WO2007119972A1 - Permanent anti-static polyoxymethylene resin composition - Google Patents
Permanent anti-static polyoxymethylene resin composition Download PDFInfo
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- WO2007119972A1 WO2007119972A1 PCT/KR2007/001800 KR2007001800W WO2007119972A1 WO 2007119972 A1 WO2007119972 A1 WO 2007119972A1 KR 2007001800 W KR2007001800 W KR 2007001800W WO 2007119972 A1 WO2007119972 A1 WO 2007119972A1
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- Prior art keywords
- weight
- percent
- formula
- carbon atoms
- resin composition
- Prior art date
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- -1 polyoxymethylene Polymers 0.000 title claims abstract description 60
- 229920006324 polyoxymethylene Polymers 0.000 title claims abstract description 46
- 229930040373 Paraformaldehyde Natural products 0.000 title claims abstract description 40
- 239000011342 resin composition Substances 0.000 title claims abstract description 19
- 229920006146 polyetheresteramide block copolymer Polymers 0.000 claims abstract description 28
- 239000004721 Polyphenylene oxide Substances 0.000 claims abstract description 18
- 239000004952 Polyamide Substances 0.000 claims abstract description 14
- 229920002647 polyamide Polymers 0.000 claims abstract description 14
- 229920000570 polyether Polymers 0.000 claims abstract description 14
- 150000002148 esters Chemical class 0.000 claims abstract description 11
- 239000000203 mixture Substances 0.000 claims abstract description 11
- 150000001408 amides Chemical class 0.000 claims abstract description 5
- 229920002614 Polyether block amide Polymers 0.000 claims abstract description 4
- 229920005989 resin Polymers 0.000 claims description 34
- 239000011347 resin Substances 0.000 claims description 34
- 125000004432 carbon atom Chemical group C* 0.000 claims description 25
- 229910052739 hydrogen Inorganic materials 0.000 claims description 13
- 239000001257 hydrogen Substances 0.000 claims description 13
- 125000000217 alkyl group Chemical group 0.000 claims description 11
- 239000012760 heat stabilizer Substances 0.000 claims description 11
- XBDQKXXYIPTUBI-UHFFFAOYSA-M Propionate Chemical compound CCC([O-])=O XBDQKXXYIPTUBI-UHFFFAOYSA-M 0.000 claims description 10
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 9
- 239000003963 antioxidant agent Substances 0.000 claims description 9
- GLUUGHFHXGJENI-UHFFFAOYSA-N Piperazine Chemical compound C1CNCCN1 GLUUGHFHXGJENI-UHFFFAOYSA-N 0.000 claims description 8
- 230000003078 antioxidant effect Effects 0.000 claims description 8
- 150000004985 diamines Chemical class 0.000 claims description 8
- 239000002253 acid Substances 0.000 claims description 7
- 229920001577 copolymer Polymers 0.000 claims description 7
- 238000006116 polymerization reaction Methods 0.000 claims description 7
- CMMODZDJEBXBHK-UHFFFAOYSA-N tetradecanedihydrazide Chemical compound NNC(=O)CCCCCCCCCCCCC(=O)NN CMMODZDJEBXBHK-UHFFFAOYSA-N 0.000 claims description 6
- 125000005704 oxymethylene group Chemical group [H]C([H])([*:2])O[*:1] 0.000 claims description 5
- 229920001515 polyalkylene glycol Polymers 0.000 claims description 5
- NSMWYRLQHIXVAP-UHFFFAOYSA-N 2,5-dimethylpiperazine Chemical compound CC1CNC(C)CN1 NSMWYRLQHIXVAP-UHFFFAOYSA-N 0.000 claims description 4
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 125000004122 cyclic group Chemical group 0.000 claims description 4
- 150000002431 hydrogen Chemical class 0.000 claims description 4
- BGYHLZZASRKEJE-UHFFFAOYSA-N [3-[3-(3,5-ditert-butyl-4-hydroxyphenyl)propanoyloxy]-2,2-bis[3-(3,5-ditert-butyl-4-hydroxyphenyl)propanoyloxymethyl]propyl] 3-(3,5-ditert-butyl-4-hydroxyphenyl)propanoate Chemical compound CC(C)(C)C1=C(O)C(C(C)(C)C)=CC(CCC(=O)OCC(COC(=O)CCC=2C=C(C(O)=C(C=2)C(C)(C)C)C(C)(C)C)(COC(=O)CCC=2C=C(C(O)=C(C=2)C(C)(C)C)C(C)(C)C)COC(=O)CCC=2C=C(C(O)=C(C=2)C(C)(C)C)C(C)(C)C)=C1 BGYHLZZASRKEJE-UHFFFAOYSA-N 0.000 claims description 3
- FIDRAVVQGKNYQK-UHFFFAOYSA-N 1,2,3,4-tetrahydrotriazine Chemical compound C1NNNC=C1 FIDRAVVQGKNYQK-UHFFFAOYSA-N 0.000 claims description 2
- 125000003118 aryl group Chemical group 0.000 claims description 2
- 125000000325 methylidene group Chemical group [H]C([H])=* 0.000 claims description 2
- PYRZPBDTPRQYKG-UHFFFAOYSA-N cyclopentene-1-carboxylic acid Chemical compound OC(=O)C1=CCCC1 PYRZPBDTPRQYKG-UHFFFAOYSA-N 0.000 claims 1
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical class O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 13
- 238000005299 abrasion Methods 0.000 description 11
- 239000002216 antistatic agent Substances 0.000 description 9
- 238000000034 method Methods 0.000 description 9
- 230000000052 comparative effect Effects 0.000 description 7
- 150000003254 radicals Chemical group 0.000 description 7
- 239000004033 plastic Substances 0.000 description 6
- 229920003023 plastic Polymers 0.000 description 6
- 239000004094 surface-active agent Substances 0.000 description 6
- 235000019256 formaldehyde Nutrition 0.000 description 5
- 230000000704 physical effect Effects 0.000 description 5
- 230000003068 static effect Effects 0.000 description 5
- XSQUKJJJFZCRTK-UHFFFAOYSA-N Urea Chemical compound NC(N)=O XSQUKJJJFZCRTK-UHFFFAOYSA-N 0.000 description 4
- BGJSXRVXTHVRSN-UHFFFAOYSA-N 1,3,5-trioxane Chemical compound C1OCOCO1 BGJSXRVXTHVRSN-UHFFFAOYSA-N 0.000 description 3
- 239000004696 Poly ether ether ketone Substances 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 239000000428 dust Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000010892 electric spark Methods 0.000 description 3
- 229920001519 homopolymer Polymers 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- JDSHMPZPIAZGSV-UHFFFAOYSA-N melamine Chemical compound NC1=NC(N)=NC(N)=N1 JDSHMPZPIAZGSV-UHFFFAOYSA-N 0.000 description 3
- 229920002530 polyetherether ketone Polymers 0.000 description 3
- 230000000379 polymerizing effect Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- AUAGGMPIKOZAJZ-UHFFFAOYSA-N 1,3,6-trioxocane Chemical compound C1COCOCCO1 AUAGGMPIKOZAJZ-UHFFFAOYSA-N 0.000 description 2
- WNXJIVFYUVYPPR-UHFFFAOYSA-N 1,3-dioxolane Chemical compound C1COCO1 WNXJIVFYUVYPPR-UHFFFAOYSA-N 0.000 description 2
