at least one sensing coil, wherein L C R parameters of said sensing coil provides resonance conditions for measuring of object under test impedance at predetermined frequency; and (D) a control system in communication with said alternating current source and said data processing system.
  • alternating current source with frequency sweep electrically connected to said at least one excitation coil
  • L C R parameters of said sensing coil provides resonance conditions for measuring of object under test impedance at predetermined frequency
  • a control system in communication with said alternating current source and said data processing system.
  • the invention provides a method of measuring chemical and physical properties of an object by a resonance type impedance sensor, the method comprising:
  • the preferred impedance sensor is the sensor described in the sensor aspect of the invention.
  • the present invention is directed to sensing system (apparatus) comprising of one or an array
  • cluster of impedance type sensor(s) which is able to create a non-contact probing, primarily by harmonic high frequency electromagnetic fields in an object under test and analyze complex object response to the sensor's probing field.
  • This invention primarily relates to wide variety sensor systems and methods for measuring physical parameters and/or chemical constituencies and their distribution in targeted composite object: solid, liquid, gaseous or their combination.
  • the invention can be used practically in all industries, including: utilities, agriculture, food, textile, pharmaceutical, photovoltaic and semiconductor, medical devices, chemical and petro-chemical, metallurgy, Homeland Security.
  • this invention discloses a structure of novel RF impedance sensing system and sensors for contact-less real-time (in-situ) measurements (analysis) of composition different materials including of thin and thick films and layers during numerous production processes (e.g. PVD, CVD, ECD, CMP, etc.) in Semiconductor, Flat Panel, Photovoltaic and Disk Drive industries, material science, etc.
  • present invention describes a new method and device (apparatus) for testing liquids, solvents and gas analysis in chemical, food processing, Agricultural and other industry fields as well as in testing laboratories.
  • the sensing system is, actually, scanning an object under test by generating sweeping voltages in the vicinity of pre-selected frequencies.
  • each Impedance sensor is designed to have resonance in presence of the object under test at one of said pre-selected frequencies.
  • the Impedance sensors are able to monitor number of targeted parameters (characteristic or properties) of the object by measuring object response to the sensor's electromagnetic field variation represented by resonance amplitude (value) change - dV, resonance frequency shift - dFr and in some cases phase angle displacements - d ⁇ at pre-selected set of frequencies.
  • Data processing unit is able to compare and analyze statistically filtered reaction of object - sensor complex on Impedance sensor outputs (V, dV, and Fr, dFr and ⁇ , d ⁇ ).
  • the data processing unit stores in memory reference data and an algorithm of their usage.
  • the reference data are acquired in process (usually named calibration) of measuring similar objects with known properties.
  • the algorithm correlates the sensor output signals with quantified characteristic(s) of the targeted property and can comprise interpolation, solution of a system of equation, search in lookup tables and etc.
  • the in-situ Impedance sensors may be designed as an air core cylindrical or planar inductors in one group of embodiments and as ferrite core inductors according to an another one.
  • Each of these sensors has at least one winding named as an excitation coil and at least one winding named as a sensing coil.
  • the excitation coil is connected (coupled) to an output of RF sweep generator and provides electromagnetic pumping to resonance circuit represented by sensing coil.
  • the sensing coil is generating probing electromagnetic field, perceiving an influence on said field by object under test and transferring information about the influence to multi- channel measuring and data processing (signal analyzing) system.
  • the Impedance sensors, RF sweep generator and data processing system are designed to function as a high speed closed loop self - tuning system continuously searching for a resonance frequency of a system (unity) sensor - object complex, calculating and presenting targeted parameters and characteristics of the object in-real time (on-line) mode.
  • the present invention is believed to have an advantage of high sensitive impedance measurements using electrical resonance circuit and advantage of Electrochemical Impedance Spectroscopy and Dielectric Relaxation Spectroscopy which provide method of defining optimal operating frequencies for impedance measurements.
  • High sensitivity impedance measurements are achieved by using refined resonance circuit composed of coil only.
  • Target parameters of impedance measurements are active capacitance and capacitive reactance of object under test, so highest sensitivity can be achieved by minimizing, as much as possible, self resistance and self capacitance of sensing coil.
  • Another improvement is using of excitation coil for transferring energy to sensing coil by excluding generator source's impedance influence on sensing resonance circuit.
  • the present invention discloses a new advanced approach. To determine an operating frequency for each impedance sensor of the sensing system an impedance spectrometer is used.
  • composition sensing system The procedure for constructing of composition sensing system is described below:
  • step D constructing a set of sensors with operating frequencies based on the results of step C;
  • the above described improvements allowed constructing novel measuring sensor with highest possible sensitivity in RF.
  • the figures 17 and 23 illustrate sensitivity scale of traditional and proposed methods.
  • the proposed sensor system and measurement method increased significantly sensitivity over all known electrical methods.
  • the improvement in sensitivity level is different from a case to case dependant on application. For some applications sensitivity improvement could be measured by factors not percentages.
  • FIG. 1 depicts a simplified equivalent circuit of an Impedance sensor of this invention and object under test response.
  • FIG. 2 illustrates response of dielectric object under test to vortex electric field for the object located outside of a sensor.
  • FIG. 3 illustrates response of dielectric object under test to vortex electric field for the object located inside of a sensor.
  • FIG. 4 illustrates response of conductive object under test to vortex electric field for the object located outside of a sensor.
  • FIG. 5 illustrates response of dielectric object under test to linear electric field for the object located inside a sensor.
  • FIG. 6 depicts a sectional view of one embodiment of the impedance sensor (cylindrical type) of the present invention.
  • FIG. 7 depicts a sectional view of another embodiment of the impedance sensor (bobbin type) of the present invention.
  • FIG. 8 depicts another embodiment of the present invention for testing flowing in the pipe liquid and comprising an array of Impedance sensors having tree different frequencies.
  • FIG. 9 depicts a general view of another embodiment of the Impedance sensors array of the present invention comprising two bypass sections wherein properties of fluid under test may be monitored by several different impedance sensors (the bypass section can be periodically empty for calibration and correction for wall deposit).
  • FIG. 10 depicts a sectional view of another embodiment of the impedance sensor (ferrite pot type) of the present invention for measuring solid object.
  • FIG. 11 depicts a sectional view of another embodiment of the impedance sensor (ferrite pot type) of the present invention for measuring liquids and bulk materials.
  • Fig. 12 depicts an embodiment of non-contact sensor device of this invention for measuring liquids and bulk materials with excitation and sensing coils embracing object under test.
  • Fig. 13 depicts a general view of an embodiment of a planar sensor of the present invention.
  • FIG. 14 depicts a block diagram of the sensing system according to the present invention.
  • FIG. 15 depicts scope screen shot of output signals of an impedance sensing system of the present invention for a bare silicon wafer and for the same silicon wafer covered by 5000 A thick aluminum film.
  • FIG. 16 depicts a graph illustrating test results of a sensing system of the present invention for samples of distilled water and tap water.
  • NaCl sodium chloride
  • FIG. 20 and FIG. 21 depicts graphs illustrating test results of measurements with sensing system of this invention for silicon wafers having different thicknesses of aluminum film.
  • FIG. 22 depicts a graph illustrating test results of a sensing system of the present invention for measuring mercury contamination in water.
  • FIG. 23 depicts a graph of amplitude/frequency response curves for solutions of water containing different concentration NaCl in the frequency range of 17 - 20 MHz for a sensor of this invention with a 20pF capacitor.
  • FIG. 24 depicts maxima of amplitude/frequency response curves as a function of the concentration of NaCl in water for embodiments of this invention having a 20pF capacitor and for a sensor system without added capacitance.
  • Optical methods like ellipsometry, are common in the semiconductor industry. They are mostly used for measurements of transparent layers.
  • the X-ray technique is expensive, associated with safety issues and has limited application in production lines.
  • optical methods often cannot be reliably used when measuring opaque or nontransparent layers and stacks of transparent layers. Things are further complicated by optical properties of the measured layers (the index of refraction, extinction coefficient, etc.) and by the surface roughness of the measured and/or underlying layers.
  • the techniques known in the art are unable to measure thicknesses of targeted individual layer(s) inside composite multi-layer objects with high accuracy.
  • Most of those known techniques are limited by one or a combination of shortcomings such as speed of measurement, optical properties and material's conductivity.
  • some of these techniques are destructive and/or require a direct contact which is highly undesirable.
  • Optical, X-ray and existing Impedance spectroscopy devices are bulky, overly expensive and not ready for in- situ type measurements.
  • a sensitive resonance circuit is an electrical circuit composed of at least two elements: inductor and capacitor electrically connected to each other.
  • inductor inductor
  • capacitor electrically connected to each other.
  • the inventors have unexpectedly discovered that the traditional electrical circuit, composed of inductor and capacitor, may be replaced by an inductor alone.
  • the said inductor induction coil
  • the sensing coil is a main part of the inductor and its parameters define operating frequency of invented sensor.
  • Sensor's sensitivity can be further increased by using monolayer coil with substantial step between turns or using basket winding to decrease self capacitance of sensing coil. While the invention is not limited to any specific theory, another significant feature that is believed to have contributed to high sensitivity of the invented sensor is an electrical separation of AC current source from the sensing coil; it is in order to exclude or minimize the influence of source impedance on the sensor's sensitivity. That was achieved by using excitation coil for electromagnetically transferring energy from source of AC current to sensing coil.
  • V - voltage of useful signal (for our DAQ it is 0.5 - 11 V)
  • FIG. 1 depicts a simplified equivalent circuit of an Impedance sensor of this invention and object under test response.
  • Impedance sensor is depicted with solid lines. It comprised of alternating current source with frequency sweep 11, excitation coil 12, sensing coil 13, and data processing system 14.
  • the excitation coil function is pumping the sensing coil with electromagnetic energy and a separate a sensing resonance circuit from impedance of alternating current source.
  • Sensitive resonance circuit of this invention consists of sensing coil only and may be described by parameters of this coil: inductance, inter-turn capacitance, and active resistance.
  • Impedance sensor design according to aspects of the present invention provides a low capacitance value. It can be desirable to reduce capacitance to the lowest possible practical value.
  • a sensing coil is coupled with high impedance (preferably in the range of about 10 7 to about 10 15 ⁇ ) input of data processing system.
  • Alternating magnetic field of sensing coil generates vortex electric field E and this field, in its turn, induces vortex currents of different type.
  • circuit 15 consists of resulting parameters L, R, and C. Impedance of circuit 15 reflects resistance to vortex displacement currents generated by vortex electric field E and energy dissipation occurs due to alternating dielectric polarization (FIG. 2).
  • the equivalent electrical circuit 16 can have only two resulting parameters L and R. These parameters consider resistance to both vortex conductive and ionic current flows caused by vortex electric field E and energy dissipation occurs due to eddy currents (FIG. 4).
  • Alternating linear electric field E of sensing coil also induces linear currents of different type.
  • Conductive and dielectric objects create capacitive coupling of sensor and object and this relationship is presented by equivalent electrical circuit 17.
  • the impedance reflects an object's resistance to linear conductive currents, displacement currents, or ionic currents generated by a potential gradient in a sensing coil (FIG. 5) or potential difference between coil and object under test (not illustrated).
  • FIG. 6 shows a sectional view of one embodiment of the present invention that can be bobbinless or may have a support member 63 which is generally formed as a short tube made from non-conductive material with minimum electrical permittivity ( ⁇ ⁇ 2) at high RF frequency, such as fluoropolymers.
  • the support member 63 should have thin walls to further minimize sensor capacitance.
  • the first (upper) section of the support member 63 carries an excitation coil 61 which may have only one or few turns of relatively thick cupper wire.
