WO2007083001A1 - A test apparatus and a method for testing an apparatus - Google Patents

A test apparatus and a method for testing an apparatus Download PDF

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Publication number
WO2007083001A1
WO2007083001A1 PCT/FI2007/050036 FI2007050036W WO2007083001A1 WO 2007083001 A1 WO2007083001 A1 WO 2007083001A1 FI 2007050036 W FI2007050036 W FI 2007050036W WO 2007083001 A1 WO2007083001 A1 WO 2007083001A1
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WO
WIPO (PCT)
Prior art keywords
target device
test apparatus
testing
data
test
Prior art date
Application number
PCT/FI2007/050036
Other languages
English (en)
French (fr)
Inventor
Mika Pollari
Original Assignee
Mika Pollari
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mika Pollari filed Critical Mika Pollari
Publication of WO2007083001A1 publication Critical patent/WO2007083001A1/en

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Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Definitions

  • the present invention relates to a test apparatus comprising connection means for coupling the test apparatus to a device to be tested, as well as analyzing means.
  • the invention also relates to a method for testing a device to be tested with a test apparatus comprising connection means for coupling the test apparatus to the device to be tested, and analyzing means.
  • the invention relates to a system for testing a target device with the test apparatus.
  • the testing of the functionality of data processing devices, such as computers, by arrangements of prior art is cumbersome and may fail if the device to be tested is not in good working order.
  • One possibility is to try to replace one part of the unserviceable device at a time and then to see if the device functions.
  • Such an arrangement is cumbersome and slow and is not even possible in all situations.
  • the defect is, for example, in the software, the replacement of different parts does not necessarily solve the problem.
  • Testing arrangements are also known, in which the housing of the target device is opened, the processor is detached from the control block of the target device and is replaced with a test connector of the test apparatus.
  • the test apparatus comprises emulation means for emulating the operation of the processor, and in this way, information is obtained about the operating condition of the different functional blocks of the target device.
  • this arrangement is difficult and requires that the housing of the target device is opened and the processor is removed. This involves the risk of damaging the processor or other electronics of the target device due to e.g. static electricity.
  • a testing system is also known in which an interface card communicating with the test apparatus is connected to an expansion card interface in a so- called mother board inside the housing of the target device. It is thus possible to monitor the status data of the expansion bus and in this way to try to determine the operating condition of the target device and its functional blocks.
  • Such an arrangement is disclosed, for example, in US patent 6,754,844, in which the function of the target device can be monitored over a data network when an expansion card developed for this purpose is installed in the target device. Also this arrangement typically requires that the housing of the target device is opened and an expansion card is connected to the expansion card interface.
  • test apparatus attempts to assume control over the device to be tested as soon as possible after turning on the device to be tested, and to perform testing operations. Furthermore, the test apparatus collects and, if necessary, reports on functional data on different components of the device to be tested. More precisely, the test apparatus according to the present invention is primarily characterized in what will be presented in the characterizing part of the appended claim 1. The method according to the present invention is primarily characterized in what will be presented in the characterizing part of the appended claim 8. Further, the system according to the present invention is primarily characterized in what will be presented in the characterizing part of the appended claim 16.
  • the present invention shows remarkable advantages over solutions of prior art.
  • the test apparatus according to the invention can also be used for testing such data processing devices, which involve problems already when they are turned on. Furthermore, the test apparatus makes it possible to collect and report on information about the function of the components of the target device, to collect and report on information about the compatibility of the components of the target device, to collect and report on information on the function of the software library used by the target device, and also to collect and report on information about the compatibility of the software library used by the target device with the components.
  • the test apparatus can also be used for running virus scans in the target device, for restarting the target device, as well as for fixing and updating instruction devices of the target device.
  • FIG. 1 illustrates a testing arrangement with a test apparatus according to an embodiment of the invention
  • Fig. 2a shows functional blocks of a test apparatus according to an embodiment of the invention in a reduced block chart /
  • Fig. 2b shows functional blocks of a target device in a reduced block chart
  • Fig. 3 is a flow chart illustrating the booting of a target device upon applying the method according to a preferred embodiment of the invention
  • Fig. 4 illustrates, in a reduced manner, the boot software of a device to be tested, provided with a modification required for coupling the test apparatus according to the invention
  • Fig. 5 shows the operation of the test apparatus according to a preferred embodiment of the invention in a reduced flow chart.
