WO2006014435A2 - Method and apparatus for intelligently setting dead time - Google Patents
Method and apparatus for intelligently setting dead time Download PDFInfo
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- WO2006014435A2 WO2006014435A2 PCT/US2005/023854 US2005023854W WO2006014435A2 WO 2006014435 A2 WO2006014435 A2 WO 2006014435A2 US 2005023854 W US2005023854 W US 2005023854W WO 2006014435 A2 WO2006014435 A2 WO 2006014435A2
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- Prior art keywords
- dead time
- memory
- circuit
- switches
- power loss
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Classifications
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of DC power input into DC power output
- H02M3/02—Conversion of DC power input into DC power output without intermediate conversion into AC
- H02M3/04—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters
- H02M3/10—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
- H02M3/145—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal
- H02M3/155—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only
- H02M3/156—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators
- H02M3/158—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators including plural semiconductor devices as final control devices for a single load
- H02M3/1588—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators including plural semiconductor devices as final control devices for a single load comprising at least one synchronous rectifier element
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of DC power input into DC power output
- H02M3/22—Conversion of DC power input into DC power output with intermediate conversion into AC
- H02M3/24—Conversion of DC power input into DC power output with intermediate conversion into AC by static converters
- H02M3/28—Conversion of DC power input into DC power output with intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate AC
- H02M3/325—Conversion of DC power input into DC power output with intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate AC using devices of a triode or a transistor type requiring continuous application of a control signal
- H02M3/335—Conversion of DC power input into DC power output with intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate AC using devices of a triode or a transistor type requiring continuous application of a control signal using semiconductor devices only
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/12—Regulating voltage or current wherein the variable actually regulated by the final control device is AC
- G05F1/40—Regulating voltage or current wherein the variable actually regulated by the final control device is AC using discharge tubes or semiconductor devices as final control devices
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/0003—Details of control, feedback or regulation circuits
- H02M1/0012—Control circuits using digital or numerical techniques
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/0048—Circuits or arrangements for reducing losses
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B70/00—Technologies for an efficient end-user side electric power management and consumption
- Y02B70/10—Technologies improving the efficiency by using switched-mode power supplies [SMPS], i.e. efficient power electronics conversion e.g. power factor correction or reduction of losses in power supplies or efficient standby modes
Definitions
- the present invention relates to power supplies and in particular to voltage converters employing two controlled switches, one of which operates as a synchronous rectifier.
- the two switches are generally controlled so that both switches are never on at the same time.
- a "dead time” is provided between the on- times of the two switches to prevent cross conduction across the DC voltage supply between which the two switches are connected in series.
- Synchronous rectification has been widely adopted for use in low voltage output converters of various topologies: Buck, boost, fly back, and forward.
- a MOSFET switch for a silicon or Schottky diode, rectification losses can be dramatically reduced.
- the present invention seeks to minimize the power losses associated with dead time. This is accomplished by minimizing dead time to reduce body diode conduction losses, and in some cases, by allowing FET switch cross conduction to eliminate body diode conduction altogether, thus eliminating reverse recovery associated losses.
- Dead time is adjusted during the design stage so that cross conduction will be avoided under all operating conditions and over the full process variation of all components involved in achieving the dead time.
- Process variation of semiconductors can be significant and circuit operation may be over a wide range. Consequently, when no crossover is achieved with the worst case components at the worst case conditions, dead time with best case components and conditions is excessive. This results in excessive wasted power loss.
- Adaptive dead time is an improvement over adjustable dead time in that it can adjust on the fly as conditions change, and from unit-to-unit over component variations. Essentially it is logic control where the gate of one switch is prevented from turning on, until the gate of the other switch has been detected to turn off. Superficially, this seems to solve the problem, but in practice it does not. Finite time periods are required for logic control, and for charging and discharging gates of the power switches themselves. In actual practice this results in dead times on the order of 10ns-to-30ns per switching transition for a total of 20ns- to-60ns per cycle.