  • One terminal of the excitation coil is connected to ground and second one to low impedance output of RF sweep generator (not shown).
  • Second section of the support member carries a sensing coil 62.
  • This coil is wound by thinner copper wire than excitation coil. Also, the distance between turns of this coil can be made variable, so the capacitance and inductance of the coil can be mechanically tuned (changed). In this way, the operating frequency of the impedance sensor can be adjusted.
  • a first terminal of the sensing coil 62 is depicted close to excitation coil 61 and is also connected to the ground.
  • a second terminal of sensing coil is coupled to a high impedance input of multi-channel measuring and data processing system.
  • An end part of the sensing coil 62 is positioned in close proximity to an object 64 under test, which may be solid or fluid. Excitation and sensing coils are wound in opposite directions, so as to obtain the same direction of magnetic field for both coils during transfer energy from the excitation coil to the sensing coil and to provide their electrical separation.
  • the embodiment can have wide range of operating frequencies.
  • the range can be divided in two diapasons: a. operating frequencies ⁇ 50MGz that are used for measuring conductive objects and b. operating frequencies 50MHz - 1 GHz that are used for measuring dielectric and semi conductive objects.
  • FIG. 7 An alternative support member design for Impedance sensor is shown in FIG 7.
  • a "bobbin type" support member 73 makes it possible to provide a higher number of turns in the sensing coil 72 and use thinner wire for this coil.
  • Excitation coil 71 has one turn only.
  • the hole in the center of the bobbin is designed for using this sensor with an optical displacement (proximity) sensor 74 to control distance from the coil to film 76 deposited on substrate 75.
  • FIG. 8 depicts a general view of another embodiment of the present invention wherein an array comprising three impedance sensors 81 -83 operating at different frequencies.
  • the sensor array of this embodiment is able to monitor at least three constituents in liquids of the interest the same time.
  • the bobbin-type embodiment with coils of the impedance sensors are installed on sections of pipe 84 carrying a liquid (gas or bulk material) under test.
  • the sensors can be positioned at distances one from other far enough to avoid substantial mutual interference or cross-talk. Also, sensors could operate alternatively. In some embodiments, the distance can be at least equal to or more than the radius of a larger neighboring bobbin.
  • Each of Impedance sensors in the array in this embodiment has its own (individual) operating frequency specific for each targeted constituent.
  • the sensor array is connected to a controller of the Impedance sensing system (not shown).
  • FIG. 9 depicts a sectional view of another embodiment of the present invention wherein a sensor array monitoring flowing fluid (e.g. a liquid) which has included therein constituents of interest.
  • the fluid is flowing through a large diameter dielectric pipe (e.g., 3" or more) or conductive pipe 97 of any diameter.
  • the impedance sensors 93, 94, 95, and 96 are mounted on two smaller bypassing pipes, 91 and 92, (number of bypasses could vary) whose diameters can be configured depending on the application.
  • Each of the sensors has its own resonance frequency specific for each targeted constituent of interest.
  • bypass tubes whose diameters match to the optimum diameter of impedance sensor coils (inductance / operating frequency) required for measuring targeted constituent. Also, bypass tubes help by providing suitable distances between sensors working in a close resonance frequency range. Cross-talk and interaction between several impedance sensors can be minimized in this embodiment.
  • the bypasses can incorporate open and close valves to allow periodic maintenance including calibration and cleaning wall deposits.
  • FIG. 10 depicts a sectional view of another embodiment of the present invention in which both excitation coil 101 and sensing coil 102 are placed inside of a ferrite half-pot 103.
  • an impedance sensor may be positioned in close proximity to the object 104 under test (e.g., like a substrate with deposited metal layer 105).
  • the ferrite pot in this embodiment is open to the object and provides high magnetic flux to the object under test.
  • ferrite cores can increase sensitivity of an impedance sensor, especially, working with conductive and low resistivity objects.
  • FIG. 11 depicts a sectional view of another embodiment of the present invention in which sensor is the same as on FIG. 10, but mounted on the wall of vessel 114, which can contains liquid state or bulk material object under test 115.
  • the sensor comprises excitation coil 111 and sensing coil 112 are placed inside of a ferrite half-pot 113.
  • FIG. 12 depicts an embodiment of a vessel type, non-contact sensor device of this invention (with excitation and sensing coils embracing object under test) for measuring liquids, gases and bulk materials.
  • This device consists of controllable RF sweep generator 121, excitation coil 122, sensing coil 123, data acquisition 124, and controller 125 with data processing system.
  • FIG. 13 depicts a general view of another embodiment of the present invention wherein an impedance sensor is configured as two concentric planar inductors.
  • An inner inductor is a sensing coil with many turns where one terminal 131 is grounded and a second terminal 132 can be connected to the controller (not shown).
  • An outer inductor can be an excitation coil grounded from one side 131 and connected to an alternating current source with frequency sweep at other side 133.
  • a planar impedance sensor can be made by lithography method with both inductors deposited on solid rigid or flexible isolative substrate. This sensor design has several advantages like small size, simple mounting (attaching) to objects like pipe and low cost.
  • FIG. 14 depicts another embodiment of the present invention in which an array of N impedance sensors is connected to a system controller.
  • FIG. 14 depicts a simplified block diagram of a sensing system with controller of this invention.
  • Excitation coils (not shown) of each impedance sensor are connected to outputs of a required number of RF sweep generators (RFG).
  • the sensing coils of each sensor are connected to high impedance inputs of a multi-channel data processing system (MDS) in the controller.
  • MDS multi-channel data processing system
  • Both RFG and MDS are connected to a control system that manages information exchanges, scanning, test - measuring presentation of results and other functions.
  • the control system may have several optional correction sensors (e.g., those used to monitor ambient air and/or fluid temperature, humidity, and the like).
  • a controller also may have an interface module to send and receive signals (information) from a higher level tool controller, machine or production floor system.
  • Real time measurement results may be displayed by controller and / or used as feedback signals for an automated closed loop tool or machine control system. This way the targeted parameter(s) of an object under test may be automatically controlled and maintained within technologically required limits. Voltage/current output of the RFG can be adjusted depending on electrical and physical properties of the object under test. For example, for measuring the thickness of a conductive metal film, higher excitation coil current/voltage provides increased sensitivity and resolution of the sensing system.
  • Data processing system can analyze information from RFG, sensors SI to SN and the control system.
  • the results define specific Resonance Frequency Fro and voltage amplitude Uo for each "object - sensor" system.
  • the MDS Multichannel Data processing System
  • the MDS made conversion of values Fro and Vo in measurement units of the targeted physical or chemical parameters like film thickness, liquid constituencies concentration, layer permittivity and so on. This conversion for two parameters may be illustrated by next system of equations:
  • X is the first targeted parameter (like film thickness)
  • Y is the second parameter (like wafer bulk conductivity)
  • kl l and kl2 are frequency weight coefficients
  • k21 and k22 are output voltage weight coefficients.
  • the coefficients kl l, k21, kl2 and k22 are usually found by using a calibration method and then can be retrieved from the MDS memory where they are regularly stored.
  • Calibration procedure comprises measurements of reference samples having known values of targeted parameter(s) and calculation statistically meaningful weight coefficients using acquired data.
  • Example 1 Test on bare silicon wafer and on the same wafer covered by 5000 A thick aluminum film
  • FIG. 15 depicts a scope screen shot of output signal 151 of an impedance sensor over a range of frequencies 32 MHz to 43 MHz in presence of bare silicon wafer.
  • the resonant frequency is 33.8 MHz
  • the resonant amplitude is 10067 mV.
  • Line 152 is the amplitude frequency curve for the same impedance sensor in presence of the same silicon wafer covered by 5000 A thick aluminum film. In this case, the resonance frequency is 41 MHz and the resonant amplitude is 1673 mV.
  • Comparison of lines 151 and 152 shows, that the resonance frequencies and particularly the voltage amplitudes are very different. This example illustrates the high sensitivity of the novel impedance sensing system according to present invention.
  • Fig. 16 depicts a graph of the test results at different conditions: 161- when there was no liquid in the sampler, 162- when the sampler was filled with distilled water, and 163- when sampler was filled with tap water.
  • the distilled water compared with the empty sampler showed only relatively small change in the output amplitude of the sensor. There was larger shift in resonance frequency from 12.5MHz for the empty vessel compared to 1 lMHz for distilled water. However, the tap water drastically changed both amplitude and resonance frequency. This result is understandable because resistively of distilled water at 25°C is about 18.2-40 ⁇ -cm and tap water is usually below 0.1 ⁇ -cm.
  • This Example demonstrates a very high sensitivity of the novel impedance sensing system and indicates that even small contamination of a liquid object can be detected and quantified.
  • the frequencies in the range of 17 to 20 MHz were chosen for an impedance sensor.
  • the amplitude-frequency response was measured for different concentrations of NaCl.
  • FIG. 17 depicts a graph of results of these measurements.
  • solutions containing different concentrations of NaCl are clearly distinguishable from each other.
  • Distilled water filled diamonds
  • the highest amplitude at a frequency of about 19.6 MHz the lowest concentration of NaCl produced amplitude less than that of distilled water, and with increasing concentrations of NaCl, the amplitude decreased, and the frequency of the maximum amplitude decreased until a concentration of 0.1% was achieved.
  • a 1% solution of NaCl produced amplitude greater than that observed for the next lower concentrations.
  • FIG. 18 depicts dependence of impedance sensor's resonant amplitude when concentration of NaCl is measured.
  • FIG. 19 depicts the same dependence when NaCl concentration is represented in logarithmic scale.
  • FIG. 20 presents tests results of aluminum film thickness measurement (depicted in the
  • a sensing system used an open core resonance sensor similar to shown in FIG.
  • Frequency range was set from 34 MHz to 43 MHz.
  • the start point in the plot corresponds to a bare silicon wafer with no aluminum film.
  • FIG. 21 depicts the same results where aluminum film thickness is represented in logarithmic scale.
  • mercury One of the most dangerous contaminants in drinking water is mercury. This contamination is highly topical even at very small concentrations. Therefore, we carried out a series of experiments to measure mercury (Hg) concentrations in water.
  • the frequency range was found at which concentration of ions of mercury (Hg+) in distilled water make a significant change in the amplitude - frequency characteristic.
  • This frequency defines L, C and R reference values for a coil design.
  • the measuring coil can be constructed per well known design rules with consideration of the particular lay-out. Also, to achieve maximum sensitivity, it can be desirable to maintain self-capacitance C at minimum for the measuring circuit. The next experiments were conducted with the above mentioned sensor.
  • FIG. 22 is a graph depicting amplitude-frequency characteristics (AFC) for samples with different concentration of Hg+ in distilled water. Test results clearly demonstrated the ability of an impedance sensing system of this invention to measure Hg+ concentration in distilled water at levels as low as 1 ppb (part per billion).
  • Example 6 Decreased Sensitivity of IRT-Sensor if Resonant Circuit Includes a Capacitor
  • FIG. 23 depicts a graph of amplitude frequency response (AFR) curves obtained using an IRT-sensor which has approximately four times fewer winds than the sensor in Example 3 and with the addition of a 20pF capacitor. Using this modified sensor with the added capacitor, we found, quite expectedly, that the amplitude-frequency relationships for each of the NaCl solutions were nearly identical, with a noted absence of change in either the amplitude or the frequency at which the maximum amplitude was observed.
  • AFR amplitude frequency response
  • FIG. 24 depicts maxima of Amplitude Frequency Response curve's for sensors with and without the added capacitor.
  • embodiments having added capacitors open circles
  • useful signals resonant frequency and amplitude variation
  • impedance resonance sensor systems without the added capacitance showed a very wide range of useful signals.