  • the system comprises a device to be tested, i.e. the target device 2 that is tested with the test apparatus 1.
  • the test apparatus 1 it is possible to use a data processing device having connection means 1.6 for data transmission between the test apparatus 1 and the target device 2.
  • the connection means 1.6 comprise communication means for wired and/or wireless data transmission, for example a transceiver 1.61.
  • the target device 2 also comprises connection means 2.6 for data transmission from the test apparatus 1 to the target device 2 and from the target device 2 to the test apparatus 1 , respectively.
  • the test apparatus 1 and the target device 2 may not necessarily comprise all the same communication means but, for example, the test apparatus 1 may comprise several different communication means, wherein each time such communication means are selected for use that are compatible with one data transmission method in the target device 2.
  • wireless data transmission methods examples include low power radio frequency (LPRF) data transmission, infrared data transmission, such as optical data transmission according to the IrDA standard, and inductive data transmissionc Wired data transmission methods, in turn, which should be mentioned as non-restrictive examples in this context, include serial data transmission according to the RS-232 standard, data transmission according to the USB standard, data transmission applying the CAN bus, and data transmission according to the I 2 C standard.
  • LPRF low power radio frequency
  • infrared data transmission such as optical data transmission according to the IrDA standard
  • inductive data transmissionc Wired data transmission methods in turn, which should be mentioned as non-restrictive examples in this context, include serial data transmission according to the RS-232 standard, data transmission according to the USB standard, data transmission applying the CAN bus, and data transmission according to the I 2 C standard.
  • the test apparatus 1 comprises a control block 1.1 which primarily controls the operation of the test apparatus 1 e.g. in connection with testing.
  • the control block 1.1 preferably comprises a processor, such as a microprocessor CPU.
  • the control block 1.1 may also comprise more than one processor so that it is always possible, for example, to select a processor that substantially matches with the processor 2.1 used in the target device 2.
  • the compatibility of the program code may be better than when different processors are used.
  • at least partly the same program code may be used in the test apparatus 1 as is used in the target device 2.
  • the test apparatus 1 also comprises memories 1.4, 1.5.
  • the memory 1.4 is preferably a semiconductor memory for storing software 1.41 and data 1.42 required during the use of the test apparatus 1.
  • the mass memory 1.5 is, for example, a fixed disk, a flash memory card and/or another corresponding memory that is suitable for storing e.g. information of various databases, for storing software (not during the running), etc.
  • the software required during the use of the test apparatus 1 can be downloaded from the mass memory 1.5 into the semiconductor memory 1.4 for example at the stage when the running of the program in the test apparatus 1 is to be started.
  • the database 1.51 can also be transferred from the mass memory 1.5 into the semiconductor memory 1.4, or the database 1.51 can be read and written directly from/into the mass memory 1.51 , if the reading/writing rate is sufficient for this purpose.
  • the test apparatus 1 also comprises a keypad 1.3 for operations by the user, such as entering of data, commands etc. Keystrokes entered via the keypad
  • 1.3 can be detected and identified e.g. by a keypad controller 1.31 which converts the keystrokes, for example, to a code corresponding to the keystroke in a way known as such.
  • the keypad preferably comprises a single key, wherein the starting and stopping of the test function is performed by this single key. However, there may also be two or more keys, wherein one key may be used for starting and another key for stopping the test function.
  • the keypad can be implemented, for example, by means of a device operating on the contact principle, wherein the specification of the keypad may depend on the function to be performed each time.
  • a device operating on the contact principle is, for example, a touch sensitive film or the like which may be placed on top of a display. The display may thus be used for displaying the key functions.
  • the test apparatus 1 comprises a display 1.2 which may be, for example, a row or a matrix consisting of light emitting diodes (LED), or a display device, such as an LCD display or the like.
  • the data to be displayed is preferably supplied to a display driver 1.21 which performs the necessary functions for converting the data to be displayed to a form suitable for the display 1.2, which is also known as such.
  • the test apparatus 1 shown in Fig. 2a further comprises a modem 1.7, by which the test apparatus 1 may communicate with a data network 4, such as the Internet data network.