- QSRJVOOOWGXUDY-UHFFFAOYSA-N 2-[2-[2-[3-(3-tert-butyl-4-hydroxy-5-methylphenyl)propanoyloxy]ethoxy]ethoxy]ethyl 3-(3-tert-butyl-4-hydroxy-5-methylphenyl)propanoate Chemical compound CC(C)(C)C1=C(O)C(C)=CC(CCC(=O)OCCOCCOCCOC(=O)CCC=2C=C(C(O)=C(C)C=2)C(C)(C)C)=C1 QSRJVOOOWGXUDY-UHFFFAOYSA-N 0.000 description 2
- IAYPIBMASNFSPL-UHFFFAOYSA-N Ethylene oxide Chemical compound C1CO1 IAYPIBMASNFSPL-UHFFFAOYSA-N 0.000 description 2
- 229920012196 Polyoxymethylene Copolymer Polymers 0.000 description 2
- YTPLMLYBLZKORZ-UHFFFAOYSA-N Thiophene Chemical compound C=1C=CSC=1 YTPLMLYBLZKORZ-UHFFFAOYSA-N 0.000 description 2
- WERYXYBDKMZEQL-UHFFFAOYSA-N butane-1,4-diol Chemical compound OCCCCO WERYXYBDKMZEQL-UHFFFAOYSA-N 0.000 description 2
- 235000013877 carbamide Nutrition 0.000 description 2
- 150000001721 carbon Chemical group 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 239000006229 carbon black Substances 0.000 description 2
- 235000019241 carbon black Nutrition 0.000 description 2
- 239000003054 catalyst Substances 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 150000002170 ethers Chemical class 0.000 description 2
- 238000001746 injection moulding Methods 0.000 description 2
- 239000000155 melt Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- WSFSSNUMVMOOMR-NJFSPNSNSA-N methanone Chemical compound O=[14CH2] WSFSSNUMVMOOMR-NJFSPNSNSA-N 0.000 description 2
- 150000002762 monocarboxylic acid derivatives Chemical class 0.000 description 2
- 239000008188 pellet Substances 0.000 description 2
- 150000002989 phenols Chemical class 0.000 description 2
- 239000002685 polymerization catalyst Substances 0.000 description 2
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 2
- OKRSVCKJPLEHEY-UHFFFAOYSA-N (2,2,6,6-tetramethylpiperidin-4-yl) acetate Chemical compound CC(=O)OC1CC(C)(C)NC(C)(C)C1 OKRSVCKJPLEHEY-UHFFFAOYSA-N 0.000 description 1
- YEYCMBWKTZNPDH-UHFFFAOYSA-N (2,2,6,6-tetramethylpiperidin-4-yl) benzoate Chemical compound C1C(C)(C)NC(C)(C)CC1OC(=O)C1=CC=CC=C1 YEYCMBWKTZNPDH-UHFFFAOYSA-N 0.000 description 1
- JMUOXOJMXILBTE-UHFFFAOYSA-N (2,2,6,6-tetramethylpiperidin-4-yl) octadecanoate Chemical compound CCCCCCCCCCCCCCCCCC(=O)OC1CC(C)(C)NC(C)(C)C1 JMUOXOJMXILBTE-UHFFFAOYSA-N 0.000 description 1
- BUFCQVRLKYIQJP-UHFFFAOYSA-N (2,2,6,6-tetramethylpiperidin-4-yl) prop-2-enoate Chemical compound CC1(C)CC(OC(=O)C=C)CC(C)(C)N1 BUFCQVRLKYIQJP-UHFFFAOYSA-N 0.000 description 1
- JNYAEWCLZODPBN-JGWLITMVSA-N (2r,3r,4s)-2-[(1r)-1,2-dihydroxyethyl]oxolane-3,4-diol Chemical compound OC[C@@H](O)[C@H]1OC[C@H](O)[C@H]1O JNYAEWCLZODPBN-JGWLITMVSA-N 0.000 description 1
- CZLMRJZAHXYRIX-UHFFFAOYSA-N 1,3-dioxepane Chemical compound C1CCOCOC1 CZLMRJZAHXYRIX-UHFFFAOYSA-N 0.000 description 1
- KGRVJHAUYBGFFP-UHFFFAOYSA-N 2,2'-Methylenebis(4-methyl-6-tert-butylphenol) Chemical compound CC(C)(C)C1=CC(C)=CC(CC=2C(=C(C=C(C)C=2)C(C)(C)C)O)=C1O KGRVJHAUYBGFFP-UHFFFAOYSA-N 0.000 description 1
- RKMGAJGJIURJSJ-UHFFFAOYSA-N 2,2,6,6-Tetramethylpiperidine Substances CC1(C)CCCC(C)(C)N1 RKMGAJGJIURJSJ-UHFFFAOYSA-N 0.000 description 1
- IUKIOUVQRQCBOX-UHFFFAOYSA-N 2,2,6,6-tetramethyl-4-phenoxypiperidine Chemical compound C1C(C)(C)NC(C)(C)CC1OC1=CC=CC=C1 IUKIOUVQRQCBOX-UHFFFAOYSA-N 0.000 description 1
- WDYYJEFALNLPOT-UHFFFAOYSA-N 2,2,6,6-tetramethyl-4-phenylmethoxypiperidine Chemical compound C1C(C)(C)NC(C)(C)CC1OCC1=CC=CC=C1 WDYYJEFALNLPOT-UHFFFAOYSA-N 0.000 description 1
- BYDACBZVIXPNEX-UHFFFAOYSA-N 2,2-bis(1,2,2,6,6-pentamethylpiperidin-3-yl)decanedioic acid Chemical compound CC1(C)N(C)C(C)(C)CCC1C(CCCCCCCC(O)=O)(C(O)=O)C1C(C)(C)N(C)C(C)(C)CC1 BYDACBZVIXPNEX-UHFFFAOYSA-N 0.000 description 1
- MKTJWUMCSNLAOX-UHFFFAOYSA-N 2,2-bis(2,2,6,6-tetramethylpiperidin-4-yl)propanedioic acid Chemical compound C1C(C)(C)NC(C)(C)CC1C(C(O)=O)(C(O)=O)C1CC(C)(C)NC(C)(C)C1 MKTJWUMCSNLAOX-UHFFFAOYSA-N 0.000 description 1
- BGCSUUSPRCDKBQ-UHFFFAOYSA-N 2,4,8,10-tetraoxaspiro[5.5]undecane Chemical compound C1OCOCC21COCOC2 BGCSUUSPRCDKBQ-UHFFFAOYSA-N 0.000 description 1
- SAJFQHPVIYPPEY-UHFFFAOYSA-N 2,6-ditert-butyl-4-(dioctadecoxyphosphorylmethyl)phenol Chemical compound CCCCCCCCCCCCCCCCCCOP(=O)(OCCCCCCCCCCCCCCCCCC)CC1=CC(C(C)(C)C)=C(O)C(C(C)(C)C)=C1 SAJFQHPVIYPPEY-UHFFFAOYSA-N 0.000 description 1
- VEOIIOUWYNGYDA-UHFFFAOYSA-N 2-[2-(6-aminopurin-9-yl)ethoxy]ethylphosphonic acid Chemical compound NC1=NC=NC2=C1N=CN2CCOCCP(O)(O)=O VEOIIOUWYNGYDA-UHFFFAOYSA-N 0.000 description 1
- PFANXOISJYKQRP-UHFFFAOYSA-N 2-tert-butyl-4-[1-(5-tert-butyl-4-hydroxy-2-methylphenyl)butyl]-5-methylphenol Chemical compound C=1C(C(C)(C)C)=C(O)C=C(C)C=1C(CCC)C1=CC(C(C)(C)C)=C(O)C=C1C PFANXOISJYKQRP-UHFFFAOYSA-N 0.000 description 1
- MDWVSAYEQPLWMX-UHFFFAOYSA-N 4,4'-Methylenebis(2,6-di-tert-butylphenol) Chemical compound CC(C)(C)C1=C(O)C(C(C)(C)C)=CC(CC=2C=C(C(O)=C(C=2)C(C)(C)C)C(C)(C)C)=C1 MDWVSAYEQPLWMX-UHFFFAOYSA-N 0.000 description 1
- AZOKEAVWRNFNHE-UHFFFAOYSA-N 4-cyclohexyloxy-2,2,6,6-tetramethylpiperidine Chemical compound C1C(C)(C)NC(C)(C)CC1OC1CCCCC1 AZOKEAVWRNFNHE-UHFFFAOYSA-N 0.000 description 1
- RWWGPCWSFFOXJN-UHFFFAOYSA-N 4-methoxy-2,2,6,6-tetramethylpiperidine Chemical compound COC1CC(C)(C)NC(C)(C)C1 RWWGPCWSFFOXJN-UHFFFAOYSA-N 0.000 description 1
- ZVVFVKJZNVSANF-UHFFFAOYSA-N 6-[3-(3,5-ditert-butyl-4-hydroxyphenyl)propanoyloxy]hexyl 3-(3,5-ditert-butyl-4-hydroxyphenyl)propanoate Chemical compound CC(C)(C)C1=C(O)C(C(C)(C)C)=CC(CCC(=O)OCCCCCCOC(=O)CCC=2C=C(C(O)=C(C=2)C(C)(C)C)C(C)(C)C)=C1 ZVVFVKJZNVSANF-UHFFFAOYSA-N 0.000 description 1
- GZVHEAJQGPRDLQ-UHFFFAOYSA-N 6-phenyl-1,3,5-triazine-2,4-diamine Chemical compound NC1=NC(N)=NC(C=2C=CC=CC=2)=N1 GZVHEAJQGPRDLQ-UHFFFAOYSA-N 0.000 description 1
- OMIHGPLIXGGMJB-UHFFFAOYSA-N 7-oxabicyclo[4.1.0]hepta-1,3,5-triene Chemical compound C1=CC=C2OC2=C1 OMIHGPLIXGGMJB-UHFFFAOYSA-N 0.000 description 1
- FBPFZTCFMRRESA-FSIIMWSLSA-N D-Glucitol Natural products OC[C@H](O)[C@H](O)[C@@H](O)[C@H](O)CO FBPFZTCFMRRESA-FSIIMWSLSA-N 0.000 description 1
- FBPFZTCFMRRESA-JGWLITMVSA-N D-glucitol Chemical compound OC[C@H](O)[C@@H](O)[C@H](O)[C@H](O)CO FBPFZTCFMRRESA-JGWLITMVSA-N 0.000 description 1
- OTMSDBZUPAUEDD-UHFFFAOYSA-N Ethane Chemical compound CC OTMSDBZUPAUEDD-UHFFFAOYSA-N 0.000 description 1
- 229920000219 Ethylene vinyl alcohol Polymers 0.000 description 1
- 239000002879 Lewis base Substances 0.000 description 1
