WO2010107853A2 - Integrated silicon/silicon-germanium magneto-optic isolator - Google Patents
Integrated silicon/silicon-germanium magneto-optic isolator Download PDFInfo
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- WO2010107853A2 WO2010107853A2 PCT/US2010/027564 US2010027564W WO2010107853A2 WO 2010107853 A2 WO2010107853 A2 WO 2010107853A2 US 2010027564 W US2010027564 W US 2010027564W WO 2010107853 A2 WO2010107853 A2 WO 2010107853A2
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
- G02B6/12007—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind forming wavelength selective elements, e.g. multiplexer, demultiplexer
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/09—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on magneto-optical elements, e.g. exhibiting Faraday effect
- G02F1/095—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on magneto-optical elements, e.g. exhibiting Faraday effect in an optical waveguide structure
- G02F1/0955—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on magneto-optical elements, e.g. exhibiting Faraday effect in an optical waveguide structure used as non-reciprocal devices, e.g. optical isolators, circulators
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/29—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the position or the direction of light beams, i.e. deflection
- G02F1/31—Digital deflection, i.e. optical switching
- G02F1/313—Digital deflection, i.e. optical switching in an optical waveguide structure
- G02F1/3132—Digital deflection, i.e. optical switching in an optical waveguide structure of directional coupler type
- G02F1/3133—Digital deflection, i.e. optical switching in an optical waveguide structure of directional coupler type the optical waveguides being made of semiconducting materials
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
- G02B2006/12035—Materials
- G02B2006/12061—Silicon
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
- G02B2006/12133—Functions
- G02B2006/12157—Isolator
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2201/00—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
- G02F2201/06—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 integrated waveguide
- G02F2201/063—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 integrated waveguide ridge; rib; strip loaded
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2202/00—Materials and properties
- G02F2202/36—Micro- or nanomaterials
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2203/00—Function characteristic
- G02F2203/15—Function characteristic involving resonance effects, e.g. resonantly enhanced interaction
Definitions
- the invention is related to microphotonics, and in particular to designs of planar-integrated optical isolators using silicon material.
- Integrated optical isolators namely the devices that allow the transmission of light in only one direction, are necessary to prevent unwanted reflection back into the laser, and are thus an important component in integrated photonic systems.
- Optical isolation for example, unidirectional transmission is typically realized by means of nonreciprocal magneto-optical effects of ferromagnetic materials such as Faraday rotation and nonreciprocal phase shift.
- ferromagnetic materials have lattice constants different from that of silicon and therefore cannot be monolithically grown on a silicon substrate; in addition, ferromagnetic materials are often comprised of ferro-metallic alloys, exotic oxides or semiconductors doped with transition metal ions, none of which is compatible with the standard silicon CMOS fabrication process due to contamination issues.
- magneto-optic isolators are made in bulk garnet-based materials. Such bulk isolators are not amenable to planar integration and their cost is also high since optical-quality crystals are required to maximize the desired magneto-optic effect.
- magneto-optic isolator devices employing hybrid architecture have been demonstrated, in which magnetically active garnet materials are bonded onto a silicon substrate. Compared to such a hybrid design, a monolithic solution requires simpler equipment, is less demanding in terms of fabrication and more cost effective, and is thus a more attractive approach.
- optical isolators that can be monolithically integrated onto a silicon platform have been highly desirable but still remain to be developed.
- a magneto-optical isolator device includes a substrate and a bottom cladding layer that is formed on the substrate.
- An optical resonator structure is formed on the bottom cladding layer.
- the resonator structure includes crystalline or amorphous diamagnetic silicon or silicon-germanium so as to provide non-reciprocal optical isolation.
- a top cladding layer is formed on the resonator structure.
- One or more magnetic layers positioned on the top cladding layer or between the top cladding or bottom cladding layers and the optical resonator structure.
- a method of forming a magneto-optical isolator device includes providing a substrate forming a bottom cladding layer on the substrate and positioning an optical resonator structure on the bottom cladding layer.
- the resonator structure includes crystalline or amorphous diamagnetic silicon or silicon-germanium so as to provide non-reciprocal optical isolation.
- the method includes forming a top cladding layer on the resonator structure.
- the method includes positioning one or more magnetic layers on the top cladding layer or between the top cladding or bottom cladding layers and the optical resonator structure.