  • the communication connection 1.71 may be a wireless or cable data transmission connection. Examples of such communication connections include a circuit-switched GSM mobile communication connection and a packet-switched GPRS mobile communication connection.
  • the test results can be transmitted, for example, in the form of a short message or by e-mail from the test apparatus 1 to a communication device 5, such as a mobile phone, of the user of the test apparatus 1 (Fig. 1).
  • a communication device 5 such as a mobile phone
  • the test apparatus 1 does not necessarily need to display the test results on the display 1.2, wherein the display 1.2 is not even necessary in all applications.
  • the test apparatus 1 also comprises a power source 1.8 for supplying the operating voltages needed for using the test apparatus 1.
  • the target device 2 shown in Fig. 2b comprises a control block 2.1 which controls the operation of the target device 2 in connection with the normal use and possibly also testing of the target device.
  • the control block 2.1 preferably comprises a processor, such as a microprocessor CPU. It is obvious that the control block 2.1 of the target device 2 may also comprise more than one processor.
  • the target device 2 also comprises memories 2.4, 2.5.
  • the memory 2.4 is preferably a semiconductor memory for storing software 2.41 and data 2.42 required during the use of the target device 2.
  • the mass memory 2.5 is, for example, a fixed disk, a flash memory card and/or another corresponding memory.
  • the software 2.41 required during the use of the target device 2 can be downloaded from the mass memory 2.5 into the semiconductor memory 2.4 for example at the stage when the running of the program is started in the target device 2.
  • the target device 2 also comprises a keypad 2.3 for operations by the user, such as entering of data, commands etc. Keystrokes entered via the keypad 2.3 can be detected and identified e.g. by a keypad controller 2.31 which converts the keystrokes, for example, into a code corresponding to the keystroke in a way known as such.
  • the target device 2 comprises a display 2.2 for displaying data.
  • the data to be displayed is preferably supplied to a display driver 2.21 which performs the necessary functions for converting the data to be displayed to a form suitable for the display 2.2, which is also known as such.
  • the target device 2 shown in Fig. 2b further comprises a disk drive connection 2.71 , by means of which the target device 2 may apply data disks, such as diskettes, CD-ROM's, DVD's, etc.
  • the target device 2 comprises one or more data disk drives 2.7, such as a disk drive, a CD-ROM drive and/or a DVD drive.
  • the disk drive connection 2.71 comprises the necessary functional blocks for controlling the use of a data disk placed in the data disk drive 2.7, and data can be transferred from the data disk into the memory 2.4, 2.5.
  • the data disk drive 2.7 may also be a so-called writable data disk drive, wherein data can also be written on the data disk, if such a writable data disk has been inserted in the data disk drive 2.7.
  • the operation of the data disk drives and the respective data disk controllers is known as such, wherein it will not be necessary to describe their operation in more detail in this context.
  • the target device 2 also comprises a power source 2.8 for supplying the operating voltages needed for using the target device 2.
  • the devices 1 , 2 may also comprise a pointing device 1.9, 2.9, such as a mouse or a joystick, which may also be used for entering control data in the device 1 , 2.
  • the display 1.2, 2.2 and/or the keypad 1.3, 2.3 may be integrated in the test apparatus 1 or the target device 2, or they may be separate, wherein the data transmission can be provided by means of suitable cabling.
  • Wireless keypads 1.3, 2.3 and pointing devices 1.9, 2.9 are also known, wherein the data transmission between the keypad 1.3, 2.3 or the pointing device 1.9, 2.9 and the test apparatus 1 or target device 2 can be arranged in a wireless manner.
  • test apparatus 1 is connected to the target device 2, for example, by means of a universal serial bus (USB).
  • USB universal serial bus
  • the testing connection 1.62 of the test apparatus is provided by means of a suitable cable.
  • the cable is thus provided with a connector compatible with the USB connection (not shown).
  • Other possible connections can also be applied, including a wireless wideband connection, for example a WLAN connection, wherein the target device 2 must comprise communication means enabling such a connection. In some cases, it may be necessary to use more than one connection, if all the functions of the target device 2 cannot be tested via a single connection.
