WO2006125161A3 - Parametric measurement of high-speed i/o systems - Google Patents

Parametric measurement of high-speed i/o systems Download PDF

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Publication number
WO2006125161A3
WO2006125161A3 PCT/US2006/019467 US2006019467W WO2006125161A3 WO 2006125161 A3 WO2006125161 A3 WO 2006125161A3 US 2006019467 W US2006019467 W US 2006019467W WO 2006125161 A3 WO2006125161 A3 WO 2006125161A3
Authority
WO
WIPO (PCT)
Prior art keywords
systems
speed
parametric measurement
device under
under test
Prior art date
Application number
PCT/US2006/019467
Other languages
French (fr)
Other versions
WO2006125161A2 (en
Inventor
Hugh S Wallace
Adrian W C Seet
Klaus-Dieter Hilliges
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Priority to DE112006001266T priority Critical patent/DE112006001266B4/en
Publication of WO2006125161A2 publication Critical patent/WO2006125161A2/en
Publication of WO2006125161A3 publication Critical patent/WO2006125161A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators

Abstract

A phase comparator (221) is used to test a device under test (301) comprising an input/output (I/O) circuit by applying a signal to the device under test; extracting a phase signal from the phase comparator (221); and determining parametric information pertaining to the (I/O) circuit of the device under test (301) from the phase signal.
PCT/US2006/019467 2005-05-19 2006-05-18 Parametric measurement of high-speed i/o systems WO2006125161A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE112006001266T DE112006001266B4 (en) 2005-05-19 2006-05-18 Parameter measurement of high-speed I / O systems

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US68310505P 2005-05-19 2005-05-19
US60/683,105 2005-05-19

Publications (2)

Publication Number Publication Date
WO2006125161A2 WO2006125161A2 (en) 2006-11-23
WO2006125161A3 true WO2006125161A3 (en) 2007-05-24

Family

ID=37432178

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2006/019467 WO2006125161A2 (en) 2005-05-19 2006-05-18 Parametric measurement of high-speed i/o systems

Country Status (2)

Country Link
DE (1) DE112006001266B4 (en)
WO (1) WO2006125161A2 (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6421801B1 (en) * 1999-06-08 2002-07-16 Intel Corporation Testing IO timing in a delay locked system using separate transmit and receive loops

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH083507B2 (en) * 1986-08-06 1996-01-17 株式会社アドバンテスト Signal remover
JP3563750B2 (en) * 1992-10-16 2004-09-08 テキサス インスツルメンツ インコーポレイテツド Scan-based testing for analog circuits.
US6313682B1 (en) * 1999-12-08 2001-11-06 Analog Devices, Inc. Pulse generation circuit and method with transmission pre-emphasis
US20030210029A1 (en) * 2002-05-07 2003-11-13 Billy Antheunisse Coherent clock measurement unit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6421801B1 (en) * 1999-06-08 2002-07-16 Intel Corporation Testing IO timing in a delay locked system using separate transmit and receive loops

Also Published As

Publication number Publication date
DE112006001266T5 (en) 2008-04-30
DE112006001266B4 (en) 2011-09-08
WO2006125161A2 (en) 2006-11-23

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