- 229920000877 Melamine resin Polymers 0.000 description 1
- CUZGWFBXFKFDKB-UHFFFAOYSA-N NN.C(C1=CC(C(=O)NN)=CC=C1)(=O)NN Chemical compound NN.C(C1=CC(C(=O)NN)=CC=C1)(=O)NN CUZGWFBXFKFDKB-UHFFFAOYSA-N 0.000 description 1
- 108010000020 Platelet Factor 3 Proteins 0.000 description 1
- 229930182556 Polyacetal Natural products 0.000 description 1
- 239000002202 Polyethylene glycol Substances 0.000 description 1
- GOOHAUXETOMSMM-UHFFFAOYSA-N Propylene oxide Chemical compound CC1CO1 GOOHAUXETOMSMM-UHFFFAOYSA-N 0.000 description 1
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 1
- 239000007983 Tris buffer Substances 0.000 description 1
- IORUEKDKNHHQAL-UHFFFAOYSA-N [2-tert-butyl-6-[(3-tert-butyl-2-hydroxy-5-methylphenyl)methyl]-4-methylphenyl] prop-2-enoate Chemical compound CC(C)(C)C1=CC(C)=CC(CC=2C(=C(C=C(C)C=2)C(C)(C)C)OC(=O)C=C)=C1O IORUEKDKNHHQAL-UHFFFAOYSA-N 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 150000005215 alkyl ethers Chemical class 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- FIPAOMIQSWQHOX-UHFFFAOYSA-N bis(1,2,2,6,6-pentamethylpiperidin-4-yl) hexanedioate Chemical compound C1C(C)(C)N(C)C(C)(C)CC1OC(=O)CCCCC(=O)OC1CC(C)(C)N(C)C(C)(C)C1 FIPAOMIQSWQHOX-UHFFFAOYSA-N 0.000 description 1
- GHJBIWHWRNKOFW-UHFFFAOYSA-N bis(2,2,6,6-tetramethylpiperidin-4-yl) benzene-1,4-dicarboxylate Chemical compound C1C(C)(C)NC(C)(C)CC1OC(=O)C1=CC=C(C(=O)OC2CC(C)(C)NC(C)(C)C2)C=C1 GHJBIWHWRNKOFW-UHFFFAOYSA-N 0.000 description 1
- XITRBUPOXXBIJN-UHFFFAOYSA-N bis(2,2,6,6-tetramethylpiperidin-4-yl) decanedioate Chemical compound C1C(C)(C)NC(C)(C)CC1OC(=O)CCCCCCCCC(=O)OC1CC(C)(C)NC(C)(C)C1 XITRBUPOXXBIJN-UHFFFAOYSA-N 0.000 description 1
- UROGBLCMTWAODF-UHFFFAOYSA-N bis(2,2,6,6-tetramethylpiperidin-4-yl) hexanedioate Chemical compound C1C(C)(C)NC(C)(C)CC1OC(=O)CCCCC(=O)OC1CC(C)(C)NC(C)(C)C1 UROGBLCMTWAODF-UHFFFAOYSA-N 0.000 description 1
- GMHDUYXGKJNFHH-UHFFFAOYSA-N bis(2,2,6,6-tetramethylpiperidin-4-yl) oxalate Chemical compound C1C(C)(C)NC(C)(C)CC1OC(=O)C(=O)OC1CC(C)(C)NC(C)(C)C1 GMHDUYXGKJNFHH-UHFFFAOYSA-N 0.000 description 1
- 229920001400 block copolymer Polymers 0.000 description 1
- 238000012662 bulk polymerization Methods 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000004202 carbamide Substances 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000007334 copolymerization reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- QGBSISYHAICWAH-UHFFFAOYSA-N dicyandiamide Chemical compound NC(N)=NC#N QGBSISYHAICWAH-UHFFFAOYSA-N 0.000 description 1
- NKDDWNXOKDWJAK-UHFFFAOYSA-N dimethoxymethane Chemical compound COCOC NKDDWNXOKDWJAK-UHFFFAOYSA-N 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 239000000806 elastomer Substances 0.000 description 1
- 229920006351 engineering plastic Polymers 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003344 environmental pollutant Substances 0.000 description 1
- RTZKZFJDLAIYFH-UHFFFAOYSA-N ether Substances CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 238000010528 free radical solution polymerization reaction Methods 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000011968 lewis acid catalyst Substances 0.000 description 1
- 150000007527 lewis bases Chemical class 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 150000007974 melamines Chemical class 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910017464 nitrogen compound Inorganic materials 0.000 description 1
- 150000002830 nitrogen compounds Chemical class 0.000 description 1
- SSDSCDGVMJFTEQ-UHFFFAOYSA-N octadecyl 3-(3,5-ditert-butyl-4-hydroxyphenyl)propanoate Chemical compound CCCCCCCCCCCCCCCCCCOC(=O)CCC1=CC(C(C)(C)C)=C(O)C(C(C)(C)C)=C1 SSDSCDGVMJFTEQ-UHFFFAOYSA-N 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 150000003018 phosphorus compounds Chemical class 0.000 description 1
- 231100000719 pollutant Toxicity 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 description 1
- YPFDHNVEDLHUCE-UHFFFAOYSA-N propane-1,3-diol Chemical compound OCCCO YPFDHNVEDLHUCE-UHFFFAOYSA-N 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 239000000600 sorbitol Substances 0.000 description 1
- 150000003464 sulfur compounds Chemical class 0.000 description 1
- 238000010557 suspension polymerization reaction Methods 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
- 229930192474 thiophene Natural products 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L59/00—Compositions of polyacetals; Compositions of derivatives of polyacetals
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L59/00—Compositions of polyacetals; Compositions of derivatives of polyacetals
- C08L59/04—Copolyoxymethylenes
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L77/00—Compositions of polyamides obtained by reactions forming a carboxylic amide link in the main chain; Compositions of derivatives of such polymers
- C08L77/12—Polyester-amides
Definitions
- the present invention relates to polyoxymethylene resins with a permanent antistatic function, and more particularly, to a permanent anti-static agent maintaining a peculiar abrasion resistance of polyoxymethylene and providing a permanent antistatic function and a polyoxymethylene resin including the permanent anti-static agent.
- a method of using surfactants in which surfactants move to a surface of plastic and are bonded with moisture in the air, thereby providing an anti-static function, may cause deterioration of the anti-static function due to peripheral environments and a period of using surfactants. Particularly, due to continuous moving of surfactants toward the surface of the plastic, the longer the period of using surfactants, the more deteriorated the anti-static function.
- methods of giving a permanent anti- static function by using polyamide elastomers are disclosed in Korean Patent No. 0300273 and U.S. Patent No. 5986041, respectively. Therefore, several plastic resins with the permanent anti-static function are used.
- An aspect of the present invention provides a polyoxymethylene resin composition including a permanent anti-static agent having compatibility with polyoxymethylene, maintaining a peculiar abrasion resistance of the polyoxymethylene, and giving a permanent anti-static function to the polyoxymethylene.