  • connection cable is provided with an adapter, by means of which the test apparatus can communicate with a reading means (or read/write means) in the data disk drive.
  • a reading means is not shown in the appended drawings.
  • the reading means is an optical receiver, wherein the adapter of the connection cable is provided with a corresponding optical transmitter which must be placed mechanically in a suitable location so that the reading means can read the signal from the optical transmitter.
  • the reading means may be difficult, for example due to the fact that the mechanics of the data disk drive may shift the reading means, which would require that the optical transmitter be shifted respectively.
  • An advantage of this arrangement is, among other things, that in many computers it is possible to set the booting of the computer from the data disk drive, wherein the test apparatus 1 can take control over the target device 2 as early as possible.
  • the test apparatus 1 and the target device 2 can be turned on.
  • the test apparatus 1 may have been turned on already in advance.
  • the booting functions are started, which have been stored in the form of a boot program or the like typically provided in a non-volatile memory arranged in the memory 1.4 that may be either a write once read only memory and/or a rewritable memory (e.g. EEPROM, Electrically Erasable Programmable Read Only Memory).
  • the boot program comprises program instructions to be run by the control block 2.1 to set the operating conditions of the functional block of the target device 2. These operations can be generally called initialization operations.
  • These initialization operations include, for example, setting of the operating condition of the connection block 2.6 and the data disk connection 2.71.
  • the control block 2.1 remains for a time waiting for possible incoming control instructions via the USB connection.
  • the test apparatus 1 detects this condition and starts to transmit control commands to the USB connection.
  • the test apparatus 1 may, for example, control the control block 2.1 of the target device 2 to test the functionality of different hardware components of the target device 2 and to transmit data to the test apparatus 1.
  • Figure 5 shows, in a reduced block chart, the operation of a test apparatus 1 according to an advantageous embodiment of the invention in connection with testing of a target device 2.
  • the test apparatus 1 preferably inquires (block 501 in Fig. 5) the identification data of the target device 2, such as type, model, manufacturer, etc.
  • the identification data can also be a unique identifier, such as a name, defined for the target device 2.
  • the test apparatus 1 searches a database 1.51 for the data of the target device (block 502). If the data is not found, a new data record is set up for said target device in the database, and an identifier is set for the data record (block 503).
  • the test apparatus 1 may, for example, request the target device 2 to read the data on the manufacturer and version of the controllers, and to transmit this data to the test apparatus 1. After this, the test apparatus 1 may scan its own database 1.51 and search for the corresponding data. If it is found in the database 1.51 , the test apparatus 1 may compare the read data with the data from the database and, if necessary, update the controllers in the target device 2 (block 505). The updating, that is, the transfer and storage of a newer version of the controller program in the target device 2, may be needed, for example, if the controller program in the target device 2 has been found defective or if it is not the newest version.
  • the test apparatus 1 investigates which programs and components have been detected earlier in the target device 2 (block 505). This data can be compared, for example, with the data on existing components and/or software detected in the target device 2 (block 507). The data of the database 1.51 and the software of the target device 2 can be updated, if necessary. After this, the testing of the software and components can be performed (block 508). If necessary, the test apparatus 1 may search for data relating to the controller program also from a data network 4, for example in a situation in which the data is not found in the database 1.51 of the test apparatus 1 (blocks 504, 507).
  • the data of the database 1.51 is relatively old, it may be necessary to retrieve newer data via a data network. Addresses of the home pages of different manufacturers, and/or an address to a storage location containing controller programs by a device manufacturer,, and the like, may be stored in the database 1.51 of the test apparatus 1. The test apparatus 1 may use this address data to find out where the data relating to the controller programs can be retrieved.
  • Examples of components to be tested include the data disk drives 2.7, the keypad 2.3, the display 2.2, the power source 2.8, and the pointing device 2.9. Furthermore, it is possible to find out the device drivers of these functional blocks, their manufacturers, versions, working condition, etc. However, it is obvious that these are only non-limiting examples, and in practice there may be several different programs and functional blocks.
  • the above-presented data searching principle can also be applied for searching other data than data of controller programs, such as, for example, data relating to the correction of defects in the operating system and application software, and/or for searching newer versions and storing them in the target device 2.
