WO2006113933A3 - Scintillator-based micro-radiographic imaging device - Google Patents
Scintillator-based micro-radiographic imaging device Download PDFInfo
- Publication number
- WO2006113933A3 WO2006113933A3 PCT/US2006/015409 US2006015409W WO2006113933A3 WO 2006113933 A3 WO2006113933 A3 WO 2006113933A3 US 2006015409 W US2006015409 W US 2006015409W WO 2006113933 A3 WO2006113933 A3 WO 2006113933A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- radiation
- submicron
- scintillator
- sources
- single crystal
- Prior art date
Links
Classifications
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K7/00—Gamma- or X-ray microscopes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/2443—Scintillation detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/2446—Position sensitive detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/25—Tubes for localised analysis using electron or ion beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Conversion Of X-Rays Into Visible Images (AREA)
Abstract
A scintillation based imaging system utilizes a single crystal inorganic scintillator (55) to convert ionizing radiation to light in a spectral range or ranges within the visible or ultraviolet spectral ranges. The conversion takes place inside the single crystal material, preserving special resolution. The single crystal scintillator (55) is sandwiched between a first plate that is substantially transparent to the ionization radiation and a second plate that is transparent to the visible or ultraviolet light. The ionization radiation is directed from the submicron source through a target (2) to create a shadow image of the target inside the scintillator crystal (55). Several submicron sources of radiation are described. Large size sources (40) are converted to submicron sources by focusing the radiation to a submicron neck by blocking all but a submicron portion using a pinhole arrangement or by channeling the radiation with a pinhole runnel (9).
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US67360605P | 2005-04-20 | 2005-04-20 | |
US60/673,606 | 2005-04-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2006113933A2 WO2006113933A2 (en) | 2006-10-26 |
WO2006113933A3 true WO2006113933A3 (en) | 2007-06-21 |
Family
ID=37115985
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2006/015409 WO2006113933A2 (en) | 2005-04-20 | 2006-04-20 | Scintillator-based micro-radiographic imaging device |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2006113933A2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108982553A (en) * | 2018-04-26 | 2018-12-11 | 同济大学 | X-ray pinhole array camera and its assembly method with shielding gamma radiation effect |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9238773B2 (en) | 2011-09-22 | 2016-01-19 | Lawrence Livermore National Security, Llc | Lutetium oxide-based transparent ceramic scintillators |
US9164181B2 (en) | 2011-12-30 | 2015-10-20 | Saint-Gobain Ceramics & Plastics, Inc. | Scintillation crystals having features on a side, radiation detection apparatuses including such scintillation crystals, and processes of forming the same |
CN109975857B (en) * | 2019-05-06 | 2023-11-03 | 中国工程物理研究院激光聚变研究中心 | Multichannel narrow-band soft X-ray imaging assembly |
CN109975859B (en) * | 2019-05-06 | 2023-10-31 | 中国工程物理研究院激光聚变研究中心 | High space-time resolution soft X-ray radiation flow quantitative measurement system |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3383510A (en) * | 1964-12-07 | 1968-05-14 | Parametrics Inc | Alpha particle excited monochromatic X-ray source |
US5001737A (en) * | 1988-10-24 | 1991-03-19 | Aaron Lewis | Focusing and guiding X-rays with tapered capillaries |
US5351279A (en) * | 1992-08-28 | 1994-09-27 | Csl Opto-Electronics Corporation | X-ray microscope with a direct conversion type x-ray photocathode |
US5723865A (en) * | 1994-11-23 | 1998-03-03 | Thermotrex Corporation | X-ray imaging device |
US6091796A (en) * | 1994-11-23 | 2000-07-18 | Thermotrex Corporation | Scintillator based microscope |
-
2006
- 2006-04-20 WO PCT/US2006/015409 patent/WO2006113933A2/en active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3383510A (en) * | 1964-12-07 | 1968-05-14 | Parametrics Inc | Alpha particle excited monochromatic X-ray source |
US5001737A (en) * | 1988-10-24 | 1991-03-19 | Aaron Lewis | Focusing and guiding X-rays with tapered capillaries |
US5351279A (en) * | 1992-08-28 | 1994-09-27 | Csl Opto-Electronics Corporation | X-ray microscope with a direct conversion type x-ray photocathode |
US5723865A (en) * | 1994-11-23 | 1998-03-03 | Thermotrex Corporation | X-ray imaging device |
US6091796A (en) * | 1994-11-23 | 2000-07-18 | Thermotrex Corporation | Scintillator based microscope |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108982553A (en) * | 2018-04-26 | 2018-12-11 | 同济大学 | X-ray pinhole array camera and its assembly method with shielding gamma radiation effect |
Also Published As
Publication number | Publication date |
---|---|
WO2006113933A2 (en) | 2006-10-26 |
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