WO2008123338A1 - Component for charged particle device and method for manufacturing the component - Google Patents
Component for charged particle device and method for manufacturing the component Download PDFInfo
- Publication number
- WO2008123338A1 WO2008123338A1 PCT/JP2008/055823 JP2008055823W WO2008123338A1 WO 2008123338 A1 WO2008123338 A1 WO 2008123338A1 JP 2008055823 W JP2008055823 W JP 2008055823W WO 2008123338 A1 WO2008123338 A1 WO 2008123338A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- component
- tube
- charged particle
- fitting section
- metal
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/08—Ion sources; Ion guns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
- H01J27/20—Ion sources; Ion guns using particle beam bombardment, e.g. ionisers
- H01J27/22—Metal ion sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
- H01J37/065—Construction of guns or parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/061—Construction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/063—Electron sources
- H01J2237/06308—Thermionic sources
- H01J2237/06316—Schottky emission
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/08—Ion sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/08—Ion sources
- H01J2237/0802—Field ionization sources
- H01J2237/0805—Liquid metal sources
Abstract
Provided is a component for a charged particle device. In the component, a brazing material is not used for an electronic source or ion source, accuracy of a joint between an extraction electrode and an insulator is improved, and an alignment error of discharged charged particles is reduced. Furthermore, since the brazing material is not used, the component is advantageous from the aspect of cost. The component is composed of a plurality of components, which are a metal component and an insulating component. The component has a tube-like fitting section for connecting the metal component and the insulating component. An outer tube of the fitting section is made of a metal, and an inner tube is made of an insulating material. The inner size of the outer tube at a room temperature is slightly smaller than the outer size of the inner tube, and the fitting section is formed by connecting the outer tube and the inner tube by thermal shrink fitting.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007-081037 | 2007-03-27 | ||
JP2007081037A JP2010135068A (en) | 2007-03-27 | 2007-03-27 | Component for charged particle device and manufacturing method for the same |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008123338A1 true WO2008123338A1 (en) | 2008-10-16 |
Family
ID=39830826
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/055823 WO2008123338A1 (en) | 2007-03-27 | 2008-03-27 | Component for charged particle device and method for manufacturing the component |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2010135068A (en) |
TW (1) | TWI428951B (en) |
WO (1) | WO2008123338A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012127963A1 (en) * | 2011-03-18 | 2012-09-27 | 電気化学工業株式会社 | Enclosure and method for handling electron gun or ion gun |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6332846A (en) * | 1986-07-25 | 1988-02-12 | Tadao Suganuma | Electron gun |
JPH06108831A (en) * | 1991-09-13 | 1994-04-19 | W R Grace & Co | Electrode feed-through |
JP2000260371A (en) * | 1999-03-09 | 2000-09-22 | Toshiba Corp | Electrode for electron beam image forming device and its manufacture |
JP2002116283A (en) * | 2000-10-05 | 2002-04-19 | Toshiba Corp | Digital system for monitoring power range in nuclear reactor |
JP2005122928A (en) * | 2003-10-14 | 2005-05-12 | Hitachi Ltd | Bonding structure of metal body and ceramics, and vacuum switch using it |
JP2005332677A (en) * | 2004-05-19 | 2005-12-02 | Denki Kagaku Kogyo Kk | Manufacturing method of electron source and its use |
WO2006011950A2 (en) * | 2004-06-24 | 2006-02-02 | Woodward Governor Company | Pre-chamber spark plug |
-
2007
- 2007-03-27 JP JP2007081037A patent/JP2010135068A/en active Pending
-
2008
- 2008-03-26 TW TW97110701A patent/TWI428951B/en active
- 2008-03-27 WO PCT/JP2008/055823 patent/WO2008123338A1/en active Application Filing
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6332846A (en) * | 1986-07-25 | 1988-02-12 | Tadao Suganuma | Electron gun |
JPH06108831A (en) * | 1991-09-13 | 1994-04-19 | W R Grace & Co | Electrode feed-through |
JP2000260371A (en) * | 1999-03-09 | 2000-09-22 | Toshiba Corp | Electrode for electron beam image forming device and its manufacture |
JP2002116283A (en) * | 2000-10-05 | 2002-04-19 | Toshiba Corp | Digital system for monitoring power range in nuclear reactor |
JP2005122928A (en) * | 2003-10-14 | 2005-05-12 | Hitachi Ltd | Bonding structure of metal body and ceramics, and vacuum switch using it |
JP2005332677A (en) * | 2004-05-19 | 2005-12-02 | Denki Kagaku Kogyo Kk | Manufacturing method of electron source and its use |
WO2006011950A2 (en) * | 2004-06-24 | 2006-02-02 | Woodward Governor Company | Pre-chamber spark plug |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012127963A1 (en) * | 2011-03-18 | 2012-09-27 | 電気化学工業株式会社 | Enclosure and method for handling electron gun or ion gun |
CN103430275A (en) * | 2011-03-18 | 2013-12-04 | 电气化学工业株式会社 | Enclosure and method for handling electron gun or ion gun |
JP5925764B2 (en) * | 2011-03-18 | 2016-05-25 | デンカ株式会社 | Handling method and container of electron gun or ion gun |
US9496673B2 (en) | 2011-03-18 | 2016-11-15 | Denka Company Limited | Enclosure and method for handling electron gun or ion gun |
CN103430275B (en) * | 2011-03-18 | 2018-01-16 | 电化株式会社 | The processing method and packaging container of electron gun or ion gun |
Also Published As
Publication number | Publication date |
---|---|
JP2010135068A (en) | 2010-06-17 |
TWI428951B (en) | 2014-03-01 |
TW200903553A (en) | 2009-01-16 |
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