  • the new versions may be subject to a fee, wherein the payment transaction may, in some cases, also be made via the data network connection, even at the same time when the new version is downloaded. In this way, the updates can be provided quickly and efficiently.
  • the testing of the hardware components of the target device 2 and the data collection can be performed largely by applying the above-presented principles.
  • the database of the test apparatus 1 may contain information about the properties of the devices, the command strings or other operations suitable for testing the devices, etc. Thus, after receiving data from the target device 2 about the functional components included therein, the test apparatus 1 retrieves the testing instructions from the database 1.51 and/or from the website of the manufacturer of said component, and controls the control block 2.1 of the target device 2 to run the testing.
  • the control block 2.1 transmits information about the test results to the test apparatus 1.
  • the test apparatus 1 may compare the test results with those given by the manufacturer, and conclude whether said component is undamaged or defective.
  • the test result can be given, for example, on the display 1.2 of the test apparatus 1 , wherein the user of the test apparatus 1 is informed if the component should be replaced with a new one. In this way, the user of the test apparatus 1 may follow up the testing procedure.
  • the test results are preferably stored in the database 1.51 (block 510).
  • the user of the test apparatus 1 may control the operation of the test apparatus 1 and decide which operations are performed each time. For example, the user may be asked to confirm whether to update a program to a new version or to retain the old version.
  • the above testing operations can be performed for various programs and components.
  • the testing can be interrupted for repair operations, if necessary, and continued after the reparation has been finished.
  • the testing program can be terminated and the target device 2 shifted to the normal mode (block 512), for example by removing the test cable and restarting the target device 2.
  • the user of the test apparatus 1 is preferably informed of this and instructions are given, for example, on the display 1.2 of the test apparatus 1 for the repair procedure.
  • test apparatus 1 may attempt to retrieve the missing data, for example, from the data network 4.
  • control block 2.1 of the target device 2 may also be defective, wherein it is not necessarily possible to make full use of the control block 2.1 in the testing.
  • Some target devices 2 may be provided with the .option of controlling the target device 2 externally, for example directly by means of the control block 1.1 of the test apparatus 1.
  • the program instructions to be run by the control block 2.1 of the target device 2 are run in the control block 1.1 of the test apparatus 1. This arrangement may also require modifications in the target device 2.
  • the control block 2.1 of the target device may be equipped with a module (not shown) which turns off the processor of the control block 2.1 and acts as a signal transmitter between the control block 1.1 of the test apparatus 1 and the other components of the target device 2.
  • the module may be arranged to emulate the operation of the processor on the basis of control commands from the test apparatus and to transmit e.g. status data corresponding to the processor states into the test apparatus 1. In this mode, it may not be possible to run the testing of the target device 2 in full scale but in a limited scale.
  • the module may be implemented in whole or in part by software, for example in the form of program instructions of the control block 2.1.
  • FIG. 4 illustrates the software 400 of the target device 2 in an example situation
  • Fig. 3 is a block chart illustrating the booting of the target device 2.
  • the software 400 comprises a boot unit 401 with a program code for starting the operation of the device 2 to be tested (block 301 in Fig. 3). If necessary, the starting unit 401 comprises a detecting program 402 to examine (block 302) if the test apparatus 1 has been connected in a data transmission connection with the target device 2. If the detecting program 402 detects that the test apparatus 1 has been connected to the target device 2, the next step is to run the testing program 403 (block 303).
  • the testing program comprises, among other things, the program codes corresponding to the above-desribed functions for testing the functions of different programs and components.
  • the testing program may also comprise a virus scan program or program instructions to start a virus scan, wherein the virus scan is run in the memories of the target device 2.4, 2.5.
  • the testing program 403 may comprise program instructions for shifting to the normal mode of the target device after the testing (block 304).
  • the running of the program is preferably shifted to the beginning of the operating system 404, or to the beginning of the boot unit 401.
  • the program also shifts to the beginning of the operating system 404 in case the detecting program 402 did not find the test apparatus 1 coupled in a data transmission connection with the target device 2 (arrow 305 in Fig. 3).
  • the boot unit 401 must perform, at least in the connection block 2.6, such initialization functions of a data transmission connection which are used for coupling the test apparatus 1 to the target device 2. For example, if a USB connection is used, this USB connection must be brought to a working order before the detecting program carries the above-mentioned examination whether the test apparatus 1 has been coupled to the target device 2.
