WO2010136827A1 - Fault detection system for an ion source of a mass spectrometer - Google Patents

Fault detection system for an ion source of a mass spectrometer Download PDF

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Publication number
WO2010136827A1
WO2010136827A1 PCT/GB2010/050927 GB2010050927W WO2010136827A1 WO 2010136827 A1 WO2010136827 A1 WO 2010136827A1 GB 2010050927 W GB2010050927 W GB 2010050927W WO 2010136827 A1 WO2010136827 A1 WO 2010136827A1
Authority
WO
WIPO (PCT)
Prior art keywords
temperature
rate
block
ion source
ion
Prior art date
Application number
PCT/GB2010/050927
Other languages
French (fr)
Inventor
Eliot Powell
Original Assignee
Micromass Uk Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US12/474,597 external-priority patent/US8119981B2/en
Priority claimed from US12/474,530 external-priority patent/US8487239B2/en
Priority claimed from US12/474,548 external-priority patent/US8536522B2/en
Priority claimed from US12/474,763 external-priority patent/US8084888B2/en
Priority claimed from US12/474,562 external-priority patent/US8598512B2/en
Application filed by Micromass Uk Limited filed Critical Micromass Uk Limited
Publication of WO2010136827A1 publication Critical patent/WO2010136827A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M7/00—Conversion of ac power input into dc power output; Conversion of dc power input into ac power output
    • H02M7/42—Conversion of dc power input into ac power output without possibility of reversal
    • H02M7/44—Conversion of dc power input into ac power output without possibility of reversal by static converters
    • H02M7/48—Conversion of dc power input into ac power output without possibility of reversal by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/0067—Converter structures employing plural converter units, other than for parallel operation of the units on a single load
    • H02M1/008—Plural converter units for generating at two or more independent and non-parallel outputs, e.g. systems with plural point of load switching regulators

