WO2010084919A1 - Contact force measuring device and contact force measuring method - Google Patents

Contact force measuring device and contact force measuring method Download PDF

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Publication number
WO2010084919A1
WO2010084919A1 PCT/JP2010/050722 JP2010050722W WO2010084919A1 WO 2010084919 A1 WO2010084919 A1 WO 2010084919A1 JP 2010050722 W JP2010050722 W JP 2010050722W WO 2010084919 A1 WO2010084919 A1 WO 2010084919A1
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WIPO (PCT)
Prior art keywords
spring
contact force
image processing
image
pantograph
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PCT/JP2010/050722
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French (fr)
Japanese (ja)
Inventor
貴雅 藤澤
庭川　誠
勇介 渡部
池田　充
Original Assignee
株式会社 明電舎
財団法人鉄道総合技術研究所
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Application filed by 株式会社 明電舎, 財団法人鉄道総合技術研究所 filed Critical 株式会社 明電舎
Priority to RU2011134864/11A priority Critical patent/RU2477229C1/en
Priority to CN2010800053028A priority patent/CN102292235A/en
Publication of WO2010084919A1 publication Critical patent/WO2010084919A1/en

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60L—PROPULSION OF ELECTRICALLY-PROPELLED VEHICLES; SUPPLYING ELECTRIC POWER FOR AUXILIARY EQUIPMENT OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRODYNAMIC BRAKE SYSTEMS FOR VEHICLES IN GENERAL; MAGNETIC SUSPENSION OR LEVITATION FOR VEHICLES; MONITORING OPERATING VARIABLES OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRIC SAFETY DEVICES FOR ELECTRICALLY-PROPELLED VEHICLES
    • B60L5/00—Current collectors for power supply lines of electrically-propelled vehicles
    • B60L5/18—Current collectors for power supply lines of electrically-propelled vehicles using bow-type collectors in contact with trolley wire
    • B60L5/22—Supporting means for the contact bow
    • B60L5/24—Pantographs
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60M—POWER SUPPLY LINES, AND DEVICES ALONG RAILS, FOR ELECTRICALLY- PROPELLED VEHICLES
    • B60M1/00—Power supply lines for contact with collector on vehicle
    • B60M1/12—Trolley lines; Accessories therefor
    • B60M1/28—Manufacturing or repairing trolley lines
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B60—VEHICLES IN GENERAL
    • B60L—PROPULSION OF ELECTRICALLY-PROPELLED VEHICLES; SUPPLYING ELECTRIC POWER FOR AUXILIARY EQUIPMENT OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRODYNAMIC BRAKE SYSTEMS FOR VEHICLES IN GENERAL; MAGNETIC SUSPENSION OR LEVITATION FOR VEHICLES; MONITORING OPERATING VARIABLES OF ELECTRICALLY-PROPELLED VEHICLES; ELECTRIC SAFETY DEVICES FOR ELECTRICALLY-PROPELLED VEHICLES
    • B60L2200/00—Type of vehicles
    • B60L2200/26—Rail vehicles