- Predictive dead time Most of the problem with adaptive dead time is the time required to switch the FETs off and on. Predictive dead time solves that deficiency by using a phase locked loop or some other loop to reduce dead time until it is near zero. This appears to provide many of the same benefits as the present invention, but the use of a control loop has attendant disadvantages. Since this methodology relies on a control loop of some sort to set dead time, there is also an associated settling time in that loop. During transient conditions, cross conduction may occur while the loop tries to settle into a new steady state. If fixed dead time is programmed into the loop to avoid cross conduction, then most of the time there will be more than minimum dead time and associated losses. In any case, the loop solution relies on some arbitrary electrical conditions rather than minimizing the losses associate with dead time. Test results indicate that this method does not result in the lowest possible power losses.
- PLMDT Power loss minimizing dead time
- Fig. 4 shows a converter circuit comprising transistors Ql and Q2 wherein PLMDT is used to set the dead time. Changes in duty factor of a PWM signal 10 are used to estimate power loss changes.
- a multiplier block 22 is used to modulate V 1N (the supply voltage to switches Q 1 and Q 2 ) with the PWM signal, producing the signal D x V 1N , which is proportional to the duty factor.
- V 1N the supply voltage to switches Q 1 and Q 2
- D x V 1N which is proportional to the duty factor.
- This signal is passed though a low pass filter 24 creating a slow moving signal which is equal to what the output voltage would be if there were no converter losses.
- This signal is amplified by a factor k (k x D x V 1N ) and split into two paths.
- One path goes directly to the decision comparator 26 and the other path is through, for example, a sample and hold module 28 before being applied to the decision comparator 26.
- the sample and hold module 28 is used to save the previous "k x D x V 1N " signal so that it can be compared to the one produced after a change in dead time.
- a sample and hold module 28 is shown in Fig. 4, but the sample and hold function can be implemented in various ways, including, for example, using an "N" bit memory or other equivalent techniques.
- the comparator function can be performed by a logic magnitude comparator, for example, or other equivalent techniques.
- the dead time processor 20 (DTP) of Fig. 4 may be implemented with logic circuitry, a microcontroller, or a microprocessor.
- the DTP 20 controls the sample and hold circuit 28, sets the dead time via the dead time modulators 16 and 18, and processes the "Better" signal from the output of the decision comparator. If the new signal (This D) is smaller than the previous signal (Last D), then the new dead time is "Better" (the comparator output is high) and the DTP 20 saves this new dead time value. Otherwise the new one is discarded and the old dead time is restored.
- a delay is required after changing the dead time to allow the power supply feedback circuitry to settle on a new duty factor. Many factors can effect this time, but in practice a time of about 10Ox the switching period of the power supply seems to work well.
- the DTP 20 preferably averages multiple decisions over a relatively long period of time before reaching a final conclusion about a particular dead time in order to obtain reliability and prevent false dead time setting due to noise or transients. Hundreds of samples or more are desirable. This effectively averages out the effect of rapid load transients on power supply duty factor. The same averaging technique is applicable if some other means besides duty factor is used to determine power loss.
- PLMDT may be implemented using digital PWM or digital signal processing (DSP) implementations, but the basic algorithm remains substantially the same.
- DSP digital signal processing
- Fig. 5 shows the basic algorithm which may be implemented with a digital signal processor, microprocessor, microcontroller, or logic state machine for implementation of PLMDT. It also substantially shows an example of the process implemented by the circuitry of Fig. 4.
- dead time is decreased or increased initially is arbitrary. However, since the goal is to decrease power losses and this is accomplished by decreasing dead time, dead time is preferably decreased initially. In the second part (H) of the Fig. 5 flow, dead time will be increased, and the dead time that results in the lower power loss will be implemented.
- a delay is implemented to allow the power supply voltage to settle as shown at 56.
- the new power loss (after the dead time has been changed) is now compared with the old power loss at 58.
- the old power loss has been saved from the previous step 52 as shown at 58A. If the new power loss is lower (for example, as determined by duty cycle), as indicated by decision block 60, flow is to block 62 wherein the "better" counter is incremented. The "better" count keeps track of the number of times the new power loss is better than the old.
- the counter is not incremented.