Definitions

  • the present invention relates to the field of mass spectrometry.
  • ion sources are required to be heated up to high temperatures in order to provide optimum performance from the ion source.
  • an ion source block may be at temperatures as high as 150°c.
  • a heater is required within the ion source block.
  • a sensor is also placed in the ion source block so as to measure the temperature and prevent overheating.
  • Mass spectrometers are expensive instruments that are in constant use in many laboratories. Powerful heaters are desired to raise the temperature in the ion source up to the desired level as quickly as possible and therefore limit down time of the instrument. Therefore it would be desirable to provide a very powerful heater.
  • This invention provides a fault detection system for protecting a mass spectrometer from the effects of temperature extremes, the system comprising: an ion source block, a thermal source for providing thermal energy to said ion source block, a temperature sensor providing a reading for the temperature of said ion source block, a temperature regulation means for controlling said thermal source in dependence of said reading provided by the temperature sensor and, a control system for monitoring the temperature change produced by said energy provided by said thermal source, and wherein said control system is adapted to monitor the rate of change of said reading provided by said temperature sensor relative to the thermal energy provided to said ion block by said thermal source.
  • the thermal source may be a heater.
  • said control system may have diagnostic ability so that the nature of an indicated fault can be identified.
  • a determinative threshold value may be assigned to the rate of change of said reading provided by said temperature sensor relative to the thermal energy provided to said ion block.
  • said determinative threshold value may be defined by the value x below the lowest rate of change of temperature of the ion source block.
  • Another aspect of the invention provides a method of protecting an ion source block from the effects of temperature extremes which method comprises heating an ion block, monitoring the rate of change of temperature of the ion block, assigning a determinative threshold value to the rate of change and interrupting the heating for a predetermined time if the rate of change is below the threshold for a predetermined time so that the temperature of the ion source can return to be substantially equilibrium with the local ambient temperature and repeating the process if and until upon resumption of heating the rate of change exceeds the threshold.
  • Yet another aspect of the invention provides a method of protecting an ion source from the effects of temperature extremes which method comprises determining the ratio between the slowest known rate of cooling, j°C/min, and the highest rate of heating, k°C/min, of the ion source and, under fault conditions, deactivating a heat source which heats the ion source for k/j longer than the heat source is active.
  • Figure 1 is a drawing of a typical heater control assembly according to the prior art
  • Figure 2 is a schematic drawing of a heater control assembly according to the present invention.
  • Figure 3 is a schematic of the process associated with the present invention.
  • Figure 4 is a graph illustrating the method of the present invention in the circumstance of an error in the temperature sensor.
  • Figure 5 is a graph of temperature against time in the event that the temperature sensor is in full working order.
  • FIG. 1 illustrates a prior art heater control system.
  • the known control system consists of a temperature regulation means (1), a heater (3) and a ion source block (5) with a thermocouple sensor (7) measuring the temperature of the ion source block. Should the sensor fail and give a false low indication of temperature, the control system will normally apply maximum power to the heater indefinitely which may result in overheating and consequent damage to the mass spectrometer .
  • FIG. 2 illustrates a heater control system in accordance with the present invention.
  • the control system consists of a temperature regulation means (9), a heater (11) an ion source block (13) with a thermocouple sensor (15) measuring the temperature of the ion source block and a control system (17) for monitoring the temperature change to the ion source block produced by the heater.
  • the control system (17) by default enables the heater (11) .
  • the available heating power is large and so under all normal circumstances the temperature regulation means will allow the heater to be switched on and the ion source block should undergo a large and measurable rate of change of temperature.
  • the control system starts monitoring only when the temperature regulation means allows the heater to be switched on. Once activated the control system begins to measure the rate of change of temperature of the heated ion source block. If the rate of change of temperature is below a given number X 0 Cs- 1 for y seconds, the control system will conclude that there is a system fault such as the thermocouple or the sensor not being in good thermal contact with the ion source block, or that there is a short circuit across the thermocouple. The control system will then disable the heater. The heater remains disabled for another programmable period of time, z seconds. With knowledge of the system parameters this time period can be set to be sufficient for the heated ion source block to return to approximate equilibrium with the local ambient temperature. Once this time period has elapsed the system can attempt to restart in the event that the fault has been removed.
  • Figure 3 is a state transition diagram illustrating the process of the invention.
  • FIG. 4 illustrates the trip mechanism and error identification in accordance with the invention.
  • the thermocouple in the ion source block has been disconnected from the control electronics and connected into a datalogger.
  • the first trace shows the reading from this datalogger.
  • the control electronics is connected to a thermocouple which is simply at ambient temperature.
  • Figure 5 is a graph of temperature against time in the situation where the temperature sensor is in full working order. It should be apparent from this that the heater will continue until the source has reached optimum temperature at which time the heater is automatically switched off by the control system.
  • the value of X may be determined by measuring the rate of change of temperature when the heater is active under all operating conditions. If the heater is active and the ion block is cold it heats more rapidly than when the heater is active and the ion block is already partly warm. Therefore the actual rate of change of temperature is measured at the maximum operating temperature, because this is the case where the rate of change of temperature is lowest.
  • a series of experiments may determine under which operating conditions the rate of change of temperature is lowest. The lowest rate of change of temperature was determined to be X°C/min. The system may be set to trip if the rate of change of temperature is less than X -2°C/min, so there is little chance of false tripping.
  • the skilled person would appreciate any value below X 0 C would be suitable
  • the value of z may be determined by a series of experiments to find the slowest cooling rate that could ever happen when the heater is inactive.
  • the slowest cooling rate had a time constant of F minutes.
  • a standard engineering rule of thumb is that something has reached 90% of it's final value after 2.2F. The system will never exactly return to ambient temperature, and the vast majority of any cooling has occurred after 2.2 F.
  • the skilled person would appreciate that many other values of z could be used and the system remain effective .
  • Another method comprises finding the ratio between the slowest known rate of cooling (approx J 0 C per min) and the highest rate of heating (approx K 0 C per min) . This ratio is k/j . Accordingly, under fault conditions the heater must be off for k/j longer than it is active.
  • the active time, y is 4 minutes so the inactive time or tripped time must be at least 4k/j minutes.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

A fault detection system for protecting a mass spectrometer from the effects of temperature extremes. The system comprises an ion block, a thermal source for providing thermal energy to the ion source block, a temperature sensor providing a reading for the temperature of the ion source block, a temperature regulation means for controlling the thermal source in dependence of the reading and a control system for monitoring the temperature change produced by the energy source. The control system is adapted to monitor the rate of change of the reading provided by the temperature sensor relative to the thermal energy provided to the ion block.