Definitions

  • the present invention relates to a contact force measuring device and a contact force measuring method.
  • the electric railway supplies electric power when the pantograph, which is a current collector installed on the roof, comes in contact with the overhead line. At this time, a force called contact force is generated between the pantograph and the overhead wire.
  • a force called contact force is generated between the pantograph and the overhead wire.
  • the fluctuation of the contact force is large, the overhead line is disconnected from the pantograph, and a discharge phenomenon called an arc occurs.
  • the arc is generated, the overhead wire is worn. That is, it is better that the fluctuation of the contact force is small.
  • the contact force is too large, the overhead wire is worn.
  • a method for obtaining a contact force by installing a sensor such as an accelerometer or a strain gauge on a pantograph and measuring a force (cross-sectional force) and an inertial force generated on a cross section of the pantograph (see Non-Patent Document 1 below).
  • a method of obtaining contact force by installing two light sources such as LEDs on the spring part of the pantograph one above the other, obtaining relative displacement by image processing, and obtaining the amount of expansion and contraction of the spring see Patent Document 1 below.
  • a line sensor camera (hereinafter referred to as a line sensor) is installed on the roof of the pantograph, and the spring part of the pantograph is photographed.
  • a method of obtaining a contact force by processing a photographed image and obtaining a relative displacement and a spring expansion / contraction amount (see Patent Document 2 below).
  • the time resolution and the spatial resolution are higher than the method (2), so the accuracy is good.
  • Patent Document 3 a white belt-like marker that easily reflects light is attached to the pantograph, the marker is photographed with a line sensor installed on the roof of the vehicle, and the position of the marker is detected by pattern matching to detect the displacement of the pantograph. Measuring. Further, by making two or more white bands and complicating the shape, the amount of features used for pattern matching is increased, and erroneous detection and the like are prevented.
  • the problem of accuracy is solved by using a special lens called a super anisotropic magnification lens that increases the vertical magnification to 80 times.
  • a super anisotropic magnification lens that increases the vertical magnification to 80 times.
  • a line sensor is a camera that has an image sensor arranged in a one-dimensional array, can capture a high-resolution one-dimensional image, and has a high sampling frequency. Therefore, since the camera has high spatial resolution and high temporal resolution, the accuracy of the contact force is high and the measurable frequency is also high.
  • the conventional method cannot accurately measure the contact force of both the pantograph with a small number of springs such as a single arm and the pantograph with a multi-partitioned sliding plate with many springs.
  • the present invention provides a contact force measuring device and a contact force measuring method capable of measuring contact force with high accuracy in both a pantograph with a small number of springs, such as a single arm, and a pantograph with a multi-partitioned sliding plate with many springs.
  • the purpose is to do.
  • a contact force measuring device for solving the above-described problems is as follows.
  • An imaging means for capturing an image of a pantograph spring by partially specifying an imaging range and improving time resolution;
  • Image processing means for detecting the spring in the image by image processing;
  • the relative displacement is calculated from the positions of the upper and lower portions of the spring detected by the image processing means, and the amount of expansion and contraction of the spring is calculated by calculating the amount of change in the relative displacement over time.
  • a spring reaction force calculating means for obtaining a spring reaction force of the spring by multiplying by An inertial force calculating means for calculating an inertial force by calculating an acceleration by second-order differentiation of the displacement of the upper part of the spring detected by the image processing means, and multiplying the acceleration by an equivalent mass of the pantograph;
  • Contact force calculating means for obtaining a contact force by adding the spring reaction force and the inertial force is provided.
  • a contact force measuring device for solving the above-mentioned problems is as follows.
  • a plurality of photographing means for photographing an image of a pantograph spring; Rearrangement means for rearranging images taken by shifting the shutter timing by the plurality of photographing means in order on the time axis;
  • Image processing means for detecting the spring in the image by image processing; The relative displacement is calculated from the positions of the upper and lower portions of the spring detected by the image processing means, and the amount of expansion and contraction of the spring is calculated by calculating the amount of change in the relative displacement over time.
  • a spring reaction force calculating means for obtaining a spring reaction force of the spring by multiplying by An inertial force calculating means for calculating an inertial force by calculating an acceleration by second-order differentiation of the displacement of the upper part of the spring detected by the image processing means, and multiplying the acceleration by an equivalent mass of the pantograph;
  • Contact force calculating means for obtaining a contact force by adding the spring reaction force and the inertial force is provided.
  • a contact force measuring device for solving the above-mentioned problems is the first invention or the second invention, Spline interpolation means is provided, which uses the position of the upper and lower portions of the spring obtained by the image processing means as position data, and performs spline interpolation on the obtained position data of the spring.
  • the contact force measuring device for solving the above-mentioned problems is the first invention or the second invention,
  • Super-resolution processing means for generating one high-resolution image by performing super-resolution processing using a plurality of low-resolution images is provided.
  • a contact force measurement method for solving the above-described problem is as follows.
  • a shooting process that captures images of pantograph springs by partially specifying the shooting range and improving the time resolution; Image processing for detecting the spring in the image by image processing; The relative displacement is calculated from the positions of the upper and lower portions of the spring detected by the image processing means, and the amount of expansion and contraction of the spring is calculated by calculating the amount of change in the relative displacement over time.
  • a contact force measuring method for solving the above-mentioned problems is as follows. Multiple shooting processes for shooting images of pantograph springs, A rearrangement process for rearranging images taken by shifting the shutter timing by the plurality of photographing means in order on the time axis; Image processing for detecting the spring in the image by image processing; The relative displacement is calculated from the positions of the upper and lower portions of the spring detected by the image processing means, and the amount of expansion and contraction of the spring is calculated by calculating the amount of change in the relative displacement over time.
  • a contact force measuring device for solving the above-mentioned problems is the fifth invention or the sixth invention.
  • the position of the upper and lower portions of the spring obtained by the image processing means is used as position data, and spline interpolation processing is performed for performing spline interpolation on the obtained spring position data. It is characterized by performing.
  • a contact force measuring device for solving the above-mentioned problems is the fifth invention or the sixth invention,
  • a super-resolution process for generating one high-resolution image is performed by performing a super-resolution process using a plurality of low-resolution images between the photographing process and the image process.
  • a contact force measuring device and a contact force measuring method capable of measuring contact force with high accuracy in both a pantograph with a small number of springs, such as a single arm, and a pantograph with a multi-partitioned sliding plate with many springs. it can.
  • the contact force measuring apparatus and the contact force measuring method according to the present embodiment solves the above-described problem of time resolution by acquiring only a specific region from an image captured by an area camera at high speed and processing the image. The contact force measurement is performed.
  • FIG. 2 is a diagram illustrating an example of an image captured by an area camera.
  • an area camera for example, when a CMOS camera is used, as shown in FIG. 2, it is indicated by a hatched line in FIG. 2 in one image 9 in a shooting range that can be acquired when shooting with a normal camera. It is possible to shoot by specifying only the part. Further, not only one part in the image 9 can be designated for photographing, but a plurality of parts can be designated and photographed as shown in FIG. 2 (see “Non-Patent Document 2” on pages 16 to 19). Refer to “4.2 Image size change”).
  • FIG. 1 is a configuration diagram of a contact force measuring apparatus according to the first embodiment.
  • an area camera 2 is installed on the roof of the vehicle 1, and an illumination 3 is installed in the vicinity thereof.
  • an illumination 3 is installed in the vicinity thereof.
  • a marker 7 is attached at the upper and lower portions of the spring 6 of the sliding plate 5 of the pantograph 4, a marker 7 in which a white member that easily reflects light is arranged on a black member that hardly reflects light is attached.
  • the shape of the white member may be a characteristic shape that can be easily extracted during image processing, such as a circle or a rectangle.
  • the marker 7 is attached to the upper and lower parts of all the springs 6.
  • the number of markers 7 having a small number of springs is smaller than that of the pantograph 4 of the multi-particulate sliding plate 5a.
  • a processing PC 8 having a central processing unit, a memory such as ROM and RAM, and input / output means is installed in the vehicle 1.
  • the processing PC 8 is used as a means for executing various processes such as calculation and storage.
  • the area camera 2 is connected to the processing PC 8, and image data captured by the area camera 2 is output to the processing PC 8.
  • the relative displacement is calculated from the positions of the upper and lower portions of the spring 6 by the processing PC 8, and the expansion / contraction amount of the spring 6 is calculated by obtaining the time change of the relative displacement. Then, the spring reaction force of the spring 6 is obtained by multiplying the amount of expansion / contraction of the spring 6 by the spring constant.
  • the acceleration is calculated by second-order differentiation of the displacement of the upper portion of the spring 6 by the processing PC 8.
  • the inertial force is obtained by multiplying the acceleration by the equivalent mass of the pantograph 4.
  • the contact force is obtained by adding the spring reaction force and inertial force obtained by the above-described method (see Patent Document 2). The above is the operation of the contact force measuring apparatus according to the present embodiment.
  • FIG. 3 is a flowchart showing a contact force measurement method by image processing using the area camera 2 according to the first embodiment.
  • step P ⁇ b> 10 the shooting range of the area camera 2 is designated and an image is shot by the area camera 2.
  • an imaging range is specified so that an area equivalent to or larger than the marker 7 installed on the upper and lower portions of the spring 6 of the pantograph 4 can be taken, and an image is taken by the area camera 2.
  • the frame rate can be increased by reducing the imaging range, that is, the time resolution can be increased.
  • the photographed image is stored in the processing PC 8 installed in the vehicle 1.
  • step P11 pattern matching is performed by the processing PC 8 using the template of the marker 7 acquired in advance, so that the position of the marker 7 attached to the upper and lower portions of the spring 6 of the pantograph 4 is determined from the stored image. To detect.
  • step P12 the processing PC 8 calculates the relative displacement of the markers 7 on the upper and lower portions of the spring 6 of the pantograph 4 and calculates the amount of expansion and contraction of the spring 6 by obtaining the time change. Then, the spring reaction force of the spring 6 is obtained by multiplying the expansion / contraction amount of the spring 6 by the spring constant.
  • step P13 the displacement of the marker 7 on the top of the spring 6 is second-order differentiated by the processing PC 8 to calculate the acceleration. Then, the inertial force is obtained by multiplying the acceleration by the equivalent mass of the pantograph 4.
  • step P14 the processing PC 8 obtains the contact force by adding the spring reaction force and inertial force obtained in steps P12 and P13.
  • the above is the contact force measurement method by image processing using the area camera 2 according to the present invention.
  • the contact force measuring device and the contact force measuring method according to the present embodiment can increase the time resolution by designating a range to be photographed by the area camera 2. Thereby, the measurable frequency range can be made higher than the method disclosed in Patent Document 1.
  • the contact force measuring device and the contact force measuring method according to the present embodiment use the area camera 2, even the pantograph 4 with the multi-partitioned sliding plate 5a as shown in FIG.
  • the contact force can be measured without installing a plurality of line sensors as in the method using a line sensor.
  • the contact force measuring device and the contact force measuring method according to the present embodiment use the area camera 2, even the pantograph 4 with the multi-partitioned sliding plate 5a as shown in FIG. Unlike the method using the line sensor disclosed in FIG. 2, it is not necessary to install the camera by the number of the springs 6 of the pantograph 4.
  • the contact force measuring device and the contact force measuring method according to the present embodiment store the image captured by the area camera 2 in the processing PC 8, when there is an abnormality or the like, the image at that location is actually used. It is possible to confirm an abnormality or the like.
  • photographed with the line sensor is a one-dimensional image like the method using the line sensor disclosed by the said patent document 2, only one part of the pantograph 4 can be image
  • the contact force measuring device and the contact force measuring method according to the present embodiment provide accurate contact force even in the case of the pantograph 4 with a small number of springs 6 such as a single arm or the pantograph 4 with the multi-partitioned sliding plate 5a. It can be measured well.
  • the contact force measurement device and the contact force measurement method according to the present embodiment are the same as the contact force measurement device and the contact force measurement method according to the first embodiment in that a plurality of area cameras 2 are installed to improve time resolution. Different.
  • FIG. 4 is a diagram illustrating a method for improving the time resolution by shifting the shutter timings of the plurality of area cameras 2 according to the second embodiment.
  • N area cameras 2 are installed, and the shutter timings of a plurality of area cameras 2 shown by hatching in FIG. Is used to shift the image by 1 / N period.
  • the frame rate can be increased N times by rearranging the captured images in order on the time axis.
  • FIG. 5 is a flowchart showing a contact force measurement method when rearranged photographed images according to the second embodiment.
  • step P10 the images taken by the plurality of area cameras 2 as described above are sequentially processed on the time axis by the processing PC 8. Sort by.
  • steps P11 to P14 are executed as in the first embodiment.
  • the above is the contact force measurement method for rearranging the captured images according to the second embodiment.
  • the position data of the marker 7 is obtained by pattern matching from images photographed by the plurality of area cameras 2, the obtained position data of the marker 7 is stored in the memory of the processing PC 8, and the stored position data of the marker 7 is stored.
  • the contact force measurement method in the case of calculating the contact force by rearranging the items in order will be described. Note that the position data of the marker 7 can be considered as position data of the upper and lower portions of the spring 6.
  • FIG. 6 is a flowchart showing a contact force measurement method when rearranging the position data of the markers 7 according to the second embodiment.
  • step P21 from the images photographed by the plurality of area cameras 2 by the processing PC 8 as described above, step P10 is executed.
  • the position of the marker 7 obtained by pattern matching is used as position data, and the obtained position data of the marker 7 is stored in the memory of the processing PC 8.
  • the contact force is calculated by rearranging the stored position data of the markers 7 in order.
  • steps P12 to P14 are executed as in the first embodiment.
  • the above is the contact force measurement method when rearranging the position data of the markers 7 according to the second embodiment.
  • N area cameras 2 are installed, and the shutter timings of the plurality of area cameras 2 are shifted by 1 / N period to perform shooting.
  • the time resolution can be increased N times as compared with the contact force measuring device and the contact force measuring method according to the first embodiment.
  • the contact force measuring device and the contact force measuring method according to the present embodiment perform spline interpolation on the position data of the marker 7 acquired in the contact force measuring device and the contact force measuring method according to the first and second embodiments, and By estimating the position of the marker 7, the time resolution is further improved. And, by improving the time resolution, the frequency range where the contact force can be measured can be further increased.
  • FIG. 7 is a diagram showing a state of spline interpolation.
  • the horizontal axis represents time and the vertical axis represents pantograph displacement.
  • the spline interpolation is a method of interpolating data by calculating a spline curve that passes through all points when data points h1 to h7 are obtained.
  • the contact force measuring device and the contact force measuring method according to the present embodiment do not have to install N area cameras 2 like the contact force measuring device and the contact force measuring method according to the second embodiment. Since the time resolution equal to or higher than that when N area cameras 2 are installed can be obtained, the number of area cameras 2 installed on the roof of the vehicle 1 can be reduced.
  • FIG. 8 is a flowchart showing a contact force measurement method when a spline interpolation process according to the third embodiment is added.
  • the processing PC 8 determines the position of the marker 7 obtained by pattern matching in step P10 as described above.
  • the obtained position data of the marker 7 is spline-interpolated as data, and the position of the marker 7 between the data is estimated.
  • Steps P12 to P14 are executed as in the first embodiment.
  • the spline interpolation processing is performed before the calculation of the spring reaction force in step P12 (see FIGS. 5 and 6). It will be added.
  • the contact force measuring device and the contact force measuring method according to the present embodiment perform an area camera more than the contact force measuring device and the contact force measuring method according to the first and second embodiments by performing spline interpolation. 2 can be reduced in number. And even if the number of area cameras 2 is reduced, by performing spline interpolation, a time resolution equivalent to or higher than the contact force measuring device and the contact force measuring method according to the first and second embodiments can be obtained. Can do. And by improving the time resolution, it is possible to make the frequency range in which the contact force can be measured higher than in the contact force measuring device and the contact force measuring method according to the first embodiment.
  • the contact force measuring device and the contact force measuring method according to the present embodiment are that the contact resolution according to the first embodiment is improved with respect to the image taken by the area camera 2 using the super-resolution technique. Different from measuring device and contact force measuring method.
  • the configuration of the contact force measuring apparatus according to this embodiment is the same as that of the first embodiment.
  • the super-resolution technique refers to a technique for generating one high-resolution image using a plurality of low-resolution images (see Patent Document 4). And by improving the spatial resolution, the amount of expansion and contraction and acceleration of the spring 6 can be obtained with high accuracy, and as a result, the accuracy of the contact force can be improved.
  • FIG. 9 is a flowchart showing a contact force measurement method using a method for improving the spatial resolution by the super-resolution technique according to the fourth embodiment.
  • the processing PC 8 performs super-resolution processing using a plurality of low-resolution images as described above. One high-resolution image is generated.
  • steps P11 to P14 are executed as in the first embodiment.
  • the spatial resolution of the image can be improved by adding the super-resolution processing. Then, by improving the spatial resolution, the height of the pantograph 4 can be calculated with high accuracy. Therefore, since the expansion / contraction amount of the spring 6 and the acceleration of the pantograph 4 can be accurately obtained, the measurement accuracy of the contact force can be improved.
  • the super-resolution processing is added to the contact force measuring apparatus and the contact force measuring method according to the second embodiment, the super-resolution processing is added before the pattern matching in step P11 (see FIGS. 5 and 6). It becomes.
  • the contact force measurement device and the contact force measurement method according to the present embodiment improve the spatial resolution and improve the contact force measurement accuracy by performing super-resolution processing on the captured image to increase the resolution. Can be improved.
  • the present invention relates to a contact force measuring device and a contact force measuring method for measuring a contact force between an overhead line and a pantograph, for example, using image processing, and more particularly to an area camera when there are a plurality of springs that support a pantograph hull. It can be used for a contact force measuring device and a contact force measuring method for obtaining an accurate contact force by processing an image photographed in (1).

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Power Engineering (AREA)
  • Transportation (AREA)
  • Manufacturing & Machinery (AREA)
  • Force Measurement Appropriate To Specific Purposes (AREA)
  • Current-Collector Devices For Electrically Propelled Vehicles (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Provided are a contact force measuring device and a contact force measuring method which are capable of accurately measuring the contact forces of both a pantograph (4) such as a single-arm pantograph, which has a few springs (6), and a pantograph (4) with a multi-divided contact strip, which has many springs (6).  In the contact force measuring device and the contact force measuring method, an image capturing means comprising an area camera (2) or the like for capturing an image of the spring (6) of the pantograph (4) after improving time resolution by partially defining an image capturing region, an image processing means comprising a processing PC (8) for detecting the spring (6) in the image by image processing, and a contact force calculating means comprising a processing PC (8) for finding contact force by adding the spring reaction force of the spring (6) detected by the image processing means and inertial force are provided.