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Abstract

A resonance type impedance sensor which is a multicoil open-core or air-core inductor, said sensor comprising at least two coils, one coil being an excitation coil connectable to at least one alternating current source with frequency sweep, another coil being a sensing coil connectable to at least one data processing system, wherein upon electrical connection to said current source, said excitation coil propagates an energy to said sensing coil, which generates a probing electromagnetic field, and wherein L C R parameters of said sensing coil are capable of providing resonance conditions for measuring of object under test impedance at predetermined frequency.

Description

IMPEDANCE SENSING SYSTEMS AND METHODS FOR USE IN MEASURING
CONSTITUENTS IN SOLID AND FLUID OBJECTS
Claim of Priority
This application claims priority to US Provisional patent Application Serial No. 61/244,584 entitled "Impedance sensors and their use for analyzing object's compositions" filed September 22, 2009. The above-identified Provisional Application is fully incorporated herein by reference.
Statement regarding federally sponsored research
Not Applicable
Reference to microfiche Appendix
Not Applicable Field of the Invention
This invention relates to a new extremely sensitive kind of electrical sensors that makes possible measurement of physical characteristics, detection and quantification of constituencies of solids, bulk materials and fluids. More particularly, the new sensor technology allows for new realtime non-contact methods for measurement, detection and quantification of components in said materials regardless of its conductivity, transparency and reflectivity under most environmental condition to apply Impedance Resonance Spectroscopy.
Short Description of the invention
An electrical resonance sensor that can be used in array of similar by design sensors, where each sensor comprises two coils, one of which is excitation coil and the other is sensing coil and in electromagnetic coupling with object under test works at predetermined resonant frequency that was chosen for providing strong correlation of sensor indication with a parameter of interest in radiofrequency range (RF); and the method of using said sensors to measure the physical characteristics and/or composition of the subject under test without contact in real-time.
Background
Human society is in continuous search for inexpensive versatile technology that can in realtime without contact monitor numerous technological process, environment, food production, public safety and medical procedures. For example: semiconductor and photovoltaic industries need an advanced process monitoring devices during entire fabrication of Integrated Circuits (IC), flat panel displays and solar panels. Starting from measuring properties of bare wafers and other substrates, monitoring film thickness during various deposition and polishing processes as well as final IC testing requires constant process monitoring and measurements. Agriculture, food, chemical and pharmaceutical industries are interested in sensing technology to monitor different physical characteristics of organic and inorganic materials, liquids and compositions of numerous constituencies within natural limits. This invention is about a new extremely sensitive sensor system that is a core for new measuring method that is applicable to broad range of conductive, semiconductive and dielectric materials.
SUMMARY
In one aspect, the invention provides a resonance type impedance sensor which is a multicoil open-core or air-core inductor, the sensor comprising at least two coils, one coil being an excitation coil connectable to at least one alternating current source with frequency sweep, another coil being a sensing coil connectable to at least one data processing system, wherein upon electrical connection to said current source, the excitation coil propagates an energy to the sensing coil, which generates a probing electromagnetic field and wherein L C R parameters of the sensing coil are capable of providing resonance conditions for measuring of object under test impedance at predetermined frequency. Various embodiments and variants are provided and contemplated.
In another aspect, the invention provides an impedance sensing system for non-contact and non-invasive measuring and analyzing of targeted chemical and physical properties of gaseous, fluid and solid objects comprising: (A) at least one resonance type impedance sensor described above; (B) at least one alternating current source with frequency sweep electrically connected to said at least one excitation coil; (C) said at least one data processing system in communication with said at least one sensing coil, wherein L C R parameters of said sensing coil provides resonance conditions for measuring of object under test impedance at predetermined frequency; and (D) a control system in communication with said alternating current source and said data processing system. Various embodiments and variants are provided.
In yet another aspect, the invention provides a method of measuring chemical and physical properties of an object by a resonance type impedance sensor, the method comprising:
(A) measuring self-resonance frequency and amplitude of said sensor(s); (B) placing an object under test comprising at least one analyte;
(C) measuring resonant frequency and amplitude of sensor in the presence of said object;
(D) calculating changes in amplitude and resonant frequency induced by electromagnetic interaction between said sensor and object to determine impedance of said object under test; and (E) matching said impedance with predetermined calibration data to determine said chemical or physical properties of said object under test. The preferred impedance sensor is the sensor described in the sensor aspect of the invention.
It is often required nondestructive contactless in-situ measurements and/or control of various multi-compositional fluids (e.g. water, blood, slurries, different solvents, etc.) and its monitoring for metallic, organic and nonorganic contamination. It is a very common task for many technological processes in many industries including: chemical, semiconductor, pharmaceutical, medicine, agriculture, food processing, etc. Proposed systems and methods are able to detect very small changes not only in mono-compositional structures and fluids but also in most of multi-composition materials, multi-layers structure and liquids with dissolved and/or homogenized constituencies.
The present invention is directed to sensing system (apparatus) comprising of one or an array
(cluster) of impedance type sensor(s) which is able to create a non-contact probing, primarily by harmonic high frequency electromagnetic fields in an object under test and analyze complex object response to the sensor's probing field.
This invention primarily relates to wide variety sensor systems and methods for measuring physical parameters and/or chemical constituencies and their distribution in targeted composite object: solid, liquid, gaseous or their combination. The invention can be used practically in all industries, including: utilities, agriculture, food, textile, pharmaceutical, photovoltaic and semiconductor, medical devices, chemical and petro-chemical, metallurgy, Homeland Security.
In particular, this invention discloses a structure of novel RF impedance sensing system and sensors for contact-less real-time (in-situ) measurements (analysis) of composition different materials including of thin and thick films and layers during numerous production processes (e.g. PVD, CVD, ECD, CMP, etc.) in Semiconductor, Flat Panel, Photovoltaic and Disk Drive industries, material science, etc. Also, present invention describes a new method and device (apparatus) for testing liquids, solvents and gas analysis in chemical, food processing, Agricultural and other industry fields as well as in testing laboratories.
The sensing system is, actually, scanning an object under test by generating sweeping voltages in the vicinity of pre-selected frequencies. To provide maximum sensitivity and resolution each Impedance sensor is designed to have resonance in presence of the object under test at one of said pre-selected frequencies.
The Impedance sensors are able to monitor number of targeted parameters (characteristic or properties) of the object by measuring object response to the sensor's electromagnetic field variation represented by resonance amplitude (value) change - dV, resonance frequency shift - dFr and in some cases phase angle displacements - d φ at pre-selected set of frequencies.
Data processing unit is able to compare and analyze statistically filtered reaction of object - sensor complex on Impedance sensor outputs (V, dV, and Fr, dFr and φ, d φ). The data processing unit stores in memory reference data and an algorithm of their usage. The reference data are acquired in process (usually named calibration) of measuring similar objects with known properties. The algorithm correlates the sensor output signals with quantified characteristic(s) of the targeted property and can comprise interpolation, solution of a system of equation, search in lookup tables and etc.
According to present invention the in-situ Impedance sensors may be designed as an air core cylindrical or planar inductors in one group of embodiments and as ferrite core inductors according to an another one. Each of these sensors has at least one winding named as an excitation coil and at least one winding named as a sensing coil. The excitation coil is connected (coupled) to an output of RF sweep generator and provides electromagnetic pumping to resonance circuit represented by sensing coil. The sensing coil is generating probing electromagnetic field, perceiving an influence on said field by object under test and transferring information about the influence to multi- channel measuring and data processing (signal analyzing) system.
The Impedance sensors, RF sweep generator and data processing system are designed to function as a high speed closed loop self - tuning system continuously searching for a resonance frequency of a system (unity) sensor - object complex, calculating and presenting targeted parameters and characteristics of the object in-real time (on-line) mode.
The present invention is believed to have an advantage of high sensitive impedance measurements using electrical resonance circuit and advantage of Electrochemical Impedance Spectroscopy and Dielectric Relaxation Spectroscopy which provide method of defining optimal operating frequencies for impedance measurements.
High sensitivity impedance measurements are achieved by using refined resonance circuit composed of coil only. Target parameters of impedance measurements are active capacitance and capacitive reactance of object under test, so highest sensitivity can be achieved by minimizing, as much as possible, self resistance and self capacitance of sensing coil. Another improvement is using of excitation coil for transferring energy to sensing coil by excluding generator source's impedance influence on sensing resonance circuit.
State of the art assumes using plurality of frequencies for determining chemical and/or physical properties by measuring electrical impedance properties of an object, but nobody mentioned how the frequencies are chosen. The present invention discloses a new advanced approach. To determine an operating frequency for each impedance sensor of the sensing system an impedance spectrometer is used.
The procedure for constructing of composition sensing system is described below:
A) preparing a set of samples with known composition of target constituents that cover possible variations of object under test;
B) determining an electrical impedance spectrum for each of said samples by scanning over a wide frequency range;
C) analyzing of said spectra to find set of frequencies, at which difference between said spectra correlates with change of target constituents portion and said constituents contribute to impedance with different proportion, wherein number of selected frequencies should be at least equal to number of explored constituents;
D) constructing a set of sensors with operating frequencies based on the results of step C;
E) assembling said set of sensors in proximity to object under test;
F) collecting and storing calibration data using set of samples prepared at the step A; and
G) elaborating and implementing a data processing algorithm.
The above described improvements allowed constructing novel measuring sensor with highest possible sensitivity in RF. The figures 17 and 23 illustrate sensitivity scale of traditional and proposed methods. The proposed sensor system and measurement method increased significantly sensitivity over all known electrical methods. The improvement in sensitivity level is different from a case to case dependant on application. For some applications sensitivity improvement could be measured by factors not percentages.
BRIEF DESCRIPTION OF THE DRAWINGS
This invention is described with reference to specific embodiments thereof. These and other features and advantages of the present invention will be apparent to those skilled in the art from the following detailed description of preferred embodiments and with the accompanying drawings, in which. FIG. 1 depicts a simplified equivalent circuit of an Impedance sensor of this invention and object under test response.
FIG. 2 illustrates response of dielectric object under test to vortex electric field for the object located outside of a sensor.
FIG. 3 illustrates response of dielectric object under test to vortex electric field for the object located inside of a sensor.
FIG. 4 illustrates response of conductive object under test to vortex electric field for the object located outside of a sensor.
FIG. 5 illustrates response of dielectric object under test to linear electric field for the object located inside a sensor.
FIG. 6 depicts a sectional view of one embodiment of the impedance sensor (cylindrical type) of the present invention.
FIG. 7 depicts a sectional view of another embodiment of the impedance sensor (bobbin type) of the present invention.
FIG. 8 depicts another embodiment of the present invention for testing flowing in the pipe liquid and comprising an array of Impedance sensors having tree different frequencies.
FIG. 9 depicts a general view of another embodiment of the Impedance sensors array of the present invention comprising two bypass sections wherein properties of fluid under test may be monitored by several different impedance sensors (the bypass section can be periodically empty for calibration and correction for wall deposit).
FIG. 10 depicts a sectional view of another embodiment of the impedance sensor (ferrite pot type) of the present invention for measuring solid object.
FIG. 11 depicts a sectional view of another embodiment of the impedance sensor (ferrite pot type) of the present invention for measuring liquids and bulk materials.
Fig. 12 depicts an embodiment of non-contact sensor device of this invention for measuring liquids and bulk materials with excitation and sensing coils embracing object under test.
Fig. 13 depicts a general view of an embodiment of a planar sensor of the present invention.
FIG. 14 depicts a block diagram of the sensing system according to the present invention;
FIG. 15 depicts scope screen shot of output signals of an impedance sensing system of the present invention for a bare silicon wafer and for the same silicon wafer covered by 5000 A thick aluminum film.