- a permanent antistatic polyoxymethylene resin composition including: from about 50-90.0 percent by weight of polyoxymethylene; and from about 10.0 to 50.0 percent by weight of polyetheresteramide including polyether blocks derived from a polyalkylene glycol of the formula
- R is one of hydrogen and an alkyl group containing from 1 to 4 carbon atoms
- x is an integer from 0 to about 8
- y is a large whole number such that a molecular weight of the polyether block is between 300 and 10,000 and polyamide blocks of the molecular weight up to about 10,000 obtained by a reaction of a dimmer acid obtained by a polymerization of an ethylenically unsaturated C to C mono- carboxylic acid with a diamine selected from a group consisting of alkyl diamines containing from 2 to 54 carbon atoms, aryl diamines, alicyclic diamines wherein a ring system contains 4 to 8 carbon atoms and is substitutable with at least one alkyl groups containing 1 to 8 carbon atoms, and heterocyclic diamines selected from a group consisting of piperazine and 2,5-dimethyl piperazine, the polyamide blocks corresponding to the formula
- R is one of hydrogen ad an alkyl radical containing from 1 to 18 carbon atoms
- B is a radical derived from dimmer acid and containing from 30 to about 50 carbon atoms
- A is a radical derived from the diamine
- z is an integer from about 1 to about 20
- the polyether and polyamide blocks being linearly bonded with ester linkages and having a theoretical amide: ester ratio between 0.5: 1 and 25: 1 with the polyether blocks including about 10 to 75 percent by weight of the polyetheresteramide composition.
- FIG. 1 is a perspective view illustrating an injection-molded sample for measuring a nonabrasive amount in an example.
- a permanent antistatic polyoxymethylene resin composition including: about 50-90.0 percent by weight of polyoxymethylene; and about 10.0 to 50.0 percent by weight of polyetheresteramide including polyether blocks derived from a polyalkylene glycol of the formula
- R is one of hydrogen and an alkyl group containing from 1 to 4 carbon atoms
- x is an integer from 0 to about 8
- y is a large whole number such that a molecular weight of the polyether block is between 300 and 10,000 and polyamide blocks of the molecular weight up to about 10,000 obtained by a reaction of a dimmer acid obtained by a polymerization of an ethylenically unsaturated C to C mono- carboxylic acid with a diamine selected from a group consisting of alkyl diamines containing from 2 to 54 carbon atoms, aryl diamines, alicyclic diamines wherein a ring system contains 4 to 8 carbon atoms and is substitutable with at least one alkyl groups containing 1 to 8 carbon atoms, and heterocyclic diamines selected from a group consisting of piperazine and 2,5-dimethyl piperazine, the polyamide blocks corresponding to the formula [27]
- R is one of hydrogen ad an alkyl radical containing from 1 to 18 carbon atoms
- B is a radical derived from dimmer acid and containing from 30 to about 50 carbon atoms
- A is a radical derived from the diamine
- z is an integer from about 1 to about 20
- the polyether and polyamide blocks being linearly bonded with ester linkages and having a theoretical amide: ester ratio between 0.5: 1 and 25: 1 with the polyether blocks including about 10 to 75 percent by weight of the polyetheresteramide composition.
- a permanent anti-static polyoxymethylene resin composition includes a poly- oxymethylene resin and a polyetheresteramide resin.
- the polyoxymethylene resin is one of a homopolymer of an oxymethylene repeat unit of Formula 1 and a oxymethylene copolymer in which the unit of Formula 1 and a unit of Formula 2 are randomly bonded with each other,
- each of X and X is one of hydrogen, an alkyl group, and an aryl group, the X and X corresponding to one of a case of being identical with each other and a case of being different from each other, at least one of the X and X is not the hydrogen, and x is an integer from about 2 to about 6.
- An average molecular weight of the polyoxymethylene resin according to an exemplary embodiment of the present invention may be from about 10,000 to about 200,000.
- the oxymethylene homopolymer may be manufactured by polymerizing one of formaldehyde and an annular oligomer of the formaldehyde, namely, trioxane.
- the oxymethylene copolymer in which the unit of Formula 1 and the unit of Formula 2 are bonded with each other may be obtained by randomly polymerizing one of formaldehyde and an annular oligomer of the formaldehyde with one of an annular ether compound of Formula 3 and an annular formal compound of Formula 4.
- n and m are integers from about 2 to about 6, respectively.
- comonomers used for the random copolymerization there are ethylene oxide, propylene oxide, butylene oxide, and phenylene oxide as the annular ether compounds and 1,3-dioxolane, diethylene glycol formal, 1,3-propandiol formal, 1,4- butandiol formal, 1,3-dioxepan formal, and 1,3,6-trioxocane as the annular formal compounds.
- the comonomers may be at least one selected from a comonomer group consisting of ethylene oxide, 1,3-dioxolane, and 1,4 butandiol formal.
- Oxymethylene copolymers with a melting point more than 15O 0 C and having more than two bond carbon atoms in a main-chain may be obtained by randomly polymerizing the comonomers with one of the trioxane and the formaldehyde, which is a main comonomer, under an atmosphere of Lewis acid catalyst.
- the oxymethylene copolymer is provided with a molar ratio of an oxymethylene bonding structure to the oxymethylene repeat unit is from 0.05 to 50, particularly, from 0.1 to 20.
- 10-hydroxyacetphenol as a polymerization catalyst used for polymerization of the oxymethylene polymer.
- Et indicates an ethyl group
- Bu indicates a butyl group.
- BF -Et and BF -Bu may be used.
- An amount of the polymerization catalyst may be within a range from 2x10 to 2x10 with respect to one trioxane mole.
- the polymerization may be performed in the form of one of bulk polymerization, suspension polymerization, and solution polymerization.
- a reaction temperature may be from 0 to 100 0 C, particularly, from 20 to 8O 0 C.
- third amines such as triethylamine, sulfur compounds such as thiophene, phosphorus compounds such as triphenylphosphine, and alkylated melamine compounds, which are Lewis bases having a Lewis electron pair having a lone electron pair and form catalysts and complex salt, as an agent forcing catalysts residual after the polymerization, to be inactive.
- one of alkylated phenol and ethers may be as a chain transferring agent.
- alkylethers such as dimethoxymethane may be used as the chain transferring agent.
- contents of the polyoxymethylene resin may be from about 50.0 to 90.0 percent by weight.
- contents of the polyoxymethylene resin may be from about 50.0 to 90.0 percent by weight.
- contents of the polyoxymethylene resin may be from about 50.0 to 90.0 percent by weight.
- 90.0 percent by weight it is impossible to obtain an anti-static function of a desired level.
- less than 50.0 percent by weight not only there is no more effect of an additional increase of the antistatic function but also properties of polyoxymethylene resins are deteriorated.
- the polyoxymethylene resin composition according to an exemplary embodiment of the present invention employs polyetheresteramide resins as a permanent anti-static agent.
- the polyetheresteramide resins may be formed by linearly bonding polyether blocks and poly amide blocks by ester linkages.
- the polyether blocks may be derived from a polyalkylene glycol of the formula
- R is one of hydrogen and an alkyl group containing from 1 to 4 carbon atoms
- x is an integer from 0 to about 8
- y is a large whole number such that a molecular weight of the polyether block is between 300 and 10,000.
- the polyamide blocks may correspond to the formula
- R is one of hydrogen ad an alkyl radical containing from 1 to 18 carbon atoms
- B is a radical derived from dimmer acid and containing from 30 to about 50 carbon atoms
- A is a radical derived from the diamine
- z is an integer from about 1 to about 20.
- the radical derived from the diamine may be selected from a group consisting of alkyl diamines containing from 2 to 54 carbon atoms, aryl diamines, alicyclic diamines wherein a ring system contains 4 to 8 carbon atoms and is substitutable with at least one alkyl groups containing 1 to 8 carbon atoms, and heterocyclic diamines selected from a group consisting of piperazine and 2,5-dimethyl piperazine.
- Terminal hydroxyl groups existing in the poly alkylene glycol is reacted with a carboxyl group of the polyamide blocks to be linearly bonded with ester linkages, thereby forming the polyetheresteramide that is a block copolymer.
- the polyether block may be from about 10 to 75 percent by weight of the copolymer and from about 10.0 to 50.0 percent by weight of polyetheresteramide composition may be provided with a theoretical amide: ester ratio between 0.5: 1 and 25: 1.
- the polyetheresteramide, the permanent anti-static agent includes from about 10.0 to 50.0 percent by weight of the polyoxymethylene resin composition. When including less than 10.0 percent, it is impossible to obtain the anti-static function of a desired level. When including more than 50.0 percent, not only there is no more effect of an additional increase of the anti- static function but also properties of polyoxymethylene resins are deteriorated.
- the polyoxymethylene resin composition may further include additional such as a heat-stabilizer and an antioxidant.