Description

接触力測定装置及び接触力測定方法Contact force measuring device and contact force measuring method
　本発明は、接触力測定装置及び接触力測定方法に関する。 The present invention relates to a contact force measuring device and a contact force measuring method.
　電気鉄道は、屋根上に設置されている集電装置であるパンタグラフと架線とが接触することによって電力を供給している。このとき、パンタグラフと架線との間には接触力という力が発生している。この接触力の変動が大きい場合、パンタグラフから架線が離線してしまい、アークと呼ばれる放電現象が発生する。そして、アークが発生すると架線は摩耗してしまう。すなわち、接触力の変動は小さいほうが良い。また、接触力が大きすぎる場合も架線は摩耗してしまう。 The electric railway supplies electric power when the pantograph, which is a current collector installed on the roof, comes in contact with the overhead line. At this time, a force called contact force is generated between the pantograph and the overhead wire. When the fluctuation of the contact force is large, the overhead line is disconnected from the pantograph, and a discharge phenomenon called an arc occurs. When the arc is generated, the overhead wire is worn. That is, it is better that the fluctuation of the contact force is small. Moreover, when the contact force is too large, the overhead wire is worn.
　このため、接触力を測定し、離線などの抑制方法について検討したり、摩耗診断を行なったりするために、接触力を測定したいというニーズが高まってきている。そして、従来、接触力を測定する方法は以下のようなものがある。
（１）　パンタグラフに加速度計や歪ゲージなどのセンサを設置し、パンタグラフのある断面に生じる力（断面力）と慣性力を計測することで接触力を得る方法（下記非特許文献１参照）。
（２）　パンタグラフのバネの部分にＬＥＤなどの光源を２個ずつ上下に設置し、画像処理により相対変位を求め、バネの伸縮量を求めることで接触力を得る方法（下記特許文献１参照）。
（３）　パンタグラフの屋根上にラインセンサカメラ（以下、ラインセンサ）を設置し、パンタグラフのバネ部分を撮影する。撮影した画像を処理し相対変位、バネの伸縮量を求めることで接触力を得る方法（下記特許文献２参照）。この方法の場合、上記（２）の方法よりも時間分解能、空間分解能が高いために精度が良い。 For this reason, there is an increasing need to measure the contact force in order to measure the contact force, to examine a method for suppressing the separation, and to perform wear diagnosis. Conventional methods for measuring contact force include the following.
(1) A method for obtaining a contact force by installing a sensor such as an accelerometer or a strain gauge on a pantograph and measuring a force (cross-sectional force) and an inertial force generated on a cross section of the pantograph (see Non-Patent Document 1 below).
(2) A method of obtaining contact force by installing two light sources such as LEDs on the spring part of the pantograph one above the other, obtaining relative displacement by image processing, and obtaining the amount of expansion and contraction of the spring (see Patent Document 1 below) .
(3) A line sensor camera (hereinafter referred to as a line sensor) is installed on the roof of the pantograph, and the spring part of the pantograph is photographed. A method of obtaining a contact force by processing a photographed image and obtaining a relative displacement and a spring expansion / contraction amount (see Patent Document 2 below). In the case of this method, the time resolution and the spatial resolution are higher than the method (2), so the accuracy is good.
　上記（３）において、画像処理の内容は詳述されていないが、例えば、下記特許文献３に開示される方法を用いることにより、相対変位やバネの伸縮量を求めることは可能である。下記特許文献３では、パンタグラフに光を反射しやすい白い帯状のマーカーを取り付け、車両の屋根上に設置したラインセンサでマーカーを撮影し、マーカーの位置をパタンマッチングによって検出することでパンタグラフの変位を測定している。また、白色の帯を２本以上にして、形状を複雑化することにより、パタンマッチングの際に用いる特徴量を増やし、誤検出などを防止している。 In the above (3), the content of the image processing is not described in detail, but it is possible to obtain the relative displacement and the amount of expansion and contraction of the spring by using, for example, the method disclosed in Patent Document 3 below. In the following Patent Document 3, a white belt-like marker that easily reflects light is attached to the pantograph, the marker is photographed with a line sensor installed on the roof of the vehicle, and the position of the marker is detected by pattern matching to detect the displacement of the pantograph. Measuring. Further, by making two or more white bands and complicating the shape, the amount of features used for pattern matching is increased, and erroneous detection and the like are prevented.
特開２００１－２３５３１０号公報JP 2001-235310 A 特開２００８－１８５４５７号公報JP 2008-185457 A 特開２００８－１０４３１２号公報JP 2008-104312 A 特開２００８－１０９３７５号公報JP 2008-109375 A
　しかしながら、上記（１）の方法のようにパンタグラフにセンサ類を設置する方法では、パンタグラフのバネの部分の全てにセンサを取り付ける必要がある。センサを取り付けた箇所には、普通ならば発生することのない揚力が掛かるので、パンタグラフの動特性に影響を与える。 However, in the method of installing sensors on the pantograph as in the method (1) above, it is necessary to attach the sensor to all of the pantograph springs. Since a lift that is not normally generated is applied to the location where the sensor is attached, it affects the dynamic characteristics of the pantograph.
　また、多分割すり板付のパンタグラフの場合、設置するセンサの数が多くなるため、さらにパンタグラフの動特性に影響を与えてしまう。パンタグラフの動特性が変化してしまうと、センサなどを設置して得られた接触力の信頼性が低くなってしまうという問題点がある。 Also, in the case of a pantograph with a multi-partitioned sliding plate, the number of sensors to be installed increases, which further affects the dynamic characteristics of the pantograph. If the dynamic characteristics of the pantograph change, there is a problem that the reliability of the contact force obtained by installing a sensor or the like becomes low.
　その点、上記（２）の画像処理を用いた方法では、撮影した画像を処理することによって接触力を求めるため、パンタグラフにセンサなど設置する必要がなく、動特性にも影響を与えない。そして、上記（２）の方法では、画像を撮影するためのカメラにはエリアカメラを用いている。しかし、エリアカメラを用いた場合、画像の空間分解能が低いので接触力の測定精度が悪い。 In that respect, in the method using the image processing of (2) above, since the contact force is obtained by processing the captured image, there is no need to install a sensor or the like on the pantograph, and the dynamic characteristics are not affected. In the method (2), an area camera is used as a camera for taking an image. However, when an area camera is used, the contact force measurement accuracy is poor because the spatial resolution of the image is low.
　そこで、上記（２）の方法では、超異方倍率レンズという垂直方向の倍率を８０倍にするという特殊なレンズを使用して、精度の問題を解決している。また、エリアカメラを使用しているので、多分割すり板付のパンタグラフも１台のカメラで測定することが可能であると考えられる。しかし、エリアカメラは時間分解能が低いために、接触力の測定可能周波数域が低くなってしまうという問題点がある。 Therefore, in the above method (2), the problem of accuracy is solved by using a special lens called a super anisotropic magnification lens that increases the vertical magnification to 80 times. In addition, since an area camera is used, it can be considered that a pantograph with a multi-particulate sliding plate can be measured with one camera. However, since the area camera has a low time resolution, there is a problem that the frequency range in which the contact force can be measured becomes low.
　また、上記（３）の方法では、ラインセンサを使用することにより上記（２）の方法における問題点を解決している。ラインセンサとは１次元に配列された撮像素子を持ち、高解像度の１次元画像を撮影することができ、また、サンプリング周波数も高いカメラである。したがって、空間分解能と時間分解能が高いカメラなので、接触力の精度も高く、測定可能周波数も高くなる。 In the method (3), the problem in the method (2) is solved by using a line sensor. A line sensor is a camera that has an image sensor arranged in a one-dimensional array, can capture a high-resolution one-dimensional image, and has a high sampling frequency. Therefore, since the camera has high spatial resolution and high temporal resolution, the accuracy of the contact force is high and the measurable frequency is also high.
　シングルアーム等のパンタグラフの場合、バネが少ないためラインセンサの設置台数は少なくなる。しかし、多分割すり板付のパンタグラフの場合、すり板の数だけバネがあるため、バネの数だけラインセンサを設置する必要がある。そして、バネの数だけラインセンサを車両の屋根上に設置することはスペース的に困難であるという問題点がある。 In the case of a pantograph such as a single arm, the number of line sensors installed is reduced because there are few springs. However, in the case of a pantograph with a multi-particulate sliding plate, there are as many springs as there are sliding plates, so it is necessary to install as many line sensors as the number of springs. And there is a problem that it is difficult to install the line sensors on the roof of the vehicle by the number of springs.
　すなわち、上述したように、従来の方法ではシングルアーム等のバネが少ないパンタグラフとバネが多い多分割すり板付パンタグラフの両方を精度良く接触力を測定することはできない。 That is, as described above, the conventional method cannot accurately measure the contact force of both the pantograph with a small number of springs such as a single arm and the pantograph with a multi-partitioned sliding plate with many springs.
　以上のことから、本発明は、シングルアーム等のバネが少ないパンタグラフとバネが多い多分割すり板付パンタグラフの両方において精度良く接触力を測定することができる接触力測定装置及び接触力測定方法を提供することを目的とする。 From the above, the present invention provides a contact force measuring device and a contact force measuring method capable of measuring contact force with high accuracy in both a pantograph with a small number of springs, such as a single arm, and a pantograph with a multi-partitioned sliding plate with many springs. The purpose is to do.
　上記の課題を解決する第１の発明に係る接触力測定装置は、
　パンタグラフのバネの画像を撮影範囲を部分的に指定して時間分解能を向上させて撮影する撮影手段と、
　前記画像中の前記バネを画像処理により検出する画像処理手段と、
　前記画像処理手段により検出した前記バネの上下部分の位置から相対変位を計算し、相対変位の時間変化分を求めることにより前記バネの伸縮量を計算した上で、前記バネの伸縮量にバネ定数を乗ずることにより前記バネのバネ反力を求めるバネ反力計算手段と、
　前記画像処理手段により検出した前記バネの上部の変位を２階微分することにより加速度を計算した上で、加速度に前記パンタグラフの等価質量を乗ずることにより慣性力を求める慣性力計算手段と、
　前記バネ反力と前記慣性力とを加算することにより接触力を求める接触力計算手段と
を備える
ことを特徴とする。 A contact force measuring device according to a first invention for solving the above-described problems is as follows.
An imaging means for capturing an image of a pantograph spring by partially specifying an imaging range and improving time resolution;
Image processing means for detecting the spring in the image by image processing;
The relative displacement is calculated from the positions of the upper and lower portions of the spring detected by the image processing means, and the amount of expansion and contraction of the spring is calculated by calculating the amount of change in the relative displacement over time. A spring reaction force calculating means for obtaining a spring reaction force of the spring by multiplying by
An inertial force calculating means for calculating an inertial force by calculating an acceleration by second-order differentiation of the displacement of the upper part of the spring detected by the image processing means, and multiplying the acceleration by an equivalent mass of the pantograph;
Contact force calculating means for obtaining a contact force by adding the spring reaction force and the inertial force is provided.
　上記の課題を解決する第２の発明に係る接触力測定装置は、
　パンタグラフのバネの画像を撮影する複数の撮影手段と、
　複数の前記撮影手段によりシャッタータイミングをずらして撮影された画像を時間軸上に順番に並べ替える並べ替え手段と、
　前記画像中の前記バネを画像処理により検出する画像処理手段と、
　前記画像処理手段により検出した前記バネの上下部分の位置から相対変位を計算し、相対変位の時間変化分を求めることにより前記バネの伸縮量を計算した上で、前記バネの伸縮量にバネ定数を乗ずることにより前記バネのバネ反力を求めるバネ反力計算手段と、
　前記画像処理手段により検出した前記バネの上部の変位を２階微分することにより加速度を計算した上で、加速度に前記パンタグラフの等価質量を乗ずることにより慣性力を求める慣性力計算手段と、
　前記バネ反力と前記慣性力とを加算することにより接触力を求める接触力計算手段と
を備える
ことを特徴とする。 A contact force measuring device according to a second invention for solving the above-mentioned problems is as follows.
A plurality of photographing means for photographing an image of a pantograph spring;
Rearrangement means for rearranging images taken by shifting the shutter timing by the plurality of photographing means in order on the time axis;
Image processing means for detecting the spring in the image by image processing;
The relative displacement is calculated from the positions of the upper and lower portions of the spring detected by the image processing means, and the amount of expansion and contraction of the spring is calculated by calculating the amount of change in the relative displacement over time. A spring reaction force calculating means for obtaining a spring reaction force of the spring by multiplying by
An inertial force calculating means for calculating an inertial force by calculating an acceleration by second-order differentiation of the displacement of the upper part of the spring detected by the image processing means, and multiplying the acceleration by an equivalent mass of the pantograph;
