WO2006024723A3 - Procede et systeme d'evaluation de tests d'un programme d'ordinateur par analyse de mutations - Google Patents

Procede et systeme d'evaluation de tests d'un programme d'ordinateur par analyse de mutations Download PDF

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Publication number
WO2006024723A3
WO2006024723A3 PCT/FR2005/001790 FR2005001790W WO2006024723A3 WO 2006024723 A3 WO2006024723 A3 WO 2006024723A3 FR 2005001790 W FR2005001790 W FR 2005001790W WO 2006024723 A3 WO2006024723 A3 WO 2006024723A3
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WO
WIPO (PCT)
Prior art keywords
tests
series
mutation
determined
computer program
Prior art date
Application number
PCT/FR2005/001790
Other languages
English (en)
Other versions
WO2006024723A2 (fr
Inventor
Mark Hampton
Original Assignee
Certess
Mark Hampton
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Certess, Mark Hampton filed Critical Certess
Priority to EP05788600A priority Critical patent/EP1776640A2/fr
Priority to US11/631,191 priority patent/US7574681B2/en
Publication of WO2006024723A2 publication Critical patent/WO2006024723A2/fr
Publication of WO2006024723A3 publication Critical patent/WO2006024723A3/fr

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G06F11/3688—Test management for test execution, e.g. scheduling of test suites

Abstract

Le procédé comporte l’exécution (F7) de programmes (Pj) mutés par insertion (F1) de mutations (Mj) et d'identification (F12) des programmes (Pj) mutés fournissant avec un test (Tk) prédéterminé, un résultat (RTkj) identique a un résultat (RTkD) prédeterminé. Une suite (Uj) de tests pertinents est selectionnée (F4), parmi une pluralité de tests (Tk), pour chaque mutation (Mj). Un classement (Cm) des mutations (Mj) peut être déterminé (F6) par application (F6) d'au moins un premier critère de simplicité aux suites (Uj) de tests selectionnées. Les programmes (Pj) mutés sont, ensuite, executés (F7) par ordre du classement (Cm) des mutations (Mj). Chaque programme (Pj) muté est executé avec les tests (Tk) de la suite (Uj) de tests associée. Le procédé peut comporter la programmation et l'activation d'un circuit programmable. Un classement des tests (Tk) d'une suite (Uj) de tests peut être déterminé par application d'un second critère de simplicité aux tests (Tk) de ladite suite (Uj) de tests.
PCT/FR2005/001790 2004-07-30 2005-07-12 Procede et systeme d'evaluation de tests d'un programme d'ordinateur par analyse de mutations WO2006024723A2 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP05788600A EP1776640A2 (fr) 2004-07-30 2005-07-12 Procede et systeme d'evaluation de tests d'un programme d'ordinateur par analyse de mutations
US11/631,191 US7574681B2 (en) 2004-07-30 2005-07-12 Method and system for evaluating computer program tests by means of mutation analysis

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0408429 2004-07-30
FR0408429A FR2873832B1 (fr) 2004-07-30 2004-07-30 Procede et systeme d'evaluation de tests d'un programme d'ordinateur par analyse de mutations

Publications (2)

Publication Number Publication Date
WO2006024723A2 WO2006024723A2 (fr) 2006-03-09
WO2006024723A3 true WO2006024723A3 (fr) 2007-03-22

Family

ID=34951087

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR2005/001790 WO2006024723A2 (fr) 2004-07-30 2005-07-12 Procede et systeme d'evaluation de tests d'un programme d'ordinateur par analyse de mutations

Country Status (4)

Country Link
US (1) US7574681B2 (fr)
EP (1) EP1776640A2 (fr)
FR (1) FR2873832B1 (fr)
WO (1) WO2006024723A2 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060225051A1 (en) * 2005-04-05 2006-10-05 Cisco Technology, Inc. Method and system for code coverage
DE102006056432A1 (de) 2006-11-28 2008-05-29 Certess, Inc., Campbell Verfahren zum Testen eines Computerprogramms
US9619373B2 (en) * 2009-12-14 2017-04-11 International Business Machines Corporation Method and apparatus to semantically connect independent build and test processes
JP6748357B2 (ja) * 2016-09-23 2020-09-02 富士通株式会社 解析装置、解析プログラムおよび解析方法
US10705949B2 (en) * 2017-11-03 2020-07-07 Oracle International Corporation Evaluation of library test suites using mutation testing
CN109739746B (zh) * 2018-12-12 2022-03-01 江苏师范大学 一种基于原语句占优分析的变异测试方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001235523A (ja) * 1999-12-07 2001-08-31 Hewlett Packard Co <Hp> テスト生成におけるマルチモード最適化技術
US6298317B1 (en) * 1999-01-25 2001-10-02 Hewlett-Packard Company Enhanced functional testing through the filtration of non-subtle mutations

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001238523A (ja) 2000-03-01 2001-09-04 Kubota Corp コンバイン
US7039545B2 (en) * 2004-04-19 2006-05-02 Agilent Technologies, Inc. Apparatus, system and/or method for converting a serial test to a parallel test

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6298317B1 (en) * 1999-01-25 2001-10-02 Hewlett-Packard Company Enhanced functional testing through the filtration of non-subtle mutations
JP2001235523A (ja) * 1999-12-07 2001-08-31 Hewlett Packard Co <Hp> テスト生成におけるマルチモード最適化技術

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
BAUDRY B ET AL: "Genes and bacteria for automatic test cases optimization in the .NET environment", SOFTWARE RELIABILITY ENGINEERING, 2002. PROCEEDINGS. 13TH INTERNATIONAL SYMPOSIUM ON 12-15 NOV. 2002, PISCATAWAY, NJ, USA,IEEE, 12 November 2002 (2002-11-12), pages 195 - 206, XP010625137, ISBN: 0-7695-1763-3 *
PATENT ABSTRACTS OF JAPAN vol. 2000, no. 25 12 April 2001 (2001-04-12) *

Also Published As

Publication number Publication date
US7574681B2 (en) 2009-08-11
FR2873832B1 (fr) 2006-09-15
EP1776640A2 (fr) 2007-04-25
WO2006024723A2 (fr) 2006-03-09
US20070266351A1 (en) 2007-11-15
FR2873832A1 (fr) 2006-02-03

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