WO2008144762A3 - Organic electrodes and electronic devices - Google Patents
Organic electrodes and electronic devices Download PDFInfo
- Publication number
- WO2008144762A3 WO2008144762A3 PCT/US2008/064431 US2008064431W WO2008144762A3 WO 2008144762 A3 WO2008144762 A3 WO 2008144762A3 US 2008064431 W US2008064431 W US 2008064431W WO 2008144762 A3 WO2008144762 A3 WO 2008144762A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- gate
- gate material
- drain
- source
- electronic devices
- Prior art date
Links
- 239000000463 material Substances 0.000 abstract 9
- 239000012212 insulator Substances 0.000 abstract 4
- 239000002184 metal Substances 0.000 abstract 1
- 230000003071 parasitic effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/481—Insulated gate field-effect transistors [IGFETs] characterised by the gate conductors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/464—Lateral top-gate IGFETs comprising only a single gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/466—Lateral bottom-gate IGFETs comprising only a single gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/10—Organic polymers or oligomers
- H10K85/111—Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/10—Organic polymers or oligomers
- H10K85/111—Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
- H10K85/113—Heteroaromatic compounds comprising sulfur or selene, e.g. polythiophene
Landscapes
- Thin Film Transistor (AREA)
Abstract
A device comprising: a transistor comprising: at least one source; at least one drain; at least one channel; at least one gate insulator comprising (i) a first surface defining a first side, and (ii) a second surface defining a second side and opposing the first surface and first side, wherein the source and the drain are disposed on the gate insulator first side; at least one first gate material disposed on the gate insulator second side; wherein the first gate material does not substantially overlap with the source or the drain so as to minimize parasitic capacitance, the transistor further comprises a second gate material disposed away from the second side so that the first gate material is between the gate insulator and the second gate material. The second gate material can comprise a metal. The second gate material can have a higher conductivity than the first gate material. The second gate material can substantially overlap with the source or the drain. The transistor can be adapted for a bottom-gate configuration or a top-gate configuration. Applications included printed electronics.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US93935207P | 2007-05-21 | 2007-05-21 | |
US60/939,352 | 2007-05-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2008144762A2 WO2008144762A2 (en) | 2008-11-27 |
WO2008144762A3 true WO2008144762A3 (en) | 2009-03-19 |
Family
ID=39615642
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2008/064431 WO2008144762A2 (en) | 2007-05-21 | 2008-05-21 | Organic electrodes and electronic devices |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2008144762A2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2466495B (en) | 2008-12-23 | 2013-09-04 | Cambridge Display Tech Ltd | Method of fabricating a self-aligned top-gate organic transistor |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6429450B1 (en) * | 1997-08-22 | 2002-08-06 | Koninklijke Philips Electronics N.V. | Method of manufacturing a field-effect transistor substantially consisting of organic materials |
US20050051770A1 (en) * | 2003-09-04 | 2005-03-10 | Hitachi, Ltd. | Electrode substrate, thin film transistor, display device and their production |
JP2005158775A (en) * | 2003-11-20 | 2005-06-16 | Hiroyuki Okada | Manufacturing method of organic thin film field effect transistor |
US20050212014A1 (en) * | 2004-03-26 | 2005-09-29 | Masahiro Horibe | Semiconductor device and semiconductor sensor |
WO2006124055A2 (en) * | 2004-10-12 | 2006-11-23 | Nanosys, Inc. | Fully integrated organic layered processes for making plastic electronics based on conductive polymers and semiconductor nanowires |
EP1732150A1 (en) * | 2005-06-07 | 2006-12-13 | Xerox Corporation | Organic thin film transistors with multilayer electrodes |
-
2008
- 2008-05-21 WO PCT/US2008/064431 patent/WO2008144762A2/en active Application Filing
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6429450B1 (en) * | 1997-08-22 | 2002-08-06 | Koninklijke Philips Electronics N.V. | Method of manufacturing a field-effect transistor substantially consisting of organic materials |
US20050051770A1 (en) * | 2003-09-04 | 2005-03-10 | Hitachi, Ltd. | Electrode substrate, thin film transistor, display device and their production |
JP2005158775A (en) * | 2003-11-20 | 2005-06-16 | Hiroyuki Okada | Manufacturing method of organic thin film field effect transistor |
US20050212014A1 (en) * | 2004-03-26 | 2005-09-29 | Masahiro Horibe | Semiconductor device and semiconductor sensor |
WO2006124055A2 (en) * | 2004-10-12 | 2006-11-23 | Nanosys, Inc. | Fully integrated organic layered processes for making plastic electronics based on conductive polymers and semiconductor nanowires |
EP1732150A1 (en) * | 2005-06-07 | 2006-12-13 | Xerox Corporation | Organic thin film transistors with multilayer electrodes |
Also Published As
Publication number | Publication date |
---|---|
WO2008144762A2 (en) | 2008-11-27 |
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