WO2009051180A1 - Offset adjusting circuit for bridge circuit output voltage - Google Patents

Offset adjusting circuit for bridge circuit output voltage Download PDF

Info

Publication number
WO2009051180A1
WO2009051180A1 PCT/JP2008/068753 JP2008068753W WO2009051180A1 WO 2009051180 A1 WO2009051180 A1 WO 2009051180A1 JP 2008068753 W JP2008068753 W JP 2008068753W WO 2009051180 A1 WO2009051180 A1 WO 2009051180A1
Authority
WO
WIPO (PCT)
Prior art keywords
resistance elements
individual
series
offset
output voltage
Prior art date
Application number
PCT/JP2008/068753
Other languages
French (fr)
Japanese (ja)
Inventor
Masahiko Ishizone
Eiji Umetsu
Kazuaki Ikarashi
Original Assignee
Alps Electric Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alps Electric Co., Ltd. filed Critical Alps Electric Co., Ltd.
Publication of WO2009051180A1 publication Critical patent/WO2009051180A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268—Arrangements for correcting or for compensating unwanted effects
    • G01L1/2281—Arrangements for correcting or for compensating unwanted effects for temperature variations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/10—AC or DC measuring bridges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/44—Modifications of instruments for temperature compensation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Force In General (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Measuring Fluid Pressure (AREA)

Abstract

Provided is an offset adjusting circuit for a bridge circuit output voltage, which can adjust and set easily the temperature coefficient (TCR) of an offset correcting resistance element. In this bridge circuit output voltage offset adjusting circuit, two sets of series resistance elements having sensitive resistance elements connected in series are connected in parallel between a supply input terminal and a ground terminal, so that the voltages at the medians of the individual series resistance elements are extracted as median voltages. Temperature characteristic adjusting resistance elements for performing the offset so that the medians of the middle point voltage differences may be those of the output ranges of a differential amplifier are arranged in series with the individual series resistance elements at diagonal positions across the individual medians of the individual series resistance elements. The individual temperature characteristic adjusting resistance elements have their temperature coefficients set smaller than those of the series resistance elements. The temperature characteristic adjusting resistance elements are made of a laminated structure of a thin film layer of Ni, Fe and Cr and a thin film layer of Ta or TaN.
PCT/JP2008/068753 2007-10-18 2008-10-16 Offset adjusting circuit for bridge circuit output voltage WO2009051180A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007271745A JP2011002231A (en) 2007-10-18 2007-10-18 Offset adjusting circuit for bridge circuit output voltage
JP2007-271745 2007-10-18

Publications (1)

Publication Number Publication Date
WO2009051180A1 true WO2009051180A1 (en) 2009-04-23

Family

ID=40567442

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/068753 WO2009051180A1 (en) 2007-10-18 2008-10-16 Offset adjusting circuit for bridge circuit output voltage

Country Status (2)

Country Link
JP (1) JP2011002231A (en)
WO (1) WO2009051180A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107702837A (en) * 2016-08-08 2018-02-16 霍尼韦尔国际公司 Pressure sensor offset temperature coefficient adjusts
CN112326751A (en) * 2020-11-09 2021-02-05 中国南方电网有限责任公司超高压输电公司柳州局 Nitrogen oxide sensor, preparation method thereof and nitrogen oxide detection device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107907728B (en) * 2017-10-11 2020-04-24 深圳供电局有限公司 Linear photoelectric isolation circuit for inhibiting temperature drift

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0285702A (en) * 1988-09-22 1990-03-27 Kyowa Electron Instr Co Ltd Free filament strain gage and production thereof
JPH0739975B2 (en) * 1990-02-28 1995-05-01 工業技術院長 Distributed tactile sensor
JPH10274572A (en) * 1997-03-31 1998-10-13 Ishida Co Ltd Weighing device
JP2000310504A (en) * 1999-02-26 2000-11-07 Tokai Rika Co Ltd Detection circuit of rotation detecting sensor
JP2001110602A (en) * 1999-10-12 2001-04-20 Toshiba Tec Corp Thin-film resistor forming method and sensor

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0285702A (en) * 1988-09-22 1990-03-27 Kyowa Electron Instr Co Ltd Free filament strain gage and production thereof
JPH0739975B2 (en) * 1990-02-28 1995-05-01 工業技術院長 Distributed tactile sensor
JPH10274572A (en) * 1997-03-31 1998-10-13 Ishida Co Ltd Weighing device
JP2000310504A (en) * 1999-02-26 2000-11-07 Tokai Rika Co Ltd Detection circuit of rotation detecting sensor
JP2001110602A (en) * 1999-10-12 2001-04-20 Toshiba Tec Corp Thin-film resistor forming method and sensor

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107702837A (en) * 2016-08-08 2018-02-16 霍尼韦尔国际公司 Pressure sensor offset temperature coefficient adjusts
CN107702837B (en) * 2016-08-08 2022-01-04 霍尼韦尔国际公司 Offset temperature coefficient adjustment for pressure sensor
CN112326751A (en) * 2020-11-09 2021-02-05 中国南方电网有限责任公司超高压输电公司柳州局 Nitrogen oxide sensor, preparation method thereof and nitrogen oxide detection device

Also Published As

Publication number Publication date
JP2011002231A (en) 2011-01-06

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