- FIG. 1 is a schematic diagram illustrating the inventive magneto-optic isolator device incorporating a resonator structure
- FIGs. 2A-2D are schematic diagrams illustrating the cross-sectional view of the resonator structure of FIG. 1 ;
- FIG. 3 is a graph illustrating the transmission spectra of a magnetically active Si/SiGe resonator
- FIG. 4 is a schematic diagram illustrating an inventive isolator device, having an input and an output waveguides coupled to a Si/SiGe non-reciprocal resonator.
- the invention provides optical isolator designs using silicon/silicon- germanium materials to achieve very low manufacturing cost, compatibility with planar microphotonic integration and possibly scalable performance improvement.
- the invention provides an optical waveguide coupled to a planar optical resonator made of silicon on insulator (SOI) material or silicon-germanium alloy grown on silicon and in the form of micro-ring, micro-disk or micro-racetrack.
- SOI silicon on insulator
- An in-plane magnetic field is applied by patterned permanent ferromagnetic films on both sides of the waveguides comprising the resonator.
- the diamagnetic nature of silicon/silicon-germanium leads to nonreciprocal phase shift in the SOl waveguides, which lifts the degeneracy of counter-propagating resonant modes in the resonator.
- the operating wavelength of the device is specifically chosen to be resonant with backward propagating waves in the resonator; therefore, the back- reflected light is coupled into the resonator and dissipated while the forward- propagating light remains unaffected by the resonator and hence leads to an optical isolation effect.
- the isolator device includes a silicon/silicon- ge ⁇ nanium resonator coupled to two optical waveguides, as well as magnetic films to provide magnetization in silicon.
- the operating wavelength is chosen so that the forward-propagating wave is resonant in the resonator: light from the laser can thus be coupled into the resonator and then coupled into the other waveguide as the output, whereas reflected light remains in one waveguide and cannot be fed back into the laser.
- Silicon is a diamagnetic material and thus has traditionally been regarded as non-magnetically active.
- the measurement has yielded Verdet constant of doped and undoped single crystalline silicon in the range of 12-17 deg/(T*cm) at 1550nm wavelength.
- the Verdet constant of silicon at 1310 and 1550 nm bands can be further improved by addition of germanium to form silicon-germanium alloys. Since silicon-germanium alloys can be monolithically grown on silicon substrate, such compatibility offers significant competitive edge for cost reduction and process improvement over current bulk magneto-optic device.
- FIG. 1 An inventive magneto-optic isolator device 2 incorporating a resonator structure 4 is schematically shown in FIG. 1. It comprises of an optical waveguide 6 for light input 8 and output 10, as well as a magnetically active optical resonator 4 having silicon/silicon-germanium materials, coupled to the optical waveguide 6, and top and bottom cladding layers 12 that formed on a substrate 14.
- a racetrack resonator 4 has been used as an example; however, the same function can be performed with other device geometries including micro-ring and micro-disk resonators.
- the isolator device 2 can include more than one optical waveguide.
- FIGs. 2A-2D show the cross-sectional view of the resonator 4.
- FIG. 2A shows the resonator 4 having a single layer rib/ridge waveguide design having a waveguide core 20 comprising of silicon/silicon-germanium, a top cladding 22, bottom cladding 24, and magnetic films 26 deposited over the top cladding 22.
- the top 22 and bottom cladding layers encompasses the waveguide core.
- the top and bottom cladding 24 layers comprise similar materials.
- FIG. 2B shows another design for resonator 4 comprising a rib/ridge waveguide structure having a multi-layer design having a waveguide core 30, a top cladding layer 32, a bottom cladding layer 34, and magnetic films 36 positioned on the top cladding layer 32.
- One or more ferromagnetic or paramagnetic layers 38 are sandwiched between the resonator structure and the top cladding layer 32 so as to increase the magneto-optical effect in the resonator to enhance the non-reciprocal phase shift in the resonator 4.
- the one or more ferromagnetic or paramagnetic layers can include oxide glasses, chalcogenide glasses, oxide crystals, or transition metal ion doped semiconductor materials.
- the top 32 and bottom 34 cladding layers encompass the waveguide core 30.
