WO2008132812A1 - Solid-state imaging element and imaging device using same - Google Patents

Solid-state imaging element and imaging device using same Download PDF

Info

Publication number
WO2008132812A1
WO2008132812A1 PCT/JP2008/001000 JP2008001000W WO2008132812A1 WO 2008132812 A1 WO2008132812 A1 WO 2008132812A1 JP 2008001000 W JP2008001000 W JP 2008001000W WO 2008132812 A1 WO2008132812 A1 WO 2008132812A1
Authority
WO
WIPO (PCT)
Prior art keywords
focus detection
imaging device
focus
electric converting
solid
Prior art date
Application number
PCT/JP2008/001000
Other languages
French (fr)
Japanese (ja)
Inventor
Toru Takagi
Original Assignee
Nikon Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corporation filed Critical Nikon Corporation
Publication of WO2008132812A1 publication Critical patent/WO2008132812A1/en

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B13/00—Viewfinders; Focusing aids for cameras; Means for focusing for cameras; Autofocus systems for cameras
    • G03B13/32—Means for focusing
    • G03B13/34—Power focusing
    • G03B13/36—Autofocus systems
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/67—Focus control based on electronic image sensor signals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14625—Optical elements or arrangements associated with the device
    • H01L27/14627—Microlenses

Abstract

There has been conventionally a problem that the symmetry of pupil division of an imaging device is greatly broken because the position of the exit pupil projected onto the focus detection photo-electric converting part varies with the focal length of the interchangeable lens. According to the invention, a solid-state imaging device having at least one focus area in a part of the effective pixel region where pixels having micro lenses are arranged in a matrix is provided. The solid-state imaging device has a structure in which the micro lens and the focus detection photo-electric converting part of each pixel in the focus area are so arranged as to be separated at a predetermined shift distance. The focus area is composed of pixels having different predetermined shift distances. From among the focus detection photo-electric converting parts, the focus detection photo-electric converting part whose pupil division is the most approximate symmetry is selected to make focus control. With this, pupil division with good symmetry can be carried out, and high-accuracy focus detection adapted to lenses having various exit pupil positions is possible irrespective of the production variation.
PCT/JP2008/001000 2007-04-20 2008-04-16 Solid-state imaging element and imaging device using same WO2008132812A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007111974 2007-04-20
JP2007-111974 2007-04-20

Publications (1)

Publication Number Publication Date
WO2008132812A1 true WO2008132812A1 (en) 2008-11-06

Family

ID=39925284

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/001000 WO2008132812A1 (en) 2007-04-20 2008-04-16 Solid-state imaging element and imaging device using same

Country Status (1)

Country Link
WO (1) WO2008132812A1 (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010061756A1 (en) 2008-11-27 2010-06-03 Canon Kabushiki Kaisha Solid-state image sensing element and image sensing apparatus
JP2011059337A (en) * 2009-09-09 2011-03-24 Fujifilm Corp Image pickup apparatus
CN102822716A (en) * 2010-04-08 2012-12-12 索尼公司 Image pickup apparatus, solid-state image pickup device, and image pickup method
CN102834756A (en) * 2010-04-08 2012-12-19 索尼公司 Image pickup apparatus, solid-state image pickup element, and image pickup method
WO2013057859A1 (en) * 2011-10-21 2013-04-25 株式会社ニコン Image capture element
US8842212B2 (en) 2009-05-19 2014-09-23 Canon Kabushiki Kaisha Optical device and focus state detection method
WO2016194577A1 (en) * 2015-05-29 2016-12-08 ソニー株式会社 Imaging element, imaging method, program, and electronic device
JP2018046336A (en) * 2016-09-12 2018-03-22 キヤノン株式会社 Imager and imaging apparatus
EP3489730A1 (en) * 2008-02-28 2019-05-29 Sony Corporation Image pickup device and image pickup element
TWI742573B (en) * 2014-11-05 2021-10-11 日商索尼半導體解決方案公司 Solid-state imaging element, its manufacturing method, and electronic equipment

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59133512A (en) * 1983-01-21 1984-07-31 Nippon Kogaku Kk <Nikon> Focus detecting device
JPH04107406A (en) * 1990-08-28 1992-04-08 Nikon Corp Focus detecting device
JP2002006205A (en) * 2000-06-22 2002-01-09 Canon Inc Automatic focusing camera
JP2003250080A (en) * 2002-02-22 2003-09-05 Canon Inc Imaging apparatus and imaging system
JP2007133087A (en) * 2005-11-09 2007-05-31 Nikon Corp Focus detection device, optical system, and focus detection method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59133512A (en) * 1983-01-21 1984-07-31 Nippon Kogaku Kk <Nikon> Focus detecting device
JPH04107406A (en) * 1990-08-28 1992-04-08 Nikon Corp Focus detecting device
JP2002006205A (en) * 2000-06-22 2002-01-09 Canon Inc Automatic focusing camera
JP2003250080A (en) * 2002-02-22 2003-09-05 Canon Inc Imaging apparatus and imaging system
JP2007133087A (en) * 2005-11-09 2007-05-31 Nikon Corp Focus detection device, optical system, and focus detection method