- Flow is then to decision block 66 to determine if N tests are complete. As discussed above, a plurality of tests are preferably made to obtain reliable results. If N tests are not complete, flow is via line 69.
- the previous dead time is reinstated and a delay is implemented at 73 to allow the power supply to settle and the test counter is again incremented at 50 and the comparison is again made with the old power loss.
- exit is to 68. The dead time will have been last implemented at step 54.
- N tests are made to ensure that the comparisons are reliable, to account, for example, for noise or load transients which could cause an error if only a single test were made. By making multiple tests, greater accuracy and reliability is obtained. [0023] At step 68, a determination is made if N/2 + 1 of the tests were better, that is, if the "better" counter shows that more than half the tests made showed a better power loss. If so, then entry is made via flow line 70 to part II of the flow. If N/2 +1 tests were not better, then the old dead time is reinstated at 74 and a delay is implemented at 75 before proceeding to step 76.
- the test counter "N" is again incremented.
- the current power loss is saved at 78, the dead time is increased by one step at 80, reducing the sync-off delay.
- a delay is implemented to allow the power supply to settle.
- the old power loss 84A saved at step 78 is compared with the new power loss. The old power loss is shown at 84A.
- a determination is made as to whether the new power loss is lower with the increased dead time. If the new power loss is lower, the "better" counter is incremented at 88. If the new power loss is not lower or after incrementing the better counter at 88, a check is made to determine if N tests have been completed.
- the PLMDT technique results in optimizing the dead time. However, results are a compromise based on average circuit conditions rather than an optimum based on exact instantaneous operating conditions.
- the Intelligent Dead Time (IDT) technique disclosed herein solves the "speed" problems associated with PLMDT.
- apparatus for setting dead time between ON times of two series connected switches of a power converter circuit connected across a supply potential, the apparatus comprising a circuit for monitoring a power converter circuit parameter and providing an output corresponding to the circuit parameter; a memory addressed by a signal related to the output of the monitoring circuit, the memory having values stored therein related to the dead times and associated with values of the circuit parameter; a processor providing an output of the memory associated with the value of the circuit parameter to set the dead time corresponding to the stored value in the memory, and a dead time implementing stage for implementing the dead time in accordance with the output of the memory.
- the invention also comprises a method for setting dead time between ON times of two series connected switches of a power converter circuit connected across a supply potential, the method comprising monitoring a power converter circuit parameter and providing an output corresponding to the circuit parameter; addressing a memory with a signal related to the output and having values stored therein related to the dead times and associated with values of the circuit parameter; providing an output of the memory associated with the value of the circuit parameter to set the dead time corresponding to the stored value in the memory, and implementing the dead time in accordance with the output of the memory.
- the invention applies both to switches directly connected across the supply potential as well as topologies wherein the two switches may be separated by a transformer such as in synchronous boost, flyback or forward converters.
- a transformer such as in synchronous boost, flyback or forward converters.
- EDT Intelligent Dead Time
- dead time is varied in response to changing converter and input conditions using a lookup table, or an appropriate closed form solution.
- memory is used to save the dead time values or coefficients for later use. If this memory is to be retained during power down, then non-volatile memory is required. Look-up tables can be stored directly, but for closed form solutions the coefficients may be stored.
- PLMDT Power Loss Minimizing Dead Time
- the dead time is varied in such a manner so as to minimize overall converter power losses.
- Several means are available for monitoring power loss, including monitoring combinations of input and output voltage and current. If input and output voltage are fixed, only current monitoring is required and if averaging techniques are applied, only input current need be measured. The most cost effective and convenient means, however, is to use control switch duty factor as a relative gauge of power losses. When dead time is adjusted to minimize duty factor, converter power losses will also be minimized.
- the error amplifier output is used in place of the duty factor. This is possible because the error signal is the modulation input to the PWM stage. Consequently, the PWM duty factor is proportional to the error voltage.
- saved dead-time values from PLMDT are used so that in the future, power loss can be minimized without taking the time according to the PLMDT technique at that instant to search for optimum values.
- PLMDT PLMDT
- other techniques for updating the stored dead time value can also be employed.