FIG. 16 depicts a graph illustrating test results of a sensing system of the present invention for samples of distilled water and tap water. FIG. 17, FIG. 18, and FIG. 19, depict graphs illustrating test results of a sensing system of the present invention for samples of distilled water and water having different concentrations of sodium chloride (NaCl) in the frequency range of 17 - 20 MHz.
FIG. 20 and FIG. 21 depicts graphs illustrating test results of measurements with sensing system of this invention for silicon wafers having different thicknesses of aluminum film.
FIG. 22 depicts a graph illustrating test results of a sensing system of the present invention for measuring mercury contamination in water.
FIG. 23 depicts a graph of amplitude/frequency response curves for solutions of water containing different concentration NaCl in the frequency range of 17 - 20 MHz for a sensor of this invention with a 20pF capacitor.
FIG. 24 depicts maxima of amplitude/frequency response curves as a function of the concentration of NaCl in water for embodiments of this invention having a 20pF capacitor and for a sensor system without added capacitance. DETAILED DESCRIPTION
Certain patents disclosed apparatus and methods to measure fluid constituencies using electrical resonance circuits. US patent 7,219,024 describes measurements density and moisture content using electromagnetic probing. US patent 6,511,851 discloses method for identifying changes in the composition of liquid using resonance frequency circuit. International patent application WO 2008076453 disclosed sensor using its inductor and capacitor for monitoring ethanol/alcohol content of the vehicle engine fuel. United States Patent Application 20080143345 disclosed inductive sensor for automotive urea solution monitoring device deployed in conjunction with the urea tank of a selective catalytic reduction vehicle.
Other patents disclosed apparatus and methods to measure physical and chemical characteristics and their distributions using Electrochemical Impedance Spectroscopy (EIS) and Dielectric Relaxation Spectroscopy (DRS). USPTO Patent Application 20090027070 discloses a dual cell Electrochemical Impedance System (EIS) testing apparatus and method for measuring coating integrity on various substrates. US patent 4,433,286 discloses identification of materials using their complex dielectric response. US patent 7,514,938 discloses dielectric relaxation spectroscopy apparatus and method of use, for non-invasive determination of presence or concentration of an analyte in the sample.
There are numerous measuring techniques suggested for measuring thickness, uniformity, composition and contamination of thin and thick layers. Optical methods, like ellipsometry, are common in the semiconductor industry. They are mostly used for measurements of transparent layers. The X-ray technique is expensive, associated with safety issues and has limited application in production lines.
Other methods include AC and DC point probes, capacitive sensors (US patent 7,332,902), inductive Eddy current technology (US patent publications 200501566042 and 20090079424) and others are dependent on a variety of factors that are difficult to control. Enhancements of Inductive and RF Impedance analyzing methods are disclosed in several patents (e.g., US 6,593,738 and US 6,891,380). Electrically based methods either require electrical connections to the measured thin layer that often affect the measured object or are noncontact, and are slow and have a low sensitivity.
It is believed that the optical methods often cannot be reliably used when measuring opaque or nontransparent layers and stacks of transparent layers. Things are further complicated by optical properties of the measured layers (the index of refraction, extinction coefficient, etc.) and by the surface roughness of the measured and/or underlying layers.
Furthermore, the techniques known in the art are unable to measure thicknesses of targeted individual layer(s) inside composite multi-layer objects with high accuracy. Most of those known techniques are limited by one or a combination of shortcomings such as speed of measurement, optical properties and material's conductivity. In addition, some of these techniques are destructive and/or require a direct contact which is highly undesirable.
Optical, X-ray and existing Impedance spectroscopy devices are bulky, overly expensive and not ready for in- situ type measurements.
While the present invention is not limited to any specific theory, traditionally a sensitive resonance circuit is an electrical circuit composed of at least two elements: inductor and capacitor electrically connected to each other. In order to maximize sensitivity of resonance circuit to electrical impedance of an object under test it was believed to be necessary to minimize capacitance and resistance of the resonance circuit. The inventors have unexpectedly discovered that the traditional electrical circuit, composed of inductor and capacitor, may be replaced by an inductor alone. The said inductor (induction coil) should be coreless or an open core type to serve as sensing element. The sensing coil is a main part of the inductor and its parameters define operating frequency of invented sensor. Sensor's sensitivity can be further increased by using monolayer coil with substantial step between turns or using basket winding to decrease self capacitance of sensing coil. While the invention is not limited to any specific theory, another significant feature that is believed to have contributed to high sensitivity of the invented sensor is an electrical separation of AC current source from the sensing coil; it is in order to exclude or minimize the influence of source impedance on the sensor's sensitivity. That was achieved by using excitation coil for electromagnetically transferring energy from source of AC current to sensing coil.
Another important aspect of our sensor design that was never introduced in prior art is a requirement for high input impedance of the data processing module. To achieve high sensor sensitivity the input impedance should be extremely high (for example, our data acquisition unit has 10 ϋΩ input resistance). Correctness of such requirement can be proven by formula: W = V2/R where,
W - energy dissipated on input resistance of data acquisition,
V - voltage of useful signal (for our DAQ it is 0.5 - 11 V)
R - input resistance of instrumentation connected to sensing coil (for example DAQ)
From above formula, it is obvious that energy dissipation is smaller when higher input resistance is used. For example, when we are replacing 10ϋΩ DAQ by standard oscilloscope (even with 10 ΜΩ attenuator) a drastic sink in sensor sensitivity is observed.
There are several patents (US patent 4058766, US patent 4433286, US patent 6669557, 7219024) mentioned use a plurality of frequencies for determining different chemical and physical features of different objects through the measuring electrical impedance, but none of the patent described criteria for defining frequencies in use. Present invention uses phenomenon of changing impedance property with changing of frequency for searching optimal operating frequencies for sensors of composition sensing systems. Information about object's impedance at frequencies, found using impedance spectroscopy, make it possible to built a system of invented impedance sensors to determine composition of liquid solutions, gas mixtures, solid composite objects, multilayer objects or for monitoring changing in such object composition.
FIG. 1 depicts a simplified equivalent circuit of an Impedance sensor of this invention and object under test response. Impedance sensor is depicted with solid lines. It comprised of alternating current source with frequency sweep 11, excitation coil 12, sensing coil 13, and data processing system 14. The excitation coil function is pumping the sensing coil with electromagnetic energy and a separate a sensing resonance circuit from impedance of alternating current source.
Sensitive resonance circuit of this invention consists of sensing coil only and may be described by parameters of this coil: inductance, inter-turn capacitance, and active resistance.
Impedance sensor design according to aspects of the present invention provides a low capacitance value. It can be desirable to reduce capacitance to the lowest possible practical value.
A sensing coil is coupled with high impedance (preferably in the range of about 107 to about 1015 Ω) input of data processing system.
Analyze of the equivalent circuit of impedance sensor of present invention shows that output current from sensing coil is usually very small (in the range 10"6 - 10~14 A).
Response of object under test is depicted with dashed lines. Reactions of the object can be represented by three equivalent electrical circuits: 15, 16, and 17.
Alternating magnetic field of sensing coil generates vortex electric field E and this field, in its turn, induces vortex currents of different type.
If a sensing coil is positioned in close proximity to a dielectric solid object, the equivalent circuit 15 consists of resulting parameters L, R, and C. Impedance of circuit 15 reflects resistance to vortex displacement currents generated by vortex electric field E and energy dissipation occurs due to alternating dielectric polarization (FIG. 2).
The same resulting parameters reflect response generated by vortex displacement currents in a tube filled by dielectric fluid. In this embodiment, an object is depicted surrounded by a sensing coil (FIG. 3).
For conductive objects, both solid and fluid, the equivalent electrical circuit 16 can have only two resulting parameters L and R. These parameters consider resistance to both vortex conductive and ionic current flows caused by vortex electric field E and energy dissipation occurs due to eddy currents (FIG. 4).
Alternating linear electric field E of sensing coil also induces linear currents of different type. Conductive and dielectric objects create capacitive coupling of sensor and object and this relationship is presented by equivalent electrical circuit 17. The impedance reflects an object's resistance to linear conductive currents, displacement currents, or ionic currents generated by a potential gradient in a sensing coil (FIG. 5) or potential difference between coil and object under test (not illustrated).
Description of Embodiments Referring now to FIG. 6, that shows a sectional view of one embodiment of the present invention that can be bobbinless or may have a support member 63 which is generally formed as a short tube made from non-conductive material with minimum electrical permittivity (ε ~ 2) at high RF frequency, such as fluoropolymers. The support member 63 should have thin walls to further minimize sensor capacitance.
The first (upper) section of the support member 63 carries an excitation coil 61 which may have only one or few turns of relatively thick cupper wire. One terminal of the excitation coil is connected to ground and second one to low impedance output of RF sweep generator (not shown).
Second section of the support member carries a sensing coil 62. This coil is wound by thinner copper wire than excitation coil. Also, the distance between turns of this coil can be made variable, so the capacitance and inductance of the coil can be mechanically tuned (changed). In this way, the operating frequency of the impedance sensor can be adjusted.
A first terminal of the sensing coil 62 is depicted close to excitation coil 61 and is also connected to the ground. A second terminal of sensing coil is coupled to a high impedance input of multi-channel measuring and data processing system. An end part of the sensing coil 62 is positioned in close proximity to an object 64 under test, which may be solid or fluid. Excitation and sensing coils are wound in opposite directions, so as to obtain the same direction of magnetic field for both coils during transfer energy from the excitation coil to the sensing coil and to provide their electrical separation.
Depending on coils' diameter and number of sensing coil turns the embodiment can have wide range of operating frequencies. The range can be divided in two diapasons: a. operating frequencies < 50MGz that are used for measuring conductive objects and b. operating frequencies 50MHz - 1 GHz that are used for measuring dielectric and semi conductive objects.
An alternative support member design for Impedance sensor is shown in FIG 7. A "bobbin type" support member 73 makes it possible to provide a higher number of turns in the sensing coil 72 and use thinner wire for this coil. Excitation coil 71 has one turn only. The hole in the center of the bobbin is designed for using this sensor with an optical displacement (proximity) sensor 74 to control distance from the coil to film 76 deposited on substrate 75.
There are many applications of present invention related to thickness measurement of thin insulative, conductive and semi conductive layers of wafer, flat panel displays, solar panels, etc. Distance (or gap) between an impedance sensor and targeted layer in the object under test is a critical factor in these cases. FIG. 8 depicts a general view of another embodiment of the present invention wherein an array comprising three impedance sensors 81 -83 operating at different frequencies. The sensor array of this embodiment is able to monitor at least three constituents in liquids of the interest the same time.
The bobbin-type embodiment with coils of the impedance sensors are installed on sections of pipe 84 carrying a liquid (gas or bulk material) under test. The sensors can be positioned at distances one from other far enough to avoid substantial mutual interference or cross-talk. Also, sensors could operate alternatively. In some embodiments, the distance can be at least equal to or more than the radius of a larger neighboring bobbin.
Each of Impedance sensors in the array in this embodiment has its own (individual) operating frequency specific for each targeted constituent. The sensor array is connected to a controller of the Impedance sensing system (not shown).
FIG. 9 depicts a sectional view of another embodiment of the present invention wherein a sensor array monitoring flowing fluid (e.g. a liquid) which has included therein constituents of interest. The fluid is flowing through a large diameter dielectric pipe (e.g., 3" or more) or conductive pipe 97 of any diameter. The impedance sensors 93, 94, 95, and 96 are mounted on two smaller bypassing pipes, 91 and 92, (number of bypasses could vary) whose diameters can be configured depending on the application. Each of the sensors has its own resonance frequency specific for each targeted constituent of interest.