Description

FAULT DETECTION SYSTEM FOR AN ION SOURCE OF A MASS SPECTROMETER
The present invention relates to the field of mass spectrometry.
BACKGROUND ART
In mass spectrometers ion sources are required to be heated up to high temperatures in order to provide optimum performance from the ion source. Typically an ion source block may be at temperatures as high as 150°c.
In order to attain these temperatures, a heater is required within the ion source block. A sensor is also placed in the ion source block so as to measure the temperature and prevent overheating.
Mass spectrometers are expensive instruments that are in constant use in many laboratories. Powerful heaters are desired to raise the temperature in the ion source up to the desired level as quickly as possible and therefore limit down time of the instrument. Therefore it would be desirable to provide a very powerful heater.
In the event of specific failure modes of a temperature sensor, powerful heaters in the source block may increase the temperature of the source to dangerously high levels at which damage may be caused to the mass spectrometer and to their users. In such circumstances, the mass spectrometer could incorrectly indicate that the temperature in the ion source chamber is below the actual temperature. This results in the heater continuing to heat the ion source, which potentially results in severe damage to the instrument requiring expensive repairs to the instrument.
It is therefore desirable to have a method of identifying faults in the source heater assembly mechanism so as to ensure the source heater will not cause severe damage to the mass spectrometer .
SUMMARY OF THE INVENTION
This invention provides a fault detection system for protecting a mass spectrometer from the effects of temperature extremes, the system comprising: an ion source block, a thermal source for providing thermal energy to said ion source block, a temperature sensor providing a reading for the temperature of said ion source block, a temperature regulation means for controlling said thermal source in dependence of said reading provided by the temperature sensor and, a control system for monitoring the temperature change produced by said energy provided by said thermal source, and wherein said control system is adapted to monitor the rate of change of said reading provided by said temperature sensor relative to the thermal energy provided to said ion block by said thermal source.
According to a feature of the invention, the thermal source may be a heater. According to another feature of the invention, said control system may have diagnostic ability so that the nature of an indicated fault can be identified.
According to a further feature of the invention, a determinative threshold value may be assigned to the rate of change of said reading provided by said temperature sensor relative to the thermal energy provided to said ion block.
According to a still further feature of the invention, said determinative threshold value may be defined by the value x below the lowest rate of change of temperature of the ion source block.
Another aspect of the invention provides a method of protecting an ion source block from the effects of temperature extremes which method comprises heating an ion block, monitoring the rate of change of temperature of the ion block, assigning a determinative threshold value to the rate of change and interrupting the heating for a predetermined time if the rate of change is below the threshold for a predetermined time so that the temperature of the ion source can return to be substantially equilibrium with the local ambient temperature and repeating the process if and until upon resumption of heating the rate of change exceeds the threshold.
Yet another aspect of the invention provides a method of protecting an ion source from the effects of temperature extremes which method comprises determining the ratio between the slowest known rate of cooling, j°C/min, and the highest rate of heating, k°C/min, of the ion source and, under fault conditions, deactivating a heat source which heats the ion source for k/j longer than the heat source is active. BRIEF DESCRIPTION OF THE DRAWINGS
Various embodiments of the present invention will now be described, by way of example only, and with reference to the accompanying drawings in which:
Figure 1 is a drawing of a typical heater control assembly according to the prior art;
Figure 2 is a schematic drawing of a heater control assembly according to the present invention;
Figure 3 is a schematic of the process associated with the present invention;
Figure 4 is a graph illustrating the method of the present invention in the circumstance of an error in the temperature sensor; and
Figure 5 is a graph of temperature against time in the event that the temperature sensor is in full working order.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
Figure 1 illustrates a prior art heater control system. The known control system consists of a temperature regulation means (1), a heater (3) and a ion source block (5) with a thermocouple sensor (7) measuring the temperature of the ion source block. Should the sensor fail and give a false low indication of temperature, the control system will normally apply maximum power to the heater indefinitely which may result in overheating and consequent damage to the mass spectrometer .
Figure 2 illustrates a heater control system in accordance with the present invention. The control system consists of a temperature regulation means (9), a heater (11) an ion source block (13) with a thermocouple sensor (15) measuring the temperature of the ion source block and a control system (17) for monitoring the temperature change to the ion source block produced by the heater. When the system is activated, the control system (17) by default enables the heater (11) . The available heating power is large and so under all normal circumstances the temperature regulation means will allow the heater to be switched on and the ion source block should undergo a large and measurable rate of change of temperature.
