WO2005049840A3 - Process and apparatus for measuring the three-dimensional shape of an object - Google Patents

Process and apparatus for measuring the three-dimensional shape of an object Download PDF

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Publication number
WO2005049840A3
WO2005049840A3 PCT/EP2004/012773 EP2004012773W WO2005049840A3 WO 2005049840 A3 WO2005049840 A3 WO 2005049840A3 EP 2004012773 W EP2004012773 W EP 2004012773W WO 2005049840 A3 WO2005049840 A3 WO 2005049840A3
Authority
WO
WIPO (PCT)
Prior art keywords
measuring
dimensional shape
light
signals
lines pattern
Prior art date
Application number
PCT/EP2004/012773
Other languages
French (fr)
Other versions
WO2005049840A2 (en
Inventor
Bernard Tilkens
Yvon Renotte
Vincent Moreau
Original Assignee
Univ Liege
Bernard Tilkens
Yvon Renotte
Vincent Moreau
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from EP03078577A external-priority patent/EP1531318A1/en
Application filed by Univ Liege, Bernard Tilkens, Yvon Renotte, Vincent Moreau filed Critical Univ Liege
Priority to EP04803125A priority Critical patent/EP1687588A2/en
Publication of WO2005049840A2 publication Critical patent/WO2005049840A2/en
Publication of WO2005049840A3 publication Critical patent/WO2005049840A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

A process for measuring a three dimensional (3D) shape of an object, comprising: 1.providing a light, 2.splitting said light into two spatially separated and orthogonally polarised signals, 3.filtering and projecting said signals on a surface of said object thus forming an interference lines pattern, and 4.viewing an image of said surface, that includes said lines pattern.
PCT/EP2004/012773 2003-11-17 2004-11-10 Process and apparatus for measuring the three-dimensional shape of an object WO2005049840A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP04803125A EP1687588A2 (en) 2003-11-17 2004-11-10 Process and apparatus for measuring the three-dimensional shape of an object

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
EP03078577A EP1531318A1 (en) 2003-11-17 2003-11-17 Process and apparatus for measuring a 3D shape of an object
EP03078577.8 2003-11-17
EP04075605 2004-02-09
EP04075605.8 2004-02-09

Publications (2)

Publication Number Publication Date
WO2005049840A2 WO2005049840A2 (en) 2005-06-02
WO2005049840A3 true WO2005049840A3 (en) 2005-07-21

Family

ID=34621559

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2004/012773 WO2005049840A2 (en) 2003-11-17 2004-11-10 Process and apparatus for measuring the three-dimensional shape of an object

Country Status (2)

Country Link
EP (1) EP1687588A2 (en)
WO (1) WO2005049840A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103115586A (en) * 2013-02-05 2013-05-22 华南理工大学 Micro three-dimensional sensing device based on laser interference fringes

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2932562B1 (en) * 2008-06-12 2010-08-27 Univ Pasteur LIGHT PROJECTION DEVICE STRUCTURED BY MEANS OF VCSEL AND PHASE DIFFRACTIVE OPTICAL COMPONENTS.
PT2602583E (en) 2011-12-05 2015-07-02 Université de Liège Low coherence interferometric system for phase stepping shearography combined with 3d profilometry
EP3451023A1 (en) 2017-09-01 2019-03-06 Koninklijke Philips N.V. Time-of-flight depth camera with low resolution pixel imaging
WO2021020603A1 (en) * 2019-07-29 2021-02-04 한국표준과학연구원 System and method for measuring three-dimensional shape of freeform surface by using ultrafast deflection measurement method using composite pattern
JP2024509390A (en) * 2021-02-23 2024-03-01 ホアウェイ・テクノロジーズ・カンパニー・リミテッド Optical systems, devices, and terminals

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3897136A (en) * 1973-03-09 1975-07-29 Xerox Corp Polarization-grating moire
US4850693A (en) * 1988-05-23 1989-07-25 The United States Of America As Represented By The United States Department Of Energy Compact portable diffraction moire interferometer
DE4230108A1 (en) * 1992-09-09 1994-03-10 Deutsche Forsch Luft Raumfahrt Moire system for inclined surface contour measurement - projecting light beam through first asymmetric grating to form light pattern on object surface, imaging onto shadow grating having same grating constant and detecting intensity with camera to evaluate distribution
US20020003628A1 (en) * 1999-10-06 2002-01-10 James Millerd E. Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
WO2003014663A1 (en) * 2001-08-06 2003-02-20 South Bank University Enterprises Ltd Three dimensional imaging by projecting interference fringes and evaluating absolute phase mapping
US20030043387A1 (en) * 2000-11-22 2003-03-06 Ssang-Gun Lim Method and apparatus for measuring the three-dimensional shape of an object using a moire equipment

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3897136A (en) * 1973-03-09 1975-07-29 Xerox Corp Polarization-grating moire
US4850693A (en) * 1988-05-23 1989-07-25 The United States Of America As Represented By The United States Department Of Energy Compact portable diffraction moire interferometer
DE4230108A1 (en) * 1992-09-09 1994-03-10 Deutsche Forsch Luft Raumfahrt Moire system for inclined surface contour measurement - projecting light beam through first asymmetric grating to form light pattern on object surface, imaging onto shadow grating having same grating constant and detecting intensity with camera to evaluate distribution
US20020003628A1 (en) * 1999-10-06 2002-01-10 James Millerd E. Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
US20030043387A1 (en) * 2000-11-22 2003-03-06 Ssang-Gun Lim Method and apparatus for measuring the three-dimensional shape of an object using a moire equipment
WO2003014663A1 (en) * 2001-08-06 2003-02-20 South Bank University Enterprises Ltd Three dimensional imaging by projecting interference fringes and evaluating absolute phase mapping

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103115586A (en) * 2013-02-05 2013-05-22 华南理工大学 Micro three-dimensional sensing device based on laser interference fringes

Also Published As

Publication number Publication date
EP1687588A2 (en) 2006-08-09
WO2005049840A2 (en) 2005-06-02

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