WO2010098647A3 - 구조물의 변형 측정용 장치 및 이를 이용한 구조물의 변형 측정방법 - Google Patents

구조물의 변형 측정용 장치 및 이를 이용한 구조물의 변형 측정방법 Download PDF

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Publication number
WO2010098647A3
WO2010098647A3 PCT/KR2010/001299 KR2010001299W WO2010098647A3 WO 2010098647 A3 WO2010098647 A3 WO 2010098647A3 KR 2010001299 W KR2010001299 W KR 2010001299W WO 2010098647 A3 WO2010098647 A3 WO 2010098647A3
Authority
WO
WIPO (PCT)
Prior art keywords
deformation
structures
measuring
present
same
Prior art date
Application number
PCT/KR2010/001299
Other languages
English (en)
French (fr)
Other versions
WO2010098647A2 (ko
Inventor
함승주
임윤묵
임윤철
박요셉
Original Assignee
연세대학교 산학협력단
(주)기술과가치
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020090017315A external-priority patent/KR101217617B1/ko
Priority claimed from KR1020090017317A external-priority patent/KR101647352B1/ko
Priority claimed from KR1020090017316A external-priority patent/KR101592950B1/ko
Application filed by 연세대학교 산학협력단, (주)기술과가치 filed Critical 연세대학교 산학협력단
Priority to JP2011551993A priority Critical patent/JP5468091B2/ja
Priority to US13/203,217 priority patent/US8671769B2/en
Publication of WO2010098647A2 publication Critical patent/WO2010098647A2/ko
Publication of WO2010098647A3 publication Critical patent/WO2010098647A3/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/32—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring the deformation in a solid
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
    • H01F1/0036—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties showing low dimensional magnetism, i.e. spin rearrangements due to a restriction of dimensions, e.g. showing giant magnetoresistivity
    • H01F1/0045—Zero dimensional, e.g. nanoparticles, soft nanoparticles for medical/biological use
    • H01F1/0054—Coated nanoparticles, e.g. nanoparticles coated with organic surfactant
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
    • H01F1/0036—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties showing low dimensional magnetism, i.e. spin rearrangements due to a restriction of dimensions, e.g. showing giant magnetoresistivity
    • H01F1/0045—Zero dimensional, e.g. nanoparticles, soft nanoparticles for medical/biological use
    • H01F1/0063—Zero dimensional, e.g. nanoparticles, soft nanoparticles for medical/biological use in a non-magnetic matrix, e.g. granular solids

Abstract

본 발명은 구조물의 변형률 측정용 장치 및 이를 이용한 구조물의 변형률 측정방법에 관한 것으로, 보다 구체적으로는 본 발명의 구조물의 변형률 측정용 장치는 일정한 간격으로 배열된 나노 입자를 함유하는 광결정층을 포함한다. 본 발명에 의하면, 다양한 산업 구조물이 사용하중 등에 의해 변형되는 경우 해당 부분의 구조색 변화 또는 자속 변화를 측정함으로써 보다 간단하고 용이하게 구조물의 정확한 변형여부 및 변형률을 측정할 수 있으며, 이를 통하여 구조물의 과다변형으로 인한 안전사고의 발생도 방지할 수 있다.
PCT/KR2010/001299 2009-02-27 2010-03-02 구조물의 변형 측정용 장치 및 이를 이용한 구조물의 변형 측정방법 WO2010098647A2 (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2011551993A JP5468091B2 (ja) 2009-02-27 2010-03-02 構造物の変形測定用装置及びそれを用いた構造物の変形測定方法
US13/203,217 US8671769B2 (en) 2009-02-27 2010-03-02 Device for measuring deformation of a structure and a method for measuring deformation of a structure using the same

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
KR10-2009-0017317 2009-02-27
KR10-2009-0017316 2009-02-27
KR1020090017315A KR101217617B1 (ko) 2009-02-27 2009-02-27 구조물 변형 측정용 도료, 이를 포함하는 테이프 및 이를 이용한 구조물의 변형 측정방법
KR1020090017317A KR101647352B1 (ko) 2009-02-27 2009-02-27 구조물 변형 측정용 도료, 이를 포함하는 테이프 및 이를 이용한 구조물의 변형 측정방법
KR1020090017316A KR101592950B1 (ko) 2009-02-27 2009-02-27 자성체를 함유하는 구조물의 변형률 측정용 도료, 이를 포함하는 테이프 및 이를 이용한 구조물의 변형률 측정방법
KR10-2009-0017315 2009-02-27

Publications (2)

Publication Number Publication Date
WO2010098647A2 WO2010098647A2 (ko) 2010-09-02
WO2010098647A3 true WO2010098647A3 (ko) 2010-11-25

Family

ID=42666104

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2010/001299 WO2010098647A2 (ko) 2009-02-27 2010-03-02 구조물의 변형 측정용 장치 및 이를 이용한 구조물의 변형 측정방법

Country Status (3)

Country Link
US (1) US8671769B2 (ko)
JP (1) JP5468091B2 (ko)
WO (1) WO2010098647A2 (ko)

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* Cited by examiner, † Cited by third party
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KR101269229B1 (ko) * 2011-06-03 2013-05-30 한국과학기술원 나노 물질의 광학적 특성을 이용한 변형률 측정 방법 및 장치
CN103983246A (zh) * 2014-05-29 2014-08-13 中铁二十局集团第二工程有限公司 一种测量隧道全断面变形的方法及装置
FR3059141A1 (fr) * 2016-11-21 2018-05-25 Commissariat A L'energie Atomique Et Aux Energies Alternatives Materiau magnetique et son procede de fabrication

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KR20090000859A (ko) * 2007-06-28 2009-01-08 연세대학교 산학협력단 진단 및 치료용 자성 메탈 나노 복합체

Also Published As

Publication number Publication date
US20120152030A1 (en) 2012-06-21
JP5468091B2 (ja) 2014-04-09
JP2012519274A (ja) 2012-08-23
US8671769B2 (en) 2014-03-18
WO2010098647A2 (ko) 2010-09-02

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