WO2010099964A3 - Method and apparatus for measurement of ohmic shunts in thin film modules with the voc-ilit technique - Google Patents

Method and apparatus for measurement of ohmic shunts in thin film modules with the voc-ilit technique Download PDF

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Publication number
WO2010099964A3
WO2010099964A3 PCT/EP2010/001357 EP2010001357W WO2010099964A3 WO 2010099964 A3 WO2010099964 A3 WO 2010099964A3 EP 2010001357 W EP2010001357 W EP 2010001357W WO 2010099964 A3 WO2010099964 A3 WO 2010099964A3
Authority
WO
WIPO (PCT)
Prior art keywords
shunts
thin film
solar cell
ilit
voc
Prior art date
Application number
PCT/EP2010/001357
Other languages
French (fr)
Other versions
WO2010099964A2 (en
Inventor
Ivan Sinicco
Jean Randhann
Original Assignee
Oerlikon Solar Ag, Trübbach
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oerlikon Solar Ag, Trübbach filed Critical Oerlikon Solar Ag, Trübbach
Publication of WO2010099964A2 publication Critical patent/WO2010099964A2/en
Publication of WO2010099964A3 publication Critical patent/WO2010099964A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Photovoltaic Devices (AREA)

Abstract

The invention refers to a method for the detection of ohmic shunts in a thin film solar cell, especially thin film silicon photovoltaic modules, wherein the solar cell is light stimulated and thermal effects caused by the shunts are detected using Lock-in Thermography as well as an apparatus to detect ohmic shunts in thin-film solar cells. According to the inventive method, the solar cell is light stimulated and thermal effects caused by the shunts are detected using Lock-in Thermography, wherein the solar cell is stimulated with light of at least two different wavelengths.
PCT/EP2010/001357 2009-03-05 2010-03-04 Method and apparatus for measurement of ohmic shunts in thin film modules with the voc-ilit technique WO2010099964A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15764609P 2009-03-05 2009-03-05
US61/157,646 2009-03-05

Publications (2)

Publication Number Publication Date
WO2010099964A2 WO2010099964A2 (en) 2010-09-10
WO2010099964A3 true WO2010099964A3 (en) 2010-11-18

Family

ID=42697174

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2010/001357 WO2010099964A2 (en) 2009-03-05 2010-03-04 Method and apparatus for measurement of ohmic shunts in thin film modules with the voc-ilit technique

Country Status (1)

Country Link
WO (1) WO2010099964A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011156527A1 (en) 2010-06-08 2011-12-15 Dcg Systems, Inc. Three-dimensional hot spot localization
EP2444795A1 (en) 2010-10-22 2012-04-25 DCG Systems, Inc. Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite side
DE102011015701B4 (en) * 2011-03-31 2013-02-14 Testo Ag Test arrangement and test method for a solar system
US11467108B2 (en) 2017-05-30 2022-10-11 Nanolockin Gmbh Method for characterizing particles producing heat when exposed to light and device for carrying out the method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19738302A1 (en) * 1997-09-02 1999-03-04 Zae Bayern Method for optimizing solar module output
DE10240060A1 (en) * 2002-08-30 2004-03-25 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Power loss measurement method for use in detecting local power loss distributions in optically sensitive semiconductors, e.g. solar cells, whereby components are illuminated with modulated radiation and thermographically imaged
EP1416288A1 (en) * 2002-10-23 2004-05-06 EADS Astrium GmbH Method and apparatus for optical detection of mechanical defects in semiconductor components, in particular solar cell arrangements

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19738302A1 (en) * 1997-09-02 1999-03-04 Zae Bayern Method for optimizing solar module output
DE10240060A1 (en) * 2002-08-30 2004-03-25 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Power loss measurement method for use in detecting local power loss distributions in optically sensitive semiconductors, e.g. solar cells, whereby components are illuminated with modulated radiation and thermographically imaged
EP1416288A1 (en) * 2002-10-23 2004-05-06 EADS Astrium GmbH Method and apparatus for optical detection of mechanical defects in semiconductor components, in particular solar cell arrangements

Non-Patent Citations (5)

* Cited by examiner, † Cited by third party
Title
ANONYMOUS: "LimoLIT; Infrared Thermographic Measuring System; Automated Lock-in Thermography on Solar Cells", 30 August 2006 (2006-08-30), pages 0, I, 1 - 17, XP002600857, Retrieved from the Internet <URL:http://www.ndtek.com/uploadfiles/down/2009-9/250425489531zvdy.pdf> [retrieved on 20100913] *
KAES M ET AL: "Light-modulated lock-in thermography for photosensitive pn-structures and solar cells", PROGRESS IN PHOTOVOLTAICS: RESEARCH AND APPLICATIONS WILEY UK, vol. 12, no. 5, August 2004 (2004-08-01), pages 355 - 363, XP002600855, ISSN: 1062-7995 *
KAES M., SEREN S., PERNAU T., HAHN G.: "LIMOLIT - A Novel Thermographic Characterisation Method for p/n Structures and Solar Cells", REPRINT - 19TH EUROPEAN PHOTOVOLTAIC SOLAR ENERGY CONFERENCE, 2004, Paris, pages 1 - 4, XP002600856, Retrieved from the Internet <URL:http://www.uni-konstanz.de/pv/publikationen/papers/paris2004/Kaes_2BO.1.2.pdf> [retrieved on 20100913] *
KLAER J ET AL: "Mini-modules from a CuInS2 baseline process", THIN SOLID FILMS, vol. 431-432, 1 May 2003 (2003-05-01), ELSEVIER-SEQUOIA S.A. LAUSANNE, CH, pages 534 - 537, XP004428700, ISSN: 0040-6090, DOI: 10.1016/S0040-6090(03)00256-6 *
SHVYDKA DIANA ET AL: "Lock-in thermography and nonuniformity modeling of thin-film CdTe solar cells", APPLIED PHYSICS LETTERS, vol. 84, no. 5, 2 February 2004 (2004-02-02), AIP, AMERICAN INSTITUTE OF PHYSICS, MELVILLE, NY, US, pages 729 - 731, XP012061978, ISSN: 0003-6951, DOI: 10.1063/1.1645322 *

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Publication number Publication date
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