- antioxidants capable of being used for the polyoxymethylene resin composition there are hindered phenolic compounds, for instance, 2,2'-methylenebis(4-methyl-6-tert-butylphenol), hexamethylene glycol- bis(3,5-di-t-butyl-4-hydroxyhydrocinnamate), tetrakis[methylene(3,5-di-t-butyl-4-hydroxyhydrocinnamate)]methane, Methylene glycol-bis-3-(3-t-butyl-4-hydroxy-5-methylphenyl)propionate, l,3,5-Trimethyl-2,4,6- tris(3,5-di-tert-butyl-4-hydroxybenzyl)benzene, n-octadecyl-3(4-hydroxy-3', 5'-di-t-butylphenyl)propionate, 4,4'-methylenebis(2,6-di-t-butylphenol), 4,4'-methylenebis(2,6-
- the antioxidant may be selected from a group consisting of triethylene glycol- bis-3-(3-t-butyl-4-hydroxy-5-methylphenyl)propionate, l,6-hexane-diol-bis-3-(3,5-di-t-butyl-4-hydroxy-phenyl) propionate, and tetrakis [methylene (3,5-di-t-butyl-4-hydroxy-hydrocinnamate)]methane.
- triethylene glycol-bis-3-(3-t-butyl-4-hydroxy-5-methylphenyl)propionate is most suitable.
- an antioxidant content corresponds to from about 0.01 to 1.0 percent by weight based on a sum of the polyoxymethylene resin and the polyetheresteramide resin, and more particularly, may be from about 0.1 to 0.5 percent by weight.
- the heat stabilizer reacts with formaldehyde and increases heat stability of the polyoxymethylene polymers.
- the heat stabilizer may be selected from a group consisting of nitrogen compounds, for instance, 6-phenyl- 1 ,3,5-triazine-2,4(benzoguanamine),
- 2,4, 6-Triamino-l,3,5-triazine and 1,12-dodecan dicarboxylic acid dihydrazide may be more suitable for the heat stabilizer.
- a heat stabilizer content corresponds to from about 0.01 to 1.0 percent by weight with respect to 100 percent by weight of the polyoxymethylene resin and the polyetheresteramide resin, and more particularly, may be from about 0.1 to 0.5 percent by weight.
- the permanent anti-static polyoxymethylene resin composition may be used in fields where the anti-static function is required, in detail, electrical-electronic fields, particularly, plastic parts used for lines for producing LCDs and semiconductors.
- polyoxymethylene resins, polyetheresteramide resins, and additional additives were fused and milled by a 2-axis extruder, and melts extruded from a die of the 2-axis extruder were cooled down by using a cooling tank and manufactured in the form of a pellet.
- An injection molding was manufactured by using the polyoxymethylene composition manufactured as described above by an injector.
- Izod impact strength was notched. A high notched value indicates that the Izod impact is excellent, and a low notched value indicates that the Izod impact is bad.
- FIG. 1 a sample with an outer diameter of 25.6 mm, an inner diameter of 20.0 mm, and a height of 15 mm was injection-molded, fixed, and underwent a test with a driving condition of a pressure load of 100 N and a linear velocity of 500 mm/s, for 100 minutes.
- the nonabrasive amount was calculated by using a following equation to estimate abrasion properties.
- POM polyetheresteramide resin produced by Ciber Company, named as Irgastat P20, 1,12-dodecane dicarboxylic acid dihydrazide as a heat stabilizer, and triethylene glycol-bis-3(3-tert-butyl-4-hydroxy-5-methylphenyl)propionate as an antioxidant, produced by Ciba-Geigy Ltd., named as Irganox245, were added by weight percent shown in Table 1.
- a composition was fused and milled by a 2-axis extruder, and melts extruded from a die of the 2-axis extruder were cooled down by using a cooling tank and manufactured in the form of a pellet to measure physical properties.
- thermoplastic resin composition in which polyetheresteramide resins are added to polyoxymethylene resins as a permanent anti-static agent, thereby obtaining a permanent anti-static function, maintaining an abrasion resistance, and having an excellent impact strength to be easily applied to all kinds of electrical-electronic parts.
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Abstract
There is provided a permanent anti-static polyoxymethylene resin composition including from about 50-90.0 percent by weight of polyoxymethylene; and from about 10.0 to 50.0 percent by weight of polyetheresteramide including polyether and polyamide blocks being linearly bonded with ester linkages and having a theoretical amide: ester ratio between 0.5: 1 and 25: 1 with the polyether blocks including about 10 to 75 percent by weight of the polyetheresteramide composition.
Description
Description
PERMANENT ANTI-STATIC POLYOXYMETHYLENE RESIN
COMPOSITION
Technical Field
[1] The present invention relates to polyoxymethylene resins with a permanent antistatic function, and more particularly, to a permanent anti-static agent maintaining a peculiar abrasion resistance of polyoxymethylene and providing a permanent antistatic function and a polyoxymethylene resin including the permanent anti-static agent.
[2]
Background Art
[3] Recently, sizes of electrical and electronic engineering markets have been increased and technologies in the field of electrical and electronic engineering have been improved. Particularly, a production yield improvement of producing LCDs and semiconductors has been gradually considered as very important. In a procedure of manufacturing LCDs and semiconductors, static, electric sparks, and dust pollution cause a decrease of the production yield and an occurrence of defects of products.
[4]
[5] Generally, due to a high surface resistivity, a plastic is widely used as an insulating material for electric-electronic parts. However, the high surface resistivity is not free from static, electric sparks, and dust pollution. Accordingly, materials having an antistatic function are used for preventing malfunctions of circuits and pollution of electronic parts, caused by the static, electric sparks, and dust pollution.
[6]
[7] In general, to obtain the anti-static function, surfactants, conductive carbon blacks, and metal meshes are used for reducing the surface resistivity. However, though resin compositions with desired surface resistivities may be manufactured by adding one of conductive carbon blacks and metal meshes, secondary pollutants may be generated by an occurrence of abrasion due to usage of the resin composition.
[8]
[9] Also, a method of using surfactants, in which surfactants move to a surface of plastic and are bonded with moisture in the air, thereby providing an anti-static function, may cause deterioration of the anti-static function due to peripheral environments and a period of using surfactants. Particularly, due to continuous moving of surfactants toward the surface of the plastic, the longer the period of using surfactants, the more deteriorated the anti-static function.
[11] To solve the problems, methods of giving a permanent anti- static function by using polyamide elastomers are disclosed in Korean Patent No. 0300273 and U.S. Patent No. 5986041, respectively. Therefore, several plastic resins with the permanent anti-static function are used. Due to secondary contaminations caused by abrasion of plastic, resins with an excellent abrasion resistance, such as polyacetal and polyetheretherketone (PEEK), are provided for components requiring excellent abrasion resistance. However, there is a restriction on using the PEEK, due to a high price. Since permanent anti-static agents manufactured from the Patents have low compatibility with polyacetals, formaldehydes are severely emitted at a level of weight percent of the permanent anti-static agent, for obtaining a desired anti-static function. Therefore, injection molding is impossible.
[12]
Disclosure of Invention Technical Problem
[13] An aspect of the present invention provides a polyoxymethylene resin composition including a permanent anti-static agent having compatibility with polyoxymethylene, maintaining a peculiar abrasion resistance of the polyoxymethylene, and giving a permanent anti-static function to the polyoxymethylene.
[14]
Technical Solution
[15] According to an aspect of the present invention, there is provided a permanent antistatic polyoxymethylene resin composition including: from about 50-90.0 percent by weight of polyoxymethylene; and from about 10.0 to 50.0 percent by weight of polyetheresteramide including polyether blocks derived from a polyalkylene glycol of the formula
[16]
[17] wherein R is one of hydrogen and an alkyl group containing from 1 to 4 carbon atoms, x is an integer from 0 to about 8 and y is a large whole number such that a molecular weight of the polyether block is between 300 and 10,000 and polyamide blocks of the molecular weight up to about 10,000 obtained by a reaction of a dimmer acid obtained by a polymerization of an ethylenically unsaturated C to C mono- carboxylic acid with a diamine selected from a group consisting of alkyl diamines containing from 2 to 54 carbon atoms, aryl diamines, alicyclic diamines wherein a ring
system contains 4 to 8 carbon atoms and is substitutable with at least one alkyl groups containing 1 to 8 carbon atoms, and heterocyclic diamines selected from a group consisting of piperazine and 2,5-dimethyl piperazine, the polyamide blocks corresponding to the formula
[18]
[19] wherein R is one of hydrogen ad an alkyl radical containing from 1 to 18 carbon atoms, B is a radical derived from dimmer acid and containing from 30 to about 50 carbon atoms, A is a radical derived from the diamine, and z is an integer from about 1 to about 20, the polyether and polyamide blocks being linearly bonded with ester linkages and having a theoretical amide: ester ratio between 0.5: 1 and 25: 1 with the polyether blocks including about 10 to 75 percent by weight of the polyetheresteramide composition.
