WO2010133488A1

WO2010133488A1 - System and method for observing transverse modes of an optical waveguide

Info

Publication number: WO2010133488A1
Application number: PCT/EP2010/056507
Authority: WO
Inventors: Stéphane BLIN; Monique Thual; Thanh Nam Nguyen; Duc Minh Nguyen; Philippe Rochard; Thierry Chartier
Original assignee: Universite De Rennes 1; Centre National De La Recherche Scientifique (Cnrs)
Priority date: 2009-05-18
Filing date: 2010-05-11
Publication date: 2010-11-25
Also published as: FR2945637B1; FR2945637A1

Abstract

The invention relates to a method for observing transverse modes of an optical waveguide in which a series of optical signals with different wavelengths are injected at one end of the optical waveguide. For each optical signal, an optical image (E202) of the optical signal is captured using an optical sensor including a plurality of elementary surfaces x_i,j. The optical power x_k,i,jreceived for each wavelength is obtained (E209) for each elemental surface x_i,j. A Fourier transform (E213) of the optical powers x_k,i,j is carried out according to the wavelength in order to identify (E214) interferences between each pair of existing modes. Said interferences are used to calculate the intensity profiles of the modes and the optical power thereof.

Description

Method and system for observing transverse modes of an optical guide

The present invention relates to a method and a system for observing transverse modes of an optical guide.

Optical guides such as optical fibers are an essential support for guided light propagation. Some optical fibers are multi-mode, i.e., light can propagate in different transverse modes, each having a characteristic spatial pattern and a characteristic propagation constant. Multimodal propagation may be advantageous in some situations but is in most cases deleterious.

Currently, slightly multi-mode optical fibers are increasingly common for the realization of power fiber laser sources.

Increasing the diameter of an optical fiber makes it possible to increase the optical power transmitted by the optical fiber. By increasing the diameter of an optical fiber, the optical power is diluted, that is to say that the optical intensity expressed in W / m ² is reduced for the same optical power expressed in W that would be transmitted in a fiber optical of smaller diameter. The effects related to the nonlinearities, or even the damage of the optical fiber related to the propagation of high intensities in the optical fiber, are thus reduced.

Large diameter optical fibers potentially support several transverse modes, and the interaction between these different transverse modes can be particularly problematic for fiber optic lasers. Indeed, these transverse modes degrade the quality of the beam, and can generate new frequencies by mixing waves. It is therefore necessary to be able to observe the transverse modes in order to characterize an optical fiber, or even to extract the energy distribution of each mode, in order to anticipate, for example, the associated degradation of the beam quality at the output of the optical fiber. .

The multimodal behavior is not limited to large diameter fibers. The so-called micro-structured fibers, fibers that have been very popular since the end of the 1990s, make it possible to control many aspects of light. The difficulty of manufacturing these optical fibers often leads to multimodal behavior, even for small diameter fibers, which is also important to observe and quantify. These optical fibers are used in many areas of photonics, such as fiber optic lasers, optical telecommunications, and so on. To guarantee the correct operation of the systems in which these optical fibers are used, it is also necessary to be able to observe the propagation modes in these optical fibers, or even to measure the energy distribution of the light power in the various existing modes.

The object of the invention is to solve the drawbacks of the prior art by proposing a method and a system which make it possible in a simple and inexpensive way to observe the transverse modes of an optical guide.

To this end, according to a first aspect, the invention proposes a method for observing transverse modes of an optical waveguide, characterized in that the method comprises the steps of: injection, at one end of the optical waveguide, of a succession of optical signals, each optical signal having a main component at a wavelength λk, with k between 1 and K, different from the wavelengths of the principal components of the other optical signals, for each optical signal having a principal component at a wavelength λk:

capturing an optical image of the optical signal at the other end of the optical guide with the aid of an optical sensor comprising a plurality of elementary surfaces X _1J with i = 1 to 1, j = 1 to J, for each elementary surface X _1J :

obtaining the optical power _{Xk 11J} received by the elementary surface X ₁₀ for each wavelength component λk,