- the stored dead time values can be determined at the design stage during prototyping. One advantage of this option is that it would not be necessary for the PLMDT circuitry to reside in the final application. The main disadvantage is that the dead time selections would need to encompass expected manufacturing variability, component tolerances, and component aging. This forces more conservative settings which will result in less than optimum losses.
- the PLMDT circuitry is incorporated in the designed product application (typically into the driver ICs), then the dead time can be mapped out at first startup.
- This has the advantage of incorporating manufacturing and component tolerances into the dead time settings.
- the disadvantage is that it does not include component aging, so the setting will have to allow for aging.
- the circuit will be more optimized than the design stage calibration, but still not ideal. It may be good enough for most applications, however.
- a preferred option from a performance standpoint is to have the mapping done at periodic intervals throughout the life of the product application. In this way, the optimum settings, once found, can be periodically updated. For example, periodically, the system can invoke PLMDT to determine new, optimized values which are then stored in memory.
- Fig. 1 is a block diagram of one embodiment of a circuit implementation according to the invention.
- Fig. IA shows a second embodiment
- Fig. 2 shows waveforms of the circuit of Fig. 1 or IA
- Fig. 3 is a flow chart of an algorithm implemented in a digital implementation of the invention.
- Fig. 4 shows a circuit that implements power loss minimizing dead time (PLMDT) which can be used in conjunction with the invention to update stored dead time values in the memory; and
- PLMDT power loss minimizing dead time
- Fig. 5 shows a flow chart of an algorithm for implementing PLMDT.
- Fig. 1 shows one possible implementation of a converter circuit implementing the intelligent dead time (IDT) method according to the present invention.
- IDT intelligent dead time
- Many other implementations are possible because the essential element of the present invention is that optimum dead time is "memorized" over the power supply operating range, and then "recalled” when needed later.
- Conditions monitored by the system will vary from one implementation to another, but may include: Input voltage, output current (e.g., synchronous switch current), and MOSFET driver temperature.
- Fig. 1 shows one possible implementation of the present invention which combines digital and analog circuitry. Others are possible and most blocks and functions can be implemented with digital circuitry as well as analog.
- Fig. 1 shows a DC-DC converter circuit that has been modified to incorporate the technique according to the present invention to intelligently set dead time to minimize power losses during dead time.
- the circuit employs PLMDT, on a periodic basis, to optimize and update the dead times.
- the converter includes two switches, Q 1 and Q 2 , typically MOSFETs, connected in series between the power supply nodes V 1N and ground.
- the converter shown is a buck converter, but the invention is applicable to any form of switching mode power supply with synchronous rectification.
- the switched node N of a buck converter is coupled to the load through an output inductor L.
- An output capacitor C is coupled across the load.
- the gate of each switch Q 1 and Q 2 is coupled to pulse width modulated (PWM) signals (control and sync, respectively) from a PWM controller 12 via gate drive circuitry 2 and 4, shown schematically, and the additional circuitry now to be described. Since the gate drive signals are complementary, an inverter 6 is shown schematically in one of the gate drive channels.
- PWM pulse width modulated
- switch Q 1 functions as the control switch and switch Q 2 functions as a synchronous rectifier.
- PWM signal 10 is generated in known fashion by PWM controller 12.
- the PWM signal 10 is delayed by the fixed delay block 14. This allows the programmable dead time range to include both positive and negative values of dead time.
- the off -time and on-time of the synchronous switch Q 2 gate signal is varied, as shown in Fig. 2, thus changing the amount of dead time.
- the Sync-On delay is implemented, for example, via a 4 bit dead time modulator 16, which may comprise, e.g., a counter, tapped analog or digital delay line, or single shot circuit.
- the Sync-Off delay is implemented by a similar modulator 18. They are programmed independently by the dead-time processor 2OA and allow independent adjustment of the Sync-On and Sync-Off delay time.
- the output of a 3 bit A/D converter 15 that monitors the current in transistor Q2 is used to directly address a memory 23, which may be a part of the processor 2OA, that contains the dead time settings for each of the 8 possible current levels determined by the 3bits.