The control system starts monitoring only when the temperature regulation means allows the heater to be switched on. Once activated the control system begins to measure the rate of change of temperature of the heated ion source block. If the rate of change of temperature is below a given number X 0Cs-1 for y seconds, the control system will conclude that there is a system fault such as the thermocouple or the sensor not being in good thermal contact with the ion source block, or that there is a short circuit across the thermocouple. The control system will then disable the heater. The heater remains disabled for another programmable period of time, z seconds. With knowledge of the system parameters this time period can be set to be sufficient for the heated ion source block to return to approximate equilibrium with the local ambient temperature. Once this time period has elapsed the system can attempt to restart in the event that the fault has been removed. Figure 3 is a state transition diagram illustrating the process of the invention.
Figure 4 illustrates the trip mechanism and error identification in accordance with the invention. At time 0 the thermocouple in the ion source block has been disconnected from the control electronics and connected into a datalogger. The first trace shows the reading from this datalogger. The control electronics is connected to a thermocouple which is simply at ambient temperature.
The rapid rise of temperature shown between t = 0 and t = 5 is the result of the control electronics applying full power to the ion block heater. After approximately 5 minutes the protection mechanism is activated because the rate of change of temperature as measured by the control electronics is close to zero as the thermocouple connected to the control electronics is measuring ambient temperature which is substantially constant.
At t = 50 the system has allowed enough time for the ion source block to cool and an attempt is made to regain control should the fault now have been removed.
At t = 70 the switching on of the desolvation heater simply raises the local ambient temperature to about 1200C from about 300C.
The system has several attempts to regain control until at about t = 220 the thermocouple measuring the source ion block is reconnected to the control electronics. It remains connected to the datalogger. The heater remains off until the current cooling down period has finished. At about t = 240 the system successfully leaves the error state and the ion source block is correctly regulated to 1400C.
The second trace shows the temperature which the control electronics "sees". After t = 220 there is no further trace line because after this point it sees the real temperature i.e. the first trace line.
Figure 5 is a graph of temperature against time in the situation where the temperature sensor is in full working order. It should be apparent from this that the heater will continue until the source has reached optimum temperature at which time the heater is automatically switched off by the control system.
The value of X may be determined by measuring the rate of change of temperature when the heater is active under all operating conditions. If the heater is active and the ion block is cold it heats more rapidly than when the heater is active and the ion block is already partly warm. Therefore the actual rate of change of temperature is measured at the maximum operating temperature, because this is the case where the rate of change of temperature is lowest. A series of experiments may determine under which operating conditions the rate of change of temperature is lowest. The lowest rate of change of temperature was determined to be X°C/min. The system may be set to trip if the rate of change of temperature is less than X -2°C/min, so there is little chance of false tripping. The skilled person would appreciate any value below X0C would be suitable
The value of y, may be determined by first determining the maximum local ambient temperature. With the desolvation heater on full and with maximum desolvation gas the value for the maximum local ambient temperature was approximately A0C. In experiments to determine x, the maximum rate of change of temperature of the ion source was also determined. This value was found to be approximately C0C per minute. It is desired to prevent the source ion block exceeding B0C. So the maximum time the heater is active is (B-A) /C = D minutes. A value below D minutes should therefore be selected.
The value of z may be determined by a series of experiments to find the slowest cooling rate that could ever happen when the heater is inactive. The slowest cooling rate had a time constant of F minutes. A standard engineering rule of thumb is that something has reached 90% of it's final value after 2.2F. The system will never exactly return to ambient temperature, and the vast majority of any cooling has occurred after 2.2 F. The skilled person would appreciate that many other values of z could be used and the system remain effective .
Another method comprises finding the ratio between the slowest known rate of cooling (approx J0C per min) and the highest rate of heating (approx K0C per min) . This ratio is k/j . Accordingly, under fault conditions the heater must be off for k/j longer than it is active. The active time, y, is 4 minutes so the inactive time or tripped time must be at least 4k/j minutes.
It would be apparent to the person skilled in the art that the process may equally be applicable for extremely low temperatures in the same way.
OTHER EMBODIMENTS
It will be apparent that various modifications may be made to the particular embodiments discussed above without departing from the scope of the invention.

