WO2008105156A1 - Polarization imaging device and differential interference microscope - Google Patents

Polarization imaging device and differential interference microscope Download PDF

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Publication number
WO2008105156A1
WO2008105156A1 PCT/JP2008/000307 JP2008000307W WO2008105156A1 WO 2008105156 A1 WO2008105156 A1 WO 2008105156A1 JP 2008000307 W JP2008000307 W JP 2008000307W WO 2008105156 A1 WO2008105156 A1 WO 2008105156A1
Authority
WO
WIPO (PCT)
Prior art keywords
differential interference
interference microscope
imaging device
polarization imaging
acquire
Prior art date
Application number
PCT/JP2008/000307
Other languages
French (fr)
Japanese (ja)
Inventor
Shojiro Kawakami
Takashi Sato
Takayuki Kawashima
Yoshihiko Inoue
Original Assignee
Photonic Lattice, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Photonic Lattice, Inc. filed Critical Photonic Lattice, Inc.
Priority to JP2009501124A priority Critical patent/JPWO2008105156A1/en
Publication of WO2008105156A1 publication Critical patent/WO2008105156A1/en

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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/0092Polarisation microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/18Diffraction gratings
    • G02B5/1876Diffractive Fresnel lenses; Zone plates; Kinoforms
    • G02B5/188Plurality of such optical elements formed in or on a supporting substrate
    • G02B5/1885Arranged as a periodic array

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

[PROBLEMS] To provide a differential interference microscope which can simultaneously acquire light intensity information and phase information. [MEANS FOR SOLVING PROBLEMS] An image of a differential interference microscope is observed by using a polarization imaging device which can acquire a spatial distribution of a polarization state at one imaging by combining a polarizer array in which transmission axis direction is changed in a pixel unit and an imaging element. By performing calculation from this, it is possible to acquire the intensity information and the phase information separately from each other.
PCT/JP2008/000307 2007-02-28 2008-02-22 Polarization imaging device and differential interference microscope WO2008105156A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009501124A JPWO2008105156A1 (en) 2007-02-28 2008-02-22 Polarization imaging apparatus and differential interference microscope

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007050873 2007-02-28
JP2007-050873 2007-02-28

Publications (1)

Publication Number Publication Date
WO2008105156A1 true WO2008105156A1 (en) 2008-09-04

Family

ID=39720998

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/000307 WO2008105156A1 (en) 2007-02-28 2008-02-22 Polarization imaging device and differential interference microscope

Country Status (2)

Country Link
JP (1) JPWO2008105156A1 (en)
WO (1) WO2008105156A1 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2253984A1 (en) * 2009-04-30 2010-11-24 Olympus Corporation Microscope
WO2014192600A1 (en) * 2013-05-28 2014-12-04 日立造船株式会社 Polarization imaging filter and method for manufacturing same
JP2015043107A (en) * 2008-12-22 2015-03-05 スリーエム イノベイティブ プロパティズ カンパニー Multilayer optical film having side-by-side polarizer/polarizer zone
CN107422484A (en) * 2017-09-19 2017-12-01 歌尔科技有限公司 Lens type AR display devices
JP2018036314A (en) * 2016-08-29 2018-03-08 富士フイルム株式会社 Polarization image sensor and polarization image sensor fabrication method
WO2021205783A1 (en) * 2020-04-10 2021-10-14 浜松ホトニクス株式会社 Observation device and observation method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05232384A (en) * 1992-02-18 1993-09-10 Olympus Optical Co Ltd Interference microscope
JPH11271630A (en) * 1998-03-25 1999-10-08 Nikon Corp Differential interference microscope
JP2000098253A (en) * 1998-09-22 2000-04-07 Olympus Optical Co Ltd Device for detecting physycal quantity of observed object and detecting method using the same

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05232384A (en) * 1992-02-18 1993-09-10 Olympus Optical Co Ltd Interference microscope
JPH11271630A (en) * 1998-03-25 1999-10-08 Nikon Corp Differential interference microscope
JP2000098253A (en) * 1998-09-22 2000-04-07 Olympus Optical Co Ltd Device for detecting physycal quantity of observed object and detecting method using the same

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9575233B2 (en) 2008-12-22 2017-02-21 3M Innovative Properties Company Internally patterned multilayer optical films using spatially selective birefringence reduction
US9291757B2 (en) 2008-12-22 2016-03-22 3M Innovative Properties Company Multilayer optical films having side-by-side polarizer/polarizer zones
US9651726B2 (en) 2008-12-22 2017-05-16 3M Innovative Properties Company Multilayer optical films having side-by-side polarizer/polarizer zones
JP2015043107A (en) * 2008-12-22 2015-03-05 スリーエム イノベイティブ プロパティズ カンパニー Multilayer optical film having side-by-side polarizer/polarizer zone
EP2253984A1 (en) * 2009-04-30 2010-11-24 Olympus Corporation Microscope
CN106358443A (en) * 2013-05-28 2017-01-25 日立造船株式会社 Polarization imaging filter and method for manufacturing same
WO2014192600A1 (en) * 2013-05-28 2014-12-04 日立造船株式会社 Polarization imaging filter and method for manufacturing same
JP2014232129A (en) * 2013-05-28 2014-12-11 国立大学法人京都大学 Polarization imaging filter and method of manufacturing the same
JP2018036314A (en) * 2016-08-29 2018-03-08 富士フイルム株式会社 Polarization image sensor and polarization image sensor fabrication method
CN107422484A (en) * 2017-09-19 2017-12-01 歌尔科技有限公司 Lens type AR display devices
CN107422484B (en) * 2017-09-19 2023-07-28 歌尔光学科技有限公司 Prismatic AR display device
WO2021205783A1 (en) * 2020-04-10 2021-10-14 浜松ホトニクス株式会社 Observation device and observation method
JP2021167880A (en) * 2020-04-10 2021-10-21 浜松ホトニクス株式会社 Observation device and observation method
JP7307027B2 (en) 2020-04-10 2023-07-11 浜松ホトニクス株式会社 Observation device and observation method

Also Published As

Publication number Publication date
JPWO2008105156A1 (en) 2010-06-03

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