  • These initialization functions can be implemented in the detecting program 402, wherein there may be no need to modify the other programs of the target device 2.
  • the detecting program 402 preferably examines these connections one by one until it is determined whether the test apparatus 1 has been coupled to the target device 2 or not.
  • the software and other functional properties of the test apparatus 1 can be modified/updated, for example by means of a device, such as a computer, coupled to the connection block 1.6.
  • a device such as a computer
  • the above description discloses the substantial features of the testing arrangement according to the invention. What is subjected to testing in the target device 2 at a time, will depend, among other things, on the properties of the target device 2. Some non-limiting examples include the checking of the functionality of the mechanical parts of the device, the checking of the functionality of factors relating to the starting-up of the device, the checking of the functionality of auxiliary equipment and drivers of the device, the detection and reparation of defects in the software of the device, as well as reporting to device suppliers, support persons and/or users.
  • the test apparatus can be used to collect and report functional data on components of the target device 2, which may also be useful for the manufacturers of the components. For example, it is possible to collect data on the fixed disk and to transmit data on e.g. the number, location and failure rate of defective sectors to the manufacturer of the fixed disk. With the test apparatus 1 , it is also . possible to find out, among other things, data on the compatibility of the software library applied by the target device 2 and the physical components of the target device 2, to correct and update the software of the target device 2, etc.
  • the target device 2 may also be, for example, a mobile phone, wherein the test apparatus 1 is connected to the mobile phone by means of a cable or a wireless data transmission connection.
  • Another target device 2 suitable for testing by the method according to the invention is a personal digital assistant (PDA).
  • PDA personal digital assistant
  • testing arrangement according to the invention can be used for testing various data processing devices without opening the device housing.
  • performing the testing may be easier than by using solutions of prior art. It is obvious that the present invention is not limited solely to the above- presented embodiments but it can be modified within the scope of the appended claims.

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Tests Of Electronic Circuits (AREA)
PCT/FI2007/050036 2006-01-23 2007-01-23 A test apparatus and a method for testing an apparatus WO2007083001A1 (en)

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FI20065044A FI118578B (fi) 2006-01-23 2006-01-23 Testauslaite ja menetelmä laitteen testaamiseksi
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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000043880A1 (en) * 1999-01-21 2000-07-27 Bsquare Corporation A system and method for testing and validating devices having an embedded operating system
US20030074423A1 (en) * 2001-03-19 2003-04-17 Thomas Mayberry Testing web services as components
US20030191590A1 (en) * 2002-04-04 2003-10-09 Catteleya Systems Interactive automatic-test GUI for testing devices and equipment using shell-level, CLI, and SNMP commands
US20050005198A1 (en) * 2003-01-29 2005-01-06 Sun Microsystems, Inc. Parallel text execution on low-end emulators and devices
US20050086561A1 (en) * 2003-10-17 2005-04-21 Huang Hc Testing device
US20050278569A1 (en) * 2004-06-09 2005-12-15 Karamadai Srinivasan Diagnostic method, system, and program that isolates and resolves partnership problems between a poratable device and a host computer

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000043880A1 (en) * 1999-01-21 2000-07-27 Bsquare Corporation A system and method for testing and validating devices having an embedded operating system
US20030074423A1 (en) * 2001-03-19 2003-04-17 Thomas Mayberry Testing web services as components
US20030191590A1 (en) * 2002-04-04 2003-10-09 Catteleya Systems Interactive automatic-test GUI for testing devices and equipment using shell-level, CLI, and SNMP commands
US20050005198A1 (en) * 2003-01-29 2005-01-06 Sun Microsystems, Inc. Parallel text execution on low-end emulators and devices
US20050086561A1 (en) * 2003-10-17 2005-04-21 Huang Hc Testing device
US20050278569A1 (en) * 2004-06-09 2005-12-15 Karamadai Srinivasan Diagnostic method, system, and program that isolates and resolves partnership problems between a poratable device and a host computer

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FI118578B (fi) 2007-12-31
FI20065044A0 (fi) 2006-01-23

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