Contact force calculating means for obtaining a contact force by adding the spring reaction force and the inertial force is provided.
　上記の課題を解決する第３の発明に係る接触力測定装置は、第１の発明又は第２の発明において、
　前記画像処理手段により求めた前記バネの上下部分の位置を位置データとし、求めた前記バネの位置データにスプライン補間を施すスプライン補間手段を備える
ことを特徴とする。 A contact force measuring device according to a third invention for solving the above-mentioned problems is the first invention or the second invention,
Spline interpolation means is provided, which uses the position of the upper and lower portions of the spring obtained by the image processing means as position data, and performs spline interpolation on the obtained position data of the spring.
　上記の課題を解決する第４の発明に係る接触力測定装置は、第１の発明又は第２の発明において、
　複数枚の低解像度画像を使って超解像度処理を行なうことにより、１枚の高解像度画像を生成する超解像度処理手段を備える
ことを特徴とする。 The contact force measuring device according to a fourth invention for solving the above-mentioned problems is the first invention or the second invention,
Super-resolution processing means for generating one high-resolution image by performing super-resolution processing using a plurality of low-resolution images is provided.
　上記の課題を解決する第５の発明に係る接触力測定方法は、
　パンタグラフのバネの画像を撮影範囲を部分的に指定して時間分解能を向上させて撮影する撮影処理と、
　前記画像中の前記バネを画像処理により検出する画像処理と、
　前記画像処理手段により検出した前記バネの上下部分の位置から相対変位を計算し、相対変位の時間変化分を求めることにより前記バネの伸縮量を計算した上で、前記バネの伸縮量にバネ定数を乗ずることにより前記バネのバネ反力を求めるバネ反力計算処理と、
　前記画像処理手段により検出した前記バネの上部の変位を２階微分することにより加速度を計算した上で、加速度に前記パンタグラフの等価質量を乗ずることにより慣性力を求める慣性力計算処理と、
　前記バネ反力と前記慣性力とを加算することにより接触力を求める接触力計算処理
を行う
ことを特徴とする。 A contact force measurement method according to a fifth invention for solving the above-described problem is as follows.
A shooting process that captures images of pantograph springs by partially specifying the shooting range and improving the time resolution;
Image processing for detecting the spring in the image by image processing;
The relative displacement is calculated from the positions of the upper and lower portions of the spring detected by the image processing means, and the amount of expansion and contraction of the spring is calculated by calculating the amount of change in the relative displacement over time. A spring reaction force calculation process for obtaining the spring reaction force of the spring by multiplying by
An inertial force calculation process for obtaining an inertial force by multiplying the acceleration by the equivalent mass of the pantograph after calculating the acceleration by second-order differentiation of the displacement of the upper part of the spring detected by the image processing unit;
A contact force calculation process for obtaining a contact force by adding the spring reaction force and the inertial force is performed.
　上記の課題を解決する第６の発明に係る接触力測定方法は、
　パンタグラフのバネの画像を撮影する複数の撮影処理と、
　複数の前記撮影手段によりシャッタータイミングをずらして撮影された画像を時間軸上に順番に並べ替える並べ替え処理と、
　前記画像中の前記バネを画像処理により検出する画像処理と、
　前記画像処理手段により検出した前記バネの上下部分の位置から相対変位を計算し、相対変位の時間変化分を求めることにより前記バネの伸縮量を計算した上で、前記バネの伸縮量にバネ定数を乗ずることにより前記バネのバネ反力を求めるバネ反力計算処理と、
　前記画像処理手段により検出した前記バネの上部の変位を２階微分することにより加速度を計算した上で、加速度に前記パンタグラフの等価質量を乗ずることにより慣性力を求める慣性力計算処理と、
　前記バネ反力と前記慣性力とを加算することにより接触力を求める接触力計算処理
を行う
ことを特徴とする。 A contact force measuring method according to a sixth invention for solving the above-mentioned problems is as follows.
Multiple shooting processes for shooting images of pantograph springs,
A rearrangement process for rearranging images taken by shifting the shutter timing by the plurality of photographing means in order on the time axis;
Image processing for detecting the spring in the image by image processing;
The relative displacement is calculated from the positions of the upper and lower portions of the spring detected by the image processing means, and the amount of expansion and contraction of the spring is calculated by calculating the amount of change in the relative displacement over time. A spring reaction force calculation process for obtaining the spring reaction force of the spring by multiplying by
An inertial force calculation process for obtaining an inertial force by multiplying the acceleration by the equivalent mass of the pantograph after calculating the acceleration by second-order differentiation of the displacement of the upper part of the spring detected by the image processing means;
A contact force calculation process for obtaining a contact force by adding the spring reaction force and the inertial force is performed.
　上記の課題を解決する第７の発明に係る接触力測定装置は、第５の発明又は第６の発明において、
　前記画像処理と前記バネ反力計算処理との間において、前記前記画像処理手段により求めた前記バネの上下部分の位置を位置データとし、求めた前記バネの位置データにスプライン補間を施すスプライン補間処理を行う
ことを特徴とする。 A contact force measuring device according to a seventh invention for solving the above-mentioned problems is the fifth invention or the sixth invention,
Between the image processing and the spring reaction force calculation processing, the position of the upper and lower portions of the spring obtained by the image processing means is used as position data, and spline interpolation processing is performed for performing spline interpolation on the obtained spring position data. It is characterized by performing.
　上記の課題を解決する第８の発明に係る接触力測定装置は、第５の発明又は第６の発明において、
　前記撮影処理と前記画像処理との間において、複数枚の低解像度画像を使って超解像度処理を行なうことにより、１枚の高解像度画像を生成する超解像度処理を行う
ことを特徴とする。 A contact force measuring device according to an eighth invention for solving the above-mentioned problems is the fifth invention or the sixth invention,
A super-resolution process for generating one high-resolution image is performed by performing a super-resolution process using a plurality of low-resolution images between the photographing process and the image process.
　本発明によれば、シングルアーム等のバネが少ないパンタグラフとバネが多い多分割すり板付パンタグラフの両方において精度良く接触力を測定することができる接触力測定装置及び接触力測定方法を提供することができる。 According to the present invention, it is possible to provide a contact force measuring device and a contact force measuring method capable of measuring contact force with high accuracy in both a pantograph with a small number of springs, such as a single arm, and a pantograph with a multi-partitioned sliding plate with many springs. it can.
第１の実施例に係る接触力測定装置の構成図である。It is a block diagram of the contact-force measuring apparatus which concerns on a 1st Example. エリアカメラで撮影した画像の例を示した図である。It is the figure which showed the example of the image image | photographed with the area camera. 第１の実施例に係るエリアカメラを用いた画像処理による接触力測定方法を示したフローチャートである。It is the flowchart which showed the contact force measurement method by the image process using the area camera which concerns on a 1st Example. 第２の実施例に係る複数のエリアカメラのシャッタータイミングをずらして時間分解能を向上する方法を示した図である。It is the figure which showed the method of improving the time resolution by shifting the shutter timing of the several area camera which concerns on a 2nd Example. 第２の実施例に係る撮影画像を並べ替える場合の接触力測定方法を示したフローチャートである。It is the flowchart which showed the contact force measurement method in the case of rearranging the picked-up image which concerns on a 2nd Example. 第２の実施例に係るマーカーの位置データを並べ替える場合の接触力測定方法を示したフローチャートである。It is the flowchart which showed the contact force measurement method in the case of rearranging the marker position data based on 2nd Example. スプライン補間の様子を示した図である。It is the figure which showed the mode of the spline interpolation. 第３の実施例に係るスプライン補間処理を追加した場合の接触力測定方法を示したフローチャートである。It is the flowchart which showed the contact force measurement method at the time of adding the spline interpolation process which concerns on a 3rd Example. 第４の実施例に係る超解像度技術により空間分解能を向上する方法を用いた接触力測定方法を示したフローチャートである。It is the flowchart which showed the contact force measurement method using the method of improving spatial resolution by the super-resolution technique which concerns on a 4th Example.
　以下、本発明に係る接触力測定装置及び接触力測定方法の実施例について、図面を参照しながら説明する。 Hereinafter, embodiments of the contact force measuring device and the contact force measuring method according to the present invention will be described with reference to the drawings.
　以下、本発明に係る接触力測定装置及び接触力測定方法の第１の実施例について説明する。
　はじめに、本実施例に係る接触力測定装置の構成について説明する。
　本実施例に係る接触力測定装置及び接触力測定方法は、エリアカメラで撮影した画像の中から特定の領域だけ高速に取得し、その画像を処理することにより、上述した時間分解能の問題を解決した接触力測定を行うことを特徴とする。 Hereinafter, a first embodiment of a contact force measuring apparatus and a contact force measuring method according to the present invention will be described.
First, the configuration of the contact force measuring device according to the present embodiment will be described.
The contact force measuring apparatus and the contact force measuring method according to the present embodiment solves the above-described problem of time resolution by acquiring only a specific region from an image captured by an area camera at high speed and processing the image. The contact force measurement is performed.
　図２は、エリアカメラで撮影した画像の例を示した図である。
　エリアカメラとして、例えば、ＣＭＯＳカメラを用いた場合、図２に示すように、通常のカメラで撮影した場合に取得することができる撮影範囲の１枚の画像９中における、図２中斜線で示す部分のみを指定して撮影することが可能である。そして、撮影を指定できる部分は画像９中の１部分のみではなく、図２に示すように複数の部分を指定して撮影することができる（上記非特許文献２の１６～１９頁記載の「４．２画像のサイズ変更」参照）。 FIG. 2 is a diagram illustrating an example of an image captured by an area camera.
As an area camera, for example, when a CMOS camera is used, as shown in FIG. 2, it is indicated by a hatched line in FIG. 2 in one image 9 in a shooting range that can be acquired when shooting with a normal camera. It is possible to shoot by specifying only the part. Further, not only one part in the image 9 can be designated for photographing, but a plurality of parts can be designated and photographed as shown in FIG. 2 (see “Non-Patent Document 2” on pages 16 to 19). Refer to “4.2 Image size change”).
　図１は、第１の実施例に係る接触力測定装置の構成図である。
　図１に示すように、本実施例に係る接触力測定装置においては、車両１の屋根の上にエリアカメラ２を設置し、その付近に照明３を設置する。パンタグラフ４のすり板５のバネ６の上下部分に、光を反射しにくい黒い部材の上に反射しやすい白い部材を配置したマーカー７を取り付ける。なお、白い部材の形状は、円形や四角形など画像処理の際に抽出しやすいような特徴的な形状であれば良い。 FIG. 1 is a configuration diagram of a contact force measuring apparatus according to the first embodiment.
As shown in FIG. 1, in the contact force measuring apparatus according to the present embodiment, an area camera 2 is installed on the roof of the vehicle 1, and an illumination 3 is installed in the vicinity thereof. At the upper and lower portions of the spring 6 of the sliding plate 5 of the pantograph 4, a marker 7 in which a white member that easily reflects light is arranged on a black member that hardly reflects light is attached. The shape of the white member may be a characteristic shape that can be easily extracted during image processing, such as a circle or a rectangle.
　図１に示すように、多分割すり板５ａのパンタグラフ４の場合は、マーカー７は全てのバネ６の上下部分に取り付けるようにする。なお、シングルアーム等のバネが少ないパンタグラフの場合は、多分割すり板５ａのパンタグラフ４に比べバネが少ないマーカー７の数は少なくなる。 As shown in FIG. 1, in the case of the pantograph 4 of the multi-partitioned sliding plate 5a, the marker 7 is attached to the upper and lower parts of all the springs 6. In the case of a pantograph having a small number of springs such as a single arm, the number of markers 7 having a small number of springs is smaller than that of the pantograph 4 of the multi-particulate sliding plate 5a.
　また、本実施例に係る接触力測定装置においては、中央演算処理装置やＲＯＭ及びＲＡＭ等のメモリや入出力手段を備えた処理用ＰＣ８が車両１内に設置されている。そして、本実施例に係る接触力測定装置においては、処理用ＰＣ８は、計算や記憶等の各種処理を実行する手段として用いられている。処理用ＰＣ８には、エリアカメラ２が接続されており、エリアカメラ２により撮影された画像のデータが処理用ＰＣ８へ出力されている。
　以上が、本実施例に係る接触力測定装置の構成である。 In the contact force measuring apparatus according to the present embodiment, a processing PC 8 having a central processing unit, a memory such as ROM and RAM, and input / output means is installed in the vehicle 1. In the contact force measuring apparatus according to the present embodiment, the processing PC 8 is used as a means for executing various processes such as calculation and storage. The area camera 2 is connected to the processing PC 8, and image data captured by the area camera 2 is output to the processing PC 8.
