WO2009016806A1 - Multiphoton laser scanning microscope device - Google Patents

Multiphoton laser scanning microscope device Download PDF

Info

Publication number
WO2009016806A1
WO2009016806A1 PCT/JP2008/001957 JP2008001957W WO2009016806A1 WO 2009016806 A1 WO2009016806 A1 WO 2009016806A1 JP 2008001957 W JP2008001957 W JP 2008001957W WO 2009016806 A1 WO2009016806 A1 WO 2009016806A1
Authority
WO
WIPO (PCT)
Prior art keywords
specimen
pulse laser
laser beam
microscope device
scanning microscope
Prior art date
Application number
PCT/JP2008/001957
Other languages
French (fr)
Japanese (ja)
Inventor
Hisashi Okugawa
Original Assignee
Nikon Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corporation filed Critical Nikon Corporation
Publication of WO2009016806A1 publication Critical patent/WO2009016806A1/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N2021/6417—Spectrofluorimetric devices
    • G01N2021/6419—Excitation at two or more wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy

Abstract

A multiphoton laser scanning microscope device in which multiple excitation wavelengths can be used or the excitation wavelength can be changed quickly even though the multiphoton laser scanning microscope device has only one femtosecond pulse laser light source. The multiphoton laser scanning microscope device comprises a femtosecond pulse laser light source (1), focusing means (12) for focusing the pulse laser beam emitted from the femtosecond pulse laser light source (1) onto a specimen, scanning means (11) for scanning the specimen with the pulse laser beam, detecting means (16) for detecting light generated from the specimen, optical path setting means (3, 6, 9, 10) for branching the optical path of the emitted pulse laser beam into two optical paths and merging them back into one optical path toward the specimen, and setting means (5, 8) for setting the pulse width of the pulse laser beam passed through one of the two optical paths and applied to the specimen in such a way that the set pulse width is different from the pulse width of the pulse laser beam passed through the other optical path and applied to the specimen.
PCT/JP2008/001957 2007-07-27 2008-07-22 Multiphoton laser scanning microscope device WO2009016806A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-196243 2007-07-27
JP2007196243 2007-07-27

Publications (1)

Publication Number Publication Date
WO2009016806A1 true WO2009016806A1 (en) 2009-02-05

Family

ID=40304050

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/001957 WO2009016806A1 (en) 2007-07-27 2008-07-22 Multiphoton laser scanning microscope device

Country Status (1)

Country Link
WO (1) WO2009016806A1 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015202365A (en) * 2014-04-16 2015-11-16 京都府公立大学法人 photoacoustic imaging apparatus and photoacoustic imaging method
CN106568754A (en) * 2016-11-06 2017-04-19 浙江大学 Optical system used for measuring liquid sample multiphoton fluorescence spectrum
WO2023010718A1 (en) * 2021-08-05 2023-02-09 中国科学院苏州生物医学工程技术研究所 Elliptical hemispherical curved surface large-field-of-view high-throughput two-photon microscope
EP3918303A4 (en) * 2019-01-31 2023-03-22 The Rockefeller University Hybrid multi-photon microscopy

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05503149A (en) * 1989-11-14 1993-05-27 コーネル・リサーチ・ファンデーション・インコーポレイテッド Two-photon laser scanning microscope
JPH05273129A (en) * 1992-03-24 1993-10-22 Nikon Corp Light echo microscope
JP2006171027A (en) * 2004-12-10 2006-06-29 Olympus Corp Illuminating device for microscope and fluorescence microscope system
JP2007155722A (en) * 2005-12-08 2007-06-21 Carl Zeiss Microimaging Gmbh Method and apparatus for examining sample

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05503149A (en) * 1989-11-14 1993-05-27 コーネル・リサーチ・ファンデーション・インコーポレイテッド Two-photon laser scanning microscope
JPH05273129A (en) * 1992-03-24 1993-10-22 Nikon Corp Light echo microscope
JP2006171027A (en) * 2004-12-10 2006-06-29 Olympus Corp Illuminating device for microscope and fluorescence microscope system
JP2007155722A (en) * 2005-12-08 2007-06-21 Carl Zeiss Microimaging Gmbh Method and apparatus for examining sample

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015202365A (en) * 2014-04-16 2015-11-16 京都府公立大学法人 photoacoustic imaging apparatus and photoacoustic imaging method
CN106568754A (en) * 2016-11-06 2017-04-19 浙江大学 Optical system used for measuring liquid sample multiphoton fluorescence spectrum
EP3918303A4 (en) * 2019-01-31 2023-03-22 The Rockefeller University Hybrid multi-photon microscopy
WO2023010718A1 (en) * 2021-08-05 2023-02-09 中国科学院苏州生物医学工程技术研究所 Elliptical hemispherical curved surface large-field-of-view high-throughput two-photon microscope

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