Claims

1. A fault detection system for protecting a mass spectrometer from the effects of temperature extremes, the system comprising: an ion source block, a thermal source for providing thermal energy to said ion source block, a temperature sensor providing a reading for the temperature of said ion source block, a temperature regulation means for controlling said thermal source in dependence of said reading provided by the temperature sensor and, a control system for monitoring the temperature change produced by said energy provided by said thermal source, and wherein said control system is adapted to monitor the rate of change of said reading provided by said temperature sensor relative to the thermal energy provided to said ion block by said thermal source.
2. A fault detection system as claimed in claim 1 wherein said thermal source is a heater.
3. A fault detection system as claimed in claim 1 wherein said control system has diagnostic ability so that the nature of an indicated fault can be identified.
4. A fault detection system as claimed in claim 1 wherein a determinative threshold value is assigned to the rate of change of said reading provided by said temperature sensor relative to the thermal energy provided to said ion block by said thermal source
5. A fault detection system as claimed in claim 4 wherein said determinative threshold value is defined by the value x below the lowest rate of change of temperature of the ion source block.
6. A method of protecting an ion source block from the effects of temperature extremes which method comprises heating an ion block, monitoring the rate of change of temperature of the ion block, assigning a determinative threshold value to the rate of change and interrupting the heating for a predetermined time if the rate of change is below the threshold for a predetermined time so that the temperature of the ion source can return to be substantially equilibrium with the local ambient temperature and repeating the process if and until upon resumption of heating the rate of change exceeds the threshold.
7. A method of protecting an ion source from the effects of temperature extremes which method comprises determining the ratio between the slowest known rate of cooling, j°C/min, and the highest rate of heating, k°C/min, of the ion source and, under fault conditions, deactivating a heat source which heats the ion source for k/j longer than the heat source is active.
PCT/GB2010/050927 2009-05-29 2010-06-01 Fault detection system for an ion source of a mass spectrometer WO2010136827A1 (en)

Applications Claiming Priority (10)

Application Number Priority Date Filing Date Title
US12/474,597 US8119981B2 (en) 2009-05-29 2009-05-29 Mass spectrometer
US12/474,530 2009-05-29
US12/474,597 2009-05-29
US12/474,530 US8487239B2 (en) 2009-05-29 2009-05-29 Mass spectrometer
US12/474,562 2009-05-29
US12/474,548 US8536522B2 (en) 2009-05-29 2009-05-29 Mass spectrometer
US12/474,763 US8084888B2 (en) 2009-05-29 2009-05-29 Method for the production of high amplitude RF voltages with control of the phase angle between outputs
US12/474,562 US8598512B2 (en) 2009-05-29 2009-05-29 Mass spectrometer and method of mass spectrometry
US12/474,548 2009-05-29
US12/474,763 2009-05-29