- Fourier transformation of the optical powers Xk, ₁₀ received by the elementary surface X _1D to obtain a representation of amplitudes for several values of differences in group delay,

identification of the amplitude peaks that exist in the representation of amplitudes with several values of group delay differences, each peak corresponding to a transverse mode of the waveguide. Correlatively, the present invention relates to a system for observing transverse modes of an optical guide, characterized in that the system comprises:

means for generating, at one end of the optical waveguide, a succession of optical signals, each optical signal having a principal component at a wavelength λk, with k lying between 1 and K, different from the wavelengths main components of other optical signals,

means for capturing an optical image of the optical signal at the other end of the optical guide by means of an optical sensor comprising a plurality of elementary surfaces X ₁₀ with i = 1 to I, j = 1 to J for each optical signal having a principal component at a wavelength λk; means for obtaining the optical power _{Xk 11J} received by the elementary surface X _1J for each wavelength component λk for each elementary surface X _1J :

Fourier transforming means, for each elementary surface X _1J , of the optical powers _{Xk 11J} received by the elementary surface X _1J in order to obtain a representation of amplitudes with several values of group delay differences,

identification means, for each elementary surface x _lj5, of the amplitude peaks that exist in the representation of amplitudes with several values of group delay differences, each peak corresponding to a transverse mode of the waveguide.

Thus, it is possible to observe in a simple and inexpensive way the transverse modes of an optical guide. Moreover, by obtaining an image of all the elementary surfaces, the characterization time of an optical waveguide is reduced, compared to the iterative observation of elementary surface by elementary surface.

According to a particular embodiment of the invention, prior to the capture of the optical image of the optical signal, the optical signal is magnified. Thus, it is possible to observe small diameter optical fibers or to improve the accuracy of the image capture.

According to a particular embodiment of the invention, the intensities of each transverse mode are determined.

Thus, it is possible to quantify the optical power contained in each of the existing transverse modes.

According to one particular embodiment of the invention, the optical signals transmitted at one end of the optical guide are generated by a broadband optical source associated with an optical filter successively tuned to the wavelength of each principal component. Thus, the cost of the system is reduced.

According to a particular embodiment of the invention, each optical signal transmitted at one end of the optical guide is generated by an optical source delivering an optical signal whose main component has a single wavelength.

Thus, it is possible to scan more accurately the optical spectrum. The accuracy of the analysis is thus improved.

The characteristics of the invention mentioned above, as well as others, will appear more clearly on reading the following description of an exemplary embodiment, said description being made in connection with the attached drawings, among which: FIG. . 1 shows the transverse mode observation system of an optical guide according to the present invention; FIG. 2 represents an algorithm for observing transverse modes of a waveguide according to the present invention and for quantifying the power contained in each mode. Fig. 1 shows the system for observing transverse modes of an optical guide according to the present invention.

The transverse mode observation system of an optical guide comprises an adjustable optical source SO, an optical guide FO, if necessary a lens L consisting of at least one lens, an image capture device CA and a control and treatment device 10.

The adjustable optical source SO is for example an optical source delivering an optical signal whose principal component is at a wavelength controlled by the control and processing device 10 or is a broadband optical source associated with an optical filter provided on a wavelength controlled by the control and processing device 10. The optical filter is for example a filter based on thin layers and / or interferometric cavities.

The signal delivered by the adjustable optical source SO is transmitted in the optical waveguide FO to be characterized. The optical guide FO is preferably a micro-structured optical fiber or not. The length of the optical fiber is at least greater than a few centimeters so that the different group propagation times of the different modes can be distinguished after Fourier transform. If necessary, opposite the output of the optical waveguide FO to be characterized, is placed a lens L consisting of at least one lens.

The function of the objective is to magnify the image of the output of the FO waveguide at the level of the CA image capture device.

The image capture device CA is for example a CCD sensor or a digital camera or a digital camera comprising a CCD sensor or any other non-digital imaging device. The image capture device CA consists of elementary elements such as, for example, pixels of a CCD sensor.

It should be noted here that the lens L and the CA image capture device can be united in a single device. Each shooting and / or transfer of each shot is controlled and / or controlled by the control and processing device 10.

The control and processing device 10 is adapted to perform from one or more software modules the steps of the algorithm as described with reference to FIG. 2. The control and processing device 10 is, without limitation, a computer. The control and processing device 10 comprises a communication bus 101 to which are connected a processor 100, a non-volatile memory 102, a random access memory 103, a communication interface 106 with the image capture device CA and the optical source adjustable SO and a human-machine interface consisting of at least one keyboard, a screen or a speaker not shown in FIG. 1.

The control and processing device 10 receives, from the image capture device CA, the values recorded for each elementary surface of the image capture device CA.