This embodiment shows an advantage of using bypass tubes whose diameters match to the optimum diameter of impedance sensor coils (inductance / operating frequency) required for measuring targeted constituent. Also, bypass tubes help by providing suitable distances between sensors working in a close resonance frequency range. Cross-talk and interaction between several impedance sensors can be minimized in this embodiment.
The bypasses can incorporate open and close valves to allow periodic maintenance including calibration and cleaning wall deposits.
FIG. 10 depicts a sectional view of another embodiment of the present invention in which both excitation coil 101 and sensing coil 102 are placed inside of a ferrite half-pot 103. In this embodiment, an impedance sensor may be positioned in close proximity to the object 104 under test (e.g., like a substrate with deposited metal layer 105). The ferrite pot in this embodiment is open to the object and provides high magnetic flux to the object under test.
In further embodiments, other shapes of the ferrite cores, such as single "I", "C" or "U" or "E" shapes may be used depending on application requirements. In any case, ferrite cores can increase sensitivity of an impedance sensor, especially, working with conductive and low resistivity objects.
FIG. 11 depicts a sectional view of another embodiment of the present invention in which sensor is the same as on FIG. 10, but mounted on the wall of vessel 114, which can contains liquid state or bulk material object under test 115. The sensor comprises excitation coil 111 and sensing coil 112 are placed inside of a ferrite half-pot 113.
FIG. 12 depicts an embodiment of a vessel type, non-contact sensor device of this invention (with excitation and sensing coils embracing object under test) for measuring liquids, gases and bulk materials. This device consists of controllable RF sweep generator 121, excitation coil 122, sensing coil 123, data acquisition 124, and controller 125 with data processing system.
FIG. 13 depicts a general view of another embodiment of the present invention wherein an impedance sensor is configured as two concentric planar inductors. An inner inductor is a sensing coil with many turns where one terminal 131 is grounded and a second terminal 132 can be connected to the controller (not shown). An outer inductor can be an excitation coil grounded from one side 131 and connected to an alternating current source with frequency sweep at other side 133.
A planar impedance sensor can be made by lithography method with both inductors deposited on solid rigid or flexible isolative substrate. This sensor design has several advantages like small size, simple mounting (attaching) to objects like pipe and low cost.
FIG. 14 depicts another embodiment of the present invention in which an array of N impedance sensors is connected to a system controller. FIG. 14 depicts a simplified block diagram of a sensing system with controller of this invention.
Excitation coils (not shown) of each impedance sensor are connected to outputs of a required number of RF sweep generators (RFG). The sensing coils of each sensor are connected to high impedance inputs of a multi-channel data processing system (MDS) in the controller.
Both RFG and MDS are connected to a control system that manages information exchanges, scanning, test - measuring presentation of results and other functions. The control system may have several optional correction sensors (e.g., those used to monitor ambient air and/or fluid temperature, humidity, and the like). A controller also may have an interface module to send and receive signals (information) from a higher level tool controller, machine or production floor system.
Real time measurement results may be displayed by controller and / or used as feedback signals for an automated closed loop tool or machine control system. This way the targeted parameter(s) of an object under test may be automatically controlled and maintained within technologically required limits. Voltage/current output of the RFG can be adjusted depending on electrical and physical properties of the object under test. For example, for measuring the thickness of a conductive metal film, higher excitation coil current/voltage provides increased sensitivity and resolution of the sensing system.
Data processing system can analyze information from RFG, sensors SI to SN and the control system. The results define specific Resonance Frequency Fro and voltage amplitude Uo for each "object - sensor" system. Based upon this information and calibration algorithms the MDS (Multichannel Data processing System) made conversion of values Fro and Vo in measurement units of the targeted physical or chemical parameters like film thickness, liquid constituencies concentration, layer permittivity and so on. This conversion for two parameters may be illustrated by next system of equations:
X x k\ \ + Y x k2\ = Fro
X x k\2 + Y x k22 = Uo
Where X is the first targeted parameter (like film thickness), Y is the second parameter (like wafer bulk conductivity), kl l and kl2 are frequency weight coefficients, k21 and k22 are output voltage weight coefficients.
The coefficients kl l, k21, kl2 and k22 are usually found by using a calibration method and then can be retrieved from the MDS memory where they are regularly stored. Calibration procedure comprises measurements of reference samples having known values of targeted parameter(s) and calculation statistically meaningful weight coefficients using acquired data.
EXAMPLES
The following examples are intended to illustrate different applications of this invention, and are not intended to limit the scope of this invention. Persons of ordinary skill in the art can use the disclosures and teachings of this application to produce alternative embodiments without undue experimentation. Each of those embodiments is considered to be part of this invention.
Example 1: Test on bare silicon wafer and on the same wafer covered by 5000 A thick aluminum film
FIG. 15 depicts a scope screen shot of output signal 151 of an impedance sensor over a range of frequencies 32 MHz to 43 MHz in presence of bare silicon wafer. The resonant frequency is 33.8 MHz, the resonant amplitude is 10067 mV. Line 152 is the amplitude frequency curve for the same impedance sensor in presence of the same silicon wafer covered by 5000 A thick aluminum film. In this case, the resonance frequency is 41 MHz and the resonant amplitude is 1673 mV. Comparison of lines 151 and 152 shows, that the resonance frequencies and particularly the voltage amplitudes are very different. This example illustrates the high sensitivity of the novel impedance sensing system according to present invention.
Example 2: Test on Samples of Distilled and Tap Water
Test fixture for calibration and measurement variable concentration of different constituencies in liquid (water as an example) shown in Fig. 14, where impedance sensor embraces small vessel -sampler, which is preferably made from Teflon.
Fig. 16 depicts a graph of the test results at different conditions: 161- when there was no liquid in the sampler, 162- when the sampler was filled with distilled water, and 163- when sampler was filled with tap water. The distilled water compared with the empty sampler showed only relatively small change in the output amplitude of the sensor. There was larger shift in resonance frequency from 12.5MHz for the empty vessel compared to 1 lMHz for distilled water. However, the tap water drastically changed both amplitude and resonance frequency. This result is understandable because resistively of distilled water at 25°C is about 18.2-40 ΜΩ-cm and tap water is usually below 0.1 ΜΩ-cm.
This Example demonstrates a very high sensitivity of the novel impedance sensing system and indicates that even small contamination of a liquid object can be detected and quantified.
Example 3: Measuring Different Concentrations of NaCl in Water
To determine proper working frequencies for solutions of sodium chloride (NaCl) in water, preliminary studies were carried out by probing the harmonic electromagnetic field over a wide range of working frequencies: 20MHz, 70MHz, 370MHz, and 480MHz. Frequencies in vicinity of 20MHz showed the better results.
The frequencies in the range of 17 to 20 MHz were chosen for an impedance sensor. In the next example, the amplitude-frequency response was measured for different concentrations of NaCl.
FIG. 17 depicts a graph of results of these measurements. As can be seen from the graph of the amplitude-frequency curve, solutions containing different concentrations of NaCl are clearly distinguishable from each other. Distilled water (filled diamonds) produced the highest amplitude at a frequency of about 19.6 MHz, the lowest concentration of NaCl produced amplitude less than that of distilled water, and with increasing concentrations of NaCl, the amplitude decreased, and the frequency of the maximum amplitude decreased until a concentration of 0.1% was achieved. Also, clearly shown is the finding that a 1% solution of NaCl produced amplitude greater than that observed for the next lower concentrations. These results demonstrate the ability of the novel impedance sensing system to measure a wide range of concentrations of liquid constituencies with high resolution.
FIG. 18 depicts dependence of impedance sensor's resonant amplitude when concentration of NaCl is measured. FIG. 19 depicts the same dependence when NaCl concentration is represented in logarithmic scale. Example 4: Measurement of Thickness of Thin Aluminum Films on Silicon Wafers
FIG. 20 presents tests results of aluminum film thickness measurement (depicted in the
Angstroms range). A sensing system used an open core resonance sensor similar to shown in FIG.
7. Frequency range was set from 34 MHz to 43 MHz. The start point in the plot corresponds to a bare silicon wafer with no aluminum film.
FIG. 21 depicts the same results where aluminum film thickness is represented in logarithmic scale.
Example 5: Measurements of Mercury in Water
One of the most dangerous contaminants in drinking water is mercury. This contamination is highly topical even at very small concentrations. Therefore, we carried out a series of experiments to measure mercury (Hg) concentrations in water.
In one group of experiments, the frequency range was found at which concentration of ions of mercury (Hg+) in distilled water make a significant change in the amplitude - frequency characteristic. This frequency defines L, C and R reference values for a coil design. The measuring coil can be constructed per well known design rules with consideration of the particular lay-out. Also, to achieve maximum sensitivity, it can be desirable to maintain self-capacitance C at minimum for the measuring circuit. The next experiments were conducted with the above mentioned sensor.
FIG. 22 is a graph depicting amplitude-frequency characteristics (AFC) for samples with different concentration of Hg+ in distilled water. Test results clearly demonstrated the ability of an impedance sensing system of this invention to measure Hg+ concentration in distilled water at levels as low as 1 ppb (part per billion). Example 6: Decreased Sensitivity of IRT-Sensor if Resonant Circuit Includes a Capacitor
To confirm our conclusion from the above of the role of capacitance of an impedance resonance device in modulating the amplitude-frequency relationships of an embodiment of this invention, we carried out a series of studies using solutions of NaCl, as described in Example 3, but in which the resonant circuit of the device includes a capacitor.
FIG. 23 depicts a graph of amplitude frequency response (AFR) curves obtained using an IRT-sensor which has approximately four times fewer winds than the sensor in Example 3 and with the addition of a 20pF capacitor. Using this modified sensor with the added capacitor, we found, quite expectedly, that the amplitude-frequency relationships for each of the NaCl solutions were nearly identical, with a noted absence of change in either the amplitude or the frequency at which the maximum amplitude was observed.
FIG. 24 depicts maxima of Amplitude Frequency Response curve's for sensors with and without the added capacitor. As it can be distinctly seen, embodiments having added capacitors (open circles) have a substantially narrower range of useful signals (resonant frequency and amplitude variation) compared to sensors without added capacitors. In contrast, according to theory, we found that impedance resonance sensor systems without the added capacitance showed a very wide range of useful signals.
This Example demonstrates that systems and methods of this invention have substantially greater sensitivity than prior art sensing systems. Therefore, use of systems and methods of this invention can provide those responsible for maintaining products free of unwanted contamination.

Claims

We claim:
1. A resonance type impedance sensor which is a multicoil open-core or air-core inductor, said sensor comprising at least two coils, one coil being an excitation coil connectable to at least one alternating current source with frequency sweep, another coil being a sensing coil connectable to at least one data processing system, wherein upon electrical connection to said current source, said excitation coil propagates an energy to said sensing coil, which generates a probing electromagnetic field, and wherein L C R parameters of said sensing coil are capable of providing resonance conditions for measuring of object under test impedance at predetermined frequency.
2. The sensor of claim 1, further comprising said at least one alternating current source with frequency sweep electrically connected to said at least one excitation coil.
3. The sensor of claim 2, further comprising said at least one data processing system in communication with said at least one sensing coil, wherein L C R parameters of said sensing coil provides resonance conditions for measuring of object under test impedance at predetermined frequency.
4. An impedance sensing system for non-contact and non-invasive measuring and analyzing of targeted chemical and physical properties of gaseous, fluid and solid objects comprising:
(A) at least one resonance type impedance sensor of claim 1 ;
(B) at least one alternating current source with frequency sweep electrically connected to said at least one excitation coil;
(C) said at least one data processing system in communication with said at least one sensing coil, wherein L C R parameters of said sensing coil provides resonance conditions for measuring of object under test impedance at predetermined frequency; and
(D) a control system in communication with said alternating current source and said data processing system.