- FIG. 2C shows an isolator device 42 having a micro-disk resonator structure 44 comprising silicon/silicon-germanium, a single cladding layer 46, and a continuous magnetic film layer 48 positioned on the single cladding layer 46. Note in FIG. 2C there is no formation of a top and bottom cladding layers but a single cladding layer 46. The single cladding layer 46 totally encompasses the micro-disk resonator structure 44.
- FIG. 2D shows an isolator device 52 having a micro-disk resonator structure 54 comprising silicon/silicon-germanium, a top cladding layer 56, a bottom cladding layer 58, and a continuous magnetic film layer 60 positioned on the top cladding structure.
- the top 56 and bottom 58 cladding layer totally encompass a silicon/silicon-germanium micro-disk resonator structure 54.
- the isolator structure 4 shown in FIGs. 2 A and 2B can be used for TE polarization, and the isolator structure 42, 52 shown in FIGs. 2C and 2D can be used for TM polarization.
- the top and bottom cladding layers described in FIGs. 2A-2D can include SiOx, SiNx or polymer.
- the magnetic layers described in FIGs. 2A-2D can include ferromagnetic metals, rare earth ferromagnetic metal alloys, or micro electromagnets. Magnetic field applied using patterned magnetic films leads to magnetization in the Si/SiGe waveguide core. If the isolator device is designed for transverse magnetic (TM) polarization, the top and bottom cladding layers can include patterned magnetic films being placed on both sides of the waveguide core, providing an in-plane magnetic field perpendicular to the light propagation direction.
- TM transverse magnetic
- the isolator device operates with transverse electric (TE) polarization
- a continuous magnetic film layer can be deposited on top of the waveguide structure to yield a magnetic field perpendicular to the substrate.
- the inherent structural asymmetry in the rib/ridge structure can thus produce non-reciprocal phase shift for TM polarized light.
- similar rib/ridge structures can be used for TM polarization; the in-plane structural asymmetry of a micro-disk also allows micro-disk isolator operation with TE polarized light.
- FIG. 3 shows numerically simulated transmission spectra for a nonreciprocal SiGe resonator isolator device operating at -1550 nm wavelength.
- the isolator device 80 includes of two optical waveguides, one for optical input 82 and one for output 84, both coupled to a Si/SiGe micro-resonator 86, as is illustrated in FIG. 4.
- Light propagating in the resonator 86 experiences a non-reciprocal phase shift when a magnetic field is applied to the Si/SiGe material.
- the operating wavelength is chosen to be the resonant wavelength of the forward propagating wave, and therefore optical isolation of back- reflected light is achieved since light transfer from the output waveguide 84 to the input waveguide 82 does not satisfy the resonant condition and thus is prohibited.
- high isolation ratio in a Si/SiGe resonator isolator device can be achieved by: 1) minimized peak full-width-at-half-maximum (FWHM) of the resonant peak; and 2) large resonant peak separation between forward and backward propagating waves.
- the peak width is inversely proportional to optical propagation loss in the resonator.
- Both crystalline and hydrogenated amorphous silicon exhibit optical loss in the telecommunication wavebands as low as a few dB/cm ( ⁇ 1 dB/cm for single crystalline Si).
- the optical band gap of silicon- germanium alloys can be continuously tuned from 1.1 eV to 0.7 eV by adjusting the alloy composition, and low optical absorption loss at telecommunication bands can be achieved in Si-rich SiGe alloys, suitable for isolator application.
- the peak separation is related to the propagation phase shift in the waveguiding structure, which is determined by the Verdet constant of the waveguide materials and the asymmetry of the optical guiding mode.
- the Verdet constant is correlated to the refractive index dispersion by the well-known Becquerel formula:
- Multilayer guiding structures with ferromagnetic or paramagnetic overlayers such as oxide crystals including garnets, perovskites or spinels, transition metal ion doped semiconductors, oxide or chalcogenide glasses, with Faraday rotation or Verdet constant of sign opposite to that of Si/SiGe can be used to enhance the resonant modal asymmetry in the optical resonator 4, as is schematically shown in FIG. 2B.