[20]
Brief Description of the Drawings
[21] FIG. 1 is a perspective view illustrating an injection-molded sample for measuring a nonabrasive amount in an example. [22]
Best Mode for Carrying Out the Invention
[23] According to an aspect of the present invention, there is provided a permanent antistatic polyoxymethylene resin composition including: about 50-90.0 percent by weight of polyoxymethylene; and about 10.0 to 50.0 percent by weight of polyetheresteramide including polyether blocks derived from a polyalkylene glycol of the formula
[24]
[25] [26] wherein R is one of hydrogen and an alkyl group containing from 1 to 4 carbon atoms, x is an integer from 0 to about 8 and y is a large whole number such that a molecular weight of the polyether block is between 300 and 10,000 and polyamide blocks of the molecular weight up to about 10,000 obtained by a reaction of a dimmer acid obtained by a polymerization of an ethylenically unsaturated C to C mono-
carboxylic acid with a diamine selected from a group consisting of alkyl diamines containing from 2 to 54 carbon atoms, aryl diamines, alicyclic diamines wherein a ring system contains 4 to 8 carbon atoms and is substitutable with at least one alkyl groups containing 1 to 8 carbon atoms, and heterocyclic diamines selected from a group consisting of piperazine and 2,5-dimethyl piperazine, the polyamide blocks corresponding to the formula [27]
[28] wherein R is one of hydrogen ad an alkyl radical containing from 1 to 18 carbon atoms, B is a radical derived from dimmer acid and containing from 30 to about 50 carbon atoms, A is a radical derived from the diamine, and z is an integer from about 1 to about 20, the polyether and polyamide blocks being linearly bonded with ester linkages and having a theoretical amide: ester ratio between 0.5: 1 and 25: 1 with the polyether blocks including about 10 to 75 percent by weight of the polyetheresteramide composition.
[29]
Mode for the Invention
[30] Hereinafter, the present invention will be described in detail.
[31] A permanent anti-static polyoxymethylene resin composition includes a poly- oxymethylene resin and a polyetheresteramide resin.
[32] The polyoxymethylene resin is one of a homopolymer of an oxymethylene repeat unit of Formula 1 and a oxymethylene copolymer in which the unit of Formula 1 and a unit of Formula 2 are randomly bonded with each other,
[33]
-(-CH2O-)-
... Formula (1) [34]
- [-(CXiXs)XO-]-
... Formula (2), [35] wherein each of X and X is one of hydrogen, an alkyl group, and an aryl group,
the X and X corresponding to one of a case of being identical with each other and a case of being different from each other, at least one of the X and X is not the hydrogen, and x is an integer from about 2 to about 6. An average molecular weight of the polyoxymethylene resin according to an exemplary embodiment of the present invention may be from about 10,000 to about 200,000.
[36]
[37] The oxymethylene homopolymer may be manufactured by polymerizing one of formaldehyde and an annular oligomer of the formaldehyde, namely, trioxane. The oxymethylene copolymer in which the unit of Formula 1 and the unit of Formula 2 are bonded with each other may be obtained by randomly polymerizing one of formaldehyde and an annular oligomer of the formaldehyde with one of an annular ether compound of Formula 3 and an annular formal compound of Formula 4.
[38]
[39]
... Formula (4) [40] wherein X , X , X , and X are one of hydrogen and an alkyl group, the X , X , X ,
3 4 5 6 3 4 5 and X corresponding to one of a case of being identical with each other and a case of
6 being different from each other, may be bonded with one of an identical carbon atom and different carbon atom, and n and m are integers from about 2 to about 6, respectively.
[41]
[42] In comonomers used for the random copolymerization, there are ethylene oxide,
propylene oxide, butylene oxide, and phenylene oxide as the annular ether compounds and 1,3-dioxolane, diethylene glycol formal, 1,3-propandiol formal, 1,4- butandiol formal, 1,3-dioxepan formal, and 1,3,6-trioxocane as the annular formal compounds. The comonomers may be at least one selected from a comonomer group consisting of ethylene oxide, 1,3-dioxolane, and 1,4 butandiol formal. Oxymethylene copolymers with a melting point more than 15O0C and having more than two bond carbon atoms in a main-chain may be obtained by randomly polymerizing the comonomers with one of the trioxane and the formaldehyde, which is a main comonomer, under an atmosphere of Lewis acid catalyst.
[43]
[44] The oxymethylene copolymer is provided with a molar ratio of an oxymethylene bonding structure to the oxymethylene repeat unit is from 0.05 to 50, particularly, from 0.1 to 20.
[45] There are BF 3 -H 2 , BF3 -Et 2 , BF3 -Bu 2 , BF3 -CH3 CO2 H, BF3 -F3 HF, and PF 3 -
10-hydroxyacetphenol as a polymerization catalyst used for polymerization of the oxymethylene polymer. In this case, Et indicates an ethyl group and Bu indicates a butyl group. Particularly, BF -Et and BF -Bu may be used. An amount of the polymerization catalyst may be within a range from 2x10 to 2x10 with respect to one trioxane mole.
[46]
[47] The polymerization may be performed in the form of one of bulk polymerization, suspension polymerization, and solution polymerization. A reaction temperature may be from 0 to 1000C, particularly, from 20 to 8O0C.
[48] On the other hand, there are third amines such as triethylamine, sulfur compounds such as thiophene, phosphorus compounds such as triphenylphosphine, and alkylated melamine compounds, which are Lewis bases having a Lewis electron pair having a lone electron pair and form catalysts and complex salt, as an agent forcing catalysts residual after the polymerization, to be inactive.
[49]
[50] Also, during the polymerization of the polyoxymethylene, one of alkylated phenol and ethers may be as a chain transferring agent. Particularly, alkylethers such as dimethoxymethane may be used as the chain transferring agent.
[51] One of homopolymer and copolymer of polyoxymethylene with an average molecular weight from about 10,000 to 200,000 melted at more than approximately 16O0C with a degree of crystallinity if from about 65 to 85% is the most desired compound according to an exemplary embodiment of the present invention.
[52]
[53] In the present invention, contents of the polyoxymethylene resin may be from about
50.0 to 90.0 percent by weight. When more than 90.0 percent by weight, it is impossible to obtain an anti-static function of a desired level. When less than 50.0 percent by weight, not only there is no more effect of an additional increase of the antistatic function but also properties of polyoxymethylene resins are deteriorated.
[54] To obtain a permanent anti-static function of the polyoxymethylene resin, the polyoxymethylene resin composition according to an exemplary embodiment of the present invention employs polyetheresteramide resins as a permanent anti-static agent.
[55] The polyetheresteramide resins may be formed by linearly bonding polyether blocks and poly amide blocks by ester linkages.
[56] The polyether blocks may be derived from a polyalkylene glycol of the formula
[57]
[58] wherein R is one of hydrogen and an alkyl group containing from 1 to 4 carbon atoms, x is an integer from 0 to about 8 and y is a large whole number such that a molecular weight of the polyether block is between 300 and 10,000.
[59]
[60] The polyamide blocks may correspond to the formula
[61]
[62] wherein R is one of hydrogen ad an alkyl radical containing from 1 to 18 carbon atoms, B is a radical derived from dimmer acid and containing from 30 to about 50 carbon atoms, A is a radical derived from the diamine, and z is an integer from about 1 to about 20.
[63]
[64] The radical derived from the diamine may be selected from a group consisting of alkyl diamines containing from 2 to 54 carbon atoms, aryl diamines, alicyclic diamines wherein a ring system contains 4 to 8 carbon atoms and is substitutable with at least one alkyl groups containing 1 to 8 carbon atoms, and heterocyclic diamines selected from a group consisting of piperazine and 2,5-dimethyl piperazine.
[65] Terminal hydroxyl groups existing in the poly alkylene glycol is reacted with a carboxyl group of the polyamide blocks to be linearly bonded with ester linkages, thereby forming the polyetheresteramide that is a block copolymer.
[66]
[67] In this case, the polyether block may be from about 10 to 75 percent by weight of the copolymer and from about 10.0 to 50.0 percent by weight of polyetheresteramide composition may be provided with a theoretical amide: ester ratio between 0.5: 1 and 25: 1.