5. The impedance sensing system of claim 4, further comprising a fixture to provide object under test placement in close proximity to said sensor(s), so that electromagnetic field induced by said sensing coil(s) can penetrate into said object under test.
6. A method of measuring chemical and physical properties of an object by a resonance type impedance sensor, said method comprising:
(A) measuring self-resonance frequency and amplitude of said sensor(s);
(B) placing an object under test comprising at least one analyte;
(C) measuring resonant frequency and amplitude of sensor in the presence of said object;
(D) calculating changes in amplitude and resonant frequency induced by electromagnetic interaction between said sensor and object to determine impedance of said object under test; and
(E) matching said impedance with predetermined calibration data to determine said chemical or physical properties of said object under test.
7. The method of claim 6, wherein said sensor is the sensor of claim 1.
8. The sensor of claim 3, wherein said data processing system has high impedance input.
9. The sensor of claim 8, wherein said impedance input is greater than 10ΜΩ.
10. The sensor of claim 2, wherein said alternating current source has an adjustable current output.
11. The sensor of claim 1, wherein said sensor is configured as a cylindrical multicoil inductor.
12. The sensor of claim 11, wherein said cylindrical multicoil inductor has a ferromagnetic open core.
13. The sensor of claim 12, wherein said ferromagnetic core is configured as a half pot core.
14. The sensor of claim 12, wherein said cylindrical multicoil inductor has an adjustable ferromagnetic core.
15. The sensor of claim 1, further comprising a support element, wherein said coils are mounted on said support element.
16. The sensor of claim 15, wherein said multicoil inductor is planar.
17. The sensor of claim 15, wherein said support element is a PCB type or flexible support element.
18. The sensor of claim 11, further comprising a support element said coils configured as multicoil inductor being mounted on said support element.
19. The sensor of claim 18, wherein said support element has low coefficient of electrical permittivity.
20. The sensor of claim 19, wherein said support element comprises fluorinated polymer in contact with said mounted multicoil inductor.
21. The sensor of claim 11, further comprising means for adjusting said sensor's operating frequency.
22. The sensor of claim 21, wherein said means for adjusting are an adjustable inter-turn step.
23. The sensing system of claim 4, further comprising a vessel for containing of said gaseous, liquid or bulk material object under test.
24. The sensing system of claim 23, wherein said at least one sensor is configured to encompass said vessel, said sensor being configured as a cylindrical multicoil inductor.
25. The sensing system of claim 23, wherein said at least one sensor is mounted on the external or internal wall of said vessel.
26. The sensing system of claims 24 or 25, which comprises a section of pipe, said sensor(s) being installed on said section of pipe.
27. The sensing system of claims 24 or 25, further comprising at least one bypass tubing or a group of channels, said sensor(s) being installed on said at least one bypass tubing or a group of channels
28. The sensing system of claim 4, further comprising means for measuring environmental conditions outside of test object to provide reference information usable to compensate measurement error.
29. The sensing system of claim 28, wherein said means for measuring environmental conditions comprise at least one additional impedance sensor.
30. The method of claim 7, further comprising monitoring of time-related changes in impedance and correlating said chemical or physical properties of said object under test to said time- related changes in impedance.
31. The sensor of claim 1, further comprising a phase detector in communication with said alternating current source and said data processing system.
32. The method of claim 6, further comprising providing the sensor of claim 23, and measuring amplitude and phase shift at fixed frequency which is near resonance frequency of said sensor.
33. The method of claim 7, further comprising applying additional external influence(s) on said object under test to improve sensitivity of said sensing system.
34. The method of claim 33, wherein said additional external influence(s) is selected from the group consisting of UV, IR, magnetic field, electrostatic field, and acoustics wave (ultra sound).
35. The sensor of claim 1, wherein said sensing coil and said excitation coil are spatially separated from one another.
PCT/US2010/049824 2009-09-22 2010-09-22 Impedance sensing systems and methods for use in measuring constituents in solid and fluid objects WO2011038003A1 (en)

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JP2012530993A JP5666597B2 (en) 2009-09-22 2010-09-22 Impedance sensing system and method for use in the measurement of components of solid and fluid objects
CA2775144A CA2775144C (en) 2009-09-22 2010-09-22 Impedance sensing systems and methods for use in measuring constituents in solid and fluid objects
CN201080047815.5A CN102575998B (en) 2009-09-22 2010-09-22 Impedance sensing system and method for measuring composition of solid and liquid objects
EP10776852.5A EP2480878B1 (en) 2009-09-22 2010-09-22 Impedance sensing systems and methods for use in measuring constituents in solid and fluid objects
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Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8547110B2 (en) 2009-09-22 2013-10-01 Adem, Llc Impedance sensing systems and methods for use in measuring constituents in solid and fluid objects
JP2014003250A (en) * 2012-06-21 2014-01-09 Sumitomo Electric Ind Ltd Semiconductor device manufacturing method and deposition apparatus
US8952708B2 (en) 2011-12-02 2015-02-10 Neovision Llc Impedance resonance sensor for real time monitoring of different processes and methods of using same
US9280761B2 (en) 2011-06-08 2016-03-08 Vidyo, Inc. Systems and methods for improved interactive content sharing in video communication systems
US9316605B2 (en) 2010-09-22 2016-04-19 Delaval Holding Ab Determination of attributes of liquid substances
WO2016126989A1 (en) * 2015-02-04 2016-08-11 Texas Instruments Incorporated Spectrographic material analysis using multi-frequency inductive sensing
US9465089B2 (en) 2011-12-01 2016-10-11 Neovision Llc NMR spectroscopy device based on resonance type impedance (IR) sensor and method of NMR spectra acquisition
US9467412B2 (en) 2012-09-11 2016-10-11 Vidyo, Inc. System and method for agent-based integration of instant messaging and video communication systems
US9528814B2 (en) 2011-05-19 2016-12-27 NeoVision, LLC Apparatus and method of using impedance resonance sensor for thickness measurement
RU2699827C1 (en) * 2015-11-19 2019-09-11 Сэн-Гобэн Гласс Франс Window glass system with emergency signaling
US10490036B2 (en) 2016-08-02 2019-11-26 Saint-Gobain Glass France Alarm pane assembly
US10557877B2 (en) 2016-08-02 2020-02-11 Saint-Gobain Glass France Alarm pane assembly

Families Citing this family (65)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9658178B2 (en) 2012-09-28 2017-05-23 General Electric Company Sensor systems for measuring an interface level in a multi-phase fluid composition
US9589686B2 (en) 2006-11-16 2017-03-07 General Electric Company Apparatus for detecting contaminants in a liquid and a system for use thereof
US9538657B2 (en) 2012-06-29 2017-01-03 General Electric Company Resonant sensor and an associated sensing method
US10914698B2 (en) 2006-11-16 2021-02-09 General Electric Company Sensing method and system
US9536122B2 (en) 2014-11-04 2017-01-03 General Electric Company Disposable multivariable sensing devices having radio frequency based sensors
US10539524B2 (en) * 2006-11-16 2020-01-21 General Electric Company Resonant sensing system and method for monitoring properties of an industrial fluid
US9389296B2 (en) * 2012-07-26 2016-07-12 General Electric Company Method for sensor reader calibration
US8542023B2 (en) 2010-11-09 2013-09-24 General Electric Company Highly selective chemical and biological sensors
US9488635B2 (en) * 2010-12-21 2016-11-08 The Hong Kong University Of Science And Technology Pore structure analyzer based on non-contact impedance measurement for cement-based materials
US8542024B2 (en) * 2010-12-23 2013-09-24 General Electric Company Temperature-independent chemical and biological sensors
GB201115612D0 (en) * 2011-09-09 2011-10-26 Pilkington Group Ltd Measuring a property of molten glass
US20130073097A1 (en) * 2011-09-19 2013-03-21 Dennis Vidovich Area soil moisture and fertilization sensor
WO2013112214A2 (en) 2011-10-18 2013-08-01 California Institute Of Technology Efficient active multi-drive radiator
US9687169B2 (en) * 2011-12-08 2017-06-27 Kimberly-Clark Worldwide, Inc. System, controller, and method for determining conductance of an object
US9921255B2 (en) 2012-02-13 2018-03-20 California Institute Of Technology Sensing radiation metrics through mode-pickup sensors
US9686070B2 (en) 2012-02-17 2017-06-20 California Institute Of Technology Dynamic polarization modulation and control
US9621269B2 (en) 2012-07-26 2017-04-11 California Institute Of Technology Optically driven active radiator
US10598650B2 (en) 2012-08-22 2020-03-24 General Electric Company System and method for measuring an operative condition of a machine
US9746452B2 (en) 2012-08-22 2017-08-29 General Electric Company Wireless system and method for measuring an operative condition of a machine
US10684268B2 (en) 2012-09-28 2020-06-16 Bl Technologies, Inc. Sensor systems for measuring an interface level in a multi-phase fluid composition
JP6312118B2 (en) * 2013-05-16 2018-04-18 学校法人東京理科大学 Electric characteristic measuring apparatus, electric characteristic measuring method and program
US9410910B1 (en) 2013-05-23 2016-08-09 D-2 Inc. Hybrid conductivity sensor
WO2015118532A1 (en) 2014-02-05 2015-08-13 Vayyar Imaging Ltd System devise and method for testing an object
CN103940859B (en) * 2014-05-13 2016-07-27 爱德森（厦门）电子有限公司 A kind of method of antiresonant circuit capacitance detecting nonmetallic materials discontinuity
EP3005942A1 (en) * 2014-10-08 2016-04-13 ARISTOTLE UNIVERSITY OF THESSALONIKI- Research Committee Method for the detection and characterisation of bubbles in liquids and device therefor, resp.system
US20160121452A1 (en) * 2014-10-31 2016-05-05 Ebara Corporation Polishing apparatus and polishing method
AU2015268746B2 (en) * 2014-12-30 2017-09-07 Ge Infrastructure Technology Llc Sensing method and system
RU2621271C2 (en) * 2015-01-12 2017-06-01 Федеральное государственное казенное военное образовательное учреждение высшего образования "Военный учебно-научный центр Военно-Морского Флота "Военно-морская академия имени Адмирала флота Советского Союза Н.Г. Кузнецова" Device for investigation of hydro-physical characteristics and properties of fluids and method of its application
US10739287B2 (en) 2015-01-15 2020-08-11 Transtech Systems, Inc. Measurement and monitoring of physical properties of material under test (MUT) from a vehicle
