WO2010044586A2 - 나노결정 양자점을 이용한 자외선 검출기 - Google Patents

나노결정 양자점을 이용한 자외선 검출기 Download PDF

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Publication number
WO2010044586A2
WO2010044586A2 PCT/KR2009/005866 KR2009005866W WO2010044586A2 WO 2010044586 A2 WO2010044586 A2 WO 2010044586A2 KR 2009005866 W KR2009005866 W KR 2009005866W WO 2010044586 A2 WO2010044586 A2 WO 2010044586A2
Authority
WO
WIPO (PCT)
Prior art keywords
ultraviolet ray
ray detector
quantum dots
color
nanocrystal quantum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/KR2009/005866
Other languages
English (en)
French (fr)
Other versions
WO2010044586A3 (ko
Inventor
한창수
정소희
이지혜
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Korea Institute of Machinery and Materials KIMM
Original Assignee
Korea Institute of Machinery and Materials KIMM
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Korea Institute of Machinery and Materials KIMM filed Critical Korea Institute of Machinery and Materials KIMM
Priority to US13/124,118 priority Critical patent/US8492729B2/en
Publication of WO2010044586A2 publication Critical patent/WO2010044586A2/ko
Publication of WO2010044586A3 publication Critical patent/WO2010044586A3/ko
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/429—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to measurement of ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/48—Photometry, e.g. photographic exposure meter using chemical effects
    • G01J1/50—Photometry, e.g. photographic exposure meter using chemical effects using change in colour of an indicator, e.g. actinometer
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4266—Photometry, e.g. photographic exposure meter using electric radiation detectors for measuring solar light

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

본 발명에 따른 자외선 검출기는 자외선을 용이하게 검출할 수 있도록 나노 결정 양자점을 포함하며 자외선의 조사로 색상이 변화하는 색변환부와, 상기 색변 환부와 인접하게 배치되며 색상을 갖고 자외선의 조사에 의하여 색상이 변화하지 않는 색불변부를 포함한다.
PCT/KR2009/005866 2008-10-13 2009-10-13 나노결정 양자점을 이용한 자외선 검출기 Ceased WO2010044586A2 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US13/124,118 US8492729B2 (en) 2008-10-13 2009-10-13 Ultraviolet ray detection apparatus using nanocrystal quantum dot

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2008-0100227 2008-10-13
KR1020080100227A KR100988645B1 (ko) 2008-10-13 2008-10-13 나노결정 양자점을 이용한 자외선 검출기

Publications (2)

Publication Number Publication Date
WO2010044586A2 true WO2010044586A2 (ko) 2010-04-22
WO2010044586A3 WO2010044586A3 (ko) 2010-07-22

Family

ID=42107037

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2009/005866 Ceased WO2010044586A2 (ko) 2008-10-13 2009-10-13 나노결정 양자점을 이용한 자외선 검출기

Country Status (3)

Country Link
US (1) US8492729B2 (ko)
KR (1) KR100988645B1 (ko)
WO (1) WO2010044586A2 (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101892694B1 (ko) * 2015-02-13 2018-08-28 한국기계연구원 자외선 검출기
KR101963965B1 (ko) * 2017-08-31 2019-03-29 고려대학교 산학협력단 이색성 물질을 이용한 자외선 검출기
KR102564214B1 (ko) 2020-12-22 2023-08-04 동아대학교 산학협력단 자외선 검출기 및 이의 제조방법
CN119002101B (zh) * 2024-10-23 2024-12-31 松山湖材料实验室 基于量子点光刻胶的超表面动态显示器件及制备方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0131427B1 (ko) * 1994-06-30 1998-04-11 성재갑 사용자에게 자외선의 세기를 알려주는 화장품 용기
US6576155B1 (en) 1998-11-10 2003-06-10 Biocrystal, Ltd. Fluorescent ink compositions comprising functionalized fluorescent nanocrystals
DE19951207A1 (de) * 1999-10-15 2001-04-19 Twlux Halbleitertechnologien B Halbleiterbauelement
US6551493B2 (en) * 2000-04-04 2003-04-22 Matsushita Electric Industrial Co., Ltd. Ultraviolet light measuring chip and ultraviolet light sensor using the same
US20030013109A1 (en) * 2001-06-21 2003-01-16 Ballinger Clinton T. Hairpin sensors using quenchable fluorescing agents
WO2004074739A1 (ja) * 2003-02-21 2004-09-02 Sanyo Electric Co., Ltd. 発光素子及びディスプレイ
KR100601949B1 (ko) * 2004-04-07 2006-07-14 삼성전자주식회사 나노와이어 발광소자
KR100657942B1 (ko) * 2005-01-05 2006-12-14 삼성전자주식회사 광전 소자 봉지재 및 이를 채용한 태양 전지 모듈
KR200389543Y1 (ko) 2005-04-08 2005-07-14 주식회사 로코 자외선 세기 인식표
KR100744351B1 (ko) * 2006-03-24 2007-07-30 삼성전자주식회사 자외선 발광 잉크 및 이를 이용한 보안장치

Also Published As

Publication number Publication date
US20110261346A1 (en) 2011-10-27
KR100988645B1 (ko) 2010-10-18
US8492729B2 (en) 2013-07-23
WO2010044586A3 (ko) 2010-07-22
KR20100041178A (ko) 2010-04-22

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