Publications (1)

Publication Number Publication Date
WO2010136827A1 true WO2010136827A1 (en) 2010-12-02

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Application Number Title Priority Date Filing Date
PCT/GB2010/050924 WO2010136824A1 (en) 2009-05-29 2010-06-01 Improvements in the performance of an ion source for use with a mass spectrometer
PCT/GB2010/050928 WO2010136828A2 (en) 2009-05-29 2010-06-01 A method for the control of phase locked rf generators in the operation of mass spectrometers
PCT/GB2010/050927 WO2010136827A1 (en) 2009-05-29 2010-06-01 Fault detection system for an ion source of a mass spectrometer
PCT/GB2010/050925 WO2010136825A1 (en) 2009-05-29 2010-06-01 Detachable and replaceable ion source for a mass spectrometer
PCT/GB2010/050926 WO2010136826A1 (en) 2009-05-29 2010-06-01 A method of deriving improved data from a mass spectrometer

Family Applications Before (2)

Application Number Title Priority Date Filing Date
PCT/GB2010/050924 WO2010136824A1 (en) 2009-05-29 2010-06-01 Improvements in the performance of an ion source for use with a mass spectrometer
PCT/GB2010/050928 WO2010136828A2 (en) 2009-05-29 2010-06-01 A method for the control of phase locked rf generators in the operation of mass spectrometers

Family Applications After (2)

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PCT/GB2010/050925 WO2010136825A1 (en) 2009-05-29 2010-06-01 Detachable and replaceable ion source for a mass spectrometer
PCT/GB2010/050926 WO2010136826A1 (en) 2009-05-29 2010-06-01 A method of deriving improved data from a mass spectrometer

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023105214A1 (en) * 2021-12-08 2023-06-15 Micromass Uk Limited A temperature monitoring system

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106206238B (en) * 2016-08-30 2018-06-05 聚光科技(杭州)股份有限公司 Change wimble device and method
CN111351309B (en) * 2020-03-11 2022-04-15 合肥美的电冰箱有限公司 Refrigeration equipment and fault detection method, control method and processing device thereof

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0488371A2 (en) * 1990-11-30 1992-06-03 Shimadzu Corporation Mass spectrometer ion source

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA558420A (en) * 1954-11-12 1958-06-03 A. Ramey Robert Magnetic amplifier for control purposes
US3046490A (en) 1959-08-13 1962-07-24 Philco Corp Synchronized oscillator control system
JPS54109895A (en) * 1978-02-17 1979-08-28 Hitachi Ltd Ion source
JPH0821360B2 (en) * 1987-05-29 1996-03-04 東京エレクトロン株式会社 Ion implanter
JP2622128B2 (en) * 1987-10-20 1997-06-18 キヤノン株式会社 Vibration wave motor device
US5118938A (en) * 1989-12-20 1992-06-02 Nippon Oil Company, Limited Rydberg atom impact type ion source
US5737203A (en) 1994-10-03 1998-04-07 Delco Electronics Corp. Controlled-K resonating transformer
US5684678A (en) 1995-12-08 1997-11-04 Delco Electronics Corp. Resonant converter with controlled inductor
AU2003262188A1 (en) * 2002-04-12 2003-10-27 Northeastern University Matched filtration with experimental noise determination for denoising, peak picking and quantitation in lc-ms
GB0624535D0 (en) * 2006-12-08 2007-01-17 Micromass Ltd Mass spectrometer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0488371A2 (en) * 1990-11-30 1992-06-03 Shimadzu Corporation Mass spectrometer ion source

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023105214A1 (en) * 2021-12-08 2023-06-15 Micromass Uk Limited A temperature monitoring system

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WO2010136825A1 (en) 2010-12-02
WO2010136828A3 (en) 2011-04-14
WO2010136824A1 (en) 2010-12-02
WO2010136828A2 (en) 2010-12-02
WO2010136826A1 (en) 2010-12-02

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