The above is the configuration of the contact force measuring apparatus according to the present embodiment.
　次に、本実施例に係る接触力測定装置の動作について説明する。
　はじめに、照明３により光を当て、エリアカメラ２によりパンタグラフ４のバネ６の撮影を行なう。そして、撮影した画像は処理用ＰＣ８に記憶する。
　次に、処理用ＰＣ８により、記憶した画像を処理することによって、パンタグラフ４のバネ６の部分を検出する。 Next, the operation of the contact force measuring apparatus according to this embodiment will be described.
First, light is applied by the illumination 3, and the area 6 captures the spring 6 of the pantograph 4. The captured image is stored in the processing PC 8.
Next, the portion of the spring 6 of the pantograph 4 is detected by processing the stored image by the processing PC 8.
　次に、処理用ＰＣ８により、バネ６の上下部分の位置から相対変位を計算し、相対変位の時間変化分を求めることによりバネ６の伸縮量を計算する。そして、バネ６の伸縮量にバネ定数を乗ずることによりバネ６のバネ反力を求める。 Next, the relative displacement is calculated from the positions of the upper and lower portions of the spring 6 by the processing PC 8, and the expansion / contraction amount of the spring 6 is calculated by obtaining the time change of the relative displacement. Then, the spring reaction force of the spring 6 is obtained by multiplying the amount of expansion / contraction of the spring 6 by the spring constant.
　次に、処理用ＰＣ８により、バネ６の上部の変位を２階微分することにより加速度を計算する。そして、加速度にパンタグラフ４の等価質量を乗ずることにより慣性力を求める。
　最後に、上述した方法で求めたバネ反力と慣性力とを加算することにより接触力を求める（上記特許文献２参照）。
　以上が、本実施例に係る接触力測定装置の動作である。 Next, the acceleration is calculated by second-order differentiation of the displacement of the upper portion of the spring 6 by the processing PC 8. Then, the inertial force is obtained by multiplying the acceleration by the equivalent mass of the pantograph 4.
Finally, the contact force is obtained by adding the spring reaction force and inertial force obtained by the above-described method (see Patent Document 2).
The above is the operation of the contact force measuring apparatus according to the present embodiment.
　次に、本実施例に係るエリアカメラ２を用いた画像処理による接触力測定方法について説明する。
　図３は、第１の実施例に係るエリアカメラ２を用いた画像処理による接触力測定方法を示したフローチャートである。 Next, a contact force measurement method by image processing using the area camera 2 according to the present embodiment will be described.
FIG. 3 is a flowchart showing a contact force measurement method by image processing using the area camera 2 according to the first embodiment.
　図３に示すように、ステップＰ１０において、エリアカメラ２の撮影範囲を指定し、エリアカメラ２により画像を撮影する。このとき、パンタグラフ４のバネ６の上下部分に設置したマーカー７と同等か、それ以上の領域を撮影できるように撮影範囲を指定し、エリアカメラ２により画像の撮影を行なう。なお、撮影範囲を小さくすることによってフレームレートを上げる、すなわち、時間分解能を上げることができる。そして、撮影した画像を車両１内に設置した処理用ＰＣ８に記憶する。 As shown in FIG. 3, in step P <b> 10, the shooting range of the area camera 2 is designated and an image is shot by the area camera 2. At this time, an imaging range is specified so that an area equivalent to or larger than the marker 7 installed on the upper and lower portions of the spring 6 of the pantograph 4 can be taken, and an image is taken by the area camera 2. Note that the frame rate can be increased by reducing the imaging range, that is, the time resolution can be increased. Then, the photographed image is stored in the processing PC 8 installed in the vehicle 1.
　ステップＰ１１において、処理用ＰＣ８により、予め取得しておいたマーカー７のテンプレートを用いてパタンマッチングを行うことにより、記憶した画像からパンタグラフ４のバネ６の上下部分に取り付けられたマーカー７の位置を検出する。 In step P11, pattern matching is performed by the processing PC 8 using the template of the marker 7 acquired in advance, so that the position of the marker 7 attached to the upper and lower portions of the spring 6 of the pantograph 4 is determined from the stored image. To detect.
　ステップＰ１２において、処理用ＰＣ８により、パンタグラフ４のバネ６の上下部分のマーカー７の相対変位を計算し、時間変化分を求めることによりバネ６の伸縮量を計算する。そして、バネ６の伸縮量にバネ定数を乗じて、バネ６のバネ反力を求める。 In step P12, the processing PC 8 calculates the relative displacement of the markers 7 on the upper and lower portions of the spring 6 of the pantograph 4 and calculates the amount of expansion and contraction of the spring 6 by obtaining the time change. Then, the spring reaction force of the spring 6 is obtained by multiplying the expansion / contraction amount of the spring 6 by the spring constant.
　ステップＰ１３において、処理用ＰＣ８により、バネ６の上部のマーカー７の変位を２階微分し、加速度を計算する。そして、加速度にパンタグラフ４の等価質量を乗じることにより慣性力を求める。 In step P13, the displacement of the marker 7 on the top of the spring 6 is second-order differentiated by the processing PC 8 to calculate the acceleration. Then, the inertial force is obtained by multiplying the acceleration by the equivalent mass of the pantograph 4.
　ステップＰ１４において、処理用ＰＣ８により、上記ステップＰ１２，Ｐ１３において求めたバネ反力と慣性力とを加算して接触力を求める。
　以上が、本発明に係るエリアカメラ２を用いた画像処理による接触力測定方法である。 In step P14, the processing PC 8 obtains the contact force by adding the spring reaction force and inertial force obtained in steps P12 and P13.
The above is the contact force measurement method by image processing using the area camera 2 according to the present invention.
　以上のように、本実施形態に係る接触力測定装置及び接触力測定方法は、エリアカメラ２で撮影する範囲を指定することによって、時間分解能を上げることができる。これにより、測定可能周波数域を上記特許文献１に開示される方法よりも高くすることができる。 As described above, the contact force measuring device and the contact force measuring method according to the present embodiment can increase the time resolution by designating a range to be photographed by the area camera 2. Thereby, the measurable frequency range can be made higher than the method disclosed in Patent Document 1.
　また、本実施形態に係る接触力測定装置及び接触力測定方法は、エリアカメラ２を用いているので、図２に示すような多分割すり板５ａ付のパンタグラフ４でも、上記特許文献２に開示されるラインセンサを用いた方法のようにラインセンサを複数台設置しなくても接触力を測定することができる。 In addition, since the contact force measuring device and the contact force measuring method according to the present embodiment use the area camera 2, even the pantograph 4 with the multi-partitioned sliding plate 5a as shown in FIG. The contact force can be measured without installing a plurality of line sensors as in the method using a line sensor.
　また、本実施形態に係る接触力測定装置及び接触力測定方法は、エリアカメラ２を用いているので、図１に示すような多分割すり板５ａ付のパンタグラフ４であっても、上記特許文献２に開示されるラインセンサを用いた方法のように、カメラをパンタグラフ４のバネ６の数だけ設置する必要がない。 Further, since the contact force measuring device and the contact force measuring method according to the present embodiment use the area camera 2, even the pantograph 4 with the multi-partitioned sliding plate 5a as shown in FIG. Unlike the method using the line sensor disclosed in FIG. 2, it is not necessary to install the camera by the number of the springs 6 of the pantograph 4.
　また、本実施形態に係る接触力測定装置及び接触力測定方法は、エリアカメラ２で撮影した画像を処理用ＰＣ８に保存しているので、異常等があった場合に、その箇所の画像を実際に見て異常等を確認することができる。なお、上記特許文献２に開示されるラインセンサを用いた方法のように、ラインセンサで撮影した画像は１次元画像であるので、パンタグラフ４の１部分しか撮影できない。したがって、パンタグラフ全体を見ることができない。 Moreover, since the contact force measuring device and the contact force measuring method according to the present embodiment store the image captured by the area camera 2 in the processing PC 8, when there is an abnormality or the like, the image at that location is actually used. It is possible to confirm an abnormality or the like. In addition, since the image image | photographed with the line sensor is a one-dimensional image like the method using the line sensor disclosed by the said patent document 2, only one part of the pantograph 4 can be image | photographed. Therefore, the entire pantograph cannot be seen.
　また、本実施形態に係る接触力測定装置及び接触力測定方法は、シングルアーム等のバネ６が少ないパンタグラフ４の場合や多分割すり板５ａ付のパンタグラフ４の場合であっても接触力を精度良く測定することができる。 In addition, the contact force measuring device and the contact force measuring method according to the present embodiment provide accurate contact force even in the case of the pantograph 4 with a small number of springs 6 such as a single arm or the pantograph 4 with the multi-partitioned sliding plate 5a. It can be measured well.
　以下、本発明に係る接触力測定装置及び接触力測定方法の第２の実施例について説明する。
　本実施例に係る接触力測定装置及び接触力測定方法は、エリアカメラ２を複数台設置して、時間分解能を向上させる点が第１の実施例に係る接触力測定装置及び接触力測定方法と異なる。 Hereinafter, a second embodiment of the contact force measuring device and the contact force measuring method according to the present invention will be described.
The contact force measurement device and the contact force measurement method according to the present embodiment are the same as the contact force measurement device and the contact force measurement method according to the first embodiment in that a plurality of area cameras 2 are installed to improve time resolution. Different.
　図４は、第２の実施例に係る複数のエリアカメラ２のシャッタータイミングをずらして時間分解能を向上する方法を示した図である。
　図４に示すように、本実施例に係る接触力測定装置及び接触力測定方法においては、エリアカメラ２をＮ台設置し、図４中斜線で示す複数のエリアカメラ２のシャッタータイミングをパルスジェネレータを使用して、１／Ｎ周期ずつずらして撮影を行なう。そして、図４中に結果として示すように、撮影した画像を時間軸上に順番に並べ替えることにより、フレームレートをＮ倍にすることができる。 FIG. 4 is a diagram illustrating a method for improving the time resolution by shifting the shutter timings of the plurality of area cameras 2 according to the second embodiment.
As shown in FIG. 4, in the contact force measuring apparatus and the contact force measuring method according to the present embodiment, N area cameras 2 are installed, and the shutter timings of a plurality of area cameras 2 shown by hatching in FIG. Is used to shift the image by 1 / N period. As shown as a result in FIG. 4, the frame rate can be increased N times by rearranging the captured images in order on the time axis.
　次に、本実施例に係る撮影画像を順番に並べたあとにパタンマッチングによりマーカー７の位置を求め、接触力を計算する場合の接触力測定方法について説明する。
　図５は、第２の実施例に係る撮影画像を並べ替える場合の接触力測定方法を示したフローチャートである。
　図５に示すように、第１の実施例と同様にステップＰ１０の実行後、ステップＰ２０において、処理用ＰＣ８により、上述したように複数のエリアカメラ２により撮影された画像を時間軸上に順番に並べ替える。ステップＰ２０の実行後は、第１の実施例と同様にステップＰ１１～Ｐ１４を実行する。
　以上が第２の実施例に係る撮影画像を並べ替える場合の接触力測定方法である。 Next, a contact force measurement method in the case of calculating the contact force by obtaining the position of the marker 7 by pattern matching after arranging the captured images according to the present embodiment in order will be described.
FIG. 5 is a flowchart showing a contact force measurement method when rearranged photographed images according to the second embodiment.
As shown in FIG. 5, after execution of step P10 as in the first embodiment, in step P20, the images taken by the plurality of area cameras 2 as described above are sequentially processed on the time axis by the processing PC 8. Sort by. After execution of step P20, steps P11 to P14 are executed as in the first embodiment.
The above is the contact force measurement method for rearranging the captured images according to the second embodiment.
　次に、複数のエリアカメラ２により撮影された画像からパタンマッチングによりマーカー７の位置データを求め、求めたマーカー７の位置データを処理用ＰＣ８のメモリ上に記憶し、記憶したマーカー７の位置データを順番に並べ替えて接触力を計算する場合の接触力測定方法について説明する。なお、マーカー７の位置データは、バネ６の上下部分の位置データと考えることができる。 Next, the position data of the marker 7 is obtained by pattern matching from images photographed by the plurality of area cameras 2, the obtained position data of the marker 7 is stored in the memory of the processing PC 8, and the stored position data of the marker 7 is stored. The contact force measurement method in the case of calculating the contact force by rearranging the items in order will be described. Note that the position data of the marker 7 can be considered as position data of the upper and lower portions of the spring 6.
　図６は、第２の実施例に係るマーカー７の位置データを並べ替える場合の接触力測定方法を示したフローチャートである。
　図６に示すように、第１の実施例と同様にステップＰ１０，１１の実行後、ステップＰ２１において、処理用ＰＣ８により、上述したように複数のエリアカメラ２により撮影された画像から、ステップＰ１０においてパタンマッチングにより求めたマーカー７の位置を位置データとし、求めたマーカー７の位置データを処理用ＰＣ８のメモリ上に記憶する。そして、記憶したマーカー７の位置データを順番に並べ替えて接触力を計算する。ステップＰ２１の実行後は、第１の実施例と同様にステップＰ１２～Ｐ１４を実行する。
　以上が、第２の実施例に係るマーカー７の位置データを並べ替える場合の接触力測定方法である。 FIG. 6 is a flowchart showing a contact force measurement method when rearranging the position data of the markers 7 according to the second embodiment.