DE102015201023B4 (en) * 2015-01-22 2016-09-15 Siemens Healthcare Gmbh MR field probes with additional turns to improve homogeneity and to limit the measurement volume
US10545107B2 (en) 2015-04-26 2020-01-28 Vayyar Imaging Ltd System, device and methods for measuring substances' dielectric properties using microwave sensors
US11016173B2 (en) 2015-04-27 2021-05-25 Vayyar Imaging Ltd. System and methods for calibrating an antenna array using targets
WO2016174680A1 (en) 2015-04-29 2016-11-03 Vayyar Imaging Ltd System, device and methods for localization and orientation of a radio frequency antenna array
US10690760B2 (en) 2015-05-05 2020-06-23 Vayyar Imaging Ltd System and methods for three dimensional modeling of an object using a radio frequency device
US10809372B2 (en) 2015-05-11 2020-10-20 Vayyar Imaging Ltd. System, device and methods for imaging of objects using electromagnetic array
US10290948B2 (en) 2015-08-02 2019-05-14 Vayyar Imaging Ltd System and method for radio frequency penetration imaging of an object
AT517604B1 (en) * 2015-10-06 2017-03-15 Siemens Ag Oesterreich PROBE
CN105488262B (en) * 2015-11-25 2019-06-04 南方电网科学研究院有限责任公司 Design method and system of broadband direct current power resistor
US10436896B2 (en) 2015-11-29 2019-10-08 Vayyar Imaging Ltd. System, device and method for imaging of objects using signal clustering
US10060895B2 (en) * 2015-12-27 2018-08-28 Light of Detection, Ltd. Devices and methods for identifying a biological or chemical residue in an liquid sample
JP6779633B2 (en) * 2016-02-23 2020-11-04 株式会社荏原製作所 Polishing equipment
US9902068B1 (en) * 2016-12-29 2018-02-27 Texas Instruments Incorporated Impedance signature analyzer to control automated actions
CN107192759B (en) * 2017-06-09 2019-08-27 湖南大学 A kind of photovoltaic cell lossless detection method and system based on induction optical heat radiation
CN109307688B (en) * 2017-07-27 2021-06-01 通用电气公司 Sensing system and method
CN108226830B (en) * 2018-01-05 2020-09-08 重庆大学 Resonance unit for reinforcing radio frequency energy and array structure thereof
KR102125246B1 (en) * 2018-03-20 2020-06-24 한양대학교 에리카산학협력단 Sensor assembly for detecting corrosion of building structure and corrosion detecting method using the same
US10908200B2 (en) * 2018-03-29 2021-02-02 Cirrus Logic, Inc. Resonant phase sensing of resistive-inductive-capacitive sensors
JP7301506B2 (en) 2018-08-06 2023-07-03 東芝エネルギーシステムズ株式会社 Eddy current flaw detector and eddy current flaw detection method
KR102541151B1 (en) * 2018-08-31 2023-06-08 건국대학교 산학협력단 Method and apparatus for measuring health status of plants with measuring inductance
KR102528061B1 (en) * 2018-08-31 2023-05-02 건국대학교 산학협력단 Method and apparatus for measuring moisture content of the plant nutrient medium with measuring induced current outside the plant nutrient medium
CN109145513B (en) * 2018-09-30 2023-11-07 南京航空航天大学 Non-contact type force touch sense reproduction system and method based on electromagnetic field combined excitation control
US10883953B2 (en) 2018-10-16 2021-01-05 Texas Instruments Incorporated Semiconductor device for sensing impedance changes in a medium
WO2020131406A1 (en) * 2018-12-19 2020-06-25 Abbott Diabetes Care Inc. Systems, devices, and methods for rf detection of analyte sensor measurements
US11435269B1 (en) 2019-01-03 2022-09-06 Honeywell Federal Manufacturings Technologies, Llc In situ data acquisition and real-time analysis system
US11300534B2 (en) * 2019-09-06 2022-04-12 General Electric Company Monolithic gas-sensing chip assembly and method
CN110672677A (en) * 2019-10-14 2020-01-10 昆明理工大学 On-line fertilizer liquid component detection device and detection method thereof
CN111122392B (en) * 2019-12-04 2021-01-26 北京航空航天大学 Aerosol moisture absorption characteristic comprehensive measurement instrument
CN111343560B (en) * 2020-03-17 2021-06-18 厦门傅里叶电子有限公司 Method for testing and tracking resonant frequency fo of mobile phone loudspeaker
ES2788801A1 (en) * 2020-06-05 2020-10-22 Univ Madrid Politecnica SYSTEM AND METHOD OF MEASURING DEGRADATION OR CONTAMINATION OF FLUIDS BY MEANS OF A HOLLOW-CORE INDUCTIVE SENSOR (Machine-translation by Google Translate, not legally binding)
DE102020132286A1 (en) 2020-07-23 2022-01-27 AST (Advanced Sensor Technologies) International GmbH Sensor device and method for detecting at least one property of a medium
CN112557260A (en) * 2020-11-24 2021-03-26 北京信息科技大学 Metal wear particle detection sensor and detection method based on high-permeability iron core
DE102021103803A1 (en) 2021-02-18 2022-08-18 Technische Universität Chemnitz, Körperschaft des öffentlichen Rechts Device and method for detecting material-internal mechanical states of a workpiece
CN113125314A (en) * 2021-04-08 2021-07-16 北京信息科技大学 High-sensitivity metal wear particle detection sensor wrapped with high-permeability material
CN113916943B (en) * 2021-10-11 2024-03-01 国家海洋技术中心 Seawater conductivity measurement method and system
CN116294415B (en) * 2023-04-06 2024-09-24 珠海格力电器股份有限公司 Refrigerator control method and device and refrigerator

Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1566042A (en) 1924-12-17 1925-12-15 Frank A Schmidt Safety tread
US2583724A (en) * 1948-05-08 1952-01-29 Socony Vacuum Oil Co Inc Magnetic flowmeter
GB1471480A (en) * 1973-07-23 1977-04-27 Inst Elektroswarki Patona Contactless inductance interface pickup
US4058766A (en) 1976-06-21 1977-11-15 Agridustrial Electronics, Inc. Multiple-frequency permittivity tester
US4433286A (en) 1979-04-09 1984-02-21 Georgetown University Identification of materials using their complex dielectric response
US6448795B1 (en) * 1999-02-12 2002-09-10 Alexei Ermakov Three coil apparatus for inductive measurements of conductance
US6511851B1 (en) 1997-04-16 2003-01-28 Kaiku Limited Identifying changes in composition of liquids
US6593738B2 (en) 2001-09-17 2003-07-15 Boris Kesil Method and apparatus for measuring thickness of conductive films with the use of inductive and capacitive sensors
US6669557B2 (en) 1997-04-09 2003-12-30 Case, Llc Apparatus for measuring parameters of material
US6891380B2 (en) 2003-06-02 2005-05-10 Multimetrixs, Llc System and method for measuring characteristics of materials with the use of a composite sensor
US7219024B2 (en) 2004-05-26 2007-05-15 Transtech Systems, Inc. Material analysis including density and moisture content determinations
US7332902B1 (en) 2004-11-02 2008-02-19 Environmental Metrology Corporation Micro sensor for electrochemically monitoring residue in micro channels
US20080143345A1 (en) 2006-12-18 2008-06-19 Idir Boudaoud Liquid level and composition sensing systems and methods using EMF wave propagation
WO2008076453A1 (en) 2006-12-18 2008-06-26 Schrader Electronics Ltd. Fuel composition sensing systems and methods using emf wave propagation
WO2008145188A1 (en) * 2007-05-31 2008-12-04 Endress+Hauser Conducta Gesellschaft Für Mess- Und Regeltechnik Mbh+Co. Kg Inductive conductivity sensor
US20090027070A1 (en) 2006-02-14 2009-01-29 Ndsu Research Foundation Electrochemical impedance spectroscopy method and system
US20090079424A1 (en) 2007-09-25 2009-03-26 General Electric Company Electromagnetic resonance frequency inspection systems and methods
US7514938B2 (en) 2004-05-11 2009-04-07 Board Of Regents Of The University And College System Of Nevada, On Behalf Of The University Of Nevada, Reno Dielectric relaxation spectroscopy apparatus and methods of use

Family Cites Families (76)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2061018C3 (en) * 1970-12-11 1974-05-02 Laukien Guenther Process for recording spin resonance spectra and a suitable spin resonance spectrometer
US4334604A (en) * 1979-03-15 1982-06-15 Casino Investment Limited Coin detecting apparatus for distinguishing genuine coins from slugs, spurious coins and the like
SU903795A1 (en) * 1980-01-04 1982-02-07 Предприятие П/Я Р-6303 Device for cleaning electrographic plates
SU960616A1 (en) * 1981-01-04 1982-09-23 Предприятие П/Я А-3869 Eddy-current resonance converter
SU1408391A1 (en) * 1986-06-18 1988-07-07 Московский Инженерно-Физический Институт Probe for meausuring the magnetic field of solid resonators
DE3817574A1 (en) * 1988-05-24 1989-11-30 Fraunhofer Ges Forschung Vortex flow sensor
US5242524A (en) * 1990-05-16 1993-09-07 International Business Machines Corporation Device for detecting an end point in polishing operations
US5132617A (en) * 1990-05-16 1992-07-21 International Business Machines Corp. Method of measuring changes in impedance of a variable impedance load by disposing an impedance connected coil within the air gap of a magnetic core
US5213655A (en) * 1990-05-16 1993-05-25 International Business Machines Corporation Device and method for detecting an end point in polishing operation
US5091704A (en) * 1991-03-12 1992-02-25 Chrysler Corporation Oscillator having resonator coil immersed in a liquid mixture to determine relative amounts of two liquids
US5550478A (en) * 1991-03-12 1996-08-27 Chrysler Corporation Housing for flexible fuel sensor
US5343146A (en) * 1992-10-05 1994-08-30 De Felsko Corporation Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil
US5516399A (en) * 1994-06-30 1996-05-14 International Business Machines Corporation Contactless real-time in-situ monitoring of a chemical etching
US5541510A (en) * 1995-04-06 1996-07-30 Kaman Instrumentation Corporation Multi-Parameter eddy current measuring system with parameter compensation technical field
US5559428A (en) * 1995-04-10 1996-09-24 International Business Machines Corporation In-situ monitoring of the change in thickness of films
US5660672A (en) * 1995-04-10 1997-08-26 International Business Machines Corporation In-situ monitoring of conductive films on semiconductor wafers
US5644221A (en) * 1996-03-19 1997-07-01 International Business Machines Corporation Endpoint detection for chemical mechanical polishing using frequency or amplitude mode
US5770948A (en) * 1996-03-19 1998-06-23 International Business Machines Corporation Rotary signal coupling for chemical mechanical polishing endpoint detection with a strasbaugh tool
US5659492A (en) * 1996-03-19 1997-08-19 International Business Machines Corporation Chemical mechanical polishing endpoint process control
US5663637A (en) * 1996-03-19 1997-09-02 International Business Machines Corporation Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool
SE508354C2 (en) * 1996-07-05 1998-09-28 Asea Atom Ab Method and apparatus for determining layer thickness
EP0819944A1 (en) * 1996-07-16 1998-01-21 Lucent Technologies Inc. Eddy current sensor
AU1405199A (en) * 1997-11-14 1999-06-07 Jentek Sensors, Inc. Multiple frequency quantitative coating characterization
US6163154A (en) * 1997-12-23 2000-12-19 Magnetic Diagnostics, Inc. Small scale NMR spectroscopic apparatus and method
WO1999058989A1 (en) * 1998-05-12 1999-11-18 Jentek Sensors, Incorporated Methods for utilizing dielectrometry signals using estimation grids
JPH11337656A (en) * 1998-05-25 1999-12-10 Sumitomo Special Metals Co Ltd Method and device for detecting metal
US6404199B1 (en) * 1998-11-25 2002-06-11 Philips Medical Systems (Cleveland), Inc. Quadrature RF coil for vertical field MRI systems