The non-volatile memory 102 stores the software modules implementing the invention, as well as the data making it possible to implement the algorithm which will be described hereinafter with reference to FIG. 2.

More generally, the programs according to the present invention are stored in storage means. This storage means is readable by the microprocessor 100. This storage means is integrated or not to the control and processing device 10, and can be removable.

When the control and processing device 10 is turned on, the software modules according to the present invention are transferred into the random access memory 103 which then contains the executable code of the invention as well as the data necessary for the implementation of the invention.

The screen allows the visualization of the different transverse modes observed in the optical waveguide to be characterized and the display of the transmitted optical powers in these modes. Fig. 2 represents an algorithm for observing transverse modes of a waveguide according to the present invention and for quantifying the power contained in each mode.

More specifically, the present algorithm is executed by the processor 100 of the control and processing device 10. In the step E200, the processor 100 initializes the variable k to the value 1. The variable k is used to vary the length of the wave λk of the optical signal delivered by the adjustable optical source SO. In the next step E201, the processor 100 controls the transfer, via the interface 106, of a command for the adjustable optical source SO to deliver an optical signal of wavelength λk.

In the following step E202, the processor 100 controls the reading, via the interface 106, of the optical power received by each elementary surface Xk, _ij of the AC sensor of size I * J to the length of wave λk, with i varying from 1 to I and j varying from 1 to J.

In the following step E203, the optical power received by each elementary surface Xk, i _j is stored in the RAM 103. It should be noted here that for the wavelength λ _k , in a single operation, the optical powers received by all the elementary surfaces of the AC sensor are received by the control and processing device 10.

In the next step E205, the processor 100 checks whether k is equal to K, the total number of wavelengths to be analyzed by the system. If k = K, the processor 100 proceeds to step E205. If not, the processor

100 goes to step E204, increments the variable k and returns to step E202. In step E206, the processor 100 initializes the variable i to the value 1. In the next step E207, the processor 100 initializes the variable j to the value 1. In the next step E208, the processor 100 initializes the variable k at the value 1. At the next step E209, the processor 100 reads the optical power received by the elementary surface Xk, i _j stored in step E203.

In the next step E210, the processor 100 inserts the optical power Xk, i _j received by the elementary surface X _11J into a curve representative of the variations of the optical power received by the elementary surface X _11J as a function of the wavelength. λk of the optical signal. This curve is for example displayed on the screen of the control and processing device 10.

Different transverse modes can propagate in the FO optical guide, each mode is characterized by a group index of its own. Thus, two different modes propagate at different speeds and can thus interfere with the output of the optical guide FO. The interference state varies sinusoidally as a function of the wavelength and the curve thus formed is representative of a fluted spectrum.

Alternatively, the processor 100 does not execute step E210 and proceeds from step E209 to step E210.

In the next step E211, the processor 100 checks whether k is equal to K. If k = K, the processor 100 proceeds to step E213. If not, the processor 100 proceeds to step E212, increments the variable k, and returns to step E209.

In step E213, the processor 100 executes a Fast Fourier Transform (FFT) on the different values read for the elementary surface X _1J . The Fourier transform allows to isolate the interferences at different periods and to extract the transverse profiles of different pairs of modes by observing the amplitude of the interferences at different periods. Indeed, the period of these interferences is characteristic of the difference in group speed between the modes. The Fourier transform makes it possible to have a representation of amplitudes with several values of group delay differences.

In the next step E214, the processor 100 identifies the interferences.

For this, the processor 100 identifies the amplitude peaks that exist in the representation of amplitudes with several values of group delay differences.

Each peak thus corresponds to the interference between two transverse modes of the waveguide.

In the next step E215, the processor 100 determines the profiles in intensity and optical power of the two transverse modes corresponding to each peak of the Fourier transform. Let B (i) be the Fourier transform as a function of t, a group time difference between two modes (or any other proportional or inversely proportional variable) obtained in step E213. The amplitude B (t) obtained for the elementary surface X _1D, to determine the optical intensities II and 12 in X _1J of the two modes interfere with a period t by the formula: IT = _1J SOrHnIe intensities of the elemental surface X _1J at all wavelengths k

H _1J = _1J * 1 / (1 + ((l-sqrt (l-4 * (5 (0/5 (0)) ² )) / (2 ^ (0/5 (0))) ² )

H _1J = IT _1J * ((1-sqrt (1-4 * (5 (0/5 (0)) ² )) / (2 ^ (0/5 (0))) ² / (1 + ((l -sqrt (l- 4 * (B (i) / B (0) f)) / (2 * B (t) / B (0)) f) where sqrt () is the square root of (). following step E216, the processor 100 checks whether j is equal to J.