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Abstract
A magneto-optical isolator device is provided. The isolator device includes a substrate and a bottom cladding layer that is formed on the substrate. An optical resonator structure is formed on the bottom cladding layer. The resonator structure includes crystalline or amorphous diamagnetic silicon or silicon-germanium so as to provide non-reciprocal optical isolation. A top cladding layer is formed on the resonator structure. One or more magnetic layers positioned on the top cladding layer or between the top cladding or bottom cladding layers and the optical resonator structure.
Description
INTEGRATED SILICON/SILICON-GERMANIUM MAGNETO-OPTIC
ISOLATOR
SPONSORSHIP INFORMATION
This invention was made with government support awarded by the National Science Foundation under Contract No. 6899955 and under Grant No. DMR- 0604430. The government has certain rights in the invention.
PRIORITY INFORMATION
This application claims priority to U.S. Utility Application Serial No. 12/406,313, filed on March 18, 2009, which is incorporated herein by reference in its entirety.
BACKGROUND OF THE INVENTION
The invention is related to microphotonics, and in particular to designs of planar-integrated optical isolators using silicon material.
Integrated optical isolators, namely the devices that allow the transmission of light in only one direction, are necessary to prevent unwanted reflection back into the laser, and are thus an important component in integrated photonic systems. Optical isolation, for example, unidirectional transmission is typically realized by means of nonreciprocal magneto-optical effects of ferromagnetic materials such as Faraday rotation and nonreciprocal phase shift. However, most ferromagnetic materials have lattice constants different from that of silicon and therefore cannot be monolithically grown on a silicon substrate; in addition, ferromagnetic materials are often comprised of ferro-metallic alloys, exotic oxides or semiconductors doped
with transition metal ions, none of which is compatible with the standard silicon CMOS fabrication process due to contamination issues.
Because of such incompatibilities, currently magneto-optic isolators are made in bulk garnet-based materials. Such bulk isolators are not amenable to planar integration and their cost is also high since optical-quality crystals are required to maximize the desired magneto-optic effect. Recently, magneto-optic isolator devices employing hybrid architecture have been demonstrated, in which magnetically active garnet materials are bonded onto a silicon substrate. Compared to such a hybrid design, a monolithic solution requires simpler equipment, is less demanding in terms of fabrication and more cost effective, and is thus a more attractive approach. In summary, optical isolators that can be monolithically integrated onto a silicon platform have been highly desirable but still remain to be developed.
SUMMARY OF THE INVENTION According to one aspect of the invention, there is provided a magneto-optical isolator device. The isolator device includes a substrate and a bottom cladding layer that is formed on the substrate. An optical resonator structure is formed on the bottom cladding layer. The resonator structure includes crystalline or amorphous diamagnetic silicon or silicon-germanium so as to provide non-reciprocal optical isolation. A top cladding layer is formed on the resonator structure. One or more magnetic layers positioned on the top cladding layer or between the top cladding or bottom cladding layers and the optical resonator structure.
According to another aspect of the invention, there is provided a method of forming a magneto-optical isolator device. The method includes providing a substrate forming a bottom cladding layer on the substrate and positioning an optical resonator
structure on the bottom cladding layer. The resonator structure includes crystalline or amorphous diamagnetic silicon or silicon-germanium so as to provide non-reciprocal optical isolation. Also, the method includes forming a top cladding layer on the resonator structure. Furthermore, the method includes positioning one or more magnetic layers on the top cladding layer or between the top cladding or bottom cladding layers and the optical resonator structure.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a schematic diagram illustrating the inventive magneto-optic isolator device incorporating a resonator structure; FIGs. 2A-2D are schematic diagrams illustrating the cross-sectional view of the resonator structure of FIG. 1 ;
FIG. 3 is a graph illustrating the transmission spectra of a magnetically active Si/SiGe resonator;
FIG. 4 is a schematic diagram illustrating an inventive isolator device, having an input and an output waveguides coupled to a Si/SiGe non-reciprocal resonator.
DETAILED DESCRIPTION OF THE INVENTION
The invention provides optical isolator designs using silicon/silicon- germanium materials to achieve very low manufacturing cost, compatibility with planar microphotonic integration and possibly scalable performance improvement. In one example, the invention provides an optical waveguide coupled to a planar optical resonator made of silicon on insulator (SOI) material or silicon-germanium alloy grown on silicon and in the form of micro-ring, micro-disk or micro-racetrack.
