WO2009069191A1 - Method and device for measuring particle - Google Patents

Method and device for measuring particle Download PDF

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Publication number
WO2009069191A1
WO2009069191A1 PCT/JP2007/072790 JP2007072790W WO2009069191A1 WO 2009069191 A1 WO2009069191 A1 WO 2009069191A1 JP 2007072790 W JP2007072790 W JP 2007072790W WO 2009069191 A1 WO2009069191 A1 WO 2009069191A1
Authority
WO
WIPO (PCT)
Prior art keywords
diffraction grating
ultrasonic wave
diffraction
generated
particle group
Prior art date
Application number
PCT/JP2007/072790
Other languages
French (fr)
Japanese (ja)
Inventor
Yosuke Hoshino
Kenji Takubo
Yukihisa Wada
Naoji Moriya
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Priority to PCT/JP2007/072790 priority Critical patent/WO2009069191A1/en
Publication of WO2009069191A1 publication Critical patent/WO2009069191A1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
    • G01N15/0211—Investigating a scatter or diffraction pattern

Abstract

Under a state where a sample having a group of particles to be measured dispersed movably into a medium is stored in a sample cell, the cell is irradiated with ultrasonic wave to generate a diffraction grating by density distribution of the particle group and diffraction light generated by irradiating the diffraction grating with a parallel light beam is detected. After a diffraction grating is generated by irradiating ultrasonic wave, the particle group is diffused by stopping irradiation of ultrasonic wave to extinguish the diffraction grating, and then the particle diameter is obtained by obtaining a diffusion coefficient from diffraction light intensity change with time in the extinction process of the diffraction grating. Since the diffraction grating is generated by the density distribution of particle group using ultrasonic wave, even such particles as dielectrophoretic power does not act can be measured without being affected by the diffraction light due to an electrode pair when the dielectrophoretic power is utilized.
PCT/JP2007/072790 2007-11-26 2007-11-26 Method and device for measuring particle WO2009069191A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/072790 WO2009069191A1 (en) 2007-11-26 2007-11-26 Method and device for measuring particle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/072790 WO2009069191A1 (en) 2007-11-26 2007-11-26 Method and device for measuring particle

Publications (1)

Publication Number Publication Date
WO2009069191A1 true WO2009069191A1 (en) 2009-06-04

Family

ID=40678109

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/072790 WO2009069191A1 (en) 2007-11-26 2007-11-26 Method and device for measuring particle

Country Status (1)

Country Link
WO (1) WO2009069191A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0747259A (en) * 1992-12-02 1995-02-21 Hitachi Ltd Apparatus for treating fine particle in fluid with ultrasonic waves
JPH11352048A (en) * 1998-06-04 1999-12-24 Toray Eng Co Ltd Device for measuring fine particles in liquid
WO2007010639A1 (en) * 2005-07-20 2007-01-25 Shimadzu Corporation Optical measuring instrument

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0747259A (en) * 1992-12-02 1995-02-21 Hitachi Ltd Apparatus for treating fine particle in fluid with ultrasonic waves
JPH11352048A (en) * 1998-06-04 1999-12-24 Toray Eng Co Ltd Device for measuring fine particles in liquid
WO2007010639A1 (en) * 2005-07-20 2007-01-25 Shimadzu Corporation Optical measuring instrument

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