FR2795524B1 (en) * 1999-06-23 2001-08-03 Commissariat Energie Atomique PORTABLE NMR MEASURING DEVICE
US6310480B1 (en) * 1999-09-13 2001-10-30 Foxboro Nmr Ltd Flow-through probe for NMR spectrometers
US6707540B1 (en) * 1999-12-23 2004-03-16 Kla-Tencor Corporation In-situ metalization monitoring using eddy current and optical measurements
US6433541B1 (en) * 1999-12-23 2002-08-13 Kla-Tencor Corporation In-situ metalization monitoring using eddy current measurements during the process for removing the film
KR100718737B1 (en) * 2000-01-17 2007-05-15 가부시키가이샤 에바라 세이사꾸쇼 Polishing apparatus
JP4874465B2 (en) * 2000-03-28 2012-02-15 株式会社東芝 Eddy current loss measurement sensor
US6741076B2 (en) * 2000-04-07 2004-05-25 Cuong Duy Le Eddy current measuring system for monitoring and controlling a CMP process
US6762604B2 (en) * 2000-04-07 2004-07-13 Cuong Duy Le Standalone eddy current measuring system for thickness estimation of conductive films
US6407546B1 (en) * 2000-04-07 2002-06-18 Cuong Duy Le Non-contact technique for using an eddy current probe for measuring the thickness of metal layers disposed on semi-conductor wafer products
US6924641B1 (en) * 2000-05-19 2005-08-02 Applied Materials, Inc. Method and apparatus for monitoring a metal layer during chemical mechanical polishing
US7374477B2 (en) * 2002-02-06 2008-05-20 Applied Materials, Inc. Polishing pads useful for endpoint detection in chemical mechanical polishing
JP3916375B2 (en) * 2000-06-02 2007-05-16 株式会社荏原製作所 Polishing method and apparatus
US6878038B2 (en) * 2000-07-10 2005-04-12 Applied Materials Inc. Combined eddy current sensing and optical monitoring for chemical mechanical polishing
US6920399B2 (en) * 2000-07-10 2005-07-19 Nanoalert (Israel) Ltd. Method and apparatus for determining the composition of fluids
US6602724B2 (en) * 2000-07-27 2003-08-05 Applied Materials, Inc. Chemical mechanical polishing of a metal layer with polishing rate monitoring
US6923711B2 (en) * 2000-10-17 2005-08-02 Speedfam-Ipec Corporation Multizone carrier with process monitoring system for chemical-mechanical planarization tool
TW541425B (en) * 2000-10-20 2003-07-11 Ebara Corp Frequency measuring device, polishing device using the same and eddy current sensor
US6966816B2 (en) * 2001-05-02 2005-11-22 Applied Materials, Inc. Integrated endpoint detection system with optical and eddy current monitoring
US7043402B2 (en) * 2001-12-20 2006-05-09 The Precision Instrument Corp. On-line oil condition sensor system for rotating and reciprocating machinery
US7024268B1 (en) * 2002-03-22 2006-04-04 Applied Materials Inc. Feedback controlled polishing processes
US7128718B2 (en) * 2002-03-22 2006-10-31 Cordis Corporation Guidewire with deflectable tip
DE10216587B4 (en) * 2002-04-14 2004-08-05 Michael Dr. Bruder Unilateral NMR probe for material analysis and its use as a sensor
IL153894A (en) * 2003-01-12 2010-05-31 Nova Measuring Instr Ltd Method and system for thickness measurements of thin conductive layers
US7016795B2 (en) * 2003-02-04 2006-03-21 Applied Materials Inc. Signal improvement in eddy current sensing
US6977503B2 (en) * 2003-02-10 2005-12-20 Quantum Magnetics, Inc. System and method for single-sided magnetic resonance imaging
US7008296B2 (en) * 2003-06-18 2006-03-07 Applied Materials, Inc. Data processing for monitoring chemical mechanical polishing
US7071684B2 (en) * 2003-07-25 2006-07-04 Red Ko Volodymyr Method of non-contact measuring electrical conductivity of electrolytes with using primary measuring transformer
US7074109B1 (en) * 2003-08-18 2006-07-11 Applied Materials Chemical mechanical polishing control system and method
JP4451111B2 (en) * 2003-10-20 2010-04-14 株式会社荏原製作所 Eddy current sensor
US7135870B2 (en) * 2004-05-04 2006-11-14 Kam Controls Incorporated Device for determining the composition of a fluid mixture
KR101078007B1 (en) * 2004-06-21 2011-10-28 가부시키가이샤 에바라 세이사꾸쇼 Polishing apparatus and polishing method
KR100600706B1 (en) * 2004-07-09 2006-07-14 삼성전자주식회사 A non-invasive blood glucose sensors using a magneto-resonance absorption method and measurement methods thereof
JP4022628B2 (en) * 2004-08-18 2007-12-19 国立大学法人信州大学 Compounding ratio identification method for composite materials
GB2425842A (en) * 2005-05-05 2006-11-08 Plant Bioscience Ltd Magnetic resonance sensor with rotatable magnetic rods placed around the sample
US20080199359A1 (en) * 2005-07-04 2008-08-21 Senviro Pty Ltd Soil Moisture Sensor
WO2007003218A1 (en) * 2005-07-05 2007-01-11 Commissariat A L'energie Atomique Apparatus for high-resolution nmr spectroscopy and/or imaging with an improved filling factor and rf field amplitude
US7198545B1 (en) * 2005-10-25 2007-04-03 Novellus Systems, Inc. Method of calibration and data evaluation for eddy current metrology systems
KR100660916B1 (en) * 2006-02-09 2006-12-26 삼성전자주식회사 Method of fabricating a semiconductor device including planarizing a conductive layer using parameters of pattern density and depth of trenches
US7912661B2 (en) * 2006-03-31 2011-03-22 Kmg2 Sensors Corporation Impedance analysis technique for frequency domain characterization of magnetoelastic sensor element by measuring steady-state vibration of element while undergoing constant sine-wave excitation
JP4971685B2 (en) * 2006-05-25 2012-07-11 株式会社日立製作所 Nuclear magnetic resonance probe coil
JP5232379B2 (en) * 2006-11-09 2013-07-10 株式会社日立製作所 NMR measurement probe and NMR apparatus using the same
US7836756B2 (en) 2006-12-18 2010-11-23 Schrader Electronics Ltd. Fuel composition sensing systems and methods using EMF wave propagation
NL1033148C2 (en) * 2006-12-29 2008-07-01 Univ Delft Tech Electric measuring device, method and computer program product.
WO2008101161A1 (en) * 2007-02-15 2008-08-21 Delphi Technologies, Inc. Liquid properties sensor circuit
JP5224752B2 (en) * 2007-09-03 2013-07-03 株式会社東京精密 Method and apparatus for predicting completion of polishing
US7821257B2 (en) * 2007-09-03 2010-10-26 Tokyo Seimitsu Co., Ltd Method and device for forecasting/detecting polishing end point and method and device for monitoring real-time film thickness
DE102007054858A1 (en) * 2007-11-16 2009-05-20 Continental Automotive France Method and device for determining a fuel fraction in an engine oil of a motor vehicle
MX2011013486A (en) * 2009-06-26 2012-02-21 Schrader Electronics Ltd Liquid level and quality sensing apparatus, systems and methods using emf wave propagation.
KR101526039B1 (en) 2009-09-22 2015-06-04 아뎀, 엘엘씨 Impedance sensing systems and methods for use in measuring constituents in solid and fluid objects

Patent Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1566042A (en) 1924-12-17 1925-12-15 Frank A Schmidt Safety tread
US2583724A (en) * 1948-05-08 1952-01-29 Socony Vacuum Oil Co Inc Magnetic flowmeter
GB1471480A (en) * 1973-07-23 1977-04-27 Inst Elektroswarki Patona Contactless inductance interface pickup
US4058766A (en) 1976-06-21 1977-11-15 Agridustrial Electronics, Inc. Multiple-frequency permittivity tester
US4433286A (en) 1979-04-09 1984-02-21 Georgetown University Identification of materials using their complex dielectric response
US6669557B2 (en) 1997-04-09 2003-12-30 Case, Llc Apparatus for measuring parameters of material
US6511851B1 (en) 1997-04-16 2003-01-28 Kaiku Limited Identifying changes in composition of liquids
US6448795B1 (en) * 1999-02-12 2002-09-10 Alexei Ermakov Three coil apparatus for inductive measurements of conductance
US6593738B2 (en) 2001-09-17 2003-07-15 Boris Kesil Method and apparatus for measuring thickness of conductive films with the use of inductive and capacitive sensors
US6891380B2 (en) 2003-06-02 2005-05-10 Multimetrixs, Llc System and method for measuring characteristics of materials with the use of a composite sensor
US7514938B2 (en) 2004-05-11 2009-04-07 Board Of Regents Of The University And College System Of Nevada, On Behalf Of The University Of Nevada, Reno Dielectric relaxation spectroscopy apparatus and methods of use
US7219024B2 (en) 2004-05-26 2007-05-15 Transtech Systems, Inc. Material analysis including density and moisture content determinations
US7332902B1 (en) 2004-11-02 2008-02-19 Environmental Metrology Corporation Micro sensor for electrochemically monitoring residue in micro channels
US20090027070A1 (en) 2006-02-14 2009-01-29 Ndsu Research Foundation Electrochemical impedance spectroscopy method and system
US20080143345A1 (en) 2006-12-18 2008-06-19 Idir Boudaoud Liquid level and composition sensing systems and methods using EMF wave propagation
WO2008076453A1 (en) 2006-12-18 2008-06-26 Schrader Electronics Ltd. Fuel composition sensing systems and methods using emf wave propagation
WO2008145188A1 (en) * 2007-05-31 2008-12-04 Endress+Hauser Conducta Gesellschaft Für Mess- Und Regeltechnik Mbh+Co. Kg Inductive conductivity sensor
US20090079424A1 (en) 2007-09-25 2009-03-26 General Electric Company Electromagnetic resonance frequency inspection systems and methods

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
B JEANNERET, J L GAVILANO, G A RACINE, CH LEEMAN AND P MARTINOLI: "Inductiveconductance measurements in two-dimensional superconducting systems", APPLIED PHYSICS LETTERS, vol. 55, no. 22, 27 November 1989 (1989-11-27), pages 2336 - 2338, XP002619112 *

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8547110B2 (en) 2009-09-22 2013-10-01 Adem, Llc Impedance sensing systems and methods for use in measuring constituents in solid and fluid objects
US9316605B2 (en) 2010-09-22 2016-04-19 Delaval Holding Ab Determination of attributes of liquid substances
US9528814B2 (en) 2011-05-19 2016-12-27 NeoVision, LLC Apparatus and method of using impedance resonance sensor for thickness measurement
US9280761B2 (en) 2011-06-08 2016-03-08 Vidyo, Inc. Systems and methods for improved interactive content sharing in video communication systems
US9465089B2 (en) 2011-12-01 2016-10-11 Neovision Llc NMR spectroscopy device based on resonance type impedance (IR) sensor and method of NMR spectra acquisition
US8952708B2 (en) 2011-12-02 2015-02-10 Neovision Llc Impedance resonance sensor for real time monitoring of different processes and methods of using same
JP2014003250A (en) * 2012-06-21 2014-01-09 Sumitomo Electric Ind Ltd Semiconductor device manufacturing method and deposition apparatus
US9467412B2 (en) 2012-09-11 2016-10-11 Vidyo, Inc. System and method for agent-based integration of instant messaging and video communication systems
WO2016126989A1 (en) * 2015-02-04 2016-08-11 Texas Instruments Incorporated Spectrographic material analysis using multi-frequency inductive sensing
US9733231B2 (en) 2015-02-04 2017-08-15 Texas Instruments Incorporated Spectrographic material analysis using multi-frequency inductive sensing
US10338055B2 (en) 2015-02-04 2019-07-02 Texas Instruments Incorporated Spectrographic material analysis based on inductive sensing
RU2699827C1 (en) * 2015-11-19 2019-09-11 Сэн-Гобэн Гласс Франс Window glass system with emergency signaling
US10553087B2 (en) 2015-11-19 2020-02-04 Saint-Gobain Glass France Alarm pane arrangement
US10490036B2 (en) 2016-08-02 2019-11-26 Saint-Gobain Glass France Alarm pane assembly
US10557877B2 (en) 2016-08-02 2020-02-11 Saint-Gobain Glass France Alarm pane assembly

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