An in-plane magnetic field is applied by patterned permanent ferromagnetic films on both sides of the waveguides comprising the resonator. The diamagnetic nature
of silicon/silicon-germanium leads to nonreciprocal phase shift in the SOl waveguides, which lifts the degeneracy of counter-propagating resonant modes in the resonator. The operating wavelength of the device is specifically chosen to be resonant with backward propagating waves in the resonator; therefore, the back- reflected light is coupled into the resonator and dissipated while the forward- propagating light remains unaffected by the resonator and hence leads to an optical isolation effect. In another example, the isolator device includes a silicon/silicon- geπnanium resonator coupled to two optical waveguides, as well as magnetic films to provide magnetization in silicon. The operating wavelength is chosen so that the forward-propagating wave is resonant in the resonator: light from the laser can thus be coupled into the resonator and then coupled into the other waveguide as the output, whereas reflected light remains in one waveguide and cannot be fed back into the laser.
Silicon is a diamagnetic material and thus has traditionally been regarded as non-magnetically active. However, the fact that silicon has very low optical loss in the 1310 and 1550 nm telecommunication bands has been overlooked for optical isolator applications. The measurement has yielded Verdet constant of doped and undoped single crystalline silicon in the range of 12-17 deg/(T*cm) at 1550nm wavelength. Further, the Verdet constant of silicon at 1310 and 1550 nm bands can be further improved by addition of germanium to form silicon-germanium alloys. Since silicon-germanium alloys can be monolithically grown on silicon substrate, such compatibility offers significant competitive edge for cost reduction and process improvement over current bulk magneto-optic device.
An inventive magneto-optic isolator device 2 incorporating a resonator structure 4 is schematically shown in FIG. 1. It comprises of an optical waveguide 6
for light input 8 and output 10, as well as a magnetically active optical resonator 4 having silicon/silicon-germanium materials, coupled to the optical waveguide 6, and top and bottom cladding layers 12 that formed on a substrate 14. In this figure, a racetrack resonator 4 has been used as an example; however, the same function can be performed with other device geometries including micro-ring and micro-disk resonators. Moreover, the isolator device 2 can include more than one optical waveguide.
FIGs. 2A-2D show the cross-sectional view of the resonator 4. In particular, FIG. 2A shows the resonator 4 having a single layer rib/ridge waveguide design having a waveguide core 20 comprising of silicon/silicon-germanium, a top cladding 22, bottom cladding 24, and magnetic films 26 deposited over the top cladding 22. The top 22 and bottom cladding layers encompasses the waveguide core. Also, the top and bottom cladding 24 layers comprise similar materials. FIG. 2B shows another design for resonator 4 comprising a rib/ridge waveguide structure having a multi-layer design having a waveguide core 30, a top cladding layer 32, a bottom cladding layer 34, and magnetic films 36 positioned on the top cladding layer 32. One or more ferromagnetic or paramagnetic layers 38 are sandwiched between the resonator structure and the top cladding layer 32 so as to increase the magneto-optical effect in the resonator to enhance the non-reciprocal phase shift in the resonator 4. The one or more ferromagnetic or paramagnetic layers can include oxide glasses, chalcogenide glasses, oxide crystals, or transition metal ion doped semiconductor materials. The top 32 and bottom 34 cladding layers encompass the waveguide core 30.
FIG. 2C shows an isolator device 42 having a micro-disk resonator structure 44 comprising silicon/silicon-germanium, a single cladding layer 46, and a continuous
magnetic film layer 48 positioned on the single cladding layer 46. Note in FIG. 2C there is no formation of a top and bottom cladding layers but a single cladding layer 46. The single cladding layer 46 totally encompasses the micro-disk resonator structure 44. FIG. 2D shows an isolator device 52 having a micro-disk resonator structure 54 comprising silicon/silicon-germanium, a top cladding layer 56, a bottom cladding layer 58, and a continuous magnetic film layer 60 positioned on the top cladding structure. The top 56 and bottom 58 cladding layer totally encompass a silicon/silicon-germanium micro-disk resonator structure 54. The isolator structure 4 shown in FIGs. 2 A and 2B can be used for TE polarization, and the isolator structure 42, 52 shown in FIGs. 2C and 2D can be used for TM polarization.