- a 3bit converter is shown, a converter having greater resolution, i.e., more bits, can also be used.
- the counter 25 is normally used as a latch and is loaded with memory contents for transfer out to the dead time modulators 16 and 18. These modulators operate as described above to implement the dead time and are the same as the modulators used in the PLMDT technique.
- Fig. 1 shows Q2 current being monitored by sensing the current in a parallel connected switch Sl, which may be a lower current carrying transistor switch, whose current bears a defined relationship to the current in Q2.
- the switch Sl implements a sample and hold circuit and keeps potentially damaging voltage out of the A/D converter 15 during continuous FET on time.
- Other current sensing solutions are possible.
- a simple sense resistor RS in series with the output switches Ql and Q2 see Fig. IA
- the average DC voltage V DC across the inductor L see Fig. IA
- Fig. 2 shows waveforms of the circuitry of Fig. 1.
- PWM signal 10 is as shown.
- Signal CONTROL is delayed by the fixed delay of delay module 14.
- the signal SYNC supplied to the gate of synchronous switch Q 2 has a variable sync-off delay and a variable sync-on delay as described above, thus determining the dead time between signals CONTROL and SYNC.
- the sync-off delay is determined by the DTP 2OA and supplied as a 4 bit digital signal to the modulator 18.
- the output of modulator 18 is provided to D flip-flop 30, which, when it sets, clears D flip-flop 32, turning off the switch Q 2 at the variable delay.
- modulator 16 turns on the switch Q 2 by setting D flip-flop 32 at the selected variable on delay.
- the dead time processor 2OA preferably implements a PLMDT algorithm via a module 27 as described above and in the above co-pending patent application.
- PLMDT module 27 is supplied with a signal corresponding to power loss by power loss detection circuit 40.
- the circuit monitors duty factor of the PWM signal as shown, although other parameters can be monitored instead.
- Circuit 40 may comprise, for example, elements 22 and 24 of Fig.4, providing a signal proportional to duty factor and thus power loss associated with each dead time.
- the power loss can be determined by monitoring the PWM circuits' error amplifier output as an indication of duty factor. This is shown in Fig. IA for a circuit implementing PLMDT.
- the output of the error amplifier 11 can be used as an indication of duty factor, and thus power loss. This is possible because the error signal is the modulation input to the PWM stage. Consequently, the PWM duty factor is proportional to the error voltage.
- PLMDT module 27 performs the necessary steps of the PLMDT algorithm to determine the optimal dead time when it is invoked, preferably periodically.
- PLMDT module 27 may be a combination of digital, analog and software functions, as described above with respect to the discussion of PLMDT
- the PLMDT algorithm is implemented periodically.
- the counter 25 may be used to test dead time (DT) values one above and one below that saved in memory to see if one has lower losses than the current DT setting.
- DT dead time
- Fig. 3 shows a basic operation sequence for IDT.
- step lOO. the current in Q2 is sensed when Q2 is turned on.
- the memory 23 is addressed at step 110 by the output of the A/D converter 15, which supplies a digital value of the sensed circuit.
- the memory 23 contents correspond to dead time (sync-on delay and sync-off delay) for the corresponding mapped value of Q2 current.
- the counter 25 is loaded with the EDT memory contents at 120.
- the counter 25 output is enabled at 130 to provide a new DT value (sync-on delay and sync-off delay) to the modulators 16 and 18.
- Q2 is then turned off (140) at the appropriate time in the PWM cycle as determined by the sync-off delay.
- a check is then made to determine if PLMDT is to be implemented at 150. If not, a return is made to the beginning of the loop and Q2 is turned on again and the loop repeats. If at 150 it is time to implement PLMDT (preferably implemented periodically), then the PLMDT algorithm 27 of processor 2OA is implemented and the IDT memory is updated with the new, better power loss minimizing dead times (for the sensed Q2 current) to be used in the next cycles until PLMDT is again implemented. In one implementation, dead time values above and below the value stored in memory are tested by counting one-up and one-down via counter 25 to see which is better.