Cited By (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3489730A1 (en) * 2008-02-28 2019-05-29 Sony Corporation Image pickup device and image pickup element
EP2370846A1 (en) * 2008-11-27 2011-10-05 Canon Kabushiki Kaisha Solid-state image sensing element and image sensing apparatus
JP2012505422A (en) * 2008-11-27 2012-03-01 キヤノン株式会社 Solid-state imaging device and imaging apparatus
WO2010061756A1 (en) 2008-11-27 2010-06-03 Canon Kabushiki Kaisha Solid-state image sensing element and image sensing apparatus
US8913175B2 (en) 2008-11-27 2014-12-16 Canon Kabushiki Kaisha Solid-state image sensing element and image sensing apparatus for detecting a focus state of a photographing lens
EP2370846A4 (en) * 2008-11-27 2013-12-11 Canon Kk Solid-state image sensing element and image sensing apparatus
US8842212B2 (en) 2009-05-19 2014-09-23 Canon Kabushiki Kaisha Optical device and focus state detection method
JP2011059337A (en) * 2009-09-09 2011-03-24 Fujifilm Corp Image pickup apparatus
CN102025903A (en) * 2009-09-09 2011-04-20 富士胶片株式会社 Image pickup apparatus
CN102025903B (en) * 2009-09-09 2015-05-27 富士胶片株式会社 Image pickup apparatus
US8471952B2 (en) 2009-09-09 2013-06-25 Fujifilm Corporation Image pickup apparatus
CN102834756A (en) * 2010-04-08 2012-12-19 索尼公司 Image pickup apparatus, solid-state image pickup element, and image pickup method
EP3333609A1 (en) * 2010-04-08 2018-06-13 Sony Corporation Image pickup apparatus, solid-state image pickup device, and image pickup method
CN102822716A (en) * 2010-04-08 2012-12-12 索尼公司 Image pickup apparatus, solid-state image pickup device, and image pickup method
US8953085B2 (en) 2010-04-08 2015-02-10 Sony Corporation Image pickup apparatus, solid-state image pickup device, and image pickup method
EP2556401A1 (en) * 2010-04-08 2013-02-13 Sony Corporation Image pickup apparatus, solid-state image pickup device, and image pickup method
US9172865B2 (en) 2010-04-08 2015-10-27 Sony Corporation Image pickup apparatus, solid-state image pickup device, and image pickup method
US9451158B2 (en) 2010-04-08 2016-09-20 Sony Corporation Image pickup apparatus, solid-state image pickup device, and image pickup method
US10021327B2 (en) 2010-04-08 2018-07-10 Sony Corporation Image pickup apparatus, solid-state image pickup device, and image pickup method
US9565382B2 (en) 2010-04-08 2017-02-07 Sony Corporation Image pickup apparatus, solid-state image pickup device, and image pickup method
EP2556401A4 (en) * 2010-04-08 2014-07-30 Sony Corp Image pickup apparatus, solid-state image pickup device, and image pickup method
WO2013057859A1 (en) * 2011-10-21 2013-04-25 株式会社ニコン Image capture element
TWI742573B (en) * 2014-11-05 2021-10-11 日商索尼半導體解決方案公司 Solid-state imaging element, its manufacturing method, and electronic equipment
WO2016194577A1 (en) * 2015-05-29 2016-12-08 ソニー株式会社 Imaging element, imaging method, program, and electronic device
JP2018046336A (en) * 2016-09-12 2018-03-22 キヤノン株式会社 Imager and imaging apparatus

Similar Documents

Publication Publication Date Title
WO2008132812A1 (en) Solid-state imaging element and imaging device using same
JP4910366B2 (en) Focus detection apparatus, optical system, and focus detection method
NZ594238A (en) Dual field-of-view optical imaging system with dual focus lens, and with axially movable detector
JP2013048309A5 (en)
MX2013002455A (en) Auto-focus control using image statistics data with coarse and fine auto-focus scores.
MX2016012728A (en) Auto-focus in low-profile folded optics multi-camera system.
TW200627936A (en) Optical tracking system using variable focal length lens
EP2683154A3 (en) Image pickup apparatus and lens apparatus
WO2013012474A3 (en) Rolling-shutter imaging system with synchronized scanning illumination and methods for higher-resolution imaging
WO2007134137A3 (en) High resolution imaging system
EP3595008A3 (en) Solid-state image pickup device and electronic apparatus
EP2566151A4 (en) Image pickup device and rangefinder device
WO2007134264A3 (en) Micro mirror array lens with micro mirror adjustments to vary lens focal length
EP3119078A3 (en) Image capturing device and auto-focus method thereof
WO2014074202A3 (en) Monocentric lens designs and associated imaging systems having wide field of view and high resolution
WO2007079397A3 (en) Autofocus method and system for an automated microscope
FI20085510L (en) A zoom-camera arrangement comprising several sub-cameras
JP2013186201A5 (en)
RU2013147423A (en) IMAGE SENSOR AND IMAGE FORMING DEVICE
JP2015149350A5 (en)
US20180184036A1 (en) Image sensor and electronic device
EP2635019A3 (en) Image processing device, image processing method, and program
JP2013183278A5 (en)
JP2018206917A5 (en)
EP3118678A8 (en) Lens system

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08738602

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 08738602

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: JP