The top and bottom cladding layers described in FIGs. 2A-2D can include SiOx, SiNx or polymer. Also, the magnetic layers described in FIGs. 2A-2D can include ferromagnetic metals, rare earth ferromagnetic metal alloys, or micro electromagnets. Magnetic field applied using patterned magnetic films leads to magnetization in the Si/SiGe waveguide core. If the isolator device is designed for transverse magnetic (TM) polarization, the top and bottom cladding layers can include patterned magnetic films being placed on both sides of the waveguide core, providing an in-plane magnetic field perpendicular to the light propagation direction. Alternatively, if the isolator device operates with transverse electric (TE) polarization, a continuous magnetic film layer can be deposited on top of the waveguide structure to yield a magnetic field perpendicular to the substrate. The inherent structural asymmetry in the rib/ridge structure can thus produce non-reciprocal phase shift for TM polarized light. In a microdisk resonator, similar rib/ridge structures can be used for TM polarization;
the in-plane structural asymmetry of a micro-disk also allows micro-disk isolator operation with TE polarized light.
The resonant frequency degeneracy of light propagating in clockwise, corresponding to forward -propagating wave in FIG. 1, and counter-clockwise, corresponding to backward-propagating wave in FIG. 1, directions is broken. If the operating wavelength is chosen so as to match the resonant wavelength of backward propagating wave, backward propagating light due to reflection or scattering will couple into the resonator and radiatively dissipated, while the forward propagation signal will hardly be affected providing that the peak separation is greater than the peak width. FIG. 3 shows numerically simulated transmission spectra for a nonreciprocal SiGe resonator isolator device operating at -1550 nm wavelength.
In another embodiment, the isolator device 80 includes of two optical waveguides, one for optical input 82 and one for output 84, both coupled to a Si/SiGe micro-resonator 86, as is illustrated in FIG. 4. Light propagating in the resonator 86 experiences a non-reciprocal phase shift when a magnetic field is applied to the Si/SiGe material. The operating wavelength is chosen to be the resonant wavelength of the forward propagating wave, and therefore optical isolation of back- reflected light is achieved since light transfer from the output waveguide 84 to the input waveguide 82 does not satisfy the resonant condition and thus is prohibited. In embodiments described herein, high isolation ratio in a Si/SiGe resonator isolator device can be achieved by: 1) minimized peak full-width-at-half-maximum (FWHM) of the resonant peak; and 2) large resonant peak separation between forward and backward propagating waves. The peak width is inversely proportional to optical propagation loss in the resonator. Both crystalline and hydrogenated amorphous silicon exhibit optical loss in the telecommunication wavebands as low as a few
dB/cm (< 1 dB/cm for single crystalline Si). The optical band gap of silicon- germanium alloys can be continuously tuned from 1.1 eV to 0.7 eV by adjusting the alloy composition, and low optical absorption loss at telecommunication bands can be achieved in Si-rich SiGe alloys, suitable for isolator application. The peak separation is related to the propagation phase shift in the waveguiding structure, which is determined by the Verdet constant of the waveguide materials and the asymmetry of the optical guiding mode. The Verdet constant is correlated to the refractive index dispersion by the well-known Becquerel formula:
2mc dλ n\ Alloying silicon with germanium increases the material dispersion at telecommunication wavelengths, and thereby the SiGe Verdet constant can be increased. Multilayer guiding structures with ferromagnetic or paramagnetic overlayers , such as oxide crystals including garnets, perovskites or spinels, transition metal ion doped semiconductors, oxide or chalcogenide glasses, with Faraday rotation or Verdet constant of sign opposite to that of Si/SiGe can be used to enhance the resonant modal asymmetry in the optical resonator 4, as is schematically shown in FIG. 2B.
Although the present invention has been shown and described with respect to several preferred embodiments thereof, various changes, omissions and additions to the form and detail thereof, may be made therein, without departing from the spirit and scope of the invention. What is claimed is:
Claims
1. A magneto-optical isolator device comprising: a substrate; a bottom cladding layer formed on said substrate; an optical resonator structure that is formed on said bottom cladding layer, said resonator structure comprising crystalline or amorphous diamagnetic silicon or silicon- germanium so as to provide non-reciprocal optical isolation; a top cladding layer formed on said resonator structure; and one or more magnetic layers positioned on said top cladding layer or between said top cladding or bottom cladding layers and said optical resonator structure.