As shown in FIG. 6, after execution of steps P10 and 11 as in the first embodiment, in step P21, from the images photographed by the plurality of area cameras 2 by the processing PC 8 as described above, step P10 is executed. The position of the marker 7 obtained by pattern matching is used as position data, and the obtained position data of the marker 7 is stored in the memory of the processing PC 8. Then, the contact force is calculated by rearranging the stored position data of the markers 7 in order. After execution of step P21, steps P12 to P14 are executed as in the first embodiment.
The above is the contact force measurement method when rearranging the position data of the markers 7 according to the second embodiment.
　図５に示す撮影画像を並べ替える場合の接触力測定方法と、図６に示すマーカー７の位置データを並べ替える場合の接触力測定方法とでは、処理するデータは画像データと数値データで異なるが、最終的に得られる結果は同じである。しかしながら、図５に示す撮影画像を並べ替える場合の接触力測定方法における画像データを入れ替える処理よりも、図６に示すマーカー７の位置データを並べ替える場合の接触力測定方法における数値データを入れ替える処理の方が、処理時間を短くすることができる。 In the contact force measurement method for rearranging the captured images shown in FIG. 5 and the contact force measurement method for rearranging the position data of the marker 7 shown in FIG. The final result is the same. However, the process of replacing numerical data in the contact force measurement method in the case of rearranging the position data of the marker 7 shown in FIG. 6 rather than the process of replacing image data in the contact force measurement method in the case of rearranging the captured images shown in FIG. The processing time can be shortened.
　以上のように、本実施形態に係る接触力測定装置及び接触力測定方法は、エリアカメラ２をＮ台設置し、複数のエリアカメラ２のシャッタータイミングを１／Ｎ周期ずつずらして撮影を行なうことで、第１の実施例に係る接触力測定装置及び接触力測定方法よりも時間分解能をＮ倍することができる。そして、時間分解能が向上することにより、第１の実施例に係る接触力測定装置及び接触力測定方法よりも接触力の測定可能周波数域を高くすることができる。 As described above, in the contact force measuring device and the contact force measuring method according to the present embodiment, N area cameras 2 are installed, and the shutter timings of the plurality of area cameras 2 are shifted by 1 / N period to perform shooting. Thus, the time resolution can be increased N times as compared with the contact force measuring device and the contact force measuring method according to the first embodiment. And by improving the time resolution, it is possible to make the frequency range in which the contact force can be measured higher than in the contact force measuring device and the contact force measuring method according to the first embodiment.
　以下、本発明に係る接触力測定装置及び接触力測定方法の第３の実施例について説明する。
　本実施例に係る接触力測定装置及び接触力測定方法は、第１，２の実施例に係る接触力測定装置及び接触力測定方法において取得したマーカー７の位置データをスプライン補間し、データ間のマーカー７の位置を推定することにより、時間分解能をさらに向上させる。そして、時間分解能が向上することにより、接触力の測定可能周波数域をさらに高くすることができる。 Hereinafter, a third embodiment of the contact force measuring device and the contact force measuring method according to the present invention will be described.
The contact force measuring device and the contact force measuring method according to the present embodiment perform spline interpolation on the position data of the marker 7 acquired in the contact force measuring device and the contact force measuring method according to the first and second embodiments, and By estimating the position of the marker 7, the time resolution is further improved. And, by improving the time resolution, the frequency range where the contact force can be measured can be further increased.
　ここで、スプライン補間について説明する。
　図７は、スプライン補間の様子を示した図である。なお、図７においては、横軸を時間とし、縦軸をパンタグラフ変位として表している。
　図７に示すように、スプライン補間は、データ点ｈ１～ｈ７が得られた場合、全ての点を通るようなスプライン曲線を計算することで、データの補間を行なう方法である。 Here, the spline interpolation will be described.
FIG. 7 is a diagram showing a state of spline interpolation. In FIG. 7, the horizontal axis represents time and the vertical axis represents pantograph displacement.
As shown in FIG. 7, the spline interpolation is a method of interpolating data by calculating a spline curve that passes through all points when data points h1 to h7 are obtained.
　また、本実施例に係る接触力測定装置及び接触力測定方法は、第２の実施例に係る接触力測定装置及び接触力測定方法のようにＮ台のエリアカメラ２を設置しなくても、エリアカメラ２をＮ台設置したときと同等か、それ以上の時間分解能を得ることができるため、車両１の屋根上に設置するエリアカメラ２の台数を少なくすることができる。 Further, the contact force measuring device and the contact force measuring method according to the present embodiment do not have to install N area cameras 2 like the contact force measuring device and the contact force measuring method according to the second embodiment. Since the time resolution equal to or higher than that when N area cameras 2 are installed can be obtained, the number of area cameras 2 installed on the roof of the vehicle 1 can be reduced.
　図８は、第３の実施例に係るスプライン補間処理を追加した場合の接触力測定方法を示したフローチャートである。
　図８に示すように、第１の実施例と同様にステップＰ１０，１１の実行後、ステップＰ３０において、処理用ＰＣ８により、上述したようにステップＰ１０においてパタンマッチングにより求めたマーカー７の位置を位置データとし、求めたマーカー７の位置データをスプライン補間し、データ間のマーカー７の位置を推定する。ステップＰ３０の実行後は、第１の実施例と同様にステップＰ１２～Ｐ１４を実行する。 FIG. 8 is a flowchart showing a contact force measurement method when a spline interpolation process according to the third embodiment is added.
As shown in FIG. 8, after the execution of steps P10 and P11, as in the first embodiment, in step P30, the processing PC 8 determines the position of the marker 7 obtained by pattern matching in step P10 as described above. The obtained position data of the marker 7 is spline-interpolated as data, and the position of the marker 7 between the data is estimated. After execution of Step P30, Steps P12 to P14 are executed as in the first embodiment.
　なお、第２の実施例に係る接触力測定装置及び接触力測定方法にスプライン補間処理を追加した場合も、ステップＰ１２（図５，６参照）におけるバネ反力の計算の前にスプライン補間処理を追加することとなる。 Even when spline interpolation processing is added to the contact force measurement device and the contact force measurement method according to the second embodiment, the spline interpolation processing is performed before the calculation of the spring reaction force in step P12 (see FIGS. 5 and 6). It will be added.
　以上のように、本実施形態に係る接触力測定装置及び接触力測定方法は、スプライン補間を行なうことにより、第１，２の実施例に係る接触力測定装置及び接触力測定方法よりもエリアカメラ２の設置台数を少なくすることができる。そして、エリアカメラ２の台数が少なくなっても、スプライン補間を行なうことで、第１，２の実施例に係る接触力測定装置及び接触力測定方法と同等か、それ以上の時間分解能を得ることができる。そして、時間分解能が向上することにより、第１の実施例に係る接触力測定装置及び接触力測定方法よりも接触力の測定可能周波数域を高くすることができる。 As described above, the contact force measuring device and the contact force measuring method according to the present embodiment perform an area camera more than the contact force measuring device and the contact force measuring method according to the first and second embodiments by performing spline interpolation. 2 can be reduced in number. And even if the number of area cameras 2 is reduced, by performing spline interpolation, a time resolution equivalent to or higher than the contact force measuring device and the contact force measuring method according to the first and second embodiments can be obtained. Can do. And by improving the time resolution, it is possible to make the frequency range in which the contact force can be measured higher than in the contact force measuring device and the contact force measuring method according to the first embodiment.
　以下、本発明に係る接触力測定装置及び接触力測定方法の第４の実施例について説明する。
　本実施例に係る接触力測定装置及び接触力測定方法は、エリアカメラ２で撮影した画像に対して、超解像度技術を用いて空間分解能を向上させる点が、第１の実施例に係る接触力測定装置及び接触力測定方法と異なる。なお、本実施例に係る接触力測定装置の構成は第１の実施例と同様である。 Hereinafter, a fourth embodiment of the contact force measuring device and the contact force measuring method according to the present invention will be described.
The contact force measuring device and the contact force measuring method according to the present embodiment are that the contact resolution according to the first embodiment is improved with respect to the image taken by the area camera 2 using the super-resolution technique. Different from measuring device and contact force measuring method. The configuration of the contact force measuring apparatus according to this embodiment is the same as that of the first embodiment.
　ここで、超解像度技術について説明する。
　超解像度技術とは、複数枚の低解像度画像を使って、１枚の高解像度画像を生成する技術のことをいう（上記特許文献４参照）。そして、空間分解能を向上させることにより、バネ６の伸縮量や加速度を精度良く求めることができ、結果として接触力の精度を向上させることができる。 Here, the super-resolution technique will be described.
The super-resolution technique refers to a technique for generating one high-resolution image using a plurality of low-resolution images (see Patent Document 4). And by improving the spatial resolution, the amount of expansion and contraction and acceleration of the spring 6 can be obtained with high accuracy, and as a result, the accuracy of the contact force can be improved.
　図９は、第４の実施例に係る超解像度技術により空間分解能を向上する方法を用いた接触力測定方法を示したフローチャートである。
　図９に示すように、第１の実施例と同様にステップＰ１０の実行後、ステップＰ４０において、処理用ＰＣ８により、上述したように複数枚の低解像度画像を使って超解像度処理を行なうことにより、１枚の高解像度画像を生成する。ステップＰ４０の実行後は、第１の実施例と同様にステップＰ１１～Ｐ１４を実行する。 FIG. 9 is a flowchart showing a contact force measurement method using a method for improving the spatial resolution by the super-resolution technique according to the fourth embodiment.
As shown in FIG. 9, after execution of step P10 as in the first embodiment, in step P40, the processing PC 8 performs super-resolution processing using a plurality of low-resolution images as described above. One high-resolution image is generated. After execution of step P40, steps P11 to P14 are executed as in the first embodiment.
　このように、超解像度処理を追加することで、画像の空間分解能を向上させることができる。そして、空間分解能を向上させることにより、パンタグラフ４の高さを精度良く計算することができる。したがって、バネ６の伸縮量やパンタグラフ４の加速度を正確に求めることができるので、接触力の測定精度を向上させることができる。 Thus, the spatial resolution of the image can be improved by adding the super-resolution processing. Then, by improving the spatial resolution, the height of the pantograph 4 can be calculated with high accuracy. Therefore, since the expansion / contraction amount of the spring 6 and the acceleration of the pantograph 4 can be accurately obtained, the measurement accuracy of the contact force can be improved.
　なお、第２の実施例に係る接触力測定装置及び接触力測定方法に超解像度処理を追加した場合も、ステップＰ１１（図５，６参照）におけるパタンマッチングの前に超解像度処理を追加することとなる。 Even when the super-resolution processing is added to the contact force measuring apparatus and the contact force measuring method according to the second embodiment, the super-resolution processing is added before the pattern matching in step P11 (see FIGS. 5 and 6). It becomes.
　以上のように、本実施形態に係る接触力測定装置及び接触力測定方法は、撮影した画像に超解像度処理を施して高解像度化することにより、空間分解能を向上させ、接触力の測定精度を向上させることができる。 As described above, the contact force measurement device and the contact force measurement method according to the present embodiment improve the spatial resolution and improve the contact force measurement accuracy by performing super-resolution processing on the captured image to increase the resolution. Can be improved.
　本発明は、例えば、画像処理を用いて架線とパンタグラフ間の接触力を測定する接触力測定装置及び接触力測定方法、特に、パンタグラフの舟体を支持するバネが複数個ある場合に、エリアカメラで撮影した画像を処理して接触力を精度良く求める接触力測定装置及び接触力測定方法に利用することが可能である。 The present invention relates to a contact force measuring device and a contact force measuring method for measuring a contact force between an overhead line and a pantograph, for example, using image processing, and more particularly to an area camera when there are a plurality of springs that support a pantograph hull. It can be used for a contact force measuring device and a contact force measuring method for obtaining an accurate contact force by processing an image photographed in (1).
１　車両
２　エリアカメラ
３　照明
４　パンラグラフ
５　すり板
５ａ　多分割すり板
６　バネ
７　マーカー
８　処理用ＰＣ
９　画像 DESCRIPTION OF SYMBOLS 1 Vehicle 2 Area camera 3 Illumination 4 Panrograph 5 Slip plate 5a Multi-partition slide plate 6 Spring 7 Marker 8 Processing PC
9 images