If J = J, the processor 100 proceeds to step E218. If not, the processor 100 proceeds to step E217, increments the variable j and returns to step E208.

In the next step E218, the processor 100 checks whether i is equal to I.

If i = I, the processor 100 interrupts the present algorithm. The power ratio between the modes M is then calculated with the

formula M = - ^ -.

The optical guide FO has been characterized. If not, the processor 100 proceeds to step E219, increments the variable i, and returns to step E207. It should be noted here that, alternatively, the iterations at i and j previously described can be avoided. The Fourier transform of all the images can be performed in an iteration by a matrix calculation tool such as the "Matlab ©" tool, thus gaining in speed.

It should also be noted that, alternatively, it is useful to calculate II and 12 for each position t and not only if a peak exists at t. Indeed, the peak may not be present in some elementary surfaces if the intensity of one of the two modes in this elementary surface is zero. Modes are calculated for all values of t. In the end, only those for which a peak indeed exists for a large part of the elementary surfaces are retained. Of course, the present invention is not limited to the embodiments described herein, but encompasses, on the contrary, any variant within the scope of those skilled in the art and particularly the combination of different embodiments of the present invention.

Claims

1) Method for observing transverse modes of an optical guide, characterized in that the method comprises the steps of:

injecting, at one end of the optical waveguide, a succession of optical signals, each optical signal having a principal component at a wavelength λk, with k lying between 1 and K, different from the wavelengths of the principal components other optical signals, for each optical signal having a principal component at a wavelength λk:

- obtaining the optical power Xk _11J received by the elementary surface X ₁₀ for each component of wavelength λk, - Fourier transformation of the optical powers Xk, ₁₀ received by the elementary surface X _1D to obtain a representation of amplitudes several values of group delay differences,

identification of the amplitude peaks that exist in the representation of amplitudes with several values of group delay differences, each peak corresponding to a transverse mode of the waveguide.

2) Method according to claim 1, characterized in that prior to the capture of the optical image of the optical signal, the optical signal is magnified.

3) Method according to claim 1 or 2, characterized in that the method further comprises a step of determining the intensities of each transverse mode.

4) Method according to any one of claims 1 to 3, characterized in that the optical signals transmitted at one end of the optical waveguide are generated by a broadband optical source associated with an optical filter successively tuned to the wavelength of each main component. 5) Method according to any one of claims 1 to 3, characterized in that each optical signal transmitted at one end of the optical guide is generated by an optical source delivering an optical signal whose main component has a single wavelength.

6) A system for observing transverse modes of an optical waveguide, characterized in that the system comprises: means for generating, at one end of the optical waveguide, a succession of optical signals, each optical signal having a component principal at a wavelength λk, with k between 1 and K, different from the wavelengths of the principal components of the other optical signals,

means for capturing an optical image of the optical signal at the other end of the optical guide by means of an optical sensor comprising a plurality of elementary surfaces X ₁₀ with i = 1 to I, j = 1 to J for each optical signal having a principal component at a wavelength λk,

means for obtaining the optical power Xk, i _j received by the elementary surface X _1J for each wavelength component λk for each elementary surface X _1J :

Fourier transforming means, for each elementary surface X _1J , of the optical powers _{Xk 11J} received by the elementary surface X _1J in order to obtain a representation of amplitudes with several values of group delay differences; identifying, for each elementary surface X _1, peaks of amplitudes that exist in the representation of amplitudes with several values of group delay differences, each peak corresponding to a transverse mode of the waveguide.

7) System according to claim 6, characterized in that the optical guide is an optical fiber.

8) System according to claim 6 or 7 characterized in that the optical signals transmitted at one end of the optical guide are generated by a broadband optical source associated with an optical filter tuned successively to the wavelength of each main component. 9) System according to claim 8, characterized in that the optical filter is for example a filter based on thin layers or interferometric cavities.

10) System according to claim 6 or 7 characterized in that each optical signal transmitted at one end of the optical guide is generated by an optical source delivering an optical signal whose main component has a single wavelength.