2. The isolator device of claim 1, wherein said resonator structure comprises a micro- ring resonator coupled to one or two optical waveguides.
3. The isolator device of claim 1, wherein said resonator structure comprises a micro- disk resonator coupled to one or more optical waveguides.
4. The isolator device of claim 1, said substrate comprises silicon.
5. The isolator device of claim 1 further comprising one or more ferromagnetic or paramagnetic layers being positioned between said optical resonator structure and said top cladding layer so as to increase the magneto-optical effect in the resonator.
6. The isolator device of claim 1, wherein said one or more ferromagnetic or paramagnetic layers comprise oxide glasses, chalcogenide glasses, oxide crystals, or transition metal ion doped semiconductor materials.
7. The isolator device of claim 1 , wherein said bottom cladding layer comprises SiOx, SiNx or polymer.
8. The isolator device of claim 1, wherein said top cladding layer comprises SiOx, SiNx or polymer.
9. The isolator device of claim 1, wherein said magnetic layers comprise ferromagnetic metals, rare earth ferromagnetic metal alloys, or micro electromagnets.
10. The isolator device of claim 1, wherein said magnetic layers are patterned so as to provide designed magnetic field intensity and distribution in the said resonator structure.
11. A method of forming a magneto-optical isolator device comprising: providing a substrate; forming a bottom cladding layer on said substrate; positioning an optical resonator structure on said bottom cladding layer, said resonator structure comprises crystalline or amorphous diamagnetic silicon or silicon- germanium so as to provide non-reciprocal optical isolation; forming a top cladding layer on said resonator structure; and positioning one or more magnetic layers on said top cladding layer or between said top cladding or bottom cladding layers and said optical resonator structure.
12. The method of claim 11, wherein said resonator structure comprises a micro-ring resonator coupled to one or two optical waveguides
13. The method of claim 11, wherein said resonator structure comprises a micro-disk resonator coupled to one or more optical waveguides.
14. The method of claim 11 further comprising positioning one or more ferromagnetic or paramagnetic layers between said optical resonator structure and said top cladding layer so as to increase the magneto-optical effect in the resonator.
15. The method of claim 11, wherein said substrate comprises silicon.
16. The method of claim 11, wherein said one or more ferromagnetic or paramagnetic layers comprise oxide glasses, chalcogenide glasses, oxide crystals, or transition metal ion doped semiconductor materials.
17. The method of claim 11, wherein said bottom cladding layer comprises SiOx, SiNx or polymer.
18. The method of claim 11, wherein said top cladding layer comprises SiOx, SiNx or polymer,
19. The method of claim 11, wherein said magnetic layers comprise ferromagnetic metals, rare earth ferromagnetic metal alloys, or micro electromagnets.
20. The method of claim 11, wherein said magnetic layers are patterned so as to provide designed magnetic field intensity and distribution in the said resonator structure.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/406,313 US20100238536A1 (en) | 2009-03-18 | 2009-03-18 | Integrated silicon/silicon-germanium magneto-optic isolator |
| US12/406,313 | 2009-03-18 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2010107853A2 true WO2010107853A2 (en) | 2010-09-23 |
| WO2010107853A3 WO2010107853A3 (en) | 2011-01-13 |
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ID=42737356
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2010/027564 Ceased WO2010107853A2 (en) | 2009-03-18 | 2010-03-17 | Integrated silicon/silicon-germanium magneto-optic isolator |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US20100238536A1 (en) |
| WO (1) | WO2010107853A2 (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US8396337B2 (en) * | 2010-06-30 | 2013-03-12 | The Regents Of The University Of California | Ring resonator based optical isolator and circulator |