- IDT is capable of changing DT values on a power supply cycle by cycle basis. Thus, there are no load transient issues associated with its operation.
- PLMDT is periodically invoked, care must be taken to insure that the DT values stored are actually those corresponding to the correct current. This should be performed by taking into account that PLMDT is best done by taking average results over tens of milliseconds.
- a method to accomplish this is to use the PLMDT circuitry to map out optimum dead times at power supply first start up.
- the values may be stored in non-volatile memory for use throughout the lifetime of the power supply. This would be facilitated by applying a well defined load to the supply during first startup, and then stepping that load through the full range of currents.
- dead-time control is optimized, to minimize power loss, yet without having to take time to search for the correct dead time.
- power loss to set dead time, rather than wave edges or synchronous switch conduction voltage, bypasses potential sources of additional power loss. It does not require knowing the relative importance of minor cross conduction versus a reduction in synchronous switch reverse recovery losses since it always picks the lowest power loss.
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Abstract
Description
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Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE112005001591T DE112005001591T5 (en) | 2004-07-06 | 2005-07-05 | Method and device for the intelligent setting of the dead time |
| JP2007520445A JP2008506347A (en) | 2004-07-06 | 2005-07-05 | Method and apparatus for intelligently setting dead time |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US58567804P | 2004-07-06 | 2004-07-06 | |
| US60/585,678 | 2004-07-06 | ||
| US11/172,163 US7098640B2 (en) | 2004-07-06 | 2005-06-30 | Method and apparatus for intelligently setting dead time |
| US11/172,163 | 2005-06-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2006014435A2 true WO2006014435A2 (en) | 2006-02-09 |
| WO2006014435A3 WO2006014435A3 (en) | 2006-08-17 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2005/023854 Ceased WO2006014435A2 (en) | 2004-07-06 | 2005-07-05 | Method and apparatus for intelligently setting dead time |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7098640B2 (en) |
| JP (1) | JP2008506347A (en) |
| KR (1) | KR100864730B1 (en) |
| DE (1) | DE112005001591T5 (en) |
| TW (1) | TWI301350B (en) |
| WO (1) | WO2006014435A2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009100494A (en) * | 2007-10-12 | 2009-05-07 | Mitsubishi Electric Corp | Semiconductor device |
Families Citing this family (87)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6940189B2 (en) * | 2003-07-31 | 2005-09-06 | Andrew Roman Gizara | System and method for integrating a digital core with a switch mode power supply |
| US7391194B2 (en) | 2004-02-20 | 2008-06-24 | International Rectifier Corporation | Apparatus and method for minimizing power loss associated with dead time |
| US20050281058A1 (en) * | 2004-06-21 | 2005-12-22 | Issa Batarseh | Dynamic optimization of efficiency using dead time and FET drive control |
| US7098640B2 (en) | 2004-07-06 | 2006-08-29 | International Rectifier Corporation | Method and apparatus for intelligently setting dead time |
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- 2005-07-05 KR KR1020077002109A patent/KR100864730B1/en not_active Expired - Lifetime
- 2005-07-05 WO PCT/US2005/023854 patent/WO2006014435A2/en not_active Ceased
- 2005-07-05 DE DE112005001591T patent/DE112005001591T5/en not_active Withdrawn
- 2005-07-05 TW TW094122686A patent/TWI301350B/en not_active IP Right Cessation
- 2005-07-05 JP JP2007520445A patent/JP2008506347A/en active Pending
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| JP2009100494A (en) * | 2007-10-12 | 2009-05-07 | Mitsubishi Electric Corp | Semiconductor device |
Also Published As
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| DE112005001591T5 (en) | 2007-06-21 |
| US7098640B2 (en) | 2006-08-29 |
| WO2006014435A3 (en) | 2006-08-17 |
| KR100864730B1 (en) | 2008-10-23 |
| US20060007713A1 (en) | 2006-01-12 |
| TW200616317A (en) | 2006-05-16 |
| KR20070039098A (en) | 2007-04-11 |
| JP2008506347A (en) | 2008-02-28 |
| TWI301350B (en) | 2008-09-21 |
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