Claims (8)

  1. 　パンタグラフのバネの画像を撮影範囲を部分的に指定して時間分解能を向上させて撮影する撮影手段と、
    　前記画像中の前記バネを画像処理により検出する画像処理手段と、
    　前記画像処理手段により検出した前記バネの上下部分の位置から相対変位を計算し、相対変位の時間変化分を求めることにより前記バネの伸縮量を計算した上で、前記バネの伸縮量にバネ定数を乗ずることにより前記バネのバネ反力を求めるバネ反力計算手段と、
    　前記画像処理手段により検出した前記バネの上部の変位を２階微分することにより加速度を計算した上で、加速度に前記パンタグラフの等価質量を乗ずることにより慣性力を求める慣性力計算手段と、
    　前記バネ反力と前記慣性力とを加算することにより接触力を求める接触力計算手段と
    を備える
    ことを特徴とする接触力測定装置。     An imaging means for capturing an image of a pantograph spring by partially specifying an imaging range and improving time resolution;
    Image processing means for detecting the spring in the image by image processing;
    The relative displacement is calculated from the positions of the upper and lower portions of the spring detected by the image processing means, and the amount of expansion / contraction of the spring is calculated by obtaining the time change of the relative displacement, and then the spring constant is added to the amount of expansion / contraction of the spring. A spring reaction force calculating means for obtaining a spring reaction force of the spring by multiplying by
    An inertial force calculating means for calculating an inertial force by multiplying an acceleration by an equivalent mass of the pantograph after calculating an acceleration by second-order differentiation of the displacement of the upper part of the spring detected by the image processing means;
    A contact force measuring device comprising: a contact force calculating means for obtaining a contact force by adding the spring reaction force and the inertial force.
  2. 　パンタグラフのバネの画像を撮影する複数の撮影手段と、
    　複数の前記撮影手段によりシャッタータイミングをずらして撮影された画像を時間軸上に順番に並べ替える並べ替え手段と、
    　前記画像中の前記バネを画像処理により検出する画像処理手段と、
    　前記画像処理手段により検出した前記バネの上下部分の位置から相対変位を計算し、相対変位の時間変化分を求めることにより前記バネの伸縮量を計算した上で、前記バネの伸縮量にバネ定数を乗ずることにより前記バネのバネ反力を求めるバネ反力計算手段と、
    　前記画像処理手段により検出した前記バネの上部の変位を２階微分することにより加速度を計算した上で、加速度に前記パンタグラフの等価質量を乗ずることにより慣性力を求める慣性力計算手段と、
    　前記バネ反力と前記慣性力とを加算することにより接触力を求める接触力計算手段と
    を備える
    ことを特徴とする接触力測定装置。     A plurality of photographing means for photographing an image of a pantograph spring;
    Rearrangement means for rearranging images taken by shifting the shutter timing by the plurality of photographing means in order on the time axis;
    Image processing means for detecting the spring in the image by image processing;
    The relative displacement is calculated from the positions of the upper and lower portions of the spring detected by the image processing means, and the amount of expansion and contraction of the spring is calculated by calculating the amount of change in the relative displacement over time. A spring reaction force calculating means for obtaining a spring reaction force of the spring by multiplying by
    An inertial force calculating means for calculating an inertial force by calculating an acceleration by second-order differentiation of the displacement of the upper part of the spring detected by the image processing means, and multiplying the acceleration by an equivalent mass of the pantograph;
    A contact force measuring device comprising: a contact force calculating means for obtaining a contact force by adding the spring reaction force and the inertial force.
  3. 　前記画像処理手段により求めた前記バネの上下部分の位置を位置データとし、求めた前記バネの位置データにスプライン補間を施すスプライン補間手段を備える
    ことを特徴とする請求項１又は請求項２に記載の接触力測定装置。     3. The apparatus according to claim 1, further comprising: a spline interpolation unit that uses the position of the upper and lower portions of the spring obtained by the image processing unit as position data, and performs spline interpolation on the obtained position data of the spring. Contact force measuring device.
  4. 　複数枚の低解像度画像を使って超解像度処理を行なうことにより、１枚の高解像度画像を生成する超解像度処理手段を備える
    ことを特徴とする請求項１又は請求項２に記載の接触力測定装置。     The contact force measurement according to claim 1 or 2, further comprising super-resolution processing means for generating a single high-resolution image by performing super-resolution processing using a plurality of low-resolution images. apparatus.
  5. 　パンタグラフのバネの画像を撮影範囲を部分的に指定して時間分解能を向上させて撮影する撮影処理と、
    　前記画像中の前記バネを画像処理により検出する画像処理と、
    　前記画像処理手段により検出した前記バネの上下部分の位置から相対変位を計算し、相対変位の時間変化分を求めることにより前記バネの伸縮量を計算した上で、前記バネの伸縮量にバネ定数を乗ずることにより前記バネのバネ反力を求めるバネ反力計算処理と、
    　前記画像処理手段により検出した前記バネの上部の変位を２階微分することにより加速度を計算した上で、加速度に前記パンタグラフの等価質量を乗ずることにより慣性力を求める慣性力計算処理と、
    　前記バネ反力と前記慣性力とを加算することにより接触力を求める接触力計算処理
    を行う
    ことを特徴とする接触力測定方法。     A shooting process that captures images of pantograph springs by partially specifying the shooting range and improving the time resolution;
    Image processing for detecting the spring in the image by image processing;
    The relative displacement is calculated from the positions of the upper and lower portions of the spring detected by the image processing means, and the amount of expansion and contraction of the spring is calculated by calculating the amount of change in the relative displacement over time. A spring reaction force calculation process for obtaining the spring reaction force of the spring by multiplying by
    An inertial force calculation process for obtaining an inertial force by multiplying the acceleration by the equivalent mass of the pantograph after calculating the acceleration by second-order differentiation of the displacement of the upper part of the spring detected by the image processing means;
    A contact force measuring method for performing a contact force calculation process for obtaining a contact force by adding the spring reaction force and the inertial force.
  6. 　パンタグラフのバネの画像を撮影する複数の撮影処理と、
    　複数の前記撮影手段によりシャッタータイミングをずらして撮影された画像を時間軸上に順番に並べ替える並べ替え処理と、
    　前記画像中の前記バネを画像処理により検出する画像処理と、
    　前記画像処理手段により検出した前記バネの上下部分の位置から相対変位を計算し、相対変位の時間変化分を求めることにより前記バネの伸縮量を計算した上で、前記バネの伸縮量にバネ定数を乗ずることにより前記バネのバネ反力を求めるバネ反力計算処理と、
    　前記画像処理手段により検出した前記バネの上部の変位を２階微分することにより加速度を計算した上で、加速度に前記パンタグラフの等価質量を乗ずることにより慣性力を求める慣性力計算処理と、
    　前記バネ反力と前記慣性力とを加算することにより接触力を求める接触力計算処理
    を行う
    ことを特徴とする接触力測定方法。     Multiple shooting processes for shooting images of pantograph springs,
    A rearrangement process for rearranging images taken by shifting the shutter timing by the plurality of photographing means in order on the time axis;
    Image processing for detecting the spring in the image by image processing;
    The relative displacement is calculated from the positions of the upper and lower portions of the spring detected by the image processing means, and the amount of expansion and contraction of the spring is calculated by calculating the amount of change in the relative displacement over time. A spring reaction force calculation process for obtaining the spring reaction force of the spring by multiplying by
    An inertial force calculation process for obtaining an inertial force by multiplying the acceleration by the equivalent mass of the pantograph after calculating the acceleration by second-order differentiation of the displacement of the upper part of the spring detected by the image processing means;
    A contact force measuring method for performing a contact force calculation process for obtaining a contact force by adding the spring reaction force and the inertial force.
  7. 　前記画像処理と前記バネ反力計算処理との間において、前記前記画像処理手段により求めた前記バネの上下部分の位置を位置データとし、求めた前記バネの位置データにスプライン補間を施すスプライン補間処理を行う
    ことを特徴とする請求項５又は請求項６に記載の接触力測定方法。     Between the image processing and the spring reaction force calculation processing, the position of the upper and lower portions of the spring obtained by the image processing means is used as position data, and spline interpolation processing is performed for performing spline interpolation on the obtained spring position data. The contact force measuring method according to claim 5, wherein the contact force is measured.
  8. 　前記撮影処理と前記画像処理との間において、複数枚の低解像度画像を使って超解像度処理を行なうことにより、１枚の高解像度画像を生成する超解像度処理を行う
    ことを特徴とする請求項５又は請求項６に記載の接触力測定方法。     The super-resolution processing for generating one high-resolution image is performed by performing super-resolution processing using a plurality of low-resolution images between the imaging processing and the image processing. The contact force measuring method according to claim 5 or 6.
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103057423A (en) * 2013-01-28 2013-04-24 辽宁工程技术大学 Pantograph head structure capable of reducing offline rate of pantograph-contact line of electric locomotive
CN110329078A (en) * 2019-07-03 2019-10-15 西南交通大学 A kind of pantograph collector head structure reducing bullet train bow net ratio of contact loss
JP2020144049A (en) * 2019-03-07 2020-09-10 株式会社明電舎 Pantograph displacement measuring device and trolley wire hard spot detection method
CN115314401A (en) * 2022-06-30 2022-11-08 中铁第四勘察设计院集团有限公司 Contact network state monitoring method and device, electronic equipment and storage medium

