WO2008024611A3 - Staggered array imaging system using pixilated radiation detectors - Google Patents

Staggered array imaging system using pixilated radiation detectors Download PDF

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Publication number
WO2008024611A3
WO2008024611A3 PCT/US2007/075249 US2007075249W WO2008024611A3 WO 2008024611 A3 WO2008024611 A3 WO 2008024611A3 US 2007075249 W US2007075249 W US 2007075249W WO 2008024611 A3 WO2008024611 A3 WO 2008024611A3
Authority
WO
WIPO (PCT)
Prior art keywords
radiation detectors
imaging system
array imaging
staggered array
radiation
Prior art date
Application number
PCT/US2007/075249
Other languages
French (fr)
Other versions
WO2008024611A2 (en
Inventor
Viatcheslav Vydrin
Original Assignee
Ii Vi Inc
Viatcheslav Vydrin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ii Vi Inc, Viatcheslav Vydrin filed Critical Ii Vi Inc
Publication of WO2008024611A2 publication Critical patent/WO2008024611A2/en
Publication of WO2008024611A3 publication Critical patent/WO2008024611A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes

Abstract

A radiation detection/imaging system includes a first set of radiation detectors (20-1, 20-3, 20-5) spaced from each other in a first direction and a second set of radiation detectors (20-2, 20-4) spaced from each other in the first direction. The second set of radiation detectors is positioned laterally- adjacent the first set of radiation detectors and the radiation detectors of the first and second sets of radiation detectors are arranged in an alternating or staggered pattern in the first direction. A composite image can be formed of the passage of radiation through an object acquired by the first and second sets of radiation detectors as the object is translated by the first and second sets of radiation detectors.
PCT/US2007/075249 2006-08-21 2007-08-06 Staggered array imaging system using pixilated radiation detectors WO2008024611A2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US83900706P 2006-08-21 2006-08-21
US60/839,007 2006-08-21
US11/888,343 2007-08-02
US88834307 2007-08-02

Publications (2)

Publication Number Publication Date
WO2008024611A2 WO2008024611A2 (en) 2008-02-28
WO2008024611A3 true WO2008024611A3 (en) 2008-05-22

Family

ID=46062912

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/075249 WO2008024611A2 (en) 2006-08-21 2007-08-06 Staggered array imaging system using pixilated radiation detectors

Country Status (1)

Country Link
WO (1) WO2008024611A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107771058B (en) * 2015-01-26 2020-11-24 伊利诺斯工具制品有限公司 Gap resolution of linear detector array

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2178048A3 (en) 2008-09-29 2017-07-19 MIR Medical Imaging Research Holding GmbH Method for defining a coordination system of a female breast tailored to the patient
EP3746489B1 (en) 2018-01-31 2022-03-30 3M Innovative Properties Company Photolabile barbiturate compounds
CN111656168A (en) * 2018-01-31 2020-09-11 3M创新有限公司 Virtual camera array for inspection of manufactured web
WO2019150242A1 (en) 2018-01-31 2019-08-08 3M Innovative Properties Company Infrared light transmission inspection for continuous moving web
CN115005853B (en) * 2022-07-19 2022-12-13 中国科学院深圳先进技术研究院 High-spatial-temporal-resolution energy spectrum CT imaging method and device based on multilayer flat panel detector

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4432017A (en) * 1981-07-20 1984-02-14 Xerox Corporation Adjacent bilinear photosite imager
US5939724A (en) * 1993-06-02 1999-08-17 State Of Israel, The, Atomic Energy Commission, Soreo Nuclear Research Center Light weight-camera head and-camera assemblies containing it
WO2003069371A1 (en) * 2002-02-15 2003-08-21 Xcounter Ab Radiation detector arrangement comprising multiple line detector units
US20040004189A1 (en) * 2002-07-02 2004-01-08 Anders Brahme Radiation sensor device
US20050249331A1 (en) * 2004-05-04 2005-11-10 Wear James A Solid state X-ray detector with improved spatial resolution

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4432017A (en) * 1981-07-20 1984-02-14 Xerox Corporation Adjacent bilinear photosite imager
US5939724A (en) * 1993-06-02 1999-08-17 State Of Israel, The, Atomic Energy Commission, Soreo Nuclear Research Center Light weight-camera head and-camera assemblies containing it
WO2003069371A1 (en) * 2002-02-15 2003-08-21 Xcounter Ab Radiation detector arrangement comprising multiple line detector units
US20040004189A1 (en) * 2002-07-02 2004-01-08 Anders Brahme Radiation sensor device
US20050249331A1 (en) * 2004-05-04 2005-11-10 Wear James A Solid state X-ray detector with improved spatial resolution

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107771058B (en) * 2015-01-26 2020-11-24 伊利诺斯工具制品有限公司 Gap resolution of linear detector array

Also Published As

Publication number Publication date
WO2008024611A2 (en) 2008-02-28

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