[68] The polyetheresteramide, the permanent anti-static agent, includes from about 10.0 to 50.0 percent by weight of the polyoxymethylene resin composition. When including less than 10.0 percent, it is impossible to obtain the anti-static function of a desired level. When including more than 50.0 percent, not only there is no more effect of an additional increase of the anti- static function but also properties of polyoxymethylene resins are deteriorated.
[69]
[70] The polyoxymethylene resin composition may further include additional such as a heat-stabilizer and an antioxidant.
[71] Though there is no particular restriction on antioxidants capable of being used for the polyoxymethylene resin composition, there are hindered phenolic compounds, for instance, 2,2'-methylenebis(4-methyl-6-tert-butylphenol), hexamethylene glycol- bis(3,5-di-t-butyl-4-hydroxyhydrocinnamate), tetrakis[methylene(3,5-di-t-butyl-4-hydroxyhydrocinnamate)]methane, Methylene glycol-bis-3-(3-t-butyl-4-hydroxy-5-methylphenyl)propionate, l,3,5-Trimethyl-2,4,6- tris(3,5-di-tert-butyl-4-hydroxybenzyl)benzene, n-octadecyl-3(4-hydroxy-3', 5'-di-t-butylphenyl)propionate, 4,4'-methylenebis(2,6-di-t-butylphenol), 4,4'-butylidene-bis(6-t-butyl-3-methyl-phenol), di-stearyl 3,5-di-t-butyl-4-hydroxybenzyl-phosphonate,
2-t-butyl-6-(3-t-butyl-5-methyl-2-hydroxybenzyl)-4-methylphenyl acrylate, 3,9-bis-(2-(3-(3-t-butyl-4-hydroxy-5-methylphenyl)propionyloxy)-l,l-dimethylethyl) 2,4,8, 10-tetraoxaspiro(5,5)undecane and hindered amino compounds, for instance, 4-acetoxy-2,2,6,6-tetramethylpiperidine, 4-stearoyloxy-2,2,6,6-tetramethyl piperidine, 4-acryloyloxy-2,2,6,6-tetramethyl piperidine, 4-methoxy-2,2,6,6-tetramethyl piperidine, 4-benzoyloxy-2,2,6,6-tetramethyl piperidine, 4-cyclohexyloxy-2,2,6,6-tetramethyl piperidine, 4-phenoxy-2,2,6,6-tetramethyl piperidine, 4-benzyloxy-2,2,6,6-tetramethyl piperidine, 4-(phenylcarbamoyoxy)-2,2,6,6-tetramethyl piperidine, bis(2,2,6,6-tetramethyl-4-piperidyl)oxalate, bis(2,2,6,6-tetramethyl-4-piperidyl)malonate, bis(2,2,6,6-tetramethyl-4-piperidyl)adipate, bis(2,2,6,6-tetramethyl-4-piperidyl)sebacate, bis(l,2,2,6,6-pentamethylpiperidyl)sebacate,
bis(2,2,6,6-tetramethyl-4-piperidyl)terephthalate, l,2-bis(2,2,6,6-tetramethyl-4-piperidyloxy)ethane, bis(2,2,6,6-tetramethyl-4-piperidyl)hexamethylene-l,6-dicarbamate, bis(l-methyl-2,2,6,6-tetramethyl-4-piperidyl)adipate, or tris(2,2,6,6-tetramethyl-4-piperidyl)benzene-l,3,5-tricarboxylate. The antioxidant may be selected from a group consisting of triethylene glycol- bis-3-(3-t-butyl-4-hydroxy-5-methylphenyl)propionate, l,6-hexane-diol-bis-3-(3,5-di-t-butyl-4-hydroxy-phenyl) propionate, and tetrakis [methylene (3,5-di-t-butyl-4-hydroxy-hydrocinnamate)]methane. Particularly, triethylene glycol-bis-3-(3-t-butyl-4-hydroxy-5-methylphenyl)propionate is most suitable.
[72] Also, an antioxidant content corresponds to from about 0.01 to 1.0 percent by weight based on a sum of the polyoxymethylene resin and the polyetheresteramide resin, and more particularly, may be from about 0.1 to 0.5 percent by weight.
[73]
[74] Also, the heat stabilizer reacts with formaldehyde and increases heat stability of the polyoxymethylene polymers. Though there is no restriction on the heat stabilizer, the heat stabilizer may be selected from a group consisting of nitrogen compounds, for instance, 6-phenyl- 1 ,3,5-triazine-2,4(benzoguanamine),
2,4,6-triamino- 1 ,3,5-triazine(melamine), carbonyldiamide(urea), dicyandiamide, isophthalic dihydrazide (hydrazine) and alcohols, for instance, poly ethylenegly col, ethylene-vinylalcohol copolymer, sorbitol, sorbitan, etc. Particularly, 2,4, 6-Triamino-l,3,5-triazine and 1,12-dodecan dicarboxylic acid dihydrazide may be more suitable for the heat stabilizer.
[75]
[76] A heat stabilizer content corresponds to from about 0.01 to 1.0 percent by weight with respect to 100 percent by weight of the polyoxymethylene resin and the polyetheresteramide resin, and more particularly, may be from about 0.1 to 0.5 percent by weight.
[77] The permanent anti-static polyoxymethylene resin composition may be used in fields where the anti-static function is required, in detail, electrical-electronic fields, particularly, plastic parts used for lines for producing LCDs and semiconductors.
[78]
[79] Examples
[80] Hereinafter, though the present invention will be described in detail with reference to following examples, the present invention will not be limited the examples.
[81] In the example, polyoxymethylene resins, polyetheresteramide resins, and additional additives were fused and milled by a 2-axis extruder, and melts extruded
from a die of the 2-axis extruder were cooled down by using a cooling tank and manufactured in the form of a pellet. An injection molding was manufactured by using the polyoxymethylene composition manufactured as described above by an injector.
[82]
[83] Physical properties of compositions shown in following examples and comparative examples are defined as follows.
[84] 1. Izod Impact Strength
[85] Based on ASTM D256 method, Izod impact strength was notched. A high notched value indicates that the Izod impact is excellent, and a low notched value indicates that the Izod impact is bad.
[86] 2. Tensile Strength
[87] Based on ASTM D638 method, a tensile strength was measured. A high measured value indicates that the tensile strength is excellent, and a low measured value indicates that the tensile strength is bad.
[88] 3. Surface Resistivity
[89] Based on ASTM D257 method, a surface resistivity was measured. A high measured value indicates insulating properties, and a low measured value indicates conductivity.
[90] 4. Abrasion Resistance
[91] Based on JIS K7218 method, a nonabrasive amount was measured. Referring to
FIG. 1, a sample with an outer diameter of 25.6 mm, an inner diameter of 20.0 mm, and a height of 15 mm was injection-molded, fixed, and underwent a test with a driving condition of a pressure load of 100 N and a linear velocity of 500 mm/s, for 100 minutes. In this case, the nonabrasive amount was calculated by using a following equation to estimate abrasion properties.
[92]
[93] Nonabrasive Amount =
[94] Abrasive Weight(D)/{Density(D/D)xPressure Load(N)xRun Length(D)}
[95] wherein a thrust type friction- abrasion tester was used as a test apparatus.
[96]
[97] Examples 1 to 5
[98] To polyoxymethylene copolymer resins produced by Korea Engineering Plastics
Co., Ltd, named as KEPITAL F 10-02, MI=3g/10 minutes (hereinafter, referred to as POM), polyetheresteramide resin produced by Ciber Company, named as Irgastat P20, 1,12-dodecane dicarboxylic acid dihydrazide as a heat stabilizer, and triethylene glycol-bis-3(3-tert-butyl-4-hydroxy-5-methylphenyl)propionate as an antioxidant, produced by Ciba-Geigy Ltd., named as Irganox245, were added by weight percent shown in Table 1. A composition was fused and milled by a 2-axis extruder, and melts
extruded from a die of the 2-axis extruder were cooled down by using a cooling tank and manufactured in the form of a pellet to measure physical properties.
[99] Physical properties of samples manufactured in respective examples 1 through 5 were shown in Table 1.
[100] [101] Comparative Example 1 [102] Polyetheresteramide resins were not added to POM resins, and a heat stabilizer and an antioxidant were added by weight percent shown in Table 1. A sample was manufactured by using the same method of the examples except weight percent of a composition.
[103] Physical properties of the sample manufactured in the comparative example 1 were shown in Table 1.
[104] [105] Comparative Examples 2 and 3 [106] To POM resins, polyetheresteramide resin produced by Ciber Company, named as Irgastat P20, 1,12-dodecane dicarboxylic acid dihydrazide as a heat stabilizer, and triethylene glycol-bis-3(3-tert-butyl-4-hydroxy-5-methylphenyl)propionate as an antioxidant, produced by Ciba-Geigy Ltd., named as Irganox245, were added by weight percent shown in Table 1. A sample was manufactured by using the same method of the example except weight percent of a composition.