| US12007605B2 (en) | 2011-06-08 | 2024-06-11 | Skorpios Technologies, Inc. | Monolithically-integrated, polarization-independent circulator |
| US9091813B2 (en) * | 2011-06-08 | 2015-07-28 | Skorpios Technologies, Inc. | Systems and methods for photonic polarization beam splitters |
| US8837877B2 (en) | 2011-08-11 | 2014-09-16 | Massachusetts Institute Of Technology | Patterned non-reciprocal optical resonator |
| US9128246B2 (en) * | 2011-10-17 | 2015-09-08 | University Of Maryland, College Park | Systems, methods, and devices for optomechanically induced non-reciprocity |
| EP2746839A1 (en) | 2013-06-30 | 2014-06-25 | Schott AG | Optical isolator |
| US9405136B2 (en) * | 2013-07-23 | 2016-08-02 | Board Of Regents, The University Of Texas System | Magnetic-free non-reciprocal devices exhibiting non-reciprocity through angular momentum biasing |
| US9829728B2 (en) * | 2015-11-19 | 2017-11-28 | Massachusetts Institute Of Technology | Method for forming magneto-optical films for integrated photonic devices |
| US10466515B2 (en) | 2016-03-15 | 2019-11-05 | Intel Corporation | On-chip optical isolator |
| WO2018017958A2 (en) | 2016-07-22 | 2018-01-25 | Skorpios Technologies, Inc. | Monolithically-integrated, polarization-independent circulator |
| US9897827B1 (en) * | 2016-07-27 | 2018-02-20 | Intel Corporation | Feedback controlled closed loop on-chip isolator |
| KR20220124298A (en) | 2018-04-04 | 2022-09-14 | 더 리서치 파운데이션 포 더 스테이트 유니버시티 오브 뉴욕 | Heterogeneous structures on integrated photonics platforms |
| CN114174902B (en) * | 2019-05-24 | 2025-09-02 | 洛克利光子有限公司 | Optical isolators |
| JP7330005B2 (en) * | 2019-07-26 | 2023-08-21 | 京セラ株式会社 | Isolator, isolator manufacturing method, and electromagnetic wave transmitter |
| JP7325254B2 (en) * | 2019-07-26 | 2023-08-14 | 京セラ株式会社 | Isolator, isolator manufacturing method, and electromagnetic wave transmitter |
| US11921365B2 (en) * | 2019-07-26 | 2024-03-05 | Kyocera Corporation | Isolator, method of manufacturing isolator, electromagnetic wave transmitter, and light transmitter |
| JP7245743B2 (en) * | 2019-07-26 | 2023-03-24 | 京セラ株式会社 | isolator and optical transmitter |
| US12101123B2 (en) * | 2021-12-13 | 2024-09-24 | Shanghai Jiao Tong University | Distributed optical millimeter wave terahertz transfer system and transfer method |
| WO2025225010A1 (en) * | 2024-04-26 | 2025-10-30 | 京セラ株式会社 | Isolator and manufacturing method |
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| JPS6419309A (en) * | 1987-07-15 | 1989-01-23 | Ibiden Co Ltd | Thin film waveguide type isolator |
| JPH0310212A (en) * | 1989-06-08 | 1991-01-17 | Nippon Telegr & Teleph Corp <Ntt> | Optical nonreciprocal phase shifter |
| JP3424095B2 (en) * | 2000-08-02 | 2003-07-07 | ミネベア株式会社 | Magneto-optical body and optical isolator using this magneto-optical body |
| US6816038B2 (en) * | 2000-11-22 | 2004-11-09 | Sanyo Electric Co., Ltd. | Magnetostatic wave device and disturbance wave eliminator |
| US7215848B2 (en) * | 2004-01-29 | 2007-05-08 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Optical isolator utilizing a micro-resonator |
| US7260282B2 (en) * | 2005-03-30 | 2007-08-21 | Intel Corporation | Integratable optical waveguide isolator |
| US20080267557A1 (en) * | 2005-12-29 | 2008-10-30 | Zheng Wang | Integrated Magneto-Optical Devices for Uni-Directional Optical Resonator Systems |
| US7228023B1 (en) * | 2005-12-30 | 2007-06-05 | Intel Corporation | Planar non-magnetic optical isolator |
| EP1980895A1 (en) * | 2006-01-31 | 2008-10-15 | Tokyo Institute of Technology | Optical isolator |
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2009
- 2009-03-18 US US12/406,313 patent/US20100238536A1/en not_active Abandoned
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2010
- 2010-03-17 WO PCT/US2010/027564 patent/WO2010107853A2/en not_active Ceased
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| Publication number | Publication date |
|---|---|
| WO2010107853A3 (en) | 2011-01-13 |
| US20100238536A1 (en) | 2010-09-23 |
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