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5520248B2 (en) * 2011-03-09 2014-06-11 公益財団法人鉄道総合技術研究所 Object displacement estimation method and pantograph contact force estimation method and apparatus
KR101285839B1 (en) 2011-12-15 2013-07-12 한국철도기술연구원 A measuring system of force sensor for current collection equipment in a electric train
JP5900018B2 (en) * 2012-02-29 2016-04-06 株式会社明電舎 Pantograph measuring method and pantograph measuring device
CN103528729B (en) * 2013-10-18 2015-05-20 中国航空工业集团公司北京长城计量测试技术研究所 Optical fiber type on-line real-time pantograph lifting pressure detection system
US11097619B2 (en) 2016-08-02 2021-08-24 Central Japan Railway Company Current collector monitoring system
TWI737624B (en) * 2016-08-02 2021-09-01 日商東海旅客鐵道股份有限公司 Collector monitoring system
JP6781822B2 (en) * 2017-03-28 2020-11-04 株式会社日立国際電気 Monitoring system
CN107560770B (en) * 2017-08-28 2019-06-25 南京拓控信息科技股份有限公司 A kind of detection device of pantograph to contact net stress
AT520791B1 (en) * 2017-12-21 2020-08-15 Plasser & Theurer Export Von Bahnbaumaschinen Gmbh Method for operating a tamping unit of a track construction machine as well as tamping device for track bed compaction and track construction machine
CN110239352A (en) * 2018-03-07 2019-09-17 郑州宇通客车股份有限公司 Vehicle and pantograph device, charging bow, pantograph, pole plate
CN108535146B (en) * 2018-03-19 2021-03-23 河海大学 Method for testing normal contact force of spherical particle system under impact
CN108896150A (en) * 2018-04-20 2018-11-27 中南大学 A kind of lorries unbalance loading monitoring system and application method based on machine vision
CN110456598A (en) * 2018-05-08 2019-11-15 深圳光峰科技股份有限公司 Shell, projector and method against pressure against pressure
JP7302169B2 (en) * 2018-12-26 2023-07-04 富士電機株式会社 Pantograph measuring system
KR102277952B1 (en) * 2019-01-11 2021-07-19 브레인소프트주식회사 Frequency estimation method using dj transform
RU2713575C1 (en) * 2019-05-07 2020-02-05 Федеральное государственное бюджетное образовательное учреждение высшего образования Иркутский государственный университет путей сообщения (ФГБОУ ВО ИрГУПС) Method of monitoring condition of sliding contact connection of pantograph with contact wire during movement of electric rolling stock of railways
CN111426346A (en) * 2020-04-09 2020-07-17 深圳了然视觉科技有限公司 Vision-based sensor and sensing method
CN114414116B (en) * 2021-12-31 2023-08-01 成都唐源电气股份有限公司 Bow net contact force analysis method based on triaxial acceleration

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11328419A (en) * 1998-05-15 1999-11-30 Nikon Corp Method for interpolating data and device therefor and projection optical device and measuring instrument
JP2001235310A (en) * 2000-02-23 2001-08-31 Railway Technical Res Inst Measuring apparatus for pantograph displacement, contact force and trolley wire deviation
JP2002279409A (en) * 2001-03-22 2002-09-27 Meidensha Corp Pantograph measuring method by image processing and measuring device by method
JP2006246307A (en) * 2005-03-07 2006-09-14 Seiko Epson Corp Image data processing apparatus
JP2007286943A (en) * 2006-04-18 2007-11-01 Fujifilm Corp Signal light detection apparatus
JP2008104312A (en) * 2006-10-20 2008-05-01 Meidensha Corp Pantograph measurement device by image processing
JP2008109375A (en) * 2006-10-25 2008-05-08 Tokyo Institute Of Technology High resolution image generation method
JP2008185457A (en) * 2007-01-30 2008-08-14 Railway Technical Res Inst Contact force measuring method and device of pantograph
JP2008252461A (en) * 2007-03-30 2008-10-16 Olympus Corp Imaging apparatus
JP2008298532A (en) * 2007-05-30 2008-12-11 Konica Minolta Holdings Inc Obstruction measurement method, device, and system

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1368200A1 (en) * 1986-05-15 1988-01-23 Локомотивное Депо Лобня Московско-Рижского Отделения Московской Железной Дороги Device for determining static pressure of current collector
AT391207B (en) * 1988-09-09 1990-09-10 Siemens Ag Oesterreich DEVICE FOR MEASURING CONTACT PRESSURE ON CURRENT COLLECTORS WITH A PRESSURE SENSOR
FR2646381B1 (en) * 1989-04-28 1991-07-26 Faiveley Sa DEVICE FOR ADJUSTING THE SUPPORT FORCE OF A PANTOGRAPH ON A CATENARY WIRE AND RELATED METHOD
DE19725906C1 (en) * 1997-06-13 1999-02-18 Abb Daimler Benz Transp Device for measuring the contact pressure on a pantograph
RU57684U1 (en) * 2006-02-20 2006-10-27 Михаил Владленович Бибанов DEVICE FOR MEASURING EFFORT FOR Squeezing the shoe of the current collector

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11328419A (en) * 1998-05-15 1999-11-30 Nikon Corp Method for interpolating data and device therefor and projection optical device and measuring instrument
JP2001235310A (en) * 2000-02-23 2001-08-31 Railway Technical Res Inst Measuring apparatus for pantograph displacement, contact force and trolley wire deviation
JP2002279409A (en) * 2001-03-22 2002-09-27 Meidensha Corp Pantograph measuring method by image processing and measuring device by method
JP2006246307A (en) * 2005-03-07 2006-09-14 Seiko Epson Corp Image data processing apparatus
JP2007286943A (en) * 2006-04-18 2007-11-01 Fujifilm Corp Signal light detection apparatus
JP2008104312A (en) * 2006-10-20 2008-05-01 Meidensha Corp Pantograph measurement device by image processing
JP2008109375A (en) * 2006-10-25 2008-05-08 Tokyo Institute Of Technology High resolution image generation method
JP2008185457A (en) * 2007-01-30 2008-08-14 Railway Technical Res Inst Contact force measuring method and device of pantograph
JP2008252461A (en) * 2007-03-30 2008-10-16 Olympus Corp Imaging apparatus
JP2008298532A (en) * 2007-05-30 2008-12-11 Konica Minolta Holdings Inc Obstruction measurement method, device, and system

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103057423A (en) * 2013-01-28 2013-04-24 辽宁工程技术大学 Pantograph head structure capable of reducing offline rate of pantograph-contact line of electric locomotive
JP2020144049A (en) * 2019-03-07 2020-09-10 株式会社明電舎 Pantograph displacement measuring device and trolley wire hard spot detection method
WO2020179194A1 (en) * 2019-03-07 2020-09-10 株式会社明電舎 Pantograph displacement measuring device, and trolley-wire hard-spot detection method
CN110329078A (en) * 2019-07-03 2019-10-15 西南交通大学 A kind of pantograph collector head structure reducing bullet train bow net ratio of contact loss
CN115314401A (en) * 2022-06-30 2022-11-08 中铁第四勘察设计院集团有限公司 Contact network state monitoring method and device, electronic equipment and storage medium
CN115314401B (en) * 2022-06-30 2024-03-15 中铁第四勘察设计院集团有限公司 Contact net state monitoring method and device, electronic equipment and storage medium

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