[107] Physical properties of the samples manufactured in the comparative examples 2 and 3 were shown in Table 1.
[108] [109] Table 1
[HO] [111] wherein Exa. is an abbreviation of example, Comp. is an abbreviation of comparative, PEEA is an abbreviation of Polyetheresteramide, DDD is an abbreviation of 1,12-dodecane dicarboxylic acid dihydrazide, and TBHMP is an abbreviation of triethylene glycol-bis-3(3-tert-butyl-4-hydroxy-5-methylphenyl)propionate, Stren. is an abbreviation of strength, Resis. is an abbreviation of resistivity, and Nonab. is an abbreviation of nonabrasive.
[112] •;*:• Weight percents of 1,12-dodecane dicarboxylic acid dihydrazide and triethylene glycol-bis-3(3-tert-butyl-4-hydroxy-5-methylphenyl)propionate are additional weight percent with respect to 100 percent by weight of the polyoxymethylene resins and polyetheresteramide resins.
[113] [114] As shown in Table 1, when the polyetheresteramide was used as a permanent antistatic agent for the polyoxymethylene copolymer resins, abrasion resistance was kept with a permanent anti-static function and an excellent impact resistance. On the other hand, when the polyetheresteramide was not used as the case of comparative example 1, a tensile strength was excellent but an anti-static function and impact resistance were deteriorated. Also, when the polyetheresteramide includes less than about 10.0 percent by weight, it is impossible to obtain a desired anti-static function. When the polyetheresteramide includes more than about 50.0 percent by weight, not only there is no more effect of an additional increase of the anti-static function but also properties of polyoxymethylene resins are deteriorated.
[115]
Industrial Applicability [116] According to an exemplary embodiment of the present invention, there is provided a thermoplastic resin composition in which polyetheresteramide resins are added to
polyoxymethylene resins as a permanent anti-static agent, thereby obtaining a permanent anti-static function, maintaining an abrasion resistance, and having an excellent impact strength to be easily applied to all kinds of electrical-electronic parts.
Claims
[1] A permanent anti-static polyoxymethylene resin composition comprising: about 50.0-90.0 percent by weight of polyoxymethylene; and about 10.0 to 50.0 percent by weight of polyetheresteramide comprising polyether blocks derived from a polyalkylene glycol of the formula
wherein R is one of hydrogen and an alkyl group containing from 1 to 4 carbon atoms, x is an integer from 0 to about 8 and y is a large whole number such that a molecular weight of the polyether block is between 300 and 10,000 and poly amide blocks of the molecular weight up to about 10,000 obtained by a reaction of a dimmer acid obtained by a polymerization of an ethylenically unsaturated C 16 to C 26 monocarboxy J lic acid with a diamine selected from a g orourp consisting of alkyl diamines containing from 2 to 54 carbon atoms, aryl diamines, alicyclic diamines wherein a ring system contains 4 to 8 carbon atoms and is substitutable with at least one alkyl groups containing 1 to 8 carbon atoms, and heterocyclic diamines selected from a group consisting of piperazine and 2,5-dimethyl piperazine, the polyamide blocks corresponding to the formula
HOOC-B- OH
wherein R is one of hydrogen ad an alkyl radical containing from 1 to 18 carbon atoms, B is a radical derived from dimmer acid and containing from 30 to about 50 carbon atoms, A is a radical derived from the diamine, and z is an integer from about 1 to about 20, the polyether and polyamide blocks being linearly bonded with ester linkages and having a theoretical amide: ester ratio between 0.5: 1 and 25: 1 with the polyether blocks comprising about 10 to 75 percent by weight of the polyetheresteramide composition.
[2] The resin composition of claim 1, further comprising: about 0.01 to 1.0 percent by weight of an antioxidant; and about 0.01 to 1.0 percent by weight of a heat stabilizer.
[3] The resin composition of claim 1, wherein the polyoxymethylene resin with an average molecular weight from about 10,000 to about 200,000 is one of a ho- mopolymer of an oxymethylene repeat unit of Formula (1) and a oxymethylene
copolymer in which the repeat unit of Formula (1) and a unit of Formula (2) are randomly bonded with each other,
-(-CH2O-)-
. Formula (1)
- [-(CXiXz)XO-] -
... Formula (2), wherein each of X 1 and X is one of hydrogen, an alkyl group, and an aryl group, the X and X corresponding to one of a case of being identical with each other and a case of being different from each other, at least one of the X and X is not the hydrogen, and x is an integer from about 2 to about 6.
[4] The resin composition of claim 2, wherein the antioxidant is at least one selected from a group consisting of Methylene glycol- bis-3(3-tert-butyl-4-hydroxy-5-methylphenyl)propionate, 1 ,6-hexane-diol-bis-3-(3,5-di-t-butyl-4-hydroxy-phenyl)propionate, and tetrakis [methylene(3,5-di-t-butyl-4-hydroxy-hydrocinnamate)] methane.
[5] The resin composition of claim 2, wherein the heat stabilizer is at least one selected from a group consisting of 2,4,6-triamino-l,3,5-triazine and 1,12-dodecan dicarboxylic acid dihydrazide.
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KR10-2006-0033697 | 2006-04-13 | ||
KR1020060033697A KR20070102052A (en) | 2006-04-13 | 2006-04-13 | Permanent anti-static polyoxymethylene resin composition |
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PCT/KR2007/001800 WO2007119972A1 (en) | 2006-04-13 | 2007-04-13 | Permanent anti-static polyoxymethylene resin composition |
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KR (1) | KR20070102052A (en) |
TW (1) | TW200745252A (en) |
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Cited By (1)
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CN112745632A (en) * | 2020-12-15 | 2021-05-04 | 金发科技股份有限公司 | Antistatic toughened POM composition and preparation method and application thereof |
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KR19980024827A (en) * | 1996-09-16 | 1998-07-06 | 베레나 스펭글러 | Antistatic composition |
US20030130419A1 (en) * | 2001-10-16 | 2003-07-10 | Armentrout Rodney Scott | Inherently electrostatic dissipating block copolymer compositions |
JP2004010803A (en) * | 2002-06-10 | 2004-01-15 | Asahi Kasei Corp | Electroconductive polyoxymethylene resin composition |
US20040176537A1 (en) * | 2001-10-16 | 2004-09-09 | Armentrout Rodney Scott | Inherently electrostatic dissipating block copolymer compositions |
US6930145B2 (en) * | 2000-12-26 | 2005-08-16 | Asahi Kasei Kabushiki Kaisha | Polyoxymethylene resin composition and molded articles made therefrom |
KR20060094148A (en) * | 2005-02-23 | 2006-08-29 | 산요가세이고교 가부시키가이샤 | Antistatic resin composition |
-
2006
- 2006-04-13 KR KR1020060033697A patent/KR20070102052A/en not_active Application Discontinuation
-
2007
- 2007-04-13 TW TW096112976A patent/TW200745252A/en unknown
- 2007-04-13 WO PCT/KR2007/001800 patent/WO2007119972A1/en active Application Filing
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19980024827A (en) * | 1996-09-16 | 1998-07-06 | 베레나 스펭글러 | Antistatic composition |
US6930145B2 (en) * | 2000-12-26 | 2005-08-16 | Asahi Kasei Kabushiki Kaisha | Polyoxymethylene resin composition and molded articles made therefrom |
US20030130419A1 (en) * | 2001-10-16 | 2003-07-10 | Armentrout Rodney Scott | Inherently electrostatic dissipating block copolymer compositions |
US20040176537A1 (en) * | 2001-10-16 | 2004-09-09 | Armentrout Rodney Scott | Inherently electrostatic dissipating block copolymer compositions |
JP2004010803A (en) * | 2002-06-10 | 2004-01-15 | Asahi Kasei Corp | Electroconductive polyoxymethylene resin composition |
KR20060094148A (en) * | 2005-02-23 | 2006-08-29 | 산요가세이고교 가부시키가이샤 | Antistatic resin composition |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112745632A (en) * | 2020-12-15 | 2021-05-04 | 金发科技股份有限公司 | Antistatic toughened POM composition and preparation method and application thereof |
CN112745632B (en) * | 2020-12-15 | 2022-03-01 | 金发科技股份有限公司 | Antistatic toughened POM composition and preparation method and application thereof |
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KR20070102052A (en) | 2007-10-18 |
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